IE56824B1 - Production of dielectric boards - Google Patents
Production of dielectric boardsInfo
- Publication number
- IE56824B1 IE56824B1 IE147385A IE147385A IE56824B1 IE 56824 B1 IE56824 B1 IE 56824B1 IE 147385 A IE147385 A IE 147385A IE 147385 A IE147385 A IE 147385A IE 56824 B1 IE56824 B1 IE 56824B1
- Authority
- IE
- Ireland
- Prior art keywords
- copper
- press plate
- press
- layer
- dielectric
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 77
- 229910052802 copper Inorganic materials 0.000 claims description 67
- 239000010949 copper Substances 0.000 claims description 67
- 238000000034 method Methods 0.000 claims description 32
- 239000000463 material Substances 0.000 claims description 15
- 238000010030 laminating Methods 0.000 claims description 13
- 239000003989 dielectric material Substances 0.000 claims description 10
- 239000011148 porous material Substances 0.000 claims description 9
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 5
- DOBRDRYODQBAMW-UHFFFAOYSA-N copper(i) cyanide Chemical compound [Cu+].N#[C-] DOBRDRYODQBAMW-UHFFFAOYSA-N 0.000 claims description 5
- 239000010936 titanium Substances 0.000 claims description 5
- 229910052719 titanium Inorganic materials 0.000 claims description 5
- 229910000831 Steel Inorganic materials 0.000 claims description 4
- 238000001816 cooling Methods 0.000 claims description 4
- 229910001220 stainless steel Inorganic materials 0.000 claims description 4
- 239000010935 stainless steel Substances 0.000 claims description 4
- 239000010959 steel Substances 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims description 3
- PEVJCYPAFCUXEZ-UHFFFAOYSA-J dicopper;phosphonato phosphate Chemical compound [Cu+2].[Cu+2].[O-]P([O-])(=O)OP([O-])([O-])=O PEVJCYPAFCUXEZ-UHFFFAOYSA-J 0.000 claims description 3
- 230000035515 penetration Effects 0.000 claims description 3
- 238000007747 plating Methods 0.000 description 17
- 210000000569 greater omentum Anatomy 0.000 description 15
- 239000011888 foil Substances 0.000 description 12
- 239000011889 copper foil Substances 0.000 description 9
- 229920005989 resin Polymers 0.000 description 9
- 239000011347 resin Substances 0.000 description 9
- 239000000758 substrate Substances 0.000 description 7
- 239000003795 chemical substances by application Substances 0.000 description 5
- 229910052751 metal Inorganic materials 0.000 description 5
- 239000002184 metal Substances 0.000 description 5
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 4
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 4
- 230000001464 adherent effect Effects 0.000 description 4
- 239000010405 anode material Substances 0.000 description 4
- ARUVKPQLZAKDPS-UHFFFAOYSA-L copper(II) sulfate Chemical compound [Cu+2].[O-][S+2]([O-])([O-])[O-] ARUVKPQLZAKDPS-UHFFFAOYSA-L 0.000 description 4
- 229910000077 silane Inorganic materials 0.000 description 4
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 229910021529 ammonia Inorganic materials 0.000 description 2
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 2
- XPPKVPWEQAFLFU-UHFFFAOYSA-J diphosphate(4-) Chemical compound [O-]P([O-])(=O)OP([O-])([O-])=O XPPKVPWEQAFLFU-UHFFFAOYSA-J 0.000 description 2
- 235000011180 diphosphates Nutrition 0.000 description 2
- 239000004744 fabric Substances 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000006911 nucleation Effects 0.000 description 2
- 238000010899 nucleation Methods 0.000 description 2
- 239000007921 spray Substances 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 101100017009 Mus musculus Hhat gene Proteins 0.000 description 1
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 1
- MPRCWBFYAMJUTK-UHFFFAOYSA-N [As].S(O)(O)(=O)=O Chemical compound [As].S(O)(O)(=O)=O MPRCWBFYAMJUTK-UHFFFAOYSA-N 0.000 description 1
- 238000005299 abrasion Methods 0.000 description 1
- 238000005273 aeration Methods 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 239000007767 bonding agent Substances 0.000 description 1
- KXZJHVJKXJLBKO-UHFFFAOYSA-N chembl1408157 Chemical compound N=1C2=CC=CC=C2C(C(=O)O)=CC=1C1=CC=C(O)C=C1 KXZJHVJKXJLBKO-UHFFFAOYSA-N 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000001276 controlling effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 210000001787 dendrite Anatomy 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- LJCNRYVRMXRIQR-OLXYHTOASA-L potassium sodium L-tartrate Chemical compound [Na+].[K+].[O-]C(=O)[C@H](O)[C@@H](O)C([O-])=O LJCNRYVRMXRIQR-OLXYHTOASA-L 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000007788 roughening Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 235000011006 sodium potassium tartrate Nutrition 0.000 description 1
- 239000001117 sulphuric acid Substances 0.000 description 1
- 235000011149 sulphuric acid Nutrition 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Landscapes
- Manufacturing Of Printed Wiring (AREA)
- Laminated Bodies (AREA)
Description
This invention relates to a process for producing copper-clad dielectric boards and to material for use in such a process.
