JP3577601B2 - Atmospheric pressure glow discharge plasma treatment method - Google Patents
Atmospheric pressure glow discharge plasma treatment method Download PDFInfo
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- JP3577601B2 JP3577601B2 JP23302693A JP23302693A JP3577601B2 JP 3577601 B2 JP3577601 B2 JP 3577601B2 JP 23302693 A JP23302693 A JP 23302693A JP 23302693 A JP23302693 A JP 23302693A JP 3577601 B2 JP3577601 B2 JP 3577601B2
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- 238000000034 method Methods 0.000 title description 11
- 238000009832 plasma treatment Methods 0.000 title description 3
- 239000007789 gas Substances 0.000 claims description 24
- 239000010409 thin film Substances 0.000 claims description 14
- 239000011261 inert gas Substances 0.000 claims description 13
- 238000003672 processing method Methods 0.000 claims description 11
- 239000000126 substance Substances 0.000 claims description 11
- 239000007787 solid Substances 0.000 claims description 3
- 230000000052 comparative effect Effects 0.000 description 8
- 239000010408 film Substances 0.000 description 8
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 6
- 239000001307 helium Substances 0.000 description 5
- 229910052734 helium Inorganic materials 0.000 description 5
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 229910052786 argon Inorganic materials 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 239000004809 Teflon Substances 0.000 description 2
- 229920006362 Teflon® Polymers 0.000 description 2
- 235000005811 Viola adunca Nutrition 0.000 description 2
- 240000009038 Viola odorata Species 0.000 description 2
- 235000013487 Viola odorata Nutrition 0.000 description 2
- 235000002254 Viola papilionacea Nutrition 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000010526 radical polymerization reaction Methods 0.000 description 2
- 238000004380 ashing Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000007348 radical reaction Methods 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- SWGJCIMEBVHMTA-UHFFFAOYSA-K trisodium;6-oxido-4-sulfo-5-[(4-sulfonatonaphthalen-1-yl)diazenyl]naphthalene-2-sulfonate Chemical compound [Na+].[Na+].[Na+].C1=CC=C2C(N=NC3=C4C(=CC(=CC4=CC=C3O)S([O-])(=O)=O)S([O-])(=O)=O)=CC=C(S([O-])(=O)=O)C2=C1 SWGJCIMEBVHMTA-UHFFFAOYSA-K 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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Description
