JP2001260024A - Washing device for dresser device - Google Patents
Washing device for dresser deviceInfo
- Publication number
- JP2001260024A JP2001260024A JP2000067799A JP2000067799A JP2001260024A JP 2001260024 A JP2001260024 A JP 2001260024A JP 2000067799 A JP2000067799 A JP 2000067799A JP 2000067799 A JP2000067799 A JP 2000067799A JP 2001260024 A JP2001260024 A JP 2001260024A
- Authority
- JP
- Japan
- Prior art keywords
- cleaning liquid
- cleaning
- polishing
- dresser
- wiping
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005406 washing Methods 0.000 title claims abstract description 17
- 239000007788 liquid Substances 0.000 claims abstract description 153
- 238000005498 polishing Methods 0.000 claims abstract description 131
- 230000007246 mechanism Effects 0.000 claims abstract description 71
- 238000004140 cleaning Methods 0.000 claims description 209
- 239000000126 substance Substances 0.000 claims description 71
- 238000003860 storage Methods 0.000 claims description 19
- 230000001172 regenerating effect Effects 0.000 claims description 10
- 230000002093 peripheral effect Effects 0.000 claims description 9
- 230000000717 retained effect Effects 0.000 claims description 4
- 239000000356 contaminant Substances 0.000 claims description 3
- 239000012466 permeate Substances 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 23
- 210000004209 hair Anatomy 0.000 description 14
- 239000000463 material Substances 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 239000003082 abrasive agent Substances 0.000 description 6
- 230000033001 locomotion Effects 0.000 description 5
- 230000008929 regeneration Effects 0.000 description 5
- 238000011069 regeneration method Methods 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 239000004065 semiconductor Substances 0.000 description 4
- 229920003002 synthetic resin Polymers 0.000 description 4
- 239000000057 synthetic resin Substances 0.000 description 4
- 239000002002 slurry Substances 0.000 description 3
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000003513 alkali Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000006260 foam Substances 0.000 description 2
- 238000012856 packing Methods 0.000 description 2
- 238000004506 ultrasonic cleaning Methods 0.000 description 2
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 1
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 210000003793 centrosome Anatomy 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 238000007517 polishing process Methods 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229940072033 potash Drugs 0.000 description 1
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Substances [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 1
- 235000015320 potassium carbonate Nutrition 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 239000011669 selenium Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000005507 spraying Methods 0.000 description 1
- 230000007723 transport mechanism Effects 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Landscapes
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、例えば半導体ウェ
ーハ等を研磨するChemical Mechanical Polishing
(CMP)装置に用いられるドレッサー装置用洗浄装置
に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to chemical mechanical polishing for polishing, for example, semiconductor wafers and the like.
The present invention relates to a dressing device cleaning device used in a (CMP) device.
【0002】[0002]
【従来の技術】半導体デバイスが形成される例えばシリ
コンインゴットから切り出した半導体ウェーハ(以下、
単にウェーハという)は、その表面がデバイスの微細化
に伴って高精度かつ無欠陥表面となるように鏡面研磨さ
れる必要がある。このような精密な研磨精度が要求され
るウェーハの表面を化学的かつ機械的に研磨する方法と
して、化学的機械的研磨法(CMP法)と呼ばれる方法
が知られている。2. Description of the Related Art A semiconductor wafer (hereinafter, referred to as a semiconductor wafer) cut from, for example, a silicon ingot on which semiconductor devices are formed.
The wafer is simply required to be mirror-polished so that its surface becomes a highly accurate and defect-free surface with miniaturization of devices. As a method for chemically and mechanically polishing the surface of a wafer that requires such precise polishing accuracy, a method called a chemical mechanical polishing method (CMP method) is known.
【0003】CMP法とは、例えばシリカを用いたアル
カリ性スラリーや、セレンを用いた中性スラリー、ある
いはアルミナを用いた酸性スラリー等(以下、これらを
総称して砥粒材と呼ぶ)を用いて化学的・機械的にウェ
ーハ表面を研磨し、平坦化する方法である。そして、C
MP法を用いてウェーハの表面を研磨する装置として
は、例えば図9に一例として示されるものがある。 [0003] The CMP method is, for example, an algorithm using silica.
There are potash slurry and neutral slurry using selenium.
Or acidic slurry using alumina, etc.
Chemically and mechanically by using abrasive materials)
This is a method of polishing and flattening the wafer surface. And C
As a device for polishing the surface of a wafer using the MP method
For example, there is one shown in FIG. 9 as an example.
【0004】このCMP装置1は、中心軸2に取り付け
られた円板状の回転テーブル3上に例えば硬質ウレタン
からなる研磨用の研磨パッド4が設けられ、この研磨パ
ッド4に対向して、かつ研磨パッド4の中心軸2から偏
心した位置にウェーハキャリア5が配設されている。こ
のウェーハキャリア5は、研磨パッド4よりも小径の自
転可能な円盤形状とされてウェーハ6を保持するもので
あり、ウェーハ6を研磨パッド4に当接させる上下方向
の移動機構が備えられている。In this CMP apparatus 1, a polishing pad 4 made of, for example, hard urethane is provided on a disk-shaped rotary table 3 attached to a center shaft 2, and is opposed to the polishing pad 4; A wafer carrier 5 is disposed at a position eccentric from the center axis 2 of the polishing pad 4. The wafer carrier 5 has a disk shape smaller in diameter than the polishing pad 4 and is capable of rotating, and holds the wafer 6. The wafer carrier 5 is provided with a vertical movement mechanism for bringing the wafer 6 into contact with the polishing pad 4. .
【0005】研磨の時には、ウェーハキャリア5がウェ
ーハ6を回転させながら研磨パッド4に当接させ、同時
に研磨パッド4が中心軸2を中心として回転することで
双方が当接面において摺動する。そして、上述した砥粒
材Sが研磨パッド4上に供給されると、双方の摺動によ
って砥粒材Sがウェーハ6と研磨パッド4の間に流動す
ると、ウェーハ6の表面が研磨され、平坦化される。At the time of polishing, the wafer carrier 5 contacts the polishing pad 4 while rotating the wafer 6, and at the same time, the polishing pad 4 rotates about the central axis 2 so that both slide on the contact surface. Then, when the above-mentioned abrasive material S is supplied onto the polishing pad 4, when the abrasive material S flows between the wafer 6 and the polishing pad 4 due to both slidings, the surface of the wafer 6 is polished and flattened. Be transformed into
【0006】研磨パッド4は、例えば硬質ウレタン等か
ら成っており、表面上には砥粒材Sを保持する微細な発
泡層が多数設けられている。ウェーハ6と研磨パッド4
の間に流動した砥粒材Sは、これらの発泡層内にも保持
され、研磨の時に供給される。ところが、ウェーハ6の
研磨を繰り返すことで、この発泡層が、ウェーハ6を研
磨することによって目詰まりや目つぶれを起こすと、ウ
ェーハ6の研磨効率が低下する。The polishing pad 4 is made of, for example, hard urethane, and has a large number of fine foam layers for holding the abrasive S on its surface. Wafer 6 and polishing pad 4
The abrasive material S flowing during this time is also held in these foamed layers, and is supplied at the time of polishing. However, if the polishing of the wafer 6 is repeated, and this foamed layer causes clogging or blinding by polishing the wafer 6, the polishing efficiency of the wafer 6 decreases.
【0007】そのため、従来からCMP装置1には、例
えば、図9に一例として示されるようなドレッサー装置
7が設けられ、ドレッシングと呼ばれる操作により研磨
パッド4の表面が切削研磨され、再び多孔質な発泡層が
表面に露出する。For this reason, a conventional CMP apparatus 1 is provided with, for example, a dresser device 7 as shown in FIG. 9 as an example, and the surface of the polishing pad 4 is cut and polished by an operation called dressing, and the porous material is formed again. The foam layer is exposed on the surface.
【0008】このドレッサー装置7は、円板状で一端面
に研削作用部(図9では図示せず)が形成された研磨体
8と、研磨体8を中心軸まわりに回転させる回転駆動機
構(図示せず)と、研磨体8を保持するアーム9とを備
え、さらに、研磨体8を研磨パッド4上に搬入して研削
作用部表面で研磨パッド4に当接させ、かつ研磨体8を
研磨パッド4に押し当てた状態で研磨パッド4に対して
平行移動させる移動機構10とを備えている。The dresser device 7 includes a polishing body 8 having a disk-like shape and a grinding action portion (not shown in FIG. 9) formed on one end surface, and a rotation driving mechanism (rotation driving mechanism for rotating the polishing body 8 about a central axis). (Not shown) and an arm 9 for holding the polishing body 8. Further, the polishing body 8 is carried on the polishing pad 4 and is brought into contact with the polishing pad 4 on the surface of the grinding action portion. A moving mechanism 10 is provided that moves the polishing pad 4 in parallel with the polishing pad 4 while being pressed against the polishing pad 4.
【0009】ここで、移動機構10は、例えばアーム9
をX軸まわりに回動させるX軸回転駆動機構11と、Y
軸まわりに回動させるY軸回転駆動機構12とを備えて
いる。また、移動機構10には、図示しないが、研磨体
8を研削作用部表面で研磨パッド4に押し当てる際、研
磨パッド4に対して研磨体8が平行となるよう研磨体8
のアーム9に対する傾きの角度を調整する機構が設けら
れている。Here, the moving mechanism 10 includes, for example, the arm 9
An X-axis rotation drive mechanism 11 for rotating the X-axis around the X-axis;
And a Y-axis rotation drive mechanism 12 that rotates around an axis. Further, although not shown, when the polishing body 8 is pressed against the polishing pad 4 on the surface of the grinding section, the polishing body 8 is moved to the moving mechanism 10 so that the polishing body 8 is parallel to the polishing pad 4.
