[go: up one dir, main page]

GB2403010A - Measuring coated part thickness using delay lines impedance-matched to the coating - Google Patents

Measuring coated part thickness using delay lines impedance-matched to the coating Download PDF

Info

Publication number
GB2403010A
GB2403010A GB0413477A GB0413477A GB2403010A GB 2403010 A GB2403010 A GB 2403010A GB 0413477 A GB0413477 A GB 0413477A GB 0413477 A GB0413477 A GB 0413477A GB 2403010 A GB2403010 A GB 2403010A
Authority
GB
United Kingdom
Prior art keywords
transducer
coating
thickness
delay line
impedance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB0413477A
Other versions
GB0413477D0 (en
GB2403010B (en
Inventor
Agostino Abbate
Paul Joseph Deangelo
Steven Abe Labreck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of GB0413477D0 publication Critical patent/GB0413477D0/en
Publication of GB2403010A publication Critical patent/GB2403010A/en
Application granted granted Critical
Publication of GB2403010B publication Critical patent/GB2403010B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B17/00Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations
    • G01B17/02Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness
    • G01B17/025Measuring arrangements characterised by the use of infrasonic, sonic or ultrasonic vibrations for measuring thickness for measuring thickness of coating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • G01N2291/044Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)

Abstract

An ultrasonic system for measuring the thickness of a part 28 with a coating 30 has at least one acoustic transducer 12, and a buffer delay line 14 having an impedance matched to an impedance of the coating 30. This eliminates a reflection at the delay line/coating interface.

