JP2013015564A - Method for evaluating patterned retardation film - Google Patents

Abstract

An evaluation method capable of easily evaluating the size and shape of a region of a pattern retardation film is provided.
SOLUTION: A linearly polarizing plate and a circularly polarizing plate, a patterned retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and one of the linearly polarizing plate and the circularly polarizing plate provided on the opposite side of the patterned retardation film. A light source and a mask provided between the light source and the other side of the linearly polarizing plate and the circularly polarizing plate opposite to the other pattern retardation film or between the linearly polarizing plate and the circularly polarizing plate and the light source. In an evaluation system in which the film has a plurality of types of regions with different slow axis directions, and the mask includes a light-shielding part and a light-transmitting part, light emitted from the light source from the side opposite to the light source of the mask with the light source illuminated Observe.
[Selection] Figure 3

Description

  The present invention relates to a method for evaluating a patterned retardation film.

  As an aspect of the liquid crystal display device, a liquid crystal display device including a retardation film having a specific pattern provided in a state of being aligned with a pixel is known. For example, in a passive-type stereoscopic image display device, a right-eye image and a left-eye image are usually displayed simultaneously on the same screen, and these images are distributed to the left and right eyes using dedicated glasses. ing. Therefore, the passive stereoscopic image display device is required to display the right-eye image and the left-eye image in different polarization states. In order to achieve such display, a passive stereoscopic image display device may be provided with a retardation film having a pattern composed of a plurality of types of regions having two or more types of different retardations (retardation). (See Patent Documents 1 and 2).

JP 2009-193014 A Japanese Patent No. 4363029

  Conventionally, the retardation film having the pattern as described above is often provided on the surface of a highly rigid base material such as a glass plate. However, in recent years, as an improvement for obtaining advantageous effects such as an improvement in production efficiency, it is conceivable to provide a retardation film having the above-described pattern on a flexible base film. To give a specific example, a retardation film having a pattern provided on such a flexible base film is bonded to an obliquely stretched retardation film to form a long retardation film. If it is possible to manufacture a liquid crystal panel that is continuously bonded, a quarter-wave plate and a retardation film having a pattern can be easily provided at the same time, significantly increasing manufacturing efficiency and significantly reducing manufacturing costs. It is expected that the obtained liquid crystal display device can be reduced in weight.

  The alignment between the retardation film having a pattern and the liquid crystal panel is required to be performed so that each region constituting the pattern of the retardation film corresponds to a pixel precisely. Specifically, in the example of the passive-type stereoscopic image display device described above, the boundary between the regions constituting the pattern is located on the black matrix of the boundary between the right-eye pixel and the left-eye pixel. It is required to achieve such an arrangement over the entire display surface.

  However, when a flexible base film is used, since the dimensional stability and the shape stability are low, the size or shape of the region constituting the pattern may not be as designed. Even when a retardation film having such a pattern that is not as designed is bonded to a liquid crystal panel, a liquid crystal display device having sufficient quality as a product cannot be obtained. Therefore, before laminating a retardation film having a pattern with a liquid crystal panel, the size and shape of the region of the retardation film having the pattern are evaluated, and whether or not the laminating film can be appropriately laminated with the liquid crystal panel. It is preferable to confirm.

  The evaluation may be performed, for example, by actually measuring the dimensions of each region of the retardation film. However, it is cumbersome and takes a long time to measure all of a large number of regions in the retardation film. Therefore, there has been a demand for a method for simply evaluating whether the size and shape of the region of the retardation film having a pattern can be bonded to a liquid crystal panel.

  The present invention has been made in view of the above problems, and an object of the present invention is to provide an evaluation method that can easily evaluate the size and shape of the region of the pattern retardation film.

As a result of intensive studies to solve the above problems, the present inventor prepared a mask for evaluation according to the shape and size of the pixel of the liquid crystal panel, and observed the pattern retardation film with polarized light through the mask under predetermined conditions. In this case, it was found that the size and shape of the pattern retardation film region can be easily and accurately evaluated depending on whether or not there is light leakage, and the present invention was completed. It was.
That is, the gist of the present invention is the following [1] to [6].

[1] A linearly polarizing plate and a circularly polarizing plate, a pattern retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and one side of the linearly polarizing plate and the circularly polarizing plate opposite to the patterned retardation film A light source provided on the opposite side of the linearly polarizing plate and the circularly polarizing plate to the other side of the pattern retardation film, or a mask provided between one of the linearly polarizing plate and the circularly polarizing plate and the light source; In an evaluation system in which the pattern retardation film has a plurality of types of regions having different slow axis directions, and the mask includes a light-shielding part and a light-transmitting part. The evaluation method of a pattern phase difference film which observes the light which the said light source emitted from the opposite side to a light source.
[2] A light source, a mask, one of a linearly polarizing plate and a circularly polarizing plate, a pattern retardation film, and the other of a reflective linearly polarizing plate and a circularly polarizing plate are provided in this order. In the evaluation system having a plurality of types of regions having different slow axis directions, and the mask includes a light-shielding part and a light-transmitting part, the light source from the same side as the light source of the mask with the light source illuminated. The evaluation method of a pattern phase difference film which observes the emitted light.
[3] The in-plane retardation of the pattern retardation film is ¼ wavelength,
The pattern retardation film evaluation method according to [1], wherein the pattern retardation film has two types of regions in which the slow axis direction is perpendicular.
[4] The in-plane retardation of the pattern retardation film is a quarter wavelength,
The pattern retardation film evaluation method according to [2], wherein the pattern retardation film has two types of regions in which the slow axis direction is perpendicular.
[5] The pattern retardation film is provided on the surface of a substrate having a retardation,
The evaluation system is the same compensation substrate as the substrate, and the pattern retardation film and the linearly polarized light are set so that the slow axis of the substrate and the slow axis of the compensation substrate are perpendicular to each other. The evaluation method of the pattern phase difference film of [1] or [3] provided between the other of a board and a circularly-polarizing plate.
[6] The pattern retardation film is provided on a surface of a substrate having a retardation,
The evaluation system is the same compensation substrate as the substrate, and the pattern retardation film and the linearly polarized light are set so that the slow axis of the substrate and the slow axis of the compensation substrate are perpendicular to each other. The evaluation method of the pattern retardation film of [2] or [4] provided between one of a board and a circularly-polarizing plate.

  According to the evaluation method of the pattern retardation film of the present invention, the size and shape of the region of the pattern retardation film can be easily evaluated.

FIG. 1 is a top view schematically showing an example of a pattern that the pattern retardation film may have. FIG. 2 is a top view schematically showing an example of the relative positional relationship between the pattern retardation film region and the pixels of the liquid crystal panel. FIG. 3 is a diagram schematically showing an evaluation system according to the first embodiment of the present invention. FIG. 4 is a top view schematically showing the relative positional relationship between the evaluation mask provided in the evaluation apparatus according to the first embodiment of the present invention and the black matrix of the liquid crystal panel. FIG. 5 is a diagram schematically showing an evaluation system according to the first embodiment of the present invention. FIG. 6 is a diagram schematically showing an evaluation system according to the second embodiment of the present invention. FIG. 7 is a diagram schematically showing an evaluation system according to the second embodiment of the present invention. FIG. 8 is a diagram schematically showing an evaluation system according to the third embodiment of the present invention. FIG. 9 is a diagram schematically showing an evaluation system according to the third embodiment of the present invention. FIG. 10 is a diagram schematically showing an evaluation system according to the fourth embodiment of the present invention. FIG. 11 is a diagram schematically showing an evaluation system according to the fourth embodiment of the present invention. FIG. 12 is a diagram schematically showing an evaluation system according to the fifth embodiment of the present invention. FIG. 13 is a diagram schematically showing an evaluation system according to the fifth embodiment of the present invention. FIG. 14 is a diagram schematically showing an evaluation system according to the sixth embodiment of the present invention. FIG. 15 is a diagram schematically showing an evaluation system according to the sixth embodiment of the present invention. FIG. 16 is a diagram schematically showing an evaluation system according to the seventh embodiment of the present invention. FIG. 17 is a diagram schematically showing an evaluation system according to the seventh embodiment of the present invention. FIG. 18 is a diagram schematically showing an evaluation system according to the eighth embodiment of the present invention. FIG. 19 is a diagram schematically showing an evaluation system according to the eighth embodiment of the present invention. FIG. 20 is an exploded top view schematically showing an example of a liquid crystal display device that can be used as a stereoscopic image display device. FIG. 21 is a diagram schematically illustrating a state of a sample when measuring the deflection width ΔD and the average width D of the pattern retardation film region of the pattern retardation film in Examples. FIG. 22 is a diagram schematically illustrating an image photographed when a pattern retardation film is photographed for measuring ΔD / D in the example. FIG. 23 is a diagram schematically illustrating a state in which a part of the image illustrated in FIG. 22 is enlarged. FIG. 24 is a diagram illustrating an example of a graph representing a standardized Y value in an image obtained by photographing a pattern retardation film in order to explain a method of measuring the touch width ΔD of the region of the pattern retardation film layer. is there.

  Hereinafter, the present invention will be described in detail with reference to embodiments and examples, but the present invention is not limited to the following embodiments and examples, and the gist of the present invention and its equivalent scope are described below. You may implement arbitrarily changing in the range which does not deviate.

In the following description, “long” means one having a length of at least 5 times the width, preferably 10 times or more, specifically a roll shape. It has a length enough to be wound up and stored or transported.
The “retardation plate”, “polarizing plate”, and “substrate” include not only rigid members but also flexible members such as resin films.

  Further, “phase difference” means in-plane retardation (in-plane retardation) unless otherwise specified. The in-plane retardation of the film is a direction (in-plane direction) perpendicular to the thickness direction of the film and giving a maximum refractive index, nx, the in-plane direction and perpendicular to the nx direction. The refractive index ny and the film thickness d of the film are values represented by (nx−ny) × d. The in-plane retardation can be measured using a commercially available retardation measuring device (for example, “KOBRA-21ADH” manufactured by Oji Scientific Instruments, “WPA-micro” manufactured by Photonic Lattice) or the Senalmon method.

Further, “(meth) acrylate” means “acrylate” and “methacrylate”, and “(meth) acryl” means “acryl” and “methacryl”.
“Ultraviolet light” means light having a wavelength of 1 nm or more and 400 nm or less.

Further, the directions of the components are “parallel”, “vertical”, and “orthogonal”, unless otherwise specified, include errors within a range that does not impair the effects of the present invention, for example, within ± 5 °. Also good. Further, “along” in a certain direction means “in parallel” in a certain direction.
In the following description, the angle of the optical axis of the optical element, such as the transmission axis of the polarizing plate and the slow axis of the retardation film, means an angle viewed from the thickness direction unless otherwise specified. .

[1. Target of evaluation]
The pattern retardation film to be evaluated by the evaluation method of the present invention is a film having a plurality of types of regions having different slow axis directions. These regions are formed at different positions when viewed from the thickness direction of the pattern retardation film. Further, these regions are arranged so as to form a pattern according to the use of the pattern retardation film.

  As an example of a suitable combination of the regions of the pattern retardation film, a combination of two types of regions in which the slow axis direction is perpendicular can be mentioned. Here, the phrase that the slow axis direction is perpendicular means that the angle formed by these slow axis directions is usually within 90 ° ± 5 °, preferably within 90 ° ± 1 °. Specific examples of combinations include a combination of a region in which the slow axis direction is parallel to the longitudinal direction of the pattern retardation film and a region perpendicular thereto, and a slow axis direction with respect to the longitudinal direction of the pattern retardation film. And a combination of a region that forms an angle of + 45 ° and a region that forms an angle of −45 °.

  Usually, the retardation of each area | region of a pattern retardation film is made the same. That is, usually, the patterned retardation film according to the present invention has a plurality of types of regions having different retardation directions but the same retardation. The specific retardation of each region of the pattern retardation film may be set according to the configuration of the liquid crystal display device. For example, the in-plane retardation of the pattern retardation film may be set to ¼ wavelength with respect to the transmitted light so that each region of the pattern retardation film can function as a ¼ wavelength plate. The phase difference of ¼ wavelength with respect to the transmitted light is usually ± 65 nm, preferably ± 30 nm, more preferably ± 10 nm from the value of ¼ of the central value of the wavelength range of the transmitted light. Or, it is in the range of ± 65 nm, preferably ± 30 nm, more preferably ± 10 nm from the value of 3/4 of the central value. Since the transmitted light is normally visible light, 550 nm, which is the central value of the wavelength range of visible light, is usually applied as the central value of the wavelength range of transmitted light.

  The specific shape of the pattern formed by the area of the pattern retardation film is usually appropriately set according to the application. For example, when the pattern retardation film is applied to a liquid crystal display device, the pattern of the region of the pattern retardation film may be set according to the arrangement of the pixels of the liquid crystal panel combined with the pattern retardation film. When the liquid crystal display device is a passive stereoscopic image display device, the liquid crystal panel usually has two sets of pixel groups, that is, a pixel group for observation with the right eye and a pixel group for observation with the left eye. For example, the pattern retardation film has a first region in which the slow axis direction forms one angle of + 45 ° and −45 ° with respect to the longitudinal direction of the pattern retardation film, and a second region which forms the other angle. In the pattern retardation film region pattern, the region corresponding to one of these pixel groups may be the first region, and the region corresponding to the other may be the second region. More specifically, a pattern in which a plurality of regions extend in a strip shape along the longitudinal direction can be preferably exemplified.

  FIG. 1 is a top view schematically showing an example of a pattern that the pattern retardation film may have. In the example shown in FIG. 1, the pattern retardation film 10 has a plurality of regions 11 and 12 alternately, and thus has a striped pattern composed of these regions. Each of the regions 11 and 12 has a strip shape extending in parallel to the longitudinal direction (direction indicated by the coordinate axis X). Therefore, the pattern retardation film 10 has a boundary line 13 between the region 11 and the region 12 as a line extending in the longitudinal direction. As described above, the boundary lines 13 of the plural types of regions 11 and 12 included in the pattern retardation film 10 may be referred to as “pattern boundary lines” below.

The widths W ₁₁ and W ₁₂ of the regions 11 and 12 may be set in accordance with the dimensions of the pixels of the liquid crystal panel to be combined. Usually, since the dimensions of the pixels of the liquid crystal panel are uniform, the widths W ₁₁ and W _{12 of} any of the regions 11 and ₁₂ are approximately the same. Further, the pattern boundary lines 13 between the different types of regions 11 and 12 are aligned at positions corresponding to the black matrix between the pixels of the liquid crystal panel, and the black matrix has a certain width. . Therefore, minute width of the black matrix, since there may be a difference between the width _{W 12} of width _{W 11} and the region 12 of the region 11, the width _{W 11} and _{W 12} different types of regions 11 and 12 It does not have to be the same.

FIG. 2 is a top view schematically showing an example of the relative positional relationship between the regions 11 and 12 of the pattern retardation film 10 and the pixels of the liquid crystal panel. In the example of FIG. 2, the liquid crystal panel 20 is a liquid crystal panel for a passive stereoscopic image display device, and includes two groups of pixels, that is, a pixel group for observation with the right eye and a pixel for observation with the left eye. Has a group. The pixel R ₁ , the pixel G _1, and the pixel B ₁ constitute a first pixel group of the two sets of pixel groups, and the pixel R ₂ , the pixel G _2, and the pixel B ₂ constitute a second pixel group. Yes. The pixels of each pixel group are aligned in the longitudinal direction (in the direction of the coordinate axis X in the figure), and constitute a pixel column 21 of the first pixel group and a pixel column 22 of the second pixel group. The pixel columns 21 and 22 are alternately arranged in the width direction (coordinate axis Y direction). Therefore, the first pixel group and the second pixel group are separated by a black matrix portion 23 extending in the longitudinal direction (coordinate axis X direction) of the liquid crystal panel 20. In this example, the pattern retardation film 10 is aligned so that the pattern boundary lines 13 of the regions 11 and 12 are positioned on the black matrix portion 23.

  When such alignment is performed, if the size or shape of the region 11 or 12 of the pattern retardation film 10 is not as designed, the pattern boundary line 13 cannot be positioned on the black matrix portion 23, which is desired. Liquid crystal display devices may not be manufactured. For example, if the width of the region 11 or 12 is not appropriate or the straightness (that is, the shape is close to a straight line) is impaired, for example, crosstalk occurs in the liquid crystal display device, which may cause a defective product. There is sex. Therefore, if the pattern retardation film 10 is evaluated before the manufacture of the product to determine whether or not the pattern retardation film 10 can be properly aligned, the liquid crystal display device is not suitable. Generation of non-defective products can be suppressed. At this time, if the evaluation method of the present invention is used, the pattern retardation film 10 can be easily evaluated.

  The thickness of the pattern retardation film can be set to an appropriate thickness so that a desired retardation can be obtained in each of the above regions. Usually, the thickness of the pattern retardation film is in the range of 0.5 μm to 50 μm.

  The pattern retardation film may be provided directly on the surface of the base material without using another layer or indirectly through another layer such as an adhesive layer. Hereinafter, the multilayer film including the base material and the pattern retardation film may be referred to as “laminated retardation film”. As the substrate, a film is usually used.

