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JP2712661B2 - How to adjust the electroplating bath - Google Patents

How to adjust the electroplating bath

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Publication number
JP2712661B2
JP2712661B2 JP1297128A JP29712889A JP2712661B2 JP 2712661 B2 JP2712661 B2 JP 2712661B2 JP 1297128 A JP1297128 A JP 1297128A JP 29712889 A JP29712889 A JP 29712889A JP 2712661 B2 JP2712661 B2 JP 2712661B2
Authority
JP
Japan
Prior art keywords
plating bath
ion
concentration
sodium sulfate
ion concentration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1297128A
Other languages
Japanese (ja)
Other versions
JPH03158500A (en
Inventor
正 野中
桂次 田中
隆 塩原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Sumitomo Metal Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Industries Ltd filed Critical Sumitomo Metal Industries Ltd
Priority to JP1297128A priority Critical patent/JP2712661B2/en
Publication of JPH03158500A publication Critical patent/JPH03158500A/en
Application granted granted Critical
Publication of JP2712661B2 publication Critical patent/JP2712661B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、硫酸性電気メッキに使用されるメッキ浴の
硫酸ナトリウム濃度を正確に管理する電気メッキ浴の調
整方法に関する。
Description: BACKGROUND OF THE INVENTION The present invention relates to a method for adjusting an electroplating bath for accurately controlling the concentration of sodium sulfate in a plating bath used for sulfate electroplating.

〔従来の技術〕[Conventional technology]

電気亜鉛メッキに代表される硫酸性電気メッキのメッ
キ浴には、メッキ通電時の省電力を図るために、電解支
持塩として硫酸ナトリウムが投入されている。この電解
支持塩としては、他に酢酸ナトリウム、硫酸アンモニウ
ム等を使用可能であるが、操業環境、廃液処理の問題で
一般には硫酸ナトリウムが用いられている。
In a plating bath of sulfuric acid electroplating represented by electrogalvanizing, sodium sulfate is supplied as an electrolytic supporting salt in order to save power when plating is conducted. Other examples of the electrolytic supporting salt include sodium acetate, ammonium sulfate, and the like. However, sodium sulfate is generally used due to problems in operating environment and waste liquid treatment.

メッキ浴に投入された硫酸ナトリウムは、メッキ反応
には直接関与せず、陰極、陽極間の電気抵抗を小さくし
て省電力に寄与し、メッキ操業の進行に伴って消耗され
る。従って、省電力効果を維持するためには、硫酸ナト
リウムを補給し続け、メッキ浴の硫酸ナトリウム濃度を
適正値に維持管理することが必要になる。すなわち、メ
ッキ浴の硫酸ナトリウム濃度を高くしすぎるとメッキ表
面にメッキ焦げが発生し、逆に、その濃度を低くしすぎ
ると十分な省電力効果が得られなくなる。
The sodium sulfate put into the plating bath does not directly participate in the plating reaction, reduces the electric resistance between the cathode and the anode, contributes to power saving, and is consumed as the plating operation proceeds. Therefore, in order to maintain the power saving effect, it is necessary to keep replenishing sodium sulfate and maintain the concentration of sodium sulfate in the plating bath at an appropriate value. That is, if the concentration of sodium sulfate in the plating bath is too high, burning of the plating surface occurs, and if the concentration is too low, a sufficient power saving effect cannot be obtained.

従来、メッキ浴の硫酸ナトリウム濃度を維持管理する
方法としては、メッキ液の電気伝導度に基づいて硫酸ナ
トリウムの添加量を調節する方法(特開昭57-63699号公
報)と、螢光X線分析等の機器分析にて求めたNaイオン
量に基づく方法とが主として採用されていた。
Conventionally, methods for maintaining and controlling the concentration of sodium sulfate in a plating bath include a method of adjusting the amount of sodium sulfate to be added based on the electric conductivity of a plating solution (Japanese Patent Laid-Open No. 57-63699) and a method using fluorescent X-rays. A method based on the amount of Na ions obtained by instrumental analysis such as analysis has been mainly employed.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

しかし、前者の電気伝導度法による方法では、測定さ
れる電気伝導度がメッキ浴のpH、温度、メッキ金属イオ
ン濃度の影響を受けやすく、実際の硫酸ナトリウム濃度
に換算するにあっては精度が出難いとの問題がある。但
し、装置自体は簡易で、低コストである。
However, in the former method using the electric conductivity method, the measured electric conductivity is easily affected by the pH, temperature, and plating metal ion concentration of the plating bath. There is a problem with difficulty. However, the device itself is simple and inexpensive.