【0001】
【産業上の利用分野】
本発明は大気圧グロ−放電プラズマ処理法に関するもので、特に、大気圧グロ−放電処理によって、被処理物質の表面に均一な処理層又は薄膜を形成する大気圧グロ−放電プラズマ処理法に関する。
【0002】
【従来の技術】
大気圧中でプラズマ励起を行い、物質の表面に親水性の処理層を形成したり、或いは、反応性の有機物の蒸気を微量添加して大気圧中でプラズマ励起を行い、物質表面でラジカル重合させて薄膜を形成させる処理方法については、例えば、特公平3−236425号公報又は特公平4−74525号公報で述べられているように既に知られている。
【0003】
そして、これらの方法は、いずれも平行電極の少なくとも一方の電極に固体誘電体を配設してなる容器中の空気をヘリウムガス、アルゴンガスとヘリウムガスの混合ガスのような不活性ガスで置換し、平行電極間に高周波高電圧を印加してグロ−放電を発生せしめ、プラズマ励起を行うものである。この処理方法を行う装置の一例を図1に示す。
【0004】
図1において、ガス導入口3及びガス排出口4を有する容器1中に上部電極2及び下部電極6を平行に対向させて配設させる。これらの電極表面は誘電体5で覆うと共にその電極の一方を加熱用電源により加熱する。このような装置を使用してガス導入口3より不活性ガス又は微量の反応性ガスを混合した不活性ガスを導入し、他方、容器内の空気をガス排出口4より排出して容器内を不活性ガス雰囲気下とし、両電極間に高周波電圧を印加してグロ−放電を行う。両電極間に位置せしめた物質は、このグロ−放電によりその表面がプラズマ処理される。
【0005】
容器内が不活性ガスの状態でプラズマ処理を行えば、平行電極の間に位置せしめた物質表面の清浄化、いわゆるアッシングが行われ、表面の親水性が著しく向上し、接触角が低下する。
また、不活性ガスの中に反応性ガスや常温で液体または昇華性のある常温で液体の有機物を混合すると、プラズマのエネルギ−によりラジカル反応またはラジカル重合を起こし、物質表面に薄膜を形成する。
【0006】
これらの方法は高真空の必要がないために極めて経済性に富んだ処理方法である。ただ高周波の高電圧として周波数は通常1KHzから100KHz、電圧は1000Vから6000Vを使用する関係上、誘電体の表面で沿面放電が起こり、また先端ほど放電しやすいから被処理物質や電極の形により放電に強弱が生じ、同様に励起されたプラズマのエネルギ−も変化する傾向がある。この問題は、親水化の場合は、被処置物質の表面の接触角のムラを生じ、漏れのムラとなって現れ、薄膜形成では、薄膜の厚みのムラとなって現れ、均一な膜厚の処理膜が得られない。
特にシリコンウエハの表面に薄膜を形成する電子材料用には、でき得る限り均一な被膜を要求されるからこのような現象は、好ましくない。
【0007】
【発明が解決しようとする課題】
本発明者はこの欠点を改良すべく努力した結果、高周波の高電圧を印加するに当たり、逆電圧の直流を一定時間高周波と交互に与えることにより従来の高周波高電圧だけの場合と比較して著しく放電が均一化され、したがって物質表面の親水化は全くムラを起こさず、薄膜形成も厚みを均一化することを見出し、本発明を完成したもので、本発明の目的は、従来の方法における沿面放電や先端放電によるグロ−放電の強弱により生じやすいプラズマ処理のむらを解決し、高周波電圧の印加方法を改良したグロ−放電プラズマ処理法に関するものである。
【0008】
【課題を解決するための手段】
本発明の要旨は、対向する平行電極の少なくとも一方の電極の表面に固体誘電体を配設してなる電極を有するプラズマ反応装置に、該反応装置内に不活性ガス、又は、不活性ガスと反応性ガスを導入し、電極間に電圧を印加して大気圧グロ−放電プラズマを励起させ、対向する電極の間に位置せしめた被処理物質の表面を親水化、または薄膜形成を行う大気圧グロ−放電プラズマ処理法において、前記グロ−放電を発生させる電圧として、高周波電圧と直流逆電圧を交互に高電圧側に印加してグロ−放電を発生せしめることを特徴とする大気圧グロ−放電プラズマ処理法である。
【0009】
以下、本発明について、更に詳細に説明する。
本発明における大気圧グロ−放電による被処理物質の表面を親水化、または薄膜形成を行う処理法の処理条件、或いは、被処理物質等は従来の処理方法と異とならない。ただ、ただ本発明においては、大気圧グロ−放電を発生させる電圧の印加方法として高周波電圧と直流逆電圧を交互に印加する点に特徴を有する。
しかして、この電圧の印加方法の基本回路の一例を図2及び図3に示す。すなわち、高周波の電源は、直流をインバ−タ−により交流(高周波)に交換し、トランスによって昇圧して高電圧を得(図2)、得られた電圧を整流して負電圧のバイアス電源を作り(図3)、これをグロ−放電処理中にフリップフロップ等のスイッチング回路を通して瞬時高圧側電極に与える。この操作を交互に行う事で放電が停止することなく処理は続行される。バイアス電圧は別の電源で作って与えても構わない。
【0010】
処理時間が30秒の場合、通常の高電圧を5秒、負直流電圧を1秒の繰り返しを5回おこなって、30秒の処理を行えば良い。
負電圧の印加時間は、0.1〜5秒、好ましくは0.5〜2秒である。0.1秒より少ないと効果は少なく、5秒より長いと放電が不安定となる。
次に実施例及び比較例によって本発明をより具体的に説明する。
【0011】
【実施例及び比較例】
比較例1