The background to the invention is as follows.
Copper clad laminates are at present manufactured by taking copper foil produced generally in accordance with the teaching of U.S. Patent 3 674 656, laying lt on top of one or more sheets of partially cured resin impregnated base material, and placing the two materials between press plates on a laminating press. Under heat and pressure the partially cured resin adheres to the copper foil so that, when removed from the press, the two materials are firmly bonded together.
n Such copper foil as is used in this process is available in unsupported form in a thickness range of 9 um upwards to in excess of 105 um. Since such foil is frequently in excess of 1 metre wide, handling sheets of it can be difficult and, particularly in thicknesses between 9 and 20 um, a great deal of scrap is generated in the laying up process. In order to preserve the surface quality of the laminate great care has to be taken to exclude all dust particles from between the surface of the copper foil and the press plates, which are used to separate the laminates in the press during manufacture.
Xn order to facilitate the handling of thin copper foils it has been proposed to manufacture such materials ζ by continuously depositing such copper onto a carrier foil of aluminium or chromium-plated copper and processes for so doing are disclosed in u.s. Patent 4 113 576 and U.K. Patent Specifications 1 430 849, 1 458 230, and 1 458 259. In practice foils produced by these techniques are costly and unreliable and have found little favour in the industry.
U.S. Patent 3 984 598 describes a process in which a stainless steel press plate known as a caul plate is coated with a silane as a release agent and is then electroplated with copper. The exposed surface of the copper is then oxidised and treated with a silane as a bonding agent. The copper-clad caul plate is then laminated to resin-impregnated base material in a laminating press. After the laminate is removed from the press, the caul plate is removed from the copper-clad dielectric board which has been produced.
The copper coating is found to have a variable thickness of about 5 to 12 um.
It is notoriously difficult to uniformly electroplate a surface provided with an organic parting layer such as silane. As a result, the deposit will suffer from porosity. During laminating, the resin will therefore seep through the pores, both causing adherence to the caul plate and contaminating the surface of the laminate.
Hhat is desired is a method by which thin copper layers of 3 microns and upwards can be successfully and economically laminated fo dielectric base materials with great reliability.
The present invention provides a process for producing copper-clad dielectric boards, comprising the sequential steps of (a) depositing a layer of copper substantially free of micro-pores directly on a polished surface of a flat metallic press plate;
(b) providing the copper layer with a matte surface of copper of dendritic structure;
(c) bonding the matte surface to a dielectric material while applying heat and pressure to the press plate and the dielectric material in a laminating press and subsequently allowing the press to cool, the forces generated at the interface of the press plate and the copper layer, owing to the penetration of the dielectric material into the dendritic structure under pressure and the subsequent cooling of the dielectric material, being sufficient to overcome the adhesion of the copper layer to the polished surface of the press plate and thereby to cause the copper layer to be detached from the press plate;
(d) removing the resulting copper-clad dielectric board from the press and separating it from the press plate; and (e) returning the press plate to step (a) and repeating steps (a) to (d).
One or both of the surfaces of the press plate may be used.
