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JP2000121331A - Optical type hole shape measuring method and apparatus - Google Patents

Optical type hole shape measuring method and apparatus

Info

Publication number
JP2000121331A
JP2000121331A JP29061798A JP29061798A JP2000121331A JP 2000121331 A JP2000121331 A JP 2000121331A JP 29061798 A JP29061798 A JP 29061798A JP 29061798 A JP29061798 A JP 29061798A JP 2000121331 A JP2000121331 A JP 2000121331A
Authority
JP
Japan
Prior art keywords
optical
hole
light
optical system
wall surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP29061798A
Other languages
Japanese (ja)
Other versions
JP4031124B2 (en
Inventor
Nobuhisa Nishioki
暢久 西沖
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Original Assignee
Mitutoyo Corp
Mitsutoyo Kiko Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp, Mitsutoyo Kiko Co Ltd filed Critical Mitutoyo Corp
Priority to JP29061798A priority Critical patent/JP4031124B2/en
Publication of JP2000121331A publication Critical patent/JP2000121331A/en
Application granted granted Critical
Publication of JP4031124B2 publication Critical patent/JP4031124B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PROBLEM TO BE SOLVED: To achieve a measurement of the correct diameter of a hole by using two images different in the length of the optical path to remove image distortions associated with axial deviation. SOLUTION: An inner circumference wall surface of a hole 2 to be measured is irradiated from a light source by an irradiation optical system and reflected light on the wall surface is caught as observation images individually with an image surface 1 and an image surface 2 arranged at positions different in the length of the optical path thereof. Spatial position P of a reflection point on the wall surface is determined based on an angle β of the reflected light determined from position information θ, R1 and R2 in the image surfaces 1-2, the angle α of the known irradiation luminous flux and the layout dimensions R0, L1 and L2 of the optical system to measure the shape of the hole 2 to be measured from the spatial position information.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、たとえば、微小径
孔の内径測定などに適用される光学式孔形状測定方法お
よび測定装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical hole shape measuring method and a measuring apparatus applied to, for example, measuring the inner diameter of a minute hole.

【0002】[0002]

【背景技術】孔の内面を接触手段により直接測定するに
は、測定子の大きさにより測定可能な孔径に大きな制約
がある。そのため、小径孔の内径測定には、光学式測定
顕微鏡や投影機による非接触式測定方法が広く用いられ
ている。しかし、この場合、測定対象となるのは孔端面
の形状で孔形状を代表できるような薄い板状の被測定物
にあけられたアスペクト比(孔の長さ/内径)の低い小
径孔に限られる。
2. Description of the Related Art To directly measure the inner surface of a hole by a contact means, there is a great limitation on the measurable hole diameter depending on the size of a probe. Therefore, a non-contact measurement method using an optical measurement microscope or a projector is widely used for measuring the inner diameter of the small-diameter hole. However, in this case, the measurement target is limited to a small-diameter hole having a low aspect ratio (hole length / inner diameter) formed in a thin plate-shaped object to be measured that can represent the hole shape by the shape of the hole end face. Can be

【0003】これに対して、アスペクト比の高い微小径
孔を測定するために、特開平8−43032号公報(長
野県精密工業試験所)、あるいは、特願平9−1059
17号(株式会社ミツトヨ)などが提案されている。こ
れらの方法はいずれも、図1に示すように、所定の拡大
率mで得られた観察像の径rから、リング状光束の開き
角αおよび光学系配置寸法fを用いて、被測定物1の孔
2の径Rを求める方法である。すなわち、この測定方法
は、孔2の内部を光が通過するときの孔2内面での正反
射光を利用したものであり、反射光により形成した像の
形状から、反射位置の光軸中心からの距離Rを孔2の半
径方向寸法とみなして孔径を導くことで、非常にアスペ
クト比の高い微小径孔の測定を可能にしている。
On the other hand, in order to measure a fine hole having a high aspect ratio, Japanese Patent Application Laid-Open No. H8-43032 (Nagano Precision Industrial Laboratory) or Japanese Patent Application No. 9-1059 has been proposed.
No. 17 (Mitutoyo Corporation) and the like have been proposed. In any of these methods, as shown in FIG. 1, an object to be measured is obtained from a diameter r of an observation image obtained at a predetermined magnification m by using an opening angle α of a ring-shaped light beam and an optical system arrangement dimension f. In this method, the diameter R of the first hole 2 is obtained. That is, this measuring method utilizes specularly reflected light on the inner surface of the hole 2 when light passes through the inside of the hole 2, and from the shape of the image formed by the reflected light, from the optical axis center of the reflection position. The distance R is regarded as the radial dimension of the hole 2 to derive the hole diameter, thereby enabling measurement of a very small hole having an extremely high aspect ratio.

【0004】[0004]

【発明が解決しようとする課題】しかし、上述の方法で
は、入射光の角度(入射角)と反射光の角度(反射角)
とが同じでなければならず、図2に示すように、光学系
の光軸中心に対して孔2の内面が傾いていると誤差を生
ずる。微小に傾くことによる径の変化はわずかでも、反
射光軸の角度変動からくる光てこ効果により、図(観察
像の図)の破線で示す実際の断面形状に対して、実線で
示す観察像の変動が顕著となる。
However, in the above method, the angle of incident light (incident angle) and the angle of reflected light (reflection angle)
Must be the same, and an error occurs if the inner surface of the hole 2 is inclined with respect to the center of the optical axis of the optical system as shown in FIG. Even if the change in diameter due to the slight tilt is slight, the light leverage effect resulting from the angle change of the reflected optical axis causes the actual cross-sectional shape of the observation image shown by the solid line to be compared with the actual cross-sectional shape shown by the broken line in the figure (viewed image). The fluctuation becomes remarkable.

