FR2871281B1 - Procede et dispositif d'alimentation de puissance duale pour une memoire non-volatile embarquee - Google Patents
Procede et dispositif d'alimentation de puissance duale pour une memoire non-volatile embarqueeInfo
- Publication number
- FR2871281B1 FR2871281B1 FR0403434A FR0403434A FR2871281B1 FR 2871281 B1 FR2871281 B1 FR 2871281B1 FR 0403434 A FR0403434 A FR 0403434A FR 0403434 A FR0403434 A FR 0403434A FR 2871281 B1 FR2871281 B1 FR 2871281B1
- Authority
- FR
- France
- Prior art keywords
- board
- volatile memory
- dual power
- feeding dual
- feeding
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 230000009977 dual effect Effects 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/08—Word line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, for word lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0403434A FR2871281B1 (fr) | 2004-04-01 | 2004-04-01 | Procede et dispositif d'alimentation de puissance duale pour une memoire non-volatile embarquee |
| US11/061,799 US7120061B2 (en) | 2004-04-01 | 2005-02-18 | Method and apparatus for a dual power supply to embedded non-volatile memory |
| CNA2005800101251A CN1961379A (zh) | 2004-04-01 | 2005-03-24 | 用于嵌入式非易失性存储器的双电源供电的方法和设备 |
| EP05729910A EP1747559B1 (fr) | 2004-04-01 | 2005-03-24 | Procede et appareil pour la distribution d'une double alimentation electrique a une memoire non volatile integree |
| DE602005012080T DE602005012080D1 (de) | 2004-04-01 | 2005-03-24 | Verfahren und vorrichtung für eine doppelte stromversorgung für eingebetteten, nicht-flüchtigen speicher |
| PCT/US2005/009865 WO2005096796A2 (fr) | 2004-04-01 | 2005-03-24 | Procede et appareil pour la distribution d'une double alimentation electrique a une memoire non volatile integree |
| TW094110507A TWI373767B (en) | 2004-04-01 | 2005-04-01 | Embedded non-volatile memory and method of driving the same |
| US11/539,567 US7450429B2 (en) | 2004-04-01 | 2006-10-06 | Method and apparatus for a dual power supply to embedded non-volatile memory |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR0403434A FR2871281B1 (fr) | 2004-04-01 | 2004-04-01 | Procede et dispositif d'alimentation de puissance duale pour une memoire non-volatile embarquee |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2871281A1 FR2871281A1 (fr) | 2005-12-09 |
| FR2871281B1 true FR2871281B1 (fr) | 2008-06-13 |
Family
ID=35054103
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR0403434A Expired - Fee Related FR2871281B1 (fr) | 2004-04-01 | 2004-04-01 | Procede et dispositif d'alimentation de puissance duale pour une memoire non-volatile embarquee |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7120061B2 (fr) |
| CN (1) | CN1961379A (fr) |
| DE (1) | DE602005012080D1 (fr) |
| FR (1) | FR2871281B1 (fr) |
| TW (1) | TWI373767B (fr) |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1747559B1 (fr) * | 2004-04-01 | 2008-12-31 | Atmel Corporation | Procede et appareil pour la distribution d'une double alimentation electrique a une memoire non volatile integree |
| US7355905B2 (en) * | 2005-07-01 | 2008-04-08 | P.A. Semi, Inc. | Integrated circuit with separate supply voltage for memory that is different from logic circuit supply voltage |
| US7352609B2 (en) * | 2005-08-15 | 2008-04-01 | International Business Machines Corporation | Voltage controlled static random access memory |
| US7466582B2 (en) * | 2005-08-15 | 2008-12-16 | International Business Machines Corporation | Voltage controlled static random access memory |
| US7554843B1 (en) * | 2005-11-04 | 2009-06-30 | Alta Analog, Inc. | Serial bus incorporating high voltage programming signals |
| US7681106B2 (en) * | 2006-03-29 | 2010-03-16 | Freescale Semiconductor, Inc. | Error correction device and methods thereof |
