JP2007107030A - Electrode short-circuit prevention method and short-circuit prevention plate - Google Patents
Electrode short-circuit prevention method and short-circuit prevention plate Download PDFInfo
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- 230000002265 prevention Effects 0.000 title claims abstract description 72
- 238000000034 method Methods 0.000 title claims abstract description 18
- 239000000463 material Substances 0.000 claims abstract description 22
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims abstract description 20
- 239000007788 liquid Substances 0.000 claims abstract description 11
- 239000011810 insulating material Substances 0.000 claims description 15
- 238000000151 deposition Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 8
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 3
- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 230000008021 deposition Effects 0.000 abstract description 7
- 239000004973 liquid crystal related substance Substances 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 15
- 239000007789 gas Substances 0.000 description 14
- 239000011162 core material Substances 0.000 description 10
- 229920000642 polymer Polymers 0.000 description 5
- 239000005046 Chlorosilane Substances 0.000 description 4
- KOPOQZFJUQMUML-UHFFFAOYSA-N chlorosilane Chemical class Cl[SiH3] KOPOQZFJUQMUML-UHFFFAOYSA-N 0.000 description 4
- 229910052710 silicon Inorganic materials 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000002994 raw material Substances 0.000 description 3
- 239000006227 byproduct Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000000498 cooling water Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000002244 precipitate Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- ZDHXKXAHOVTTAH-UHFFFAOYSA-N trichlorosilane Chemical compound Cl[SiH](Cl)Cl ZDHXKXAHOVTTAH-UHFFFAOYSA-N 0.000 description 1
- 239000005052 trichlorosilane Substances 0.000 description 1
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Abstract
【課題】多結晶シリコンの製造反応炉に設置された電極まわりの液滴の流下を阻止し、液滴の析出と堆積による短絡を防止する。
【解決手段】多結晶シリコンの製造反応炉に設置された電極に板材を装着し、該板材が電極まわりに張り出すように設けることを特徴とする電極の短絡防止方法、および、側方に開口する凹部を有する板材によって形成されており、該凹部が電極の軸まわりに装入されることによって該板材が電極まわりに張り出して装着され、電極まわりの液滴の流下を阻止することを特徴とする電極の短絡防止板。
【選択図】図1Disclosed is a method for preventing a liquid crystal from flowing down around an electrode installed in a reactor for producing polycrystalline silicon and preventing a short circuit due to deposition and deposition of the liquid droplet.
A method for preventing a short circuit of an electrode, wherein a plate material is attached to an electrode installed in a reactor for producing polycrystalline silicon, and the plate material is provided so as to project around the electrode, and a side opening is provided. Characterized in that it is formed by a plate material having a concave portion, and that the concave portion is inserted around the axis of the electrode so that the plate material is mounted around the electrode and prevents the liquid droplet from flowing around the electrode. Electrode short-circuit prevention plate.
[Selection] Figure 1
Description
本発明は、シーメンス法による多結晶シリコン製造炉に設置される電極の短絡を防止する手段に関する。 The present invention relates to a means for preventing a short circuit of electrodes installed in a polycrystalline silicon manufacturing furnace by the Siemens method.
半導体級多結晶シリコンは従来から主にシーメンス法によって製造されている。この製造装置の一例を図3に示す。図に示するように、反応炉10は炉底20を覆うようにベルジャ30が設けられており、内部が密閉されている。炉内には種棒となる逆U字型のシリコン芯材(シード)50が複数本立設されており、該芯材50の両基端部は炉底部の電極60にホルダー61を介して支えられている。炉底20には、炉内の芯材に向かって原料ガスを供給するノルズ70が設けらてれいる。ノズル70の個数は複数のシリコン芯材50に対して均一に原料ガスが供給されるように配置されている。これらのノズル70は原料ガスの供給管路90に接続しており、供給管路90は流量調整弁92を介して原料ガスの供給源に通じている。原料ガスは供給管路90を経てノズル70に送られ、炉内に供給される。また、反応炉10には排ガスの排出口93が設けられており、排出口93は排出管路94に接続している。
