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JP2635355B2 - Method for producing oxide superconductor film - Google Patents

Method for producing oxide superconductor film

Info

Publication number
JP2635355B2
JP2635355B2 JP63065871A JP6587188A JP2635355B2 JP 2635355 B2 JP2635355 B2 JP 2635355B2 JP 63065871 A JP63065871 A JP 63065871A JP 6587188 A JP6587188 A JP 6587188A JP 2635355 B2 JP2635355 B2 JP 2635355B2
Authority
JP
Japan
Prior art keywords
film
thickness
oxide
temperature
oxide superconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP63065871A
Other languages
Japanese (ja)
Other versions
JPH01239027A (en
Inventor
昌志 向田
研一 黒田
信太郎 宮澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NTT Inc
Original Assignee
Nippon Telegraph and Telephone Corp
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Filing date
Publication date
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Priority to JP63065871A priority Critical patent/JP2635355B2/en
Publication of JPH01239027A publication Critical patent/JPH01239027A/en
Application granted granted Critical
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Expired - Fee Related legal-status Critical Current

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Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E40/00Technologies for an efficient electrical power generation, transmission or distribution
    • Y02E40/60Superconducting electric elements or equipment; Power systems integrating superconducting elements or equipment

Landscapes

  • Inorganic Compounds Of Heavy Metals (AREA)
  • Compositions Of Oxide Ceramics (AREA)
  • Physical Vapour Deposition (AREA)
  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、液体窒素温度(絶対温度77K)以上の絶対
温度110K以下で超伝導体となる薄膜の形成法に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a method for forming a thin film that becomes a superconductor at an absolute temperature of 110 K or higher which is higher than liquid nitrogen temperature (absolute temperature 77 K).

〔従来の技術〕[Conventional technology]

1987年に化学式LnBa2Cu3Ox(Ln:Y,ランタノイド元
素)で与えられる酸化物化合物が絶対温度90度(摂氏マ
イナス183℃)の超伝導転移温度をもつことが公知とな
って以来、より高い超伝導転移温度をもつ酸化物超伝導
物質の探索が盛んである。
Since it was known in 1987 that oxide compounds given by the chemical formula LnBa 2 Cu 3 O x (Ln: Y, a lanthanoid element) have a superconducting transition temperature of 90 ° C. (−183 ° C.), The search for oxide superconducting materials with higher superconducting transition temperatures is active.

1988年1月22日に、Bi,Sr,Ca,Cuで構成された酸化物
化合物である化学式BiSrCaCu2Oxが絶対温度105Kと75Kに
超伝導転移をもつ物質であることが報道された。
On January 22, 1988, it was reported that BiSrCaCu 2 O x , an oxide compound composed of Bi, Sr, Ca, and Cu, had a superconducting transition at absolute temperatures of 105K and 75K.

〔発明が解決しようとする課題〕[Problems to be solved by the invention]

上述した物質は転移温度が異なる化合物(相)が共存
(あるいは混在)しているもので、高温転移(105K)相
の化合物の同定は未解決である。この報道以後、絶対温
度が105Kを越える化合物組成についての知見は報告され
ていない。
The above-mentioned substances have compounds (phases) having different transition temperatures coexisting (or coexisting), and identification of a compound having a high-temperature transition (105 K) phase has not been solved. Since this report, no information has been reported on the composition of compounds having an absolute temperature exceeding 105K.

本発明は、エレクトロニクス応用に欠かせない絶対温
度105Kを越す超伝導転移温度を有するBi−Sr−Cu−O化
合物および高い超伝導転移温度を有する薄膜の製造方法
を提供することを目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a Bi-Sr-Cu-O compound having a superconducting transition temperature exceeding an absolute temperature of 105 K, which is indispensable for electronics applications, and a method for producing a thin film having a high superconducting transition temperature.

〔課題を解決するための手段〕[Means for solving the problem]

本発明の酸化物超伝導体膜の製造方法は、100K以上の
温度で電気抵抗が零となる酸化物超伝導体膜の製造法に
おいて、蒸着法によってCu,Bi,CaF2,SrF2を基板上に積
層して2500Å以下の厚さの積層体を堆積し、この積層体
を酸素中で熱処理して組成式BiuSrvCawCuxOyで表され、
u:v:w:xの比が0.7〜1.1:1.4〜3.1:0.85〜1.1:2である酸
化物超伝導体膜を作成することを特徴とする。
The method for producing an oxide superconductor film of the present invention is a method for producing an oxide superconductor film in which electric resistance becomes zero at a temperature of 100 K or more, wherein Cu, Bi, CaF 2 , and SrF 2 are formed on a substrate by vapor deposition. laminated on depositing a stack of a thickness of less than 2500 Å, represented in this composition the laminate was heat-treated in oxygen formula Bi u Sr v Ca w Cu x O y,
It is characterized in that an oxide superconductor film having a ratio of u: v: w: x of 0.7 to 1.1: 1.4 to 3.1: 0.85 to 1.1: 2 is prepared.