A mechanism is provided for adjusting the angle of inclination of the arm 9 with respect to the arm 9.
【0010】図9に一例として示されるドレッサー装置
7において、研磨パッド4のドレッシング時には、まず
研磨体8の研削作用部表面が、移動機構10によって研
磨パッド4の表面に押し当てられる。そして、中心軸ま
わりで回転している研磨体8が、X軸回転駆動機構11
により回転している研磨パッド4上において往復揺動さ
れる。こうして、研磨体8の研削作用部が、研磨パッド
4の表面を切削研磨して目詰まりや目つぶれのない多孔
質の発泡層を再び表面に露出させる。In the dresser device 7 shown as an example in FIG. 9, when the polishing pad 4 is dressed, first, the surface of the grinding portion of the polishing body 8 is pressed against the surface of the polishing pad 4 by the moving mechanism 10. Then, the polishing body 8 rotating around the central axis is rotated by the X-axis rotation driving mechanism 11.
Oscillates reciprocally on the rotating polishing pad 4. Thus, the grinding section of the polishing body 8 cuts and polishes the surface of the polishing pad 4 to expose the porous foamed layer without clogging or blinding to the surface again.
【0011】[0011]
【発明が解決しようとする課題】ところで、上述したよ
うなドレッサー装置においては、研磨体の主に研削作用
部表面に、研磨パッドの切削屑やウェーハの研磨屑及び
変質した砥粒材等の物質が付着する。このような付着物
が研削作用部表面で固化あるいはゲル化して変質する
と、次に研磨パッドをドレッシングする時、変質した付
着物が研磨パッド上に剥落残留し、続くウェーハ研磨の
際に、この剥落片によってウェーハ表面にスクラッチ等
の傷を与える問題が存在していた。また、研削作用部表
面を洗浄液の中に浸しても、付着物が研削作用部表面で
粘着性を有して除去されず、同様の問題を引き起こして
いた。 By the way, as described above,
In a dresser device like this, the grinding action mainly
On the surface of the part, the cutting debris of the polishing pad and the polishing debris of the wafer
A substance such as a modified abrasive material adheres. Such deposits
Is solidified or gelled on the surface of the grinding section and deteriorates
The next time you dress the polishing pad,
The kimono is left on the polishing pad and remains for polishing the wafer.
When this occurs, scratches and the like on the wafer surface
There was a problem of scratching. Also, the grinding action part table
Even if the surface is immersed in the cleaning solution, the deposits
Not removed with stickiness, causing similar problems
Was.
【0012】本発明は、上記の事情に鑑みてなされたも
のであって、研磨体から付着物を効果的に除去できるド
レッサー装置用洗浄装置を提供することを目的とする。The present invention has been made in view of the above circumstances, and an object of the present invention is to provide a dressing device cleaning apparatus capable of effectively removing deposits from a polishing body.
【0013】[0013]
【課題を解決するための手段】請求項1に記載の発明
は、研削作用部を有する略円板形状の研磨体と、該研磨
体を回転させる回転駆動機構と、前記研削作用部が研磨
パッドに当接するよう前記研磨体を前記研磨パッド上に
搬入及び搬出する移動機構とを有し、前記研磨体と前記
研磨パッドとを相対的に移動させて前記研磨パッドを研
磨するドレッサー装置の洗浄装置であって、前記研磨体
の移動領域に設置され、前記研磨体の付着物を除去する
除去手段を備え、該除去手段は、前記研磨体に当接自在
に設置され前記研磨体の付着物を払拭する付着物払拭体
と、前記付着物払拭体が前記研磨体に当接した時に該当
接した部分に洗浄液を供給する洗浄液供給機構とを備え
てなることを特徴とする。 Means for Solving the Problems The invention according to claim 1
Is a substantially disk-shaped abrasive body having a grinding action portion,
A rotation drive mechanism for rotating the body, and the grinding action portion is polished
Place the polishing body on the polishing pad so that it comes into contact with the pad
Having a moving mechanism for carrying in and out, wherein the polishing body and the
The polishing pad is moved by relatively moving the polishing pad.
A cleaning device for a dresser device for polishing, wherein the polishing body
Installed in the moving area of the polishing body to remove the deposits on the polishing body
Removing means, which is free to abut on the abrasive body
An adhering substance wiping body installed on the surface for wiping off the adhering substance of the abrasive body
And when the adhering substance wiping body contacts the abrasive body.
A cleaning liquid supply mechanism for supplying the cleaning liquid to the contacted part.
It is characterized by becoming.
【0014】このような構成としたことにより、研磨パ
ッド上より搬出された研磨体の少なくとも一部の研削作
用部表面ならびにその近辺とが、研磨体の移動機構によ
って付着物払拭体に当接され、例えば、研磨体が回転さ
れ、研削作用部表面が付着物払拭体上で摺動し、付着物
が研磨体から機械的に取り去られ、払拭される。そし
て、研磨体と付着物払拭体が当接する部分には、洗浄液
供給機構から供給される洗浄液が存在しており、付着物
は、洗浄液の中に拡散し、洗浄液が流れることにより、
洗浄液に含まれたまま前記当接する部分より離散する。
このようにして、研磨体から付着物が除去される。 With this configuration, the polishing
Grinding at least a part of the abrasive body carried out from the pad
The surface of the part and its vicinity are
Contacting the adhering substance wiping body, for example,
The surface of the grinding section slides on the adhering substance wiping body,
Is mechanically removed from the abrasive body and wiped. Soshi
Cleaning fluid is applied to the area where the abrasive body and
The cleaning liquid supplied from the supply mechanism is present,
Is diffused into the cleaning solution and the cleaning solution flows,
It is separated from the abutting portion while being contained in the cleaning liquid.
In this way, the deposit is removed from the polishing body.
【0015】請求項2に記載の発明は、請求項1記載の
ドレッサー装置用洗浄装置であって、前記付着物払拭体
が前記研磨体に当接した時に、前記付着物払拭体が前記
研削作用部表面で摺接運動するよう前記付着物払拭体を
駆動する払拭体駆動機構を備えてなることを特徴とす
る。 [0015] The invention according to claim 2 provides the invention according to claim 1.
What is claimed is: 1. A cleaning device for a dresser device, comprising:
Is in contact with the abrasive body, the adhering substance wiping body is
The adhering substance wiping body is moved so as to slide on the grinding action surface.
And a wiping body drive mechanism for driving.
You.
【0016】このような構成としたことにより、研磨体
の研削作用部表面ならびにその近辺が、研磨体の移動機
構によって付着物払拭体に当接される時、付着物払拭体
が研削作用部表面で摺接するよう駆動され、付着物が研
磨体から機械的に取り去られ、払拭される。すなわち、
研削作用部表面ならびにその近辺の少なくとも周方向の
一部を付着物払拭体に当接させた状態で、付着物払拭体
を研削作用部表面全体に摺接するよう駆動するか、ある
いは、研磨体を中心軸まわりに回転すると共に付着物払
拭体を駆動すると、付着物が研磨体から効率よく払拭さ
れる。 With such a structure, the polishing body
Grinding machine surface and its vicinity is a polishing body
When the abutment is brought into contact with the adhering substance wiping body,
Is driven to slide on the grinding action surface,
It is mechanically removed from the body and wiped. That is,
In the state where at least a part of the grinding action part surface and its vicinity in the circumferential direction are in contact with the attached matter wiping body, the attached matter wiping body is driven so as to slide on the entire grinding action part surface, or the abrasive body is By rotating around the central axis and driving the attached matter wiping body, the attached matter is efficiently wiped from the abrasive body.
【0017】請求項3に記載の発明は、請求項2記載の
ドレッサー装置用洗浄装置であって、前記払拭体駆動機
構は、前記付着物払拭体を支持する軸体と、この軸体を
回転駆動する駆動装置とを備えてなることを特徴とす
る。 [0017] The invention according to claim 3 provides the invention according to claim 2.
A cleaning device for a dresser device, wherein the wiping body driving machine
The structure includes a shaft that supports the attached matter wiping body, and a shaft that supports the body.
And a driving device for rotationally driving.
You.
【0018】このような構成としたことにより、研削作
用部表面及びその近辺が軸体により支持された付着物払
拭体上において当接され、この状態で軸体を駆動装置に
よって回転させることで、軸体に支持された付着物払拭
体が研磨体と当接する部分において回転駆動の中心から
の距離に比例する速度で駆動され、付着物払拭体が研削
作用部に対して連続的に摺接される。このようにして、
付着物払拭体が研削作用部表面で摺接運動し、付着物が
研磨体から効率よく払拭される。 With this configuration, the grinding work
Adhesion removal with the surface of the part and its vicinity supported by the shaft
Abuts on the wipe, and in this state the shaft is
Therefore, by rotating, wiping off the adhered matter supported by the shaft
From the center of rotation drive at the part where the body contacts the abrasive body
Is driven at a speed proportional to the distance of
It is slid continuously against the action part. In this way,
The adhering substance wiping body makes sliding movement on the surface of the grinding action section,
It is effectively wiped off from the abrasive body.
【0019】請求項4に記載の発明は、請求項3記載の
ドレッサー装置用洗浄装置であって、前記付着物払拭体
は、前記洗浄液が浸透し保持される部材より形成され、
前記洗浄液供給機構は、洗浄液貯留槽と、該洗浄液貯留
槽内に、少なくとも前記付着物払拭体の一部が浸漬する
ように貯留された前記洗浄液とを備えてなることを特徴
とする。 The invention according to claim 4 is the invention according to claim 3.