The substrate preferably has a uniform phase difference and slow axis direction in the plane. This is because the pattern retardation film is appropriately evaluated. Here, the in-plane retardation is different from the pattern retardation film, which means that the substrate does not have a pattern composed of two or more regions having different retardations. The variation in the in-plane retardation of the substrate is preferably within ± 20 nm, more preferably within ± 10 nm.
Further, the uniform slow axis direction in the plane means that, unlike the pattern retardation film, it does not have a pattern composed of two or more regions having different slow axis directions. The variation in the slow axis direction in the plane of the base film is preferably within ± 5 °, more preferably within ± 1 °.

As the substrate, an isotropic film having no retardation may be used, or a retardation film having a retardation may be used.
When a retardation film is used as the substrate, the specific retardation of the retardation film may be set according to the configuration of the liquid crystal display device. For example, a retardation film that can function as a quarter-wave plate may be used. The retardation of the retardation film that can function as a quarter-wave plate is usually ± 65 nm, preferably ± 30 nm, more preferably ± 10 nm, from a quarter value of the center value of the wavelength range of transmitted light. Or within the range of 3/4 of the central value, usually ± 65 nm, preferably ± 30 nm, more preferably ± 10 nm. Since the transmitted light is usually visible light, the center value of the wavelength range of the transmitted light is usually 550 nm, which is the center value of the wavelength range of the transmitted light.

  When the substrate is a retardation film, the angle formed by the longitudinal direction of the retardation film and the slow axis direction of the retardation film may be set according to the mode of the liquid crystal display device. For example, by stretching the retardation film in the width direction or the longitudinal direction, the slow axis direction of the retardation film may be a direction parallel to or perpendicular to the longitudinal direction. Further, for example, by using a stretched film obliquely stretched as the retardation film, the slow axis direction of the retardation film is about 45 ° with respect to the longitudinal direction (for example, 45 ° ± 5 °, preferably 45 ° ± 1 °). ).

  In addition to the pattern retardation film and the substrate, the laminated retardation film may include any layer as long as the effects of the present invention are not significantly impaired. For example, you may provide the contact bonding layer which bonds a pattern phase difference film and a base material. An adhesive layer is a layer formed of an adhesive. This adhesive is not only a narrowly defined adhesive (an adhesive having a shear storage modulus of 1 to 500 MPa at 23 ° C. after irradiation with energy rays or after heat treatment), but also has a shear storage modulus of less than 1 MPa at 23 ° C. The adhesive which is is also included.

[2. First embodiment]
In the method for evaluating a patterned retardation film according to the first embodiment of the present invention, a linearly polarizing plate and a circularly polarizing plate, a patterned retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and a linearly polarizing plate (that is, A light source provided on the opposite side of the linear retardation plate and one of the circularly polarizing plates) and a circular retardation plate (that is, the other of the linearly polarizing plate and the circularly polarizing plate) An evaluation system including a mask provided on the opposite side (hereinafter sometimes referred to as an “evaluation mask”) is prepared, and the light source is illuminated in this evaluation system, and the opposite side of the light source of the evaluation mask The light emitted from the light source is observed.

[2-1. Preparation of evaluation system]
FIG. 3 is a diagram schematically showing an evaluation system according to the first embodiment of the present invention. As shown in FIG. 3, in the evaluation system 1 according to the first embodiment of the present invention, a light source 110, a linearly polarizing plate 120, a circularly polarizing plate 130, an evaluation mask 140, and a camera 150 as an observation device, Are provided in this order. Between the linearly polarizing plate 120 and the circularly polarizing plate 130, a laminated retardation film 180 including a base material 160 and a pattern retardation film 170 provided on the surface of the base material 160 is inserted.

Here, each of the linearly polarizing plate 120, the circularly polarizing plate 130, the evaluation mask 140, and the laminated retardation film 180 is disposed so that the principal surfaces thereof are parallel to the horizontal direction and the thickness directions thereof coincide. . In the following description, unless otherwise specified, “thickness direction” means the thickness direction.
In FIG. 3, the linearly polarizing plate 120, the circularly polarizing plate 130, the evaluation mask 140, and the laminated retardation film 180 are shown apart from each other for illustration, but some or all of these are actually used. In this aspect, the contact may be evaluated.

  The light source 110 is a device that can emit non-polarized light for evaluation. Usually, a device capable of emitting visible light is used as the light source 110.

The linear polarizing plate 120 may be an absorption linear polarizing plate or a reflective linear polarizing plate. Here, the absorption linear polarizing plate means a polarizing plate that transmits linearly polarized light having a vibration direction parallel to a predetermined transmission axis direction and can absorb other polarized light. The reflection type linearly polarizing plate means a polarizing plate that transmits linearly polarized light having a vibration direction parallel to a predetermined transmission axis direction and can reflect other polarized light. The vibration direction of linearly polarized light means the vibration direction of the electric field of linearly polarized light. In the present embodiment, it is assumed that the linear polarizing plate 120 having the transmission axis A ₁₂₀ parallel to the longitudinal direction of the pattern retardation film 170 is used.

The circularly polarizing plate 130 may be an absorption type circularly polarizing plate or a reflective type circularly polarizing plate. Here, the absorption-type circularly polarizing plate means a polarizing plate that transmits circularly polarized light that rotates in a predetermined rotation direction and that can absorb other polarized light. The reflection type circularly polarizing plate means a polarizing plate that transmits circularly polarized light rotating in a predetermined rotation direction and can reflect other polarized light. In the present embodiment, the circularly polarized light rotating in the same direction of rotation A ₁₃₀ and the rotational direction Aii circularly polarized light linearly polarized light transmitted through the linearly polarizing plate 120 is converted through the first region 171 of the patterned retardation film 170 It is assumed that a circularly polarizing plate 130 that transmits light is used.

  The evaluation mask 140 includes a light shielding portion 141 that can block light, and a light transmitting portion 142 that can transmit light. The dimensions and shapes of the light shielding part 141 and the light transmitting part 142 are set according to the liquid crystal panel to be bonded to the laminated retardation film 180 to be evaluated. In the present embodiment, the laminated retardation film 180 is scheduled to be bonded to the same liquid crystal panel 20 as described with reference to FIG. 2, and the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140 are combined. The dimensions and shape are set according to the liquid crystal panel 20 described above.

  FIG. 4 is a top view schematically showing a relative positional relationship between the evaluation mask 140 provided in the evaluation apparatus according to the first embodiment of the present invention and the black matrix of the liquid crystal panel. In the present embodiment, the first region 171 and the second region 172 of the pattern retardation film 170 of the laminated retardation film 180 are aligned with the first pixel group and the second pixel group of the liquid crystal panel 20, respectively. It is like that. In this case, as shown in FIG. 4, the light shielding portion 141 of the evaluation mask 140 covers the first pixel group column 21 and the light transmitting portion 142 covers the second pixel group column 22. The

The width W ₁₄₁ of the light shielding portion 141 of the evaluation mask 140 is set to be the same as the total width of the column 21 of the first pixel group and the black matrix portions 23 at both ends surrounding the column 21. On the other hand, the width W ₁₄₂ of the light transmitting portion 142 of the evaluation mask 140 is set to be the same as the width of the column 22 of the second pixel group. As a result, when the shapes or dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are non-uniform to the extent that they do not affect the image quality of the stereoscopic display of the liquid crystal display device, Leaks cannot be observed and non-uniformities cannot be detected. Therefore, for example, when the shapes or dimensions of the first region 171 and the second region 172 are set within a range that can be accommodated in the width of the black matrix portion 23, a practically used pattern retardation film is evaluated as a defective product. Can be avoided.

  The evaluation mask 140 is provided so as to be movable in the in-plane direction.

  The camera 150 is an observation device that performs observation from the thickness direction and detects light emitted from the light source 110 and transmitted through the linearly polarizing plate 120, the laminated retardation film 180, the circularly polarizing plate 130, and the evaluation mask 140.

As shown in FIG. 3, the laminated retardation film 180 to be observed includes a film-like substrate 160 and a pattern retardation film 170 formed on the surface of the substrate 160.
In the present embodiment, the substrate 160 is an isotropic film having no phase difference.

  The pattern retardation film 170 has a first region 171 and a second region 172 as strip-like regions extending parallel to the longitudinal direction of the pattern retardation film 170. The first regions 171 and the second regions 172 are alternately provided in the width direction of the pattern retardation film 170, and these form a stripe pattern as a whole. As described above, the first region 171 and the second region 172 of the pattern retardation film 170 are respectively the first pixel group column 21 and the second pixel group of the liquid crystal panel 20 as shown in FIG. It is adapted to be aligned with the row 22.

In the present embodiment, each of the first region 171 and the second region 172 has a phase difference of ¼ wavelength with respect to the transmitted light. For this reason, both the first region 171 and the second region 172 are regions that can function as quarter-wave plates.
Further, the slow axis direction _{A 171} of the first region 171 and the slow axis direction _{A 172} of the second region _{A 172} are perpendicular. Specifically, the slow axis direction A ₁₇₁ of the first region 171 forms one angle of + 45 ° and −45 ° with respect to the longitudinal direction of the pattern retardation film 170, and the slow axis direction of the second region 172. A ₁₇₂ forms the other angle of + 45 ° and −45 ° with respect to the longitudinal direction of the pattern retardation film 170. Thus, the slow axis direction _{A 172} in the slow axis direction _{A 171} and the second region 172 of the first region 171, an angle of + 45 ° with respect to the transmission axis _{A 120} of linear polarizer 120 or -45 ° ing.

  Thus, in this embodiment, the linear polarizing plate 120 and the circularly polarizing plate 130, the pattern retardation film 170 provided between the linearly polarizing plate 120 and the circularly polarizing plate 130, and the pattern of the linearly polarizing plate 120 are used. An evaluation system 1 including a light source 110 provided on the side opposite to the phase difference film 170 and an evaluation mask 140 provided on the side opposite to the pattern phase difference film 170 of the circularly polarizing plate 130 is configured. .

[2-2. Evaluation of pattern retardation film]
After preparing the evaluation system 1 as described above, the light emitted from the light source 110 is observed from the opposite side of the evaluation mask 140 from the light source 110 with the light source 110 illuminated. In the present embodiment, observation is performed by photographing the surface of the evaluation mask 140 with the camera 150. At this time, the evaluation mask 140 is moved to adjust the position so that the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140 overlap the first region 171 and the second region 172 of the pattern retardation film, respectively. Thus, the relative positions of the evaluation mask 140 and the pattern retardation film 170 are aligned to evaluate whether a dark state where light emitted from the light source 110 is not detected is observed.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 3, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern formed by the first region 171 and the second region 172 and the evaluation mask 140 are formed. The patterns formed by the light shielding portion 141 and the light transmitting portion 142 coincide with each other. For this reason, by performing relative positioning between the pattern retardation film 170 and the evaluation mask 140, the first region 171 and the second region 172 of the pattern retardation film 170 are seen from the thickness direction at a certain position. Since the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140 overlap, it can be observed in a dark state.

Specifically, when light is emitted from the light source 110, a part of the light _{L I} is linear polarizer 120, a substrate 160, transmitted in the order of the first region 171 and the circular polarizer 130 of patterned retardation film 170 Then, the light enters the evaluation mask 140.
That is, when the light _{L I} is incident on linear polarizer 120, the linearly polarized light having a vibration direction parallel to Ai to the transmission axis _{A 120} of linear polarizer 120 is transmitted through the linearly polarizing plate 120, the other polarization linear polarizer 120 Blocked by.
Light _{L I} transmitted through the linearly polarizing plate 120 is then transmitted through the substrate 160. At this time, since the substrate 160 has no phase difference, the light L _I is directly transmitted through the base 160 without changing the polarization state.
Light _{L I} transmitted through the substrate 160 is then transmitted through the first region 171 of the patterned retardation film 170. Since the first region 171 can function as a quarter-wave plate, the light L _I is converted into circularly polarized light when passing through the first region 171.
Light _{L I} transmitted through the first region 171 is then incident on the circularly polarizing plate 130. Since the incident light L _I is circularly polarized light that rotates in the same rotation direction Aii as the rotation direction A ₁₃₀ that can pass through the circularly polarizing plate 130, the light L _I passes through the circularly polarizing plate 130.
Light _{L I} that has passed through the circular polarizer 130, then, enters the evaluating mask 140. At this time, the light shielding portion 141 of the evaluating mask 140 as viewed from the thickness direction overlaps the whole of the first region 171 of the patterned retardation film 170, the light L _I is shielded by the light shielding portion 141.

Further, another light L _II emitted from the light source 110 passes through the linearly polarizing plate 120, the base material 160, and the second region 172 of the pattern retardation film 170 in this order, and enters the circularly polarizing plate 130.
That is, when the light L _II is incident on the linearly polarizing plate 120, linearly polarized light having a vibration direction Ai parallel to the transmission axis A ₁₂₀ of the linearly polarizing plate 120 is transmitted through the linearly polarizing plate 120, and the other polarized light is linearly polarizing plate 120. Blocked by.
The light L _II transmitted through the linearly polarizing plate 120 is then transmitted through the substrate 160 without changing the polarization state.
Thereafter, the light L _{II that} has passed through the substrate 160 passes through the second region 172 of the pattern retardation film 170. Since the second region 172 can function as a quarter-wave plate, the light L _II is converted into circularly polarized light when passing through the second region 172. However, since the slow axis direction A ₁₇₂ of the second region 172 is perpendicular to the slow axis direction A ₁₇₁ of the first region 171, the rotation direction Aiii of the circularly polarized light transmitted through the second region 172 is This is opposite to the rotation direction Aii of the circularly polarized light transmitted through the region 171.
The light L _{II that} has passed through the second region 172 of the pattern retardation film 170 then enters the circularly polarizing plate 130. Since the rotational direction Aiii of the circularly polarized light of the incident light L _II is opposite to the rotational direction A ₁₃₀ that can be transmitted through the circularly polarizing plate 130, the light L _II is blocked by the circularly polarizing plate 130.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the light L _I and L _II are not detected by the camera 150. Accordingly, if the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed and a dark state is observed at at least one position, the first region 171 and the second region 172 of the pattern retardation film 170 are observed. It can be evaluated that the size and shape of the are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 5 is a diagram schematically showing an evaluation system according to the first embodiment of the present invention.
In the evaluation system 1 shown in FIG. 5, the width of the first region 171 and the second region 172 of the pattern retardation film 170 is out of an appropriate size range, or the shape is straightened and the straightness of the shape is impaired. The pattern formed by the first region 171 and the second region 172 does not match the pattern formed by the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140. Therefore, even if the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, at least a part of the first region 171 of the pattern retardation film 170 is evaluated at any position as viewed from the thickness direction. Since it does not overlap with the light shielding portion 141 of the mask 140 for observation, it cannot be observed in a dark state.

Specifically, when light is emitted from the light source 110, a part of the light L _III, in the same manner as the light L _I described with reference to FIG. 3, the linearly polarizing plate 120, substrate 160, patterned retardation film The light passes through the first region 171 of 170 and the circularly polarizing plate 130 in this order, and enters the evaluation mask 140. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _III is transmitted through the light transmitting portion of the evaluation mask 140. 142 passes through camera 150 and enters camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  As described above, if the shapes or dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate, relative alignment between the pattern retardation film 170 and the evaluation mask 140 may be performed. Cannot be observed in the dark. Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

  As described above, according to the evaluation method of the present embodiment, the first region 171 and the second region 171 and the second region 172 of the pattern retardation film 170 can be measured without actually measuring the shapes and dimensions of the first region 171 and the second region 172. It can be easily evaluated whether or not the shape and size of the region 172 are appropriate in relation to the liquid crystal panel to be bonded. In particular, when it is appropriate, a dark state is observed, and when it is not appropriate, light from the light source 110 is detected. Therefore, since light in the dark place is conspicuous, even a small amount of light can be easily detected. In view of this, it is possible to perform highly accurate evaluation.

[3. Second embodiment]
In the method for evaluating a patterned retardation film according to the second embodiment of the present invention, a linearly polarizing plate and a circularly polarizing plate, a patterned retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and a linearly polarizing plate (that is, , One of the linearly polarizing plate and the circularly polarizing plate) provided between the light source provided on the opposite side of the pattern retardation film and the linearly polarizing plate (that is, one of the linearly polarizing plate and the circularly polarizing plate) and the light source. An evaluation system including the evaluation mask thus prepared is prepared, and light emitted from the light source is observed from the side opposite to the light source of the evaluation mask in a state in which the light source is illuminated in the evaluation system.

[3-1. Preparation of evaluation system]
FIG. 6 is a diagram schematically showing an evaluation system according to the second embodiment of the present invention. As shown in FIG. 6, in the evaluation system 2 according to the second embodiment of the present invention, since the position of the evaluation mask 140 is changed, the order of the components of the evaluation system 2 is the light source 110 and the evaluation mask. 140, the linearly polarizing plate 120, the laminated retardation film 180, the circularly polarizing plate 130, and the camera 150 are the same as in the first embodiment except that the order is changed.