Semiconductor grade polycrystalline silicon has heretofore been produced mainly by the Siemens method. An example of this manufacturing apparatus is shown in FIG. As shown in the figure, the
シリコン芯材50は電極60およびホルダー61を通じて通電され、表面が1000℃以上に赤熱される。炉内に供給された原料ガスは、赤熱したシリコン芯材11の表面に接触して熱分解ないし水素還元され、シード50の表面に多結晶シリコンを析出する。この反応が進行して多結晶シリコン棒に成長する(特許文献1)。
The
このように、シリコン芯材には電極およびホルダーを通じて大量の電流が流れるので、炉底に設けられている電極は反応炉本体に対して絶縁を確保する必要がある。そこで、電極と反応炉との間には絶縁材が設けられている。さらに、電極は赤熱した芯材からの放熱に対して保護するために、電極の内部には冷却水が流れる構造が形成されており、電極および絶縁材が水冷されている(特許文献2)。
炉内でトリクロロシランなどのクロロシラン類の原料ガスが反応してシリコン心材表面に多結晶シリコンを析出させる際に、シリコン析出時の副生物であるクロロシランポリマーが凝縮し、流れ落ちて電極や絶縁材に付着する場合がある。このポリマーはシリコン心材からの放射熱を受けて多結晶シリコンに転化して電極や絶縁材およびその周囲に付着し、この付着したシリコンによって電極とその周囲の炉本体との間で短絡が生じ、電源接地のトラブルを招くことがある。 When the source gas of chlorosilanes such as trichlorosilane reacts in the furnace to deposit polycrystalline silicon on the surface of the silicon core, the by-product chlorosilane polymer at the time of silicon deposition condenses and flows down to the electrodes and insulation. May adhere. This polymer receives radiant heat from the silicon core material and is converted into polycrystalline silicon and adheres to the electrode and the insulating material and its surroundings. This deposited silicon causes a short circuit between the electrode and the surrounding furnace body, May cause power grounding problems.
本発明は、多結晶シリコン製造における従来の上記問題を解決したものであり、反応炉に設置した電極の短絡を防止する方法と手段を提供する。本発明の短絡防止方法ないし手段は既存の反応炉の構造を変更せずに容易に実施することができ、確実な短絡防止効果を得ることができるので、安定操業の確保、および生産性の向上に有用である。 The present invention solves the above-mentioned conventional problems in the production of polycrystalline silicon, and provides a method and means for preventing a short circuit of an electrode installed in a reaction furnace. The short-circuit prevention method or means of the present invention can be easily implemented without changing the structure of the existing reactor, and a reliable short-circuit prevention effect can be obtained, ensuring stable operation and improving productivity. Useful for.
本発明は、以下の構成を有する電極短絡防止方法と短絡防止手段に関する。
(1)多結晶シリコンの製造反応炉に設置された電極に板材を装着し、該板材が電極まわりに張り出すように設けることによって、電極まわりの液滴の流下を阻止し、液滴の析出と堆積による短絡を防止することを特徴とする電極の短絡防止方法。
(2)側方に開口する凹部を有する板材によって形成した短絡防止板を少なくとも二枚用い、これら短絡防止板の開口凹部の向きが重ならないように、該短絡防止板を上下に重ねて電極に装着し、該短絡防止材が電極まわりに張り出すように設けることによって、電極まわりの液滴の流下を阻止する上記(1)に記載する電極の短絡防止方法。
(3)電極と反応炉との間に介設されている絶縁材の上側に短絡防止板を設けて、電極まわりの液滴の流下を阻止する上記(1)または(2)に記載する電極の短絡防止方法。
(4)多結晶シリコンの製造反応炉に設置された電極に装着される短絡防止板であって、側方に開口する凹部を有する板材によって形成されており、該凹部が電極の軸まわりに装入されることによって該板材が電極まわりに張り出して装着され、電極まわりの液滴の流下を阻止することを特徴とする電極の短絡防止板。
(5)カーボン製の板材によって形成された上記(4)に記載する電極の短絡防止板。
The present invention relates to an electrode short-circuit prevention method and a short-circuit prevention means having the following configurations.
(1) Production of polycrystalline silicon A plate is attached to an electrode installed in a reaction furnace, and the plate is provided so as to protrude around the electrode, thereby preventing the liquid droplet from flowing around the electrode and depositing the droplet. And a method of preventing a short circuit due to deposition.
(2) Use at least two short-circuit prevention plates formed of a plate material having recesses that open to the side, and stack the short-circuit prevention plates on top and bottom so that the orientation of the opening recesses of these short-circuit prevention plates does not overlap. The electrode short-circuit prevention method according to the above (1), wherein the electrode is installed and the short-circuit prevention material is provided so as to protrude around the electrode, thereby preventing the liquid droplet from flowing down around the electrode.
(3) The electrode described in (1) or (2) above, wherein a short-circuit prevention plate is provided on the upper side of the insulating material interposed between the electrode and the reactor to prevent the liquid droplet from flowing around the electrode. How to prevent short circuit.