What is claimed is: 1. A cleaning device for a dresser device, comprising:
Is formed of a member in which the cleaning liquid is permeated and held,
The cleaning liquid supply mechanism includes a cleaning liquid storage tank and the cleaning liquid storage tank.
At least a part of the adhered substance wiping body is immersed in the tank.
And the washing liquid stored as described above.
And
【0020】このような構成としたことにより、付着物
払拭体の一部が洗浄液中に浸漬され、洗浄液が付着物払
拭体に浸透して保持され、この洗浄液の保持された付着
物払拭体の部分が払拭体駆動機構によって研磨体に当接
するよう駆動されて研磨体との当接部分に洗浄液が供給
される。このような付着物払拭体としては、例えばブラ
シ様の毛状体、あるいはスポンジ様の海綿状の部材とい
ったものを用いることができる。また、付着物払拭体上
の付着物を払拭する箇所が、付着物の払拭の後、軸体の
回転運動により迅速に研磨体から離れ、研磨体への付着
物の再付着を防止し、付着物が効率よく洗浄液の中へ拡
散される。このように、研磨体から付着物が効果的に除
去される。 [0020] By adopting such a structure, the attached matter
Part of the wiping body is immersed in the cleaning liquid, and the cleaning liquid
The cleaning liquid penetrates and is retained, and the retained adhesion of the cleaning liquid
The wiping body part contacts the abrasive body by the wiping body drive mechanism.
Cleaning liquid is supplied to the contact area with the polishing body
Is done. Examples of such an adhering substance wiping body include a bra
A hair-like body or sponge-like spongy material
Can be used. Also, on the wiping body
After wiping off the adhering material,
Quickly separates from polishing body by rotating motion and adheres to polishing body
Prevents reattachment of substances and spreads them efficiently into the cleaning solution.
Be scattered. Thus, the adhered substance is effectively removed from the abrasive body.
Left.
【0021】請求項5に記載の発明は、請求項3記載の
ドレッサー装置用洗浄装置であって、前記軸体は、その
内部に中空部を有すると共に該中空部から外周面外方に
連通する複数の孔を備えてなり、前記付着物払拭体は、
前記洗浄液が浸透し保持される部材より形成され、前記
洗浄液供給機構は、前記中空部及び前記複数の孔から前
記付着物払拭体表面へ前記洗浄液を供給する洗浄液供給
装置を備えてなることを特徴とする。 According to a fifth aspect of the present invention, there is provided the third aspect of the present invention.
A washing device for a dresser device, wherein the shaft body is
It has a hollow portion inside and outward from the hollow portion to the outer peripheral surface
It is provided with a plurality of communicating holes, the adhering substance wiping body,
The cleaning liquid is formed of a member that penetrates and is retained,
The cleaning liquid supply mechanism is provided in front of the hollow portion and the plurality of holes.
Cleaning liquid supply for supplying the cleaning liquid to the surface of the attached object wiping body
It is characterized by comprising a device.
【0022】このような構成としたことにより、洗浄液
供給機構により洗浄液が軸体内の中空部へに送られ、中
空部から外周面外方に連通する複数の孔から洗浄液が供
給される。 With such a configuration, the cleaning liquid
The cleaning liquid is sent to the hollow part inside the shaft by the supply mechanism,
The cleaning liquid is supplied from a plurality of holes communicating from the void to the outer peripheral surface.
Be paid.
【0023】請求項6に記載の発明は、請求項1記載の
ドレッサー装置用洗浄装置であって、前記除去手段は、
前記付着物払拭体及び前記洗浄液供給機構に代えて、前
記研磨体に高圧の洗浄液を噴出する高圧洗浄液供給機構
を備えていることを特徴とする。 The invention according to claim 6 is the invention according to claim 1.
A cleaning device for a dresser device, wherein the removing unit includes:
Instead of the adhering substance wiping body and the cleaning liquid supply mechanism,
High-pressure cleaning liquid supply mechanism that jets high-pressure cleaning liquid to the polishing body
It is characterized by having.
【0024】このような構成としたことにより、研磨体
の付着物が、高圧の洗浄液によって研磨体から押し流さ
れることにより除去される。 With such a configuration, the polishing body
Deposits are washed away from the abrasive body by the high-pressure cleaning solution.
To be removed.
【0025】請求項7に記載の発明は、請求項1記載の
ドレッサー装置用洗浄装置であって、前記除去手段は、
前記付着物払拭体及び前記洗浄液供給機構に代えて、洗
浄液に超音波振動を付与する超音波付与機構を備えてい
ることを特徴とする。 [0025] The invention according to claim 7 is the invention according to claim 1.
A cleaning device for a dresser device, wherein the removing unit includes:
Instead of the adhering substance wiping body and the cleaning liquid supply mechanism,
It has an ultrasonic application mechanism that applies ultrasonic vibration to the purified liquid.
It is characterized by that.
【0026】このような構成としたことにより、研磨体
の付着物が、超音波洗浄により除去される。 With such a structure, the polishing body
Is removed by ultrasonic cleaning.
【0027】請求項8に記載の発明は、請求項1から7
いずれかに記載のドレッサー装置用洗浄装置であって、
前記研磨体の洗浄に用いた前記付着物を含む前記洗浄液
を回収し、該洗浄液から前記付着物及びその他の混入異
物を取り除く洗浄液再生手段を備えてなることを特徴と
する。 [0027] The invention according to claim 8 is the invention according to claims 1 to 7.
A washing device for a dresser device according to any of the above,
The cleaning liquid containing the deposit used for cleaning the abrasive body
Is collected, and the deposits and other contaminants are removed from the cleaning solution.
Characterized in that it is provided with a cleaning liquid regenerating means for removing objects.
I do.
【0028】このような構成としたことにより、研磨体
の洗浄に用いた付着物を含む洗浄液から洗浄液再生手段
によって付着物及びその他の混入異物が取り除かれる。
洗浄液再生手段としては、例えばフィルター等による洗
浄液の濾過機能や砥粒材の酸ないしはアルカリを中和す
る手段等が用いられる。 With such a structure, the polishing body
Cleaning liquid regenerating means from cleaning liquid containing deposits used for cleaning
This removes deposits and other contaminants.
As the washing liquid regenerating means, for example, washing with a filter or the like
Neutralizes the filtering function of the purified liquid and the acid or alkali of the abrasive.
Means or the like is used.
【0029】[0029]
【発明の実施の形態】以下、本発明の実施形態によるド
レッサー装置用洗浄装置を図面に基づき説明する。BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view showing a dressing device cleaning apparatus according to an embodiment of the present invention.
【0030】[第一の実施の形態]図1及び図2に、本発
明に係るドレッサー装置用洗浄装置の第一の実施形態を
示す。図1及び図2に示すドレッサー装置用洗浄装置A
は、例えば図9に示すドレッサー装置7に用いられる場
合には、ドレッサー装置7の移動機構10による研磨体
8の移動領域内であるCMP装置1の側方に設置され
る。そして、ドレッサー装置用洗浄装置Aは、付着物払
拭体30と、洗浄液供給機構50と、洗浄液再生機構6
0(洗浄液再生手段)とを有し、中心軸線が水平な回転
軸線Wとされる軸体20と、軸体20を回転駆動させる
駆動装置40とからなる払拭体駆動機構を備えている。
ここで、付着物払拭体30と、洗浄液供給機構50とが
協働して研磨体の付着物を除去する除去手段を構成して
いる。[First Embodiment] FIGS. 1 and 2 show a first embodiment of a cleaning apparatus for a dresser apparatus according to the present invention. Cleaning device A for dresser device shown in FIGS. 1 and 2
For example, when used in the dresser device 7 shown in FIG. 9, it is installed on the side of the CMP device 1 in the moving area of the polishing body 8 by the moving mechanism 10 of the dresser device 7. Then, the cleaning device A for the dresser device includes the adhering substance wiping body 30, the cleaning liquid supply mechanism 50, and the cleaning liquid regeneration mechanism 6.
0 (cleaning liquid regenerating means), and is provided with a wiping body driving mechanism including a shaft body 20 having a horizontal axis W as a center axis and a driving device 40 for driving the shaft body 20 to rotate.
Here, the adhering substance wiping body 30 and the cleaning liquid supply mechanism 50 cooperate with each other to constitute a removing unit for removing the adhering substance on the abrasive body.
【0031】軸体20は、中心軸まわりに軸対称とされ
た中心体21と、中心体21に嵌着され払拭体30を保
持する払拭体保持円筒22とを備えている。中心体21
の一端には、払拭体保持円筒22の嵌着時に当接する当
接円板21aが、また他の一端には、払拭体保持円筒2
2の嵌着時に突出するねじ部21bが設けられている。
払拭体保持円筒22は、中心体21に外嵌され、当接円
板21aに当接された状態で、ねじ部21bに螺合する
外径が払拭体保持円筒22の外径より小とされたナット
23により中心体21に固定されている。The shaft body 20 includes a center body 21 which is axially symmetric about the center axis, and a wiping body holding cylinder 22 which is fitted to the center body 21 and holds the wiping body 30. Centrosome 21
At one end of the wiping body holding cylinder 22, a contact disk 21a that comes into contact when the wiping body holding cylinder 22 is fitted is provided.
2 is provided with a screw portion 21b projecting at the time of fitting.
The outer diameter of the wiping body holding cylinder 22 is smaller than the outer diameter of the wiping body holding cylinder 22 when the wiping body holding cylinder 22 is externally fitted to the center body 21 and is in contact with the abutting disk 21a. It is fixed to the center body 21 by a nut 23.