In the preferred process the press plate is 1.5 to 3 mm thick and is made of stainless steel, titanium, or chromium-plated steel. The press plate is polished by an abrasive brush or spray to provide a uniform finish of a surface roughness not exceeding 0.2 urn (preferably o.i um) centre line average (C.L.A.).
After polishing, all traces of abrasive and products of abrasion are removed by washing.
The polished press plate is immersed in a copper plating bath vertically disposed and parallel to a suitable anode where it is rendered cathodic. A current is applied so as to plate on the press plate a fine k grain copper deposit substantially free of micro-pores.
The so plated press plate is removed from the bath.
\ washed, and placed in a strong copper sulphate bath.
again vertically and parallel to an anode. By controlling the conditions in this bath a further copper layer is deposited in such a way as to cause a somewhat coarser crystalline layer to be deposited on the fine grain deposit already present.
Subsequent placing in further copper baths under controlled conditions can be carried out to create a microcrystalline dendritic structure which has a high surface area suitable for bonding to typical dielectric ; base materials. When the plating sequence is complete ♦
the copper plated press plate is crashed, passivated in weak chromic acid, washed again, and dried.
]
The plate is then taken to a laminating press and laid on top of suitable base material such as epoxy resin impregnated glass cloth. When the laminating press Is closed^ and heat is applied, the resin in the base material is forced info che microcrystalline dendritic structure of the copper. During the subsequent cooling of the resin there is created a sufficient force to disturb the adhesion between the copper and the carrier plate so that when the press is opened if will be found that the copper layer is completely detached from che carrier place and is firmly adherent co che base. If the plating conditions in the first bath are properly related co che surface texture j of the carrier plate, the detachment of ehe copper happens so cleanly that the plate can immediately be passed through the plating cycle again.
Such a method of making laminates avoids completely the hazard of reeling and unreeling rolls of copper foil, eliminates the common problems of surface defects on finished laminates, and because of the fine crystal deposit of the first layer eliminates the problems of porosity commonly to be found in electroformed copper ’ foil. Use can be made of polished caul plates uhich have previously been used in a conventional laminating process.
The total thickness of copper on the press plate is preferably 3 to 12 pm, more preferably about 5 pm.
The first copper layer deposited on the press plate can be very thin. e.g. 1 to 2 pm. It may be deposited by electrolysis, e.g. from a copper cyanide bath or a copper pyrophosphate bath, preferably containing 25 to 35 g/1 of copper. 150 to 310 g/1 of P2O?. 1 to 2 ammonia, and having a pH of 8 to 9.
If the first strike of copper is carried out from a near neutral plating bath with high throwing power, and the metal carrier plate has the correct surface finish, the dense crystal structure of the first layer virtually guarantees that the foil as eventually plated will be free from pinholes or micro-porosity. In conventional foil making technology porosity on thin foils is a major problem because the copper foil is plated all from the same bath and. in the interests of economical production and so that a matte structure can be achieved, the bath used is an aqueous copper sulphate solution. Such baths, operated at the high current densities required to achieve economical levels of production, always pose difficulties in maintaining control of the nucleation sites of the copper at tho start of the plating process. Micro-contamination of the drum surface or the solution can result in intercrystalline porosity which permits resin bleed through if such material is laminated. Rigorous testing is carried out by the foil producer and larainators so that the high standards required result in high scrap levels in the industry.
The production of foil in a multi-stage sheet-by-sheet process as now proposed allows the copper core to be plated at high speed from a similar bath to that used in typical drum foil processes, but the nucleation site problem is avoided by plating this layer after a first strike. The near-neutral pyrophosphate bath also assists in obtaining an oxide free surface on the finished laminate.
Even if a few micro-pores are present in the copper plated on the press plate, resin bleed-through is effectively prevented because there is no space between the copper and the press plate info which the air entrapped in the micro-pores can escape, so that the resin cannot even enter the micro-pores.
EXAMPLE
A press plate consisting of a sheet of titanium 2 mm thick was polished to provide a uniform surface of between 0.1 and 0.2 um C.L.A. The polished sheet was placed in a plating tank containing copper cyanide solution and plate as described in Table 1 below.