【0005】たとえば、被測定物1の光軸に対する姿勢
は、オフセット、ピッチ角、ヨー角で規定されるが、紙
面に垂直な軸向りの傾きをピッチングとすると、図2は
ヨー角0°でピッチ角が生じた場合を示している。も
し、ヨー角が0°でなければ、図2における観察像形状
にはさらに歪みが加わる。
For example, the posture of the DUT 1 with respect to the optical axis is defined by an offset, a pitch angle, and a yaw angle. If the inclination in the direction of an axis perpendicular to the plane of the paper is pitching, FIG. Shows a case where a pitch angle occurs. If the yaw angle is not 0 °, the observed image shape in FIG. 2 is further distorted.

【0006】実際の測定においては、孔2のテーパや曲
がりなど、孔内面は孔径の変化に伴って必ず傾きの変化
を有する。また、孔形状の詳細が元々不明であるのに、
被測定物1の軸心のずれ量を既知量以下に抑えるという
のは不可能である。それゆえ、光学的手法を小径孔の内
径測定に適用するには注意が必要であり、たとえば、テ
ーパ孔を測定するときは同じテーパ角を有する標準試料
での校正を行うなどの処置が必要である。
In actual measurement, the inner surface of the hole, such as the taper or bend of the hole 2, always changes in inclination with a change in the hole diameter. Also, although the details of the hole shape were originally unknown,
It is impossible to suppress the deviation amount of the axis of the DUT 1 to a known amount or less. Therefore, care must be taken when applying the optical method to the measurement of the inner diameter of a small-diameter hole.For example, when measuring a tapered hole, measures such as performing calibration with a standard sample having the same taper angle are required. is there.

【0007】本発明の目的は、光路長の異なる二つの像
を用いて測定することにより、軸ずれに伴う画像歪みを
除去して正確な孔形状を測定できるようにした光学式孔
形状測定方法および測定装置を提供することにある。
SUMMARY OF THE INVENTION It is an object of the present invention to provide an optical hole shape measuring method capable of accurately measuring a hole shape by removing an image distortion caused by an axis deviation by measuring using two images having different optical path lengths. And a measuring device.

【0008】[0008]

【課題を解決するための手段】上記目的を達成するた
め、本発明の光学式孔形状測定方法は、光束を照射光学
系により測定対象孔の内周壁面に照射し、この壁面にお
ける反射光を観察光学系で観察像として捉え、この観察
像の像面における位置情報から前記測定対象孔の形状を
測定する光学式孔形状測定方法において、前記反射光の
光路長が異なる位置で、それぞれ前記壁面における反射
光を観察像として捉え、この各観察像の像面における位
置情報から求めた前記反射光の光軸に対する角度、前記
照射光束の光軸に対する角度および前記光学系の配置寸
法から、前記壁面における反射点の空間位置を求め、こ
の空間位置情報により前記測定対象孔の形状を測定する
ことを特徴とする。
In order to achieve the above object, an optical hole shape measuring method of the present invention irradiates a light beam to an inner peripheral wall surface of a hole to be measured by an irradiation optical system, and reflects reflected light on the wall surface. In an optical hole shape measuring method in which an observation optical system captures the observation image as an observation image and measures the shape of the measurement target hole from position information on the image plane of the observation image, the position of the light path of the reflected light is different at the wall surface. From the reflected light at the image plane of the observation light, the angle of the reflected light with respect to the optical axis, the angle with respect to the optical axis of the illuminating light beam, and the arrangement dimensions of the optical system. The spatial position of the reflection point is obtained, and the shape of the hole to be measured is measured based on the spatial position information.

【0009】従って、本発明の測定方法では、反射光の
光路長が異なる位置で捉えられた2つの観察像の像面に
おける位置情報から反射光の光軸に対する角度を求め、
これと、既知の値、つまり、照射光束の光軸に対する角
度および前記光学系の配置寸法から、前記壁面における
反射点の空間位置を求めて測定対象孔の形状を測定する
ようにしているから、被測定物の軸線が光軸中心に一致
しなくても、2つの像から被測定物の軸方向ずれに伴う
画像歪みを除去でき、面倒な位置決めをすることなく精
度よく孔形状を測定できる。
Therefore, in the measuring method of the present invention, the angle of the reflected light with respect to the optical axis is obtained from the position information on the image plane of the two observation images captured at the positions where the optical path lengths of the reflected light are different,
From this and the known value, that is, from the angle with respect to the optical axis of the irradiation light beam and the arrangement dimensions of the optical system, the spatial position of the reflection point on the wall surface is determined to measure the shape of the measurement target hole, Even if the axis of the measured object does not coincide with the center of the optical axis, image distortion due to the axial displacement of the measured object can be removed from the two images, and the hole shape can be measured accurately without complicated positioning.

【0010】以上の測定方法において、前記各観察像の
光強度の極大値または受光領域の中央値を前記位置情報
とすれば、受像した輪郭の大きさに伴う誤差を極小とす
ることができる。また、前記測定対象孔を有する被測定
物の前記光学系の光軸に対するオフセットおよび傾き角
を一定に保ちながら、前記光学系の光軸方向へ前記被測
定物を平行移動させて、前記測定対象孔の軸方向に変化
する形状を測定すれば、被測定物の測定対象孔の軸方向
全体の孔形状を測定できる。
In the above measurement method, if the maximum value of the light intensity of each of the observation images or the median value of the light receiving area is used as the position information, an error associated with the size of the received contour can be minimized. Further, while maintaining a constant offset and tilt angle of the object to be measured having the hole to be measured with respect to the optical axis of the optical system, the object to be measured is translated in the optical axis direction of the optical system, and By measuring the shape of the hole that changes in the axial direction, it is possible to measure the entire shape of the hole to be measured of the measured object in the axial direction.

