GB0118981D0 - Electron microscope and spectroscopy system - Google Patents
Electron microscope and spectroscopy systemInfo
- Publication number
- GB0118981D0 GB0118981D0 GB0118981A GB0118981A GB0118981D0 GB 0118981 D0 GB0118981 D0 GB 0118981D0 GB 0118981 A GB0118981 A GB 0118981A GB 0118981 A GB0118981 A GB 0118981A GB 0118981 D0 GB0118981 D0 GB 0118981D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- electron microscope
- spectroscopy system
- spectroscopy
- microscope
- electron
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000004611 spectroscopical analysis Methods 0.000 title 1
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0118981A GB0118981D0 (en) | 2001-08-03 | 2001-08-03 | Electron microscope and spectroscopy system |
| US10/211,558 US6885445B2 (en) | 1998-05-09 | 2002-08-05 | Electron microscope and spectroscopy system |
| PCT/GB2002/003599 WO2003014794A1 (en) | 2001-08-03 | 2002-08-05 | Electron microscope and spectroscopy system |
| JP2003519668A JP2004538470A (en) | 2001-08-03 | 2002-08-05 | Electron microscope and spectroscopy system |
| EP02753135A EP1412796A1 (en) | 2001-08-03 | 2002-08-05 | Electron microscope and spectroscopy system |
| JP2008291333A JP5095587B2 (en) | 2001-08-03 | 2008-11-13 | Adapter for optical analysis of specimens |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0118981A GB0118981D0 (en) | 2001-08-03 | 2001-08-03 | Electron microscope and spectroscopy system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB0118981D0 true GB0118981D0 (en) | 2001-09-26 |
Family
ID=9919764
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB0118981A Ceased GB0118981D0 (en) | 1998-05-09 | 2001-08-03 | Electron microscope and spectroscopy system |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP1412796A1 (en) |
| JP (2) | JP2004538470A (en) |
| GB (1) | GB0118981D0 (en) |
| WO (1) | WO2003014794A1 (en) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2003322611A (en) * | 2002-04-30 | 2003-11-14 | Horiba Ltd | Measuring chamber equipped with optical window |
| EP1953791A1 (en) * | 2007-02-05 | 2008-08-06 | FEI Company | Apparatus for observing a sample with a particle beam and an optical microscope |
| JP5507177B2 (en) * | 2009-09-25 | 2014-05-28 | 株式会社堀場製作所 | Photodetector |
| FR2960699B1 (en) * | 2010-05-27 | 2013-05-10 | Centre Nat Rech Scient | FLEXIBLE CATHODOLUMINESCENCE DETECTION SYSTEM AND MICROSCOPE USING SUCH A SYSTEM. |
| EP2469253A1 (en) | 2010-12-24 | 2012-06-27 | HybriScan Technologies Holding BV | System for electron microscopy and Raman spectroscopy |
| CZ2014184A3 (en) | 2014-03-26 | 2015-08-26 | Tescan Orsay Holding, A.S. | Analytic system with Raman microscope and electron microscope |
| US10707051B2 (en) * | 2018-05-14 | 2020-07-07 | Gatan, Inc. | Cathodoluminescence optical hub |
| JP7194202B2 (en) * | 2018-05-30 | 2022-12-21 | ガタン インコーポレイテッド | Apparatus and method for wavelength-resolved and angle-resolved cathodoluminescence |
| JP7505990B2 (en) * | 2021-01-07 | 2024-06-25 | 浜松ホトニクス株式会社 | Light source |
| EP4092406A1 (en) * | 2021-05-19 | 2022-11-23 | Hitachi High-Tech Analytical Science Finland Oy | An optical assembly for optical emission spectroscopy |
| GB202203238D0 (en) | 2022-03-09 | 2022-04-20 | Renishaw Plc | Optical apparatus |
| GB202203236D0 (en) | 2022-03-09 | 2022-04-20 | Renishaw Plc | Optical apparatus |
| GB202203237D0 (en) | 2022-03-09 | 2022-04-20 | Renishaw Plc | Optical apparatus |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| IT1088539B (en) * | 1976-12-24 | 1985-06-10 | Rolls Royce | PROBE FOR USE IN MEASURING EQUIPMENT |
| US4451987A (en) * | 1982-06-14 | 1984-06-05 | The Valeron Corporation | Touch probe |
| US4810093A (en) * | 1986-08-11 | 1989-03-07 | Laser Precision Corporation | Versatile and efficient radiation transmission apparatus and method for spectrometers |
| JPH0415529A (en) * | 1990-05-09 | 1992-01-20 | Hitachi Ltd | Two-dimensional image spectral device and two-dimensional image spectral processor and its method |
| GB9308364D0 (en) * | 1993-04-22 | 1993-06-09 | Renishaw Metrology Ltd | Probe arm for machine tool |
| US5789750A (en) * | 1996-09-09 | 1998-08-04 | Lucent Technologies Inc. | Optical system employing terahertz radiation |
| JP4392990B2 (en) * | 1998-05-09 | 2010-01-06 | レニショウ パブリック リミテッド カンパニー | Electron microscope and spectroscopic system |
| GB9819006D0 (en) * | 1998-09-02 | 1998-10-21 | Renishaw Plc | Optical filter |
| WO2000065331A2 (en) * | 1999-04-22 | 2000-11-02 | Kla-Tencor Corporation | System for analyzing surface characteristics with self-calibrating capability |
| JP3884594B2 (en) * | 1999-05-20 | 2007-02-21 | 浜松ホトニクス株式会社 | Fluorescence lifetime measuring device |
-
2001
- 2001-08-03 GB GB0118981A patent/GB0118981D0/en not_active Ceased
-
2002
- 2002-08-05 JP JP2003519668A patent/JP2004538470A/en active Pending
- 2002-08-05 EP EP02753135A patent/EP1412796A1/en not_active Ceased
- 2002-08-05 WO PCT/GB2002/003599 patent/WO2003014794A1/en not_active Ceased
-
2008
- 2008-11-13 JP JP2008291333A patent/JP5095587B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| WO2003014794A1 (en) | 2003-02-20 |
| JP2004538470A (en) | 2004-12-24 |
| JP5095587B2 (en) | 2012-12-12 |
| JP2009031314A (en) | 2009-02-12 |
| EP1412796A1 (en) | 2004-04-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| AT | Applications terminated before publication under section 16(1) |