【0032】付着物払拭体30は、払拭体保持円筒22
の外側表面に植設される略長さの等しい毛状体31、3
1…よりなるブラシ様のものである。ここで、毛状体3
1、31…は、例えば合成樹脂などにより形成されてい
る。The adhering substance wiping body 30 includes a wiping body holding cylinder 22.
Hairs 31, 3 of approximately equal length implanted on the outer surface of the
1, a brush-like one. Here, the hair 3
Are formed of, for example, a synthetic resin.
【0033】洗浄液供給機構50は、洗浄液貯留槽51
と、供給管52を介して洗浄液貯留槽51に洗浄液を供
給する洗浄液供給装置54を備えている。貯留槽51の
内側には、高さ寸法が貯留槽51の外壁51aより小さ
いオーバーフロー壁55が、外壁51aと協働して貯留
槽51の二重外壁を形成するよう設けられている。供給
管52は、オーバーフロー壁55よりも貯留槽51の内
側、かつ貯留槽51の底部にその開口部52aを有して
いる。The cleaning liquid supply mechanism 50 includes a cleaning liquid storage tank 51.
And a cleaning liquid supply device 54 for supplying a cleaning liquid to the cleaning liquid storage tank 51 via a supply pipe 52. Inside the storage tank 51, an overflow wall 55 whose height is smaller than the outer wall 51a of the storage tank 51 is provided so as to form a double outer wall of the storage tank 51 in cooperation with the outer wall 51a. The supply pipe 52 has an opening 52 a inside the storage tank 51 with respect to the overflow wall 55 and at the bottom of the storage tank 51.
【0034】洗浄液再生機構60は、外壁51aの下方
にその開口部53aを有する流出管53を介して付着物
を含む使用済みの洗浄液を回収し、図示されないが、例
えばフィルター等による洗浄液の濾過機能や、砥粒材に
含まれる酸ないしはアルカリを中和する手段等を備えて
いる。The washing liquid regenerating mechanism 60 collects used washing liquid containing adhering matter through an outflow pipe 53 having an opening 53a below the outer wall 51a. And a means for neutralizing the acid or alkali contained in the abrasive material.
【0035】軸体20を回転駆動する駆動装置40は、
貯留槽51の外壁51aに固定されている。また、駆動
装置40より突出する自転する回転軸41は、外壁51
aに挿通されている。この回転軸41に、回転伝達軸4
2が中心軸線(回転軸線)を同じくして固定され、さら
に、回転軸41の回転を軸体20に伝達するように、当
接円板21aに中心軸線を同じくして固定されている。
回転伝達軸42の当接円板21aと反対の側の端部は、
外壁51aに挿通されており、回転伝達軸42の外周面
と外壁51aとの間には、これらの間を液密に封止し、
かつ回転伝達軸42の回転を可能とするパッキング43
が設けられている。ここで、駆動装置40は、軸体20
の外側に設けられた付着物払拭体30の最上部が、オー
バーフロー壁55の上端部より高くなるように固定され
ている。The driving device 40 for rotating and driving the shaft body 20 includes:
It is fixed to the outer wall 51a of the storage tank 51. In addition, the rotating rotating shaft 41 protruding from the driving device 40 has an outer wall 51.
a. The rotation transmission shaft 4 is attached to the rotation shaft 41.
2 is fixed with the same central axis (rotation axis), and is further fixed with the same center axis on the abutting disk 21 a so as to transmit the rotation of the rotation shaft 41 to the shaft body 20.
The end of the rotation transmission shaft 42 on the side opposite to the contact disk 21a is
It is inserted through the outer wall 51a, and between the outer peripheral surface of the rotation transmission shaft 42 and the outer wall 51a, the space between them is sealed in a liquid-tight manner,
And a packing 43 enabling rotation of the rotation transmission shaft 42
Is provided. Here, the driving device 40 is connected to the shaft body 20.
Is fixed so that the uppermost portion of the attached matter wiping body 30 provided outside the upper side of the overflow wall 55 is higher than the upper end portion of the overflow wall 55.
【0036】さらに、軸体20の回転軸線Wを安定させ
るため、中心体21のねじ部21bには、外径がねじ部
21bより小とされた支持円筒部24が中心体21と中
心軸線を同じくして設けられており、貯留槽51の底部
に固定された支持体25によって回転自在に支持されて
いる。Further, in order to stabilize the rotation axis W of the shaft body 20, a supporting cylindrical portion 24 having an outer diameter smaller than that of the screw portion 21b is provided on the screw portion 21b of the center body 21 so that the center body 21 and the center axis are aligned. It is provided similarly, and is rotatably supported by a support 25 fixed to the bottom of the storage tank 51.
【0037】図5では、このような構成を有するドレッ
サー装置用洗浄装置Aの付着物払拭体30の最上部が、
研削作用部13表面が付着物払拭体30に均等に当接し
やすいよう、研磨パッド4の表面の高さに略揃えられた
例を示している。 FIG . 5 shows a dress having such a configuration.
The uppermost part of the adhering substance wiping body 30 of the cleaning device A for the
The surface of the grinding action portion 13 abuts evenly on the adhering substance wiping body 30
In order to make it easier, the height of the polishing pad 4 was set to be almost the same as the surface height.
An example is shown.
【0038】斯かる一例として、図1には、アーム9に
保持された研磨体8が、付着物払拭体30に当接された
状態で示されている。ここで、略円板形状の研磨体8
は、研磨体8の底面8aの周端部に所定の幅をもって環
状に延在すると共に底面8aから突出する凸部8bと、
この凸部8bの先端面に形成された研削作用部13を備
えている。As one example, FIG. 1 shows the polishing body 8 held by the arm 9 in a state in which the polishing body 8 is in contact with the attached matter wiping body 30. Here, the substantially disc-shaped polishing body 8
A convex portion 8b extending annularly with a predetermined width at a peripheral end of the bottom surface 8a of the polishing body 8 and protruding from the bottom surface 8a;
There is a grinding action portion 13 formed on the tip end surface of the projection 8b.
【0039】図1、図2及び図5に示されるドレッサー
装置用洗浄装置Aにおいて、まず研磨体8が、ドレッサ
ー装置7の移動機構10によって例えば図5に矢印
(イ)、さらに(ロ)で示される方向に移動され、研削
作用部13の表面の一部が、付着物払拭体30に当接さ
れる。この時、付着物払拭体30を構成する合成樹脂製
の毛状体31、31…は、各々毛状の細い合成樹脂であ
るため可撓性を有し、研削作用部13が付着物払拭体3
0に当接されると変形して、研削作用部13表面はもと
より、研磨体8から突出する凸部8b、及び底面8aの
周端部といった研削作用部13の近辺が全て付着物払拭
体30に当接される。In the cleaning device A for a dresser device shown in FIGS. 1, 2 and 5, first, the polishing body 8 is moved by the moving mechanism 10 of the dresser device 7, for example, by arrows (a) and (b) in FIG. The part is moved in the direction shown, and a part of the surface of the grinding action part 13 is brought into contact with the attached matter wiping body 30. At this time, the synthetic resin hairs 31, 31,... Constituting the attached matter wiping body 30 are each made of thin hairy synthetic resin and therefore have flexibility, and the grinding action portion 13 is attached to the attached matter wiping body. 3
0, the entire surface of the grinding action portion 13 such as the protrusion 8b protruding from the polishing body 8 and the peripheral edge of the bottom surface 8a as well as the surface of the grinding action portion 13 are deformed. Contacted.
【0040】駆動装置40によって軸体20が水平な回
転軸線Wまわりに図1に矢印(ハ)で示された方向に回
転し、研磨体8が鉛直方向の中心軸Zまわりに図1に矢
印(ニ)で示される方向に回転すると、付着物払拭体3
0が研削作用部13表面及びその近辺を含む研磨体8の
表面で摺動し、付着物を研磨体8より払拭する。ここ
で、矢印(ハ)で示された方向と、矢印(ニ)で示され
た方向は、当接部分において互いに異なる方向とされ、
付着物に対する付着物払拭体30の相対速度が増加され
る。The driving body 40 rotates the shaft body 20 around the horizontal rotation axis W in the direction shown by the arrow (c) in FIG. 1, and the polishing body 8 rotates around the vertical center axis Z in FIG. When rotated in the direction shown in (d), the adhering substance wiping body 3
Numeral 0 slides on the surface of the polishing body 8 including the surface of the grinding action portion 13 and the vicinity thereof, and wipes off the attached matter from the polishing body 8. Here, the direction indicated by the arrow (c) and the direction indicated by the arrow (d) are different directions in the contact portion,
The relative speed of the deposit wiping body 30 to the deposit is increased.
【0041】洗浄液供給機構50においては、洗浄液供
給装置54により供給管52を介して洗浄液が貯留槽5
1に貯えられ、付着物払拭体30上部の毛状体31、3
1…の先端が洗浄液の液面より高い位置にあるよう洗浄
液に一部浸漬された付着物払拭体30において、毛状体
31、31…の間に洗浄液が浸透して保持され、軸体2
0が回転することにより、毛状体31、31…が洗浄液
を保持したまま軸体20上方へと研磨体8に当接するま
で移動し、同時に毛状体31、31…間に保持されてい
た洗浄液が、遠心力により毛状体31、31…の先端へ
と輸送されて、研磨体8との当接部分に洗浄液が供給さ
れる。こうして、研削作用部13表面と付着物払拭体3
0が当接する部分には、洗浄液供給機構50から供給さ
れる洗浄液が存在しており、付着物は、洗浄液の中に拡
散し、洗浄液が流れることにより、洗浄液に含まれたま
ま当接する部分より離散する。このようにして、研磨体
8から付着物が除去される。In the cleaning liquid supply mechanism 50, the cleaning liquid supply
The cleaning liquid is supplied to the storage tank 5 through the supply pipe 52 by the supply device 54.