【0011】本発明の光学式孔形状測定装置は、光束を
測定対象孔の内周壁面に照射し、この壁面における反射
光を観察像として捉え、この観察像の像面における位置
情報から前記測定対象孔の形状を測定する光学式孔形状
測定装置において、光源からの光を光軸に対して所定の
角度で傾斜する光束に生成して測定対象孔の内周壁面に
照射する照射光学系と、前記反射光の光路長さが異なる
位置に対応してそれぞれ配置された複数の位置検出手段
を有し、前記壁面における反射光の観察像をそれぞれ二
次元の位置情報として捉える観察光学系と、この観察光
学系の各位置検出手段で捉えられた観察像の像面におけ
る位置情報から求めた前記反射光の光軸に対する角度、
前記照射光束の光軸に対する角度および前記光学系の配
置寸法から、前記壁面における反射点の空間位置を求
め、この空間位置情報により前記測定対象孔の形状を測
定する演算手段とを備えたことを特徴とする。
The optical hole shape measuring apparatus of the present invention irradiates a light beam on the inner peripheral wall surface of the hole to be measured, captures the reflected light on the wall surface as an observation image, and performs the measurement from position information of the observation image on the image plane. In an optical hole shape measuring device for measuring the shape of the target hole, an irradiation optical system that generates light from a light source into a light beam inclined at a predetermined angle with respect to the optical axis and irradiates the inner peripheral wall surface of the target hole with An observation optical system having a plurality of position detection means arranged respectively corresponding to positions where the optical path length of the reflected light is different, and capturing an observation image of the reflected light on the wall surface as two-dimensional position information, Angle with respect to the optical axis of the reflected light obtained from position information on the image plane of the observation image captured by each position detection means of this observation optical system,
Computing means for determining a spatial position of a reflection point on the wall surface from an angle of the irradiation light beam with respect to an optical axis and an arrangement size of the optical system, and measuring a shape of the measurement target hole based on the spatial position information. Features.

【0012】従って、本発明の測定装置によれば、反射
光の光路長さが異なる位置に対応して位置検出手段をそ
れぞれ配置し、この各位置検出手段で捉えられた観察像
の像面における位置情報から求めた前記反射光の光軸に
対する角度、前記照射光束の光軸に対する角度および前
記光学系の配置寸法から、前記壁面における反射点の空
間位置を求めて測定対象孔の形状を測定するようにして
いるから、被測定物の軸線が光軸中心に一致しなくて
も、2つの像から被測定物の軸方向ずれに伴う画像歪み
を除去でき、面倒な位置決めをすることなく精度よく孔
形状を測定できる。
Therefore, according to the measuring apparatus of the present invention, the position detecting means are respectively arranged corresponding to the positions where the optical path lengths of the reflected light are different, and the position of the observation image captured by each of the position detecting means is reduced. From the angle of the reflected light with respect to the optical axis obtained from the position information, the angle of the irradiation light beam with respect to the optical axis, and the arrangement size of the optical system, the spatial position of the reflection point on the wall surface is obtained to measure the shape of the hole to be measured. Therefore, even if the axis of the DUT does not coincide with the center of the optical axis, image distortion due to the axial displacement of the DUT can be removed from the two images with high accuracy without troublesome positioning. The hole shape can be measured.

【0013】以上の測定装置において、前記照射光学系
は、たとえば、光源からの光を開き角を有するリング状
平行光に生成するリング状平行光生成手段と、このリン
グ状平行光生成手段からのリング状平行光を所定の開き
角を有するリング状円錐光束に生成して測定対象孔の内
周壁面に照射する第1のレンズ手段とを含む構成が望ま
しい。このような構成とすれば、測定対象孔の内面全周
に光束を同時に照射できるから、その測定対象孔の形状
を能率的に測定できる。
In the above measuring apparatus, the irradiation optical system includes, for example, a ring-shaped parallel light generating means for generating light from a light source into a ring-shaped parallel light having an open angle, It is preferable that the first lens unit be configured to generate the ring-shaped parallel light into a ring-shaped conical light beam having a predetermined opening angle and irradiate the inner peripheral wall surface of the measurement target hole. With such a configuration, since the light beam can be simultaneously irradiated on the entire inner surface of the measurement target hole, the shape of the measurement target hole can be efficiently measured.

【0014】また、前記観察光学系は、たとえば、前記
壁面における反射光を受ける第2のレンズ手段と、この
第2のレンズ手段を透過した光を複数の光路に分割する
ビームスプリッタ手段と、このビームスプリッタ手段に
よって分割された各光路上において光路長さの異なる位
置にそれぞれ配置された複数の二次元画像センサとを含
む構成が望ましい。このような構成とすれば、一部の光
路を共有できるから、コスト的にも安価に、かつ、全体
にコンパクト化できる。
Further, the observation optical system includes, for example, a second lens means for receiving the reflected light on the wall surface, a beam splitter means for splitting the light transmitted through the second lens means into a plurality of optical paths, Desirably, a configuration including a plurality of two-dimensional image sensors arranged at positions having different optical path lengths on each optical path divided by the beam splitter means is provided. With such a configuration, a part of the optical path can be shared, so that the cost can be reduced and the whole can be made compact.

【0015】この際、前記二次元画像センサで受像され
る観察像の光強度の極大値または受光領域の中央値を前
記位置情報とすれば、受像した輪郭の大きさに伴う誤差
を極小とすることができる。また、前記被測定物を前記
光学系の光軸方向へ平行移動させる移動手段と、この移
動手段による被測定物の移動量を検出する移動量検出手
段とを備える構成とすれば、被測定物の測定対象孔の軸
方向各部における孔形状の測定が可能となり、直線状の
円孔のほかにテーパ孔の形状も測定できる。
At this time, if the maximum value of the light intensity of the observation image received by the two-dimensional image sensor or the median value of the light receiving area is used as the position information, an error associated with the size of the received contour is minimized. be able to. Further, if the moving object for moving the object to be measured in parallel in the optical axis direction of the optical system and the moving amount detecting means for detecting the moving amount of the object to be measured by the moving unit are provided, It is possible to measure the shape of the hole at each portion in the axial direction of the hole to be measured, and to measure the shape of the tapered hole in addition to the linear circular hole.