また、後者の螢光X線分析によってNaイオンを測定す
る方法でも、Naが軽元素測定限界域にあるため測定精度
が出難い問題がある。更にメッキ液を濾紙に受けるサン
プリング系では、サンプリング機構が繁雑で故障しやす
く、コストが高い問題もある。
Also, the latter method of measuring Na ions by fluorescent X-ray analysis has a problem in that measurement accuracy is difficult to obtain because Na is in the light element measurement limit region. Further, the sampling system which receives the plating solution on the filter paper has a problem that the sampling mechanism is complicated and easily broken, and the cost is high.

本発明はこれら問題点を解決して、メッキ浴の硫酸ナ
トリウム濃度を高精度かつ経済的に維持管理し得るメッ
キ浴の調整方法を提供することを目的とする。
An object of the present invention is to solve these problems and to provide a plating bath adjustment method capable of maintaining the concentration of sodium sulfate in a plating bath with high accuracy and economical efficiency.

〔課題を解決するための手段〕[Means for solving the problem]

本発明の電気メッキ浴の調整方法は、電気メッキに使
用する硫酸性メッキ浴のメッキ金属イオン濃度、Feイオ
ン濃度、硫酸イオン濃度、pHおよび温度を測定し、これ
らの測定値から、メッキ浴中の硫酸ナトリウムに依存す
るNaイオン濃度を下式により求め、求めたNaイオン濃度
から得た硫酸ナトリウム濃度に基づいて硫酸ナトリウム
の補給量を制御することを特徴としている。
The method for adjusting the electroplating bath of the present invention comprises measuring a plating metal ion concentration, a Fe ion concentration, a sulfate ion concentration, a pH and a temperature of a sulfate plating bath used for electroplating, and measuring these values in the plating bath. The sodium ion concentration dependent on sodium sulfate is determined by the following equation, and the amount of sodium sulfate supplied is controlled based on the sodium sulfate concentration obtained from the determined sodium ion concentration.

〔作用〕[Action]

本発明は、求められるメッキ浴の硫酸ナトリウム濃度
が、従来の電気伝導法又は螢光X線分析法によるごとき
不正確になるのを避けるために、Naイオン濃度ないしは
硫酸ナトリウム濃度を直接測定することなく、硫酸ナト
リウム投入とは無関係に硫酸ナトリウム濃度を演算によ
り精度よく求めるものである。
The present invention is to directly measure the Na ion concentration or the sodium sulfate concentration in order to prevent the required concentration of sodium sulfate in the plating bath from being inaccurate as in a conventional electric conduction method or X-ray fluorescence analysis. Instead, the concentration of sodium sulfate is accurately obtained by calculation regardless of the input of sodium sulfate.

すなわち、本発明者らの研究によれば、メッキ浴中の
硫酸ナトリウムに依存するNaイオン濃度は、メッキ浴に
含まれる水素イオン濃度(pH)と、pH値に影響を与える
メッキ浴温度と、メッキ浴中に存在するSO4 2-イオン、Z
nイオン、Niイオン、FeTイオン(全Feイオン−Fe2++Fe
3+)、Fe3+(又はFe2+)イオン等のメッキ金属イオン濃
度とから、次の(1)式に従って正確に計算される。
That is, according to the study of the present inventors, the Na ion concentration depending on sodium sulfate in the plating bath, the hydrogen ion concentration (pH) contained in the plating bath, the plating bath temperature affecting the pH value, SO 4 2- ion, Z present in the plating bath
n ion, Ni ion, Fe T ion (total Fe ion −Fe 2+ + Fe
3+ ) and the concentration of plating metal ions such as Fe 3+ (or Fe 2+ ) ions can be accurately calculated according to the following equation (1).