1 and hairs 31 and 3 on the upper part of the adhering substance wiping body 30.
Cleaning so that the tip of 1 ... is higher than the level of the cleaning liquid
In the adhering substance wiping body 30 partially immersed in the liquid,
The cleaning liquid is permeated and held between 31, 31,.
When the 0 rotates, the hairs 31, 31,...
While holding the polishing body 8 in contact with the polishing body 8 above the shaft body 20.
, And at the same time held between the hairs 31, 31,.
Washing liquid is transferred to the tips of the hairs 31, 31 ... by centrifugal force.
And the cleaning liquid is supplied to the contact portion with the polishing body 8.
It is. Thus, the surface of the grinding section 13 and the adhering substance wiping body 3
The cleaning liquid supplied from the cleaning liquid supply mechanism 50 is present in the portion where the cleaning liquid supply mechanism 50 contacts, and the adhered substance diffuses into the cleaning liquid and flows through the cleaning liquid. Discrete. Thus, the deposit is removed from the polishing body 8.
【0042】研削作用部13表面の洗浄に伴い、貯留槽
51の中に貯えられた洗浄液は、次第に研削作用部13
表面に付着していた物質が混入するが、洗浄液は、洗浄
液供給装置54により常に貯留槽51に供給されてお
り、液面がオーバーフロー壁55の上端部に達すると、
付着物を含む使用された洗浄液は、付着物と共にオーバ
ーフロー壁55と外壁51aとで挟まれた空間に溢れ出
すようになっており、これによって洗浄液の入れ換えが
行われる。オーバーフロー壁55を超えて溢れ出した付
着物を含む洗浄液は、流出管53を介して洗浄液再生機
構60に回収されて浄化される。洗浄液再生機構60で
再利用可能に再生された洗浄液は、図示されぬ洗浄液輸
送機構により洗浄液供給装置54に送られる。With the cleaning of the surface of the grinding section 13, the cleaning liquid stored in the storage tank 51 gradually becomes smaller.
Although the substance adhering to the surface is mixed, the cleaning liquid is always supplied to the storage tank 51 by the cleaning liquid supply device 54, and when the liquid level reaches the upper end of the overflow wall 55,
The used cleaning liquid containing the adhering substance overflows into the space between the overflow wall 55 and the outer wall 51a together with the adhering substance, whereby the cleaning liquid is replaced. The cleaning liquid containing extraneous matter that has overflowed beyond the overflow wall 55 is collected by the cleaning liquid regeneration mechanism 60 through the outflow pipe 53 and purified. The cleaning liquid regenerated so as to be reusable by the cleaning liquid regeneration mechanism 60 is sent to the cleaning liquid supply device 54 by a cleaning liquid transport mechanism (not shown).
【0043】図1に示されるドレッサー装置用洗浄装置
Aによれば、研磨体8の研削作用部13表面及びその近
辺に付着した付着物をブラシ様の付着物払拭体30によ
って払拭し、洗浄液によって洗い流すことで除去するこ
とができる。According to the cleaning device A for the dresser device shown in FIG. 1, the adhered matter adhering to the surface of the grinding action portion 13 of the polishing body 8 and the vicinity thereof is wiped off by the brush-like adhered substance wiping body 30, and the cleaning liquid is used. It can be removed by washing away.
【0044】なお、上記の実施例では、付着物払拭体3
0の最上部を残して、残りの部分を洗浄液に浸す構成と
したが、要は、毛状体31、31…間に洗浄液が十分保
持され研削作用部13との当接部分に供給されればよ
く、付着物払拭体30の一部がわずかに洗浄液に浸漬さ
れる構成としてもよい。In the above embodiment, the attached matter wiping member 3 is used.
The remaining portion is immersed in the cleaning liquid except for the uppermost portion of the zero, but the point is that the cleaning liquid is sufficiently held between the hairs 31, 31 and supplied to the contact portion with the grinding action portion 13. Alternatively, a configuration may be employed in which a part of the adhered substance wiping body 30 is slightly immersed in the cleaning liquid.
【0045】あるいは逆に、オーバーフロー壁55の高
さを高くし、付着物払拭体30が全て洗浄液の中に完全
に浸される構成としてもよい。このような構成によれ
ば、毛状体31、31…の周囲に常に洗浄液が存在する
ようにできる。すなわち、研削作用部13の全表面が、
常に洗浄液の中に浸ることになるので、付着物を十分に
軟化させることができると共に、付着物が拡散する洗浄
液を周囲に多く供給することができ、より効果的に付着
物を払拭することができる。Alternatively, on the contrary, the height of the overflow wall 55 may be increased so that the attached matter wiping body 30 is completely immersed in the cleaning liquid. According to such a configuration, the cleaning liquid can always be present around the hairs 31, 31,.... That is, the entire surface of the grinding section 13 is
Since it is always immersed in the cleaning liquid, it is possible to sufficiently soften the deposits and to supply a large amount of the cleaning liquid in which the deposits are diffused to the surroundings, thereby more effectively wiping off the deposits. it can.
【0046】また、設置場所に制約がある場合には、貯
留槽51の寸法を小型化し、さらに研削作用部13表面
が外壁51aと干渉しないように外壁51aの高さをオ
ーバーフロー壁55と同じにする構成としてもよい。When the installation location is restricted, the size of the storage tank 51 is reduced, and the height of the outer wall 51a is set to be the same as that of the overflow wall 55 so that the surface of the grinding section 13 does not interfere with the outer wall 51a. It is good also as a structure which performs.
【0047】[第二の実施の形態]次に、本発明に係るド
レッサー装置用洗浄装置の第二の実施形態を図3及び図
4を用いて説明する。図3及び図4に示すドレッサー装
置用洗浄装置Bは、例えば図9に示すドレッサー装置7
に用られる場合には、ドレッサー装置7の移動機構10
による研磨体8の移動領域内であるCMP装置1の側方
に設置される。そして、ドレッサー装置用洗浄装置B
は、付着物払拭体30と、洗浄液供給機構50と、洗浄
液再生機構60(洗浄液再生手段)とを有し、中心軸線
が水平な回転軸線Wとされる軸体20と、軸体20を回
転駆動させる駆動装置40とからなる払拭体駆動機構を
備えている。ここで、付着物払拭体30と、洗浄液供給
機構50とが協働して研磨体の付着物を除去する除去手
段を構成している。[Second Embodiment] Next, a second embodiment of the cleaning device for a dresser device according to the present invention will be described with reference to FIGS. The dressing device cleaning device B shown in FIGS. 3 and 4 is, for example, a dresser device 7 shown in FIG.
In the case where the moving mechanism 10 of the dresser device 7 is used for
The polishing body 8 is set on the side of the CMP apparatus 1 within the moving area of the polishing body 8. And the cleaning device B for the dresser device
Has an adhering substance wiping body 30, a cleaning liquid supply mechanism 50, and a cleaning liquid regenerating mechanism 60 (cleaning liquid regenerating means). The shaft 20 has a central axis set to a horizontal rotation axis W, and the shaft 20 is rotated. A wiping body driving mechanism including a driving device 40 to be driven is provided. Here, the adhering substance wiping body 30 and the cleaning liquid supply mechanism 50 cooperate with each other to constitute a removing unit for removing the adhering substance on the abrasive body.
【0048】軸体20は、その内部に中空部26を有す
ると共に中空部26から外周面外方に連通する複数の微
細な孔27、27…を備えてなる中心体21と、中心体
21の開放端部28の内周面に設けられたねじ部28a
に液密に螺合する蓋29とを備えている。The shaft body 20 has a hollow portion 26 therein and a plurality of fine holes 27 communicating from the hollow portion 26 to the outside of the outer peripheral surface. Screw portion 28a provided on the inner peripheral surface of open end 28
And a lid 29 which is screwed liquid-tight.
【0049】付着物払拭体30は、中心体21の外側表
面に植設される略長さの等しい毛状体31、31…より
なるブラシ様のものである。ここで、毛状体31、31
…は、例えば合成樹脂などにより形成されている。The adhering substance wiping member 30 is a brush-like member composed of hairs 31, 31... Here, the hairs 31, 31
Are formed of, for example, a synthetic resin.
【0050】洗浄液供給機構50は、蓋29に挿通され
中空部26に連通する中心軸線が中心体21の軸線と同
じくされた円筒状の洗浄液導入管56と、供給管52と
洗浄液導入管56を介して中心体21の中空部26に洗
浄液を供給し、流出管53を介して洗浄液回収皿57に
溜まった付着物を含む使用された洗浄液を回収し再生す
る洗浄液再生機構60を備えている。さらに、洗浄液導
入管56が挿通される蓋29と洗浄液導入管56の間に
は、これらの間を液密に封止しつつ軸体20の回転を可
能とするパッキング58が設けられている。The cleaning liquid supply mechanism 50 includes a cylindrical cleaning liquid introduction pipe 56 having a central axis which is inserted into the lid 29 and communicates with the hollow portion 26 and whose central axis is the same as the axis of the central body 21, a supply pipe 52 and a cleaning liquid introduction pipe 56. A cleaning liquid replenishing mechanism 60 is provided for supplying the cleaning liquid to the hollow portion 26 of the central body 21 through the outlet pipe 53 and recovering and regenerating the used cleaning liquid including the deposits accumulated in the cleaning liquid recovery tray 57 via the outflow pipe 53. Further, a packing 58 is provided between the lid 29 through which the cleaning liquid introduction tube 56 is inserted and the cleaning liquid introduction tube 56 to enable rotation of the shaft body 20 while sealing the space between the lid 29 and the cleaning liquid introduction tube 56 in a liquid-tight manner.