Table 1
Copper Cyanide 3.0 - 16 g/1 Sodium Cyanide 4.5 - 1Θ g/1 Sodium Carbonate 2.0 - 4 g/1 Rochelle Salt 0 - 6 g/1 PH 12 - 13 Temperature 32 - B2°C Current Density 1 - 7 A/dm2 Time 3 - 30 S Anode Material Copper or steel The plated sheet was removed from the bath and thoroughly washed in a warm water spray. The sheet was then placed in a copper sulphate plating solution,
rendered cathodic and plated In conditions as described below in Table 2.
tTable 2
Copper (as metal) Sulphuric acid Temperature
Current Density
Anode Material
- 110 g/1 60 * 110 g/1 45 - 85°C 2 - 110 A/dm2
Lead Sheet
The plating time depends on the required.
thickness of copper
After the foregoing plating step the sheet was transferred to a further copper sulphate plating bath and subjected to conditions as follows in Table 3. In determining the precise conditions to be used, it is important that copper crystals plated are not of a powdery oxidised character buf are pure metallic copper dendrites firmly adherent to the surface.
Table 3
Copper (as metal) Sulphuric acid Arsenic (as metal) Temperature Anode material Current Density
- 45 g/1 60 - 90 g/1 200 - 500 mg/1 18 - 50°C Lead Sheet 5 - 220 A/dm2
The sheet was placed in this bath disposed parallel and in close proximity to the lead anode and subjected to a continuous buf variable current in a range of time and current densities so as to produce a strongly adherent microcrystalline dendritic deposit of high surface area.
The so plated sheet was removed from the plating bath, thoroughly washed, passivated in a weak chromic acid solution, washed again, and dried. The total thickness of the plated layer was 12 um.
This sheet was taken to a laminating press and laid upon 5 sheets of epoxy impregnated glass cloth of a type commonly used in the production of copper clad laminates. After the press had been closed and heat and pressure applied in accordance with the requirements of the resin impregnated base material, the press was allowed to cool and the laminate removed. It was immediately apparent that the titanium sheet had separated from the copper layer and could be lifted off
W the laminate that had been made; it was ready for return to the initial plating bath.
The resultant laminate demonstrated a particularly clean, stain free copper surface and the copper layer was firmly adherent to the base. The laminate was subjected to test procedures typical for the industry and was found to be satisfactory in every respect.
(,
Instead of the copper cyanide solution specified in Table 1 above, a copper pyrophosphate solution may be used under the following conditions:
Plating solution:
Copper (as metal) Pyrophosphate as P2O? Ammonia PH
Temperature
Current density
Anode-cathode gap
Anode material g/1 ISO g/1 1 g/1 8.6-8.8 5O-55°C
2.2 - 4.3 A/dm2 7-12 cm copper.
Potassium hydroxide is used to regulate the pH. The plating time depends on the current density and required thickness (generally 1-2 μη). During the plating process continuous aeration of the anode/cathode interspace is carried out to prevent the copper deposit from 'burning*.
Tho pH of the bath is regulated continuously fo maintain if in the range 8.6-8.8. variations on either side of these levels may result in copper which adheres too strongly to the press plate or is porous or both.
The process of the invention described above has clear advantages over the prior art process represented by U.S. Patent 3 984 598. In the prior art process a silane release agent has to be used to facilitate removal of the laminate from the caul plate after lamination; even so, if is clear that separation of the laminate from the caul plate does not occur automatically in the laminating press. The known use of
Ί5 temporary (disposable or re-usable) substrates has always required stripping of the foil from the substrate mechanically (i.e. by peeling) or chemically (i.e. by dissolving the substrate). The present invention is a radical departure, ln that adhesion between the laminate end the substrate is destroyed during the laminating process, so that the caul plates and laminates can be separated in the same way as conventional caul plates and laminates.
In the present process an initial copper layer substantially free of micro-pores is surmounted by a copper dendritic structure, thereby achieving a copper foil info which the dielectric material can penetrate so as to produce strong bonding (high peel strength) but which foil is impermeable to the dielectric material.
