JP6595618B2 - 広視野顕微鏡を用いて試料の空間分解された高さ情報を確定するための方法および広視野顕微鏡 - Google Patents

広視野顕微鏡を用いて試料の空間分解された高さ情報を確定するための方法および広視野顕微鏡 Download PDF

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Publication number: JP6595618B2
Authority: JP; Japan
Prior art keywords: sample; beam path; wide; image; images
Prior art date: 2015-06-01
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Active

Application number

JP2017556932A

Other languages

English (en)

Japanese (ja)

Other versions

JP2018520337A (ja

Inventor

リッペルト、ヘルムート

ラングホルツ、ニルス

ネッツ、ラルフ

ヴォレシェンスキー、ラルフ

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Carl Zeiss Microscopy GmbH

Original Assignee

Carl Zeiss Microscopy GmbH

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2015-06-01

Filing date

2016-05-23

Publication date

2019-10-23

2016-05-23 Application filed by Carl Zeiss Microscopy GmbH filed Critical Carl Zeiss Microscopy GmbH

2018-07-26 Publication of JP2018520337A publication Critical patent/JP2018520337A/ja

2019-10-23 Application granted granted Critical

2019-10-23 Publication of JP6595618B2 publication Critical patent/JP6595618B2/ja

Status Active legal-status Critical Current

2036-05-23 Anticipated expiration legal-status Critical

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
- G01B2210/50—Using chromatic effects to achieve wavelength-dependent depth resolution

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Optics & Photonics (AREA)
Spectroscopy & Molecular Physics (AREA)
Microscoopes, Condenser (AREA)
Length Measuring Devices By Optical Means (AREA)
Instruments For Measurement Of Length By Optical Means (AREA)

JP2017556932A 2015-06-01 2016-05-23 広視野顕微鏡を用いて試料の空間分解された高さ情報を確定するための方法および広視野顕微鏡 Active JP6595618B2 (ja)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
DE102015210016.2A DE102015210016A1 (de)	2015-06-01	2015-06-01	Verfahren zum Ermitteln einer ortsaufgelösten Höheninformation einer Probe mit einem Weitfeldmikroskop und Weitfeldmikroskop
DE102015210016.2		2015-06-01
PCT/EP2016/061581 WO2016193037A1 (fr)	2015-06-01	2016-05-23	Procédé pour la détermination d'une information de hauteur à résolution spatiale d'un échantillon au moyen d'un microscope à champ large et microscope à champ large

Publications (2)

Publication Number	Publication Date
JP2018520337A JP2018520337A (ja)	2018-07-26
JP6595618B2 true JP6595618B2 (ja)	2019-10-23

Family

ID=56092898

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
JP2017556932A Active JP6595618B2 (ja)	2015-06-01	2016-05-23	広視野顕微鏡を用いて試料の空間分解された高さ情報を確定するための方法および広視野顕微鏡

Country Status (4)

Country	Link
JP (1)	JP6595618B2 (fr)
CN (1)	CN107710046B (fr)
DE (1)	DE102015210016A1 (fr)
WO (1)	WO2016193037A1 (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE102018127281A1 (de) *	2018-10-31	2020-04-30	Carl Zeiss Microscopy Gmbh	Mikroskop und Verfahren zur Mikroskopie
DE102018219450A1 (de) *	2018-11-14	2020-05-14	Robert Bosch Gmbh	Verfahren zum Erzeugen eines Spektrums und Spektrometereinheit
LU101084B1 (de) *	2018-12-21	2020-06-22	Abberior Instruments Gmbh	Verfahren und Vorrichtung zum punktförmigen Beleuchten einer Probe in einem Mikroskiop
EP3786573A1 (fr) *	2019-08-30	2021-03-03	Klingelnberg GmbH	Dispositif optique de mesure de coordonnées et procédé de fonctionnement d'un tel dispositif
DE102019135521A1 (de) *	2019-12-20	2021-06-24	Carl Zeiss Microscopy Gmbh	Messanordnung, Lichtmikroskop und Messverfahren zur bildgebenden Tiefenmessung
DE102020200214A1 (de)	2020-01-09	2021-07-15	Hochschule für angewandte Wissenschaften Kempten Körperschaft des öffentlichen Rechts	Konfokale Messvorrichtung zur 3D-Vermessung einer Objektoberfläche
JP7629437B2 (ja)	2020-02-13	2025-02-13	浜松ホトニクス株式会社	撮像ユニット及び測定装置
DE102023120240B4 (de)	2023-07-31	2025-08-07	Jenoptik Optical Systems Gmbh	Aufnahmevorrichtung zum Erzeugen einer 3D-Aufnahme eines dreidimensionalen Objekts und Verfahren
DE102023132199A1 (de) *	2023-11-20	2025-05-22	Precitec Optronik Gmbh	Chromatisch-konfokale Messvorrichtung und Verfahren zur Messung des Abstands zu einem Objekt

