FR2886458B1 - Reseau capacitif - Google Patents
Reseau capacitifInfo
- Publication number
- FR2886458B1 FR2886458B1 FR0505267A FR0505267A FR2886458B1 FR 2886458 B1 FR2886458 B1 FR 2886458B1 FR 0505267 A FR0505267 A FR 0505267A FR 0505267 A FR0505267 A FR 0505267A FR 2886458 B1 FR2886458 B1 FR 2886458B1
- Authority
- FR
- France
- Prior art keywords
- capacitive network
- capacitive
- network
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/5222—Capacitive arrangements or effects of, or between wiring layers
- H01L23/5223—Capacitor integral with wiring layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/38—Multiple capacitors, i.e. structural combinations of fixed capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/201—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
- H10D84/204—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
- H10D84/212—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors of only capacitors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D1/00—Resistors, capacitors or inductors
- H10D1/60—Capacitors
- H10D1/68—Capacitors having no potential barriers
- H10D1/692—Electrodes
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0505267A FR2886458B1 (fr) | 2005-05-25 | 2005-05-25 | Reseau capacitif |
| US11/420,152 US7873191B2 (en) | 2005-05-25 | 2006-05-24 | Capacitive array |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0505267A FR2886458B1 (fr) | 2005-05-25 | 2005-05-25 | Reseau capacitif |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2886458A1 FR2886458A1 (fr) | 2006-12-01 |
| FR2886458B1 true FR2886458B1 (fr) | 2007-09-07 |
Family
ID=35575445
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR0505267A Expired - Fee Related FR2886458B1 (fr) | 2005-05-25 | 2005-05-25 | Reseau capacitif |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7873191B2 (fr) |
| FR (1) | FR2886458B1 (fr) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102007051871A1 (de) * | 2007-10-30 | 2009-05-07 | Robert Bosch Gmbh | Mikromechanisches Bauelement und Verfahren zum Betrieb eines mikromechanischen Bauelements |
| US8076893B2 (en) * | 2008-09-04 | 2011-12-13 | The Board Of Trustees Of The University Of Illinois | Displacement actuation and sensing for an electrostatic drive |
| TW201110167A (en) * | 2009-09-04 | 2011-03-16 | Novatek Microelectronics Corp | Metal-oxide-metal capacitor having low parasitic capacitor |
| US8594604B2 (en) * | 2009-12-18 | 2013-11-26 | Nxp, B.V. | Fringe capacitor circuit |
| CN103180938A (zh) * | 2010-10-26 | 2013-06-26 | 松下电器产业株式会社 | 电容排列体以及具备该电容排列体的信号处理装置 |
| EP2458636A1 (fr) * | 2010-11-29 | 2012-05-30 | Nxp B.V. | Réseau de compensation pour transistor RF |
| FR2976715B1 (fr) * | 2011-06-15 | 2013-06-28 | St Microelectronics Sa | Dispositif capacitif integre et convertisseur analogique numerique integre comprenant un tel dispositif |
| KR101585959B1 (ko) * | 2015-02-10 | 2016-01-20 | 전자부품연구원 | 무선랜 ap의 adc에 적용 가능한 mom 커패시터 |
| DE102018104459A1 (de) * | 2018-02-27 | 2019-08-29 | Tdk Electronics Ag | Vielschichtbauelement mit externer Kontaktierung |
| US10629672B2 (en) * | 2018-07-31 | 2020-04-21 | Taiwan Semiconductor Manufacturing Co., Ltd. | Capacitor structure with low capacitance |
| TWI774363B (zh) * | 2021-05-11 | 2022-08-11 | 瑞昱半導體股份有限公司 | 手指式半導體電容陣列布局 |
| CN113378510A (zh) * | 2021-06-29 | 2021-09-10 | 上海华力微电子有限公司 | 拟合mom电容的模型 |
| CN114203442B (zh) * | 2021-12-03 | 2023-11-03 | 灿芯半导体(上海)股份有限公司 | 一种用于高精度电容阵列的电容单元 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4093892A (en) * | 1967-01-16 | 1978-06-06 | Varian Associates, Inc. | Ring-and-bar slow wave circuits employing ceramic supports at the bars |
| US5208725A (en) | 1992-08-19 | 1993-05-04 | Akcasu Osman E | High capacitance structure in a semiconductor device |
| US5373245A (en) * | 1993-07-12 | 1994-12-13 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Capaciflector camera |
| US5583359A (en) * | 1995-03-03 | 1996-12-10 | Northern Telecom Limited | Capacitor structure for an integrated circuit |
| US6000280A (en) * | 1995-07-20 | 1999-12-14 | Cornell Research Foundation, Inc. | Drive electrodes for microfabricated torsional cantilevers |
| FR2768852B1 (fr) | 1997-09-22 | 1999-11-26 | Sgs Thomson Microelectronics | Realisation d'un condensateur intermetallique |
| US6473713B1 (en) * | 1999-09-20 | 2002-10-29 | American Gnc Corporation | Processing method for motion measurement |
| US6541831B2 (en) * | 2000-01-18 | 2003-04-01 | Cornell Research Foundation, Inc. | Single crystal silicon micromirror and array |
| AU2002228809A1 (en) * | 2000-12-05 | 2002-06-18 | Validity, Inc. | Swiped aperture capacitive fingerprint sensing systems and methods |
| JP2004534217A (ja) * | 2001-04-27 | 2004-11-11 | アトルア テクノロジーズ インコーポレイテッド | 改善されたキャパシタンス測定感度を持つ容量性のセンサシステム |
| US6542351B1 (en) * | 2001-06-28 | 2003-04-01 | National Semiconductor Corp. | Capacitor structure |
| JP4024572B2 (ja) * | 2002-03-28 | 2007-12-19 | ユーディナデバイス株式会社 | インタディジタルキャパシタを有するデバイス |
| US6880134B2 (en) * | 2003-04-09 | 2005-04-12 | Freescale Semiconductor, Inc. | Method for improving capacitor noise and mismatch constraints in a semiconductor device |
-
2005
- 2005-05-25 FR FR0505267A patent/FR2886458B1/fr not_active Expired - Fee Related
-
2006
- 2006-05-24 US US11/420,152 patent/US7873191B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US7873191B2 (en) | 2011-01-18 |
| US20060270145A1 (en) | 2006-11-30 |
| FR2886458A1 (fr) | 2006-12-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |
Effective date: 20140131 |