図1のプラズマ処理装置を用いてフッ素樹脂テフロンの表面を処理して親水化を行なった。
テフロンとしては最も濡れにくいFEPを使用した。この材料は、その表面に1滴の水滴を落とすと未処理の場合、接触角は103度で殆ど水玉に近い。
電極として、ステンレス製直径80mmに誘電体として直径100mm、厚み0.2mmの雲母板を張ったものを使用した。なお、この実施例では平行電極の両面に同じ誘電体を張り付けた。下部電極の上に100mm×100mmで厚さ0.1mmのFEPフィルムを置き、処理装置中の空気をヘリウム40部、アルゴン60部の混合ガスで置換した。この状態で平行電極間に5KHz、4000Vの高周波電圧を印加した。電極間の間隙は8mmである。青紫色のグロ−放電で発生し、プラズマ励起されるから20秒このまま通電し、その後取り出して表面の接触角を測定したところ図4Aに示すように、接触角は30゜〜50゜の範囲にあって若干のムラが見られた。
【0012】
実施例1
比較例1と同一の装置でガスも同様の混合ガスを使用し、ただ、印加電圧として、5KHz、4000Vの高周波電圧を4秒、続いて4000Vの直流負電圧を1秒、この繰り返しを20秒間行なってプラズマ処理を行なった。グロ−放電の発生には全く変化なく直流を印加した時、青紫色の光がやや弱く感じられた程度である。
ついで、処理して得られたFEPフィルムを取り出して同様に接触角を測定したところ図4Bに示したように、30゜〜35゜の範囲にあって、極めて平均化されているのがよく分かる。
【0013】
実施例2
比較例1に示したと同様の装置を使用し、下部電極の上に直径60mmのシリコンウエハを位置せしめ、且つ、下部電極の温度を200℃に上げシリコンウエハを同温度に加熱した。不活性ガスとしてヘリウムガスを使用し、反応性ガスであるメタンガスを少量混合した。混合比はヘリウム93部、メタン7部である。上記混合ガスで容器の空気を置換し、完全に置換した時5KHz、2500Vの高周波電圧を電極間に印加した。美しい紫紅色のグロ−放電が発生しプラズマ励起される。このまま5分間通電を持続し、ウエハの表面に薄膜を形成させた。5分後ピンセットでウエハを取り出し、その表面に光をあてると形成された薄膜は干渉色を発し、虹色に見えた。薄膜の薄い部分は青く、厚い部分は赤く、中間の厚みは緑色となり、これが同心円のように見え薄膜が均一でないことを示した。
全く同様な方法で電圧の印加方法を変え、5KHz、2500Vの高周波電圧を10秒、続いて直流2500Vの負電圧を1秒印加し、この印加電圧を5分間繰り返し、処理したウエハを取り出し、その表面を観察したところ干渉色が殆ど黄赤色の1色で虹色にはならず、極めて均一な薄膜が形成されていることが分かった。
【0014】
実施例3
比較例1と同様の装置を使用し下部電極の上に50mm角、厚み0.5mmのガラス板を置き、不活性ガスとしてアルゴンガス99部を使用し、これにグロ−放電を起こさせる為に6ppmのアセトンと反応性ガスとしてCF41部を混合し、この混合ガスで容器中の空気を置換した。
完全に置換が終了した時8KHz、3500Vの高周波電圧を印加した。美しい黄桃色のグロ−放電が発生しプラズマ励起される。そのまま2分間通電した。処理後、ガラス板を取り出し接触角を測定したが、測定場所により45度から60度までの変化があった。
次に全く同様の方法で電圧の印加方法のみ8KHz、2500Vの高周波電圧を8秒、続いて、直流2500Vの負電圧を2秒の繰り返しで2分間通電した。グロ−放電には全く変化は見られなかった。処理後、ガラス板を取り出し接触角を測定したが、50度から55度でムラが大幅に少なく均一に近い処理がなされていた。
【0015】
【発明の効果】
以上述べたように、本願発明においては、高周波電圧と直流逆電圧を交互に高電圧側に印加してグロ−放電を発生せしめることによって、雰囲気が不活性ガスの場合には被処理物質の表面に均一な親水性の処理層が形成され、接触角にムラを生じること無く、又、反応性ガスと不活性ガスを存在させて薄膜を形成する場合、均一な処理膜が形成され、例えばシリコンウエハのようにその表面に均一な被膜を形成する場合に特に有効である。
【図面の簡単な説明】
【図1】大気圧グロ−放電によるプラズマ処理を行う装置の断面図を示す。
【図2】本発明における高電圧発生の一例を示す回路図である。
【図3】本発明にかかる印加電圧の一例を示す回路図である。
【図4】比較例1及び実施例1によって得られた表面の接触角の測定結果を示す。
Aが比較例1、Bが実施例1である。
【符号の説明】
1 容器 5 誘電体
2 上部電極 6 下部電極
3 ガス入口 7 加熱用電源
4 ガス出口[0001]
[Industrial applications]
The present invention relates to an atmospheric pressure glow discharge plasma processing method, and more particularly to an atmospheric pressure glow discharge plasma processing method for forming a uniform processing layer or thin film on the surface of a substance to be processed by the atmospheric pressure glow discharge processing.
