FR2849921B1 - Circuit de detection de temperature - Google Patents

Circuit de detection de temperature

Info

Publication number: FR2849921B1
Authority: FR; France
Prior art keywords: detection circuit; temperature detection; temperature; circuit; detection
Prior art date: 2003-01-14
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

FR0400121A

Other languages

English (en)

Other versions

FR2849921A1 (fr

Inventor

Chan Yong Kim

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Samsung Electronics Co Ltd

Original Assignee

Samsung Electronics Co Ltd

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2003-01-14

Filing date

2004-01-08

Publication date

2006-11-17

2004-01-08 Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd

2004-07-16 Publication of FR2849921A1 publication Critical patent/FR2849921A1/fr

2006-11-17 Application granted granted Critical

2006-11-17 Publication of FR2849921B1 publication Critical patent/FR2849921B1/fr

2024-01-08 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/04—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding disturbances due to temperature effects
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K3/00—Thermometers giving results other than momentary value of temperature
- G01K3/005—Circuits arrangements for indicating a predetermined temperature

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Semiconductor Integrated Circuits (AREA)
Measuring Temperature Or Quantity Of Heat (AREA)
Manipulation Of Pulses (AREA)
Control Of Electrical Variables (AREA)

FR0400121A 2003-01-14 2004-01-08 Circuit de detection de temperature Expired - Lifetime FR2849921B1 (fr)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
KR1020030002472A KR100560652B1 (ko)	2003-01-14	2003-01-14	전원 전압과 온도 변화에 둔감한 온도 검출 회로

Publications (2)

Publication Number	Publication Date
FR2849921A1 FR2849921A1 (fr)	2004-07-16
FR2849921B1 true FR2849921B1 (fr)	2006-11-17

Family

ID=32588953

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FR0400121A Expired - Lifetime FR2849921B1 (fr)	2003-01-14	2004-01-08	Circuit de detection de temperature

Country Status (5)