(4) Production of polycrystalline silicon A short-circuit prevention plate to be attached to an electrode installed in a reaction furnace, which is formed of a plate material having a concave portion that opens to the side, and the concave portion is mounted around the axis of the electrode. An electrode short-circuit prevention plate, wherein the plate material is mounted so as to protrude around the electrode by being inserted, and the flow of liquid droplets around the electrode is prevented.
(5) The electrode short-circuit prevention plate according to (4), which is formed of a carbon plate material.
本発明は、反応炉の電極に短絡防止材を装着し、好ましくは絶縁材よりも上側に装着し、該短絡防止板が電極まわりに張り出すように設けるので、原料ガスの反応によって副生するクロロシランポリマーの液滴の流下が短絡防止板によって阻止され、電極および絶縁材と炉底との間に流れ込まないので、この部分に析出するシリコン量が大幅に低減され、従って、電極と炉底との間の短絡を確実に防止することができる。 In the present invention, the short-circuit prevention material is attached to the electrode of the reaction furnace, preferably on the upper side of the insulating material, and the short-circuit prevention plate is provided so as to protrude around the electrode. Since the flow of chlorosilane polymer droplets is prevented by the short-circuit prevention plate and does not flow between the electrode and the insulating material and the bottom of the furnace, the amount of silicon deposited in this part is greatly reduced. Can be reliably prevented.
短絡防止板を電極まわりに張り出すように設けるので、短絡防止板より下側の部分には原料ガスが触れ難くなり、またシリコン心材から受ける放射熱も減少するので、絶縁材に析出するシリコン量が大幅に減少する。 Since the short-circuit prevention plate is provided so as to protrude around the electrode, it is difficult for the source gas to touch the part below the short-circuit prevention plate, and the radiant heat received from the silicon core material is reduced, so the amount of silicon deposited on the insulating material Is greatly reduced.
本発明の短絡防止方法ないし防止手段は、短絡防止板を電極に装着するだけであり、反応炉の構造を変更する必要がないので、容易に実施することができる。また、短絡防止板は側方に開口する凹部を設けた板材であるので、容易に製造することができ、しかも確実な短絡防止効果を得ることができる。さらに、この短絡防止板は着脱自在であり、この上側に多結晶シリコンが析出して堆積量が多くなったときには容易に交換することができる。 The short-circuit prevention method or prevention means of the present invention can be easily implemented because only the short-circuit prevention plate is attached to the electrode and there is no need to change the structure of the reactor. Further, since the short-circuit prevention plate is a plate material provided with a concave portion that opens to the side, it can be easily manufactured and a reliable short-circuit prevention effect can be obtained. Further, the short-circuit prevention plate is detachable, and can be easily replaced when polycrystalline silicon is deposited on the upper side and the deposition amount increases.
以下、本発明の短絡防止方法と手段について、図面を参照して具体的に説明する。
本発明の短絡防止方法は、多結晶シリコンの製造反応炉に設置された電極に板材を装着し、該板材が電極まわりに張り出すように設けることによって、電極まわりの液滴の流下を阻止し、液滴の析出と堆積による短絡を防止することを特徴とする電極の短絡防止方法である。
The short-circuit prevention method and means of the present invention will be specifically described below with reference to the drawings.
The short-circuit prevention method of the present invention prevents the flow of liquid droplets around the electrode by attaching a plate material to an electrode installed in a polycrystalline silicon production reactor and providing the plate material so as to protrude around the electrode. An electrode short-circuit prevention method characterized by preventing a short-circuit due to deposition and deposition of droplets.
本発明の短絡防止板は、上記短絡防止方法に用いるものであって、側方に開口する凹部を有する板材によって形成されており、該凹部が電極の軸まわりに装入されることによって該板材が電極まわりに張り出して装着され、電極まわりの液滴の流下を阻止することを特徴とする電極の短絡防止板である。 The short-circuit prevention plate of the present invention is used for the above-mentioned short-circuit prevention method, and is formed of a plate material having a concave portion that opens to the side. The plate material is formed by inserting the concave portion around the axis of the electrode. Is a short-circuit prevention plate for an electrode, which is mounted so as to protrude around the electrode and prevents the flow of droplets around the electrode.