[0002]
[Prior art]
Plasma excitation is performed at atmospheric pressure to form a hydrophilic treatment layer on the surface of the substance, or plasma is excited at atmospheric pressure by adding a small amount of reactive organic vapor to radical polymerization on the surface of the substance. A processing method for forming a thin film by such a method is already known, for example, as described in Japanese Patent Publication No. 3-236425 or Japanese Patent Publication No. 4-74525.
[0003]
In each of these methods, the air in a container in which a solid dielectric is disposed on at least one of the parallel electrodes is replaced with an inert gas such as helium gas or a mixed gas of argon gas and helium gas. Then, a high-frequency high voltage is applied between the parallel electrodes to generate a glow discharge to excite the plasma. FIG. 1 shows an example of an apparatus for performing this processing method.
[0004]
In FIG. 1, an upper electrode 2 and a
[0005]
If the plasma treatment is performed in a state where the inside of the container is an inert gas, the surface of the substance located between the parallel electrodes is cleaned, that is, ashing is performed, and the hydrophilicity of the surface is significantly improved, and the contact angle is reduced.
In addition, when a reactive gas or a liquid at room temperature or an organic substance that is sublimable at room temperature is mixed with an inert gas, radical reaction or radical polymerization is caused by the energy of plasma, and a thin film is formed on the surface of the material.
[0006]
These methods are extremely economical because no high vacuum is required. However, since the frequency is usually 1KHz to 100KHz and the voltage is 1000V to 6000V as a high frequency high voltage, creeping discharge occurs on the surface of the dielectric, and the tip is easier to discharge. And the energy of the excited plasma also tends to change. In the case of hydrophilization, this problem causes uneven contact angles on the surface of the substance to be treated and appears as uneven leakage. In the case of forming a thin film, it appears as uneven thickness of the thin film. A processed film cannot be obtained.
In particular, such a phenomenon is not preferable for an electronic material for forming a thin film on the surface of a silicon wafer since a coating as uniform as possible is required.
[0007]
[Problems to be solved by the invention]
As a result of the inventor's efforts to remedy this drawback, when applying a high-frequency high voltage, by alternately applying a reverse voltage direct current and a high-frequency for a certain period of time, the present inventors have made a remarkable improvement compared to the conventional high-frequency high voltage alone. It has been found that the discharge is made uniform, the surface of the material is not hydrophilized at all, and the formation of a thin film is made uniform in thickness, and the present invention has been completed. BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a glow-discharge plasma processing method in which unevenness of plasma processing which is apt to occur due to the intensity of glow discharge due to electric discharge or tip discharge is solved, and a method of applying a high-frequency voltage is improved.
[0008]
[Means for Solving the Problems]
The gist of the present invention is to provide a plasma reactor having an electrode in which a solid dielectric is disposed on the surface of at least one of the opposed parallel electrodes, an inert gas in the reactor, or an inert gas. Atmospheric pressure at which a reactive gas is introduced, a voltage is applied between the electrodes to excite the atmospheric pressure glow-discharge plasma, and the surface of the substance to be treated positioned between the opposing electrodes is hydrophilized or a thin film is formed. In the glow discharge plasma processing method, a glow discharge is generated by alternately applying a high frequency voltage and a DC reverse voltage to a high voltage side as a voltage for generating the glow discharge, thereby generating a glow discharge. This is a plasma processing method.
[0009]
Hereinafter, the present invention will be described in more detail.
The processing conditions of the processing method for hydrophilizing the surface of the substance to be treated or forming a thin film by the atmospheric pressure glow discharge in the present invention, or the substance to be treated and the like do not differ from the conventional treatment method. However, the present invention is characterized in that a high frequency voltage and a DC reverse voltage are alternately applied as a method of applying a voltage for generating an atmospheric pressure glow discharge.