  Thereby, in this embodiment, the pattern position of the linearly polarizing plate 120 and the circularly polarizing plate 130, the pattern retardation film 170 provided between the linearly polarizing plate 120 and the circularly polarizing plate 130, and the linearly polarizing plate 120. An evaluation system 2 including a light source 110 provided on the side opposite to the phase difference film 170 and an evaluation mask 140 provided between the linearly polarizing plate 120 and the light source 110 is configured.

[3-2. Evaluation of pattern retardation film]
After the evaluation system 2 as described above is prepared, the light emitted from the light source 110 is observed from the opposite side of the evaluation mask 140 from the light source 110 in the state where the light source 110 is illuminated, as in the first embodiment. To do.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
When light is emitted from the light source 110 as shown in FIG. 6, part of the light L _IV enters the light shielding portion 141 of the evaluation mask 140 is blocked by the light shielding portion 141.

Another light _{L V} emitted from the light source 110, the evaluation mask 140, linear polarizer 120 transmits the order of the second region 172 of the substrate 160 and patterned retardation film 170, incident on the circular polarizer 130 To do.
That is, the light _{L V} is transmitted through the light transmitting portion 142 of the evaluating mask 140 enters the linear polarizer 120. When light _{L V} enters the linear polarizer 120, the linearly polarized light having a vibration direction parallel to Ai to the transmission axis _{A 120} of linear polarizer 120 is transmitted through the linearly polarizing plate 120, the other polarized light shielding by the linear polarizer 120 It is done.
Light L _V transmitted through the linearly polarizing plate 120 is then transmitted through the substrate 160 without changing the polarization state.
Light _{L V} transmitted through the substrate 160 is then transmitted through the patterned retardation film 170. At this time, the light shielding portion 141 of the evaluating mask 140 as viewed from the thickness direction overlaps the whole of the first region 171 of the patterned retardation film 170, all light L _V, the second region of the patterned retardation film 170 It is converted into circularly polarized light that passes through 172 and rotates in the rotational direction Aiii.
Light _{L V} passing through the second region 172 of the patterned retardation film 170 is then incident on the circularly polarizing plate 130. Since the rotational direction Aiii circularly polarized light of the incident light L _V is opposite to the rotation direction A ₁₃₀ circularly polarized light capable of passing through the circular polarizer 130, the light L _V is shielding the circular polarizer 130 It is done.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. in some positions, it can be observed a dark state in which the camera 150 does not detect the light L _IV and L _V. Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, the case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 7 is a diagram schematically showing an evaluation system according to the second embodiment of the present invention.
When light is emitted from the light source 110 in the evaluation system 2 illustrated in FIG. 7, a part of the light L _VI is the same as the light L _V described with reference to FIG. The light passes through the linearly polarizing plate 120 and the substrate 160 in this order, and enters the pattern retardation film 170. At this time, the light shielding portion 141 of the evaluating mask 140 as viewed from the thickness direction does not overlap the entire first region 171 of the patterned retardation film 170, a part of the light L _VI is transmitted through the first region 171 Incident on the circularly polarizing plate 130. When passing through the first region 171, the light L _VI is converted into circularly polarized light that rotates in the same rotational direction Aii as the rotational direction A ₁₃₀ that can pass through the circularly polarizing plate 130. Therefore, the light L _VI passes through the circularly polarizing plate 130 and enters the camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, whether or not the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate in relation to the liquid crystal panel to be bonded. Can be easily evaluated.
Moreover, the same advantage as 1st embodiment can also be acquired.

[4. Third embodiment]
In the method for evaluating a patterned retardation film according to the third embodiment of the present invention, a linearly polarizing plate and a circularly polarizing plate, a patterned retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and a circularly polarizing plate (that is, The light source provided on the opposite side of the pattern retardation film of one of the linearly polarizing plate and the circularly polarizing plate and the pattern retardation film of the linearly polarizing plate (that is, the other of the linearly polarizing plate and the circularly polarizing plate) An evaluation system including an evaluation mask provided on the opposite side is prepared, and light emitted from the light source is observed from the opposite side of the evaluation mask to the light source in a state where the light source is illuminated in the evaluation system. To do.

[4-1. Preparation of evaluation system]
FIG. 8 is a diagram schematically showing an evaluation system according to the third embodiment of the present invention. As shown in FIG. 8, in the evaluation system 3 according to the third embodiment of the present invention, the circularly polarizing plate 230 is used instead of the linearly polarizing plate 120, and the linearly polarizing plate 220 is used instead of the circularly polarizing plate 130. Except for this, it is the same as the first embodiment.

The circularly polarizing plate 230 may be an absorption type circularly polarizing plate or a reflective type circularly polarizing plate. In the present embodiment, it is assumed that using the circularly polarizing plate 230 circularly polarized light can be transmitted to rotate in a certain direction of rotation A _230.

The linear polarizing plate 220 may be an absorption linear polarizing plate or a reflective linear polarizing plate. In the present embodiment, the circularly polarized light transmitted through the circularly polarizing plate 230 is linearly polarized light having a transmission axis A ₂₂₀ parallel to the vibration direction Av of the linearly polarized light that is transmitted through the first region 171 of the pattern retardation film 170 and converted. It is assumed that the plate 220 is used.

  Accordingly, in the present embodiment, the linear retardation plate 220 and the circular polarization plate 230, the pattern retardation film 170 provided between the linear polarization plate 220 and the circular polarization plate 230, and the pattern retardation of the circular polarization plate 230. An evaluation system 3 including a light source 110 provided on the side opposite to the film 170 and an evaluation mask 140 provided on the side opposite to the pattern retardation film 170 of the linear polarizing plate 220 is configured.

[4-2. Evaluation of pattern retardation film]
After preparing the evaluation system 3 as described above, the light emitted from the light source 110 is observed from the side opposite to the light source 110 of the evaluation mask 140 in the state where the light source 110 is illuminated. To do.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 8, when light is emitted from the light source 110, a part of the light L _VII is transmitted in the order of the circularly polarizing plate 230, the base material 160, the first region 171 of the pattern retardation film 170, and the linear polarizing plate 220. Then, the light enters the evaluation mask 140.
That is, when the light L _VII enters the circularly polarizing plate 230, the circularly polarized light which rotates in the same rotational direction Aiv the rotation direction A ₂₃₀ is transmitted through the circularly polarizing plate 230, the other polarized light is blocked by the circular polarizer 230.
Thereafter, the light L _VII transmitted through the circularly polarizing plate 230 passes through the substrate 160 without changing the polarization state.
Thereafter, the light L _VII transmitted through the base material 160 is transmitted through the first region 171 of the pattern retardation film 170. Since the first region 171 can function as a quarter wavelength plate, the light L _VII is converted into linearly polarized light when passing through the first region 171.
The light L _VII transmitted through the first region 171 then enters the linearly polarizing plate 220. Since the incident light L _VII has a vibration direction Av parallel to the transmission axis A ₂₂₀ of the linear polarizing plate 220, the light L _VII passes through the linear polarizing plate 220.
The light L _VII transmitted through the linear polarizing plate 220 is then incident on the evaluation mask 140. At this time, when the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, the light L _VII is blocked by the light shielding portion 141.

Further, another light L _vIII emitted from the light source 110 _{passes through} the circularly polarizing plate 230, the base material 160, and the second region 172 of the pattern retardation film 170 in this order, and enters the linearly polarizing plate 220.
That is, when the light L _vIII enters the circularly polarizing plate 230, the circularly polarized light which rotates in the same rotational direction Aiv the rotation direction A ₂₃₀ is transmitted through the circularly polarizing plate 230, the other polarized light is blocked by the circular polarizer 230.
Thereafter, the light L _vIII transmitted through the circularly polarizing plate 230 passes through the substrate 160 without changing the polarization state.
Thereafter, the light L _{VIII that} has passed through the substrate 160 passes through the second region 172 of the pattern retardation film 170. Since the second region 172 can function as a quarter wave plate, the light L _VIII is converted into linearly polarized light when passing through the second region 172. However, since the slow axis direction A ₁₇₂ of the second region 172 is perpendicular to the slow axis direction A ₁₇₁ of the first region 171, the vibration direction Avi of the linearly polarized light transmitted through the second region 172 is It becomes perpendicular to the vibration direction Av of the linearly polarized light transmitted through the region 171.
The light L _{VIII that} has passed through the second region 172 of the pattern retardation film 170 is then incident on the linearly polarizing plate 220. Since the incident light L _VIII has a vibration direction Avi perpendicular to the transmission axis A ₂₂₀ of the linear polarizing plate 220, the light L _VIII is blocked by the linear polarizing plate 220.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the camera 150 does not detect the lights L _VII and L _VIII . Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 9 is a diagram schematically showing an evaluation system according to the third embodiment of the present invention.
When light is emitted from the light source 110 in the evaluation system 3 shown in FIG. 9, a part of the light L _IX is the same as the light L _VII described with reference to FIG. The light passes through the first region 171 of the retardation film 170 and the linearly polarizing plate 220 in this order, and enters the evaluation mask 140. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _IX is transmitted through the light transmitting portion of the evaluation mask 140. 142 passes through camera 150 and enters camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, whether or not the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate in relation to the liquid crystal panel to be bonded. Can be easily evaluated.
Moreover, the same advantage as 1st embodiment can also be acquired.

[5. Fourth embodiment]
In the method for evaluating a patterned retardation film according to the fourth embodiment of the present invention, a linearly polarizing plate and a circularly polarizing plate, a patterned retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and a circularly polarizing plate (that is, , One of the linear polarizing plate and the circular polarizing plate) provided between the light source provided on the opposite side of the pattern retardation film and the circular polarizing plate (that is, one of the linear polarizing plate and the circular polarizing plate) and the light source. An evaluation system including the evaluation mask thus prepared is prepared, and light emitted from the light source is observed from the side opposite to the light source of the evaluation mask in a state in which the light source is illuminated in the evaluation system.

[5-1. Preparation of evaluation system]
FIG. 10 is a diagram schematically showing an evaluation system according to the fourth embodiment of the present invention. As shown in FIG. 10, in the evaluation system 4 according to the fourth embodiment of the present invention, the order of the components of the evaluation system 4 is changed to the light source 110 and the evaluation mask because the position of the evaluation mask 140 is changed. The third embodiment is the same as the third embodiment except that 140, the circularly polarizing plate 230, the laminated retardation film 180, the linear polarizing plate 220, and the camera 150 are changed in this order.

  Accordingly, in the present embodiment, the linear retardation plate 220 and the circular polarization plate 230, the pattern retardation film 170 provided between the linear polarization plate 220 and the circular polarization plate 230, and the pattern retardation of the circular polarization plate 230. An evaluation system 4 including a light source 110 provided on the side opposite to the film 170 and an evaluation mask 140 provided between the circularly polarizing plate 230 and the light source 110 is configured.

[5-2. Evaluation of pattern retardation film]
After preparing the evaluation system 4 as described above, the light emitted from the light source 110 is observed from the opposite side of the evaluation mask 140 from the light source 110 in the state in which the light source 110 is illuminated, as in the first embodiment. To do.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 10, when light is emitted from the light source 110, a part of the light L _X enters the light shielding part 141 of the evaluation mask 140 and is blocked by the light shielding part 141.

Further, another light L _XI emitted from the light source 110 passes through the evaluation mask 140, the circularly polarizing plate 230, the base material 160, and the second region 172 of the pattern retardation film 170 in this order, and enters the linearly polarizing plate 220. To do.
That is, the light L _XI passes through the light transmitting portion 142 of the evaluation mask 140 and enters the circularly polarizing plate 230. When light L _XI enters the circularly polarizing plate 230, the circularly polarized light which rotates in the same rotational direction Aiv the rotation direction A ₂₃₀ is transmitted through the circularly polarizing plate 230, the other polarized light is blocked by the circular polarizer 230.
The light L _XI transmitted through the circularly polarizing plate 230 then passes through the base material 160 without changing the polarization state.
Thereafter, the light L _XI transmitted through the base material 160 is transmitted through the pattern retardation film 170. At this time, when the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 as viewed from the thickness direction, all the light L _XI is the second region of the pattern retardation film 170. 172 is converted into linearly polarized light having a vibration direction Avi.
The light L _XI transmitted through the second region 172 of the pattern retardation film 170 is then incident on the linear polarizing plate 220. Vibration direction Avi linearly polarized light of the incident light L _XI are the perpendicular to the transmission axis A ₂₂₀ of linear polarizer 220, the light _XI is blocked by the linear polarizer 220.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the camera 150 does not detect the light L _X and L _XI . Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 11 is a diagram schematically showing an evaluation system according to the fourth embodiment of the present invention.
When light is emitted from the light source 110 in the evaluation system 4 shown in FIG. 11, a part of the light L _XII is transmitted in the same manner as the light L _XI described with reference to FIG. The light passes through the circularly polarizing plate 230 and the base material 160 in this order and enters the pattern retardation film 170. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _XII is transmitted through the first region 171. Incident on the linear polarizing plate 220. When passing through the first region 171, the light L _XII is converted into linearly polarized light having a vibration direction Av parallel to the transmission axis A ₂₂₀ of the linear polarizing plate 220. Therefore, the light L _XII passes through the linear polarizing plate 220 and enters the camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, whether or not the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate in relation to the liquid crystal panel to be bonded. Can be easily evaluated.
Moreover, the same advantage as 1st embodiment can also be acquired.

[6. Fifth embodiment]
In the evaluation method of the patterned retardation film according to the fifth embodiment of the present invention, a light source, an evaluation mask, a circularly polarizing plate (that is, one of a linearly polarizing plate and a circularly polarizing plate), a patterned retardation film, An evaluation system comprising a reflective linearly polarizing plate (that is, the other of the linearly polarizing plate and the circularly polarizing plate) in this order is prepared, and the light source is illuminated in this evaluation system from the same side as the light source of the evaluation mask. Observe the light emitted by the light source.

[6-1. Preparation of evaluation system]
FIG. 12 is a diagram schematically showing an evaluation system according to the fifth embodiment of the present invention. As shown in FIG. 12, the evaluation system 5 according to the fifth embodiment of the present invention includes a light source 110, an evaluation mask 140, a circularly polarizing plate 330, and a reflective linearly polarizing plate 320 in this order. Equipped with an evaluation device. In this evaluation apparatus, a camera 150 is provided on the same side of the evaluation mask 140 as the light source 110. Between the circularly polarizing plate 330 and the linearly polarizing plate 320, a laminated retardation film 180 including a base material 160 and a pattern retardation film 170 provided on the surface of the base material 160 is inserted.

  Here, each of the linearly polarizing plate 320, the circularly polarizing plate 330, the evaluation mask 140, and the laminated retardation film 180 is disposed so that the principal surfaces thereof are parallel to the horizontal direction and the thickness directions thereof coincide. . Therefore, in the following description, unless otherwise specified, the “thickness direction” means the thickness direction. In FIG. 12, for the sake of illustration, the optical path from the light source to the camera is shown obliquely, but actually, it may be substantially parallel to the thickness direction. Furthermore, in FIG. 12, the linearly polarizing plate 320, the circularly polarizing plate 330, the evaluation mask 140, and the laminated retardation film 180 are shown apart from each other for illustration, but some or all of these are actually used. In this aspect, the contact may be evaluated.

  The light source 110, the evaluation mask 140, the camera 150, the laminated retardation film 180, and the substrate 160 and the pattern retardation film 170 included in the laminated retardation film 180 are the same as those in the first embodiment. However, as the light shielding portion 141 of the evaluation mask 140, it is preferable to use one that can absorb the irradiated light. Also in this embodiment, it is assumed that the light shielding unit 141 is capable of absorbing the irradiated light. This prevents the light reflected by the light shielding portion 141 of the evaluation mask 140 from entering the camera 150, and the shape and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate. Observed bright parts can be made more conspicuous and the evaluation accuracy can be improved.

The circularly polarizing plate 330 is preferably an absorption type circularly polarizing plate. Also in this embodiment, the circularly polarizing plate 330 is an absorption-type circularly polarizing plate that transmits circularly polarized light that rotates in a certain rotation direction A ₃₃₀ and can absorb other polarized light. Accordingly, the light reflected by the circularly polarizing plate 330 is prevented from entering the camera 150, and the bright observed when the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate. The portion can be made conspicuous and the evaluation accuracy can be increased.

The linearly polarizing plate 320 is a reflective linearly polarizing plate. Transmission axis A ₃₂₀ of linear polarizer 320 is parallel to the vibration direction Aviii linearly polarized light circularly polarized light transmitted through the circularly polarizing plate 330 is converted through the second region 172 of the patterned retardation film 170 .

  Thus, in this embodiment, the evaluation system 5 including the light source 110, the evaluation mask 140, the circularly polarizing plate 330, the pattern retardation film 170, and the reflective linear polarizing plate 320 in this order is configured. Has been.