【0016】[0016]

【発明の実施の形態】以下、本発明の好ましい実施の形
態につき、添付図面を参照して詳細に説明する。まず、
本発明の測定原理を図3を用いて説明する。同図におい
て、開き角度α(光軸中心とのなす角)が既知であるリ
ング状光束を照射光学系により生成し、被測定物1の測
定対象孔2の内面に対して入射させる。被測定物1が、
光軸中心上にある極座標原点から見て、オフセツトN、
距離M、最大傾き角γに位置決めされるとき、これらの
N、M、γに依存せず測定対象孔2の形状を求めること
が本発明の課題である。
Preferred embodiments of the present invention will be described below in detail with reference to the accompanying drawings. First,
The measurement principle of the present invention will be described with reference to FIG. In the figure, a ring-shaped light beam having a known opening angle α (the angle formed with the center of the optical axis) is generated by an irradiation optical system, and is incident on the inner surface of a measurement target hole 2 of the DUT 1. The DUT 1 is
When viewed from the polar coordinate origin on the optical axis center, the offset N,
It is an object of the present invention to determine the shape of the measurement target hole 2 without depending on these N, M, and γ when the positioning is performed at the distance M and the maximum inclination angle γ.

【0017】ここでは説明を簡単にするため、孔2の内
面の1ケ所で反射した光についてのみ着目する。図に示
すように、孔2の内面に当って反射した光線は孔2を通
過して反対側に出てくるので、これを観察光学系を用い
て像面上に結像させる。このとき、観察学光学系により
光学的に所定の拡大率で拡大した像を得ることで測定の
分解能が確保される。
Here, for the sake of simplicity, attention is focused only on the light reflected at one point on the inner surface of the hole 2. As shown in the figure, the light beam reflected on the inner surface of the hole 2 passes through the hole 2 and emerges on the opposite side, and is formed into an image on an image plane using an observation optical system. At this time, the resolution of measurement is ensured by obtaining an image optically enlarged at a predetermined magnification by the observational optical system.

【0018】照射光学系の基準位置から距離L1離れた
位置に像面1があるとき、像面1上での反射光による像
の径方向に対する距離はR1となる。同時に、照射光学
系の基準位置から距離L2離れた位置に像面2があれ
ば、像面2上での反射光による像の径方向に対する距離
はR2となる。反射点の位置をPとすると、照射光学系
の基準位置を原点とする極座標系を用いて、P=(R,
L,θ)で表現できる。ここで、θは像面上の二次元位
置を検出することで直接得ることができるので、残った
RとLについて既知量と他の検出量から算出すること
で、Pの位置を幾何学的に特定できる。
When the image plane 1 is located at a distance L1 from the reference position of the irradiation optical system, the distance in the radial direction of the image due to the reflected light on the image plane 1 is R1. At the same time, if the image plane 2 is located at a distance L2 from the reference position of the irradiation optical system, the distance in the radial direction of the image due to the reflected light on the image plane 2 is R2. Assuming that the position of the reflection point is P, using a polar coordinate system whose origin is the reference position of the irradiation optical system, P = (R,
L, θ). Here, since θ can be directly obtained by detecting the two-dimensional position on the image plane, the position of P is geometrically determined by calculating the remaining R and L from known amounts and other detected amounts. Can be specified.

【0019】光軸上の極座標原点から見て、光軸回りの
回転角座標位置θに対応してR1とR2が2つの像の二次
元位置より定まり、このθに対応してtanβも定まる。
このとき、光学系上における上述の被測定物1の位置ず
れ量N、M、γを細かく考慮する必要はない。
When viewed from the polar coordinate origin on the optical axis, R1 and R2 are determined from the two-dimensional positions of the two images corresponding to the rotational angle coordinate position θ about the optical axis, and tan β is determined corresponding to the θ.
At this time, it is not necessary to carefully consider the above-described positional shift amounts N, M, and γ of the DUT 1 on the optical system.

【0020】実際の算出については、像面配置LlとL2
の差(L2−Ll)に対応して変化した像位置R1とR2の
差(R1−R2)から反射光の傾き角度β(光軸中心tの
なす角度)を導けば、既知量α、L1、R0(入射光配
置)と、検出量R1とを用いて、次の式で幾何学的にR
とLとを求めることができる。
For the actual calculation, the image plane arrangements Ll and L2
Is derived from the difference (R1-R2) between the image positions R1 and R2 corresponding to the difference (L2-L1), the known amount α, L1 , R0 (incident light arrangement) and the detected amount R1, the geometrical R
And L can be obtained.

【0021】 R=(R1・tanα+L1・tanα・tanβ+R0・tanβ)/(tanα+tanβ) ……(1) L=(R1−R0+L1・tanβ)/(tanα+tanβ) ……(2) ここで、tanβ=(R1−R2)/(L2−L1)である。
以上のような反射点の位置測定を孔2の内面に対して全
周行うことで、孔形状の座標データ取得による測定を行
っていく。
R = (R1 · tanα + L1 · tanα · tanβ + R0 · tanβ) / (tanα + tanβ) (1) L = (R1−R0 + L1 · tanβ) / (tanα + tanβ) (2) where tanβ = (R1 -R2) / (L2-L1).
By performing the above-described measurement of the position of the reflection point all around the inner surface of the hole 2, measurement is performed by acquiring coordinate data of the hole shape.

【0022】次に、たとえば、Nとγを一定のまま、被
測定物1を光軸方向へ平行移動してMを別な値に位置決
めし、同一のプロセスで測定を繰返して軸方向の形状測
定を行う。これにより、たとえば、テーパ孔のような傾
きを有する孔内面の光学的手法による形状測定も可能で
ある。しかも、光学系に対する被測定物のミスアライメ
ントからくる誤差もなく、従来手法のような正碓な取り
付けは不要となる。
Next, for example, while N and γ are kept constant, the DUT 1 is translated in the direction of the optical axis to position M at another value, and the measurement is repeated in the same process to obtain the shape in the axial direction. Perform the measurement. Thereby, for example, it is possible to measure the shape of the inner surface of the hole having an inclination such as a tapered hole by an optical method. In addition, there is no error due to misalignment of the object to be measured with respect to the optical system, and it is not necessary to mount the device in a conventional manner.

