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GB0713585D0 - Equivalent - Google Patents

Equivalent

Info

Publication number
GB0713585D0
GB0713585D0 GBGB0713585.8A GB0713585A GB0713585D0 GB 0713585 D0 GB0713585 D0 GB 0713585D0 GB 0713585 A GB0713585 A GB 0713585A GB 0713585 D0 GB0713585 D0 GB 0713585D0
Authority
GB
United Kingdom
Prior art keywords
equivalent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0713585.8A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Corp
Original Assignee
Fluke Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/462,996 external-priority patent/US7403274B2/en
Application filed by Fluke Corp filed Critical Fluke Corp
Publication of GB0713585D0 publication Critical patent/GB0713585D0/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/31—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter and a light receiver being disposed at the same side of a fibre or waveguide end-face, e.g. reflectometers
    • G01M11/3109—Reflectometers detecting the back-scattered light in the time-domain, e.g. OTDR
    • G01M11/3145—Details of the optoelectronics or data analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Communication System (AREA)
  • Tests Of Electronic Circuits (AREA)
GBGB0713585.8A 2006-07-16 2007-07-12 Equivalent Ceased GB0713585D0 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US80749806P 2006-07-16 2006-07-16
US46278306A 2006-08-07 2006-08-07
US11/462,996 US7403274B2 (en) 2006-07-16 2006-08-07 Equivalent time sampling system

Publications (1)

Publication Number Publication Date
GB0713585D0 true GB0713585D0 (en) 2007-08-22

Family

ID=38461602

Family Applications (2)

Application Number Title Priority Date Filing Date
GBGB0713585.8A Ceased GB0713585D0 (en) 2006-07-16 2007-07-12 Equivalent
GB0713720A Active GB2440253B (en) 2006-07-16 2007-07-16 Equivalent time sampling system

Family Applications After (1)

Application Number Title Priority Date Filing Date
GB0713720A Active GB2440253B (en) 2006-07-16 2007-07-16 Equivalent time sampling system

Country Status (2)

Country Link
DE (1) DE102007032791B4 (en)
GB (2) GB0713585D0 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2219018B1 (en) * 2009-02-17 2016-02-17 Alcatel Lucent Method for monitoring an optical data line, and optical transmission module therefor
CN103454903B (en) * 2013-09-23 2016-05-04 哈尔滨工程大学 A kind of time interval measurement calibrating installation and calibration steps thereof based on optics times journey
JP7257105B2 (en) * 2018-03-02 2023-04-13 株式会社東京精密 Absolute distance measuring device and method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6150033A (en) * 1984-08-18 1986-03-12 Iwatsu Electric Co Ltd Time domain reflectometer
US7173443B1 (en) * 1998-11-24 2007-02-06 Advantest Corp. Semiconductor test system
JP4386514B2 (en) * 1998-11-24 2009-12-16 株式会社アドバンテスト Semiconductor test equipment
WO2001020288A1 (en) * 1999-09-10 2001-03-22 Anritsu Corporation Optical time domain reflectometer
JP2003185683A (en) * 2001-12-21 2003-07-03 Yokogawa Electric Corp Waveform measuring instrument
US7697912B2 (en) * 2005-09-22 2010-04-13 Freescale Semiconductor, Inc. Method to adjustably convert a first data signal having a first time domain to a second data signal having a second time domain

Also Published As

Publication number Publication date
GB2440253B (en) 2011-07-13
DE102007032791B4 (en) 2020-10-01
DE102007032791A1 (en) 2008-04-24
GB2440253A (en) 2008-01-23
GB0713720D0 (en) 2007-08-22

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)