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GB0812480D0 - Sample holder - Google Patents

Sample holder

Info

Publication number
GB0812480D0
GB0812480D0 GBGB0812480.2A GB0812480A GB0812480D0 GB 0812480 D0 GB0812480 D0 GB 0812480D0 GB 0812480 A GB0812480 A GB 0812480A GB 0812480 D0 GB0812480 D0 GB 0812480D0
Authority
GB
United Kingdom
Prior art keywords
sample holder
holder
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
GBGB0812480.2A
Other versions
GB2461708A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SILSON Ltd
Original Assignee
SILSON Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SILSON Ltd filed Critical SILSON Ltd
Priority to GB0812480A priority Critical patent/GB2461708A/en
Publication of GB0812480D0 publication Critical patent/GB0812480D0/en
Priority to PCT/GB2009/001692 priority patent/WO2010004275A2/en
Publication of GB2461708A publication Critical patent/GB2461708A/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2204—Specimen supports therefor; Sample conveying means therefore
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K5/00—Irradiation devices
    • G21K5/08—Holders for targets or for other objects to be irradiated
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K7/00—Gamma- or X-ray microscopes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2001—Maintaining constant desired temperature
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2008—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated specially adapted for studying electrical or magnetical properties of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/206—Modifying objects while observing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/26—Electron or ion microscopes
    • H01J2237/28—Scanning microscopes

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Engineering & Computer Science (AREA)
  • Nanotechnology (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
GB0812480A 2008-07-08 2008-07-08 Sample holder Withdrawn GB2461708A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GB0812480A GB2461708A (en) 2008-07-08 2008-07-08 Sample holder
PCT/GB2009/001692 WO2010004275A2 (en) 2008-07-08 2009-07-07 Sample holder

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB0812480A GB2461708A (en) 2008-07-08 2008-07-08 Sample holder

Publications (2)

Publication Number Publication Date
GB0812480D0 true GB0812480D0 (en) 2008-08-13
GB2461708A GB2461708A (en) 2010-01-13

Family

ID=39718156

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0812480A Withdrawn GB2461708A (en) 2008-07-08 2008-07-08 Sample holder

Country Status (2)

Country Link
GB (1) GB2461708A (en)
WO (1) WO2010004275A2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2626884A1 (en) * 2012-02-10 2013-08-14 Danmarks Tekniske Universitet - DTU Microfluidic chip for high resolution transmission electron microscopy
GB201613173D0 (en) * 2016-07-29 2016-09-14 Medical Res Council Electron microscopy
GB201721152D0 (en) * 2017-12-18 2018-01-31 Univ Warwick Transmission electron microscopy systems
CN115931942A (en) * 2022-12-08 2023-04-07 中国铝业股份有限公司 X-ray fluorescence spectrum determination sample and preparation method thereof

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4953387A (en) * 1989-07-31 1990-09-04 The Regents Of The University Of Michigan Ultrathin-film gas detector
US5296255A (en) * 1992-02-14 1994-03-22 The Regents Of The University Of Michigan In-situ monitoring, and growth of thin films by means of selected area CVD
JP3359703B2 (en) * 1992-08-27 2002-12-24 オリンパス光学工業株式会社 X-ray microscope sample container and sample holding method
JP2835422B2 (en) * 1994-04-30 1998-12-14 株式会社北里サプライ Transparent heating plate for microscope and transparent heating device for microscope
JPH07333119A (en) * 1994-06-14 1995-12-22 Nikon Corp Sample holder
JPH09297093A (en) * 1996-05-01 1997-11-18 Hamamatsu Photonics Kk Sample cell for x-ray microscope
US5731587A (en) * 1996-08-12 1998-03-24 The Regents Of The University Of Michigan Hot stage for scanning probe microscope
US20090045349A1 (en) * 2004-08-26 2009-02-19 David Sprinzak Sample enclosure for inspection and methods of use thereof
NL1027025C2 (en) * 2004-09-13 2006-03-14 Univ Delft Tech Microreactor for a transmission electron microscope and heating element and method for manufacturing thereof.
WO2006127736A2 (en) * 2005-05-23 2006-11-30 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of The University Of Oregon Silicon substrates with thermal oxide windows for transmission electron microscopy
JP2008047411A (en) * 2006-08-15 2008-02-28 Jeol Ltd Sample holder, sample inspection method, and sample inspection apparatus
TWI330380B (en) * 2006-12-07 2010-09-11 Nat Univ Tsing Hua A specimen kit for electron microscope and its fabrication process
WO2008141147A1 (en) * 2007-05-09 2008-11-20 Protochips, Inc. Microscopy support structures

Also Published As

Publication number Publication date
GB2461708A (en) 2010-01-13
WO2010004275A3 (en) 2010-06-03
WO2010004275A2 (en) 2010-01-14

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Legal Events

Date Code Title Description
WAP Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1)