Description

METHOD AND APPARATUS FOR MEASURING PART THICKNESS
HAVING AN EXTERNAL COATING USING IMPEDANCE MATCHING
DELAY LINES
This invention relates to thickness measurement instruments, and in particular to ultrasound thickness measurement instruments.
In many applications it is helpful to know with accuracy the thickness of a part.
A thickness measurement may be used to detect part wear and may indicate that a part should be replaced before the part mechanically fails. For example, thickness measurements are helpful in determining whether to replace pipes carrying fluids, e.g., liquids or gasses, before the pipe bursts or otherwise fails due to excessive wear. On the other hand, it is desirable to avoid replacing pipes that still have a considerable safe useful life. For this reason, the need for accuracy in the determination of the thickness of the part is paramount.
Ultrasound instruments have been used to measure the thickness of pipes and other parts. The time-of-flight (TOF) of an ultrasonic echo traveling through a part is used to determine the thickness of the part. The ultrasound velocity in the part is a known constant. Thus, the TOF provides an accurate indication of part thickness. Pulse-echo techniques are usually used for these ultrasound measurements. Instruments having dual transducers in a pitch-catch configuration may be utilized for ultrasonic thickness measurements.
Pipes and other parts often are coated with paint and other coatings that affect the propagation rate of ultrasound signals. The coating may corrode or become thin due to wear. Measurement of the thickness is needed to determine whether the coating needs to be repaired or reapplied, and whether the coated pipe should be replaced.
Ultrasound measurement of the thickness of coatings is problematic. Pulse echo ultrasound techniques rely on the time of flight (TOF) of echoes reflecting off internal features of the pipe. With a corroded coating, the echoes at the interface between the coating and underlying pipe often become distorted due to the corrosion. In some instances, the ultrasound instrument cannot detect an echo from the coating-pipe interface and cannot reliably measure the thickness of the coating. Accordingly, there is a long felt need for a system and method to measure the thickness of coatings on parts using ultrasound measurement techniques.
In a first embodiment, the invention is an ultrasonic transducer instrument for measuring a part with a coating having at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating. The impedance of the buffer delay line may be within an order of magnitude of 3.0 x 1 o6 Kg/m2 sec and/or in a range of 9.9 x 106 Kg/m2 sec to 1.0 x 1 o6 Kg/m2 sec.
The first embodiment may include an ultrasonic transducer instrument that is a pair of ultrasonic transducers mounted on the buffer delay line so that the transmission of one transducer generates echoes that are sensed by the other transducer. Alternatively, the instrument has one ultrasonic transducer mounted on the buffer delay line.
In a second embodiment, the invention is a method to measure a thickness of a part using an ultrasonic transducer instrument having a buffer delay line and at least one transducer, the method comprising: selecting an impedance for the buffer delay line of a same order of magnitude as an impedance of a coating on the part; calibrating the instrument by determining a time of flight period (TCAL2) from an acoustic pulse emission to an echo reception, wherein the echo reflects from an interface between the coating and underlying part; measuring a time of flight (TOP) from an acoustic pulse emission to an echo reception, wherein the echo reflects from a back surface of the underlying part; determining a thickness of the part based on a difference between the TOF and the TCAL2.
The invention will now be described in greater detail, by way of example, with reference to the drawings, in which: FIGURE 1 is a schematic diagram of a dual transducer ultrasound instrument on an uncoated part. - 3
FIGURE 2 are ultrasound signal time-of-flight (TOF) graphs associated with the transducer and uncoated part shown in Figure 1.
FIGURE 3 is a schematic diagram of a dual transducer ultrasound instrument mounted on a coated part.
FIGURE 4 is an TOF graph associated with the transducer and coated part shown in Figure 3.
FIGURE 5 is a schematic diagram of a dual transducer ultrasound instrument on a coated part and illustrating an echo-to-echo signal.
FIGURE 6 is an TOF graph associated with the transducer and coated part shown in Figure 5 and showing the TOF2 of an echo-to-echo signal, as well as the TOF of a signal having no echo-to-echo signals in its propagation path.
FIGURE 7 is a pair of graphs showing a TOF of an ultrasound signal reflected from a back surface of a part, and a pair of calibration TOF signals designated TCAL and TCAL2 FIGURE 8 is a schematic diagram of an ultrasound instrument having a single transducer and mounted on a coated part.
FIGURE 1 shows an ultrasound instrument 10 having dual transducers 12 mounted on a transducer buffer delay line 14. The transducers may be arranged in a pitch-catch orientation. The instrument is mounted on a part 16 so as to measure a thickness (H) of the part. The transducers emit ultrasound signals, e.g., acoustic pulses, that propagate through the delay line, pass into the part 16 and reflect off the front surface 18 and back surface 20 of the part.
The propagation paths 22 of the ultrasound pulses from each of the transducers 12 indicate the outbound path of an acoustic pulse emitted from the transducer and the inward bound path of echoes reflected from the surfaces of the part and the internal features, such as interfaces between a paint coating and underlying part. In a dual transducer instrument, each transducer 12 emits an ultrasound signal and receives the echoes reflected from the signals emitted from the other transducer. The buffer delay line 14 - 4 - introduces a time delay in the signal propagation so that the transducers can switch from signal transmission to signal reception before the echoes return to the transducers. The dual transducers are mounted on the buffer delay line at a slight tilt angle such that signals transmitted from one transducer produce echoes that are received by the other transducer.