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
ATE236412T1 (de) *	1997-10-22	2003-04-15	Max Planck Gesellschaft	Programmierbares räumlich lichtmoduliertes mikroskop und mikroskopieverfahren
DE102007018048A1 (de)	2007-04-13	2008-10-16	Michael Schwertner	Verfahren und Anordnung zur optischen Abbildung mit Tiefendiskriminierung
DE102012009836A1 (de) *	2012-05-16	2013-11-21	Carl Zeiss Microscopy Gmbh	Lichtmikroskop und Verfahren zur Bildaufnahme mit einem Lichtmikroskop
US9860520B2 (en) *	2013-07-23	2018-01-02	Sirona Dental Systems Gmbh	Method, system, apparatus, and computer program for 3D acquisition and caries detection
TWI465683B (zh) *	2013-08-20	2014-12-21	Univ Nat Taiwan	差動濾波式彩色共焦量測系統
DE102013016368B4 (de) *	2013-09-30	2024-05-16	Carl Zeiss Microscopy Gmbh	Lichtmikroskop und Mikroskopieverfahren zum Untersuchen einer mikroskopischen Probe

2015
- 2015-06-01 DE DE102015210016.2A patent/DE102015210016A1/de active Pending
2016
- 2016-05-23 JP JP2017556932A patent/JP6595618B2/ja active Active
- 2016-05-23 WO PCT/EP2016/061581 patent/WO2016193037A1/fr not_active Ceased
- 2016-05-23 CN CN201680029710.4A patent/CN107710046B/zh active Active

Also Published As

Publication number	Publication date
WO2016193037A1 (fr)	2016-12-08
CN107710046A (zh)	2018-02-16
JP2018520337A (ja)	2018-07-26
CN107710046B (zh)	2021-08-31
DE102015210016A1 (de)	2016-12-01

Publication	Publication Date	Title
JP6595618B2 (ja)	2019-10-23	広視野顕微鏡を用いて試料の空間分解された高さ情報を確定するための方法および広視野顕微鏡
CN108254909B (zh)	2021-07-06	光学显微镜和用于利用光学显微镜记录图像的方法
US10612913B2 (en)	2020-04-07	Apparatus and methods for performing tomography and/or topography measurements on an object
JP4747243B2 (ja)	2011-08-17	試料の光学的深部分解による光学的把握のための方法および装置
JP5792792B2 (ja)	2015-10-14	試料表面を結像する装置
JP5646604B2 (ja)	2014-12-24	物体を３次元的に測定するための方法および測定装置
US7274446B2 (en)	2007-09-25	Method and arrangement for the deep resolved optical recording of a sample
JP5536650B2 (ja)	2014-07-02	自己干渉蛍光顕微鏡検査のためのシステムと方法、及び、それに関連するコンピュータがアクセス可能な媒体
TWI743200B (zh)	2021-10-21	用於最佳化以成像為基礎之疊對度量之聚焦的系統及方法
JP6362498B2 (ja)	2018-07-25	微視的標本を検査するための光学顕微鏡および顕微鏡方法
US9696686B2 (en)	2017-07-04	Method and device for focussing a microscope automatically
JP2021515218A (ja)	2021-06-17	多層スタックの計測
CN110785692B (zh)	2021-12-31	用于拍摄图像的方法和显微镜系统
JP2008268387A (ja)	2008-11-06	共焦点顕微鏡
JP6018711B2 (ja)	2016-11-02	光断層観察装置
US12111455B2 (en)	2024-10-08	Detecting movements of a sample with respect to an objective
GB2537786A (en)	2016-10-26	Microspectroscopy device
JP2019525194A (ja)	2019-09-05	クロマティック共焦点センサ
JP7370326B2 (ja)	2023-10-27	大視野３ｄ分光顕微鏡法
KR101716452B1 (ko)	2017-03-15	디지털 홀로그래피 마이크로스코프를 이용한 고단차 측정 방법
JP5668566B2 (ja)	2015-02-12	顕微鏡装置および観察方法
JP5642411B2 (ja)	2014-12-17	波面測定方法、波面測定装置および顕微鏡
WO2019065271A1 (fr)	2019-04-04	Microscope confocal et système de création d'image

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