[6-2. Evaluation of pattern retardation film]
After preparing the evaluation system 5 as described above, the light emitted from the light source 110 is observed from the same side as the light source 110 of the evaluation mask 140 with the light source 110 illuminated. In the present embodiment, observation is performed by photographing the surface of the evaluation mask 140 with the camera 150. At this time, as in the first embodiment, the evaluation mask 140 is moved so that the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140 overlap the first region 171 and the second region of the pattern retardation film, respectively. By adjusting the position as described above, the relative positions of the evaluation mask 140 and the pattern retardation film 170 are matched to evaluate whether or not a dark state in which light emitted from the light source 110 is not detected is observed.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
When light is emitted from the light source 110 as shown in FIG. 12, a part of the light L _XIII enters the light shielding portion 141 of the evaluation mask 140 is blocked by the light shielding portion 141. The blocked light L _XIII is absorbed by the light blocking unit 141 and thus does not reflect and is not detected by the camera 150.

Further, the other light L _XIV emitted from the light source 110 is the light transmitting portion 142 of the evaluation mask 140, the circularly polarizing plate 330, the second region 172 of the pattern retardation film 170, the base 160, and the reflective linearly polarized light. The light passes through the plate 320 in this order.
That is, the light L _XIV enters the circularly polarizing plate 330 after passing through the light transmitting portion 142 of the evaluation mask 140. When light L _XIV enters the circularly polarizing plate 330, the circularly polarized light which rotates in the same rotational direction A _vii to the rotation direction A ₃₃₀ is transmitted through the circularly polarizing plate 330, the other polarized light is blocked by the circular polarizer 330. In this embodiment, since the circularly polarizing plate 330 is an absorption type, the blocked polarized light is absorbed by the circularly polarizing plate 330 and is not reflected and is not detected by the camera 150.
The light L _{XIV that} has passed through the circularly polarizing plate 330 then passes through the pattern retardation film 170. At this time, if the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, all of the light L _XIV is transmitted through the second region 172 and is linear. Converted to polarized light.
Thereafter, the light L _XIV transmitted through the second region 172 passes through the substrate 160 without changing the polarization state.
The light L _XIV transmitted through the substrate 160 is then incident on the reflective linear polarizing plate 320. Since the incident light L _XIV is linearly polarized light having a vibration direction Aviii parallel to the transmission axis A ₃₂₀ of the linear polarizing plate 320, the light L _XIV is transmitted through the linear polarizing plate 320.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the camera 150 does not detect the light L _XIII and L _XIV . Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 13 is a diagram schematically showing an evaluation system according to the fifth embodiment of the present invention.
When light is emitted from the light source 110 in the evaluation system 5 shown in FIG. 13, a part of the light L _XV is transmitted in the same manner as the light L _XIV described with reference to FIG. The light passes through the polarizing plate 330 and enters the pattern retardation film 170. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 as viewed from the thickness direction, a part of the light L _XV is part of the first region 171 and the substrate 160. Transparent. When passing through the first region 171, the light L _XV is converted into linearly polarized light having a vibration direction Aix perpendicular to the transmission axis A ₃₂₀ of the linearly polarizing plate 320. Therefore, the light L _XV is reflected by the linear polarizing plate 320. Light L _XV after reflection is a linearly polarized light having the same vibration direction Ax and before reflection by passing through the first region 171 of the patterned retardation film 170 again, in the same rotational direction Axi the rotating direction A ₃₃₀ Converted to rotating circularly polarized light. For this reason, the light L _XV passes through the circularly polarizing plate 330, then passes through the light transmitting portion 142 of the evaluation mask 140 and enters the camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, whether or not the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate in relation to the liquid crystal panel to be bonded. Can be easily evaluated.
Moreover, the same advantage as 1st embodiment can also be acquired.

[7. Sixth embodiment]
In the method for evaluating a patterned retardation film according to the sixth embodiment of the present invention, a light source, an evaluation mask, a linearly polarizing plate (that is, one of a linearly polarizing plate and a circularly polarizing plate), a patterned retardation film, An evaluation system including a reflective circularly polarizing plate (that is, the other of the linearly polarizing plate and the circularly polarizing plate) in this order is prepared, and the light source is emitted from the same side as the light source of the evaluation mask. Observe the light emitted by the light source.

[7-1. Preparation of evaluation system]
FIG. 14 is a diagram schematically showing an evaluation system according to the sixth embodiment of the present invention. As shown in FIG. 14, in the evaluation system 6 according to the sixth embodiment of the present invention, a linearly polarizing plate 420 is provided instead of the circularly polarizing plate 330, and a reflective circularly polarized light is used instead of the reflective linearly polarizing plate 320. Except for providing the plate 430, it is the same as the fifth embodiment.

The linear polarizing plate 420 is preferably an absorption linear polarizing plate. Also in this embodiment, the linearly polarizing plate 420 is an absorption type linearly polarizing plate that transmits linearly polarized light parallel to the transmission axis A ₄₂₀ and can absorb other polarized light. This prevents light reflected by the linear polarizing plate 420 from entering the camera 150, and is bright observed when the shape and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate. The portion can be made conspicuous and the evaluation accuracy can be increased.

The circularly polarizing plate 430 is a reflective circularly polarizing plate. In the present embodiment, the circularly polarized light that rotates in the rotation direction A ₄₃₀ that is the same as the rotation direction Axiii of the circularly polarized light that is transmitted through the second region 172 of the pattern retardation film 170 and converted by the linearly polarized light that has passed through the linear polarizing plate 420 is converted. It is assumed that a circularly polarizing plate 430 that transmits light is used.

  Thereby, in this embodiment, the evaluation system 6 including the light source 110, the evaluation mask 140, the linearly polarizing plate 420, the pattern retardation film 170, and the reflective circularly polarizing plate 430 is configured in this order. ing.

[7-2. Evaluation of pattern retardation film]
After the evaluation system 6 as described above is prepared, the light emitted from the light source 110 is observed from the same side as the light source 110 of the evaluation mask 140 in the state where the light source 110 is illuminated, as in the fifth embodiment. .

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 14, when light is emitted from the light source 110, a part of the light L _XVI enters the light shielding part 141 of the evaluation mask 140 and is shielded by the light shielding part 141. The blocked light L _XVI is absorbed by the light blocking unit 141 and thus does not reflect and is not detected by the camera 150.

Further, another light L _XVII emitted from the light source 110 is the light transmitting portion 142 of the evaluation mask 140, the linearly polarizing plate 420, the second region 172 of the pattern retardation film 170, the base 160, and the reflective circularly polarized light. The light passes through the plate 430 in this order.
That is, the light L _XVII enters the linear polarizing plate 420 after passing through the light transmitting portion 142 of the evaluation mask 140. When the light L _XVII is incident on the linear polarizing plate 420, the linearly polarized light having the vibration direction Axii parallel to the transmission axis A ₄₂₀ of the linear polarizing plate 420 is transmitted through the linear polarizing plate 420, and the other polarized light is blocked by the linear polarizing plate 420. It is done. In this embodiment, since the linear polarizing plate 420 is an absorption type, the blocked polarized light is absorbed by the linear polarizing plate 420 and is not reflected and is not detected by the camera 150.
The light L _{XVII that} has passed through the linear polarizing plate 420 then passes through the pattern retardation film 170. At this time, when the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, all the light L _XVII is transmitted through the second region 172, and the circle Converted to polarized light.
The light L _XVII transmitted through the second region 172 then passes through the base material 160 without changing the polarization state.
The light L _XVII transmitted through the substrate 160 is then incident on the reflective circularly polarizing plate 430. Since the rotation direction Axiii of the circularly polarized light of the incident light L _XVII is the same as the rotation direction A ₄₃₀ that can be transmitted through the circularly polarizing plate 430, the light L _XVII is transmitted through the circularly polarizing plate 430.

Thus, if the shape and size of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the camera 150 does not detect the light L _XVI and L _XVII . Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 15 is a diagram schematically showing an evaluation system according to the sixth embodiment of the present invention.
When light is emitted from the light source 110 in the evaluation system 6 shown in FIG. 15, a part of the light L _XVIII is transmitted in the same manner as the light L _XVII described with reference to FIG. The light passes through the polarizing plate 420 and enters the pattern retardation film 170. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _XVIII is part of the first region 171 and the substrate 160. Transparent. When passing through the first region 171, the light L _XVIII is the rotation direction A ₄₃₀ circularly polarized light capable of passing through the circular polarizer 430 is converted into circularly polarized light rotating in the opposite rotational direction Axiv. For this reason, the light L _XVIII is reflected by the circularly polarizing plate 430. The reflected light L _XVIII is circularly polarized light that rotates in the same rotational direction Axv as before reflection, but passes through the first region 171 of the pattern retardation film 170 again, thereby transmitting the transmission axis A _{420 of the} linear polarizing plate _420. Is converted into linearly polarized light having a vibration direction Axvi parallel to. For this reason, the light L _XVIII passes through the linear polarizing plate 420 and then passes through the light transmitting portion 142 of the evaluation mask 140 and enters the camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, whether or not the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate in relation to the liquid crystal panel to be bonded. Can be easily evaluated.
Moreover, the same advantage as 1st embodiment can also be acquired.

[8. Seventh embodiment]
In any of the embodiments described above, the substrate provided in the pattern retardation film to be evaluated is a film having no retardation, but the substrate may be a film having a retardation. However, when the substrate has a phase difference, in order to cancel out the phase difference developed in the substrate, the same film as the substrate is used as the compensation substrate, and this compensation substrate is used as the slow axis of the substrate. And the compensation base material are preferably provided so that their slow axes are perpendicular to each other. Thereby, even if a base material has a phase difference, highly accurate evaluation can be performed.

[8-1. Preparation of evaluation system]
FIG. 16 is a diagram schematically showing an evaluation system according to the seventh embodiment of the present invention. Here, in FIG. 16, although the base material 560 which comprises the lamination | stacking phase difference film 580, and the pattern phase difference film 170 are shown spaced apart for illustration, these are the states which contacted in the actual aspect. May be evaluated.
As shown in FIG. 16, in the evaluation system 7 according to the seventh embodiment of the present invention, the base material 560 is used instead of the base material 160, and the compensation base material 590 is replaced with the pattern retardation film 170. The third embodiment is the same as the third embodiment except that the linear polarizing plate 220 is provided.

The substrate 560 is a film having a uniform phase difference in the plane and thus having a slow axis in the plane. The pattern phase difference film 170 is provided on the surface of the base material 560, and the base material 560 and the pattern phase difference film 170 constitute a laminated phase difference film 580. In this embodiment, the phase difference of the base material 560 is a quarter wavelength with respect to the wavelength of the transmitted light, and thus the base material 560 can function as a quarter wavelength plate. The slow axis direction A ₅₆₀ in the plane of the substrate 560 forms an angle of 45 ° with respect to the longitudinal direction of the pattern retardation film 170.

The compensation substrate 590 is a film similar to the substrate 560. Therefore, in this embodiment, the compensation base material 590 has a phase difference of ¼ wavelength with respect to the wavelength of the transmitted light. Further, the in-plane slow axis direction A ₅₉₀ of the compensation substrate 590 is perpendicular to the slow axis A _{560 of the} substrate 560.

Thus, in the present embodiment, the same compensation substrate 590 and substrate 560, such that the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is perpendicular, An evaluation system 7 provided between the pattern retardation film 170 and the linear polarizing plate 220 is configured.

[8-2. Evaluation of pattern retardation film]
After preparing the evaluation system 7 as described above, the light emitted from the light source 110 is observed from the opposite side of the evaluation mask 140 from the light source 110 in the state in which the light source 110 is illuminated, as in the first embodiment. To do.

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 16, when light is emitted from the light source 110, a part of the light L _XIX is the circularly polarizing plate 230, the base material 560, the first region 171 of the pattern retardation film 170, the compensation base material 590, and the straight line. The light passes through the polarizing plate 220 and enters the evaluation mask 140.
That is, when the light L _XIX is incident on the circularly polarizing plate 230, circularly polarized light rotating in the same rotational direction Aiv as the rotational direction A ₂₃₀ is transmitted through the circularly polarizing plate 230, and other polarized light is blocked by the circularly polarizing plate 230.
The light L _{XIX that} has passed through the circularly polarizing plate 230 then passes through the substrate 560. At this time, since the base material 560 exhibits a quarter-wave phase difference with respect to the transmitted light, the light L _XIX is converted into linearly polarized light having the vibration direction Axvii.
Thereafter, the light L _{XIX that} has passed through the base material 560 passes through the first region 171 of the pattern retardation film 170. When passing through the first region 171, the light L _XIX is converted into circularly polarized light that rotates in the rotation direction Axviii.
The light L _{XIX that} has passed through the first region 171 passes through the compensation substrate 590. At this time, compensation for the substrate 590 has the same phase difference as the substrate 560, and, since the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is vertical, The light L _XIX is converted into linearly polarized light having a vibration direction Av parallel to the transmission axis A ₂₂₀ of the linear polarizing plate 220.
The light L _{XIX that} has passed through the compensation substrate 590 then passes through the linear polarizing plate 220 and enters the evaluation mask 140 in the same manner as the light L _{VII according} to the third embodiment described with reference to FIG. To do. At this time, when the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, all the light L _XIX is blocked by the light shielding portion 141.

Further, another light L _XX emitted from the light source 110 passes through the circularly polarizing plate 230, the base material 560, the second region 172 of the pattern retardation film 170 and the compensation base material 590 in this order, and enters the linear polarizing plate 220. Incident.
That is, the light L _XX is transmitted through the circularly polarizing plate 230 and the base material 560 and converted into linearly polarized light having the vibration direction Axvii in the same manner as the light L _XIX .
The light L _XX transmitted through the base material 560 is then transmitted through the second region 172 of the pattern retardation film 170. When passing through the second region 172, the light L _XX is converted into circularly polarized light that rotates in the rotational direction Axix opposite to the light L _XIX .
The light L _{XX that} has passed through the second region 172 then passes through the compensation substrate 590. At this time, compensation for the substrate 590 has the same phase difference as the substrate 560, and, since the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is vertical, The light L _XX is converted into linearly polarized light having a vibration direction Avi perpendicular to the transmission axis A ₂₂₀ of the linear polarizing plate 220.
The light L _XX transmitted through the compensation substrate 590 is then blocked by the linear polarizing plate 220 in the same manner as the light L _{VIII according} to the third embodiment described with reference to FIG.

As described above, if the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, it is possible to observe a dark state in which the camera 150 does not detect the lights L _XIX and L _XX . Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, the case where the shape and dimension of the 1st area | region 171 and the 2nd area | region 172 of the pattern phase difference film 170 are not appropriate is demonstrated, showing an example in FIG. FIG. 17 is a diagram schematically showing an evaluation system according to the seventh embodiment of the present invention.
In the evaluation system 7 shown in FIG. 17, when light is emitted from the light source 110, a part of the light L _XXI is the same as the light L _XIX described with reference to FIG. The light passes through the first region 171 of the pattern retardation film 170, the compensation substrate 590, and the linear polarizing plate 220 in this order, and enters the evaluation mask 140. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _XXI is transmitted through the light transmitting portion of the evaluation mask 140. 142 passes through camera 150 and enters camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, even if the base material 560 has a retardation, the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not attached. It can be easily evaluated whether it is appropriate or not in relation to the liquid crystal panel to be matched.
Moreover, the same advantage as 1st embodiment can also be acquired.

[9. Eighth embodiment]
In the seventh embodiment, as in the first embodiment to the fourth embodiment, the example in which the compensation base material is used in the evaluation system of the type that observes the light transmitted through the sample is shown. For example, the fifth embodiment and As in the sixth embodiment, a compensation substrate may be used in an evaluation system that observes light reflected from a sample.

[9-1. Preparation of evaluation system]
FIG. 18 is a diagram schematically showing an evaluation system according to the eighth embodiment of the present invention. Here, in FIG. 18, the base material 560 constituting the laminated retardation film 580 and the pattern retardation film 170 are shown apart from each other for illustration, but these are in contact with each other in an actual aspect. May be evaluated.
As shown in FIG. 18, in the evaluation system 8 according to the eighth embodiment of the present invention, the base material 560 was used instead of the base material 160, and the compensation base material 590 was replaced with the pattern retardation film 170. Except that it is provided between the linear polarizing plate 420 and the sixth embodiment, it is the same as the sixth embodiment.
The base material 560 and the compensation base material 590 are the same as those described in the seventh embodiment.

Thus, in the present embodiment, the same compensation substrate 590 and substrate 560, such that the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is perpendicular, An evaluation system 8 provided between the pattern retardation film 170 and the linear polarizing plate 420 is configured.

[9-2. Evaluation of pattern retardation film]
After preparing the evaluation system 8 as described above, the light emitted from the light source 110 is observed from the same side as the light source 110 of the evaluation mask 140 in the state where the light source 110 is illuminated, as in the fifth embodiment. .

Hereinafter, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate will be described with examples.
As shown in FIG. 18, when light is emitted from the light source 110, a part of the light L _XXII enters the light shielding part 141 of the evaluation mask 140 and is blocked by the light shielding part 141, as in the sixth embodiment. . The blocked light L _XVII is absorbed by the light shielding unit 141 and thus does not reflect and is not detected by the camera 150.

