JP4039381B2 - ガラス組成物を用いた情報記録媒体用ガラス基板及びこれを用いた情報記録媒体 - Google Patents
ガラス組成物を用いた情報記録媒体用ガラス基板及びこれを用いた情報記録媒体 Download PDFInfo
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- JP4039381B2 JP4039381B2 JP2004088252A JP2004088252A JP4039381B2 JP 4039381 B2 JP4039381 B2 JP 4039381B2 JP 2004088252 A JP2004088252 A JP 2004088252A JP 2004088252 A JP2004088252 A JP 2004088252A JP 4039381 B2 JP4039381 B2 JP 4039381B2
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- 239000011521 glass Substances 0.000 title claims description 133
- 239000000758 substrate Substances 0.000 title claims description 85
- 239000000203 mixture Substances 0.000 title claims description 19
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 27
- 238000010828 elution Methods 0.000 claims description 25
- 239000003513 alkali Substances 0.000 claims description 22
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 16
- 230000009477 glass transition Effects 0.000 claims description 11
- 229910052744 lithium Inorganic materials 0.000 claims description 5
- 229910044991 metal oxide Inorganic materials 0.000 claims description 5
- 229910052700 potassium Inorganic materials 0.000 claims description 5
- 229910052708 sodium Inorganic materials 0.000 claims description 5
- 229910010413 TiO 2 Inorganic materials 0.000 claims description 4
- 229910052747 lanthanoid Inorganic materials 0.000 claims description 4
- -1 lanthanoid metal oxides Chemical class 0.000 claims description 4
- 229910052725 zinc Inorganic materials 0.000 claims description 3
- 150000001875 compounds Chemical class 0.000 claims description 2
- 230000000694 effects Effects 0.000 description 17
- 238000000034 method Methods 0.000 description 15
- 239000010410 layer Substances 0.000 description 13
- 238000005498 polishing Methods 0.000 description 13
- 239000000126 substance Substances 0.000 description 13
- 239000011241 protective layer Substances 0.000 description 8
- 230000003746 surface roughness Effects 0.000 description 8
- 238000004140 cleaning Methods 0.000 description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 229910001149 41xx steel Inorganic materials 0.000 description 5
- 229910000272 alkali metal oxide Inorganic materials 0.000 description 5
- 230000000052 comparative effect Effects 0.000 description 5
- 238000010438 heat treatment Methods 0.000 description 5
- 238000007373 indentation Methods 0.000 description 5
- 239000000155 melt Substances 0.000 description 5
- 238000005728 strengthening Methods 0.000 description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- 239000002994 raw material Substances 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 230000000087 stabilizing effect Effects 0.000 description 4
- 238000010998 test method Methods 0.000 description 4
- 229910000943 NiAl Inorganic materials 0.000 description 3
- NPXOKRUENSOPAO-UHFFFAOYSA-N Raney nickel Chemical compound [Al].[Ni] NPXOKRUENSOPAO-UHFFFAOYSA-N 0.000 description 3
- 229910001413 alkali metal ion Inorganic materials 0.000 description 3
- 239000002585 base Substances 0.000 description 3
- 229910052796 boron Inorganic materials 0.000 description 3
- 229910000420 cerium oxide Inorganic materials 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 238000007772 electroless plating Methods 0.000 description 3
- 230000005484 gravity Effects 0.000 description 3