FIGS. 2 and 3 show an example of a basic circuit of this voltage application method. That is, a high-frequency power source exchanges a direct current into an alternating current (high frequency) by an inverter, boosts a voltage by a transformer to obtain a high voltage (FIG. 2), rectifies the obtained voltage, and supplies a negative voltage bias power source. It is made (FIG. 3) and supplied to the high voltage side electrode instantaneously through a switching circuit such as a flip-flop during the glow discharge process. By alternately performing this operation, the process is continued without stopping the discharge. The bias voltage may be generated by another power supply.
[0010]
When the processing time is 30 seconds, the normal high voltage is repeated for 5 seconds and the negative DC voltage is repeated for 1 second five times to perform the processing for 30 seconds.
The application time of the negative voltage is 0.1 to 5 seconds, preferably 0.5 to 2 seconds. If the time is shorter than 0.1 second, the effect is small, and if it is longer than 5 seconds, the discharge becomes unstable.
Next, the present invention will be described more specifically with reference to Examples and Comparative Examples.
[0011]
[Examples and Comparative Examples]
Comparative Example 1
The surface of the fluororesin Teflon was treated for hydrophilicity using the plasma processing apparatus shown in FIG.
As the Teflon, FEP which is the least wet was used. When one drop of water is dropped on the surface of this material, when it is untreated, the contact angle is 103 degrees and almost close to a polka dot.
The electrode used was a stainless steel 80 mm diameter with a mica plate having a diameter of 100 mm and a thickness of 0.2 mm as a dielectric. In this example, the same dielectric was attached to both surfaces of the parallel electrode. An FEP film having a size of 100 mm × 100 mm and a thickness of 0.1 mm was placed on the lower electrode, and the air in the processing apparatus was replaced with a mixed gas of 40 parts of helium and 60 parts of argon. In this state, a high frequency voltage of 5 kHz and 4000 V was applied between the parallel electrodes. The gap between the electrodes is 8 mm. It is generated by a blue-violet glow discharge and is energized as it is for 20 seconds after being excited by plasma, and then taken out and measured for a contact angle of the surface. As shown in FIG. 4A, the contact angle is in a range of 30 ° to 50 °. There was some unevenness.
[0012]
Example 1
The same mixture gas was used in the same apparatus as in Comparative Example 1, but the applied voltage was 5 KHz, 4000 V high-frequency voltage for 4 seconds, followed by 4000 V DC negative voltage for 1 second, and repeated for 20 seconds. And plasma treatment was performed. When a direct current was applied without any change in the generation of glow discharge, blue-violet light was felt slightly weak.
Then, the FEP film obtained by the treatment was taken out and the contact angle was measured in the same manner. As shown in FIG. 4B, it was well understood that the FEP film was in the range of 30 ° to 35 ° and extremely averaged. .
[0013]
Example 2
Using a device similar to that shown in Comparative Example 1, a silicon wafer having a diameter of 60 mm was positioned on the lower electrode, and the temperature of the lower electrode was raised to 200 ° C. to heat the silicon wafer to the same temperature. Helium gas was used as an inert gas, and a small amount of methane gas as a reactive gas was mixed. The mixing ratio is 93 parts of helium and 7 parts of methane. The air in the container was replaced with the above mixed gas, and when completely replaced, a high frequency voltage of 5 KHz and 2500 V was applied between the electrodes. A beautiful purple-red glow discharge is generated and plasma is excited. The energization was continued for 5 minutes to form a thin film on the surface of the wafer. After 5 minutes, the wafer was taken out with tweezers and illuminated on the surface of the wafer. The formed thin film emitted an interference color and appeared rainbow-colored. The thin part of the film is blue, the thick part is red, and the intermediate thickness is green, which looks like concentric circles, indicating that the film is not uniform.
The voltage application method was changed in exactly the same manner, and a high frequency voltage of 5 KHz and 2500 V was applied for 10 seconds, followed by a negative voltage of DC 2500 V for 1 second, and the applied voltage was repeated for 5 minutes. Observation of the surface revealed that the interference color was almost yellow-red, not iridescent, and that a very uniform thin film was formed.