Further, another light L _XXIII emitted from the light source 110 includes the light transmitting portion 142 of the evaluation mask 140, the linearly polarizing plate 420, the compensation base material 590, the first region 171 of the pattern retardation film 170, and the base material 560. And the reflective circularly polarizing plate 430 in this order.
That is, the light L _XXIII is transmitted through the light transmitting portion 142 of the evaluation mask 140 and then enters the linear polarizing plate 420. When the light L _XXIII is incident on the linear polarizing plate 420, the linearly polarized light having the vibration direction Axii parallel to the transmission axis A ₄₂₀ is transmitted through the linear polarizing plate 420, and the other polarized light is linear polarizing plate, as in the sixth embodiment. Blocked by 420.
The light L _{XXIII that} has passed through the linear polarizing plate 420 then passes through the compensation substrate 590. At this time, the compensation base material 590 expresses a phase difference of ¼ wavelength with respect to the transmitted light, so that the light L _XXIII is converted into circularly polarized light that rotates in the rotation direction Axx.
The light L _{XXIII that} has passed through the compensation substrate 590 then passes through the pattern retardation film 170. At this time, when the light shielding portion 141 of the evaluation mask 140 overlaps the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, all the light L _XXIII is transmitted through the second region 172 and vibrates. It is converted to linearly polarized light with direction Axxi.
The light L _{XXIII that} has passed through the second region 172 then passes through the substrate 560. In this case, the substrate 560 has the same phase difference as the compensation substrate 590, and, since the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is vertical, light L _XXIII is converted to circularly polarized light rotating in the same rotational direction Axiii the rotation direction a _430.
The light L _XXIII transmitted through the base material 560 is then transmitted through the circularly polarizing plate 430 in the same manner as the light L _{XVII according} to the sixth embodiment.

Thus, if the shape and size of the first region 171 and the second region 172 of the pattern retardation film 170 are appropriate, the pattern retardation film 170 and the evaluation mask 140 are relatively aligned. In a certain position, a dark state in which the camera 150 does not detect the light L _XXII and L _XXIII can be observed. Therefore, as in the first embodiment, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if a dark state is observed at at least one position, the pattern retardation film 170 is It can be evaluated that the size and shape of the one region 171 and the second region 172 are appropriate.

Next, a case where the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not appropriate will be described with reference to FIG. FIG. 19 is a diagram schematically showing an evaluation system according to the eighth embodiment of the present invention.
In the evaluation system 8 shown in FIG. 19, when light is emitted from the light source 110, a part of the light L _XXIV is transmitted in the same manner as the light L _XXIII described with reference to FIG. The light passes through the linear polarizing plate 420 and the compensation substrate 590 and enters the pattern retardation film 170. At this time, if the light shielding portion 141 of the evaluation mask 140 does not overlap the entire first region 171 of the pattern retardation film 170 when viewed from the thickness direction, a part of the light L _XXIV is transmitted through the first region 171. When passing through the first region 171, the light L _XXIV is converted into linearly polarized light having the vibration direction Axxii. This vibration direction Axxii is perpendicular to the vibration direction Axxi of the light L _XXIII transmitted through the second region 172.
The light L _{XXIV that} has passed through the first region 171 then passes through the substrate 560. In this case, the substrate 560 has the same phase difference as the compensation substrate 590, and, since the slow axis _{A 560} of the substrate 560 and the slow axis _{A 590} of the compensation substrate 590 is vertical, light L _XXIV, like the light L _XVIII described with reference to FIG. 15 in the sixth embodiment, the direction of rotation Axiv is opposite circular polarization to the rotation direction a ₄₃₀ capable of transmitting a circularly polarizing plate 430. For this reason, the light L _XXIV is reflected by the circularly polarizing plate 430.
The light L _XXIV after reflection is circularly polarized light that rotates in the same rotation direction Axv as before reflection, but passes through the base material 560, the first region 171 of the pattern retardation film 170, and the compensation base material 590 again. The polarization state is converted into linearly polarized light having the vibration direction Axxiii, circularly polarized light rotating in the rotation direction Axxiv, and linearly polarized light having the vibration direction Axvi. Vibration direction Axvi of the linearly polarized light after passing through the compensating substrate 590 is parallel to the transmission axis A ₄₂₀ of linear polarizer 420. For this reason, the light L _XXIV is transmitted through the linear polarizing plate 420, and then transmitted through the light transmitting portion 142 of the evaluation mask 140 and enters the camera 150. For this reason, a brighter part than the surroundings is generated in the video imaged by the camera 150, and the video does not become dark.

  Accordingly, the relative alignment between the pattern retardation film 170 and the evaluation mask 140 is performed, and if no dark state is observed at any position, the first region 171 and the second region 172 of the pattern retardation film 170 are detected. It can be evaluated that the size and shape of are not appropriate.

As described above, according to the evaluation method of the present embodiment, even if the base material 560 has a retardation, the shapes and dimensions of the first region 171 and the second region 172 of the pattern retardation film 170 are not attached. It can be easily evaluated whether it is appropriate or not in relation to the liquid crystal panel to be matched.
Moreover, the same advantage as 1st embodiment can also be acquired.

[10. Other Embodiments]
The above-described embodiments may be arbitrarily modified and implemented without departing from the scope of the present invention and its equivalent scope.
For example, when the base material 160 has a phase difference in the first embodiment or the second embodiment, the compensation base material is provided between the pattern phase difference film 170 and the circularly polarizing plate 130 in the same manner as in the seventh embodiment. May be provided.
For example, when the base material 160 has a phase difference in the fourth embodiment, a compensation base material is provided between the pattern retardation film 170 and the linear polarizing plate 220 in the same manner as in the seventh embodiment. Also good.
For example, when the base material 160 has a phase difference in the fifth embodiment, a compensation base material is provided between the pattern phase difference film 170 and the circularly polarizing plate 330 in the same manner as in the eighth embodiment. Also good.

Further, for example, in the fifth embodiment, the sixth embodiment, and the eighth embodiment, black that absorbs light emitted from the light source 110 on the surface opposite to the pattern retardation film 170 of the polarizing plates 320 and 430. A sheet may be arranged. By arranging the black sheet as described above, reflection of the light L _XIV , L _XVII and L _XXIII transmitted through the polarizing plates 320 and 430 can be prevented, and the dark state observed at a certain position can be clearly observed. it can.

In addition, for example, in the above-described embodiment, the observation is performed by the camera 150, but the evaluation may be performed visually.
Further, for example, the anisotropic region 171 and the isotropic region 172 of the pattern retardation film 170, and the shape of the light shielding portion 141 and the light transmitting portion 142 of the evaluation mask 140 may be any shape other than the belt shape. .

  Further, for example, the phase difference and the direction of the slow axis in each region of the pattern retardation film 170 are arbitrary as long as the effects of the present invention are not significantly impaired. Depending on the magnitude of the phase difference in each region, a dark observation image without light may not be observed in the dark state, but if a dark observation image is obtained to such an extent that a bright part indicating that the pattern is not appropriate can be detected. For example, only the gray observation image may be obtained in the darkest dark state at the time of evaluation.

[11. Material etc.]
Then, the example of the material which comprises the member used in the evaluation method of this invention is demonstrated below.

[11-1. Polarizer]
The absorption linear polarizing plate may be produced, for example, by adsorbing iodine or a dichroic dye to a polyvinyl alcohol film and then uniaxially stretching in a boric acid bath. Alternatively, for example, iodine or a dichroic dye may be adsorbed and stretched on a polyvinyl alcohol film, and a part of the polyvinyl alcohol unit in the molecular chain may be modified to a polyvinylene unit.
Examples of the reflective linear polarizing plate include the following.
(1) Utilizing the difference in the reflectance of the polarization component depending on the Brewster angle (for example, the one described in JP-A-6-508449).
(2) A structure in which a fine metal linear pattern is constructed (for example, one described in JP-A-2-308106).
(3) A film in which at least two polymer films are laminated and the anisotropy of reflectance due to refractive index anisotropy is utilized (for example, the one described in JP-T-9-506837).
(4) A film having a sea-island structure formed of at least two kinds of polymers in a polymer film and utilizing the reflectance anisotropy due to refractive index anisotropy (for example, US Pat. 825,543)).
(5) A film in which particles are dispersed in a polymer film and the anisotropy of reflectance due to refractive index anisotropy is utilized (for example, the one described in JP-T-11-509014).
(6) Inorganic particles dispersed in a polymer film and utilizing the anisotropy of reflectance based on the scattering ability difference depending on the size (for example, those described in JP-A-9-297204).

Examples of the absorption type circularly polarizing plate include a polarizing plate obtained by combining the above-described absorption type linearly polarizing plate and a quarter wavelength plate.
Examples of the reflective circularly polarizing plate include a cholesteric liquid crystal polarizing plate (for example, “cholesteric resin layer” described in JP 2010-181710 A). Further, a polarizing plate in which the above-described reflective linear polarizing plate and a quarter wavelength plate are combined may be used. In the case of using a polarizing plate in which an absorption type linear polarizing plate or a reflection type linear polarizing plate and a quarter wavelength plate are used, the quarter wavelength plate is preferably arranged so as to face the pattern retardation film side. .

The polarization degree of the polarizing plate is preferably 98% or more, more preferably 99% or more.
Moreover, the thickness (average thickness) of the polarizing plate is preferably 5 μm to 80 μm.

[11-2. Evaluation mask]
As an evaluation mask, for example, a mask provided with a resin layer containing a colorant, metal particles and the like on the surface of a transparent film may be used. In such an evaluation mask, a portion where the resin layer is thick is a light shielding portion, and a portion where the resin layer is thin or a portion where the resin layer is not formed is a light transmitting portion.

  As the transparent film, a film having a light-transmitting property capable of evaluating the pattern retardation film is used. Usually, the material of the transparent film has a thickness of 1 mm and a total light transmittance (based on JIS K7361-1997, measured using a turbidimeter (Nippon Denshoku Industries Co., Ltd., NDH-300A)) of 80% or more. If it is material which is, it can use conveniently.

  As for the thickness of the transparent film, the lower limit is usually 10 μm or more, preferably 30 μm or more, more preferably 50 μm or more, and the upper limit is usually 3 mm or less, preferably 1 mm or less, more preferably 0.5 mm or less. When the thickness is 10 μm or less, the film rigidity becomes low, and it may be difficult to handle as an evaluation mask. If it is 3 mm or more, the evaluation condition may be different from that when actually mounted on the liquid crystal panel for observation, and the evaluation result may not be consistent with the result observed using the actual liquid crystal panel. There is.

  Examples of the resin that forms the resin layer include acrylic resin, urethane resin, polyamide resin, cellulose ester resin, polyester resin, polyimide resin, polyamideimide resin, urethane acrylate cured resin, epoxy acrylate cured resin, and polyester acrylate cured resin. Can be mentioned. These resins may be used alone or in combination of two or more at any ratio.

  Examples of the colorant include organic pigments, carbon black pigments, conductive carbon blacks, battery carbon blacks, rubber carbon blacks, and the like; anthraquinone compounds, phthalocyanine compounds, perinone compounds, dioxazine compounds, benzofuran compounds. And dyes such as compounds, thiophene monoazo compounds, cyanine compounds, and diimmonium compounds. These colorants may be used alone or in combination of two or more at any ratio.

  Examples of the metal material forming the metal particles include nickel, platinum, palladium, silver-palladium, copper, gold, silver, tin, lead, and alloys thereof. These metal materials may be used alone or in combination of two or more at any ratio. Moreover, the surface treatment may be given to the metal particle, for example, the surface may be modified by the thiol compound. The particle diameter (diameter) of the metal particles is preferably in the range of 0.2 μm or more and 60 μm or less.

  You may use the mask for evaluation which bonded the mask which provided the resin layer on the surface of the transparent film to the glass plate or the plastic plate. As the glass plate and the plastic plate, those having the same translucency as the transparent film are usually used. In this case, it is preferable that the thickness of what bonded the mask and the glass plate or the plastic plate is 10 μm or more and 3 mm or less.

Moreover, you may use the glass mask which provided the translucent part and light-shielding part which comprise a striped pattern on glass as a mask for evaluation. For example, the glass mask may be formed by applying chromium sputtering to the glass surface, further applying a photoresist, exposing the photoresist in a stripe shape, exposing the photoresist, washing, and etching chromium. Alternatively, for example, a PET film coated with a photosensitive emulsion may be laser-drawn in a stripe shape, washed, and the PET film bonded onto a glass via an adhesive layer.
Moreover, you may use the method shown in Unexamined-Japanese-Patent No. 4-299332.

[11-3. Pattern retardation film]
As the pattern retardation film, for example, a film produced using a material that can exhibit a liquid crystal phase on a substrate film and can be cured by irradiation with energy rays such as ultraviolet rays (UV) may be used. Hereinafter, such a material may be referred to as a “liquid crystal layer forming composition”. In addition, an uncured layer or a cured layer of such a material may be referred to as a “liquid crystal resin layer” below.

If the specific example of the manufacturing method of a pattern phase difference film is given, the method demonstrated below will be mentioned.
That is, this manufacturing method
i. A step of forming a layer of a photo-alignment material (hereinafter sometimes referred to as “photo-alignment material layer”) on the surface of the base film;
ii. Irradiating polarized light to a partial region of the photo-alignment material layer;
iii. Irradiating the entire photo-alignment material layer with polarized light having a polarization direction different from that of the polarized light by 90 ° ± 3 ° to obtain an alignment film;
iv. Forming a liquid crystal layer-forming composition layer (that is, an uncured liquid crystal resin layer) containing a liquid crystal compound and curable by irradiation with active energy rays on the surface of the alignment film;
v. Irradiating the liquid crystal resin layer with active energy rays to cure the liquid crystal resin layer.

  The pattern retardation film produced as described above is usually used after the base film is peeled off. However, you may use a base film, without peeling suitably. For example, a retardation film may be used as the base film.

  In the method for producing a patterned retardation film, examples of the material for the base film include a chain olefin polymer resin, an alicyclic olefin polymer resin, a polycarbonate resin, a polyester resin, a polysulfone resin, and a polyether. Examples include sulfone resins, polystyrene resins, polyolefin resins, polyvinyl alcohol resins, cellulose acetate polymer resins, polyvinyl chloride resins, and polymethacrylate resins. Among these, a chain olefin polymer resin and an alicyclic olefin polymer resin are preferable. Specifically, for example, ZEONOR 1420 (trade name, manufactured by Nippon Zeon Co., Ltd.) can be mentioned. One of these materials may be used alone, or two or more of these materials may be used in combination at any ratio. As a base material, you may use a commercially available long diagonally stretched film, for example, the product name "diagonal stretched ZEONOR film" by Nippon Zeon.

  The thickness of the base film is preferably 30 μm or more, more preferably 60 μm or more, preferably 300 μm or less, more preferably 200 μm or less, from the viewpoints of handling properties at the time of manufacture, material cost, thickness reduction and weight reduction. is there.

  The base film may be a non-stretched unstretched film or a stretched stretched film. Further, it may be an isotropic film or an anisotropic film.

  The base film may be a single-layer film composed of only one layer, or may be a multilayer film composed of two or more layers. Usually, from the viewpoint of productivity and cost, a film having a single layer structure is used.

  The base film may have a surface treated on one side or both sides. By performing the surface treatment, adhesion with other layers directly formed on the surface of the base film can be improved. Examples of the surface treatment include energy ray irradiation treatment and chemical treatment.

  In the pattern retardation film manufacturing method, the photo-alignment material is a material that is irreversibly aligned when irradiated with polarized light. Examples of such photo-alignment materials include PPN materials used in the PPN layer described in Japanese Patent No. 4267080, LPP / LCP mixtures described in Japanese Patent No. 46477782, PPN materials described in No. 2543666, and the like. Can be mentioned. In addition, these may be used individually by 1 type and may be used combining two or more types by arbitrary ratios.

The surface of the base film is subjected to corona discharge treatment (output 0.2 kW, base film wetting index 56 dyne / cm ² ), and a photo-alignment material layer is formed by applying, for example, a photo-alignment material on the treated surface. The thickness of the photo-alignment material layer may be any thickness as long as the desired alignment uniformity of the liquid crystal resin layer is obtained, and is preferably 0.001 μm or more, more preferably 0.01 μm or more, and preferably 5 μm or less. Is 2 μm or less.

  After forming the photo-alignment material layer, a step of irradiating polarized light to a partial region of the photo-alignment material layer (first modified irradiation step) is performed. In the region irradiated with polarized light, the photo-alignment material is irreversibly aligned in the photo-alignment material layer, and is fixed while maintaining the alignment state.

  In the first polarized light irradiation step, the light alignment material layer is usually irradiated with polarized light through a mask. In this case, as the mask, a mask having a strip-shaped light shielding portion and a light transmitting portion that extend in parallel with a certain direction is usually used. Thereby, polarized light can be irradiated to the strip | belt-shaped area | region extended in parallel with a certain direction of a photo-alignment material layer.

  As a mask, you may use the mask layer formed in the opposite side to the photo-alignment material layer of a base film, for example. As a material for the mask layer, for example, a mask composition that can shield energy rays, particularly ultraviolet rays, and can easily form a pattern may be appropriately selected and used.