【0023】次に、上述の測定原理を用いて被測定物1
の孔2の内径測定を行うための具体的な装置構成につい
て、図4を用いて説明する。図における孔形状測定装置
は、光源(図示省略)からの光を所定の開き角を有する
リング状円錐光束に形成して前記被測定物1の孔2の内
周壁面に照射する照射光学系11と、前記測定対象孔2
の壁面からの反射光を観察像として捉える観察光学系2
1と、被測定物1をこれらの光学系11,21の光軸方
向へ平行移動させる移動手段31と、装置全体を統括制
御するとともに、観察光学系21から得られた光学情報
を元に前述の計算式を演算処理してその孔形状を算出す
るパソコンなどの演算制御手段41とから構成されてい
る。
Next, the DUT 1 is measured using the above-described measurement principle.
A specific device configuration for measuring the inner diameter of the hole 2 will be described with reference to FIG. The hole shape measuring apparatus shown in the figure is an irradiation optical system 11 for forming light from a light source (not shown) into a ring-shaped conical light beam having a predetermined opening angle and irradiating the inner peripheral wall surface of the hole 2 of the DUT 1. And the hole to be measured 2
Observation optical system that captures the reflected light from the wall as an observation image 2
1, a moving means 31 for moving the device under test 1 in parallel in the optical axis direction of these optical systems 11 and 21, and overall control of the entire apparatus, and the above-described optical information obtained from the observation optical system 21. And an arithmetic control means 41 such as a personal computer for calculating the hole shape by performing an arithmetic operation on the calculation formula.

【0024】前記照射光学系11は、光源からの光を開
き角を有するリング状平行光に生成するリング状平行光
生成手段12と、このリング状平行光生成手段12から
のリング状平行光を所定(既知)の開き角を有するリン
グ状円錐光束に生成して被測定物1の孔2の内面に照射
する第1のレンズ手段13とから構成されている。ここ
で、リング状平行光生成手段12のリング状平行光の生
成方法については、各種あるので説明を省略するが、光
束内部の光強度がなるべく均一なものが望ましい。
The irradiation optical system 11 includes a ring-shaped parallel light generating means 12 for generating light from a light source into a ring-shaped parallel light having an open angle, and a ring-shaped parallel light from the ring-shaped parallel light generating means 12. And a first lens means 13 for generating a ring-shaped conical light beam having a predetermined (known) opening angle and irradiating the inner surface of the hole 2 of the DUT 1. Here, the method of generating the ring-shaped parallel light by the ring-shaped parallel light generating means 12 is not described because there are various methods, but it is desirable that the light intensity inside the light beam is as uniform as possible.

【0025】前記観察光学系21は、前記測定対象孔2
の内周壁面で正反射した光を受ける第2のレンズ手段2
2と、この第2のレンズ手段22からの光を複数(2
つ)の光路に分割するビームスプリッタ手段23と、こ
のビームスプリッタ手段23で分割された各光路中にか
つ反射光の光路長さが異なる位置にそれぞれ配置された
複数(2つ)の位置検出手段としての二次元画像センサ
24,25と、この各二次元画像センサ24,25で得
られた二次元の画像情報を処理する画像処理手段26と
から構成されている。ここで、第2のレンズ手段22
は、その前側焦点面が前記第1のレンズ手段13の後側
焦点面と共有する位置になるように配置されている。そ
の結果、第2のレンズ手段22からの出射光は、ある開
き角をもったリング状平行光として出射される。なお、
第1、第2のレンズ手段13,22の実現方法は、単レ
ンズだけでもよく、複数のレンズの組合せでもよく、あ
るいは、非球面なものを用いてもよい。
The observation optical system 21 is provided with the hole 2 to be measured.
Lens means 2 for receiving light regularly reflected on the inner peripheral wall surface of the lens
2 and a plurality of light beams (2
And a plurality of (two) position detecting means arranged in each of the optical paths divided by the beam splitter means 23 and at positions where the optical path lengths of the reflected light are different. And two-dimensional image sensors 24 and 25, and image processing means 26 for processing two-dimensional image information obtained by the two-dimensional image sensors 24 and 25. Here, the second lens means 22
Are arranged such that the front focal plane is located at a position shared by the rear focal plane of the first lens means 13. As a result, light emitted from the second lens means 22 is emitted as ring-shaped parallel light having a certain opening angle. In addition,
The method of realizing the first and second lens means 13 and 22 may be only a single lens, a combination of a plurality of lenses, or an aspherical lens.

【0026】前記移動手段31は、前記被測定物1を載
置したテーブル32と、このテーブル32を光学系1
1,21の光軸方向へ平行移動させる駆動モータ33と
から構成されている。駆動モータ33の回転角、つま
り、テーブル32の移動量は、ロータリエンコーダなど
の移動量検出手段34によって検出されたのち、演算制
御手段41に入力される。
The moving means 31 includes a table 32 on which the device under test 1 is placed, and the table 32
And a drive motor 33 that translates in the direction of the optical axis 1 and 21. The rotation angle of the drive motor 33, that is, the amount of movement of the table 32 is detected by the amount of movement detection means 34 such as a rotary encoder, and then input to the arithmetic and control means 41.

【0027】演算制御手段41には、予め前述する計算
を実行するための計算ソフトが内蔵され、付属キーボー
ドあるいはマウスなどの入力操作によるソフトの立上げ
により、照射光学系11の光源の起動、画像処理手段2
6からの画像情報の取入れ、駆動モータ33の正逆転駆
動および移動量検出手段34から取入れたデータにより
移動量を検出し、その位置における幾何計算を実行し、
その結果を付属モニタに順次表示する。
The arithmetic control means 41 has built-in calculation software for executing the above-mentioned calculation in advance, and starts up the light source of the irradiation optical system 11 and activates the Processing means 2
6, the amount of movement is detected by the forward / reverse rotation drive of the drive motor 33 and the data taken from the amount of movement detection means 34, and the geometric calculation at that position is executed.
The results are sequentially displayed on the attached monitor.