さらに本発明製造方法は組成式BiuSrvCawCuxOyで表さ
れ、u:b:w:xの比が0.7〜1.1:1.4〜3.1:0.85〜1.1:2であ
る酸化物超伝導体を2500Å以下の厚さで基板上に堆積
し、熱処理する工程を複数回繰り返すことを特徴とす
る。
Furthermore, the present invention production process is represented by a composition formula Bi u Sr v Ca w Cu x O y, u: b: w: ratio of x 0.7 to 1.1: 1.4 to 3.1: 0.85 to 1.1: oxides than a 2 The step of depositing a conductor with a thickness of 2500 mm or less on a substrate and performing a heat treatment is repeated a plurality of times.

〔作 用〕(Operation)

Bi−Sr−Ca−Cu−O四元(酸素を含めると五元)系酸
化物で、Bi:Sr:Ca:Cu=0.7〜1.1:1.4〜3.1:0.85〜1.1:
2.0の比をもつ化合物が絶対温度約110Kで超伝導転移を
示す新物質であり、この転移温度を保った薄膜を形成す
るには1回の堆積膜厚を2500Å以下とすることで実現で
きる。
Bi-Sr-Ca-Cu-O quaternary (quinary including oxygen) -based oxide, Bi: Sr: Ca: Cu = 0.7-1.1: 1.4-3.1: 0.85-1.1:
A compound having a ratio of 2.0 is a new substance exhibiting a superconducting transition at an absolute temperature of about 110 K. A thin film having this transition temperature can be formed by setting the thickness of one deposition to 2500 ° or less.

〔実施例〕〔Example〕

以下に図面を参照して本発明を詳細に説明する。 Hereinafter, the present invention will be described in detail with reference to the drawings.

実施例1 電子ビーム蒸着法により金属Cu,Biおよびフッ化物CaF
2,SrF2の順に基板MgO(100)面上にCu:Bi:Ca:Sr=2:1:
1:1.5になるように、Cu約90Å、Bi約130Å、CaF2約160
Å、SrF2約520Åを積層した。ただし、この膜厚は堆積
中の膜厚計での指標で、実際の全膜厚は775Åであっ
た。この積層膜を酸素中で約870℃1時間熱処理をして
フッ化物を分解するとともに酸化し、酸化物化合物薄膜
とした。熱処理後の酸化膜をX線蛍光分析法により組成
分析をしたところ、各元素の比はCu:Bi:Ca:Sr=2.0:1.0
8:1.08:1.43であった。分析誤差は各元素に対して±10
%以下である。
Example 1 Metal Cu, Bi and fluoride CaF by electron beam evaporation
2, the substrate MgO (100) in order of SrF 2 on the surface Cu: Bi: Ca: Sr = 2: 1:
1: about 1.5, Cu about 90Å, Bi about 130Å, CaF 2 about 160
Å, SrF 2 about 520F were laminated. However, this film thickness is an index by a film thickness meter during deposition, and the actual total film thickness was 775 °. This laminated film was subjected to a heat treatment in oxygen at about 870 ° C. for 1 hour to decompose and oxidize the fluoride to obtain an oxide compound thin film. When the composition of the oxide film after the heat treatment was analyzed by X-ray fluorescence analysis, the ratio of each element was Cu: Bi: Ca: Sr = 2.0: 1.0.
8: 1.08: 1.43. Analysis error ± 10 for each element
% Or less.

通常の四端子法によりこの酸化膜の電気抵抗の温度変
化を測定した結果を第1図に示す。約110Kで電気抵抗が
急激に下がって、約100Kで抵抗がゼロとなる超伝導性を
示している。この組成が110K転移温度をもつ酸化物化合
物であることは本発明者が見出したものである。
FIG. 1 shows the result of measuring the temperature change of the electrical resistance of this oxide film by the ordinary four-terminal method. It shows superconductivity where the electrical resistance drops sharply at about 110K and becomes zero at about 100K. The present inventor has found that this composition is an oxide compound having a transition temperature of 110K.