Country	Link
US (1)	US6882213B2 (fr)
KR (1)	KR100560652B1 (fr)
CN (1)	CN100427908C (fr)
FR (1)	FR2849921B1 (fr)
IT (1)	ITMI20040027A1 (fr)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP3861613B2 (ja) *	2001-03-27	2006-12-20	日産自動車株式会社	オンチップ温度検出装置
FR2834343B1 (fr) *	2001-12-28	2004-04-09	St Microelectronics Sa	Detecteur thermique
US6921199B2 (en) *	2002-03-22	2005-07-26	Ricoh Company, Ltd.	Temperature sensor
JP4515821B2 (ja) *	2004-05-25	2010-08-04	ルネサスエレクトロニクス株式会社	駆動回路、動作状態検出回路及び表示装置
US20060028257A1 (en) *	2004-08-03	2006-02-09	Hong Huang	System and method for over-temperature protection sensing employing MOSFET on-resistance Rds_on
MXPA05007947A (es)	2005-07-27	2005-12-12	L I P N Ct De Investigacion Y	Metodo para utilizar un transistor bipolar como sensor de temperatura y/o termometro autocalibrado.
KR100736403B1 (ko) *	2005-08-19	2007-07-09	삼성전자주식회사	온도 검출기, 온도 검출방법, 및 상기 온도 검출기를구비하는 반도체 장치
CN100445712C (zh) *	2005-10-24	2008-12-24	圆创科技股份有限公司	通过平移转换参考电平以进行校正的温度测量电路
JP4807074B2 (ja) *	2005-12-28	2011-11-02	Ｔｄｋ株式会社	温度検出回路及び温度検出方法
US7410293B1 (en) *	2006-03-27	2008-08-12	Altera Corporation	Techniques for sensing temperature and automatic calibration on integrated circuits
JP4295289B2 (ja) *	2006-03-30	2009-07-15	パナソニック株式会社	基準電源電圧回路
US7579898B2 (en) *	2006-07-31	2009-08-25	Freescale Semiconductor, Inc.	Temperature sensor device and methods thereof
US7589572B2 (en) *	2006-12-15	2009-09-15	Atmel Corporation	Method and device for managing a power supply power-on sequence
JP4829143B2 (ja) *	2007-02-17	2011-12-07	セイコーインスツル株式会社	温度検出回路
KR100866967B1 (ko) *	2007-05-10	2008-11-05	삼성전자주식회사	밴드갭 기준 전압 발생 회로를 이용한 이상 전압 검출 및차단 회로
JP2009053069A (ja) *	2007-08-28	2009-03-12	Sanyo Electric Co Ltd	温度検出回路
JP2009058438A (ja) *	2007-08-31	2009-03-19	Toshiba Corp	温度検出回路
KR100898654B1 (ko) *	2007-12-28	2009-05-22	주식회사 하이닉스반도체	온도 감지 장치
CN101620012B (zh) *	2008-07-02	2011-04-06	南亚科技股份有限公司	温度检测器及其使用方法
US8183910B2 (en) *	2008-11-17	2012-05-22	Taiwan Semiconductor Manufacturing Co., Ltd.	Circuit and method for a digital process monitor
KR101036925B1 (ko) *	2008-12-26	2011-05-25	주식회사 하이닉스반도체	밴드갭 회로 및 이를 포함하는 온도 감지회로
JP5399740B2 (ja) *	2009-02-25	2014-01-29	テルモ株式会社	体温計及び体温測定システム
US8475039B2 (en) *	2009-04-22	2013-07-02	Taiwan Semiconductor Manufacturing Company, Ltd.	Providing linear relationship between temperature and digital code
CN201440221U (zh) *	2009-05-21	2010-04-21	鸿富锦精密工业（深圳）有限公司	双路温控电路
US8432214B2 (en)	2011-03-21	2013-04-30	Freescale Semiconductor, Inc.	Programmable temperature sensing circuit for an integrated circuit
CN102853931A (zh) *	2011-06-30	2013-01-02	台湾积体电路制造股份有限公司	热传感器及其操作方法
US9004756B2 (en)	2012-04-10	2015-04-14	Freescale Semiconductor, Inc.	Temperature sensor
JP6035473B2 (ja) *	2012-05-02	2016-11-30	株式会社Ｊｏｌｅｄ	表示装置、表示装置の駆動方法、及び、電子機器
KR20140080725A (ko) *	2012-12-14	2014-07-01	에스케이하이닉스 주식회사	음전압 조절 회로 및 이를 포함하는 전압 생성 회로
US9240775B2 (en) *	2013-03-12	2016-01-19	Intel Deutschland Gmbh	Circuit arrangements
US9213353B2 (en) *	2013-03-13	2015-12-15	Taiwan Semiconductor Manufacturing Company Limited	Band gap reference circuit
KR102033790B1 (ko) *	2013-09-30	2019-11-08	에스케이하이닉스 주식회사	온도센서
US9991792B2 (en) *	2014-08-27	2018-06-05	Intersil Americas LLC	Current sensing with RDSON correction
US9939335B2 (en) *	2014-12-17	2018-04-10	Nxp Usa, Inc.	Over-temperature detector with test mode
JP6542103B2 (ja) *	2015-11-09	2019-07-10	エイブリック株式会社	過熱検出回路、過熱保護回路、及び半導体装置
CN106840446B (zh)	2015-12-04	2019-08-06	华邦电子股份有限公司	温度检测电路
DE102017102499B4 (de)	2017-02-08	2021-06-17	Infineon Technologies Ag	Elektrische Bauelemente, integrierte Schaltungen und Verfahren zum Überwachen von Spannungen
CN106840434A (zh) *	2017-03-27	2017-06-13	成都锐成芯微科技股份有限公司	温度监测电路
JP7086562B2 (ja) *	2017-10-31	2022-06-20	シナプティクスインコーポレイテッド	バンドギャップリファレンス回路
US10908029B2 (en) *	2018-01-02	2021-02-02	Nxp B.V.	Voltage and temperature monitoring in power supplies
CN116610184A (zh) *	2023-05-22	2023-08-18	北京普能微电子科技有限公司	电源、控制方法及电子设备