The time of flight (TOF) is the period from the transmission of an ultrasound pulse by one of the transducers 12 to when an echo of the pulse is received by the transducer. The TOF may Include periods during which the signal propagates through the delay line, e.g., To and T4, and periods during which the signal propagates through the part, e.g., T2 and T3.
FIGURE 1 shows a part 16 that does not have coatings. Echoes are reflected from the front and back surfaces of the part, but not from coatings on the part -- because there are no coatings in the part shown in Figure 1. The dual transducer instrument 10 has a buffer delay line 14 separating the transducer crystal from the front surface 18 of the part 16. The TOF is given by the sum of the time delays associated with the different paths: (Eq.1)TOF=T, +T2+T3+T4 Where: T. is the time delay associated with the first leg (outbound) of signal propagation through the buffer 14; T2 is the time delay associated with the first leg of signal propagation through the part; T3 is the time delay associated with the second leg (echo inbound) of signal propagation in the part; and T4 is the time delay associated with the second leg of signal propagation in the buffer.
T. and T4 can be measured during calibration (TCAL = T] + T4) of the instrument 10 using each transducer in pulse echo mode. TCAL IS indicative of the signal propagation time through the buffer delay line 14. The TCAL portion of the TOF is a constant applied during actual thickness measurements of the part.
The thickness (H) of the part 16 can be determined using equation (2) as follows: (Eq. 2) H = Vpart * (TOF - TCAL) * k /2 - 5 Where: Vpart is the propagation velocity of the ultrasound signal through the part, and k is a geometrical correction factor accounting for the tilt angle between the two transducers 12 and the factor 2 of the pulse-echo.
FIGURE 2 shows typical ultrasound echo signals acquired by the transducer for the measurement of the part 16 shown in Figure 1. The graphs shown in Figure 2 show the echo signal amplitude over a period of time. The first signal 24 represents the measurement a TOF (12.24 Llsec) of an echo reflecting off of the back surface 20 of the part. The second signal 26 may be assigned as the calibration time (TCAL = 9.53 f-]sec) and indicates the period of the TOF during which the signals are passing through the buffer delay line 14.
The second signal 26 was obtained by using the transducer in pulse-echo mode and measuring the signal reflected by the bottom surface of the delay line. Using Equation 2 and with Vpart = 0.232 in/Dsec, k=.955, the thickness (H) is 0.300 inches for the part 16 shown in Figure 1.
The part 16 in Figure 1 does not have a surface coating. Many parts do have coatings of paint or other materials to protect the part or provide some beneficial property to the part. Measurement of the thickness of the coating or of a coated part is difficult because the coating has a different acoustic velocity and may introduce an error in ultrasonic measurement.
FIGURE 3 shows a coated part 28 having a coating 30, e.g., paint, and an underlying part material 32. The TOF of an ultrasound signal propagating through the coating, part and buffer delay line as is indicated below in Equation 3: (Eq. 3)TOF=T, +T2+T3+T4+T5+T6 Where: T5 and T6 are the time delays associated with the ultrasonic wave traveling through the coating, and T. to T4 are the same as for the similarly referenced TOF periods shown in Figure 1.
The time delays (T5 and T6) associated with the coatings can introduce an error in the measurement of the thickness of the part. The error (ET) in the measurement of the part thickness, e.g., the thickness (TC) of the coating or - 6 the thickness (H) of the part, can be determined using Equations 4a and 4b below: (Eq. 4a) ET = VpartNcoating *(TO) * k (Eq. 4b) ET = VpartNcoating * H * k Where Vcoating is the propagation velocity of the ultrasound through the coating on the port. The ratio (VpartNcoating) is usually a factor of two to three. In view of this rather high velocity ratio, the error (ET) introduced by the coating in the determination of the thickness of the coating or part can be quite high.
FIGURE 4 is a chart showing the TOF of an ultrasound signal 33 associated the coated part 28, where the coating is a paint layer having a thickness of 0.030 inches. The TOF is 12.84 Llsec. Using equation 2, the estimated part thickness is 0.367 inches in contrast to the actual part thickness of 0.300.
Accordingly, a measurement error (ET) of 0.067 inches has been introduced into the part thickness measurement due to the coating.
FIGURE 5 is a schematic of a dual transducer ultrasound instrument 10 mounted on a coated part 28. The instrument senses echo-to-echo signals, as well as the transducer-to-echo signals. A echo-to-echo signal 34 is an ultrasound signal that Includes two or more reflected echoes in the path of the signal. A portion of the echo that reflects off the back surface 20 will reflect of the front surface 18 and again of the back surface before propagating to the transducer.
FIGURE 6 is a chart showing the TOF of a sequence of echo signals. A first signal (TOF) 36 has a path (To - Ts - T2 - T3 - T6 - T4) and does not include an echo-to-echo signal. A subsequent signal (TOF2) 38 (T,T5 - T2 T2 - T3 - T3 - T6 - T4). Two successive echoes (T2 - T2 - T3 - T3) of the same signal occur as can be used to determine the thickness of the part. The TOF of the first signal 36 is still given by equation 3. The TOF2 for the second signal 38 is given by equation 5 below: - 7 (Eq. 5)TOF2=T1 +2T2+2T3+T4+T5+T6 The thickness (H) of the part can be calculated using equation 6 below: (Eq. 6) H = Vpart * (TOF2 - TOF) * k/2 Using the prior example and the signals shown in Figure 6 to read TOF, the TOF2 is 15.55 nsec and TOF is 12.84 I lsec. Applying equation 6, the thickness of the part H is measured as being 0.300 inches, which is accurate.