実施例2 電子ビーム蒸着により、金属Cu,Bi,フッ化物のCaF2,S
rF2の順に基板MgO(100)面上にCu約170Å、Bi約240
Å、CaF2約300Å、SrF2約910Åを積層堆積した。この厚
みは膜原計での換算であり、実際には全膜厚は1993Åで
あった。この積層膜を酸素中で約870℃、1時間熱処理
をし、フッ化物を分解させると同時に酸化し、酸化物化
合物とした。この酸化膜をX線蛍光分析により組成分析
をしたところ、Cu:Bi:Ca:Sr=2.0:0.94:0.88:1.4であっ
た。分析誤差は各元素に対して±10%以内である。
Example 2 Metal Cu, Bi, fluoride CaF 2 , S by electron beam evaporation
Approximately 170 mm of Cu and approximately 240 Bi on the MgO (100) surface of the substrate in the order of rF 2
Å, about 300 2 of CaF 2 and about 910Å of SrF 2 were deposited. This thickness is a conversion based on the original film thickness, and the actual total thickness was 1993 mm. This laminated film was heat-treated in oxygen at about 870 ° C. for 1 hour to decompose the fluoride and oxidize it at the same time to obtain an oxide compound. The composition analysis of this oxide film by X-ray fluorescence analysis revealed that Cu: Bi: Ca: Sr = 2.0: 0.94: 0.88: 1.4. Analysis errors are within ± 10% for each element.

通常の四端子法でこの酸化膜の電気抵抗の温度変化を
測定した結果を第2図に示す。約110Kで電気抵抗が急激
に低下しており、110K転移温度の超伝導体である。但
し、抵抗が約108K以下で据をひいて90Kで抵抗ゼロとな
っていることが判った。分析精度内で実施例1の酸化膜
の組成とほぼ同じであることから、この電気抵抗の据び
きは膜厚の違いと云える。すなわち実施例1に比べ全膜
厚は約2.6倍になっており、この膜厚の違いが膜内の組
成均一性を左右している結果、電気抵抗の据びきを生じ
せしめている。この事は実施例3で明らかとなったこと
でもある。
FIG. 2 shows the result of measuring the temperature change of the electrical resistance of the oxide film by the ordinary four-terminal method. It has a sharp drop in electrical resistance at about 110K and is a superconductor with a 110K transition temperature. However, it was found that the resistance was about 108K or less and the resistance became zero at 90K. Since the composition of the oxide film in Example 1 is almost the same within the analysis accuracy, it can be said that the setting of the electric resistance is a difference in the film thickness. That is, the total film thickness is about 2.6 times as large as that of Example 1. As a result of this difference in film thickness affecting the composition uniformity in the film, the electric resistance is settled. This is also clear from the third embodiment.

実施例3 電子ビーム蒸着により、金属Cu,Bi,フッ化物CaF2,SrF
2の順にCu:Bi:Ca:Sr=2:1.5:1:1になるように、Cu約255
Å、Bi約360Å、CaF2約450Å、SrF2約1350Åを積層堆積
した。この厚さは堆積中の膜厚計からの換算で、実際の
全膜厚は2814Åであった。この積層膜と酸素中で約870
℃1時間熱処理することで、フッ化物を分解させると同
時に酸化物化合物とした。X線蛍光分析による組成分析
では、Cu:Bi:Ca:Sr=2.0:0.93:1.11:1.48であり、分析
誤差は各元素に対して±10%以下である。
Example 3 Metal Cu, Bi, fluoride CaF 2 , SrF by electron beam evaporation
Cu: 255 so that Cu: Bi: Ca: Sr = 2: 1.5: 1: 1 in the order of 2.
Å, Bi about 360Å, CaF 2 about 450Å, SrF 2 about 1350Å were deposited. This thickness was converted from a thickness gauge during deposition, and the actual total thickness was 2814 °. About 870 in this laminated film and oxygen
By heat treatment at 1 ° C. for 1 hour, the fluoride was decomposed and an oxide compound was formed at the same time. In the composition analysis by X-ray fluorescence analysis, Cu: Bi: Ca: Sr = 2.0: 0.93: 1.11: 1.48, and the analysis error is ± 10% or less for each element.