  Usually, a resin is used as the mask composition. The resin is, for example, selected from the group consisting of acrylic resin, urethane resin, polyamide resin, cellulose ester resin, polyester resin, polyimide resin, polyamideimide resin, urethane acrylate cured resin, epoxy acrylate cured resin, and polyester acrylate cured resin. At least one kind of resin is preferred. By including these resins, it is possible to hold a material that blocks ultraviolet rays even in a high-temperature environment and to produce a stable light-blocking portion. The above resins may be used alone or in combination of two or more at any ratio.

  The mask composition preferably contains an ultraviolet absorber. Thereby, the light shielding part of the mask layer contains the ultraviolet absorber, and the ultraviolet light can be stably shielded in the light shielding part. As the UV absorber, at least one UV absorber selected from the group consisting of benzophenone UV absorbers, benzotriazole UV absorbers and triazine UV absorbers is preferably used. One type of ultraviolet absorber may be used alone, or two or more types may be used in combination at any ratio. The amount of the ultraviolet absorber used is usually 5 parts by weight or more, preferably 8 parts by weight or more, more preferably 10 parts by weight or more, and usually 20 parts by weight with respect to 100 parts by weight of the monomer, oligomer and polymer in the mask layer. Parts or less, preferably 18 parts by weight or less, more preferably 15 parts by weight or less.

  The mask composition may further contain a colorant, metal particles, a solvent, a photopolymerization initiator, a crosslinking agent, and other components.

  As a method of forming a mask layer using a mask composition, a gravure printing method, a screen printing method, an offset printing method, a rotary screen printing method, a gravure offset printing method, an ink jet printing method, or a printing method that is a combination thereof Can be preferably mentioned. The light transmitting part and the light shielding part may be provided, for example, by forming a thin layer and a thick layer of the mask layer.

Further, as a mask, for example, a glass mask in which chromium is sputtered on the glass surface, further coated with a photoresist, exposed to stripes to expose the photoresist, washed, and etched with chromium may be used. .
Alternatively, for example, a mask may be used in which a PET film coated with a photosensitive emulsion is laser-drawn in stripes, washed, and the PET film is bonded onto glass via an adhesive layer.

  In the first polarized light irradiation step, as the polarized light, light having a wavelength capable of orienting the photo-alignment material, which is shielded by the light shielding part of the mask but transmitted through the light transmitting part, is used. As such polarized light, ultraviolet rays are usually used. The ultraviolet irradiation time, the irradiation amount, and other conditions can be appropriately set according to the composition of the photo-alignment material and the thickness of the photo-alignment material layer. Further, the irradiation of polarized light may be performed in an inert gas such as nitrogen and argon, or may be performed in the air.

  In the pattern retardation film manufacturing method, after the first polarized light irradiation step, the entire photo-alignment material layer is irradiated with polarized light having a polarization direction different from the polarized light by 90 ° ± 3 °. The polarized light irradiation step is performed. Thereby, in the area | region where the polarized light was not irradiated in the 1st polarized light irradiation process, photo-alignment material orientates irreversibly and is fixed with the alignment state maintained. In addition, since the polarization direction of the polarized light irradiated in the first polarized light irradiation step and the polarized light irradiated in the second polarized light irradiation step are different by 90 ° ± 3 °, in the second polarized light irradiation step in the photo-alignment material layer The orientation direction of the oriented region differs from the orientation direction of the region oriented in the first polarized light irradiation step by 90 ° ± 3 °.

The second polarized light irradiation step may be performed, for example, by irradiating polarized light without using a mask. Irradiation time of polarization, such as the dose is be appropriately set depending on the thickness of the composition and the optical alignment material layer of the optical alignment material, ranges irradiation amount usually 50 mJ / cm ² of 10,000 / cm ² It is. Further, the irradiation of polarized light may be performed in an inert gas such as nitrogen and argon, or may be performed in the air.

  By the manufacturing method described above, an alignment film composed of a photo-alignment material layer is obtained on the surface of the base film. In this alignment film, two types of regions with different alignment directions of 90 ° ± 3 ° form a pattern that accurately copies the mask pattern of the mask formed by the light shielding portion and the light transmitting portion. In this example, two types of regions with different orientation directions of 90 ° ± 3 ° are alternately arranged in a strip shape extending in parallel to a certain direction, thereby forming a stripe shape as a whole. A pattern is formed.

In the above method for producing a patterned retardation film, after forming an alignment film on the substrate film, a liquid crystal resin layer is formed on the surface of the alignment film.
As the liquid crystal layer forming composition, a composition containing a liquid crystal compound can be used. Examples of the liquid crystal compound include a rod-like liquid crystal compound having a polymerizable group, a side chain type liquid crystal polymer compound, and the like. Examples of the rod-like liquid crystal compound are described in JP-A No. 2002-030042, JP-A No. 2004-204190, JP-A No. 2005-263789, JP-A No. 2007-119415, JP-A No. 2007-186430, and the like. And rod-like liquid crystal compounds having a polymerizable group. Moreover, as a side chain type liquid crystal polymer compound, the side chain type liquid crystal polymer compound etc. which are described in Unexamined-Japanese-Patent No. 2003-177242 etc. are mentioned, for example. Further, examples of preferable liquid crystal compounds include “LC242” manufactured by BASF and the like. A liquid crystal compound may be used individually by 1 type, and may be used combining two or more types by arbitrary ratios.

  The refractive index anisotropy Δn of the liquid crystal compound in the composition for forming a liquid crystal layer is preferably 0.05 or more, more preferably 0.10 or more, preferably 0.30 or less, more preferably 0.25 or less. is there. If the refractive index anisotropy Δn is less than 0.05, in order to obtain a desired optical function, the thickness of the liquid crystal resin layer may be increased, and the alignment uniformity may be lowered. is there. If the refractive index anisotropy Δn is greater than 0.30, the thickness of the liquid crystal resin layer becomes thin in order to obtain a desired optical function, which is disadvantageous for the thickness accuracy. Further, when Δn is larger than 0.30, the absorption edge on the long wavelength side of the ultraviolet absorption spectrum of the liquid crystal resin layer may reach the visible range. It can be used as long as the performance is not adversely affected. When the composition for forming a liquid crystal layer contains only one kind of liquid crystal compound, the refractive index anisotropy of the liquid crystal compound is directly used as the refractive index anisotropy of the liquid crystal compound in the composition for forming a liquid crystal layer. When the composition for forming a liquid crystal layer contains two or more types of liquid crystal compounds, the refractive index anisotropy Δn determined from the value of the refractive index anisotropy Δn of each liquid crystal compound and the content ratio of each liquid crystal compound. Is the refractive index anisotropy of the liquid crystal compound in the composition for forming a liquid crystal layer. The value of the refractive index anisotropy Δn can be measured by the Senarmon method.

  Furthermore, the composition for forming a liquid crystal layer may contain other components in addition to the liquid crystal compound in order to impart proper physical properties to the production method and final performance. Examples of other components include organic solvents, surfactants, chiral agents, polymerization initiators, ultraviolet absorbers, crosslinking agents, antioxidants, and the like. These components may be used individually by 1 type, and may be used combining two or more types by arbitrary ratios.

Preferable examples of the organic solvent include ketones, alkyl halides, amides, sulfoxides, heterocyclic compounds, hydrocarbons, esters, ethers, and the like. Among these, cyclic ketones and cyclic ethers are preferable because they easily dissolve the liquid crystal compound. Examples of the cyclic ketone solvent include cyclopropanone, cyclopentanone, cyclohexanone, and the like, among which cyclopentanone is preferable. Examples of the cyclic ether solvent include tetrahydrofuran, 1,3-dioxolane, 1,4-dioxane, etc. Among them, 1,3-dioxolane is preferable. One type of solvent may be used alone, or two or more types may be used in combination at any ratio, and the solvent is optimized from the viewpoint of compatibility, viscosity, and surface tension as a liquid crystal layer forming composition. It is preferable.
The content ratio of the organic solvent is usually 30% by weight or more and 95% by weight or less as a ratio with respect to the total solid content other than the organic solvent.

  As the surfactant, it is preferable to select and use one that does not inhibit the orientation. Examples of preferred surfactants include nonionic surfactants containing a siloxane and a fluorinated alkyl group in the hydrophobic group portion. Of these, oligomers having two or more hydrophobic group moieties in one molecule are particularly suitable. Examples of these surfactants are OMNOVA PolyFox's PF-151N, PF-636, PF-6320, PF-656, PF-6520, PF-3320, PF-651, PF-652; Examples include FTX-209F, FTX-208G, FTX-204D of Neos Corporation, and KH-40 of Surflon, Seimi Chemical Co., Ltd. One type of surfactant may be used, or two or more types may be used in combination at any ratio.

  The blending ratio of the surfactant is preferably such that the concentration of the surfactant in the liquid crystal resin layer obtained by curing the liquid crystal layer forming composition is 0.05% by weight or more and 3% by weight or less. If the blending ratio of the surfactant is less than 0.05% by weight, the alignment regulating force at the air interface is lowered and alignment defects may occur. On the other hand, when the amount is more than 3% by weight, an excessive surfactant may enter between the liquid crystal compound molecules to reduce the alignment uniformity.

  The chiral agent may be a polymerizable compound or a non-polymerizable compound. As the chiral agent, a compound having a chiral carbon atom in the molecule and not disturbing the alignment of the liquid crystal compound is usually used. When an example of the chiral agent is given, “LC756” manufactured by BASF and the like may be mentioned as the polymerizable chiral agent. Moreover, for example, those described in JP-A-11-193287, JP-A-2003-13787 and the like can be mentioned. One type of chiral agent may be used, or two or more types may be used in combination at any ratio. A chiral agent is usually used in combination with a polymerizable liquid crystal compound when forming a region having a twisted nematic phase.

  As the polymerization initiator, for example, a thermal polymerization initiator may be used, but usually a photopolymerization initiator is used. As a photoinitiator, the compound which generate | occur | produces a radical or an acid with an ultraviolet-ray or visible light can be used, for example. Examples of photopolymerization initiators include benzoin, benzylmethyl ketal, benzophenone, biacetyl, acetophenone, Michler's ketone, benzyl, benzylisobutyl ether, tetramethylthiuram mono (di) sulfide, 2,2-azobisisobutyronitrile, 2,2-azobis-2,4-dimethylvaleronitrile, benzoyl peroxide, di-tert-butyl peroxide, 1-hydroxycyclohexyl phenyl ketone, 2-hydroxy-2-methyl-1-phenyl-propan-1-one 1- (4-Isopropylphenyl) -2-hydroxy-2-methylpropan-1-one, thioxanthone, 2-chlorothioxanthone, 2-methylthioxanthone, 2,4-diethylthioxanthone, methylbenzoyl formate 2,2-diethoxyacetophenone, β-ionone, β-bromostyrene, diazoaminobenzene, α-amylcinnacaldehyde, p-dimethylaminoacetophenone, p-dimethylaminopropiophenone, 2-chlorobenzophenone, pp′- Dichlorobenzophenone, pp'-bisdiethylaminobenzophenone, benzoin ethyl ether, benzoin isopropyl ether, benzoin n-propyl ether, benzoin n-butyl ether, diphenyl sulfide, bis (2,6-methoxybenzoyl) -2,4,4-trimethyl- Pentylphosphine oxide, 2,4,6-trimethylbenzoyldiphenyl-phosphine oxide, bis (2,4,6-trimethylbenzoyl) -phenylphosphine oxide 2-methyl-1 [4- (methylthio) phenyl] -2-morpholinopropan-1-one, 2-benzyl-2-dimethylamino-1- (4-morpholinophenyl) -butan-1-one, Anthracene benzophenone, α-chloroanthraquinone, diphenyl disulfide, hexachlorobutadiene, pentachlorobutadiene, octachlorobutene, 1-chloromethylnaphthalene, 1,2-octanedione, 1- [4- (phenylthio) -2- (o- Benzoyloxime)] and 1- [9-ethyl-6- (2-methylbenzoyl) -9H-carbazol-3-yl] ethanone 1- (o-acetyloxime), (4-methylphenyl) [4- (2-Methylpropyl) phenyl] iodonium hexafluoroph Sufeto, 3-methyl-2-butynyl tetramethyl hexafluoroantimonate, diphenyl - (p-phenylthiophenyl) sulfonium hexafluoroantimonate, and the like. One type of polymerization initiator may be used, or two or more types may be used in combination at any ratio. Furthermore, you may adjust photocuring agents, such as a tertiary amine compound, or a polymerization accelerator, for example to a liquid crystal layer forming composition as needed, and may adjust the sclerosis | hardenability of the composition for liquid crystal layer forming. In order to improve the photopolymerization efficiency, it is preferable to appropriately select the average molar extinction coefficient of the liquid crystal compound and the photopolymerization initiator.

  Examples of the ultraviolet absorber include 2,2,6,6-tetramethyl-4-piperidylbenzoate, bis (2,2,6,6-tetramethyl-4-piperidyl) sebacate, and bis (1,2,2). , 6,6-pentamethyl-4-piperidyl) -2- (3,5-di-t-butyl-4-hydroxybenzyl) -2-n-butyl malonate, 4- (3- (3,5-di) -T-butyl-4-hydroxyphenyl) propionyloxy) -1- (2- (3- (3,5-di-t-butyl-4-hydroxyphenyl) propionyloxy) ethyl) -2,2,6 Hindered amine ultraviolet absorbers such as 6-tetramethylpiperidine; 2- (2-hydroxy-5-methylphenyl) benzotriazole, 2- (3-t-butyl-2-hydroxy-5-methylphenyl) 5-chlorobenzotriazole, 2- (3,5-di-t-butyl-2-hydroxyphenyl) -5-chlorobenzotriazole, 2- (3,5-di-t-amyl-2-hydroxyphenyl) benzo Benzotriazole ultraviolet absorbers such as triazole; 2,4-di-t-butylphenyl-3,5-di-t-butyl-4-hydroxybenzoate, hexadecyl-3,5-di-t-butyl-4- Examples thereof include benzoate ultraviolet absorbers such as hydroxybenzoate; benzophenone ultraviolet absorbers, and acrylonitrile. These ultraviolet absorbers may be used alone or in combination of two or more at an arbitrary ratio in order to impart desired light resistance.

  The blending ratio of the ultraviolet absorber is usually 0.001 part by weight or more, preferably 0.01 part by weight or more, and usually 5 parts by weight or less, preferably 1 part by weight or less with respect to 100 parts by weight of the liquid crystal compound. . When the blending ratio of the UV absorber is less than 0.001 part by weight, the UV absorbing ability may be insufficient, and the desired light resistance may not be obtained. When the composition is cured with active energy rays such as ultraviolet rays, the curing becomes insufficient, and the mechanical strength of the liquid crystal resin layer may be lowered or the heat resistance may be lowered.

  The composition for forming a liquid crystal layer may contain a crosslinking agent according to the desired mechanical strength. Examples of cross-linking agents include trimethylolpropane tri (meth) acrylate, pentaerythritol tri (meth) acrylate, pentaerythritol tetra (meth) acrylate, dipentaerythritol hexa (meth) acrylate, 2- (2-vinyloxyethoxy) Polyfunctional acrylate compounds such as ethyl acrylate; Epoxy compounds such as glycidyl (meth) acrylate, ethylene glycol diglycidyl ether, glycerin triglycidyl ether, pentaerythritol tetraglycidyl ether; 2,2-bishydroxymethylbutanol-tris [3- ( 1-aziridinyl) propionate], 4,4-bis (ethyleneiminocarbonylamino) diphenylmethane, trimethylolpropane-tri-β-aziridinylpropionate Aziridine compounds such as nates; Isocyanurate type isocyanates derived from hexamethylene diisocyanate, hexamethylene diisocyanate, isocyanurate type isocyanates, biuret type isocyanates, adduct type isocyanates, etc .; Polyoxazoline compounds having an oxazoline group in the side chain; N- (2-aminoethyl) 3-aminopropyltrimethoxysilane, 3-aminopropyltrimethoxysilane, 3-glycidoxypropyltrimethoxysilane, 3- (meth) acryloxypropyltrimethoxysilane, N- (1 , 3-dimethylbutylidene) -3- (triethoxysilyl) -1-propanamine and the like alkoxysilane compounds; A crosslinking agent may be used individually by 1 type, and may be used combining two or more types by arbitrary ratios. Further, the liquid crystal layer forming composition may contain a known catalyst according to the reactivity of the cross-linking agent to improve the productivity in addition to improving the film strength and durability.

  The blending ratio of the crosslinking agent is preferably such that the concentration of the crosslinking agent in the cured liquid crystal resin layer is 0.1 wt% or more and 20 wt% or less. If the blending ratio of the crosslinking agent is less than 0.1% by weight, the effect of improving the crosslinking density may not be obtained. Conversely, if it exceeds 20% by weight, the stability of the liquid crystal resin layer after curing may be lowered. There is.

  Antioxidants include, for example, phenolic antioxidants such as tetrakis (methylene-3- (3,5-di-t-butyl-4-hydroxyphenyl) propionate) methane, phosphorus antioxidants, and thioether oxidations. Examples include inhibitors. An antioxidant may be used individually by 1 type and may be used combining two or more types by arbitrary ratios. The blending amount of the antioxidant can be within a range in which the transparency and adhesive strength of the adhesive layer are not lowered.