【0051】また、このような構成を有するドレッサー
装置用洗浄装置Bの付着物払拭体30の最上部は、例え
ば、研削作用部13表面が付着物払拭体30に均等に当
接しやすいよう、研磨パッド4の表面の高さに略揃えら
れている。 A dresser having such a configuration
The uppermost part of the attached matter wiping body 30 of the apparatus cleaning device B is, for example,
In this case, the surface of the grinding action portion 13 evenly contacts the adhered substance wiping body 30.
Aligned with the height of the surface of the polishing pad 4 for easy contact
Have been.
【0052】斯かる一例として、図3には、さらに、ア
ーム9に保持された研磨体8が、研磨体8に形成された
研削作用部13の表面が付着物払拭体30に当接された
状態で示されている。この他、図3及び図4に示された
ドレッサー装置用洗浄装置Bにおいて、図1及び図2に
示されたものにそれぞれ対応する部分は、同一の符号を
付し、ここではその説明を省略する。As an example of this, FIG. 3 shows that the polishing body 8 held by the arm 9 is further in contact with the surface of the grinding action portion 13 formed on the polishing body 8 against the attached matter wiping body 30. Shown in state. In addition, in the cleaning device B for the dresser device shown in FIGS. 3 and 4, portions corresponding to those shown in FIGS. 1 and 2 are denoted by the same reference numerals, and description thereof is omitted here. I do.
【0053】図3及び図4に示されたドレッサー装置用
洗浄装置Bにおいて、図1及び図2に示されたドレッサ
ー装置用洗浄装置Aと同様、研削作用部13表面ならび
にその近辺が付着物払拭体30に当接され、軸体20と
研磨体8の回転によって研削作用部13表面及びその近
辺より付着物が払拭される。この時、研削作用部13表
面と付着物払拭体30が当接する部分には、洗浄液供給
機構50から供給される洗浄液が存在しており、付着物
は、洗浄液の中に拡散し、洗浄液が流れることにより、
洗浄液に含まれたまま当接する部分より離散する。この
ようにして、研磨体8から付着物が除去される。以下、
ドレッサー装置用洗浄装置Bにおいて特徴をなす洗浄液
供給機構50について詳細に説明する。In the dressing device cleaning apparatus B shown in FIGS. 3 and 4, similarly to the dressing apparatus cleaning apparatus A shown in FIGS. When the shaft body 20 and the polishing body 8 rotate, the adhered material is wiped off from the surface of the grinding portion 13 and the vicinity thereof by the rotation of the shaft body 20 and the polishing body 8. At this time, the cleaning liquid supplied from the cleaning liquid supply mechanism 50 exists in a portion where the surface of the grinding action section 13 and the adhered substance wiping body 30 are in contact with each other, and the adhered substance is diffused into the cleaning liquid and the cleaning liquid flows. By doing
Discrete from the part that comes in contact with the cleaning liquid. Thus, the deposit is removed from the polishing body 8. Less than,
The cleaning liquid supply mechanism 50 which is a feature of the cleaning device B for a dresser device will be described in detail.
【0054】洗浄液供給機構50においては、洗浄液が
中心体21内の中空部26へ供給されると共に、外周面
外方に連通する複数の微細な孔27、27…から付着物
払拭体30である毛状体31、31…へ送られる。こう
して研削作用部13表面と付着物払拭体30が当接する
部分に洗浄液が供給される。In the cleaning liquid supply mechanism 50, the cleaning liquid is supplied to the hollow portion 26 in the central body 21, and the adhering substance wiping body 30 is formed from a plurality of fine holes 27 communicating outside the outer peripheral surface. Are sent to the hairs 31, 31... Thus, the cleaning liquid is supplied to the portion where the surface of the grinding action section 13 and the adhering substance wiping body 30 are in contact with each other.
【0055】付着物を含む使用された洗浄液は、付着物
払拭体30より流れ落ち、洗浄液回収皿57に貯えら
れ、流出管53を介して洗浄液再生機構60に回収さ
れ、再生される。The used cleaning liquid containing the adhering substance flows down from the adhering substance wiping body 30, is stored in the cleaning liquid collecting tray 57, is collected by the cleaning liquid regenerating mechanism 60 through the outflow pipe 53, and is regenerated.
【0056】図3及び図4に示されるドレッサー装置用
洗浄装置Bによれば、研磨体8の研削作用部13表面及
びその近辺に付着した付着物をブラシ様の付着物払拭体
30によって払拭し、洗浄液によって洗い流すことがで
きる。さらに、付着物の払拭される研削作用部13表面
に、付着物を含まない洗浄液が直接供給され、かつ、付
着物を含んだ使用後の洗浄液は、そのまま流出する。し
たがって研磨体に再び付着物が付着するのを効果的に防
止することができる。このようにして、研磨体8より付
着物を除去することができる。According to the dressing apparatus cleaning apparatus B shown in FIGS. 3 and 4, the adhered matter adhering to the surface of the grinding portion 13 of the polishing body 8 and its vicinity is wiped by the brush-like adhered matter wiping body 30. , Can be washed away with a cleaning solution. Further, the cleaning liquid containing no attached matter is directly supplied to the surface of the grinding section 13 from which the attached matter is wiped, and the used cleaning liquid containing the attached matter flows out as it is. Therefore, it is possible to effectively prevent the deposit from being attached to the polishing body again. In this way, the deposit can be removed from the polishing body 8.
【0057】なお、上記の実施例では、付着物払拭体3
0より流れ落ちた付着物を含む洗浄液は、洗浄液回収皿
57に一度回収される構成としたが、図1に示されるよ
うな、貯留槽51及びオーバーフロー壁55を用いる構
成としてもよい。すなわち、図1では洗浄液は、供給管
52を介して供給されたが、その代わりに軸体20内に
設けられた中空部26を通して洗浄液を供給するのであ
る。洗浄液の供給される入り口を研削作用部13と付着
物払拭体30に近づけることによって付着物をより効果
的に除去できる。というのも、上述したように、研磨体
8と付着物払拭体30との当接部に直接洗浄液が供給さ
れるので、付着物の再付着が生じにくいからである。 In the above embodiment, the attached matter wiping member 3 is used.
The washing liquid containing the adhered substance that has flowed down from 0
It is configured to be collected once at 57, but as shown in FIG.
A structure using a storage tank 51 and an overflow wall 55 is used.
It is good also as a result. That is, in FIG.
52, but instead in the shaft 20
The cleaning liquid is supplied through the hollow portion 26 provided.
You. Attach the inlet where the cleaning liquid is supplied to the grinding action part 13
Deposits are more effective by approaching the wiping body 30
Can be removed. Because, as mentioned above, the abrasive body
The cleaning liquid is directly supplied to the contact portion between the
This is because the reattachment of the adhered substance hardly occurs.
【0058】なお、これまでに述べた実施例では、略円
筒形状の軸体20の外周部に付着物払拭体30を設ける
構成としたが、図6に示すように、中心軸線が研磨体8
の回転軸線Zに略平行で鉛直な回転軸線Vとされる円盤
状の軸体20と、軸体20を回転駆動させる駆動装置4
0とからなる払拭体駆動機構を設け、付着物払拭体30
が軸体20の上面に設けられる構成としてもよい。洗浄
液供給機構50は、この実施例では、洗浄液を供給管5
2を介して付着物払拭体30と研削作用部13との当接
する部分に向けて直接噴射するよう構成されている。も
ちろん、洗浄液供給機構50は、図1及び図2に示すよ
うな構成とされてもよい。 In the above- described embodiments, the substantially circular
An attached matter wiping body 30 is provided on the outer periphery of the cylindrical shaft body 20.
As shown in FIG. 6, the center axis is
Disk having a rotation axis V substantially parallel to and perpendicular to the rotation axis Z
Shaft 20 and a driving device 4 for rotating and driving the shaft 20
And a wiping body drive mechanism comprising:
May be provided on the upper surface of the shaft body 20. Washing
In this embodiment, the liquid supply mechanism 50 supplies the cleaning liquid to the supply pipe 5.
Abutment between the adhering substance wiping body 30 and the grinding action section 13 through
It is configured to inject directly to the part to be heated. Also
Of course, the cleaning liquid supply mechanism 50 is as shown in FIGS.
Such a configuration may be adopted.
【0059】さらに簡潔に、図7に示されるような構成
としてもよい。すなわち、付着物払拭体30を矩形板体
70上に設け、矩形板体70を図7中に矢印(ホ)及び
(へ)で示される方向に往復運動させる駆動装置80
(払拭体駆動機構)により付着物払拭体30を研削作用
部13表面で摺接運動させるような構成としてもよい。
斯かる付着物払拭体30の摺接運動は、あくまでも研削
作用部13表面から効率よく付着物を除去するためのも
のであり、例えば、付着物払拭体30を静止させ、研磨
体8を回転させ、付着物払拭体30と研削作用部13と
の当接する部分に洗浄液を供給して付着物を除去する構
成としてもよい。要は、研削作用部13及びその近辺の
付着物の付いた部分に付着物払拭体30を当接させ、研
磨体8ないしは付着物払拭体30の双方もしくはいずれ
か一方を動かし、研磨体8より付着物を払拭する構成と
すればよい。 More simply, the configuration as shown in FIG.