[Na](g/l)=K1×46.0(Naの原子量×2)×A(mol
/l)+K2 ……(1) 但し [SO4],[Zn],[Ni],[FeT],[Fe3+]SO4イオ
ン,Znイオン、Niイオン,FeTイオン,Fe3+イオンの各イ
オン濃度 γ(T)=活量係数(メッキ液の温度Tの関数) K1,K2=補正係数(基本的にはK1=1,K2=0で実測値と
推定値との対応でチューニングを実施する) SO4イオン、Znイオン、Niイオン、全Feイオン、Fe3+
オン等のメッキ金属イオン濃度、硫酸イオン濃度および
pHはいずれもオンラインで精度よく簡単に測定すること
ができる。従って、これらからメッキ浴中の硫酸ナトリ
ウムに依存するNaイオン濃度を算出し、この算出された
Naイオン濃度に基づく硫酸ナトリウム量に従ってメッキ
浴への硫酸ナトリウム補給量を制御することにより、メ
ッキ浴の硫酸ナトリウム量が適正値に簡単かつ正確に維
持管理される。
[Na] (g / l) = K 1 × 46.0 (atomic weight of Na × 2) × A (mol
/ l) + K 2 …… (1) [SO 4 ], [Zn], [Ni], [Fe T ], [Fe 3+ ] Each ion concentration of SO 4 ion, Zn ion, Ni ion, Fe T ion and Fe 3+ ion γ (T) = Activity coefficient (function of plating solution temperature T) K 1 , K 2 = correction coefficient (basically, tuning is performed in correspondence of the actually measured value and the estimated value with K 1 = 1, K 2 = 0) SO 4 ion, Zn ion, Ni ion, total Fe ion, Fe 3+ ion plating metal ion concentration, sulfate ion concentration and
The pH can be easily and accurately measured online. Therefore, from these, the Na ion concentration depending on sodium sulfate in the plating bath was calculated, and this calculated
By controlling the amount of sodium sulfate supplied to the plating bath according to the amount of sodium sulfate based on the Na ion concentration, the amount of sodium sulfate in the plating bath can be easily and accurately maintained at an appropriate value.

なお特開昭60-164239号公報には、本発明のような硫
酸ナトリウムの補給量を制御する方法ではないが、メッ
キ浴のメッキ金属イオン濃度を蛍光X線分析により定量
する際に、硫酸ナトリウムからのNaイオンに蛍光X線が
吸収されることによるマトリックス効果を補正するため
に、メッキ浴のメッキ金属イオン濃度および硫酸イオン
濃度の測定値から硫酸ナトリウム濃度を演算により推定
する技術が記載されているが、不純物であるFeイオンの
濃度、pH値、およびメッキ浴の温度の関数である活量係
数が考慮されていないので、仮にこれを本発明のような
硫酸ナトリウムの補給量を制御する方法に適用しても、
高精度の制御は行われない。
Japanese Patent Application Laid-Open No. 60-164239 does not describe a method of controlling the replenishment amount of sodium sulfate as in the present invention. However, when quantifying the plating metal ion concentration of the plating bath by fluorescent X-ray analysis, sodium sulfate is used. In order to correct the matrix effect caused by the absorption of fluorescent X-rays by Na ions from the surface, a technique for estimating the sodium sulfate concentration by calculation from the measured values of the plating metal ion concentration and the sulfate ion concentration in the plating bath is described. However, since the concentration of Fe ions as impurities, the pH value, and the activity coefficient that is a function of the temperature of the plating bath are not taken into account, a method for controlling the replenishment amount of sodium sulfate as in the present invention is assumed. Applied to
No high-precision control is performed.

〔実施例〕〔Example〕

以下に本発明の実施例を説明する。 Hereinafter, embodiments of the present invention will be described.

第1図は本発明の方法に用いられるオンライン測定系
を示している。槽内の硫酸性メッキ浴1のpHは、系統2
を通じてpH計により測定される。測定されたpHには、系
統3を通じて温度計により測定されたメッキ浴温度に基
づいて補正が加えられる。また、系統4を通じて螢光X
線分析計よりメッキ浴1のNi,Zn,FeTの各イオン濃度お
よび硫酸イオン濃度が測定され、系統5では吸光光度計
によりFe3+イオン濃度が測定される。
FIG. 1 shows an on-line measurement system used in the method of the present invention. The pH of the sulfuric acid plating bath 1 in the tank is
Through a pH meter. The measured pH is corrected based on the plating bath temperature measured by the thermometer through the system 3. In addition, fluorescent X
The ion concentration of Ni, Zn, and Fe T in the plating bath 1 and the sulfate ion concentration of the plating bath 1 are measured by a line analyzer, and the Fe 3+ ion concentration of the system 5 is measured by an absorptiometer.

pHの測定に使用されるpH計は、例えば低pH用ガラス電
極式であり、その測定値の補正に用いられるメッキ浴温
度はメッキ浴管理用温度計の測定値によってもよいし、
pH計内蔵温度計の測定値によってもよい。
The pH meter used for pH measurement is, for example, a glass electrode type for low pH, and the plating bath temperature used for correcting the measured value may be based on the measured value of the plating bath management thermometer,
It may be based on the measurement value of a thermometer with a built-in pH meter.

