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IN2015KN00605A - - Google Patents

Info

Publication number
IN2015KN00605A
IN2015KN00605A IN605KON2015A IN2015KN00605A IN 2015KN00605 A IN2015KN00605 A IN 2015KN00605A IN 605KON2015 A IN605KON2015 A IN 605KON2015A IN 2015KN00605 A IN2015KN00605 A IN 2015KN00605A
Authority
IN
India
Prior art keywords
inspection device
disposed
inspection
downstream
inspected
Prior art date
Application number
Other languages
English (en)
Inventor
Takanori Kiritoshi
Makoto Sato
Keiji Tsujita
Original Assignee
Kawasaki Heavy Ind Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kawasaki Heavy Ind Ltd filed Critical Kawasaki Heavy Ind Ltd
Publication of IN2015KN00605A publication Critical patent/IN2015KN00605A/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Re-Forming, After-Treatment, Cutting And Transporting Of Glass Products (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IN605KON2015 2012-08-13 2012-08-13 IN2015KN00605A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2012/005145 WO2014027375A1 (fr) 2012-08-13 2012-08-13 Unité de vérification de plaque de verre et équipement de fabrication

Publications (1)

Publication Number Publication Date
IN2015KN00605A true IN2015KN00605A (fr) 2015-07-17

Family

ID=49907887

Family Applications (1)

Application Number Title Priority Date Filing Date
IN605KON2015 IN2015KN00605A (fr) 2012-08-13 2012-08-13

Country Status (6)

Country Link
JP (1) JP5923172B2 (fr)
KR (1) KR101697216B1 (fr)
CN (2) CN203396363U (fr)
IN (1) IN2015KN00605A (fr)
TW (1) TWI486578B (fr)
WO (1) WO2014027375A1 (fr)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014027375A1 (fr) * 2012-08-13 2014-02-20 川崎重工業株式会社 Unité de vérification de plaque de verre et équipement de fabrication
JP2017032523A (ja) * 2015-08-06 2017-02-09 株式会社オハラ 光学ガラス母材欠陥検査装置及び光学ガラス母材欠陥検査方法
CN110431406B (zh) * 2017-02-28 2022-04-01 东洋玻璃株式会社 容器的检查装置和容器的检查方法
CN109746188A (zh) * 2017-11-01 2019-05-14 湖南海擎智能科技有限责任公司 流水线玻璃板厚度检测系统
CN108106996B (zh) * 2017-12-25 2024-05-28 通彩智能科技集团有限公司 一种玻璃检测盛放平台
CN108287167A (zh) * 2018-01-04 2018-07-17 芜湖东旭光电科技有限公司 液晶玻璃边缘检测方法和装置
CN108716935A (zh) * 2018-08-27 2018-10-30 陈富威 汽车挡风玻璃检测设备
CN109580659A (zh) * 2018-10-23 2019-04-05 彩虹(合肥)液晶玻璃有限公司 一种玻璃检测系统及玻璃生产系统
CN109406538B (zh) * 2018-12-27 2024-09-27 银河水滴科技(北京)有限公司 手机外观检测系统
CN112782197A (zh) * 2021-01-06 2021-05-11 蚌埠凯盛工程技术有限公司 退火窑炸板在线监测装置
JP7742039B2 (ja) * 2021-12-03 2025-09-19 日本電気硝子株式会社 ガラス物品の製造方法
KR20240116702A (ko) * 2021-12-03 2024-07-30 니폰 덴키 가라스 가부시키가이샤 투명체의 측정 방법 및 측정기 및 유리판의 제조 방법
CN117553701B (zh) * 2024-01-12 2024-03-22 山东晟昌新材料有限公司 一种木质板材翘曲的在线检测装置及方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2585594Y2 (ja) * 1993-03-10 1998-11-18 株式会社イナックス 表面凹凸検査システム
JP3746433B2 (ja) * 2001-03-02 2006-02-15 日本板硝子株式会社 ガラス製品の製造方法及び製造装置
JP2003098122A (ja) * 2001-09-21 2003-04-03 Toshiba Ceramics Co Ltd ガラス基板の外観検査装置
JP4626982B2 (ja) * 2005-02-10 2011-02-09 セントラル硝子株式会社 ガラス板の端面の欠陥検出装置および検出方法
TWI360652B (en) * 2005-04-06 2012-03-21 Corning Inc Glass inspection systems and method for using same
JP2006300663A (ja) * 2005-04-19 2006-11-02 Asahi Glass Co Ltd 欠点検出システム
JP4628964B2 (ja) * 2005-04-26 2011-02-09 大日本スクリーン製造株式会社 基板処理装置
DE102005050882B4 (de) * 2005-10-21 2008-04-30 Isra Vision Systems Ag System und Verfahren zur optischen Inspektion von Glasscheiben
JP2007205724A (ja) * 2006-01-30 2007-08-16 Central Glass Co Ltd ガラス基板の形状測定装置および測定方法
JP2008076171A (ja) * 2006-09-20 2008-04-03 Olympus Corp 基板検査装置
WO2008072693A1 (fr) * 2006-12-14 2008-06-19 Nippon Electric Glass Co., Ltd. Dispositif de détection de défauts d'une vitre, procédé de fabrication d'une vitre, vitre, dispositif d'évaluation de la qualité d'une vitre, et procédé d'inspection d'une vitre
JP4964176B2 (ja) * 2008-03-13 2012-06-27 AvanStrate株式会社 ガラス板の厚さ測定装置およびガラス板の厚さ測定方法
JP2010019834A (ja) * 2008-06-13 2010-01-28 Nippon Electric Glass Co Ltd 板ガラス欠陥検査装置及びフラットパネルディスプレイ用板ガラスの製造方法
JP5596925B2 (ja) 2009-01-20 2014-09-24 株式会社山梨技術工房 異物検査装置及び検査方法
JP2011227049A (ja) * 2010-03-31 2011-11-10 Asahi Glass Co Ltd 光透過性矩形板状物の端面検査方法及び端面検査装置
JP2012007993A (ja) 2010-06-24 2012-01-12 Asahi Glass Co Ltd 板状透明体の欠陥検査装置及びその方法
CN102445168A (zh) * 2010-09-30 2012-05-09 旭硝子株式会社 表面形状的检查方法及检查装置
KR101170928B1 (ko) * 2010-11-05 2012-08-03 (주)미래컴퍼니 기판 검사 장치 및 기판 검사 방법
WO2014027375A1 (fr) * 2012-08-13 2014-02-20 川崎重工業株式会社 Unité de vérification de plaque de verre et équipement de fabrication

Also Published As

Publication number Publication date
CN103591897B (zh) 2016-06-29
KR101697216B1 (ko) 2017-01-17
JP5923172B2 (ja) 2016-05-24
CN203396363U (zh) 2014-01-15
CN103591897A (zh) 2014-02-19
TW201407152A (zh) 2014-02-16
JPWO2014027375A1 (ja) 2016-07-25
TWI486578B (zh) 2015-06-01
KR20150038608A (ko) 2015-04-08
WO2014027375A1 (fr) 2014-02-20

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