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GB2414548B - Method and pixel for performing correlated double sampling - Google Patents

Method and pixel for performing correlated double sampling

Info

Publication number
GB2414548B
GB2414548B GB0510547A GB0510547A GB2414548B GB 2414548 B GB2414548 B GB 2414548B GB 0510547 A GB0510547 A GB 0510547A GB 0510547 A GB0510547 A GB 0510547A GB 2414548 B GB2414548 B GB 2414548B
Authority
GB
United Kingdom
Prior art keywords
pixel
double sampling
correlated double
performing correlated
sampling
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
GB0510547A
Other versions
GB0510547D0 (en
GB2414548A (en
Inventor
Bart Dierickx
Jan Bogaerts
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
FillFactory NV
Cypress Semiconductor Corp
Original Assignee
FillFactory NV
Cypress Semiconductor Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GBGB0411648.9A external-priority patent/GB0411648D0/en
Priority claimed from GB0411655A external-priority patent/GB0411655D0/en
Application filed by FillFactory NV, Cypress Semiconductor Corp filed Critical FillFactory NV
Publication of GB0510547D0 publication Critical patent/GB0510547D0/en
Publication of GB2414548A publication Critical patent/GB2414548A/en
Application granted granted Critical
Publication of GB2414548B publication Critical patent/GB2414548B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H01L27/14609—
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/616—Noise processing, e.g. detecting, correcting, reducing or removing noise involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H04N3/1568—Control of the image-sensor operation, e.g. image processing within the image-sensor for disturbance correction or prevention within the image-sensor, e.g. biasing, blooming, smearing

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
GB0510547A 2004-05-25 2005-05-24 Method and pixel for performing correlated double sampling Expired - Fee Related GB2414548B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0411648.9A GB0411648D0 (en) 2004-05-25 2004-05-25 Method and pixel for performing correlated double sampling
GB0411655A GB0411655D0 (en) 2004-05-25 2004-05-25 Method and pixel for performing correlated double sampling

Publications (3)

Publication Number Publication Date
GB0510547D0 GB0510547D0 (en) 2005-06-29
GB2414548A GB2414548A (en) 2005-11-30
GB2414548B true GB2414548B (en) 2008-12-17

Family

ID=34839919

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0510547A Expired - Fee Related GB2414548B (en) 2004-05-25 2005-05-24 Method and pixel for performing correlated double sampling

Country Status (1)

Country Link
GB (1) GB2414548B (en)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0788277A2 (en) * 1996-01-05 1997-08-06 Sterling Diagnostic Imaging, Inc. Method and apparatus for reducing noise in a radiation capture device
US5754056A (en) * 1996-04-23 1998-05-19 David Sarnoff Research Center, Inc. Charge detector with long integration time
EP1003220A2 (en) * 1998-11-20 2000-05-24 Eastman Kodak Company Three transistor active pixel sensor architecture with correlated double sampling
US6166766A (en) * 1997-09-03 2000-12-26 Motorola, Inc. Sensing circuit for capturing a pixel signal

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0788277A2 (en) * 1996-01-05 1997-08-06 Sterling Diagnostic Imaging, Inc. Method and apparatus for reducing noise in a radiation capture device
US5754056A (en) * 1996-04-23 1998-05-19 David Sarnoff Research Center, Inc. Charge detector with long integration time
US6166766A (en) * 1997-09-03 2000-12-26 Motorola, Inc. Sensing circuit for capturing a pixel signal
EP1003220A2 (en) * 1998-11-20 2000-05-24 Eastman Kodak Company Three transistor active pixel sensor architecture with correlated double sampling

Also Published As

Publication number Publication date
GB0510547D0 (en) 2005-06-29
GB2414548A (en) 2005-11-30

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Legal Events

Date Code Title Description
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)
732E Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977)

Free format text: REGISTERED BETWEEN 20121004 AND 20121010

PCNP Patent ceased through non-payment of renewal fee

Effective date: 20130524