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JP2004055884A - Polishing liquid, surface plate, hard and brittle material, and method for manufacturing the same - Google Patents

Polishing liquid, surface plate, hard and brittle material, and method for manufacturing the same Download PDF

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Publication number
JP2004055884A
JP2004055884A JP2002212396A JP2002212396A JP2004055884A JP 2004055884 A JP2004055884 A JP 2004055884A JP 2002212396 A JP2002212396 A JP 2002212396A JP 2002212396 A JP2002212396 A JP 2002212396A JP 2004055884 A JP2004055884 A JP 2004055884A
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JP
Japan
Prior art keywords
surface plate
polishing
platen
abrasive
hard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2002212396A
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Japanese (ja)
Inventor
Takashi Sato
佐藤 孝志
Osamu Hattori
服部 修
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Seiko Instruments Inc
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Seiko Instruments Inc
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Priority to JP2002212396A priority Critical patent/JP2004055884A/en
Publication of JP2004055884A publication Critical patent/JP2004055884A/en
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  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for removing a deep hole produced on the surface of a sapphire to shorten a chemical polishing time. <P>SOLUTION: In this case, a surface plate 21 made of cast iron and a surface plate 22 made of tin are stuck. A groove 52 is formed on one surface of the surface plate 22. A lower surface plate 72 is fitted while the groove 52 is upward. An upper surface plate 71 is fitted while the groove 52 is downward. A polishing liquid is poured in between the upper and lower surface plates 71 and 72. While pouring the polishing liquid, the upper and lower surface plates 71 and 72 are turned to polish and manufacture a hard and brittle material. <P>COPYRIGHT: (C)2004,JPO

Description

【0001】
【発明の属する技術分野】
この発明は研削液、定盤、硬脆材及び硬脆材の製造方法に関する。
【0002】
【従来の技術】
従来の硬脆材は高い表面精度の製品を作るのために、両面を同時に研磨する方法(以下「両面同時研磨方法」という。)が広く使われて来た。特に光学部品の分野では、研磨品の厚みバラツキや平坦度が光学特性に反映される為に、高精度の光学特性を要求される製品に於いては、両面同時研磨方法で作成された製品を多用する事が多い。また、半導体用基板製造の分野に於いても、両面鏡面基板に付いては最終工程まで、片面鏡面基板に付いては片面鏡面工程に入るまでの研磨工程に於いて、両面同時研磨方法が使用される事が多い。
【0003】
ところが、アルミナや炭化珪素等の硬脆材単結晶の研磨には 従来の両面同時研磨法に於いて研磨する場合、研磨工程は数段階に分かれるのが一般的である。すなわち、研磨剤の種類と粒子径を変えながら、表面粗さを細かくして行く方法が取られている。研磨剤の種類は研磨品の種類によって決まるが、研磨剤の硬さは研磨品の硬さよりやや硬いのが一般的である。研磨剤の選定はこの考え方に従って行って来た。
【0004】
サファイヤの様な硬脆材を研磨加工する場合、一つの研磨方法として研磨加工品の厚み揃えと厚みバラツキ補正用にグリーンシリコンカーバイドを主成分とする研磨剤を用いた粗研磨、仕上げ研磨にはコロイダルシリカを主成分とする研磨剤を用いた鏡面研磨法を用いて加工していた。加工時間は、例えばサファイヤ材のC面2インチ基板では粗研磨で通常8時間程度、鏡面研磨は非常に長く、150〜200時間の研磨時間を費やしていた。
【0005】
【発明が解決しようとする課題】
しかし、従来の硬脆材は、研磨する工程においてかなりの時間を要していた。サファイヤ材の研磨時間を短縮する為に、前記粗研磨と仕上げ研磨に用いる研磨剤の形状と粒子径を変えて研磨時間の変化を見たが、費やした時間に大きな変化は見られなかった。鏡面研磨工程に於いてサファイヤ板が鏡面状態になる様子を観察すると、鏡面研磨開始数時間でサファイヤ表面の状態が砂目と呼ばれる磨りガラス状態になり、その砂目が完全に消えると鏡面状態になる事が判明した。化学研磨途中の砂目を細かく観察すると内部が磨りガラス状の穴で構成されており、その深さは光学顕微鏡での測定で10ミクロンを越えるものが多かった。同様に粗研磨後の表面を見ると砂目の原因と推測される同様の深さの穴が観察された。
【0006】
それを図13に示す。図13(a)は粗研磨後の表面状態を示し、部分的に深く成った穴を示す。図13(b)は化学研磨の途中で表面の殆どが鏡面状態になったのにもかかわらず、深い穴の部分が砂目となって残った状態を表す。この結果から、これらの深い穴はサファイヤ材の部分的に硬さの柔らかい部分があって、グリーンシリコンカーバイド(GC)の研磨力が低い為に、サファイヤ材の柔らかい部分ではGCが潰れず深く穴を、サファイヤ材の硬い部分ではGCが潰れて浅い穴を掘る、という選択性研磨が原因であると考えられる。そのため、部分的に深い穴が発生する。従って、化学研磨時間を短くする為には、サファイヤ表面に発生した深い穴を除去する方法が課題となる。
