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FR2883977B1 - Machine laser d'analyse directe - Google Patents

Machine laser d'analyse directe

Info

Publication number
FR2883977B1
FR2883977B1 FR0503383A FR0503383A FR2883977B1 FR 2883977 B1 FR2883977 B1 FR 2883977B1 FR 0503383 A FR0503383 A FR 0503383A FR 0503383 A FR0503383 A FR 0503383A FR 2883977 B1 FR2883977 B1 FR 2883977B1
Authority
FR
France
Prior art keywords
laser machine
direct analysis
analysis
direct
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0503383A
Other languages
English (en)
Other versions
FR2883977A1 (fr
Inventor
Olivier Donard
Christophe Pecheyran
Suzanne Cany
Pmatrick Chabassier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Centre National de la Recherche Scientifique CNRS
Universite de Pau et des Pays de lAdour
Original Assignee
Centre National de la Recherche Scientifique CNRS
Universite de Pau et des Pays de lAdour
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, Universite de Pau et des Pays de lAdour filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR0503383A priority Critical patent/FR2883977B1/fr
Priority to PCT/FR2006/050298 priority patent/WO2006106265A1/fr
Publication of FR2883977A1 publication Critical patent/FR2883977A1/fr
Application granted granted Critical
Publication of FR2883977B1 publication Critical patent/FR2883977B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • G01N27/626—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
    • H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Optics & Photonics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
FR0503383A 2005-04-05 2005-04-05 Machine laser d'analyse directe Expired - Fee Related FR2883977B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0503383A FR2883977B1 (fr) 2005-04-05 2005-04-05 Machine laser d'analyse directe
PCT/FR2006/050298 WO2006106265A1 (fr) 2005-04-05 2006-04-04 Machine laser d'analyse directe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0503383A FR2883977B1 (fr) 2005-04-05 2005-04-05 Machine laser d'analyse directe

Publications (2)

Publication Number Publication Date
FR2883977A1 FR2883977A1 (fr) 2006-10-06
FR2883977B1 true FR2883977B1 (fr) 2007-06-22

Family

ID=35682785

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0503383A Expired - Fee Related FR2883977B1 (fr) 2005-04-05 2005-04-05 Machine laser d'analyse directe

Country Status (2)

Country Link
FR (1) FR2883977B1 (fr)
WO (1) WO2006106265A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8383420B2 (en) * 2006-12-07 2013-02-26 Applied Isotope Technologies, Inc. Solid phase and catalyzed enabled automated isotope dilution and speciated isotope dilution mass spectrometry
CN103063575B (zh) * 2011-10-19 2015-05-20 中国石油化工股份有限公司 一种流体包裹体激光剥蚀样品池
AU2013382989B2 (en) 2013-03-22 2018-06-07 Eth Zurich Laser ablation cell
ES2425138B2 (es) * 2013-06-07 2014-06-10 Universidad De Oviedo Celda de ablación criogénica con control de la temperatura de la muestra
JP6799311B2 (ja) * 2016-05-12 2020-12-16 国立大学法人東京工業大学 サンプリング方法およびサンプリングシステム
US11892428B2 (en) * 2018-04-18 2024-02-06 S.T.Japan Inc. Laser ablation device and analysis apparatus
CN117110020B (zh) * 2023-10-24 2024-02-02 中国地质大学（武汉） 一种自动在线溶液激光剥蚀池

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5844149A (en) * 1996-09-19 1998-12-01 Nkk Corporation Method for analyzing solid specimen and apparatus therefor
US6414320B1 (en) * 1999-05-03 2002-07-02 The Regents Of The University Of California Composition analysis by scanning femtosecond laser ultraprobing (CASFLU).
DE19934561C2 (de) * 1999-07-22 2001-12-13 Stiftung A Wegener Inst Polar Analyseverfahren zur Detektion von räumlichen Spurenelement-Verteilungsmustern in einer Feststoffprobe und Anordnung zu seiner Druchführung
FR2800466B1 (fr) * 1999-11-03 2001-11-23 Commissariat Energie Atomique Dispositif d'analyse element par spectrometrie d'emission optique sur plasma produit par laser

Also Published As

Publication number Publication date
FR2883977A1 (fr) 2006-10-06
WO2006106265A1 (fr) 2006-10-12

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20151231