【0028】以上において、計算ソフトの起動により、
次の測定モードが実行される。まず、照射光学系11に
おいて、リング状平行光生成手段12からのリング状平
行光を第1のレンズ手段13によって既知の開き角を有
するリング状円錐光束を生成し、その生成したリング状
円錐光束を被測定物1の測定対象孔2の内周壁面に導
く。このとき、リング状円錐光束は孔2の内面の近傍で
焦点f1を結ぶようにする。これは、照射される範囲を
狭くして測定位置の確度を上げるためであり、孔内面上
に必ず集光させる必要はない。
In the above, by starting the calculation software,
The next measurement mode is executed. First, in the irradiation optical system 11, the ring-shaped parallel light from the ring-shaped parallel light generating means 12 is converted into a ring-shaped conical light beam having a known opening angle by the first lens means 13, and the generated ring-shaped conical light beam is generated. Is guided to the inner peripheral wall surface of the measurement target hole 2 of the DUT 1. At this time, the ring-shaped conical light beam is focused on the focal point f1 near the inner surface of the hole 2. This is to increase the accuracy of the measurement position by narrowing the irradiation range, and it is not always necessary to condense light on the inner surface of the hole.

【0029】孔2の内面で正反射した光は、第2のレン
ズ手段22によって、ある開き角を持つリング状平行光
とされ、ビームスプリッタ手段23に達する。すると、
リング状平行光は、ビームスプリッタ手段23により透
過光と反射光とに分割され、それぞれ二次元画像センサ
24,25により受像される。
The light specularly reflected on the inner surface of the hole 2 is converted into a ring-shaped parallel light having a certain opening angle by the second lens means 22 and reaches the beam splitter means 23. Then
The ring-shaped parallel light is split by the beam splitter means 23 into transmitted light and reflected light, and received by the two-dimensional image sensors 24 and 25, respectively.

【0030】二次元画像センサ24,25に結像する検
出画像は、それぞれ先の図3に示したスクリーンイメー
ジ図形と同様のリング状分布で検出され、画像処理手段
26により、光軸中心からのX,Y座標分布を持つ電気
信号に変換され、演算制御手段41に取入られる。
The detected images formed on the two-dimensional image sensors 24 and 25 are detected in the same ring-shaped distribution as the screen image figure shown in FIG. 3, and are detected by the image processing means 26 from the center of the optical axis. The signal is converted into an electric signal having X, Y coordinate distribution, and is taken into the arithmetic and control unit 41.

【0031】演算制御手段41は、取込んだ画像データ
より、原点位置から0〜360°の範囲を掃引しながら
それぞれの半径R1,R2(図3参照)を計測し、そこか
ら導いたβを用いて前述の幾何計算式に代入し、反射点
の極座標位置P(R,L,θ)を求める。つまり、孔2
に入射させるリング状円錐光束の開き角は光源側で生成
したリング状平行光と第1のレンズ手段13の特性値よ
り既知であるので、光学系配置寸法より前述の測定原理
に基づき孔形状の測定を行える。
The arithmetic control means 41 measures the respective radii R1, R2 (see FIG. 3) while sweeping a range of 0 to 360 ° from the origin position from the captured image data, and calculates β derived therefrom. Then, the polar coordinate position P (R, L, θ) of the reflection point is obtained by substituting the above into the above-described geometric calculation formula. That is, hole 2
Since the opening angle of the ring-shaped conical light beam incident on the light source is known from the ring-shaped parallel light generated on the light source side and the characteristic value of the first lens means 13, the aperture shape of the hole shape is determined based on the above-described measurement principle based on the arrangement dimensions of the optical system. Perform measurements.

【0032】なお、二次元画像センサ24,25で受像
されるリング状光束により検出される情報からR1およ
びR2の値を決定するには、センサ24,25面上でθ
を指定したときに検出される受光領域幅に対して、受光
領域内の輝度分布から求めた光線の中心位置を用いる。
たとえば、受光領域の輝度分布がガウシアン分布してい
れば輝度最大となる位置を用いればよいし、受光領域の
中央位置を用いても大差はない。もし、受光領域の輝度
分布が一様であれば受光領域の中央位置を用いるのが妥
当である。
In order to determine the values of R1 and R2 from the information detected by the ring-shaped light beams received by the two-dimensional image sensors 24 and 25, θ
The center position of the light beam obtained from the brightness distribution in the light receiving area is used for the light receiving area width detected when is designated.
For example, if the luminance distribution of the light receiving area is a Gaussian distribution, the position where the luminance is maximum may be used, and there is not much difference even if the center position of the light receiving area is used. If the brightness distribution of the light receiving area is uniform, it is appropriate to use the center position of the light receiving area.

【0033】以上の位置を定めるための細線化処理は、
画像処理手段26で行うか、演算制御手段41側のいず
れでも行うことができ、演算制御手段41は、その細線
化された座標データを元に前述の演算を実行する。ま
た、演算制御手段41は、テーブル32をその計測原点
位置から駆動モータ33を駆動しつつ、その移動量を検
出し、その移動位置における前記計測および演算を繰返
すことにより、孔2の奥行方向における全ての観察像の
リング状パターンをモニタしつつ反射点の極座標位置P
(R,L,θ)を求め、その演算結果を付属モニタに順
次表示する。
The thinning processing for determining the position is as follows.
The calculation can be performed by the image processing unit 26 or by the calculation control unit 41. The calculation control unit 41 executes the above-described calculation based on the thinned coordinate data. The arithmetic control means 41 detects the amount of movement of the table 32 while driving the drive motor 33 from the measurement origin position, and repeats the measurement and calculation at the movement position, thereby obtaining the table 32 in the depth direction of the hole 2. Polar coordinate position P of reflection point while monitoring the ring pattern of all observed images
(R, L, θ) are obtained, and the calculation results are sequentially displayed on an attached monitor.

【0034】以上の測定モードは、テーブル32が原点
位置から限界位置まで平行移動するまで継続し、限界位
置、すなわち、孔の後端または最前部側であって、反射
パターンがないと判断されると、演算制御手段41は駆
動モータ33の駆動を停止し、再びテーブル32を測定
原点位置に戻す制御がなされ、テーブル32が原点位置
に復帰した後、モニタに終了が表示される。
The above measurement mode is continued until the table 32 moves in parallel from the origin position to the limit position, and it is determined that there is no reflection pattern at the limit position, that is, at the rear end or the frontmost side of the hole. Then, the arithmetic and control unit 41 stops the driving of the drive motor 33 and performs control to return the table 32 to the measurement origin position again. After the table 32 returns to the origin position, the end is displayed on the monitor.