It may be. That is, the adhering substance wiping body 30 is
The rectangular plate 70 is provided on the arrow (e) in FIG.
Drive device 80 for reciprocating in the direction shown by (F)
(Wiping body drive mechanism) grinds the adhering substance wiping body 30
It is good also as a structure which makes a sliding motion on the surface of the part 13.
The sliding movement of the adhered substance wiping body 30 is only for efficiently removing the adhered substance from the surface of the grinding section 13. For example, the adhered substance wiping body 30 is stopped and the polishing body 8 is rotated. The cleaning liquid may be supplied to a portion where the adhering substance wiping body 30 and the grinding action section 13 are in contact with each other to remove the adhering substance. The point is that the adhered substance wiping body 30 is brought into contact with the grinding action portion 13 and the area near the adhered substance and the abrasive body 8 or both or one of the adhered substance wiping bodies 30 is moved. What is necessary is just to set it as the structure which wipes off an attached matter.
【0060】加えて、付着物払拭体30として用いるの
は、洗浄液が浸透しやすく、保持されやすく、かつ、弾
力性に富んで研削作用部13表面及びその近辺に当接し
て、さらに研磨体8の表面を傷つけないものであれば何
でもよいから、選択の可能性は多い。例えば、毛状体3
1、31…のかわりに、海綿状の部材(スポンジ様のも
の)等を用いる構成としてもよい。 In addition, it is used as the adhering substance wiping body 30.
Is easy to penetrate, hold,
It comes in contact with the surface of the grinding part 13
What is so long as it does not damage the surface of the polishing body 8
However, there are many possibilities for selection. For example, the hair 3
Instead of 1, 31, ..., sponge-like members (sponge-like
) May be used.
【0061】このように、付着物払拭体30と洗浄液供
給機構50を付着物の除去手段について、幾つかの実施
例を挙げたが、これ以外の構成を用いることも可能であ
る。例えば、図8に示すように、付着物の除去手段とし
て、洗浄液供給機構50に洗浄液を高圧にして供給管5
2に送り出す高圧洗浄液供給機構61を設け、さらに供
給管52の先端にノズル62を設けて、洗浄液を研磨体
8の表面に勢いよく吹き付ける構成としてもよい。斯か
る構成によれば、洗浄液の圧力によって付着物を研磨体
8より取り去り流し去ってしまうことができる。また、
洗浄液を吹き付けるための高圧洗浄液供給機構61を有
する構造において、噴出させる洗浄液に超音波振動を付
与する超音波付与機構63を設けることも可能である。
あるいは、洗浄液を貯留槽に貯え、研削作用部13及び
その近辺を洗浄液の中に浸漬させ、洗浄液に超音波振動
を付与して付着物を研磨体8から除去することも可能で
ある。なお、上記の実施例では、ドレッサー装置の一例
として図9に示されるものを示したが、他のドレッサー
装置においても、図1及び図2に示されるドレッサー装
置用洗浄装置Aあるいは、図3及び図4に示されるドレ
ッサー装置用洗浄装置Bが研磨体の移動領域に設置さ
れ、研磨体より付着物が除去されることに変わりはな
い。As described above, several embodiments have been described with respect to the attached matter wiping body 30 and the cleaning liquid supply mechanism 50 for the attached matter removing means. However, other configurations can be used. For example, as shown in FIG. 8, as a means for removing deposits, the cleaning liquid is supplied to the cleaning liquid
A high-pressure cleaning liquid supply mechanism 61 for sending the cleaning liquid to the polishing body 8 may be provided, and a nozzle 62 may be provided at the tip of the supply pipe 52 to blow the cleaning liquid onto the surface of the polishing body 8 vigorously. According to such a configuration, it is possible to remove the attached matter from the polishing body 8 by the pressure of the cleaning liquid and to wash away the attached matter. Also,
A high-pressure cleaning liquid supply mechanism 61 for spraying the cleaning liquid is provided.
Ultrasonic vibration is applied to the cleaning liquid to be ejected.
It is also possible to provide an ultrasonic wave applying mechanism 63 for giving.
Alternatively, the cleaning liquid is stored in a storage tank, and the grinding action portion 13 and
Immerse the area in the cleaning solution and apply ultrasonic vibration to the cleaning solution.
It is also possible to remove deposits from the polishing body 8 by giving
is there. In the above embodiment, the dresser device shown in FIG. 9 is shown as an example of a dresser device. However, in other dresser devices, the dressing device cleaning device A shown in FIGS. 1 and 2 or FIG. The cleaning device B for the dresser device shown in FIG. 4 is installed in the moving region of the polishing body, and there is no change in removing the deposits from the polishing body.
【0062】[0062]
【発明の効果】本発明は、以下に記載されるような効果
を奏する。以上説明したように、請求項1に係るドレッ
サー装置用洗浄装置によれば、研磨体の研削作用部表面
ならびにその近辺に付着した研磨パッドや変質した砥粒
材等の付着物を払拭し、洗浄液で流し去ることによって
除去することができる。 The present invention has the following effects. As described above, the dressing according to claim 1
According to the cleaning device for the grinding machine, the surface of the grinding body of the abrasive body
Polishing pads and degraded abrasive grains attached to the area
By wiping off any deposits such as materials,
Can be removed.
【0063】請求項2に係るドレッサー装置用洗浄装置
によれば、付着物払拭体が研削作用部にて摺接するよう
駆動されるので、研磨体より効果的に付着物を払拭でき
る。 A cleaning device for a dresser device according to claim 2.
According to the above, the adhering substance wiping body is brought into sliding contact with the grinding action portion.
It is driven, so it is possible to more effectively wipe off deposits than the abrasive body.
You.
【0064】請求項3に係るドレッサー装置用洗浄装置
によれば、軸体上に付着物払拭体を設け、この軸体を回
転駆動させる簡易な構成により付着物払拭体を研削作用
部にて摺接させ、研磨体より効果的に付着物を払拭でき
る。 A cleaning device for a dresser device according to claim 3.
According to the method, the adhered substance wiping body is provided on the shaft, and the shaft is rotated.
Grinding action of the adhering material wiping body with a simple configuration that rotates
Parts can be slid and wiped off the adhered material more effectively than the abrasive body.
You.
【0065】請求項4に係るドレッサー装置用洗浄装置
によれば、簡易な構成によって洗浄液を供給することが
できる。 A cleaning device for a dresser device according to claim 4.
According to the above, the cleaning liquid can be supplied with a simple configuration.
it can.
【0066】請求項5に係るドレッサー装置用洗浄装置
によれば、簡易な構成によって洗浄液を供給することが
できると共に、付着物払拭体と研磨体とが当接する箇所
に洗浄液を直接供給しそのまま流し去ることができ、付
着物の再付着を防止して付着物を効果的に除去できる。According to the fifth aspect of the present invention, the cleaning liquid can be supplied with a simple structure, and the cleaning liquid is directly supplied to the portion where the adhered substance wiping body and the polishing body come into contact with each other, and the cleaning liquid is supplied as it is. It is possible to leave and prevent reattachment of deposits, thereby effectively removing the deposits.
【0067】請求項6に係るドレッサー装置用洗浄装置
によれば、高圧の洗浄液流により、研磨体の付着物を洗
い流して除去することができる。According to the cleaning device for a dresser device according to the sixth aspect, it is possible to wash away and remove the deposits on the abrasive body by the high-pressure cleaning liquid flow.
【0068】請求項7に係るドレッサー装置用洗浄装置
によれば、洗浄液による超音波洗浄により、研磨体の付
着物を除去することができる。According to the cleaning device for a dresser device of the present invention, it is possible to remove the deposits on the polishing body by ultrasonic cleaning with a cleaning liquid.
【0069】請求項8に係るドレッサー装置用洗浄装置
によれば、付着物を含む使用された洗浄液を回収し再利
用可能に再生することができる。 A cleaning device for a dresser device according to claim 8.
According to, the used cleaning solution containing the deposits is collected and reused.
It can be played back for use.
【図1】本発明の第一の実施の形態を示すドレッサー装
置用洗浄装置の断面図である。FIG. 1 is a cross-sectional view of a dressing device cleaning apparatus according to a first embodiment of the present invention.
【図2】図1における部分Oをさらに拡大して示した図
である。FIG. 2 is an enlarged view of a portion O in FIG. 1;
【図3】本発明の第二の実施の形態を示すドレッサー装
置用洗浄装置の断面図である。FIG. 3 is a cross-sectional view of a dressing device cleaning apparatus according to a second embodiment of the present invention.
【図4】図3における部分Pをさらに拡大して示した図
である。FIG. 4 is an enlarged view of a portion P in FIG. 3;
【図5】本発明の第一の実施の形態を示す図であって、
ドレッサー装置用洗浄装置と、従来のドレッサー装置を
有するCMP装置との位置関係を一例として模式的に示
す図である。FIG. 5 is a diagram showing a first embodiment of the present invention,
It is a figure which shows typically the positional relationship between the washing apparatus for dresser apparatuses, and the CMP apparatus which has the conventional dresser apparatus as an example.
【図6】本発明の他の実施の形態を示すドレッサー装置
用洗浄装置の断面図である。FIG. 6 is a sectional view of a cleaning device for a dresser device according to another embodiment of the present invention.
【図7】本発明のさらに他の実施の形態を示すドレッサ
ー装置用洗浄装置の断面図である。FIG. 7 is a cross-sectional view of a cleaning device for a dresser device according to still another embodiment of the present invention.
【図8】本発明のさらに他の実施の形態を示すドレッサ
ー装置用洗浄装置の断面図である。FIG. 8 is a sectional view of a dressing device cleaning apparatus according to still another embodiment of the present invention.