[0014]
Example 3
A 50 mm square, 0.5 mm thick glass plate was placed on the lower electrode using the same device as in Comparative Example 1, and 99 parts of argon gas was used as an inert gas to cause a glow discharge. 6 ppm of acetone and 1 part of CF 4 as a reactive gas were mixed, and the air in the container was replaced with the mixed gas.
When the replacement was completed, a high frequency voltage of 8 kHz and 3500 V was applied. A beautiful yellow-pink glow discharge is generated to excite the plasma. Electricity was supplied for 2 minutes. After the treatment, the glass plate was taken out and its contact angle was measured.
Next, in exactly the same manner, a high frequency voltage of 8 kHz and 2500 V was applied for 8 seconds, and a negative voltage of 2500 V DC was applied for 2 minutes with a repetition of 2 seconds. No change was observed in the glow discharge. After the treatment, the glass plate was taken out and the contact angle was measured, and the treatment was substantially uniform at 50 to 55 degrees with little unevenness.
[0015]
【The invention's effect】
As described above, in the present invention, the high-frequency voltage and the DC reverse voltage are alternately applied to the high voltage side to generate a glow discharge. In the case where a uniform hydrophilic processing layer is formed and a thin film is formed without causing uneven contact angles and in the presence of a reactive gas and an inert gas, a uniform processing film is formed, for example, silicon. This is particularly effective when a uniform film is formed on the surface of a wafer, for example.
[Brief description of the drawings]
FIG. 1 is a cross-sectional view of an apparatus for performing plasma processing by atmospheric pressure glow discharge.
FIG. 2 is a circuit diagram showing an example of high voltage generation in the present invention.
FIG. 3 is a circuit diagram showing an example of an applied voltage according to the present invention.
FIG. 4 shows the measurement results of the contact angle of the surface obtained by Comparative Example 1 and Example 1.
A is Comparative Example 1 and B is Example 1.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Container 5 Dielectric 2
Claims (2)
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| Application Number | Priority Date | Filing Date | Title |
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| JP23302693A JP3577601B2 (en) | 1993-09-20 | 1993-09-20 | Atmospheric pressure glow discharge plasma treatment method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP23302693A JP3577601B2 (en) | 1993-09-20 | 1993-09-20 | Atmospheric pressure glow discharge plasma treatment method |
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| Publication Number | Publication Date |
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| JPH0785997A JPH0785997A (en) | 1995-03-31 |
| JP3577601B2 true JP3577601B2 (en) | 2004-10-13 |
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| JP23302693A Expired - Fee Related JP3577601B2 (en) | 1993-09-20 | 1993-09-20 | Atmospheric pressure glow discharge plasma treatment method |
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| WO1999040642A1 (en) * | 1998-02-06 | 1999-08-12 | Nisshinbo Industries, Inc. | Separator for fuel cells and method of manufacturing the same |
| EP1448030A4 (en) | 2002-08-30 | 2006-11-22 | Sekisui Chemical Co Ltd | Plasma processing system |
| JP4141803B2 (en) * | 2002-11-05 | 2008-08-27 | シャープ株式会社 | Plasma processing equipment |
| EP2326151A1 (en) * | 2009-11-24 | 2011-05-25 | AGC Glass Europe | Method and device for polarising a DBD electrode |
| WO2022018861A1 (en) * | 2020-07-22 | 2022-01-27 | 国立大学法人大阪大学 | Method of argon-based atmospheric-pressure plasma treatment and method of chemical vapor machining with atmospheric-pressure plasma |
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| JPS5368171A (en) * | 1976-11-30 | 1978-06-17 | Hitachi Ltd | Method and apparatus for plasma treatment |
| JPH088237B2 (en) * | 1986-10-17 | 1996-01-29 | 株式会社日立製作所 | Plasma processing method |
| JP3063769B2 (en) * | 1990-07-17 | 2000-07-12 | イーシー化学株式会社 | Atmospheric pressure plasma surface treatment method |
| JP2524942B2 (en) * | 1992-07-27 | 1996-08-14 | 新日本製鐵株式会社 | Plasma surface treatment equipment |
| JPH06204182A (en) * | 1993-01-05 | 1994-07-22 | Nippon Steel Corp | Etching device |
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