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GB0624967D0 - Not published - Google Patents

Not published

Info

Publication number
GB0624967D0
GB0624967D0 GBGB0624967.6A GB0624967A GB0624967D0 GB 0624967 D0 GB0624967 D0 GB 0624967D0 GB 0624967 A GB0624967 A GB 0624967A GB 0624967 D0 GB0624967 D0 GB 0624967D0
Authority
GB
United Kingdom
Prior art keywords
published
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GBGB0624967.6A
Other versions
GB2438640B (en
GB2438640A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
Original Assignee
Tokyo Seimitsu Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority claimed from PCT/JP2006/311150 external-priority patent/WO2007023605A1/en
Publication of GB0624967D0 publication Critical patent/GB0624967D0/en
Publication of GB2438640A publication Critical patent/GB2438640A/en
Application granted granted Critical
Publication of GB2438640B publication Critical patent/GB2438640B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0016Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to weight
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0002Arrangements for supporting, fixing or guiding the measuring instrument or the object to be measured
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/20Measuring arrangements characterised by the use of mechanical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/28Measuring arrangements characterised by the use of electric or magnetic techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/34Measuring arrangements characterised by the use of electric or magnetic techniques for measuring roughness or irregularity of surfaces

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
GB0624967A 2006-05-29 2006-05-29 Surface roughness/outline shape measurement device Expired - Fee Related GB2438640B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/311150 WO2007023605A1 (en) 2005-08-23 2006-05-29 Surface roughness/outline shape measurement device

Publications (3)

Publication Number Publication Date
GB0624967D0 true GB0624967D0 (en) 2007-01-24
GB2438640A GB2438640A (en) 2007-12-05
GB2438640B GB2438640B (en) 2011-05-18

Family

ID=37712137

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0624967A Expired - Fee Related GB2438640B (en) 2006-05-29 2006-05-29 Surface roughness/outline shape measurement device

Country Status (1)

Country Link
GB (1) GB2438640B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201007186D0 (en) * 2010-04-30 2010-06-09 Renishaw Plc Changeable task module counterweight

Also Published As

Publication number Publication date
GB2438640B (en) 2011-05-18
GB2438640A (en) 2007-12-05

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20110818