In principle, the echo-to-echo measurement is accurate. However in many corroded parts, the echo-to-echo signals are distorted and weak. In some cases these signals are almost null. Often, the echo-to-echo signals cannot be reliably used to determine TOF2 and the echo-to-echo technique is not useful to measure the thickness of a part.
Another technique is needed to measure the thickness of a coating and the thickness of a coated part. Other prior art techniques utilize a magnetic measurement, such as Hall effect or Eddy current methods, to determine the thickness (h) of a coating. Once h is determined, then the part thickness (H) can be determined using equation 7 below: (7) H= Vpart*(TOF-TcAL)*k/2 - VparVVcoating * h * k However, if there is any error In the determination of h and or of Vcoating by the Hall effect or Eddy current sensors, then the thickness of the part (H) cannot be accuracy determined. Another prior art technique is to determine T5 and T6 separately and then subtract them from the TOF measurement.
Such a technique is shown in US Patent No. 6,035,717. These prior techniques for measuring the thickness of coated pipes have one or more problems, some of which are discussed above.
Another technique, which is the subject of this disclosure, is to impedance match the transducer buffer delay line buffer 14 in the ultrasound instrument to the impedance of the coating 30 on a coated part 28. Pipes and other parts are typically coated with paint, epoxy or RTVtype material. These coatings have a typical acoustic impedance on the order of 3.0 X106 Kg/m2 - 8 - sec. The delay line material in the buffer 14 of the transducer 12 may be selected such that it is impedance matched to the coating 30 on the pipe 28.
By impedance matching the buffer delay line 14 to the coating, the reflection coefficient between the end of the delay line and the coating is extremely small (R 0.1). By impedance matching, the coating becomes an extension of the delay line for ultrasonic purposes. A plurality of buffer delay lines 14 may be available for selection and attachment to the transducer instrument 10, wherein each buffer delay line has a different impedance. In use, the buffer delay line having an impedance similar to that of the coating being measured.
FIGURE 7 shows TOF graphs of a signal 40 that is of an echo reflected from the back surface 20 of a part; a calibration signal (TCAL2) 42 that reflected off the interface 44 (Fig. 3) between the coating 30 and the underlying part 32, and the calibration signal (TCAL) 46 performed on an uncoated part 16 (Fig. 1).
The calibration of the instrument is performed while the transducer is mounted on the pipe. When the transducer is mounted on a coated part, the ultrasound signals pass through, without reflection, the interface 44 between the buffer delay line 14 and coating 30, because the buffer delay line is impedance matched to the coating. The calibration signal is relatively strong, at least as compared to echo-to-echo signals. The TOF of the calibration signal (TCAL2) 42 is indicated by Equation 9 below with reference to Figure 3: (Eq 9) TCAL2 = T] + T4 + T5 + T6 Using TCAL2 the thickness (H) of the coated part 28 can be determined using Equation 10 below: (Eq. 10) H = Vpart * (TOF - TCAL2) * k /2 Further, the thickness (h) of the coating is determined knowing TCAL2 and the conventional calibration TOF (TCAL) 46 measured when the transducer is on an uncoated part. The coating thickness (h) may be determined using Equation 11 below: (Eq. 11) h = Vcoat * (TCAL2 - TCAL) * k /2 _ 9 _! The TOFs of the signals shown in Figure 7 provide an example of the measurements of the part and coating thicknesses (H. h). The timing of the TOF 40 is 12.84 []sec, TCAL 46 is 9.53 fIsec, and TCAL2 42 is 10.14 [:]sec Applying equations 10 and 11, the part thickness (H) is determined to be 0.300 inches and the coating thickness (h) is determined to be 0.029 inches.
Using impedance matching to determine a TCAL2, the time of flight of signals passing through the buffer delay line and coating and reflecting from the coating-part interface 44 provides an accurate technique for measuring the thickness of a coating and the underlying part.
The technique of impedance matching the buffer delay line to the impedance of the coating may also be applied to an ultrasound instrument 50 having a single transducer 52, as is shown in FIGURE 8. A instrument 50 having signal transducer 52 and a buffer delay line 54 is mounted on the coating 56 of a coated part 58. The propagation time through: the buffer delay line is represented by TA, the coating is represented by TB an through the part is represented by Tc.
The traditional instrument calibration signal (TCAL) indicates the acoustic propagation time through the buffer delay line, with the echo reflected from the bottom of the delay line 60. TCAL may be determined based on equation 12 below: (Eq 12) TCAL = 2 * TA The calibration signal (TCAL2) indicates the acoustic propagation time through the buffer delay line (TA) and coating (TB). TCAL2 may be determined based on equation 13 below: (Eq 13)TcAr2=2*(TA+Ts) The TOF of a signal reflecting from the back surface 20 of the part 58 may be determined based on equation 14 below: (Eq. 14)TOF=2*(TA+TB+TC) The part thickness (H) may be determined based on equation 15 below: (Eq. 15) H = Vpart * (TOF - TCAL2)/2 The coating thickness (h) may be determined based on equation 16 below: (Eq. 16) h = Vcoat * (TCAL2 - TCAL)/2 Please note that equations 15 and 16 are equivalent to equations 10 and 11, where k is taken as one.