【0007】
また、研磨剤は研磨力が強いほど選択性研磨が起きにくい事は周知に事実である為に、GCを用いた粗研磨の後に研磨力の強い研磨粒子を用いて選択性研磨が起きない工夫をする必要があるが、硬脆材の研磨に於いてはダイヤ粒子を用いた研磨法が一般的となる。しかし、ダイヤ研磨剤は次の問題がある。ダイヤは比重が高く、ダイヤを含んだ溶液にしても直ぐに沈殿してしまい、均一な研磨剤を作る事は難しい。また、ダイヤ粒子は溶液内でお互いが集合して固まりとなる為に単体の粒子より大きな粒子となって溶液の中に存在してしまう。この大きな粒子が研磨傷の発生につながる。
【0008】
このような研磨傷は、サファイヤや炭化珪素の単結晶基板が半導体用の基板として採用され始めている状況では、基板の厚みバラツキによる結晶面方位の変化や平坦度の変化による製膜プロセス条件のバラツキにより、基板上に生成される製品の歩留まりが変化する問題を引き起こす。
【0009】
【課題を解決するための手段】
本発明の研削液は、高分子有機化合物を含んだ溶液と、前記溶液に加える研磨剤と、を有し、超音波振動を与えて前記研磨剤を前記溶液に対して撹拌したものである。超音波振動を与えることで、高分子有機化合物を含んだ溶剤と研磨剤を十分撹拌することができる。
【0010】
本発明の研磨液は、溶液が澱粉系の高分子化合物を含んだ水溶液であり、前記溶液を沸騰させたものである。沸騰させることにより、高分子化合物を含んだ水溶液を十分に撹拌することができる。
【0011】
本発明の研削液は、研磨剤がダイアモンド粒子である。ダイアモンドを使用することで、研削時間を短縮することができる。また、高分子有機化合物を含んだ溶液及び澱粉系の高分子化合物を含んだ水溶液と混ぜ合わすことで、硬脆材に深い傷をつけずに研磨することができる。
【0012】
本発明の定盤は、基台となる第一の定盤と、前記基台よりも柔らかい材質を用い、いずれかの一面に溝を設けた第二の定盤と、を有し、前記第二の定盤の前記溝を設けた前記一面と対抗する面と前記第一の定盤とを固定したものである。
【0013】
本発明の定盤は、第一の定盤が鋳鉄であり、第二の定盤が錫であるのが好ましい。
【0014】
本発明の硬脆材は、任意の一面を上記に記載の研磨液を使用して、上記に記載した定盤で研磨したものである。
【0015】
本発明の硬脆材は、前記任意の一面と対抗する面を上記に記載の研磨液を使用して、上記に記載した定盤で研磨すると共に、前記任意の一面と同時に研磨したものである。
【0016】
本発明の硬脆材の製造方法は、上記に記載の定盤の溝を有する面を上側に取り付けた下定盤と、上記に記載の定盤の溝を有する面を下側に取り付けた上定盤とで挟み込むステップと、前記下定盤と前記上定盤間に上記に記載の研削液を流入させるステップと、前記研削液を流入させながら前記下定盤と前記上定盤を回転して研磨するステップと、を有するものである。
【0017】
本発明の硬脆材の製造方法は、前記下定盤と前記上定盤の間にキャリアを挟み込んで研磨するステップを有するものである。
【0018】
【発明の実施の形態】
本発明は粘度の高い高分子有機溶剤または澱粉系有機化合物を溶かした水溶液にダイヤ粒子を溶かし、超音波振動を一定時間加える事でダイヤ粒子の溶液内分離を進める事でダイヤ粒子の分散度が均一で且つダイヤ粒子の沈みが遅い溶液を作成し、その溶液を研磨剤として用いる。
【0019】
次に、鋳鉄製定盤に錫製定盤を張り付けた2重定盤を用意し、錫製定盤を山切り状に溝を切り、上下におかれた2重定盤の間に加工物を配し、上記の研磨剤を流しながら加工物を研磨する。また、2重定盤の目立てには2重定盤と同じ大きさのダイヤ電着の定盤を用いて行う。
【0020】
<実施例1>
本発明の態様を図面に基づいて説明する。最初に、本発明の研磨剤を作成する工程について説明する。本発明において、研磨剤は、油脂性の研磨剤と水溶性の研磨剤に大別される。図1は本発明の油脂性の研磨剤を作成する工程図であり、図2は水溶性の研磨剤を作成する工程図である。
【0021】
図1においては、先ず、高分子有機化合物、粘度調整剤とダイヤ粒子をそれぞれ用意する(工程101〜工程103)。本実施例では、高分子有機化合物は流動パラフィンを250ml、粘度調整剤はオリーブ油を500ml用意した。ダイヤ粒子は、単結晶ダイヤの中心径で2〜4ミクロンの粒子を100カラット用意した。用意した流動パラフィンにダイヤ粒子を溶き(工程104)、次にダイヤ粒子を溶いた溶液を常温で超音波発信器を用いて超音波振動攪拌を行う(工程105)。本実施例では溶液に超音波振動を加える時間を1時間半とした。次に、溶液にオリーブ油を加えて粘度を調整する(工程106)。更に粘度を調整した溶液を超音波振動による攪拌を行い(工程107)、ダイヤ粒子の分裂状態を確認する(工程108)。
【0022】
<実施例2>
次に水溶性の研磨剤を作成する工程を説明する。図2において、先ず、食品製有機化合物を水に溶く(工程111)。食品性有機化合物として粉末状の澱粉を200グラム、水10リットルを用意する。粉末状の澱粉をビーカーに入れ、徐々に水を加えながら粉末状の澱粉を水に溶かす(工程112)。水に溶いた食品製有機化合物を火に掛けて沸騰させる。沸騰してから5分待った後に火を止める。ダイヤ粒子を用意し(工程113)、とダイヤ粒子を界面活性剤に溶く(工程114)。ダイヤ粒子は、単結晶ダイヤの中心径で2〜4ミクロンの粒子を500カラット用意し、界面活性剤は、700ミリリットルを水10リットルに希釈した水溶液を用意する。用意した界面活性剤水溶液にダイヤ粒子を溶き(工程115)、次にダイヤ粒子を溶いた溶液を、常温で超音波発信器を用いて超音波振動を加えて攪拌する(工程116)。このとき、溶液に超音波振動を加える時間を3時間とした。次に界面活性剤水溶液と食品性有機化合物水溶液を加熱する(工程117)。加熱温度は摂氏70度とした。加熱した両水溶液を混ぜ合わせる(工程118)。
【0023】
<実施例3>
次に、本発明の硬脆材の製造に使用する研磨定盤の製造方法、調整方法及び保守方法に付いて説明する。図3は、本発明で使用する研磨定盤の製造方法を示す工程図である。
【0024】
先ず通常使用されている鋳鉄製の定盤21を用意する(工程201)。ここで鋳鉄製定盤21は、9B型両面研磨機用の鋳鉄製定盤21を厚み15ミリに削り、定盤面内平坦度を20ミクロン以下に加工したものを用意する。次に鋳鉄製定盤21と同じ形状の錫製の錫製定盤22を用意する(工程202)。錫製定盤22は、純錫を溶解し、鋳型に入れて固化させたものを厚み15ミリに削りだしたものを使用した。次に鋳鉄製定盤21と錫製定盤22とを、接着剤24を使って貼り合わせる(工程203)。鋳鉄製定盤21と錫製定盤22を貼り合す状態を図4に示す。次に、貼り合わせた定盤の上下を跨ぐ形で落下防止装置23を取り付ける(工程204)。落下防止装置23は、上部定盤を固定する取付け用穴23aと、下部定盤を固定するための折り曲げ部23bを有し、全体の形状はL字状となっている。折り曲げ部23bを鋳鉄製定盤21の取り付け溝21aに挿入し、取付け用穴23aと錫製定盤22の取り付け穴22aを合せて、ねじで固定する。なお、落下防止装置23は折り曲げ部23bで鋳鉄製定盤21と固定せずに、ねじを用いて錫製定盤22の固定方法と同様にしてもよい。
【0025】