また、通常のメッキ浴では、Fe3+イオン濃度が僅少の
ときがあるので、その場合はFe3+イオン濃度を無視して
もよく、他の金属イオンについても0.1g/l以下のときは
無視してもよい。
In addition, in a normal plating bath, the Fe 3+ ion concentration may be very small.In such a case, the Fe 3+ ion concentration may be ignored, and when other metal ions are 0.1 g / l or less, You can ignore it.

測定された各メッキ金属イオン濃度、硫酸イオン濃
度、および温度によって補正されたpHは、別に設置され
た計算機において、それぞれ前記(1)式に代入され
る。これによって得られたメッキ浴1のNaイオン濃度よ
り、メッキ浴1の硫酸ナトリウム濃度を適正に管理する
べく、メッキ浴1への硫酸ナトリウム量を求める。この
計算も上記計算機において行われ、その方法を第2図の
フローチャートに従って以下に説明する。
The pH corrected by the measured plating metal ion concentration, sulfate ion concentration, and temperature is substituted into the above equation (1) by a separately installed computer. From the Na ion concentration of the plating bath 1 thus obtained, the amount of sodium sulfate in the plating bath 1 is determined in order to properly control the sodium sulfate concentration of the plating bath 1. This calculation is also performed in the computer, and the method will be described below with reference to the flowchart of FIG.

メッキ浴におけるNa濃度の管理上限をNaMAX、下限をN
aMINとする。メッキ浴の各金属イオン濃度、硫酸イオン
濃度、pH値を測定し、その各測定値より(1)式を使用
して求めた演算Na値が上限を超えたとき(Na>NaMAXがY
es)であれば、メッキ浴に水(推量xl/h)を注入してメ
ッキ浴を希釈する。Na演算値を上限、下限と比べ、上限
未満(Na>NaMAXがNo)であれば水の注入は行わない。N
a演算値が上限未満で且つ下限未満のとき(Na<NaMINが
Yes)であれば、硫酸ナトリウムの粉末あるいは濃度硫
酸ナトリウム水溶液を一定時間(T1h)に一定量投入す
る。Na演算値が上限未満で下限を超えたとき(Na<NaMI
NがNo)であれば現状保持となる。このフローを繰り返
すことにより、硫酸ナトリウムがメッキ浴に効果的に投
入され、その濃度が適正範囲内に維持管理される。
Control upper limit of Na concentration in plating bath: NaMAX, lower limit: N
aMIN. When each metal ion concentration, sulfate ion concentration and pH value of the plating bath are measured, and the calculated Na value obtained by using the equation (1) exceeds the upper limit from each of the measured values (Na> NaMAX is Y
If es), dilute the plating bath by injecting water (guess xl / h) into the plating bath. Compare the Na operation value with the upper and lower limits, and if less than the upper limit (Na> NaMAX is No), water is not injected. N
aWhen the calculated value is less than the upper limit and less than the lower limit (Na <NaMIN
If Yes, add a fixed amount of sodium sulfate powder or a concentrated aqueous solution of sodium sulfate for a fixed time (T 1 h). When the Na operation value is less than the upper limit and less than the lower limit (Na <NaMI
If N is No), the current status is maintained. By repeating this flow, sodium sulfate is effectively introduced into the plating bath, and its concentration is maintained within an appropriate range.

本発明の方法は、例えば純亜鉛電気メッキ、Ni−Zn合
金電気メッキ、Fe−Zn合金電気メッキに適用できる。
The method of the present invention can be applied to, for example, pure zinc electroplating, Ni-Zn alloy electroplating, and Fe-Zn alloy electroplating.

純亜鉛電気メッキにおいて、上記硫酸ナトリウム濃度
の管理を実際に行ったときの結果を第3図に示す。第3
図には本発明法と共に、従来の電気伝導度法、螢光X線
法による場合も示している。結果は、各法におけるオン
ラインNa分析値と原子吸光度法(標準法)によるNa量と
の対応関係で示している。図で明らかなように、従来の
電気伝導度法、螢光X線法に比し、本発明法によるNa分
析値は原子吸光度法とよく一致する高水準の結果になっ
ている。
FIG. 3 shows the result when the concentration of sodium sulfate was actually controlled in pure zinc electroplating. Third
The figure shows the case of the conventional electric conductivity method and the fluorescent X-ray method together with the method of the present invention. The results are shown by the correspondence between the online Na analysis value in each method and the amount of Na by the atomic absorption method (standard method). As is clear from the figure, compared with the conventional electric conductivity method and the fluorescent X-ray method, the Na analysis value according to the method of the present invention is a high level result which is in good agreement with the atomic absorption method.