Claims (10)

  1. CLAIMS: 1. An ultrasonic transducer for measuring a part with a coating
    comprising: at least one acoustic transducer, and a buffer delay line having an impedance matched to an impedance of the coating.
  2. 2. An ultrasonic transducer as in claim 1 wherein the impedance of the buffer delay line is 3.0 x 1 o6 Kg/m2 sec.
  3. 3. An ultrasonic transducer as in claim 1 wherein the impedance of the buffer delay line has a magnitude of 1.0 x 106 Kg/m2 sec.
  4. 4. An ultrasonic transducer as in claim 1 wherein the impedance of the buffer delay line is in a range of 9.9 x 1 o6 Kg/m2 sec to 1.0 x 1 o6 Kg/m2 sec.
  5. 5. An ultrasonic transducer as in claim 1 wherein the at least one transducer is two ultrasonic transducers mounted on the buffer delay line.
  6. 6. A method to measure a thickness of a part using an ultrasonic transducer instrument having a buffer delay line and at least one transducer, the method comprising: a). selecting an impedance for the buffer delay line of a same order of magnitude as an impedance of a coating on the part; b). calibrating the instrument by determining a time of flight period (TCAL2) from an acoustic pulse emission to an echo reception, wherein the echo reflects from an interface between the coating and underlying part; c). measuring a time of flight (TOP) from an acoustic pulse emission to an echo reception, wherein the echo reflects from a bottom surface of the underlying part; and d). determining a thickness of the part based on a difference between the TOF and the TCAL2
  7. 7. A method as in claim 6 wherein the determination of the thickness (H) of the part is made using the following equation: H = Vpart * (TOF - TCAL2) * k /2 wherein Vpart is an acoustic velocity through the part and k is a geometrical correction factor accounting for an angle between a pair of transducer that are the at least one ultrasound transducer.
  8. 8. A method as in claim 6 wherein the determination of the thickness (H) of the part is made using the following equation: H = Vpart * (TOP TCAL2)/2 wherein Vpart is an acoustic velocity through the part and the at least one transducer is one transducer.
  9. 9. An ultrasonic transducer for measuring a part with a coating substantially as described herein with reference to the drawings.
  10. 10. A method to measure a thickness of a part using an ultrasonic transducer instrument having a buffer delay line and at least one transducer, substantially as described herein with reference to the drawings.
GB0413477A 2003-06-16 2004-06-16 Method and apparatus for measuring part thickness having an external coating using impedance matching delay lines Expired - Fee Related GB2403010B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/461,382 US7194907B2 (en) 2003-06-16 2003-06-16 Method for measuring part thickness having an external coating using impedance matching delay lines

Publications (3)

Publication Number Publication Date
GB0413477D0 GB0413477D0 (en) 2004-07-21
GB2403010A true GB2403010A (en) 2004-12-22
GB2403010B GB2403010B (en) 2007-05-30

Family

ID=32772111

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0413477A Expired - Fee Related GB2403010B (en) 2003-06-16 2004-06-16 Method and apparatus for measuring part thickness having an external coating using impedance matching delay lines

Country Status (4)

Country Link
US (1) US7194907B2 (en)
JP (1) JP2005010159A (en)
DE (1) DE102004027798A1 (en)
GB (1) GB2403010B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2506145A (en) * 2012-09-21 2014-03-26 Permasense Ltd Ultrasonic non-destructive testing of solid objects