貼り合わせた定盤の鋳鉄側を大型旋盤53に銜え、取り付けた錫製定盤22の錫面を精度良く削り出す(工程205)。本実施例では平行度を20ミクロン以内に削り出した。次に、切削工具51をダイヤバイトに銜え、錫製定盤22の表面を山切り状にスパイラル溝52を掘る(工程206)。錫製定盤22の表面にスパイラル溝52を切る模式図を図5に示す。本実施例では溝の深さを0.6ミリ±0.1ミリ、溝のピッチを0.9ミリ±0.1ミリに加工した。溝加工後の状態を図6に示す。図6に示した定盤をもう1つ作成する。2つの定盤を1組として、硬脆材を研磨する。同様に図7に示す定盤をもう一枚作成し、上下1枚ずつを1セットとする。更に上側の定盤に付いては、錫製定盤に研磨剤を流す為の貫通穴を鋳鉄側から錫側に掘り(工程207)、鋳鉄側の貫通穴に銅製のチューブを埋め込む(工程208)。
【0026】
図8は当発明に用いられる研磨定盤の完成図を示す。次に上下2枚の定盤を両面研磨機に取り付ける(工程209)。上記で述べた研磨剤を注入溝に沿って流がす。(工程210)、上下の定盤を合わせて異なる方向に回転させて「共摺り」を行う(工程211)。共摺りを行うことによって錫盤表面に残ったバリや突起が平坦化されるため、バリや突起によって引き起こされる加工物の加工面上の大きな傷やエッジのチッピングを防止することができる。また、共摺りによって錫製定盤22の上面全体が平坦化されので、上面の平坦度が上がる事によって加工物の平坦度を上げる効果もある。このため摺りは、約5分間が好ましい。図8は貼り合わせた上下定盤を共摺りする状態を示す状態図を示す。下定盤72のスパイラス溝52を有する面と、上定盤71のスパイラル溝51を有する面とを向かい合わせる。上定盤71の研磨剤注入パイプ73の一端は、研磨剤を流すための研磨剤戸井120に接続しており、研磨剤は研磨剤戸井120から研磨剤注入パイプ73を通じて流れる。また、上定盤71は、定盤上下軸90と嵌め合っており、この軸を上下すると、上定盤71もそれと連動して上下する。
【0027】
そして、錫製定盤22の表面にある異物をふき取って(工程212)、この作業は終了する。
【0028】
<実施例4>
次に、図9は本発明の硬脆材を研磨する工程を示す。硬脆材として、サファイヤ結晶を使用した場合について述べる。本発明で用いられる加工物に用いられるサファイヤ結晶の形状は長方形に成形され、各面を面取りしたサファイヤ板31を粗研磨で研磨したものを用いる。本実施例では16ミリメートルのオリエンテーション・フラット(オリフラ)を持つ直径50.8ミリメートルで厚み0.5ミリメートルのサファイヤ板を両面同時研磨機とGC研磨材を用いて加工したものを使用した。
【0029】
先ず、下定盤72に上記で説明した研磨材32をまんべんなく塗る(工程301)。研磨材32を塗った下定盤72の上にキャリアを並べ(工程302)、更にキャリア100の穴101に加工物を入れる(工程303)。図10はキャリア100を示す。キャリア100は、円盤状の形状で中央に穴があいている。また、中心と外周の間に加工物を入れるための穴101を6個有している。6つの穴101は、その中心とキャリア100の中心とを結んだそれぞれの線が、キャリア100の中心から等角度となる配置する。穴の数は、加工物の大きさやキャリア100の外形等に基づいて決めることができる。
【0030】
キャリア100の穴101に入れられた加工物の上面に研磨剤32を塗る(工程304)。このとき、研磨材32はスポンジ等に含ませて塗ると、研磨剤が加工物上面につきやすくなり、効果的である。本実施例では加工物のセット(セッティング)を確実にする為に、下定盤72を一回転させ、加工物のセット状態を確認した。上定盤71を静かに下げ、サファイヤ板31に上定盤71が乗る状態になるまで下げる(工程305)。本実施例では両面研磨機を減圧設定で使用したが、その減圧設定を9B型の場合は1.8kg/cmに、4B型の場合には1.3kg/cmに設定した。
【0031】
次に研磨剤注入口から研磨剤を流し込み、(工程306)、上下の定盤71、72をゆっくり回転させる(工程307)。上下の定盤71、72が回転し始めたら研磨剤32を止め(工程308)、定盤71、72の回転を速める(工程309)。本実施例では400RPMに設定して使用した。研磨剤32は一定の間隔を於いて研磨剤注入口から流し込む(工程310)。研磨剤の供給は点滴方法を用いて行い、本実施例では9B型の場合は1回転に1滴、4B型の場合は1.5秒に1回の割合で点滴を行う。加工時間は希望の表面粗さや研磨量によって異なるが研磨速度はサファイヤのA面[11−20]の加工物で0.06μm/sec/mmの値を得た。本実施例では片側15μmの研磨を行った。加工が終わる(工程311)と上定盤71に逆圧を掛けて下定盤71と加工物31の密着を解き、その後ゆっくり上に持ち上げる。更に、サファイヤ板31を回収する(工程312)。図11は加工物の研磨を示す状態図である。研磨注入口100に研削液を注入すると、研削液は研磨剤井戸120を伝わって研磨剤チューブ73に供給される。そして、研磨液は下定盤72の上面に達する。
【0032】
研磨剤32は粘性が高いために、不純物を吸収して更に粘性が高くなるので、定盤上71、72のスパイラル溝(V溝)52に溜まった異物を布で拭き取る(工程313)。本実施例では、研磨剤32の拭き取りは加工回数1回に対して1度行った。加工上がりのサファイヤ板の表面粗さを測定したら、平均粗さRaで1.73オングストロームとの値を得た。厚みバラツキは中心及び周辺4点の測定で最大2ミクロン、同様に平坦度に付いても2ミクロン以内の結果が得られた。
【0033】
<実施例5>
次に、本発明の硬脆材の製造方法について述べる。図12は、硬脆材の製造方法を示す工程図である。研磨工程で製造される製品を液晶プロジェクタ用サファイヤ板とした。
【0034】
本実施例では液晶プロジェクタ用サファイヤ板を鏡面加工する全体の工程について説明する。先ず、サファイヤのインゴット41を用意し(工程401)、X線結晶方位測定器を用いてC軸の方向を測定する(工程402)。サファイヤのインゴット31は、例えばチョコラルスキー法またはベルヌーイ法等で作成された棒状のインゴットが好ましい。X線による結晶方位測定方法に付いては[0001]面、通称C面を測定し、C面の方向に印を付ける。次にサファイヤインゴットを固定用金属板32に貼り付け(工程403)、C面方向に印の付いたサファイヤインゴットにC面方向の印に従って基準面を作る(工程404)。サファイヤインゴットの固定に用いる接着剤は、強固な接着性と高温耐久性が高い接着剤が好ましく、本実施例ではラックを接着剤として用いた。基準面を作成する機械設備としては平面研削盤を用いる事が好ましく、本実施例では平面研削盤に平面部の大きいダイヤホイールを装着した切削盤を用いた。
【0035】
次に接着の終わったサファイヤインゴットの残りの3面をサファイヤインゴット断面が指定された大きさより若干大きくなる様に、3面を相互の面がお互いに90度になる様に加工する(工程405)。本実施例では工程405で使用する加工設備は基準面作成で用いる設備と同じものを使用し、加工仕上がりの外形寸法に対して各方向1mmずつ大きくなる寸法を用いた。次に、4面を面加工したサファイヤインゴット41を指定された厚みで切断する(工程406)。本実施例に於いて切断にはマルチワイヤーソーを用いた。ワイヤー間のスペースは、加工品の最終厚みに切り代と研磨代を足した値に設定をした。切断が終わった板状のサファイヤ板43を数枚集めて固定し、加工品の最終外形寸法に加工する(工程407)。使用する加工設備はロータリー研削盤が好ましく、本実施例でもダイヤホイールを搭載したロータリー研削盤を使用して、外形寸法の追い込みを行った。次に斜面の面取りを行い(工程408)、続いて両面研削盤を用いて粗研磨を行う(工程409)。粗研磨に於ける切削量は、本実施例では片面25μmとした。