  When providing an uncured liquid crystal resin layer, a coating method is usually used. Examples of the method for applying the liquid crystal layer forming composition include a reverse gravure coating method, a direct gravure coating method, a die coating method, and a bar coating method. By applying the composition for forming a liquid crystal layer to the surface of the base film, an uncured liquid crystal resin layer is formed.

  After performing the step of forming an uncured liquid crystal resin layer, an alignment step of aligning the liquid crystal compound contained in the liquid crystal resin layer may be performed as necessary. By performing the alignment step, the liquid crystal compound is aligned in a direction corresponding to the alignment direction of each region of the alignment film. As a specific operation in the alignment step, for example, an operation of heating an uncured liquid crystal resin layer to a predetermined temperature in an oven can be exemplified.

  The temperature at which the liquid crystal resin layer is heated in the alignment step is usually 40 ° C. or higher, preferably 50 ° C. or higher, and is usually 200 ° C. or lower, preferably 140 ° C. or lower. The treatment time in the heat treatment is usually 1 second or longer, preferably 5 seconds or longer, usually 3 minutes or shorter, preferably 120 seconds or shorter. Thereby, the liquid crystal compound in the liquid crystal resin layer can be aligned. Moreover, when a solvent is contained in the composition for forming a liquid crystal layer, the solvent is usually dried by the heating, and thus the solvent is removed from the liquid crystal resin layer. Therefore, when the alignment process is performed, a drying process for drying the liquid crystal resin layer usually proceeds simultaneously.

  After performing an alignment process as needed, the process (curing process) of hardening an uncured liquid crystal resin layer is performed. In each region of the liquid crystal resin layer to be cured, a polymerization reaction proceeds in the composition for forming a liquid crystal layer, and the liquid crystal compound is fixed while maintaining the alignment state. Thereby, the pattern phase difference film which consists of a liquid crystal resin layer is formed in the surface of a base film through an orientation film.

The curing step is usually performed by ultraviolet irradiation. The ultraviolet irradiation time, the irradiation amount, and the like can be appropriately set according to the composition of the liquid crystal layer forming composition and the thickness of the liquid crystal resin layer, but the irradiation amount is usually from 50 mJ / cm ² to 10,000 mJ / cm ^2. Range. Further, the irradiation of ultraviolet rays may be performed in an inert gas such as nitrogen and argon, or may be performed in the air. During irradiation, if necessary, heating with a heater may be continued to perform irradiation while maintaining the isotropic phase of the uncured liquid crystal resin layer.

  In this pattern retardation film, two types of regions having different slow axis directions form a pattern that accurately copies the pattern of regions having different alignment directions formed on the alignment film. Usually, the alignment direction in each region of the alignment film and the slow axis direction of each region of the pattern retardation film formed on the surface thereof are parallel or perpendicular. Therefore, when regions having different orientation directions of 90 ° ± 3 ° are formed in the alignment film as in this example, the slow axis direction of each region is vertical in the pattern retardation film.

  Furthermore, in the patterned retardation film obtained by the production method, there is material continuity between regions having different slow axis directions. Therefore, the manufacturing method described above is optically advantageous in that it does not cause reflection and scattering due to gaps between different types of regions, and it is mechanical in that it does not cause breakage starting from the gaps between regions. This is also advantageous in terms of mechanical strength.

In the manufacturing method of said pattern phase difference film, you may make it perform processes other than the process mentioned above as needed.
Moreover, as long as a desired pattern phase difference film is obtained, the order of each process is arbitrary.

  As for the thickness of the liquid crystal resin layer as the pattern phase difference film, a desired phase difference Re is obtained in each region of the pattern phase difference film according to the value of the refractive index anisotropy Δn of the liquid crystal compound in the liquid crystal layer forming composition. Can be set to an appropriate thickness. Usually, the thickness of the liquid crystal resin layer is in the range of 0.5 μm to 50 μm.

[11-4. Base material]
As the base material, a thermoplastic resin having good transparency can be used without any particular limitation. Examples of such thermoplastic resins include chain olefin polymer resins, alicyclic olefin polymer resins, polycarbonate resins, polyester resins, polysulfone resins, polyethersulfone resins, polystyrene resins, polyolefin resins, Examples include polyvinyl alcohol resins, cellulose acetate polymer resins, polyvinyl chloride resins, polymethacrylate resins, and the like. Among these, a chain olefin polymer resin and an alicyclic olefin polymer resin are preferable. Specifically, for example, ZEONOR 1420 (trade name, manufactured by Nippon Zeon Co., Ltd.) can be mentioned. As a base material, you may use a commercially available long diagonally stretched film, for example, the product name "diagonal stretched ZEONOR film" by Nippon Zeon.

[12. Application]
The pattern retardation film evaluated as described above may be used as a constituent member of a stereoscopic image display device, for example. Hereinafter, a specific example of a liquid crystal display device that can be used as a stereoscopic image display device will be described with reference to the drawings.

  FIG. 20 is an exploded top view schematically showing an example of a liquid crystal display device that can be used as a stereoscopic image display device. FIG. 20 shows an example in which an observer observes an aspect in which an image is visually recognized by a right eye and a left eye from a direction perpendicular to the display surface of the liquid crystal display device 600. The liquid crystal display device 600 is vertically placed on the left side in the figure (that is, placed so that the display surface is parallel to the vertical direction), and therefore the observation direction of the observer observing from the right side in the figure is the horizontal direction. As shown in FIG. 20, the liquid crystal display device 600 includes a liquid crystal panel 610, a base film 620, and a pattern retardation film layer 630 in this order. In the mode of use, the liquid crystal panel 610, the base film 620, and the pattern retardation film layer 630 are usually attached, but in FIG. 20, they are disassembled for illustration. Further, although an adhesive layer is provided between the base film 620 and the pattern retardation film layer 630, since this adhesive layer does not have a large retardation, the image display is not affected. The illustration is omitted.

The liquid crystal panel 610 includes a light source side polarizing plate 611 that is a linear polarizing plate, a liquid crystal cell 612, and a viewing side polarizing plate 613 that is a linear polarizing plate in order from the light source side. As a result, the light transmitted through the liquid crystal panel 610 is emitted as linearly polarized light. The transmission axis of the viewing side polarizing plate 613 is parallel to the vertical direction as indicated by an arrow A ₆₁₃ , and thus the polarization direction of light emitted from the viewing side polarizing plate 613 is also the vertical direction indicated by an arrow A ₆₁₃ .

  In the liquid crystal panel 610, a pixel region for displaying a right-eye image and a pixel region for displaying a left-eye image are set at different positions as viewed from the thickness direction. Each of these pixel regions is a strip-like region extending in the horizontal direction. In addition, the pixel region for displaying the right-eye image and the pixel region for displaying the left-eye image have a constant width, and their arrangement displays the pixel region for displaying the right-eye image and the left-eye image. The pixel regions are arranged in stripes so as to be alternately arranged in the vertical direction.

  The base film 620 is a film having a retardation of 10 nm or less and substantially having no retardation. Therefore, the light that passes through the base film 620 passes through the base film 620 while maintaining the polarization state before transmission.

  The pattern retardation film 630 has a strip-shaped region 631 and a strip-shaped region 632 that are provided in parallel and uniformly with respect to the longitudinal direction of the screen. The region 631 and the region 632 are arranged in stripes that are alternately arranged in the vertical direction. When viewed from the thickness direction, the region 631 overlaps the pixel region displaying the left-eye image of the liquid crystal panel 610, and the region 632 overlaps the pixel region displaying the right-eye image of the liquid crystal panel.

The phase difference of the region 631 is a quarter wavelength of the transmitted light. Further, the slow axis direction _{A 631} of the region 631 is the direction forming an angle of -45 ° with respect to the polarization transmission axis of the viewing-side polarizing plate 613. For this reason, the linearly polarized light emitted from the viewing side polarizing plate 613 is converted into circularly polarized light that rotates in the rotation direction A ₆₄₁ by passing through the region 631.
On the other hand, the phase difference of the region 632 is also a quarter wavelength of the transmitted light. However, the slow axis direction _{A 632} of the region 632 is a direction forming an angle of + 45 ° relative to the polarization transmission axis of the viewing-side polarizing plate 613, and has a slow axis direction _{A 631} and vertical region 631 . Therefore, the linearly polarized light emitted from the viewing-side polarizing plate 613 is converted into circularly polarized light that rotates in the rotation direction A ₆₄₂ , as opposed to the light that has passed through the region 631, by passing through the region 632.

In this example, the observer observes the display surface of the liquid crystal display device 600 through the polarizing glasses 700. The polarizing glasses 700 include a quarter wavelength plate 710, a quarter wavelength plate 720, and a linear polarizing plate 730. A slow axis direction _{A 710} of the quarter wave plate 710 is parallel to the slow axis direction _{A 631} of the first region 631 of the patterned retardation film 630. 1/4 slow axis direction _{A 720} wavelength plate 720 is parallel to the slow axis direction _{A 632} of the second region 632 of the patterned retardation film 630. Transmission axis _{A 730} of linear polarizer 730 is perpendicular (i.e., horizontal direction) with respect to the polarization transmission axis _{A 613} of the viewing-side polarizer 613 of the liquid crystal display device 600. The quarter wavelength plate 710 is provided in a portion corresponding to the left eye of the polarizing glasses 700, and the quarter wavelength plate 720 is provided in a portion corresponding to the right eye of the polarizing glasses 700. The linearly polarizing plate 730 is provided in both the portion corresponding to the right eye and the portion corresponding to the left eye of the polarizing glasses 700.

The light transmitted through the light source side polarizing plate 611, the liquid crystal cell 612, and the viewing side polarizing plate 613 is emitted as linearly polarized light. Direction of polarization transmission axis of the viewing-side polarizing plate 613, because as the vertical direction indicated by an arrow A _613, the polarization direction of the light emitted from the viewing-side polarizing plate 613 is the vertical direction indicated by an arrow A _613. The linearly polarized light emitted from the viewing side polarizing plate 613 is transmitted through the base film 620 while maintaining its polarization state.

Of the linearly polarized light transmitted through the base film 620, the light transmitted through the region 631 is converted into circularly polarized light that rotates in the rotation direction A ₆₄₁ . On the other hand, the light transmitted through the region 632 is converted into circularly polarized light that rotates in the rotation direction A ₆₄₂ opposite to the light transmitted through the region 631.

When the light L emitted from the region 631 enters the portion corresponding to the left eye of the polarizing glasses 700, the light L enters the quarter wavelength plate 710. The light transmitted through the quarter-wave plate 710 is converted into linearly polarized light having a vibration direction parallel to the transmission axis A _{730 of the} linearly polarizing plate 730, and thus can pass through the linearly polarizing plate 730. Therefore, the light L transmitted through the region 631 is visually recognized by the user's left eye.
On the other hand, when the light L emitted from the region 631 enters the portion corresponding to the right eye of the polarizing glasses 700, the light L enters the quarter wavelength plate 720. The light transmitted through the quarter-wave plate 720 is converted into linearly polarized light having a vibration direction perpendicular to the transmission axis A ₇₃₀ of the linearly polarizing plate 730, and thus cannot pass through the linearly polarizing plate 730. Accordingly, the light L transmitted through the region 631 is not visually recognized by the user's right eye.

Further, when the light R emitted from the region 632 enters the portion corresponding to the right eye of the polarizing glasses 700, the light R enters the quarter wavelength plate 720. The light transmitted through the quarter-wave plate 720 is converted into linearly polarized light having a vibration direction parallel to the transmission axis A _{730 of the} linearly polarizing plate 730, and thus can pass through the linearly polarizing plate 730. Therefore, the light R transmitted through the region 632 is visually recognized by the user's right eye.
On the other hand, when the light R emitted from the region 632 enters the portion corresponding to the left eye of the polarizing glasses 700, the light R enters the quarter wavelength plate 710. The light transmitted through the quarter-wave plate 710 is converted into linearly polarized light having a vibration direction perpendicular to the transmission axis A ₇₃₀ of the linearly polarizing plate 730, and therefore cannot be transmitted through the linearly polarizing plate 730. Therefore, the light R that has passed through the region 632 is not visually recognized by the user's left eye.

  Thus, the user views the light transmitted through the region 631 with the left eye and the light transmitted through the region 632 with the right eye. Therefore, by displaying the left-eye image in the pixel region corresponding to the region 631 and displaying the right-eye image in the pixel region corresponding to the region 632, the user can visually recognize the stereoscopic image. At this time, in the liquid crystal display device 600, since the shape and dimensions of the pattern retardation film 630 are appropriate, the phase difference between the anisotropic region 631 and the isotropic region 632 can be expressed with high accuracy. Therefore, the image quality of the liquid crystal display device 600 can be improved.

Note that the liquid crystal display device 600 may be further modified.
For example, the order of the base film 620 and the pattern retardation film 630 may be changed, and the base film 620 may be provided on the viewing side with respect to the pattern retardation film 630.
Further, for example, the liquid crystal display device 600 may be provided with an antireflection film, an antiglare film, an antiglare film, a hard coat film, a brightness enhancement film, an adhesive layer, an adhesive layer, a hard coat layer, an antireflection film, a protective layer, and the like. Good.
Further, the configuration of the part corresponding to the right eye and the part corresponding to the left eye of the polarizing glasses 700 is switched, and the image of the pixel area corresponding to the area 631 of the liquid crystal panel 610 and the pixel area corresponding to the area 632 of the liquid crystal panel 610 This may be carried out by replacing the image.
Furthermore, as long as a stereoscopic image can be appropriately displayed, the direction of the optical axis such as the slow axis and the transmission axis of each optical element may be changed.

  EXAMPLES Hereinafter, the present invention will be specifically described with reference to examples. However, the present invention is not limited to the examples shown below, and may be arbitrarily changed without departing from the gist of the present invention and its equivalent scope. May be implemented. In the following description, “%” and “parts” representing amounts are based on weight unless otherwise specified. In the following description, the measurement wavelength of the phase difference Re is 550 nm unless otherwise specified. Further, the operations described below were performed under normal temperature and normal pressure conditions unless otherwise specified.

[Example 1]
(1-1. Production of pattern retardation film)
(1-1-1. Preparation of Composition for Forming Liquid Crystal Layer)
25 parts of a polymerizable liquid crystal compound (manufactured by BASF, product name “LC242”), 1 part of a polymerization initiator (manufactured by Ciba Japan, product name “Irg 379”), and compound 1 (structural formula) that does not exhibit liquid crystallinity 5 parts, trimethylolpropane triacrylate as a crosslinking agent, 0.03 part of a fluorosurfactant (manufactured by Neos, product name “Furgent 209F”) as a surfactant, and solvent A liquid crystal layer forming composition comprising 66 parts of methyl ethyl ketone was prepared.

(1-1-2. Formation of Pattern Retardation Film)
As a base film, a long norbornene resin film (Zeonor film ZF14-100 manufactured by Nippon Zeon Co., Ltd .; thickness 100 μm; in-plane retardation 10 nm or less at a measurement wavelength of 550 nm) was prepared. One side of this base film was coated with a # 2 bar as a photo-alignment material (“LIA-02” manufactured by DIC; solid content 1% by weight; 2-butoxyethanol 99% by weight as a solvent) at 80 ° C. It dried for minutes and formed the photo-alignment material layer. Thereby, the orientation material laminated body provided with the photo-orientation material layer on the single side | surface of a base film was obtained.

Then, the linearly polarized ultraviolet ray having a wavelength of 313 nm was irradiated to the photo-alignment material layer through a glass mask with an integrated light amount of 200 mJ / cm ² . As said glass mask, the transparent part and light-shielding part which were extended in the elongate direction of the base film were used in the shape of stripes along with mutually parallel. The width of the light transmitting part of the glass mask was 276.8 μm, and the width of the light shielding part was 276.8 μm. Moreover, when irradiating an ultraviolet-ray, tension | tensile_strength was applied to the alignment material laminated body provided with the layer structure of (base film)-(photo-alignment material layer) in the elongate direction. The tension was such that the tensile strain of the alignment material laminate was 0.13%. As a result, the photo-alignment material was aligned in the exposed region of the photo-alignment material layer.

Next, the glass mask was removed, and linearly polarized ultraviolet light having a wavelength of 313 nm, which was 90 ° different from the linearly polarized ultraviolet light, was irradiated with an integrated light amount of 10 mJ / cm ² . Thereby, the non-oriented region in the photo-alignment material layer was aligned, and an alignment film was obtained. In this alignment film, a region in which the alignment directions differ by 90 ° formed a pattern that accurately copied the mask pattern of the glass mask.

  Then, the liquid crystal layer forming composition prepared above was applied to the surface of the alignment film using a die coater to obtain a liquid crystal resin layer. This liquid crystal resin layer was subjected to an alignment treatment at 40 ° C. for 2 minutes to align the polymerizable liquid crystal compound in the liquid crystal resin layer.