〔発明の効果〕〔The invention's effect〕

本発明のメッキ浴の調整方法は、硫酸ナトリウム濃度
をオンラインで正確に管理することができる。従って、
メッキ操業における電力消費量の低減を図り、電気メッ
キコストの低減に寄与する。しかも、測定系が簡素にな
るために、システムの耐久性に優れる。
The plating bath adjusting method of the present invention can accurately control the concentration of sodium sulfate online. Therefore,
It reduces the power consumption in the plating operation and contributes to the reduction of the electroplating cost. Moreover, since the measurement system is simplified, the durability of the system is excellent.

【図面の簡単な説明】[Brief description of the drawings]

第1図は本発明のメッキ浴の調整方法に使用されるオン
ライン測定系統の説明図、第2図は硫酸ナトリウムの自
動投入操作を示すフローチャート、第3図はオンライン
Na分析値と原子吸光度法によるNa値との関係を本発明法
および従来法について示す線図である。
FIG. 1 is an explanatory view of an on-line measuring system used in the plating bath adjusting method of the present invention, FIG. 2 is a flowchart showing an operation for automatically feeding sodium sulfate, and FIG.
FIG. 3 is a diagram showing the relationship between the Na analysis value and the Na value by the atomic absorption method for the method of the present invention and the conventional method.

Claims (1)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】電気メッキに使用する硫酸性メッキ浴のメ
ッキ金属イオン濃度、Feイオン濃度、硫酸イオン濃度、
pHおよび温度を測定し、これらの測定値から、メッキ浴
の硫酸ナトリウム濃度に依存するNaイオン濃度を下式に
より求め、求めたNaイオン濃度から得た硫酸ナトリウム
濃度に基づいて硫酸ナトリウムの補給量を制御すること
を特徴とする電気メッキ浴の調整方法。 〔Na〕(g/l)=K1×46.0×A(g/mol)+K2 但し 〔Na〕=Naイオン濃度 K1,K2=補正係数 A=〔SO4〕/B1−10-pH/2γ(T)−〔Zn〕/B2 −〔Ni〕/B3−(〔FeT〕+0.5〔Fe3+〕)/B4 〔SO4〕,〔Zn〕,〔Ni〕,〔FeT〕,〔Fe3+〕=SO4
オン,Znイオン,Niイオン,FeTイオン,Fe3+イオンの各
イオン濃度(g/l) γ(T)=活量係数(メッキ浴の温度Tの関数) B1,B2,B3,B4=定数(g/mol)
1. A plating metal ion concentration, a Fe ion concentration, a sulfate ion concentration of a sulfate plating bath used for electroplating.
The pH and temperature were measured, and the Na ion concentration depending on the sodium sulfate concentration of the plating bath was determined from the measured values according to the following formula.The replenishment amount of sodium sulfate was determined based on the sodium sulfate concentration obtained from the determined Na ion concentration. And controlling the electroplating bath. (Na) (g / l) = K 1 × 46.0 × A (g / mol) + K 2 where (Na) = Na ion concentration K 1, K 2 = correction coefficient A = [SO 4] / B 1 -10 - pH / (T) - [Zn] / B 2 - [Ni] / B 3 - ([Fe T] + 0.5 [Fe 3+]) / B 4 [SO 4], [Zn], [Ni] , [Fe T ], [Fe 3+ ] = SO 4 ion, Zn ion, Ni ion, Fe T ion, Fe 3+ ion concentration (g / l) γ (T) = activity coefficient (plating bath B 1 , B 2 , B 3 , B 4 = constant (g / mol)
JP1297128A 1989-11-15 1989-11-15 How to adjust the electroplating bath Expired - Lifetime JP2712661B2 (en)

Priority Applications (1)

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JP1297128A JP2712661B2 (en) 1989-11-15 1989-11-15 How to adjust the electroplating bath

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Application Number Priority Date Filing Date Title
JP1297128A JP2712661B2 (en) 1989-11-15 1989-11-15 How to adjust the electroplating bath

Publications (2)

Publication Number Publication Date
JPH03158500A JPH03158500A (en) 1991-07-08
JP2712661B2 true JP2712661B2 (en) 1998-02-16

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JPS5810480B2 (en) * 1980-10-02 1983-02-25 住友金属工業株式会社 Method for controlling electrical conductivity of electroplating bath
JPS60164239A (en) * 1984-02-06 1985-08-27 Seiko Instr & Electronics Ltd Plating liquid analyzing apparatus utilizing fluorescent x rays

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JPH03158500A (en) 1991-07-08

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