- 238000005342 ion exchange Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 239000012528 membrane Substances 0.000 description 3
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 3
- 238000007517 polishing process Methods 0.000 description 3
- 238000001223 reverse osmosis Methods 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 238000003756 stirring Methods 0.000 description 3
- 239000005341 toughened glass Substances 0.000 description 3
- 229910000599 Cr alloy Inorganic materials 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 2
- 239000000156 glass melt Substances 0.000 description 2
- 239000000314 lubricant Substances 0.000 description 2
- 239000000696 magnetic material Substances 0.000 description 2
- 239000006249 magnetic particle Substances 0.000 description 2
- 239000010702 perfluoropolyether Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 239000005361 soda-lime glass Substances 0.000 description 2
- 239000002904 solvent Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 238000007088 Archimedes method Methods 0.000 description 1
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- 229910002441 CoNi Inorganic materials 0.000 description 1
- 229910018979 CoPt Inorganic materials 0.000 description 1
- 229910000684 Cobalt-chrome Inorganic materials 0.000 description 1
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910002546 FeCo Inorganic materials 0.000 description 1
- 229910052688 Gadolinium Inorganic materials 0.000 description 1
- 229910052689 Holmium Inorganic materials 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- NIPNSKYNPDTRPC-UHFFFAOYSA-N N-[2-oxo-2-(2,4,6,7-tetrahydrotriazolo[4,5-c]pyridin-5-yl)ethyl]-2-[[3-(trifluoromethoxy)phenyl]methylamino]pyrimidine-5-carboxamide Chemical compound O=C(CNC(=O)C=1C=NC(=NC=1)NCC1=CC(=CC=C1)OC(F)(F)F)N1CC2=C(CC1)NN=N2 NIPNSKYNPDTRPC-UHFFFAOYSA-N 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 229910052771 Terbium Inorganic materials 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
- 229910052769 Ytterbium Inorganic materials 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 150000001721 carbon Chemical class 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 150000004649 carbonic acid derivatives Chemical class 0.000 description 1
- 239000005345 chemically strengthened glass Substances 0.000 description 1
- 239000010952 cobalt-chrome Substances 0.000 description 1
- 239000008119 colloidal silica Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004031 devitrification Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007865 diluting Methods 0.000 description 1
- 239000012153 distilled water Substances 0.000 description 1
- 229910052634 enstatite Inorganic materials 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 239000006025 fining agent Substances 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 150000004679 hydroxides Chemical class 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 229910052746 lanthanum Inorganic materials 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000010687 lubricating oil Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- BBCCCLINBSELLX-UHFFFAOYSA-N magnesium;dihydroxy(oxo)silane Chemical compound [Mg+2].O[Si](O)=O BBCCCLINBSELLX-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 150000002823 nitrates Chemical class 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052761 rare earth metal Inorganic materials 0.000 description 1