【0036】
次に本発明の研磨方法を中間研磨として行う(工程410)。中間研磨の加工終了後に有機溶剤、例えばヘキサンで洗浄剤を充分落とす(工程411)。これは、次の化学研磨工程にダイヤを持ち込まない為に、洗浄は有機溶剤を2段階洗浄が好ましい。次に両面研磨機を用いて化学研磨を行う(工程412)。化学研磨で用いる研磨剤はコロイダルシリカが好ましく、本実施例では中心粒子径100nmのコロイダルシリカ研磨剤を使用した。加工物が鏡面状態になった段階で界面活性剤を主成分とする洗浄剤で洗浄し、水でリンスする(工程413)。加工物を乾燥させ(工程414)、外観検査及び寸法検査を行う(工程420)。
【0037】
【発明の効果】
本発明の研削液は、超音波振動を与えることにより、高分子有機化合物を含んだ溶液と研磨剤とを撹拌しやすくすることができる。
【0038】
本発明の研削液は、澱粉系の高分子化合物を含んだ水溶液を沸騰させることにより、撹拌しやすくすることができる。
【0039】
本発明の研削液は、ダイアモンドを使用することで研磨時間を短縮することができる。また、ダイアモンドと高分子有機化合物を含んだ溶液あるいは澱粉系の高分子化合物を含んだ水溶液と混ぜ合わすことで、硬脆材に深い傷をつけずに研磨することができる。
【0040】
本発明の定盤は、第二の定盤が基台となる第一の定盤よりも柔らかい材質を用いて、いずれかの一面に溝を設けたことにより、ダイアモンドを含む研削液を使用しても、硬脆材の研削面に研削液を流入させることができる。
【0041】
また、本発明の定盤は、第一の定盤に鋳鉄を、前記第二の定盤に錫をそれぞれ使用することで、ダイアモンドを含む研削液を使用しても、硬脆材の研削面に研削液を流入させることができる。
【0042】
本発明の硬脆材は、ダイアモンドを含む研磨液を使用して、第二の定盤が第二の定盤よりも柔らかい定盤で研磨することにより、硬脆材を研磨時間を短縮することができるので、硬脆材の製造時間を短縮することができる。
【0043】
本発明は、硬脆材の相対する面を同時に研磨することで、加工時間を短縮することができる。
【0044】
本発明の硬脆材の製造方法は、下定盤と上定盤とで挟み込んだ状態で研削液を流入することで、硬脆材を両定盤に固定せずに研磨出来るために、硬脆材が両定盤に接着及び剥がしに掛かる時間を省くことで、研磨時間を短縮することができる。
【0045】
本発明の硬脆材の製造方法は、下定盤と上定盤の間にキャリアを挟み込んで研磨することにより、硬脆材を安定させて研磨することができるので、加工精度の高い研磨品を製造する事ができる。
【図面の簡単な説明】
【図1】油脂性の研磨剤を作成する工程を示す工程図である。
【図2】水溶性の研磨剤を作成する工程を示す工程図である。
【図3】研磨定盤の製造方法を示す工程図である。
【図4】鋳鉄製定盤と錫製定盤の貼り合わせた状態を示す状態図である。
【図5】錫製定盤の表面にスパイラル溝を設けた模式図である。
【図6】研磨定盤の完成図を示す模式図である。
【図7】上定盤に研磨剤導入パイプを取り付けた状態を示す状態図である。
【図8】貼り合わせた上下定盤を共摺りする状態を示す状態図である。
【図9】硬脆材を研磨する工程図である。
【図10】キャリアの斜視図である。
【図11】硬脆材を研磨するとき状態を示す状態図である。
【図12】硬脆材の製造方法を示す工程図である。
【図13】従来の研磨による表面の研磨状態を示す。詳細には、(a)は粗研磨終了後の表面状態であり、(b)は化学研磨途中の表面状態である。
【符号の説明】
21 鋳鉄製定盤
22 錫製定盤
23 落下防止板
71 上定盤
72 下定盤
100 キャリア
[0001]
TECHNICAL FIELD OF THE INVENTION
The present invention relates to a grinding fluid, a surface plate, a hard brittle material, and a method for manufacturing a hard brittle material.
[0002]
[Prior art]
Conventionally, a method of simultaneously polishing both surfaces of a hard and brittle material (hereinafter referred to as a “simultaneous polishing method on both surfaces”) has been widely used in order to produce a product with high surface accuracy. Especially in the field of optical components, since the thickness variation and flatness of the polished product are reflected in the optical characteristics, in the case of products requiring high-precision optical characteristics, products manufactured by the double-sided simultaneous polishing method must be used. I often use it a lot. Also, in the field of semiconductor substrate manufacturing, the simultaneous polishing method for both sides is used in the polishing process for the double-sided mirror surface substrate until the final process, and for the single-sided mirror surface substrate until the single-side mirror surface process is started. It is often done.
[0003]
However, when polishing a single crystal of a brittle material such as alumina or silicon carbide when polishing by a conventional double-sided simultaneous polishing method, the polishing process is generally divided into several stages. That is, a method is employed in which the surface roughness is reduced while changing the type and particle size of the abrasive. The type of the abrasive is determined by the type of the abrasive, but the hardness of the abrasive is generally slightly higher than the hardness of the abrasive. The selection of the abrasive has been made according to this concept.