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007027391B3 (en) * 2007-06-11 2009-01-08 Forschungszentrum Dresden - Rossendorf E.V. Ultrasonic sensor for measuring local flow velocities in liquid melts
US9360309B2 (en) 2008-03-14 2016-06-07 Cidra Corporate Services Inc. Method and apparatus for monitoring of component housing wall thickness and wear monitoring
US8117918B2 (en) * 2008-03-14 2012-02-21 Expro Meters, Inc. Method and apparatus for determining pipewall thickness using one or more ultrasonic sensors
MX2010010142A (en) 2008-03-14 2010-12-20 Cidra Corporate Services Inc Flow and pipe management using velocity profile measurement and/or pipe wall thickness and wear monitoring.
DE102008041831A1 (en) * 2008-09-05 2010-03-25 Ge Inspection Technologies Gmbh Impulse echo method with determination of the lead body geometry
DE102008041835A1 (en) * 2008-09-05 2010-03-18 Ge Inspection Technologies Gmbh Impulse chopper method using phased array and temperature compensation
WO2011112715A1 (en) 2010-03-09 2011-09-15 Cidra Corporate Services Inc. Method and apparatus for using cepstrum and wavelet based algorithms for wall thickness measurement
CA2793513C (en) * 2010-03-18 2017-05-16 Cidra Corporate Services Inc. Method and apparatus for monitoring of component housing wall thickness and wear monitoring
KR101501857B1 (en) * 2010-09-16 2015-03-18 가부시키가이샤 아이에이치아이 Method and device for measuring surface-hardened layer
US8978476B2 (en) * 2012-11-05 2015-03-17 General Electric Company Ultrasonic signal coupler
GB2512835A (en) 2013-04-08 2014-10-15 Permasense Ltd Ultrasonic detection of a change in a surface of a wall
CN106017372B (en) * 2016-05-04 2018-02-02 大连理工大学 A method for ultrasonic non-destructive measurement of wear-resistant coating thickness and elastic modulus
US10837916B2 (en) * 2017-03-09 2020-11-17 Spirit Aerosystems, Inc. Optical measurement device for inspection of discontinuities in aerostructures
US20230280280A1 (en) * 2017-03-09 2023-09-07 Spirit Aerosystems, Inc. Optical measurement device for inspection of discontinuities in aerostructures
EP3470775B1 (en) 2017-10-11 2022-12-14 Flexim Flexible Industriemesstechnik GmbH Method and measuring assembly for measuring layer thickness and sound wave speed in single-layered or multilayered samples by means of ultrasound without a priori knowledge of the other variable
US11359488B2 (en) 2019-03-12 2022-06-14 Baker Hughes Oilfield Operations Llc Self-calibrated method of determining borehole fluid acoustic properties

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU868351A1 (en) * 1980-01-02 1981-09-30 Предприятие П/Я Р-6209 Ultrasonic method of measuring article coating thickness
JPH02205771A (en) * 1989-02-03 1990-08-15 Tokyo Keiki Co Ltd Ultrasonic probe
US5201225A (en) * 1990-09-24 1993-04-13 Toyo Kanetsu K.K. Instrument for measuring thickness of coated plate and method thereof
EP0878691A1 (en) * 1997-05-14 1998-11-18 Marmirt Ltd. A device for ultrasonic inspection of a multi-layer metal workpiece

