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FR2896871B1 - Dispositif de mesure pour la mesure optique d'un objet. - Google Patents

Dispositif de mesure pour la mesure optique d'un objet.

Info

Publication number
FR2896871B1
FR2896871B1 FR0700561A FR0700561A FR2896871B1 FR 2896871 B1 FR2896871 B1 FR 2896871B1 FR 0700561 A FR0700561 A FR 0700561A FR 0700561 A FR0700561 A FR 0700561A FR 2896871 B1 FR2896871 B1 FR 2896871B1
Authority
FR
France
Prior art keywords
measuring
optically
measuring device
optically measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0700561A
Other languages
English (en)
Other versions
FR2896871A1 (fr
Inventor
Christian Rembe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Polytec GmbH
Original Assignee
Polytec GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Polytec GmbH filed Critical Polytec GmbH
Publication of FR2896871A1 publication Critical patent/FR2896871A1/fr
Application granted granted Critical
Publication of FR2896871B1 publication Critical patent/FR2896871B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02012—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal intensity variation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/50—Systems of measurement based on relative movement of target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/491—Details of non-pulse systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
FR0700561A 2006-01-27 2007-01-26 Dispositif de mesure pour la mesure optique d'un objet. Expired - Fee Related FR2896871B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP06001676A EP1813962A1 (fr) 2006-01-27 2006-01-27 Dispositif de mesure et procédé destinés à la mesure optique d'un objet

Publications (2)

Publication Number Publication Date
FR2896871A1 FR2896871A1 (fr) 2007-08-03
FR2896871B1 true FR2896871B1 (fr) 2012-02-10

Family

ID=36609441

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0700561A Expired - Fee Related FR2896871B1 (fr) 2006-01-27 2007-01-26 Dispositif de mesure pour la mesure optique d'un objet.

Country Status (5)

Country Link
US (1) US7663764B2 (fr)
EP (1) EP1813962A1 (fr)
JP (1) JP4914729B2 (fr)
DE (1) DE102007003777B4 (fr)
FR (1) FR2896871B1 (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7480058B2 (en) * 2006-01-19 2009-01-20 Optovue, Inc. Fourier-domain optical coherence tomography imager
DE102007023826A1 (de) * 2007-05-21 2008-11-27 Polytec Gmbh Verfahren und Vorrichtung zur berührungslosen Schwingungsmessung
DE102008017119A1 (de) 2008-04-02 2009-10-08 Polytec Gmbh Vibrometer und Verfahren zur optischen Vermessung eines Objekts
SE533391C2 (sv) * 2008-05-09 2010-09-14 Gs Dev Ab Kombinationssikte
JP5306075B2 (ja) * 2008-07-07 2013-10-02 キヤノン株式会社 光干渉断層法を用いる撮像装置及び撮像方法
DE102010004366A1 (de) * 2010-01-12 2011-07-14 Flsmidth A/S Vorrichtung und Verfahren zur Kontrolle der Verfestigung einer Kohleschüttung
DE102011100252A1 (de) * 2011-05-03 2012-11-08 Polytec Gmbh Verfahren und Vorrichtung zur optischen, berührungslosen Schwingungsmessung eines schwingenden Objekts
CN103791844B (zh) * 2014-01-20 2016-08-17 浙江大学 光学位移测量系统
WO2017015424A1 (fr) * 2015-07-22 2017-01-26 The University Of Mississippi Capteur interférométrique différentiel multi-faisceaux laser et procédés pour une imagerie par vibration
JP6795154B2 (ja) * 2016-07-20 2020-12-02 学校法人東京電機大学 干渉計

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6123943A (ja) * 1984-07-12 1986-02-01 Kano Hajime 粒子計測装置
US4690551A (en) * 1985-04-19 1987-09-01 Massachusetts Institute Of Technology Laser radar utilizing pulse-tone waveform
JPS6319507A (ja) * 1986-07-12 1988-01-27 Diesel Kiki Co Ltd 噴霧流測定装置
JPS63229309A (ja) * 1987-03-18 1988-09-26 Nikon Corp 微細パタ−ンの深さ測定方法及びその装置
US4995720A (en) * 1989-12-12 1991-02-26 Litton Systems, Inc. Pulsed coherent Doppler laser radar
JPH04249719A (ja) * 1991-01-07 1992-09-04 Ono Sokki Co Ltd 光ファイバ・レーザドップラ振動計
AT396526B (de) * 1992-04-23 1993-10-25 Tabarelli Werner Interferometer
US5317376A (en) * 1992-12-03 1994-05-31 Litton Systems, Inc. Solid state pulsed coherent laser radar for short range velocimetry applications
JP3372632B2 (ja) * 1993-11-22 2003-02-04 グラフテック株式会社 レーザ利用測定器
DE4414514A1 (de) * 1994-04-26 1995-11-02 Klaus Deichl Verfahren zur Ermittlung der zwischen zwei Meßorten liegenden Strecke und Vorrichtung zur Durchführung des Verfahrens
FR2728971A1 (fr) * 1994-12-30 1996-07-05 Thomson Csf Telemetre discret multifonctionnel
JP4438111B2 (ja) * 1998-07-02 2010-03-24 ソニー株式会社 計測装置及び計測方法
JP4192370B2 (ja) * 1999-12-03 2008-12-10 ソニー株式会社 検査装置及び検査方法
JP2001168159A (ja) * 1999-12-03 2001-06-22 Sony Corp 検査装置及び検査方法
JP2004103807A (ja) * 2002-09-09 2004-04-02 Tokyo Seimitsu Co Ltd 外観検査装置
JP2004233163A (ja) * 2003-01-29 2004-08-19 Hitachi High-Technologies Corp パターン欠陥検査方法およびその装置
KR100503007B1 (ko) * 2003-06-24 2005-07-21 삼성전기주식회사 광픽업용 액추에이터의 부공진 측정 장치
US7031796B2 (en) * 2003-09-03 2006-04-18 Kla-Tencor Technologies Corporation Radiation damage reduction
JP2006349534A (ja) * 2005-06-16 2006-12-28 Fujinon Corp 動体測定用干渉計装置および動体測定用光干渉計測方法

Also Published As

Publication number Publication date
FR2896871A1 (fr) 2007-08-03
EP1813962A1 (fr) 2007-08-01
US20070177154A1 (en) 2007-08-02
DE102007003777B4 (de) 2010-07-08
DE102007003777A1 (de) 2007-08-02
JP4914729B2 (ja) 2012-04-11
JP2007199071A (ja) 2007-08-09
US7663764B2 (en) 2010-02-16

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