通常の四端法でこの酸化膜の電気抵抗の温度変化を測
定した結果を第3図に示す。約110Kで抵抗が急激に下が
るものの、約107K以下で抵抗が残存し、約60Kで抵抗が
ゼロとなる、二段の変化を示している。
FIG. 3 shows the result of measuring the temperature change of the electrical resistance of this oxide film by the ordinary four-point method. Although the resistance drops sharply at about 110K, the resistance remains below about 107K and becomes zero at about 60K, indicating a two-step change.

組成分析の精度内でこの酸化膜の化合物は実施例1お
よび2の化合物と同じであることから、この二段の抵抗
変化、言い換えれば110Kにのみ超伝導転移を示す膜は初
期の堆積膜厚の違いによることに他ならない。すなわ
ち、実施例2の場合に比べCa濃度が測定精度(誤差±10
%)内であるが、膜厚は1.4倍厚い。
Since the compound of this oxide film is the same as the compounds of Examples 1 and 2 within the accuracy of the composition analysis, the film showing the two-stage resistance change, in other words, the film showing a superconducting transition only at 110K is the initial deposited film thickness. It is nothing but the difference. That is, as compared with the case of Example 2, the Ca concentration was higher in the measurement accuracy (error ± 10
%), But the film thickness is 1.4 times thicker.

第4図に実施例1および実施例3で得られた酸化膜の
X線回折像を示す。曲線(a)は実施例1で得られた膜
厚775Åの膜、曲線(b)は実施例3で得られた2814Å
の膜の回折図形である。第4図に示すように各試料は同
じパターンを示し、BrSr1.5CaCu2Ox(xは不明)の酸化
物化合物が基板上に配向していることを示し、ほぼ同一
の構造が出来ている。しかし、実施例3での厚い膜の場
合には2θ=32゜のピークが僅かに現われ、これが電気
抵抗の低温での据びきの原因と云える。膜厚が2500Å以
下ではほぼ110K転移温度の超伝導体となっていることが
結論され、この事は組成とともに本発明者らが見出した
ものである。
FIG. 4 shows X-ray diffraction images of the oxide films obtained in Example 1 and Example 3. Curve (a) is a film having a film thickness of 775 ° obtained in Example 1, and curve (b) is a film having 2814 ° obtained in Example 3.
3 is a diffraction pattern of the film of FIG. As shown in FIG. 4, each sample shows the same pattern, indicating that the oxide compound of BrSr 1.5 CaCu 2 O x (x is unknown) is oriented on the substrate, and almost the same structure is formed. . However, in the case of the thick film in the third embodiment, a slight peak at 2θ = 32 ° appears, which can be said to be the cause of the low-temperature electrical resistance. It is concluded that when the film thickness is less than 2500 ° C., the superconductor has a transition temperature of about 110 K, which is found by the present inventors together with the composition.

実施例4 実施例2で行った積層堆積(初期膜厚1993Å)をした
後に同様に酸化熱処理を行い、約110Kの超伝導転移を確
認した後、再び同じ組成になるように約2000ÅのBi0.94
Sr1.40Ca0.88Cu2.0Oxを堆積し、やはり酸素中で870℃1
時間酸化熱処理を行った。
Example 4 After the lamination deposition (initial film thickness 1993 °) performed in Example 2, an oxidizing heat treatment was similarly performed, and after confirming a superconducting transition of about 110K, Bi 0.94 of about 2000 ° was again formed to have the same composition.
Deposit Sr 1.40 Ca 0.88 Cu 2.0 O x , also in oxygen at 870 ℃
A time oxidation heat treatment was performed.

この酸化膜は約4000Åの膜厚をもつ。通常の四端子法
で電気抵抗の温度変化を測定した結果を第5図に示す。
膜厚約2800Åの実施例3では電気抵抗の温度変化は二段
になって約70Kで抵抗ゼロになったが、本実施例のよう
に2000Å膜厚の堆積・熱処理を繰返して約4000Åの膜に
したときには、2500Å膜厚単層の抵抗温度変化と大差な
く、約110Kで抵抗が急激に低下して約95Kで抵抗ゼロの
超伝導体厚膜が得られた。すなわち、2500Å以下の膜の
堆積・熱処理を多数回繰返すことによってより厚い110K
転移温度をもつ膜が得られる。2500Å以下の膜厚であれ
ばよい事は実施例1〜3の結果からも明らかで、薄い膜
ほど超伝導転移での電気抵抗の据が小さいことから容易
に判断できる。
This oxide film has a thickness of about 4000 °. FIG. 5 shows the result of measuring the temperature change of the electric resistance by the ordinary four-terminal method.
In Example 3 having a film thickness of about 2800 mm, the temperature change of the electric resistance became two steps, and the resistance became zero at about 70 K. However, as shown in this example, the film thickness of about 4000 mm was repeated by repeatedly depositing and heat-treating a film having a thickness of 2000 mm. At about 110K, the resistance dropped sharply at about 110K, and a zero-resistance superconductor thick film was obtained at about 95K. That is, by repeating the deposition and heat treatment of a film of 2500 °
A film having a transition temperature is obtained. It is clear from the results of Examples 1 to 3 that the film thickness should be 2500 ° or less, and it can be easily judged from the results of Examples 1 to 3 that the thinner the film, the smaller the electrical resistance at the superconducting transition.