[0004]
When polishing hard and brittle materials such as sapphire, as one polishing method, rough polishing and finish polishing using an abrasive mainly composed of green silicon carbide for uniformity of thickness of the polished product and correction of thickness variation Processing has been performed using a mirror polishing method using an abrasive mainly composed of colloidal silica. The processing time is, for example, about 8 hours for rough polishing on a C-plane 2 inch substrate made of sapphire material, and the mirror polishing is very long, requiring 150 to 200 hours.
[0005]
[Problems to be solved by the invention]
However, the conventional hard brittle material requires a considerable amount of time in the polishing process. In order to shorten the polishing time of the sapphire material, the polishing time was changed by changing the shape and particle size of the abrasive used for the rough polishing and the finish polishing, but no significant change was observed in the time spent. Observing the sapphire plate in the mirror state in the mirror polishing process, the surface of the sapphire becomes a polished glass state called grain after several hours from the start of mirror polishing, and when the grain completely disappears, it becomes a mirror state. It turned out to be. A fine observation of the grain during chemical polishing revealed that the inside was composed of ground glass-like holes, the depth of which often exceeded 10 microns as measured by an optical microscope. Similarly, looking at the surface after the rough polishing, holes having the same depth, which are presumed to be the cause of the grain, were observed.
[0006]
It is shown in FIG. FIG. 13A shows a surface state after the rough polishing, and shows a partially deep hole. FIG. 13 (b) shows a state in which the deep hole remains as a grain while the surface is almost mirror-finished during chemical polishing. From these results, it is found that these deep holes have a partially soft portion of sapphire material and the polishing power of green silicon carbide (GC) is low. This is thought to be due to the selective polishing in which the GC is crushed in a hard part of the sapphire material and a shallow hole is dug. Therefore, a deep hole is partially generated. Therefore, in order to shorten the chemical polishing time, a method of removing a deep hole generated on the sapphire surface becomes an issue.
[0007]
In addition, since it is well known that selective polishing is less likely to occur as the polishing agent has a higher polishing force, a method of preventing selective polishing by using abrasive particles having a high polishing force after rough polishing using GC. In polishing hard and brittle materials, a polishing method using diamond particles is generally used. However, diamond abrasives have the following problems. Diamond has a high specific gravity and immediately precipitates even in a solution containing diamond, making it difficult to produce a uniform abrasive. In addition, the diamond particles gather together in the solution to form a solid, so that the diamond particles are larger than a single particle and exist in the solution. These large particles lead to the generation of polishing scratches.
[0008]
Such polishing scratches may cause a variation in the film-forming process conditions due to a change in the crystal plane orientation due to a variation in the thickness of the substrate or a change in the flatness in a situation where a single crystal substrate of sapphire or silicon carbide has begun to be used as a substrate for a semiconductor. This causes a problem that the yield of products generated on the substrate changes.
[0009]
[Means for Solving the Problems]
The grinding fluid of the present invention has a solution containing a high-molecular-weight organic compound and an abrasive added to the solution, and the ultrasonic abrasive is applied to agitate the abrasive with respect to the solution. By applying the ultrasonic vibration, the solvent containing the high molecular organic compound and the abrasive can be sufficiently stirred.
[0010]
The polishing liquid of the present invention is an aqueous solution containing a starch-based polymer compound, and the solution is boiled. By boiling, the aqueous solution containing the polymer compound can be sufficiently stirred.
[0011]
In the grinding fluid of the present invention, the abrasive is diamond particles. The use of diamond can shorten the grinding time. Also, by mixing with a solution containing a high-molecular organic compound and an aqueous solution containing a starch-based high-molecular compound, the hard brittle material can be polished without causing deep damage.
[0012]
The surface plate of the present invention has a first surface plate serving as a base, and a second surface plate provided with a groove on one surface using a material softer than the base, A surface opposite to the one surface provided with the grooves of the second surface plate and the first surface plate are fixed.
[0013]
In the platen of the present invention, the first platen is preferably cast iron and the second platen is preferably tin.
[0014]
The hard brittle material of the present invention is obtained by polishing an arbitrary surface of the hard brittle material using the polishing liquid described above with the platen described above.
[0015]
The hard brittle material of the present invention is obtained by polishing the surface opposite to the arbitrary one surface using the polishing liquid described above with the platen described above, and simultaneously polishing the arbitrary one surface. .
[0016]
The method for producing a hard and brittle material of the present invention includes a lower platen having the surface having the groove of the surface plate described above mounted on the upper side and an upper surface plate having the surface having the groove of the surface plate described above mounted on the lower side. A step of sandwiching the lower platen and the upper platen while flowing the grinding liquid between the lower platen and the upper platen, and polishing the grinding liquid while flowing the grinding liquid. And step.
[0017]
The method for producing a hard and brittle material according to the present invention includes a step of sandwiching a carrier between the lower surface plate and the upper surface plate and polishing the carrier.
[0018]
BEST MODE FOR CARRYING OUT THE INVENTION
The present invention dissolves diamond particles in an aqueous solution in which a high-viscosity high-molecular organic solvent or a starch-based organic compound is dissolved, and promotes the separation of the diamond particles in the solution by applying ultrasonic vibration for a certain period of time, thereby increasing the degree of dispersion of the diamond particles. A solution is prepared which is uniform and has a slow settling of diamond particles, and the solution is used as an abrasive.
[0019]
Next, a double surface plate was prepared by attaching a tin surface plate to a cast iron surface plate, and the tin surface plate was cut into grooves in a mountain-cut shape, and the workpiece was placed between the double surface plates placed one above the other. The workpiece is polished while flowing an abrasive. The sharpening of the double surface plate is performed using a diamond electrodeposited surface plate having the same size as the double surface plate.
[0020]
<Example 1>
Embodiments of the present invention will be described with reference to the drawings. First, the step of preparing the abrasive of the present invention will be described. In the present invention, the abrasive is roughly classified into an oil-based abrasive and a water-soluble abrasive. FIG. 1 is a process chart for preparing an oil-based abrasive of the present invention, and FIG. 2 is a process chart for preparing a water-soluble abrasive.
[0021]
In FIG. 1, first, a high molecular organic compound, a viscosity modifier and diamond particles are prepared (Step 101 to Step 103). In this embodiment, 250 ml of liquid paraffin was prepared as the high molecular organic compound, and 500 ml of olive oil was prepared as the viscosity modifier. As the diamond particles, 100 carats of particles having a center diameter of a single crystal diamond of 2 to 4 microns were prepared. The diamond particles are dissolved in the prepared liquid paraffin (Step 104), and then the solution in which the diamond particles are dissolved is subjected to ultrasonic vibration stirring at room temperature using an ultrasonic transmitter (Step 105). In this embodiment, the time for applying ultrasonic vibration to the solution was set to one and a half hours. Next, olive oil is added to the solution to adjust the viscosity (step 106). Further, the solution whose viscosity has been adjusted is stirred by ultrasonic vibration (Step 107), and the split state of the diamond particles is confirmed (Step 108).