| US7675806B2 (en) * | 2006-05-17 | 2010-03-09 | Freescale Semiconductor, Inc. | Low voltage memory device and method thereof |
| US7365585B2 (en) * | 2006-08-09 | 2008-04-29 | Atmel Corporation | Apparatus and method for charge pump slew rate control |
| US7834662B2 (en) * | 2006-12-13 | 2010-11-16 | Apple Inc. | Level shifter with embedded logic and low minimum voltage |
| US7652504B2 (en) * | 2006-12-13 | 2010-01-26 | Apple Inc. | Low latency, power-down safe level shifter |
| US7427890B2 (en) * | 2006-12-29 | 2008-09-23 | Atmel Corporation | Charge pump regulator with multiple control options |
| US7656740B2 (en) | 2007-02-05 | 2010-02-02 | Micron Technology, Inc. | Wordline voltage transfer apparatus, systems, and methods |
| CN101617371B (zh) * | 2007-02-16 | 2014-03-26 | 莫塞德技术公司 | 具有多个外部电源的非易失性半导体存储器 |
| US7639540B2 (en) * | 2007-02-16 | 2009-12-29 | Mosaid Technologies Incorporated | Non-volatile semiconductor memory having multiple external power supplies |
| US7715267B2 (en) * | 2007-07-18 | 2010-05-11 | Macronix International Co., Ltd. | Driving method and driving circuit and low power memory using the same |
| US8102728B2 (en) * | 2009-04-07 | 2012-01-24 | Apple Inc. | Cache optimizations using multiple threshold voltage transistors |
| US8004922B2 (en) * | 2009-06-05 | 2011-08-23 | Nxp B.V. | Power island with independent power characteristics for memory and logic |
| US7995410B2 (en) | 2009-06-26 | 2011-08-09 | Apple Inc. | Leakage and NBTI reduction technique for memory |
| US8605534B2 (en) * | 2009-09-09 | 2013-12-10 | Marvell World Trade Ltd. | Circuits, architectures, apparatuses, systems, algorithms, and methods for memory with multiple power supplies and/or multiple low power modes |
| US8867278B2 (en) * | 2011-02-28 | 2014-10-21 | Samsung Electronics Co., Ltd. | Nonvolatile memory device, memory system including the same, and method of operating nonvolatile memory device |
| US8553488B2 (en) | 2011-06-10 | 2013-10-08 | Apple Inc. | Performing stuck-at testing using multiple isolation circuits |
| KR101874408B1 (ko) | 2011-11-09 | 2018-07-05 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 이를 포함하는 메모리 시스템 |
| US9665144B2 (en) * | 2011-12-21 | 2017-05-30 | Intel Corporation | Methods and systems for energy efficiency and energy conservation including entry and exit latency reduction for low power states |
| US9142266B2 (en) * | 2013-11-19 | 2015-09-22 | Arm Limited | Memory circuitry using write assist voltage boost |
| KR20160079051A (ko) * | 2013-12-27 | 2016-07-05 | 인텔 코포레이션 | 이중 전압 비대칭 메모리 셀 |
| JP6495024B2 (ja) * | 2015-01-29 | 2019-04-03 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US9666253B2 (en) * | 2015-09-18 | 2017-05-30 | Taiwan Semiconductor Manufacturing Company Ltd. | Dual rail memory, memory macro and associated hybrid power supply method |
| US10163470B2 (en) * | 2015-09-18 | 2018-12-25 | Taiwan Semiconductor Manufacturing Company Ltd. | Dual rail memory, memory macro and associated hybrid power supply method |
| CN106935268B (zh) * | 2015-12-31 | 2021-12-17 | 紫光同芯微电子有限公司 | 一种非易失性存储器双电源管理电路 |
| TWI608485B (zh) * | 2016-06-07 | 2017-12-11 | 來揚科技股份有限公司 | 電阻式記憶體的讀寫控制裝置 |
| KR102392665B1 (ko) * | 2017-11-29 | 2022-04-29 | 삼성전자주식회사 | 메모리 장치, 이를 포함하는 시스템 온 칩 및 메모리 장치의 동작 방법 |
| US11056155B1 (en) | 2018-06-20 | 2021-07-06 | Adesto Technologies Corporation | Nonvolatile memory devices, systems and methods with switching charge pump architectures |
| CN112967741B (zh) * | 2021-02-06 | 2023-09-08 | 江南大学 | 一种面向存算阵列的高速高压字线驱动电路 |