実施例5 電子ビーム蒸着により金属Cu,Biおよびフッ化物CuF2,
SrF2の順に基板MgO(100)面上に堆積した。膜厚は2006
Åであった。この膜を酸素中で約870℃1時間熱処理し
て酸化物薄膜とした。四端子法によって測定したこの膜
の電気の温度変化を第6図に示す。約110Kで電気抵抗が
急激に下がって、約108Kで電気抵抗がゼロとなる超伝導
性を示している。
Example 5 Metal Cu, Bi and fluoride CuF 2 ,
SrF 2 was deposited on the MgO (100) surface of the substrate in this order. The film thickness is 2006
Was Å. This film was heat-treated in oxygen at about 870 ° C. for 1 hour to form an oxide thin film. FIG. 6 shows a change in electricity temperature of this film measured by the four probe method. At about 110K, the electric resistance sharply drops, and at about 108K, the electric resistance becomes zero, indicating superconductivity.

本発明の酸化物超伝導体はBi1.0Sr1.5Ca1.0Cu2.0Oy
中心組成とし、Bi,Sr,CaおよびCuの原子比が、Cuを2と
した時、Biが0.7〜1.1,Srが1.4〜3.1,Caが0.85〜1.1で
ある。この組成範囲をはずれると、良好な超伝導特性が
得られない。
The oxide superconductor of the present invention has a center composition of Bi 1.0 Sr 1.5 Ca 1.0 Cu 2.0 O y , and when the atomic ratio of Bi, Sr, Ca and Cu is 2, Cu is 0.7 to 1.1, Sr Is 1.4 to 3.1 and Ca is 0.85 to 1.1. If the composition is out of this range, good superconducting properties cannot be obtained.

実施例では、アルカリ土類元素の蒸発源としてCaF2,S
rF2を用いたが、金属Ca,Srでもよく、また膜堆積法につ
いても本発明は限定、あるいは制約されるものではな
い。本発明においては、上述した組成の酸化物を厚さ25
00Å以下で基板上に堆積させ、または2500Å以下の厚さ
の膜の堆積と熱処理とを繰返して酸化物超伝導体膜を形
成することによって、高い超伝導転移温度を得ることが
できる。
In the example, CaF 2 , S
Although rF 2 was used, metallic Ca and Sr may be used, and the present invention is not limited or limited to the film deposition method. In the present invention, the oxide having the above-described composition has a thickness of 25%.
A high superconducting transition temperature can be obtained by forming an oxide superconductor film by depositing on a substrate at a temperature of 00 ° or less or by repeating deposition and heat treatment of a film having a thickness of 2500 ° or less.

〔発明の効果〕〔The invention's effect〕

以上説明したように、Bi−Sr−Ca−Cu−O四元(酸素
を含めると五元)系酸化物で、Bi:Sr:Ca:Cu=0.7〜1.1:
1.4〜3.1:0.85〜1.1:2.0の比をもつ化合物が絶対温度約
110Kで超伝導転移を示す新物質であり、この転移温度を
保った薄膜を形成するには1回の堆積膜厚を2500Å以下
とすることで実現できる。この結果、液体窒素温度77よ
りも30度以上転移温度が高いことから、この組成比をも
つ薄膜により77Kで安定して動作する種々のエレクトロ
ニクスデバイスが実現できる。
As described above, Bi-Sr-Ca-Cu-O quaternary (quinary when oxygen is included) -based oxide, Bi: Sr: Ca: Cu = 0.7 to 1.1:
Compounds having a ratio of 1.4 to 3.1: 0.85 to 1.1: 2.0 have an absolute temperature of about
It is a new substance that exhibits a superconducting transition at 110K. A thin film that maintains this transition temperature can be realized by reducing the thickness of one deposited film to 2500 ° or less. As a result, since the transition temperature is at least 30 degrees higher than the liquid nitrogen temperature 77, various electronic devices that can operate stably at 77K can be realized by the thin film having this composition ratio.