【0035】なお、以上の演算結果の表示形態として
は、計算ソフトのアルゴリズムに応じて、たとえば、被
測定物1の孔2が円孔であれば、その平均半径または直
径、真円度、最大および最小値、偏差値、孔の奥行ある
いは深さなどの数値表示のほかに、二次元ないしは三次
元図形なども併せて表示できる。また、テーパ孔であれ
ば、そのテーパ角度なども表示できることは勿論であ
る。
As the display form of the above calculation results, for example, if the hole 2 of the DUT 1 is a circular hole, its average radius or diameter, roundness, maximum In addition to displaying numerical values such as a minimum value, a deviation value, and the depth or depth of a hole, a two-dimensional or three-dimensional figure can also be displayed. Also, if a tapered hole is used, the taper angle and the like can be displayed.

【0036】終了表示後は、キーボードまたはマウス操
作により終了処理、あるいは必要に応じて保存処理後、
終了処理を実行すれば、再び計測モード待機状態とな
る。さらに、本実施形態では、演算制御手段41として
パソコンを用いたが、専用の処理装置に代替えできるこ
とは勿論である。
After the end display, the end processing is performed by operating the keyboard or the mouse, or the storage processing is performed as necessary.
When the end processing is performed, the measurement mode standby state is set again. Further, in the present embodiment, a personal computer is used as the arithmetic control means 41, but it is needless to say that a dedicated processing device can be used instead.

【0037】[0037]

【発明の効果】以上のように、本発明による光学式孔形
状測定方法および測定装置によれば、被測定物の軸線と
光軸中心が一致しなくても、二つの像から被測定物の軸
方向ずれに伴う画像歪みを除去でき、面倒な位置決めを
することなく精度のよい孔形状の測定を行うことができ
る。
As described above, according to the optical hole shape measuring method and measuring apparatus according to the present invention, even if the axis of the object and the center of the optical axis do not coincide with each other, the object can be measured from the two images. Image distortion due to axial displacement can be removed, and accurate hole shape measurement can be performed without complicated positioning.

【図面の簡単な説明】[Brief description of the drawings]

【図1】従来技術の概念を示す説明図である。FIG. 1 is an explanatory diagram showing the concept of a conventional technique.

【図2】同従来技術の不具合を示す説明図である。FIG. 2 is an explanatory diagram showing a defect of the conventional technique.

【図3】本発明方法の測定原理を示す説明図である。FIG. 3 is an explanatory view showing a measurement principle of the method of the present invention.

【図4】本発明の装置構成を示す説明図である。FIG. 4 is an explanatory diagram showing a device configuration of the present invention.

【符号の説明】[Explanation of symbols]

1 被測定物 2 測定対象孔 11 照射光学系 12 リング状平行光生成手段 13 第1のレンズ手段 21 観察光学系 22 第2のレンズ手段 23 ビームスプリッタ手段 24 二次元画像センサ(位置検出手段) 25 二次元画像センサ(位置検出手段) 26 画像処理手段 31 相対移動手段 32 テーブル 33 駆動モータ 34 移動量検出手段 41 演算制御手段(演算手段) REFERENCE SIGNS LIST 1 object to be measured 2 measurement target hole 11 irradiation optical system 12 ring-shaped parallel light generating means 13 first lens means 21 observation optical system 22 second lens means 23 beam splitter means 24 two-dimensional image sensor (position detecting means) 25 Two-dimensional image sensor (position detecting means) 26 Image processing means 31 Relative moving means 32 Table 33 Drive motor 34 Moving amount detecting means 41 Calculation control means (Calculating means)

Claims (8)