[0022]
<Example 2>
Next, a process for preparing a water-soluble abrasive will be described. In FIG. 2, first, a food-made organic compound is dissolved in water (step 111). 200 grams of powdered starch and 10 liters of water are prepared as a food organic compound. The powdered starch is put into a beaker, and the powdered starch is dissolved in water while gradually adding water (step 112). The food-made organic compound dissolved in water is brought to the boil by heating. Turn off the heat after waiting 5 minutes after boiling. Diamond particles are prepared (Step 113), and the diamond particles are dissolved in a surfactant (Step 114). As the diamond particles, 500 carats of particles having a center diameter of a single crystal diamond of 2 to 4 microns are prepared, and as the surfactant, an aqueous solution obtained by diluting 700 ml to 10 liters of water is prepared. The diamond particles are dissolved in the prepared aqueous surfactant solution (step 115), and the solution in which the diamond particles are dissolved is stirred at room temperature by applying ultrasonic vibration using an ultrasonic transmitter (step 116). At this time, the time for applying ultrasonic vibration to the solution was set to 3 hours. Next, the surfactant aqueous solution and the food-based organic compound aqueous solution are heated (step 117). The heating temperature was 70 degrees Celsius. The two heated aqueous solutions are mixed (step 118).
[0023]
<Example 3>
Next, a method for manufacturing, adjusting, and maintaining a polishing platen used for manufacturing a hard and brittle material according to the present invention will be described. FIG. 3 is a process chart showing a method for manufacturing a polishing platen used in the present invention.
[0024]
First, a commonly used cast iron platen 21 is prepared (step 201). Here, the cast iron platen 21 is prepared by shaping the cast iron platen 21 for a 9B type double-side polishing machine to a thickness of 15 mm and processing the platen flatness to 20 μm or less. Next, a tin surface plate 22 made of tin having the same shape as the cast iron surface plate 21 is prepared (step 202). The tin platen 22 used was prepared by dissolving pure tin, putting it into a mold, and solidifying the tin to a thickness of 15 mm. Next, the cast iron platen 21 and the tin platen 22 are bonded together using an adhesive 24 (step 203). FIG. 4 shows a state where the cast iron platen 21 and the tin platen 22 are bonded together. Next, the fall prevention device 23 is attached so as to straddle the upper and lower surfaces of the bonded platen (step 204). The fall prevention device 23 has a mounting hole 23a for fixing the upper surface plate and a bent portion 23b for fixing the lower surface plate, and the entire shape is L-shaped. The bent portion 23b is inserted into the mounting groove 21a of the cast iron platen 21, the mounting hole 23a and the mounting hole 22a of the tin platen 22 are aligned, and fixed with screws. Note that the fall prevention device 23 may be fixed to the tin platen 22 using screws instead of being fixed to the cast iron platen 21 at the bent portion 23b.
[0025]
The cast iron side of the bonded platen is held by a large lathe 53, and the tin surface of the attached tin platen 22 is precisely cut out (step 205). In this embodiment, the parallelism is cut to within 20 microns. Next, the cutting tool 51 is held by a diamond, and the spiral groove 52 is dug in a mountain-like shape on the surface of the tin platen 22 (step 206). FIG. 5 is a schematic view of cutting a spiral groove 52 on the surface of the tin platen 22. In this embodiment, the depth of the groove is 0.6 mm ± 0.1 mm, and the pitch of the groove is 0.9 mm ± 0.1 mm. FIG. 6 shows a state after the groove processing. Another platen shown in FIG. 6 is created. The hard and brittle material is polished by using the two surface plates as one set. Similarly, another surface plate shown in FIG. 7 is created, and one upper and lower surface is set as one set. Further, for the upper platen, a through-hole for flowing an abrasive into the tin platen is dug from the cast iron side to the tin side (step 207), and a copper tube is embedded in the through-hole on the cast iron side (step 208). .
[0026]
FIG. 8 shows a completed view of the polishing platen used in the present invention. Next, the upper and lower platens are attached to a double-side polishing machine (step 209). The above-mentioned abrasive is caused to flow along the injection groove. (Step 210), the upper and lower platens are rotated together in different directions to perform "co-grinding" (Step 211). Burrs and projections remaining on the surface of the tin plate are flattened by the co-sliding, so that large scratches and edge chipping on the processed surface of the workpiece caused by the burrs and projections can be prevented. In addition, since the entire upper surface of the tin platen 22 is flattened by the co-grinding, the flatness of the upper surface is increased, which has an effect of increasing the flatness of the workpiece. Therefore, the sliding is preferably performed for about 5 minutes. FIG. 8 is a state diagram showing a state in which the upper and lower platens are rubbed together. The surface of the lower stool 72 having the spiral grooves 52 faces the surface of the upper stool 71 having the spiral grooves 51. One end of an abrasive injection pipe 73 of the upper stool 71 is connected to an abrasive well 120 for flowing an abrasive, and the abrasive flows from the abrasive well 120 through the abrasive injection pipe 73. The upper stool 71 is fitted with a stool vertical shaft 90. When the shaft is moved up and down, the upper stool 71 moves up and down in conjunction therewith.
[0027]
Then, foreign substances on the surface of the tin platen 22 are wiped off (step 212), and this operation ends.
[0028]
<Example 4>
Next, FIG. 9 shows a step of polishing the hard brittle material of the present invention. The case where sapphire crystal is used as the hard and brittle material will be described. The shape of the sapphire crystal used in the workpiece used in the present invention is a rectangular shape, and a sapphire plate 31 having each surface chamfered and polished by rough polishing is used. In this embodiment, a sapphire plate having a diameter of 50.8 mm and a thickness of 0.5 mm having an orientation flat (orientation flat) of 16 mm was processed using a double-sided simultaneous polishing machine and a GC abrasive.
[0029]
First, the abrasive 32 described above is evenly applied to the lower stool 72 (step 301). The carriers are arranged on the lower platen 72 coated with the abrasive 32 (Step 302), and a workpiece is put into the hole 101 of the carrier 100 (Step 303). FIG. 10 shows the carrier 100. The carrier 100 has a disc-like shape and a hole in the center. In addition, there are six holes 101 between the center and the outer periphery for receiving a workpiece. The six holes 101 are arranged such that respective lines connecting the center and the center of the carrier 100 are equiangular from the center of the carrier 100. The number of holes can be determined based on the size of the workpiece, the outer shape of the carrier 100, and the like.