- 230000003014 reinforcing effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000002791 soaking Methods 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
- 229920001187 thermosetting polymer Polymers 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- 229910000859 α-Fe Inorganic materials 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/089—Glass compositions containing silica with 40% to 90% silica, by weight containing boron
- C03C3/091—Glass compositions containing silica with 40% to 90% silica, by weight containing boron containing aluminium
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C3/00—Glass compositions
- C03C3/04—Glass compositions containing silica
- C03C3/076—Glass compositions containing silica with 40% to 90% silica, by weight
- C03C3/095—Glass compositions containing silica with 40% to 90% silica, by weight containing rare earths
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- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Glass Compositions (AREA)
- Magnetic Record Carriers (AREA)
- Optical Record Carriers And Manufacture Thereof (AREA)
Description
0.080<(R’Oの総量)/(SiO2+Al2O3+B2O3)<0.180
0.15<Al2O3/(SiO2+Al2O3+B2O3)<0.25
を満足するガラス組成物を用いて作製されたことを特徴とする情報記録媒体用ガラス基板が提供される。なお、以下「%」は特に断りのない限り「重量%」を意味するものとする。
Al2O3/B2O3>2.0 又は B2O3=0%
0.50<(R’Oの総量)/MOx<5.00
(式中、Kc:破壊靭性値(Pa・m1/2)、E:弾性率(Pa)、Hv:ビッカース硬度(Pa)、P:押し込み荷重(N)、C:クラック長さの平均の半分(m)、a:圧痕の対角線長さの平均の半分(m))
定められた量の原料粉末を白金るつぼに秤量して入れ、混合したのち、電気炉中で1,550℃で溶解した。原料が充分に溶解したのち、撹拌羽をガラス融液に挿入し、約1時間撹拌した。その後、撹拌羽を取り出し、30分間静置したのち、治具に融液を流しこむことによってガラスブロックを得た。その後各ガラスのガラス転移点付近までガラスブロックを再加熱し、徐冷して歪取りを行った。得られたガラスブロックを約1.5mmの厚さ、2.5インチの円盤形状にスライスし、内周,外周を同心円としてカッターを用いて切り出した。そして、両面を粗研磨及び研磨、洗浄を行って実施例及び比較例のガラス基板を作製した。作製したガラス基板について下記物性評価を行った。結果を合わせて表1〜表9に示す。
粉末状に調整したガラス試料を、示差熱測定装置によって室温〜900℃の温度範囲を10℃/minの昇温速度で加熱し測定した。
ヤング率Eを「JIS R 1602」ファインセラミックスの弾性試験方法の動的弾性率試験方法に準じて測定し、これをアルキメデス法により25℃の蒸留水中で測定した比重値ρで割って比弾性率を算出した。
ビッカース硬度試験機を用い荷重100g、負荷時間15secの条件下にて測定した。
ビッカース硬度試験機を用い、荷重500g、負荷時間15secの条件下にてビッカース圧子にて圧痕をつけ前記式から算出した。
ガラス基板の表面を酸化セリウムで研磨してRa値が2nm以下の平滑面とした後、表面を洗浄し、80℃の逆浸透膜水50ml中に24h浸漬した後、ICP発光分光分析装置でその溶出液を分析し算出した。
ガラス基板の表面を酸化セリウムで研磨してRa値が2nm以下の平滑面とした後、表面を洗浄し、80℃の逆浸透膜水50ml中に24h浸漬した後、ICP発光分光分析装置でその溶出液を分析し算出した。
2 磁性膜
D 磁気ディスク
Claims (8)
- 重量%で、
SiO2:60.2〜70%、
Al2O3:1〜20%、
B2O3:0〜10%(ただし、ゼロを含む)、
SiO2+Al2O3+B2O3:60〜90%、
R2O(R=Li,Na,K)の総量:3.0〜15%、
R’O(R’=Mg,Zn)の総量:2.0〜15%、
MOx(TiO2+ZrO2+LnxOy):1.0〜20%(LnxOyはランタノイ
ド金属酸化物及びY2O3,Nb2O5,Ta2O5からなる群より選ばれた少なくとも
1つの化合物を意味する)
の各ガラス成分を有し、下記式
0.080<(R’Oの総量)/(SiO2+Al2O3+B2O3)<0.180
0.15<Al2O3/(SiO2+Al2O3+B2O3)<0.25
を満足するガラス組成物を用いて作製されたことを特徴とする情報記録媒体用ガラス基板。 - 請求項1記載のガラス組成物で、
重量%で、
B2O3:0.5〜10%、
であることを特徴とする情報記録媒体用ガラス基板。 - 請求項1又は2記載のガラス組成物で、
重量%で、
Al2O3:13.1〜20%、
R2O(R=Li,Na,K)の総量:3.0〜9.5%、
であることを特徴とする情報記録媒体用ガラス基板。 - 請求項1〜3のいずれかに記載のガラス組成物において、さらに下記式
Al2O3/B2O3>2.0 又は B2O3=0%
を満足することを特徴とする情報記録媒体用ガラス基板。 - 請求項1〜4のいずれかに記載のガラス組成物において、さらに下記式
0.50<(R’Oの総量)/MOx<5.00
を満足することを特徴とする情報記録媒体用ガラス基板。 - 比弾性率(E/ρ)が33以上、ビッカース硬度Hvが550〜675、アルカリ溶出
量Aが2.5インチディスク当たり200ppb以下、Si溶出量Sが2.5インチディ
スク当たり500ppb以下、破壊靭性値Kcが0.85(MPa/m1/2)より大き
く、ガラス転移点Tgが550℃以上である請求項1〜5のいずれかに記載の情報記録媒体用ガラス基板。 - 下記式、
Tg/Hv>0.85、
Tg×Kc>500
Tg×Kc/Hv>0.80