| US12237007B2 (en) | 2021-07-09 | 2025-02-25 | Stmicroelectronics International N.V. | Selective bit line clamping control for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US12176025B2 (en) | 2021-07-09 | 2024-12-24 | Stmicroelectronics International N.V. | Adaptive body bias management for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US12087356B2 (en) | 2021-07-09 | 2024-09-10 | Stmicroelectronics International N.V. | Serial word line actuation with linked source voltage supply modulation for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US12354644B2 (en) | 2021-07-09 | 2025-07-08 | Stmicroelectronics International N.V. | Adaptive word line underdrive control for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US11984151B2 (en) | 2021-07-09 | 2024-05-14 | Stmicroelectronics International N.V. | Adaptive bit line overdrive control for an in-memory compute operation where simultaneous access is made to plural rows of a static random access memory (SRAM) |
| US11875854B2 (en) * | 2022-03-31 | 2024-01-16 | Macronix International Co., Ltd. | Memory device and word line driver thereof |
| KR20240112465A (ko) * | 2023-01-12 | 2024-07-19 | 에스케이하이닉스 주식회사 | 전력 공급의 효율을 개선한 스토리지 시스템 및 반도체 패키지 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5077691A (en) * | 1989-10-23 | 1991-12-31 | Advanced Micro Devices, Inc. | Flash EEPROM array with negative gate voltage erase operation |
| US5222040A (en) | 1990-12-11 | 1993-06-22 | Nexcom Technology, Inc. | Single transistor eeprom memory cell |
| JPH06236694A (ja) | 1991-05-07 | 1994-08-23 | Intel Corp | 高電圧レベル変換回路 |
| US5274278A (en) | 1991-12-31 | 1993-12-28 | Intel Corporation | High-speed tri-level decoder with dual-voltage isolation |
| JP2870328B2 (ja) | 1992-11-12 | 1999-03-17 | 日本電気株式会社 | 不揮発性半導体記憶装置 |
| US5399928A (en) | 1993-05-28 | 1995-03-21 | Macronix International Co., Ltd. | Negative voltage generator for flash EPROM design |
| DE69427025T2 (de) | 1994-08-31 | 2001-09-27 | Stmicroelectronics S.R.L., Agrate Brianza | Doppelquellenspannungsversorgungsschaltung |
| US5483486A (en) * | 1994-10-19 | 1996-01-09 | Intel Corporation | Charge pump circuit for providing multiple output voltages for flash memory |
| TW423162B (en) | 1997-02-27 | 2001-02-21 | Toshiba Corp | Power voltage supplying circuit and semiconductor memory including the same |
| KR100290283B1 (ko) * | 1998-10-30 | 2001-05-15 | 윤종용 | 불휘발성 반도체 메모리 장치 및 그의 워드 라인 구동 방법 |
| JP2001067886A (ja) * | 1999-08-26 | 2001-03-16 | Nec Ic Microcomput Syst Ltd | 半導体記憶装置 |
| US6201747B1 (en) | 1999-09-30 | 2001-03-13 | Advanced Micro Devices, Inc. | Method and apparatus for measuring subthreshold current in a memory array |
| US6550028B1 (en) * | 1999-10-19 | 2003-04-15 | Advanced Micro Devices, Inc. | Array VT mode implementation for a simultaneous operation flash memory device |
| KR100734637B1 (ko) | 2000-04-14 | 2007-07-02 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 반도체 디바이스, 메모리 셀 및 메모리 셀 구조물과 그 제어 방법 |
| JP2002261239A (ja) * | 2001-02-28 | 2002-09-13 | Sharp Corp | 不揮発性半導体メモリ装置の昇圧回路 |
| JP5041631B2 (ja) * | 2001-06-15 | 2012-10-03 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| US6822899B1 (en) * | 2002-12-23 | 2004-11-23 | Cypress Semiconductor Corporation | Method of protecting flash memory from data corruption during fast power down events |
-
2004
- 2004-04-01 FR FR0403434A patent/FR2871281B1/fr not_active Expired - Fee Related
-
2005
- 2005-02-18 US US11/061,799 patent/US7120061B2/en not_active Expired - Lifetime
- 2005-03-24 DE DE602005012080T patent/DE602005012080D1/de not_active Expired - Fee Related
- 2005-03-24 CN CNA2005800101251A patent/CN1961379A/zh active Pending
- 2005-04-01 TW TW094110507A patent/TWI373767B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| FR2871281A1 (fr) | 2005-12-09 |
| CN1961379A (zh) | 2007-05-09 |
| TWI373767B (en) | 2012-10-01 |
| TW200615957A (en) | 2006-05-16 |
| US7120061B2 (en) | 2006-10-10 |
| DE602005012080D1 (de) | 2009-02-12 |
| US20050219903A1 (en) | 2005-10-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |
Effective date: 20131231 |