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CA1010574A (en) *	1974-12-02	1977-05-17	Canadian General Electric Company Limited	Temperature monitoring of semiconductors
GB2224846A (en) *	1988-11-14	1990-05-16	Philips Electronic Associated	Temperature sensing circuit
CH679336A5 (fr) *	1989-06-28	1992-01-31	Suisse Electronique Microtech
EP0910870B1 (fr) *	1997-02-19	2008-05-14	Nxp B.V.	Dispositifs a semiconducteur de puissance pourvus d'un circuit de detection de temperature
US6055489A (en) *	1997-04-15	2000-04-25	Intel Corporation	Temperature measurement and compensation scheme
US6157244A (en) *	1998-10-13	2000-12-05	Advanced Micro Devices, Inc.	Power supply independent temperature sensor
US6697205B2 (en) *	2001-05-25	2004-02-24	Infineon Technologies Ag	Write output driver with internal programmable pull-up resistors
JP2004086750A (ja) *	2002-08-28	2004-03-18	Nec Micro Systems Ltd	バンドギャップ回路

2003
- 2003-01-14 KR KR1020030002472A patent/KR100560652B1/ko not_active Expired - Fee Related
- 2003-10-29 US US10/697,475 patent/US6882213B2/en not_active Expired - Lifetime
- 2003-12-29 CN CNB2003101242796A patent/CN100427908C/zh not_active Expired - Lifetime
2004
- 2004-01-08 FR FR0400121A patent/FR2849921B1/fr not_active Expired - Lifetime
- 2004-01-13 IT IT000027A patent/ITMI20040027A1/it unknown

Also Published As

Publication number	Publication date
KR100560652B1 (ko)	2006-03-16
KR20040065489A (ko)	2004-07-22
CN100427908C (zh)	2008-10-22
FR2849921A1 (fr)	2004-07-16
CN1517687A (zh)	2004-08-04
US6882213B2 (en)	2005-04-19
US20040135599A1 (en)	2004-07-15
ITMI20040027A1 (it)	2004-04-13

Publication	Publication Date	Title
FR2849921B1 (fr)	2006-11-17	Circuit de detection de temperature
DE60309155D1 (de)	2006-11-30	Stromfühlerschaltung
DE602004007932D1 (de)	2007-09-13	Temperatursensor-schema
DK1467158T3 (da)	2009-01-12	Kölekredslöbsapparat
FI20030101A0 (fi)	2003-01-22	Parannettu mittausjärjestely
DE602004016424D1 (de)	2008-10-23	Umweltsensor
DE60322149D1 (de)	2008-08-28	Ladungsleseschaltung
DE602004024903D1 (de)	2010-02-11	Kalibrations-komparatorschaltung
FR2854736B1 (fr)	2009-04-24	Capteur hyperfrequence
DE602004027337D1 (de)	2010-07-08	Treiberschaltung
DE602004027184D1 (de)	2010-07-01	Positionsdetektionssystem
DE50304535D1 (de)	2006-09-21	Mikrowellen-Sensor
DE602004019482D1 (de)	2009-04-02	Positionsdetektionssystem
DE60302581D1 (de)	2006-01-05	Kühlelement
DE502004010138D1 (de)	2009-11-12	Schaltungsmodul
ATE454987T1 (de)	2010-01-15	Verbindungsschaltung
ATA16882004A (de)	2005-11-15	Sensor
DE10322017B8 (de)	2005-02-24	Sensoreinheit
DE50310686D1 (de)	2008-12-11	Temperaturfühler
FR2861758B1 (fr)	2009-01-16	Element de caniveau
EP1672765A4 (fr)	2008-07-09	Circuit de secours
DE50304939D1 (de)	2006-10-19	Temperaturüberwachungseinrichtung
EP1608968A4 (fr)	2006-06-14	Methode d'evaluation
DE50300971D1 (de)	2005-09-15	Sensorschaltung
FR2848667B1 (fr)	2005-01-14	Capteur de temperature

Legal Events

Date	Code	Title	Description
2015-12-22	PLFP	Fee payment	Year of fee payment: 13
2016-12-21	PLFP	Fee payment	Year of fee payment: 14
2017-12-21	PLFP	Fee payment	Year of fee payment: 15
2019-12-19	PLFP	Fee payment	Year of fee payment: 17
2020-12-17	PLFP	Fee payment	Year of fee payment: 18
2021-11-25	PLFP	Fee payment	Year of fee payment: 19
2022-11-22	PLFP	Fee payment	Year of fee payment: 20