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FR2994506B1 - Adaptation de transistors - Google Patents

Adaptation de transistors

Info

Publication number
FR2994506B1
FR2994506B1 FR1257792A FR1257792A FR2994506B1 FR 2994506 B1 FR2994506 B1 FR 2994506B1 FR 1257792 A FR1257792 A FR 1257792A FR 1257792 A FR1257792 A FR 1257792A FR 2994506 B1 FR2994506 B1 FR 2994506B1
Authority
FR
France
Prior art keywords
adaptation
transistors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1257792A
Other languages
English (en)
Other versions
FR2994506A1 (fr
Inventor
Frederic Allibert
Maud Vinet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Soitec SA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Soitec SA
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA, Soitec SA, Commissariat a lEnergie Atomique et aux Energies Alternatives CEA filed Critical Commissariat a lEnergie Atomique CEA
Priority to FR1257792A priority Critical patent/FR2994506B1/fr
Priority to PCT/EP2013/066930 priority patent/WO2014026996A1/fr
Priority to US14/421,298 priority patent/US9443933B2/en
Publication of FR2994506A1 publication Critical patent/FR2994506A1/fr
Application granted granted Critical
Publication of FR2994506B1 publication Critical patent/FR2994506B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/10Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
    • H10D62/124Shapes, relative sizes or dispositions of the regions of semiconductor bodies or of junctions between the regions
    • H10D62/126Top-view geometrical layouts of the regions or the junctions
    • H10D62/127Top-view geometrical layouts of the regions or the junctions of cellular field-effect devices, e.g. multicellular DMOS transistors or IGBTs
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00Computer-aided design [CAD]
    • G06F30/30Circuit design
    • G06F30/39Circuit design at the physical level
    • G06F30/398Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B10/00Static random access memory [SRAM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/0123Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
    • H10D84/0126Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
    • H10D84/0128Manufacturing their channels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/01Manufacture or treatment
    • H10D84/02Manufacture or treatment characterised by using material-based technologies
    • H10D84/03Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
    • H10D84/038Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology using silicon technology, e.g. SiGe
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D84/00Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
    • H10D84/80Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
    • H10D84/82Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/201Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates the substrates comprising an insulating layer on a semiconductor body, e.g. SOI
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/10Integrated device layouts

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Evolutionary Computation (AREA)
  • Geometry (AREA)
  • General Physics & Mathematics (AREA)
  • Thin Film Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
FR1257792A 2012-08-13 2012-08-13 Adaptation de transistors Active FR2994506B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR1257792A FR2994506B1 (fr) 2012-08-13 2012-08-13 Adaptation de transistors
PCT/EP2013/066930 WO2014026996A1 (fr) 2012-08-13 2013-08-13 Mise en correspondance de transistors
US14/421,298 US9443933B2 (en) 2012-08-13 2013-08-13 Matching of transistors

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1257792A FR2994506B1 (fr) 2012-08-13 2012-08-13 Adaptation de transistors

Publications (2)

Publication Number Publication Date
FR2994506A1 FR2994506A1 (fr) 2014-02-14
FR2994506B1 true FR2994506B1 (fr) 2015-11-27

Family

ID=46963966

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1257792A Active FR2994506B1 (fr) 2012-08-13 2012-08-13 Adaptation de transistors

Country Status (3)

Country Link
US (1) US9443933B2 (fr)
FR (1) FR2994506B1 (fr)
WO (1) WO2014026996A1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3057104A1 (fr) * 2016-10-04 2018-04-06 Commissariat A L'energie Atomique Et Aux Energies Alternatives Transistors a effet de champ de type fdsoi
US9935187B1 (en) * 2017-03-31 2018-04-03 Teresa Oh Ambipolar transistor and leakage current cutoff device using the same
US10784250B2 (en) * 2018-08-21 2020-09-22 Marvell Asia Pte, Ltd. Sub-device field-effect transistor architecture for integrated circuits
US11755808B2 (en) * 2020-07-10 2023-09-12 Taiwan Semiconductor Manufacturing Company Limited Mixed poly pitch design solution for power trim

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH088264B2 (ja) * 1988-06-30 1996-01-29 株式会社東芝 半導体集積回路
US7397085B2 (en) * 2000-12-31 2008-07-08 Texas Instruments Incorporated Thermal coupling of matched SOI device bodies
JP4852694B2 (ja) * 2004-03-02 2012-01-11 独立行政法人産業技術総合研究所 半導体集積回路およびその製造方法
JP2008004796A (ja) * 2006-06-23 2008-01-10 Matsushita Electric Ind Co Ltd 半導体装置および回路素子レイアウト方法
US7673195B2 (en) * 2007-10-03 2010-03-02 International Business Machines Corporation Circuits and methods for characterizing device variation in electronic memory circuits

Also Published As

Publication number Publication date
US9443933B2 (en) 2016-09-13
US20150221723A1 (en) 2015-08-06
FR2994506A1 (fr) 2014-02-14
WO2014026996A1 (fr) 2014-02-20

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