IN2014CN03499A - - Google Patents
Info
- Publication number
- IN2014CN03499A IN2014CN03499A IN3499CHN2014A IN2014CN03499A IN 2014CN03499 A IN2014CN03499 A IN 2014CN03499A IN 3499CHN2014 A IN3499CHN2014 A IN 3499CHN2014A IN 2014CN03499 A IN2014CN03499 A IN 2014CN03499A
- Authority
- IN
- India
- Prior art keywords
- detector
- surface layer
- tile
- primary substrate
- pixels
- Prior art date
Links
- 239000000758 substrate Substances 0.000 abstract 5
- 239000002344 surface layer Substances 0.000 abstract 5
- 238000003384 imaging method Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/17—Circuit arrangements not adapted to a particular type of detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/2018—Scintillation-photodiode combinations
- G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/20—Measuring radiation intensity with scintillation detectors
- G01T1/208—Circuits specially adapted for scintillation detectors, e.g. for the photo-multiplier section
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
- G01T1/24—Measuring radiation intensity with semiconductor detectors
- G01T1/243—Modular detectors, e.g. arrays formed from self contained units
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
- G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
- G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
- H10F39/026—Wafer-level processing
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201161556870P | 2011-11-08 | 2011-11-08 | |
| PCT/IB2012/056176 WO2013068912A1 (fr) | 2011-11-08 | 2012-11-06 | Mosaïque sans joint pour construire un détecteur de grande taille |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| IN2014CN03499A true IN2014CN03499A (fr) | 2015-10-09 |
Family
ID=47226243
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IN3499CHN2014 IN2014CN03499A (fr) | 2011-11-08 | 2012-11-06 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US9513384B2 (fr) |
| EP (1) | EP2745142B1 (fr) |
| JP (1) | JP6100791B2 (fr) |
| CN (1) | CN103917896B (fr) |
| IN (1) | IN2014CN03499A (fr) |
| WO (1) | WO2013068912A1 (fr) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6478538B2 (ja) * | 2014-09-10 | 2019-03-06 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
| CZ306067B6 (cs) | 2015-05-12 | 2016-07-20 | Advacam S.R.O. | Modul detektoru ionizujícího záření |
| CN115047511B (zh) * | 2015-09-24 | 2025-07-29 | 棱镜传感器公司 | 模块化的x射线检测器 |
| EP3346296B1 (fr) * | 2017-01-10 | 2021-10-27 | Oxford Instruments Technologies Oy | Détecteur de rayonnement à semi-conducteurs |
| US20190353805A1 (en) * | 2018-05-21 | 2019-11-21 | General Electric Company | Digital x-ray detector having polymeric substrate |
| DE102020213171B4 (de) | 2020-10-19 | 2025-08-28 | Siemens Healthineers Ag | Röntgendetektormodul und Verfahren zur Bereitstellung eines Röntgendetektormoduls |
| US11647973B2 (en) * | 2021-05-04 | 2023-05-16 | Siemens Medical Solutions Usa, Inc. | Three-dimensional tileable gamma ray detector |
| EP4330730B1 (fr) * | 2022-07-15 | 2025-09-17 | Shanghai United Imaging Healthcare Co., Ltd. | Module de détection |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4891522A (en) | 1988-10-11 | 1990-01-02 | Microtronics Associates, Inc. | Modular multi-element high energy particle detector |
| US5629524A (en) * | 1995-02-21 | 1997-05-13 | Advanced Scientific Concepts, Inc. | High speed crystallography detector |
| US6204087B1 (en) | 1997-02-07 | 2001-03-20 | University Of Hawai'i | Fabrication of three-dimensional architecture for solid state radiation detectors |
| US6853411B2 (en) * | 2001-02-20 | 2005-02-08 | Eastman Kodak Company | Light-producing high aperture ratio display having aligned tiles |
| AU2003209622A1 (en) * | 2002-03-03 | 2003-10-13 | Interon As | Pixel sensor array and method of manufacture thereof |
| CN1230693C (zh) * | 2002-11-26 | 2005-12-07 | 张亚美 | 小面积像素电极直接平板x－线探测器 |
| EP1706884A2 (fr) | 2003-12-30 | 2006-10-04 | DxRay, Inc. | Detecteur pixelise a mode de comptage photonique a base de tellurure de zinc et de cadmium |
| US20050286682A1 (en) * | 2004-06-29 | 2005-12-29 | General Electric Company | Detector for radiation imaging systems |
| US20060192087A1 (en) * | 2005-02-28 | 2006-08-31 | Real Time Radiography Ltd. | Two-dimensional CMOS-based flat panel imaging sensor |
| JP5070637B2 (ja) * | 2005-12-07 | 2012-11-14 | 株式会社アクロラド | 放射線画像検出モジュール |
| JP5172267B2 (ja) * | 2007-10-09 | 2013-03-27 | 富士フイルム株式会社 | 撮像装置 |
| JP4808760B2 (ja) * | 2008-11-19 | 2011-11-02 | 浜松ホトニクス株式会社 | 放射線検出器の製造方法 |
| JP5870375B2 (ja) | 2008-11-21 | 2016-03-01 | トリクセル | タイル型検出器の組み立て方法 |
| JP2011163868A (ja) * | 2010-02-08 | 2011-08-25 | Hitachi Cable Ltd | 放射線検出モジュール |
| CN102445703A (zh) * | 2010-10-12 | 2012-05-09 | 上海生物医学工程研究中心 | 基于无缝拼接的光电传感探测器及制备方法 |
-
2012
- 2012-11-06 JP JP2014540599A patent/JP6100791B2/ja not_active Expired - Fee Related
- 2012-11-06 IN IN3499CHN2014 patent/IN2014CN03499A/en unknown
- 2012-11-06 US US14/356,553 patent/US9513384B2/en not_active Expired - Fee Related
- 2012-11-06 CN CN201280054828.4A patent/CN103917896B/zh not_active Expired - Fee Related
- 2012-11-06 WO PCT/IB2012/056176 patent/WO2013068912A1/fr not_active Ceased
- 2012-11-06 EP EP12791271.5A patent/EP2745142B1/fr not_active Not-in-force
Also Published As
| Publication number | Publication date |
|---|---|
| US9513384B2 (en) | 2016-12-06 |
| US20140307850A1 (en) | 2014-10-16 |
| CN103917896B (zh) | 2017-08-15 |
| CN103917896A (zh) | 2014-07-09 |
| EP2745142B1 (fr) | 2021-03-17 |
| WO2013068912A1 (fr) | 2013-05-16 |
| JP2015506117A (ja) | 2015-02-26 |
| EP2745142A1 (fr) | 2014-06-25 |
| JP6100791B2 (ja) | 2017-03-22 |
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