本発明の短絡防止板とその装着状態を図1および図2に示す。図示するように、反応炉10の炉底20を貫通して電極60が設けられており、電極60と炉底20との間には絶縁材40が介設されている。電極60の先端にはホルダー61が形成されており、該ホルダー61にはシリコン心材50が差し込まれている。該シリコン心材50は、図3に示すように、炉内に逆U字型に設置されており、その両端部は上記ホルダー61によって電極60に支持されている。
The short-circuit prevention plate of the present invention and its mounting state are shown in FIGS. As shown in the drawing, an
絶縁材40の上側の電極まわりに本発明の短絡防止板80が装着されている。短絡防止板80は、図2に示すように、側方に開口する凹部81を有する板材によって形成されている。開口凹部81の大きさは電極60の外径に対応しており、該開口凹部81に電極60を嵌合することによって短絡防止板80を電極の軸まわりに張り出して装着させる。
A short-
短絡防止板80は電極30の軸まわりに十分に張り出した状態を形成すればよいので、その外周部の形状は限定されず、丸形、角形、または多角形の何れででもよい。短絡防止板80は反応炉10の炉内に設置されるので、炉内の汚染を生じないように、その材質は電極60やホルダー61と同様にカーボン等が好ましい。また、短絡防止板80の板厚は任意であり十分な強度が得られる板厚であれば良い。なお、電極60に嵌合した短絡防止板80を安定に装着させるには、電極60の側面に突起(図示省略)を設け、この突起で短絡防止板80を支持させると良い。
The short-
短絡防止板80には開口凹部81が設けられているので、電極60に装着したときに、この部分を通じて液滴が流下しないように、短絡防止板80を少なくとも二枚用い、これら短絡防止板80の開口凹部81の向きが重ならないように、該短絡防止板80を上下に重ねて電極60に装着させると良い。図1は二枚の短絡防止板80を用いた例である。
Since the
また、短絡防止板80を電極60に装着させる際、電極60と反応炉10との間に介設されている絶縁材40よりも上側の部分に短絡防止板80を設けるのが好ましい。図1に示す例では、絶縁材40の上端に接して短絡防止板80が装着されている。絶縁材40よりも上側に短絡防止板80を設けることによって、副生ポリマーの液滴が絶縁材40に接触しないように、該液滴の流下を確実に防止することができる。
Further, when the short-
さらに、この短絡防止板は凹部81の部分に電極60を嵌合して装着するので、着脱自在であり、短絡防止板の上側に多結晶シリコンが析出して堆積量が多くなったときには容易に交換することができる。
Further, since the
原料ガスの反応によって副生したクロロシランポリマーの液滴は、短絡防止板によって流下が阻止され、一部は蒸発する。さらに短絡防止板よりも下側の部分は短絡防止板によって覆われた状態になるので、短絡防止板より下側の部分には原料ガスが触れ難くなり、さらに、シリコン芯材から受ける放射熱が少なくなるので、この部分では原料ガスが多結晶シリコンに転化し難くくなる。従って、多結晶シリコンが殆ど析出しないので電極の短絡が確実に防止される。 The chlorosilane polymer droplets by-produced by the reaction of the raw material gas are prevented from flowing by the short-circuit prevention plate, and partly evaporate. Furthermore, since the part below the short-circuit prevention plate is covered with the short-circuit prevention plate, it becomes difficult for the raw material gas to touch the part below the short-circuit prevention plate, and the radiant heat received from the silicon core material is further reduced. Therefore, in this portion, the source gas is difficult to convert to polycrystalline silicon. Therefore, since the polycrystalline silicon hardly precipitates, the short circuit of the electrode is surely prevented.
短絡防止板を電極まわりに張り出して設けた反応炉を用いて多結晶シリコンを製造した。一枚の短絡防止板を用いた場合(実施例1)、二枚の短絡防止板を開口凹部が重ならないように上下に設けた場合(実施例2)について、短絡発生率を表1に示した。また、短絡防止板を用いない場合を比較例として示した。実施例1では短絡発生率が比較例の概ね1/4以下であり、実施例2では短絡が発生せず、いずれも確実に短絡が防止されている。 Polycrystalline silicon was produced using a reactor provided with a short-circuit prevention plate extending around the electrode. Table 1 shows the short-circuit occurrence rate when one short-circuit prevention plate is used (Example 1) and two short-circuit prevention plates are provided vertically so that the opening recesses do not overlap (Example 2). It was. Moreover, the case where a short circuit prevention board is not used was shown as a comparative example. In Example 1, the short-circuit occurrence rate is approximately ¼ or less of that of the comparative example, and in Example 2, no short-circuit occurs, and both are reliably prevented from being short-circuited.