Next, 2000 mJ / cm < ² > of ultraviolet rays were irradiated with respect to the liquid crystal resin layer in nitrogen atmosphere, and the liquid crystal resin layer was hardened. As a result, a liquid crystal resin layer having two types of regions different in the slow axis direction by 90 ° in the same plane was obtained as a pattern retardation film. Thereby, a long laminated retardation film having a layer structure of (base film)-(alignment film)-(pattern retardation film) was obtained. The dry thickness of the formed pattern retardation film was 2 μm. The phase difference Re of the pattern retardation film was 125 nm, and the slow axis in the plane direction formed an angle of + 45 ° or −45 ° with the long direction of the long laminated retardation film. The arrangement of each area of the pattern retardation film is such that each area extends in a strip shape in the longitudinal direction, and a stripe pattern is formed as a whole. The width of each region was 276.8 μm.

(1-2. Evaluation of pattern retardation film by actual measurement of dimensions)
FIG. 21 is a diagram schematically illustrating a state of a sample when measuring the deflection width ΔD and the average width D of the pattern retardation film region of the pattern retardation film in Examples.
As shown in FIG. 21, a circularly polarizing plate 810 in which a linearly polarizing plate 811 and a quarter wavelength plate 812 are bonded to a glass plate with an adhesive, and a linearly polarizing plate 820 that is bonded to a glass plate are prepared. The glass plate was placed inside. Here, the transmission axis _{A 811} of linear polarizer 811 circularly polarizing plate 810 and the perpendicular to the transmission axis _{A 820} of linear polarizer 820. Further, the slow axis _{A 812} of the transmission axis _{A 811} and the quarter-wave plate 812 of the linear polarizer 811 so as to form an angle of 45 °. A laminated retardation film 830 was inserted between the circularly polarizing plate 810 and the linearly polarizing plate 820. At this time, the transmission axis A ₈₁₁ of linear polarizer 811, patterned retardation band of each region 831 and 832 of the film of the laminated retardation film 830 was such that a direction extending become parallel. In such a state, the slow axis directions A ₈₃₁ and A ₈₃₂ of the regions 831 and 832 of the pattern retardation film form an angle of 45 ° with the transmission axes A ₈₁₁ and A ₈₂₀ of the linearly polarizing plates 811 and 820.

The sample thus prepared was placed on a surface plate of a two-dimensional measuring machine (“EXLONY99” manufactured by Nakamura Seisakusho Co., Ltd.), photographed with a CCD camera, and observed. The specifications of the two-dimensional measuring device are as follows.
Measuring machine specifications Measuring range: X axis = 900 mm, Y axis = 900 mm
Minimum reading amount: 0.001mm
Each axis accuracy: U1 = 5 + 5L / 1000
Coordinate detection: Optical linear encoder Image detection: CCD camera Illumination device: LED epi-illumination

The difference in the slow axis direction _{A 831} and _{A 832} of each region 831 and 832 of the patterned retardation film laminated retardation film 830 is provided, but a region 831 of the region 831 and the region 832 light may passes through the region 832 Blocks the light. Therefore, in the above photographing, as shown in FIG. 22, an image in which a transmissive portion and a light shielding portion are formed in a stripe shape is photographed. In the captured image, the direction in which the black portion extends is the long direction X, the direction perpendicular thereto is the width direction Y, and a highly reliable reference point is provided in advance in the two-dimensional measuring machine. XY coordinates were set as the origin (0, 0).

FIG. 23 schematically shows an enlarged view of a part of the photographed image. As shown in FIG. 23, the edges 841 and 842 in the width direction Y of the black portion 840 are detected by image processing, and the Y coordinates of the edges 841 and 842 at both ends in the width direction of the black portion 840 are set as “Y value”. It was measured.
At the position where the X coordinate is the same value (x), the average value ((y ₈₄₁ + y ₈₄₂ ) of the Y value (y ₈₄₁ ) of the edge 841 on one end side and the Y value (y ₈₄₂ ) of the edge 842 on the other end side. / 2) is the Y value of the midpoint 843 at the X coordinate (x). Further, the difference (y ₈₄₂ −y ₈₄₁ ) between the Y value (y ₄₁ ) of the edge 841 on one end side and the Y value (y ₈₄₂ ) of the edge 842 on the other end side is determined as a black portion 840 in the X coordinate (x). And the width. Such a calculation was performed on the black portion 840 at 37 points up to 1080 mm at a pitch of 30 mm in the longitudinal direction X.

  As shown in FIG. 22, the measurement is performed on five black portions 840A to 840E that are continuous from the end in the width direction and five black portions 840F to 840J at a pitch of 20 mm. The width and the Y value of the midpoint in each X coordinate of 840A to 840J were determined.

  The average value of all the measurement results of the widths of the ten black portions 840A to 840J obtained as described above was defined as the average width D of the region of this sample. As a result of the measurement, the average width D of this sample region was 275.9 μm.

  For each of the 10 black portions 840A to 840J, the Y value at the midpoint at the position where the X coordinate is 0 is set to “0”, and the Y values at the 37 midpoints are normalized, as illustrated in FIG. Expressed on a graph. In this graph, the difference between the maximum value and the minimum value of the Y value in the longitudinal direction X is defined as a region shake width ΔD. As a result of the measurement, the deflection width ΔD of this sample region was 25 μm.

  The ratio of the deflection width ΔD to the average width D of the sample region is 25 / 275.9, which is a very small value. Therefore, it turns out that the shape and dimension of the area | region of the pattern retardation film of this sample are appropriate.

(1-3. Evaluation of Pattern Retardation Film Using Evaluation Mask)
The manufactured pattern retardation film was evaluated in the same manner as in the third embodiment described with reference to FIGS. 8 and 9. A polarizing plate (manufactured by Sanlitz, product name “HLC2-5618”) is used as the linear polarizing plate 220, and a PSA is used on the polarizing plate (manufactured by Sanlitz, product name “HLC2-5618”) as the circularly polarizing plate 230. Then, what stuck the phase difference film (The product made by Nippon Zeon Co., Ltd., product name "diagonal stretched ZEONOR film") which can function as a quarter wavelength plate was used. For PSA, an acrylic pressure-sensitive adhesive (manufactured by Soken Chemical Co., Ltd., product name “SK Dyne 2094”) and a curing agent (manufactured by Soken Chemical Co., Ltd., product name “E-AX”) are added to 100 parts by weight of the polymer in the acrylic pressure-sensitive adhesive. And added at a ratio of 5 parts by weight. As the evaluation mask 140, a mask having a light shielding portion 141 with a width W ₁₄₁ of 326.4 μm and a light transmitting portion 142 with a width W ₁₄₂ of 227.2 μm was used (see FIG. 4).

  A laminated retardation film 180 including a circularly polarizing plate 230, a base film 160, and a pattern retardation film 170, a linearly polarizing plate 220, and an evaluation mask 140 were stacked in this order. When overlapping, the quarter-wave plate of the circularly polarizing plate 230 was disposed so as to face the laminated retardation film 180 side. When observation was performed while irradiating light from the opposite side of the evaluation mask 140 and adjusting the angle of the evaluation mask 140, a position where a dark state where no light could be detected was observed was confirmed. Therefore, it was confirmed that the dimension and shape of the area | region of the manufactured pattern phase difference film were appropriate.

(1-4. Mounting test on liquid crystal display device)
In the same manner as described with reference to FIG. 20, a liquid crystal display device was assembled as follows using the manufactured pattern retardation film, and observed with polarized glasses.
“VW2420H” (24 inches) manufactured by BenQ was prepared as an evaluation display device, and the liquid crystal panel 610 was removed.

  The laminated retardation film was overlaid on the removed liquid crystal panel 610 via an adhesive that is cured by ultraviolet rays. At this time, the laminated retardation film was oriented in the order of the base film 620, the alignment film (not shown), and the pattern retardation film 630 from the side closer to the liquid crystal panel 610. In addition, the polarizing plate transmission axis on the viewing side of the liquid crystal panel 610 and the slow axis of each region of the pattern retardation film 630 were the same as those described with reference to FIG.

  The laminated retardation film was bonded to the viewing-side polarizing plate 613 of the liquid crystal panel 610 by pressing the laminated retardation film with a nip roll. Thereafter, tension was applied to the laminated retardation film, and the pixels 63 of the liquid crystal panel 610 and the regions 631 and 632 of the pattern retardation film 630 were aligned while maintaining the tension. After alignment, the adhesive between the liquid crystal panel 610 and the laminated retardation film was cured by irradiating ultraviolet rays. The liquid crystal panel 610 bonded to the laminated retardation film in this manner was returned to the evaluation display device.

On the other hand, polarized glasses were prepared as follows.
A retardation film (manufactured by Zeon Corporation, product name “obliquely stretched ZEONOR film”) as a quarter-wave plate on the polarizing plate (manufactured by Sanlitz, product name “HLC2-5618”) via the PSA prepared above. An orientation angle of 45 ° with respect to the longitudinal direction; an in-plane retardation of 125 nm at a measurement wavelength of 550 nm, and an in-plane retardation variation of ± 10 nm or less) were bonded to obtain a circularly polarizing plate 1 for polarizing glasses.

  Moreover, it bonded with the polarizing plate so that the slow axis direction of a quarter wavelength plate might be orthogonal to the circularly-polarizing plate 1 for polarizing glasses, and the circularly-polarizing plate 2 for polarizing glasses was obtained.

The circular polarizing plate 1 for polarizing glasses and the circular polarizing plate 2 for polarizing glasses are arranged so as to be aligned in the left and right fields of view of the observer, and polarizing glasses similar to the example shown in FIG. 20 are obtained.
At this time, the circular polarizing plate 1 for polarizing glasses corresponds to the evaluation display device in the order of the quarter wavelength plate 710, the PSA layer (not shown), and the polarizing plate 730 from the evaluation display device side. It was made to become a laminated state. The transmission axis direction of the polarizing plate 730 of the circular polarizing plate 1 for polarizing glasses was arranged to be perpendicular to the transmission axis direction A ₆₁₃ of the viewing side polarizing plate 613 of the evaluation display device. Further, the slow axis direction of the quarter-wave plate 710 of the circularly polarizing plate 1 for polarizing glasses is parallel to the slow axis direction A ₆₃₁ of the region 631 of the pattern retardation film 630 of the evaluation display device. Arranged.
Further, the circular polarizing plate 2 for polarizing glasses is laminated in the order of a quarter wavelength plate 720, a PSA layer (not shown), and a polarizing plate 730 from the evaluation display device side corresponding to the evaluation display device. It was made to become a state. The transmission axis direction of the polarizing plate 730 of the circular polarizing plate 2 for polarizing glasses was arranged to be perpendicular to the transmission axis direction of the viewing side polarizing plate 613 of the evaluation display device. Further, the slow axis direction of the quarter wavelength plate 720 of the circularly polarizing plate 2 for polarizing glasses is parallel to the slow axis direction A ₆₃₂ of the region 632 of the pattern retardation film 630 of the evaluation display device. Arranged.

  The liquid crystal panel of the evaluation display device was inputted with a signal indicating that the odd columns of pixels displayed black and the even columns of pixels displayed white, and the odd columns of pixels were displayed black and the even columns were displayed white. Observation was performed using polarized glasses at a distance of 1 m from the liquid crystal panel. When the right eye displays black in an area of 9/10 or more of the entire screen of the liquid crystal panel, “good” is assumed, and when light leakage is seen in an area larger than 1/10 of the entire screen, “bad” is assumed. As a result of mounting evaluation, black was displayed in an area of 10/10 out of the entire screen, and it was judged as “good”.

[Example 2]
(2-1. Production of pattern retardation film)
Except that the tensile force applied to the alignment material laminate having the layer structure of (base film)-(photo-alignment material layer) was set to a magnitude such that the tensile strain of the alignment material laminate was 0.05%. In the same manner as in Example 1, a long laminated retardation film having a layer structure of (base film)-(alignment film)-(pattern retardation film) was obtained.

(2-2. Evaluation of pattern retardation film by actual measurement of dimensions)
With respect to the pattern retardation film produced in Example 2, the average width D and deflection width ΔD of the region of the pattern retardation film were measured in the same manner as in Example 1. As a result of the measurement, the average width D of the pattern retardation film region was 276.5 μm, and the deflection width ΔD was 70 μm. The ratio of the deflection width ΔD to the average width D of the sample area is 70 / 276.5, which is a larger value than that of the first embodiment. Therefore, it can be seen that the shape and size of the pattern retardation film region of this sample are inferior in accuracy as compared with Example 1.

(2-3. Evaluation of Pattern Retardation Film Using Evaluation Mask)
About the pattern phase difference film manufactured in Example 2, the evaluation of the pattern phase difference film was performed using the evaluation mask in the same manner as in Example 1. When observation was performed while adjusting the angle of the evaluation mask, there was no position at which a dark state where no light could be detected was observed. Therefore, it was confirmed that the size and shape of the region of the manufactured pattern retardation film were not appropriate.

(2-4. Mounting test on liquid crystal display device)
Using the pattern retardation film produced in Example 2, a mounting test on a liquid crystal display device was performed in the same manner as in Example 1. As a result of mounting evaluation, light leakage was observed in an area of 2/10 or more of the entire screen, and it was judged as “defective”.

[Consideration]
From the results of Example 1 and Example 2, it can be seen that according to the pattern retardation film evaluation method of the present invention, the shape and size of the region of the pattern retardation film can be accurately evaluated. Further, this evaluation method can be said to be a simpler method than the conventional method because it can be performed in a short time without requiring labor compared to the actual measurement of dimensions.

1 to 8 Evaluation System 10 Pattern Retardation Film 11, 12 Region 13 Pattern Boundary Line 20 Liquid Crystal Panel 21 First Pixel Group Row 22 Second Pixel Group Row 23 Black Matrix Part 110 Light Source 120 Linear Polarizing Plate 130 Yen Polarizing plate 140 Mask for evaluation 141 Light shielding portion 142 Translucent portion 150 Camera 160 Base material 170 Pattern retardation film 171 First region 172 Second region 180 Laminated retardation film 220 Linearly polarizing plate 230 Circularly polarizing plate 320 Reflective linearly polarized light Different plates 330 Circular polarizing plate 420 Linear polarizing plate 430 Reflective circular polarizing plate 560 Base material 580 Laminated retardation film 590 Compensation base material 600 Liquid crystal display device 610 Liquid crystal panel 611 Light source side polarizing plate 612 Liquid crystal cell 613 Viewing side polarizing plate 620 Substrate 630 Pattern retardation film 31 Region of Pattern Retardation Film 632 Region of Pattern Retardation Film 700 Polarized Glasses 710 1/2 Wave Plate 720 1/4 Wave Plate 730 Linear Polarizer 810 Circular Polarizer 811, 820 Linear Polarizer 812 1/4 Wave Plate 830 Laminated phase difference film 831, 832 Pattern phase difference film region of laminated phase difference film 840 Black portion of photographed image 841, 842 Edge of black portion photographed 843 Middle point of photographed black portion

Claims (6)

  A linearly polarizing plate and a circularly polarizing plate, a pattern retardation film provided between the linearly polarizing plate and the circularly polarizing plate, and one of the linearly polarizing plate and the circularly polarizing plate provided on the opposite side of the patterned retardation film. A light source and a mask provided between the linear polarizing plate and the circular polarizing plate on the opposite side of the other pattern retardation film or between the linear polarizing plate and the circular polarizing plate and the light source, In the evaluation system in which the pattern retardation film has a plurality of types of regions having different slow axis directions, and the mask includes a light-shielding part and a light-transmitting part, the light source of the mask is the light source The evaluation method of a pattern phase difference film which observes the light which the said light source emitted from the other side.   A light source, a mask, one of a linearly polarizing plate and a circularly polarizing plate, a pattern retardation film, and the other of a reflective linearly polarizing plate and a circularly polarizing plate are provided in this order, and the pattern retardation film has a slow axis. The light emitted from the light source from the same side as the light source of the mask in a state where the light source is illuminated in an evaluation system having a plurality of types of regions having different directions and the mask includes a light shielding portion and a light transmitting portion The method for evaluating a pattern retardation film. The in-plane retardation of the pattern retardation film is ¼ wavelength,
The pattern retardation film evaluation method according to claim 1, wherein the pattern retardation film has two types of regions in which the slow axis direction is vertical. The in-plane retardation of the pattern retardation film is ¼ wavelength,
The evaluation method of the pattern phase difference film of Claim 2 with which the said pattern phase difference film has two types of area | regions where a slow axis direction is perpendicular | vertical. The pattern retardation film is provided on the surface of a substrate having a retardation,
The evaluation system is the same compensation substrate as the substrate, and the pattern retardation film and the linearly polarized light are set so that the slow axis of the substrate and the slow axis of the compensation substrate are perpendicular to each other. The evaluation method of the pattern phase difference film of Claim 1 or 3 provided between the board and the other of a circularly-polarizing plate. The pattern retardation film is provided on the surface of a substrate having a retardation,
The evaluation system is the same compensation substrate as the substrate, and the pattern retardation film and the linearly polarized light are set so that the slow axis of the substrate and the slow axis of the compensation substrate are perpendicular to each other. The evaluation method of the pattern phase difference film of Claim 2 or 4 provided between one of a board and a circularly-polarizing plate.

Images