[go: up one dir, main page]

GB2599047A8 - Optoelectronic measuring device for measuring an intensity of electromagnetic radiation - Google Patents

Optoelectronic measuring device for measuring an intensity of electromagnetic radiation Download PDF

Info

Publication number
GB2599047A8
GB2599047A8 GB2117746.4A GB202117746A GB2599047A8 GB 2599047 A8 GB2599047 A8 GB 2599047A8 GB 202117746 A GB202117746 A GB 202117746A GB 2599047 A8 GB2599047 A8 GB 2599047A8
Authority
GB
United Kingdom
Prior art keywords
electromagnetic radiation
detector
signal
intensity
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB2117746.4A
Other versions
GB2599047B (en
GB2599047A (en
GB202117746D0 (en
Inventor
Dietze Daniel
Zinkl Wolfgang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ams Osram International GmbH
Original Assignee
Osram Opto Semiconductors GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osram Opto Semiconductors GmbH filed Critical Osram Opto Semiconductors GmbH
Publication of GB202117746D0 publication Critical patent/GB202117746D0/en
Publication of GB2599047A publication Critical patent/GB2599047A/en
Publication of GB2599047A8 publication Critical patent/GB2599047A8/en
Application granted granted Critical
Publication of GB2599047B publication Critical patent/GB2599047B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4228Photometry, e.g. photographic exposure meter using electric radiation detectors arrangements with two or more detectors, e.g. for sensitivity compensation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0474Diffusers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0488Optical or mechanical part supplementary adjustable parts with spectral filtering
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/4204Photometry, e.g. photographic exposure meter using electric radiation detectors with determination of ambient light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12Generating the spectrum; Monochromators
    • G01J2003/1226Interference filters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/46Measurement of colour; Colour measuring devices, e.g. colorimeters
    • G01J3/465Measurement of colour; Colour measuring devices, e.g. colorimeters taking into account the colour perception of the eye; using tristimulus detection

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Sustainable Development (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

The aim of the inventions is to measure the intensity of electromagnetic radiation (L) hitting an optoelectronic measuring device (1). This aim is achieved in that the electromagnetic radiation (L) is detected by means of a first detector (10), a first detector signal thus being provided. Furthermore, the electromagnetic radiation (L) is detected by means of a second detector (20), a second detector signal thus being provided, a spectral filter (24) being arranged in a beam path (S) upstream of the second detector (20) in order to filter the electromagnetic radiation (L) before detection by the second detector (20). By means of a signal difference determiner (30), a difference signal is produced by subtracting the second detector signal from the first detector signal.
GB2117746.4A 2019-05-21 2020-05-12 Optoelectronic measuring device for measuring an intensity of electromagnetic radiation Active GB2599047B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102019207404.9A DE102019207404A1 (en) 2019-05-21 2019-05-21 Optoelectronic measuring device for measuring an intensity of electromagnetic radiation
PCT/EP2020/063181 WO2020234046A1 (en) 2019-05-21 2020-05-12 Optoelectronic measuring device for measuring an intensity of electromagnetic radiation

Publications (4)

Publication Number Publication Date
GB202117746D0 GB202117746D0 (en) 2022-01-19
GB2599047A GB2599047A (en) 2022-03-23
GB2599047A8 true GB2599047A8 (en) 2022-10-05
GB2599047B GB2599047B (en) 2022-12-28

Family

ID=70775333

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2117746.4A Active GB2599047B (en) 2019-05-21 2020-05-12 Optoelectronic measuring device for measuring an intensity of electromagnetic radiation

Country Status (5)

Country Link
US (1) US11835384B2 (en)
CN (1) CN113853511B (en)
DE (1) DE102019207404A1 (en)
GB (1) GB2599047B (en)
WO (1) WO2020234046A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230360848A1 (en) * 2022-05-04 2023-11-09 Delta Electronics, Inc. Emi filter system