10−反応炉、30−ベルジャ、50−シリコン芯材、40−絶縁材、60−電極、61−ホルダー、70−原料ガス供給ノズル、80−短絡防止板、81−開口凹部、90−原料ガス供給管路、92−流量調整弁、93−排出口、94−排出管路。 10-reactor, 30-belger, 50-silicon core material, 40-insulating material, 60-electrode, 61-holder, 70-source gas supply nozzle, 80-short-circuit prevention plate, 81-opening recess, 90-source gas Supply line, 92-flow regulating valve, 93-discharge port, 94-discharge line.
Claims (5)
Polycrystalline silicon production A plate is attached to the electrode installed in the reactor, and the plate is provided so that it protrudes around the electrode, thereby preventing the flow of droplets around the electrode, and by depositing and depositing droplets. An electrode short-circuit prevention method characterized by preventing a short circuit.
Using at least two short-circuit prevention plates formed by a plate material having a concave portion that opens to the side, the short-circuit prevention plates are stacked on top and bottom so that the orientation of the opening concave portions of these short-circuit prevention plates does not overlap, 2. The method for preventing an electrode from being short-circuited according to claim 1, wherein the short-circuit preventing material is provided so as to project around the electrode, thereby preventing the liquid droplet from flowing around the electrode.
The method for preventing an electrode from being short-circuited according to claim 1 or 2, wherein a short-circuit prevention plate is provided on an upper side of an insulating material interposed between the electrode and the reaction furnace to prevent a liquid droplet from flowing around the electrode.
A short-circuit prevention plate attached to an electrode installed in a reactor for producing polycrystalline silicon, which is formed of a plate material having a concave portion that opens to the side, and the concave portion is inserted around the axis of the electrode. An electrode short-circuit prevention plate, wherein the plate material is mounted so as to protrude around the electrode and prevents the liquid droplet from flowing around the electrode.
The electrode short-circuit prevention plate according to claim 4, which is formed of a carbon plate material.
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Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2105408A1 (en) | 2008-03-27 | 2009-09-30 | Mitsubishi Materials Corporation | Polycrystalline silicon manufacturing apparatus |
| JP2009221058A (en) * | 2008-03-17 | 2009-10-01 | Mitsubishi Materials Corp | Polycrystalline silicon production apparatus |
| JP2009256191A (en) * | 2008-03-21 | 2009-11-05 | Mitsubishi Materials Corp | Polycrystalline silicon reactor |
| EP2138459A1 (en) | 2008-06-24 | 2009-12-30 | Mitsubishi Materials Corporation | Apparatus for producing polycrystalline silicon |
| JP2010090000A (en) * | 2008-10-08 | 2010-04-22 | Mitsubishi Materials Corp | Apparatus for producing polycrystalline silicon |
| JP2011195441A (en) * | 2010-03-19 | 2011-10-06 | Wacker Chemie Ag | Method for manufacturing polycrystalline silicon rod without crack |
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| JP2013507522A (en) * | 2009-10-09 | 2013-03-04 | ヘムロック・セミコンダクター・コーポレーション | CVD apparatus having electrodes |
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01208312A (en) * | 1988-02-15 | 1989-08-22 | Shin Etsu Handotai Co Ltd | Process for producing high-purity polycrystalline rod and reaction vessel used in said production process |
| JP2002508294A (en) * | 1997-12-15 | 2002-03-19 | アドバンスド シリコン マテリアルズ リミテツド ライアビリテイ カンパニー | Chemical vapor deposition for polycrystalline silicon rod production. |
| JP2003522716A (en) * | 2000-02-18 | 2003-07-29 | ジー.ティ.・イクイップメント・テクノロジーズ・インコーポレーテッド | Method and apparatus for chemical vapor deposition of polysilicon |
-
2005
- 2005-10-11 JP JP2005297001A patent/JP4905638B2/en not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01208312A (en) * | 1988-02-15 | 1989-08-22 | Shin Etsu Handotai Co Ltd | Process for producing high-purity polycrystalline rod and reaction vessel used in said production process |
| JP2002508294A (en) * | 1997-12-15 | 2002-03-19 | アドバンスド シリコン マテリアルズ リミテツド ライアビリテイ カンパニー | Chemical vapor deposition for polycrystalline silicon rod production. |
| JP2003522716A (en) * | 2000-02-18 | 2003-07-29 | ジー.ティ.・イクイップメント・テクノロジーズ・インコーポレーテッド | Method and apparatus for chemical vapor deposition of polysilicon |
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