[0030]
The abrasive 32 is applied to the upper surface of the workpiece placed in the hole 101 of the carrier 100 (step 304). At this time, if the abrasive 32 is applied by being contained in a sponge or the like, the abrasive easily adheres to the upper surface of the workpiece, which is effective. In this embodiment, in order to ensure the setting (setting) of the workpiece, the lower platen 72 was rotated once to confirm the setting state of the workpiece. The upper platen 71 is gently lowered, and is lowered until the upper platen 71 is put on the sapphire plate 31 (step 305). In the present embodiment it was used with vacuum set the double-side polishing machine, if the vacuum setting 9B type 1.8 kg / cm 2, in the case of a Type 4B was set to 1.3 kg / cm 2.
[0031]
Next, an abrasive is poured from the abrasive inlet (step 306), and the upper and lower platens 71 and 72 are slowly rotated (step 307). When the upper and lower platens 71 and 72 start rotating, the abrasive 32 is stopped (step 308), and the rotation of the platens 71 and 72 is accelerated (step 309). In this embodiment, the speed was set to 400 RPM. The abrasive 32 is poured at regular intervals from the abrasive inlet (step 310). The abrasive is supplied by a drip method. In the present embodiment, the drip is performed at a rate of one drop per rotation in the case of the 9B type and once every 1.5 seconds in the case of the 4B type. The processing time varies depending on the desired surface roughness and polishing amount, but the polishing rate was 0.06 μm / sec / mm 2 for the processed object on the A-side [11-20] of sapphire. In this embodiment, polishing was performed on one side at 15 μm. When processing is completed (step 311), reverse pressure is applied to the upper stool 71 to release the close contact between the lower stool 71 and the workpiece 31, and then slowly lifted up. Further, the sapphire plate 31 is collected (Step 312). FIG. 11 is a state diagram showing polishing of a workpiece. When the grinding fluid is injected into the polishing inlet 100, the grinding fluid is supplied to the abrasive tube 73 along the abrasive well 120. Then, the polishing liquid reaches the upper surface of the lower stool 72.
[0032]
Since the abrasive 32 has a high viscosity, it absorbs impurities and becomes even more viscous. Therefore, foreign substances accumulated in the spiral grooves (V grooves) 52 on the surface plates 71 and 72 are wiped off with a cloth (step 313). In the present embodiment, the wiping of the abrasive 32 was performed once for each processing. When the surface roughness of the sapphire plate after processing was measured, a value of 1.73 Å in average roughness Ra was obtained. Thickness variation was obtained at a maximum of 2 microns in the measurement at the center and at the four peripheral points, and similarly, within 2 microns in flatness.
[0033]
<Example 5>
Next, a method for producing a hard and brittle material of the present invention will be described. FIG. 12 is a process chart showing a method for manufacturing a hard and brittle material. The product manufactured in the polishing process was a sapphire plate for a liquid crystal projector.
[0034]
In this embodiment, the entire process of mirror-finishing a sapphire plate for a liquid crystal projector will be described. First, a sapphire ingot 41 is prepared (Step 401), and the direction of the C axis is measured using an X-ray crystal orientation measuring device (Step 402). The sapphire ingot 31 is preferably a rod-shaped ingot made by, for example, the Czochralski method or the Bernoulli method. In the crystal orientation measurement method using X-rays, the [0001] plane, commonly called the C plane, is measured, and the direction of the C plane is marked. Next, the sapphire ingot is attached to the fixing metal plate 32 (step 403), and a reference surface is formed on the sapphire ingot marked in the C plane according to the mark in the C plane (step 404). The adhesive used for fixing the sapphire ingot is preferably an adhesive having strong adhesiveness and high durability at high temperatures. In this embodiment, a rack was used as the adhesive. It is preferable to use a surface grinder as the machine equipment for creating the reference surface. In this embodiment, a cutting machine equipped with a diamond wheel having a large flat portion is used for the surface grinder.
[0035]
Next, the remaining three surfaces of the bonded sapphire ingot are processed so that the cross-section of the sapphire ingot is slightly larger than the designated size so that the mutual surfaces are at 90 degrees to each other (step 405). . In the present embodiment, the processing equipment used in step 405 is the same as the equipment used for creating the reference plane, and has a dimension that is larger by 1 mm in each direction than the external dimensions of the processing finish. Next, the sapphire ingot 41 whose four surfaces have been processed is cut to a specified thickness (step 406). In this embodiment, a multi-wire saw was used for cutting. The space between the wires was set to a value obtained by adding the cutting allowance and the polishing allowance to the final thickness of the processed product. Several sapphire plates 43 which have been cut are collected and fixed, and processed to the final outer dimensions of the processed product (step 407). The processing equipment to be used is preferably a rotary grinder. In this embodiment, a rotary grinder equipped with a diamond wheel was used to drive the outer dimensions. Next, the slope is chamfered (step 408), and then rough polishing is performed using a double-sided grinding machine (step 409). In this embodiment, the cut amount in the rough polishing was 25 μm on one side.
[0036]
Next, the polishing method of the present invention is performed as intermediate polishing (Step 410). After the completion of the intermediate polishing, the cleaning agent is sufficiently removed with an organic solvent, for example, hexane (step 411). This is because washing is preferably performed in two steps using an organic solvent in order to avoid bringing a diamond into the next chemical polishing step. Next, chemical polishing is performed using a double-side polishing machine (step 412). The abrasive used in the chemical polishing is preferably colloidal silica. In this example, a colloidal silica abrasive having a central particle diameter of 100 nm was used. When the workpiece has a mirror surface, it is washed with a detergent containing a surfactant as a main component and rinsed with water (step 413). The workpiece is dried (step 414), and an appearance inspection and a dimensional inspection are performed (step 420).
[0037]
【The invention's effect】
By applying ultrasonic vibration to the grinding fluid of the present invention, the solution containing the high molecular organic compound and the abrasive can be easily stirred.
[0038]
The grinding fluid of the present invention can be easily stirred by boiling an aqueous solution containing a starch-based polymer compound.
[0039]
The grinding fluid of the present invention can shorten the polishing time by using diamond. Also, by mixing with a solution containing diamond and a polymer organic compound or an aqueous solution containing a starch-based polymer compound, the hard brittle material can be polished without causing deep damage.
[0040]
The surface plate of the present invention uses a grinding fluid containing diamond by using a material that is softer than the first surface plate on which the second surface plate is to be a base, and by providing a groove on any one surface. Even so, the grinding fluid can flow into the grinding surface of the hard and brittle material.
[0041]
Further, the surface plate of the present invention uses cast iron for the first surface plate and tin for the second surface plate, respectively, so that even when a grinding fluid containing diamond is used, the ground surface of the hard and brittle material is used. The grinding fluid can be caused to flow into the nozzle.