【図9】ドレッサー装置を有するCMP装置の一例を模
式的に示す図である。FIG. 9 is a diagram schematically illustrating an example of a CMP apparatus having a dresser apparatus.
A・・・ドレッサー装置用洗浄装置 8・・・研磨体 13・・・研削作用部 20・・・軸体 30・・・付着物払拭体 31・・・毛状体 40・・・駆動装置 50・・・洗浄液供給機構 60・・・洗浄液再生機構(洗浄液再生手段) A: Cleaning device for dresser device 8: Polishing body 13: Grinding unit 20: Shaft 30: Adhering substance wiping body 31: Hair 40: Driving device 50 ... Cleaning liquid supply mechanism 60 ... Cleaning liquid regeneration mechanism (Cleaning liquid regeneration means)
───────────────────────────────────────────────────── フロントページの続き (72)発明者 細木 寛二 埼玉県大宮市北袋町1丁目297番地 三菱 マテリアル株式会社総合研究所内 Fターム(参考) 3C047 AA34 FF08 FF19 3C058 AA07 AA19 AC01 BC02 CA01 CB01 CB03 DA12 ──────────────────────────────────────────────────の Continuing on the front page (72) Inventor Kanji Hosoki 1-297 Kitabukuro-cho, Omiya-shi, Saitama F-term in Mitsubishi Materials Corporation Research Institute (reference) 3C047 AA34 FF08 FF19 3C058 AA07 AA19 AC01 BC02 CA01 CB01 CB03 DA12
Claims (8)
と、該研磨体を回転させる回転駆動機構と、前記研削作
用部が研磨パッドに当接するよう前記研磨体を前記研磨
パッド上に搬入及び搬出する移動機構とを有し、前記研
磨体と前記研磨パッドとを相対的に移動させて前記研磨
パッドを研磨するドレッサー装置の洗浄装置であって、 前記研磨体の移動領域に設置され、前記研磨体の付着物
を除去する除去手段を備え、 該除去手段は、 前記研磨体に当接自在に設置され前記研磨体の付着物を
払拭する付着物払拭体と、 前記付着物払拭体が前記研磨体に当接した時に該当接し
た部分に洗浄液を供給する洗浄液供給機構とを備えてな
ることを特徴とするドレッサー装置用洗浄装置。1. A substantially disk-shaped polishing body having a grinding action portion, a rotation drive mechanism for rotating the polishing body, and the polishing body being placed on the polishing pad such that the grinding action portion comes into contact with a polishing pad. A cleaning mechanism for a dresser device having a moving mechanism for carrying in and out, and for relatively moving the polishing body and the polishing pad to polish the polishing pad, wherein the cleaning device is provided in a moving area of the polishing body. A removing means for removing the deposits on the polishing body, the removing means being installed to be able to contact the polishing body and wiping off the deposits on the polishing body; A cleaning liquid supply mechanism for supplying a cleaning liquid to a portion of the dresser when the polishing member comes into contact with the polishing body.
置であって、 前記付着物払拭体が前記研磨体に当接した時に、前記付
着物払拭体が前記研削作用部表面で摺接運動するよう前
記付着物払拭体を駆動する払拭体駆動機構を備えてなる
ことを特徴とするドレッサー装置用洗浄装置。2. The dressing device cleaning apparatus according to claim 1, wherein the attached matter wiping body slides on the surface of the grinding action portion when the attached matter wiping body contacts the polishing body. A cleaning device for a dresser device, comprising a wiping body drive mechanism for driving the attached matter wiping body.
置であって、 前記払拭体駆動機構は、 前記付着物払拭体を支持する軸体と、 この軸体を回転駆動する駆動装置とを備えてなることを
特徴とするドレッサー装置用洗浄装置。3. The cleaning device for a dresser device according to claim 2, wherein the wiping body driving mechanism includes a shaft that supports the adhering substance wiping body, and a driving device that rotationally drives the shaft. A cleaning device for a dresser device, comprising:
置であって、 前記付着物払拭体は、前記洗浄液が浸透し保持される部
材より形成され、 前記洗浄液供給機構は、 洗浄液貯留槽と、 該洗浄液貯留槽内に、少なくとも前記付着物払拭体の一
部が浸漬するように貯留された前記洗浄液とを備えてな
ることを特徴とするドレッサー装置用洗浄装置。4. The cleaning device for a dresser device according to claim 3, wherein the adhering substance wiping body is formed of a member through which the cleaning liquid permeates and is retained, wherein the cleaning liquid supply mechanism includes: a cleaning liquid storage tank; A cleaning apparatus for a dresser device, comprising: the cleaning liquid stored in the cleaning liquid storage tank so that at least a part of the adhered substance wiping body is immersed therein.
置であって、前記軸体は、その内部に中空部を有すると共に該中空部
から外周面外方に連通する複数の孔を備えてなり、 前記付着物払拭体は、前記洗浄液が浸透し保持される部
材より形成され、 前記洗浄液供給機構は、前記中空部及び前記複数の孔か
ら前記付着物払拭体表面へ前記洗浄液を供給する洗浄液
供給装置を備えてなることを特徴とするドレッサー装置
用洗浄装置。5. The cleaning device for a dresser device according to claim 3, wherein said shaft body has a hollow portion therein and said hollow portion.
A plurality of holes communicating with the outside of the outer peripheral surface from the outside, the adhering substance wiping body is formed of a member through which the cleaning liquid is permeated and held, and the cleaning liquid supply mechanism includes the hollow portion and the plurality of holes. And a cleaning liquid supply device for supplying the cleaning liquid to the surface of the adhered substance wiping body from above.
置であって、前記除去手段は、前記付着物払拭体及び前記洗浄液供給
機構に代えて、前記研磨体に高圧の洗浄液を噴出する高
圧洗浄液供給機構を備えていることを特徴とするドレッ
サー装置用洗浄装置。 6. The cleaning device for a dresser device according to claim 1, wherein said removing means includes said adhering substance wiping body and said cleaning liquid supply.
Instead of a mechanism, a high-pressure jetting high-pressure cleaning liquid to the polishing body is used.
A pressure washing liquid supply mechanism.
Cleaning equipment for Sir equipment.
置であって、 前記除去手段は、前記付着物払拭体及び前記洗浄液供給
機構に代えて、洗浄液に超音波振動を付与する超音波付
与機構を備えていることを特徴とするドレッサー装置用
洗浄装置。7. The cleaning device for a dresser device according to claim 1, wherein the removing unit applies ultrasonic vibration to a cleaning liquid instead of the adhered substance wiping body and the cleaning liquid supply mechanism. A cleaning device for a dresser device, comprising:
サー装置用洗浄装置であって、 前記研磨体の洗浄に用いた前記付着物を含む前記洗浄液
を回収し、該洗浄液から前記付着物及びその他の混入異
物を取り除く洗浄液再生手段を備えてなることを特徴と
するドレッサー装置用洗浄装置。8. The cleaning device for a dresser device according to claim 1, wherein the cleaning liquid containing the deposit used for cleaning the polishing body is collected, and the deposit and the deposit are removed from the cleaning liquid. A cleaning device for a dresser device, comprising a cleaning liquid regenerating means for removing other contaminants.
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000067799A JP2001260024A (en) | 2000-03-10 | 2000-03-10 | Washing device for dresser device |
| EP00117388A EP1080840A3 (en) | 1999-08-30 | 2000-08-24 | Polishing apparatus, polishing method and method of conditioning polishing pad |
| TW089117256A TW510841B (en) | 1999-08-30 | 2000-08-25 | Polishing apparatus, polishing method and method conditioning polishing pad |
| KR1020000050267A KR20010050233A (en) | 1999-08-30 | 2000-08-29 | Polishing apparatus, polishing method and method of conditioning polishing pad |
| US09/651,299 US6488573B1 (en) | 1999-08-30 | 2000-08-30 | Polishing apparatus, polishing method and method of conditioning polishing pad |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000067799A JP2001260024A (en) | 2000-03-10 | 2000-03-10 | Washing device for dresser device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2001260024A true JP2001260024A (en) | 2001-09-25 |
Family
ID=18586938
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000067799A Pending JP2001260024A (en) | 1999-08-30 | 2000-03-10 | Washing device for dresser device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2001260024A (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007500087A (en) * | 2003-05-29 | 2007-01-11 | ティービーダブリュ インダストリーズ,インコーポレーテッド | Vacuum assist pad conditioning system and method utilizing a conditioning disk with an opening |
| WO2007140111A1 (en) * | 2006-05-26 | 2007-12-06 | 3M Innovative Properties Company | Abrasive brush recovery system and process |
| CN101898328A (en) * | 2009-04-27 | 2010-12-01 | 瑞萨电子株式会社 | Polishing equipment and polishing method |
| JP2014034064A (en) * | 2012-08-07 | 2014-02-24 | Ebara Corp | Dresser disc cleaning brush, cleaning device and cleaning method |
| KR102465486B1 (en) * | 2021-10-19 | 2022-11-11 | (주)퓨렉스 | Cleaning apparatus for polishing pad |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP2007500087A (en) * | 2003-05-29 | 2007-01-11 | ティービーダブリュ インダストリーズ,インコーポレーテッド | Vacuum assist pad conditioning system and method utilizing a conditioning disk with an opening |
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| JP2014034064A (en) * | 2012-08-07 | 2014-02-24 | Ebara Corp | Dresser disc cleaning brush, cleaning device and cleaning method |
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| KR102465486B1 (en) * | 2021-10-19 | 2022-11-11 | (주)퓨렉스 | Cleaning apparatus for polishing pad |
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