を満足する請求項6記載の情報記録媒体用ガラス基板。 - 請求項1〜7のいずれかに記載のガラス基板に情報記録層を形成したことを特徴とする情報記録媒体。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004088252A JP4039381B2 (ja) | 2004-03-25 | 2004-03-25 | ガラス組成物を用いた情報記録媒体用ガラス基板及びこれを用いた情報記録媒体 |
| US10/957,899 US7687419B2 (en) | 2004-03-25 | 2004-10-04 | Glass composition, glass susbstrate employing it for an information recording medium, and information recording medium employing it |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004088252A JP4039381B2 (ja) | 2004-03-25 | 2004-03-25 | ガラス組成物を用いた情報記録媒体用ガラス基板及びこれを用いた情報記録媒体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005272212A JP2005272212A (ja) | 2005-10-06 |
| JP4039381B2 true JP4039381B2 (ja) | 2008-01-30 |
Family
ID=34990783
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004088252A Expired - Fee Related JP4039381B2 (ja) | 2004-03-25 | 2004-03-25 | ガラス組成物を用いた情報記録媒体用ガラス基板及びこれを用いた情報記録媒体 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7687419B2 (ja) |
| JP (1) | JP4039381B2 (ja) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10064808B4 (de) * | 2000-12-22 | 2005-09-01 | Schott Ag | Zinkoxidhaltiges Borosilicatglas und dessen Verwendungen |
| JP4530618B2 (ja) * | 2002-09-27 | 2010-08-25 | コニカミノルタオプト株式会社 | ガラス組成物及びガラス基板 |
| EP1426345A1 (en) * | 2002-12-03 | 2004-06-09 | Corning Incorporated | Borosilicate glass compositions and uses therof |
| US7566673B2 (en) * | 2003-10-31 | 2009-07-28 | Konica Minolta Opto, Inc. | Glass substrate for an information recording medium and information recording medium employing it |
| MY149133A (en) * | 2006-07-03 | 2013-07-15 | Konica Minolta Opto Inc | Method for fabricating a glass substrate, magnetic disk, and method for fabricating the same |
| JPWO2008004469A1 (ja) * | 2006-07-03 | 2009-12-03 | コニカミノルタオプト株式会社 | ガラス基板の洗浄方法、製造方法およびそれを用いた磁気ディスク |
| WO2008004472A1 (fr) * | 2006-07-03 | 2008-01-10 | Konica Minolta Opto, Inc. | Procédé de fabrication d'un substrat de verre pour support d'enregistrement d'informations et disque magnétique utilisant ce procédé |
| JP5083212B2 (ja) * | 2006-07-03 | 2012-11-28 | コニカミノルタアドバンストレイヤー株式会社 | ガラス基板の洗浄方法、製造方法およびそれを用いた磁気ディスク |
| WO2008149858A1 (ja) * | 2007-06-07 | 2008-12-11 | Nippon Electric Glass Co., Ltd. | 強化ガラス基板及びその製造方法 |
| EP2206691A4 (en) * | 2007-11-06 | 2010-12-29 | Asahi Glass Co Ltd | GLASS PLATE FOR A SUBSTRATE |
| JP5375608B2 (ja) * | 2008-01-28 | 2013-12-25 | 旭硝子株式会社 | データ記憶媒体基板用ガラス、データ記憶媒体用ガラス基板および磁気ディスク |
| JP5072657B2 (ja) * | 2008-03-05 | 2012-11-14 | 株式会社松風 | アルミノシリケートガラスおよびセラミックス系歯冠陶材用の色調調整組成物 |
| US8895165B2 (en) * | 2008-09-10 | 2014-11-25 | Hoya Corporation | Method of manufacturing a glass substrate for a magnetic disk, glass substrate for a magnetic disk, method of manufacturing a magnetic disk, and magnetic disk |
| JP5699434B2 (ja) * | 2009-04-02 | 2015-04-08 | 旭硝子株式会社 | 情報記録媒体基板用ガラス、情報記録媒体用ガラス基板および磁気ディスク |
| JP2011040145A (ja) * | 2009-07-17 | 2011-02-24 | Ohara Inc | 情報記録媒体用基板の製造方法 |
| US8603350B2 (en) | 2009-07-17 | 2013-12-10 | Ohara Inc. | Method of manufacturing substrate for information storage media |
| CN102471133B (zh) | 2009-08-10 | 2014-10-15 | Hoya株式会社 | 磁记录介质基板用玻璃、磁记录介质基板及其制造方法、以及磁记录介质 |
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2004
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| US20050215414A1 (en) | 2005-09-29 |
| JP2005272212A (ja) | 2005-10-06 |
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