【図面の簡単な説明】[Brief description of the drawings]

第1図は初期膜厚775ÅのBi1.08Sr1.43Ca1.08Cu2.0Ox
膜の電気抵抗の温度変化を示す特性図、 第2図は初期膜厚1993ÅのBi0.94Sr1.40Ca0.88Cu2.0Ox
薄膜の電気抵抗の温度変化を示す特性図、 第3図は初期膜厚2814ÅのBi0.95Sr1.48Ca1.10Cu2.0Ox
薄膜の電気抵抗の温度変化を示す特性図、 第4図は本発明による基板MgO上のBi−Sr−Ca−Cu−O
超伝導薄膜のX線回折図、 第5図は堆積と熱処理を繰返し行った膜厚約4000Åの薄
膜の電気抵抗の温度変化を示す特性図、 第6図は膜厚2006ÅのBi0.92Sr3.08Ca1.04Cu2.0Ox薄膜
の電気抵抗の温度変化を示す特性図である。
FIG. 1 is a characteristic diagram showing a temperature change of electric resistance of a Bi 1.08 Sr 1.43 Ca 1.08 Cu 2.0 O x thin film having an initial film thickness of 775 mm. FIG. 2 is a Bi 0.94 Sr 1.40 Ca 0.88 Cu 2.0 O x film having an initial film thickness of 1993 mm.
Characteristic diagram showing the temperature change of the electric resistance of the thin film, Bi 0.95 of Figure 3 is the initial film thickness 2814Å Sr 1.48 Ca 1.10 Cu 2.0 O x
FIG. 4 is a characteristic diagram showing a change in electric resistance of the thin film with temperature, and FIG.
X-ray diffraction diagram of the superconducting thin film, FIG. 5 is a characteristic diagram showing temperature change of electric resistance of a thin film having a thickness of about 4000 行 っ obtained by repeating deposition and heat treatment, and FIG. 6 is Bi 0.92 Sr 3.08 Ca of 2006 膜厚 thickness. FIG. 4 is a characteristic diagram showing a temperature change of electric resistance of a 1.04 Cu 2.0 O x thin film.

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】100K以上の温度で電気抵抗が零となる酸化
物超伝導体膜の製造法において、蒸着法によってCu,Bi,
CaF2,SrF2を基板上に積層して2500Å以下の厚さの積層
体を堆積し、この積層体を酸素中で熱処理して組成式Bi
uSrvCawCuxOyで表され、u:v:w:xの比が0.7〜1.1:1.4〜
3.1:0.85〜1.1:2である酸化物超伝導体膜を作成するこ
とを特徴とする酸化物超伝導体膜の製造方法。
1. A method for producing an oxide superconductor film having an electric resistance of zero at a temperature of 100 K or more, comprising the steps of: depositing Cu, Bi,
Laminate CaF 2 and SrF 2 on a substrate to deposit a laminate having a thickness of 2500 mm or less.
u Sr v Ca w Cu x O y , where the ratio of u: v: w: x is 0.7-1.1: 1.4-
3.1: A method for producing an oxide superconductor film, comprising preparing an oxide superconductor film having a ratio of 0.85 to 1.1: 2.
【請求項2】前記積層体を2500Å以下の厚さで基板上へ
堆積し、熱処理する工程を複数回繰り返すことを特徴と
する請求項1に記載の酸化物超伝導体膜の製造方法。
2. The method for producing an oxide superconductor film according to claim 1, wherein the step of depositing the laminate with a thickness of 2500 ° or less on a substrate and performing a heat treatment is repeated a plurality of times.
JP63065871A 1988-03-22 1988-03-22 Method for producing oxide superconductor film Expired - Fee Related JP2635355B2 (en)

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JP2650513B2 (en) * 1991-06-24 1997-09-03 財団法人国際超電導産業技術研究センター Method for producing Bi-Sr-Ca-Cu-O-based superconducting film
JP2606043B2 (en) * 1992-03-06 1997-04-30 財団法人国際超電導産業技術研究センター Multilayer film for passive device comprising BiSrCaCuO-based superconducting layer and bismuth oxide insulating layer, and method of manufacturing the same
WO1999000435A1 (en) 1997-06-30 1999-01-07 Sanyo Chemical Industries, Ltd. Polymerizable resin, and cured resins, insulators, components of electrical appliances, and electrical appliances made by using the same

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