X) In contrast, the prior art process uses a high current density to achieve a copper layer with a rough surface, with the inevitable result that the thin copper layer is micro-porous; furthermore, it is still found necessary to roughen the surface further by oxidization, such a surface provides a much weaker bond than a dendritic structure.
in the prior art process, after removal of the substrate from the laminate, it is expected that the substrate (caul plate) will still contain the release agent as a thin film. However, there is a risk that the film will become so thin, perhaps locally, that it will no longer facilitate removal of the substrate.
Therefore, checking of recycled caul plates would be necessary to ensure that the release layer is continuous and undamaged. The release layer will, in general, be more easily damaged than a polished metallic surface.
It will be difficult to detect imperfections in a release layer, whereas imperfections in a polished surface (such as roughening or scratching) are very easily detected.
In order to operate economically, a laminator would use not only copper-clad caul plates (in the production of laminates with very thin copper, i.e. less than 20 um) but also ordinary polished caul plates with self-supporting copper foil (for producing laminates with thicker copper layers). If a release agent is used (as in the prior art process) there is a risk that caul plates with and without a film of release agent will be mixed up, whereas the present process can make use of polished caul plates which have been used in a conventional laminating process.
Claims (11)
1. A process for producing copper-clad dielectric boards, comprising the sequential steps of (a) depositing a layer of copper substantially free 5 of micro-pores directly on a polished surface of a flat metallic press plate; (b) providing the copper layer with a matte surface of copper of dendritic structure; (c) bonding the matte surface to a dielectric 10 material while applying heat and pressure to the press plate and the dielectric material in a laminating press and subsequently allowing the press to cool, the forces generated at the interface of the press plate and the copper layer, owing to the penetration of the dielectric 15 material into the dendritic structure under pressure and the subsequent cooling of the dielectric material, being sufficient to overcome the adhesion of the copper layer to the polished surface of the press plate and thereby to cause the copper layer to be detached from the press 2. (1 plate; (d) removing the resulting copper-clad dielectric board from the press and separating if from the press plate; and (e) returning the press plate to step (a) and 25 repeating steps (a) to (d).
2. A process as claimed in claim 1, in which the press plate is made of stainless steel, titanium, or chromium-plated steel.
3. A process as claimed in claim 1 or 2, in which the 30 layer of copper initially deposited on the polished surface is 1 to 2 um thick.
4. A process as claimed in any of claims 1 to 3, in which the initial copper layer is deposited electrolytically from a copper cyanide solution.
5. A process as claimed in any of claims 1 to 3, in 5 which the initial copper layer is deposited electrolytically from a copper pyrophosphate solution. ί
6. A process as claimed in any of claims 1 to 5. in which the total thickness of copper on the press plate surface is 3 to 12 pm. 10
7. A flat metallic prjess plate having a polished surface on which a layer of copper substantially free of micro-pores has been deposited directly, the copper layer having a matte surface of copper of dendritic structure capable of being bonded to a dielectric 15 material under heat and pressure in a laminating press, the adhesion of the copper layer to the polished surface of the press plate being sufficiently low that the forces generated at the interface of the press plate and the copper layer, owing to the penetration of the 20 dielectric material into the dendritic structure under a pressure and the subsequent cooling of the dielectric material, will cause the copper layer to be detached from the press plate.
8. A press plate as claimed in claim 7, made of 25 stainless steel, titanium, or chromium-plated steel.
9. A press plate as claimed in claim 7, in which the total thickness of copper on the press plate surface is 3 to 12 um. · r $
10. A process as claimed in claim 1. substantially as described.
11. A press plate as claimed in claim 7, substantially j as described.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IE147385A IE56824B1 (en) | 1985-06-13 | 1985-06-13 | Production of dielectric boards |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| IE147385A IE56824B1 (en) | 1985-06-13 | 1985-06-13 | Production of dielectric boards |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| IE851473L IE851473L (en) | 1986-12-13 |
| IE56824B1 true IE56824B1 (en) | 1991-12-18 |
Family
ID=11027710
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| IE147385A IE56824B1 (en) | 1985-06-13 | 1985-06-13 | Production of dielectric boards |
Country Status (1)
| Country | Link |
|---|---|
| IE (1) | IE56824B1 (en) |
-
1985
- 1985-06-13 IE IE147385A patent/IE56824B1/en not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| IE851473L (en) | 1986-12-13 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Patent lapsed |