【特許請求の範囲】[Claims] 【請求項1】 光束を照射光学系により測定対象孔の内
周壁面に照射し、この壁面における反射光を観察光学系
で観察像として捉え、この観察像の像面における位置情
報から前記測定対象孔の形状を測定する光学式孔形状測
定方法において、 前記反射光の光路長が異なる位置で、それぞれ前記壁面
における反射光を観察像として捉え、この各観察像の像
面における位置情報から求めた前記反射光の光軸に対す
る角度、前記照射光束の光軸に対する角度および前記光
学系の配置寸法から、前記壁面における反射点の空間位
置を求め、この空間位置情報により前記測定対象孔の形
状を測定することを特徴とする光学式孔形状測定方法。
1. An irradiation optical system irradiates an inner peripheral wall surface of a measurement object hole with a light beam, a reflected light on the wall surface is captured as an observation image by an observation optical system, and the measurement object is obtained from position information of the observation image on an image plane. In the optical hole shape measuring method for measuring the shape of the hole, at positions where the optical path lengths of the reflected light are different, the reflected light on the wall surface is captured as an observation image, and the position is obtained from positional information on the image plane of each observation image. From the angle of the reflected light with respect to the optical axis, the angle of the irradiation light beam with respect to the optical axis, and the arrangement dimensions of the optical system, the spatial position of the reflection point on the wall surface is determined, and the shape of the measurement target hole is measured based on the spatial position information. An optical hole shape measuring method.
【請求項2】 請求項1に記載の光学式孔形状測定方法
において、 前記各観察像の光強度の極大値または受光領域の中央値
を前記位置情報とすることを特徴とする光学式孔形状測
定方法。
2. The optical hole shape measuring method according to claim 1, wherein a maximum value of the light intensity of each of the observed images or a median value of a light receiving area is used as the position information. Measuring method.
【請求項3】 請求項1または請求項2に記載の光学式
孔形状測定方法において、 前記測定対象孔を有する被測定物の前記光学系の光軸に
対するオフセットおよび傾き角を一定に保ちながら、前
記光学系の光軸方向へ前記被測定物を平行移動させて、
前記測定対象孔の軸方向に変化する形状を測定すること
を特徴とする光学式孔形状測定方法。
3. The optical hole shape measuring method according to claim 1, wherein an offset and a tilt angle of an object to be measured having the hole to be measured with respect to an optical axis of the optical system are kept constant. Translate the object to be measured in the optical axis direction of the optical system,
An optical hole shape measuring method, wherein a shape of the hole to be measured that changes in the axial direction is measured.
【請求項4】 光束を測定対象孔の内周壁面に照射し、
この壁面における反射光を観察像として捉え、この観察
像の像面における位置情報から前記測定対象孔の形状を
測定する光学式孔形状測定装置において、 光源からの光を光軸に対して所定の角度で傾斜する光束
に生成して測定対象孔の内周壁面に照射する照射光学系
と、 前記反射光の光路長さが異なる位置に対応してそれぞれ
配置された複数の位置検出手段を有し、前記壁面におけ
る反射光の観察像をそれぞれ二次元の位置情報として捉
える観察光学系と、 この観察光学系の各位置検出手段で捉えられた観察像の
像面における位置情報から求めた前記反射光の光軸に対
する角度、前記照射光束の光軸に対する角度および前記
光学系の配置寸法から、前記壁面における反射点の空間
位置を求め、この空間位置情報により前記測定対象孔の
形状を測定する演算手段とを備えたことを特徴とする光
学式孔形状測定装置。
4. A method for irradiating a light beam on an inner peripheral wall surface of a hole to be measured,
In an optical hole shape measuring apparatus which captures reflected light on the wall surface as an observation image and measures the shape of the measurement target hole from position information on the image plane of the observation image, the light from the light source is directed to a predetermined position with respect to the optical axis. It has an irradiation optical system that generates a light beam inclined at an angle and irradiates the inner peripheral wall surface of the measurement target hole, and a plurality of position detection means respectively arranged corresponding to positions where the optical path length of the reflected light is different. An observation optical system that captures the observation image of the reflected light on the wall surface as two-dimensional position information, and the reflected light obtained from the position information on the image plane of the observation image captured by each position detection unit of the observation optical system. From the angle with respect to the optical axis, the angle of the irradiation light beam with respect to the optical axis, and the arrangement size of the optical system, the spatial position of the reflection point on the wall surface is obtained, and the spatial position information is used to determine the shape of the hole to be measured. Optical hole shape measuring apparatus characterized by comprising a calculating means for measuring.
【請求項5】 請求項4に記載の光学式孔形状測定装置
において、 前記照射光学系は、光源からの光を開き角を有するリン
グ状平行光に生成するリング状平行光生成手段と、この
リング状平行光生成手段からのリング状平行光を所定の
開き角を有するリング状円錐光束に生成して測定対象孔
の内周壁面に照射する第1のレンズ手段とから構成され
ていることを特徴とする光学式孔形状測定装置。
5. The optical hole shape measuring apparatus according to claim 4, wherein the irradiation optical system generates ring-shaped parallel light generating means for generating light from a light source into ring-shaped parallel light having an open angle. And first lens means for generating ring-shaped parallel light from the ring-shaped parallel light generating means into a ring-shaped conical light beam having a predetermined opening angle and irradiating the inner peripheral wall surface of the measurement target hole. Characteristic optical hole shape measuring device.
【請求項6】 請求項4または請求項5に記載の光学式
孔形状測定装置において、 前記観察光学系は、前記壁面における反射光を受ける第
2のレンズ手段と、この第2のレンズ手段を透過した光
を複数の光路に分割するビームスプリッタ手段と、この
ビームスプリッタ手段によって分割された各光路上にお
いて光路長さの異なる位置にそれぞれ配置された複数の
二次元画像センサとから構成されていることを特徴とす
る光学式孔形状測定装置。
6. The optical hole shape measuring apparatus according to claim 4, wherein the observation optical system includes a second lens unit that receives light reflected on the wall surface, and the second lens unit. It is composed of beam splitter means for splitting transmitted light into a plurality of optical paths, and a plurality of two-dimensional image sensors arranged at positions having different optical path lengths on each optical path split by the beam splitter means. An optical hole shape measuring device, characterized in that:
【請求項7】 請求項5に記載の光学式孔形状測定装置
において、 前記二次元画像センサで受像される観察像の光強度の極
大値または受光領域の中央値を前記位置情報とすること
を特徴とする光学式孔形状測定装置。
7. The optical hole shape measuring apparatus according to claim 5, wherein a maximum value of the light intensity of the observation image received by the two-dimensional image sensor or a median value of a light receiving region is set as the position information. Characteristic optical hole shape measuring device.
【請求項8】 請求項4ないし請求項7のいずれかに記
載の光学式孔形状測定装置において、 前記被測定物を前記光学系の光軸方向へ平行移動させる
移動手段と、この移動手段による被測定物の移動量を検
出する移動量検出手段とが設けられていることを特徴と
する光学式孔形状測定装置。
8. The optical hole shape measuring apparatus according to claim 4, wherein said moving means moves said object to be translated in a direction parallel to an optical axis of said optical system, and said moving means comprises: An optical hole shape measuring apparatus, comprising: a moving amount detecting means for detecting a moving amount of an object to be measured.
JP29061798A 1998-10-13 1998-10-13 Optical hole shape measuring method and measuring apparatus Expired - Fee Related JP4031124B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP29061798A JP4031124B2 (en) 1998-10-13 1998-10-13 Optical hole shape measuring method and measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP29061798A JP4031124B2 (en) 1998-10-13 1998-10-13 Optical hole shape measuring method and measuring apparatus

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113175318A (en) * 2021-04-13 2021-07-27 中国石油天然气股份有限公司 Well wall hole size measuring device and method with positioning function
CN115451880A (en) * 2022-09-29 2022-12-09 西安理工大学 Method for identifying installation error of large gear

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113175318A (en) * 2021-04-13 2021-07-27 中国石油天然气股份有限公司 Well wall hole size measuring device and method with positioning function
CN113175318B (en) * 2021-04-13 2023-10-31 中国石油天然气股份有限公司 Borehole wall eyelet size measuring method with positioning function
CN115451880A (en) * 2022-09-29 2022-12-09 西安理工大学 Method for identifying installation error of large gear

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