[0042]
The hard brittle material of the present invention uses a polishing liquid containing diamond to reduce the polishing time of the hard brittle material by polishing the second surface plate with a surface plate softer than the second surface plate. Therefore, the manufacturing time of the hard and brittle material can be shortened.
[0043]
The present invention can reduce the processing time by simultaneously polishing the opposing surfaces of the hard and brittle materials.
[0044]
In the method for producing a hard brittle material of the present invention, the grinding fluid is introduced while being sandwiched between the lower surface plate and the upper surface plate, so that the hard brittle material can be polished without being fixed to both surface plates. The polishing time can be reduced by eliminating the time required for the material to adhere to and peel off from both platens.
[0045]
The method for producing a hard brittle material of the present invention can stably polish a hard brittle material by sandwiching a carrier between a lower surface plate and an upper surface plate and polishing the same. Can be manufactured.
[Brief description of the drawings]
FIG. 1 is a process chart showing a process of preparing an oily abrasive.
FIG. 2 is a process chart showing a process of preparing a water-soluble abrasive.
FIG. 3 is a process chart showing a method for manufacturing a polishing platen.
FIG. 4 is a state diagram showing a state in which a cast iron platen and a tin platen are bonded together.
FIG. 5 is a schematic diagram in which spiral grooves are provided on the surface of a tin platen.
FIG. 6 is a schematic view showing a completed drawing of a polishing platen.
FIG. 7 is a state diagram showing a state in which an abrasive introduction pipe is attached to an upper surface plate.
FIG. 8 is a state diagram showing a state in which the upper and lower lapping plates are rubbed together.
FIG. 9 is a process chart for polishing a hard and brittle material.
FIG. 10 is a perspective view of a carrier.
FIG. 11 is a state diagram showing a state when polishing a brittle material.
FIG. 12 is a process chart showing a method for producing a hard and brittle material.
FIG. 13 shows a state of polishing the surface by conventional polishing. More specifically, (a) shows the surface state after the rough polishing, and (b) shows the surface state during the chemical polishing.
[Explanation of symbols]
21 Cast iron platen 22 Tin platen 23 Fall prevention plate 71 Upper platen 72 Lower platen 100 Carrier

Claims (9)

高分子有機化合物を含んだ溶液と、
前記溶液に加える研磨剤と、を有し、
超音波振動を与えて前記研磨剤を前記溶液に対して撹拌した研磨液。
A solution containing a high molecular organic compound;
An abrasive to be added to the solution,
A polishing liquid in which the polishing agent is stirred with respect to the solution by applying ultrasonic vibration.
前記溶液は、澱粉系の高分子化合物を含んだ水溶液であり、前記溶液を沸騰させた請求項1記載の研磨液。The polishing liquid according to claim 1, wherein the solution is an aqueous solution containing a starch-based polymer compound, and the solution is boiled. 前記研磨剤がダイアモンド粒子である請求項1又は2記載の研磨液。3. The polishing liquid according to claim 1, wherein the polishing agent is diamond particles. 基台となる第一の定盤と、
前記基台よりも柔らかい材質を用い、いずれかの一面に溝を設けた第二の定盤と、
を有し、
前記第二の定盤の前記溝を設けた前記一面と対抗する面と前記第一の定盤とを固定した定盤。
The first base plate that serves as a base,
Using a material softer than the base, a second surface plate provided with a groove on one surface,
Has,
A surface plate in which a surface of the second surface plate that opposes the one surface provided with the grooves is fixed to the first surface plate.
前記第一の定盤は鋳鉄であり、前記第二の定盤は錫である請求項4記載の定盤。The platen according to claim 4, wherein the first platen is cast iron and the second platen is tin. 任意の一面を請求項1乃至3のいずれかに記載の研磨液を使用して、
請求項4又は5に記載の定盤で研磨した硬脆材。
Any one side using the polishing liquid according to any one of claims 1 to 3,
A hard brittle material polished by the surface plate according to claim 4.
前記任意の一面と対抗する面を請求項1乃至3のいずれかに記載の研磨液を使用して、
請求項4又は5に記載の定盤で研磨すると共に、
前記任意の一面と同時に研磨した硬脆材。
Using the polishing liquid according to any one of claims 1 to 3, a surface opposing the arbitrary surface,
Polishing with the surface plate according to claim 4 or 5,
A hard brittle material polished simultaneously with any one of the above surfaces.
請求項4又は5記載の定盤の溝を有する面を上側に取り付けた下定盤と、請求項4又は5記載の定盤の溝を有する面を下側に取り付けた上定盤とで挟み込むステップと、
前記下定盤と前記上定盤間に請求項1乃至3のいずれかに記載の研削液を流入させるステップと、
前記研削液を流入させながら前記下定盤と前記上定盤を回転して研磨するステップと、
を有する硬脆材の製造方法。
A step of sandwiching between a lower surface plate having the surface of the surface plate having the groove according to claim 4 or 5 mounted on the upper side and an upper surface plate having the surface having the groove of the surface plate of claim 4 or 5 mounted on the lower side. When,
Flowing the grinding fluid according to any one of claims 1 to 3 between the lower surface plate and the upper surface plate;
Rotating the lower surface plate and the upper surface plate while pouring the grinding fluid, and polishing,
A method for producing a hard and brittle material having:
前記下定盤と前記上定盤の間にキャリアを挟み込んで研磨するステップを有する請求項8記載の硬脆材の製造方法。The method for producing a hard and brittle material according to claim 8, further comprising a step of sandwiching and polishing a carrier between the lower surface plate and the upper surface plate.
JP2002212396A 2002-07-22 2002-07-22 Polishing liquid, surface plate, hard and brittle material, and method for manufacturing the same Pending JP2004055884A (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011098396A (en) * 2009-11-04 2011-05-19 Showa Denko Kk Lapping surface plate and lapping method
JP2017518197A (en) * 2014-06-18 2017-07-06 藍思科技股▲ふん▼有限公司 Copper disk for sapphire polishing and repair method for two copper disks
CN114276165A (en) * 2021-12-24 2022-04-05 中国人民解放军陆军装甲兵学院 Method for reducing surface brittleness of hard and brittle material

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011098396A (en) * 2009-11-04 2011-05-19 Showa Denko Kk Lapping surface plate and lapping method
JP2017518197A (en) * 2014-06-18 2017-07-06 藍思科技股▲ふん▼有限公司 Copper disk for sapphire polishing and repair method for two copper disks
CN114276165A (en) * 2021-12-24 2022-04-05 中国人民解放军陆军装甲兵学院 Method for reducing surface brittleness of hard and brittle material
CN114276165B (en) * 2021-12-24 2022-10-21 中国人民解放军陆军装甲兵学院 Method for reducing surface brittleness of hard and brittle material

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