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3625143B2 (en) * 1998-12-28 2005-03-02 大日精化工業株式会社 Pigment dispersant, pigment dispersion and color filter
DE10345410A1 (en) * 2003-09-30 2005-05-04 Osram Opto Semiconductors Gmbh radiation detector
US8212285B2 (en) * 2004-03-31 2012-07-03 Osram Opto Semiconductors Gmbh Radiation detector
US7611922B2 (en) * 2006-11-13 2009-11-03 Dongbu Hitek Co., Ltd. Image sensor and method for manufacturing the same
US7960807B2 (en) * 2007-02-09 2011-06-14 Intersil Americas Inc. Ambient light detectors using conventional CMOS image sensor process
US8330122B2 (en) * 2007-11-30 2012-12-11 Honeywell International Inc Authenticatable mark, systems for preparing and authenticating the mark
JP5333964B2 (en) * 2008-06-27 2013-11-06 株式会社ジャパンディスプレイ Photodetection device, electro-optical device, and electronic apparatus
JP5178393B2 (en) * 2008-08-20 2013-04-10 シャープ株式会社 Optical distance measuring sensor and electronic device
US8008613B2 (en) * 2009-05-05 2011-08-30 Apple Inc. Light sensing device having a color sensor and a clear sensor for infrared rejection
DE102009024069A1 (en) * 2009-06-05 2010-12-09 Osram Opto Semiconductors Gmbh Optical lighting device and optical recording device
JP5300791B2 (en) * 2010-06-09 2013-09-25 日本電信電話株式会社 Image processing apparatus, image processing method, and image processing program
US8269172B2 (en) * 2010-09-23 2012-09-18 Maxim Integrated Products, Inc. Double layer photodiodes in ambient light sensors and proximity detectors
US9891098B2 (en) * 2010-12-30 2018-02-13 Apple Inc. Diffuser and filter structures for light sensors
CN102175613B (en) * 2011-01-26 2012-11-14 南京大学 Image-brightness-characteristic-based pan/tilt/zoom (PTZ) video visibility detection method
CN103247059B (en) * 2013-05-27 2016-02-17 北京师范大学 A kind of remote sensing images region of interest detection method based on integer wavelet and visual signature
US9627424B2 (en) * 2014-11-19 2017-04-18 Silicon Laboratories Inc. Photodiodes for ambient light sensing and proximity sensing
US10349015B2 (en) * 2015-06-08 2019-07-09 Trustees Of Dartmouth College Image sensor color filter array pattern
EP3165876A3 (en) * 2015-11-03 2017-07-26 Hexagon Technology Center GmbH Opto-electronic measuring device
CN108414083B (en) * 2018-02-27 2019-08-30 商洛学院 A multifunctional illuminance sensor capable of correcting human eye transmittance and its design method

Also Published As

Publication number Publication date
DE102019207404A1 (en) 2020-11-26
GB2599047B (en) 2022-12-28
WO2020234046A1 (en) 2020-11-26
GB2599047A (en) 2022-03-23
US20220228909A1 (en) 2022-07-21
GB202117746D0 (en) 2022-01-19
CN113853511B (en) 2024-05-03
US11835384B2 (en) 2023-12-05
CN113853511A (en) 2021-12-28

Similar Documents

Publication Publication Date Title
WO2019191698A3 (en) Self-referenced spectrometer
SE1850791A1 (en)
WO2019084022A8 (en) Optical configuration methods for spectral scatter flow cytometry
WO2020180503A8 (en) Range calibration of light detectors
WO2016132222A3 (en) Scanning infrared measurement system
PH12017501215A1 (en) Device for processing a surface
MX2016005836A (en) Inspection apparatus.
WO2019147872A3 (en) Position feedback for multi-beam particle detector
EA201792238A1 (en) METHOD AND SYSTEM OF QUICK VEHICLE INSPECTION
WO2015193804A3 (en) Detector for determining a position of at least one object
ATE511075T1 (en) INTERFEROMETRIC DEVICE FOR MEASURING SHAPES
IL247255B (en) Optical critical dimension metrology
CY1117422T1 (en) INFRARED PRESENCE DETECTOR TO DETECT A PRESENCE OF AN OBJECT IN A SURVEILLANCE AREA
EP2293049A3 (en) Radiation inspection apparatus
MX2015011014A (en) Container inspection.
MX348395B (en) Apparatus and method for determining the target position deviation of two bodies.
GB201114330D0 (en) Detector circuits for interferometers
TR201907436T4 (en) Banknote slot detection method and apparatus.
SG11201900795TA (en) Grating measurement apparatus
EP4487773A3 (en) Method and apparatus for performing multidimensional velocity measurements based on amplitude and phase signals in the field of optical interferometry
GB201303761D0 (en) Opticle emmision system including dichroic beam system
CA2953696C (en) CLOUD PARAMETERS OPTICALLY DETECTED BY MEANS OF ANALOGUE LIGHT REFLECTION SAMPLING MEASUREMENTS
TW201614222A (en) Measuring method, measurement apparatus, lithographic apparatus and device manufacturing method
MX2021002977A (en) Optical probe and method for in situ soil analysis.
MX2019004262A (en) Optical fluid sensors for cross contamination control systems.