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3174120A (en) * 1960-04-18 1965-03-16 Corning Glass Works Ultrasonic delay line having means to reduce third-time echo
US3663842A (en) * 1970-09-14 1972-05-16 North American Rockwell Elastomeric graded acoustic impedance coupling device
US3688222A (en) * 1971-03-18 1972-08-29 Us Army Matched ultrasonic delay line with solderable transducer electrodes
US4275597A (en) * 1977-07-11 1981-06-30 Smithkline Instruments, Inc. Ultrasonic beam scanning technique and apparatus
US4207772A (en) * 1977-07-11 1980-06-17 Mediscan, Inc. Electronic drive system and technique for ultrasonic transducer
DE3478357D1 (en) * 1983-03-17 1989-06-29 Matsushita Electric Industrial Co Ltd Ultrasonic transducers having improved acoustic impedance matching layers
WO1995002169A2 (en) * 1993-07-06 1995-01-19 Daniel Industries, Inc. Measuring the time of flight of a signal
US5723791A (en) * 1993-09-28 1998-03-03 Defelsko Corporation High resolution ultrasonic coating thickness gauge
US5777230A (en) * 1995-02-23 1998-07-07 Defelsko Corporation Delay line for an ultrasonic probe and method of using same
US5708209A (en) * 1996-08-27 1998-01-13 Aluminum Company Of America Apparatus and method for ultrasonic particle detection in molten metal
US6089094A (en) * 1997-10-09 2000-07-18 The United States Of America As Represented By The Department Of Health And Human Services Acoustical method and system for measuring barrier membrane thickness and the correspondent area distribution using maximum transmission or maximum reflection coefficients
US6330831B1 (en) * 1998-10-20 2001-12-18 Panametrics, Inc. Stream-cleaned differential reflection coefficient sensor
WO2000060317A1 (en) 1999-04-01 2000-10-12 Panametrics, Inc. Clamp-on ultrasonic flow meter for low density fluids
US6634233B2 (en) 2001-01-23 2003-10-21 Wright State University Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU868351A1 (en) * 1980-01-02 1981-09-30 Предприятие П/Я Р-6209 Ultrasonic method of measuring article coating thickness
JPH02205771A (en) * 1989-02-03 1990-08-15 Tokyo Keiki Co Ltd Ultrasonic probe
US5201225A (en) * 1990-09-24 1993-04-13 Toyo Kanetsu K.K. Instrument for measuring thickness of coated plate and method thereof
EP0878691A1 (en) * 1997-05-14 1998-11-18 Marmirt Ltd. A device for ultrasonic inspection of a multi-layer metal workpiece

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2506145A (en) * 2012-09-21 2014-03-26 Permasense Ltd Ultrasonic non-destructive testing of solid objects

Also Published As

Publication number Publication date
GB0413477D0 (en) 2004-07-21
GB2403010B (en) 2007-05-30
US20040250624A1 (en) 2004-12-16
JP2005010159A (en) 2005-01-13
DE102004027798A1 (en) 2005-01-13
US7194907B2 (en) 2007-03-27

Similar Documents

Publication Publication Date Title
US7194907B2 (en) Method for measuring part thickness having an external coating using impedance matching delay lines
US6122968A (en) Delay line for an ultrasonic probe and method of using same
CN111183332B (en) Method and device for measuring the layer thickness and the sound velocity of a layer of a single-layer or multi-layer sample
US8170809B2 (en) Guided waves for nondestructive testing of pipes
JP2676321B2 (en) Ultrasonic flow measurement method and device
US4831884A (en) Device for determining the flow velocity of a medium in a cylindrical conduit
US20050209795A1 (en) Method and system for calculating the transit time of an ultrasonic pulse
US6584860B1 (en) Flow probe insertion gauge
US6772638B2 (en) UT detection and sizing method for thin wall tubes
US7076992B2 (en) Method and apparatus for calibrating position and thickness in acoustic hull testing
RU2005102778A (en) METHOD FOR MEASURING COATING CLUTCH WITH SUBSTRATE
US6314055B1 (en) Range measuring system
RU2259557C2 (en) Method for measuring hardness of engagement of covering with substrate
EP3486619A1 (en) Device and method for detecting deposition layers in a conduit conducting a liquid or a soft medium and/or for level detection
US6865137B2 (en) Method for pulse offset calibration in time of flight ranging systems
RU2231753C1 (en) Procedure measuring thickness of article with use of ultrasonic pulses
JP3136002B2 (en) Ultrasonic flow meter
JP3821035B2 (en) Material thickness measurement method
JPH02205771A (en) Ultrasonic probe
RU2301420C2 (en) Mode of definition of coefficient of longitudinal ultrasound vibrations' fading in material
GB2262341A (en) Method and apparatus for measuring distances using an acoustic signal
US20200233070A1 (en) Ultrasonic wave apparatus for measure of distance
RU2034236C1 (en) Ultrasound echo thickness gage
JPS61228307A (en) Apparatus for ultrasonic thickness measurement of material to be inspected with coating
JPH11108648A (en) Measuring method of thickness and distance using ultrasonic wave

Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20090616