FR2799014B1 - Procede et installation de nanolithographie par interferometrie atomique - Google Patents
Procede et installation de nanolithographie par interferometrie atomiqueInfo
- Publication number
- FR2799014B1 FR2799014B1 FR9912016A FR9912016A FR2799014B1 FR 2799014 B1 FR2799014 B1 FR 2799014B1 FR 9912016 A FR9912016 A FR 9912016A FR 9912016 A FR9912016 A FR 9912016A FR 2799014 B1 FR2799014 B1 FR 2799014B1
- Authority
- FR
- France
- Prior art keywords
- nanolithography
- installation
- atomic interferometry
- interferometry
- atomic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000009434 installation Methods 0.000 title 1
- 238000005305 interferometry Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 238000005329 nanolithography Methods 0.000 title 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/30—Electron-beam or ion-beam tubes for localised treatment of objects
- H01J37/317—Electron-beam or ion-beam tubes for localised treatment of objects for changing properties of the objects or for applying thin layers thereon, e.g. for ion implantation
- H01J37/3174—Particle-beam lithography, e.g. electron beam lithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Analytical Chemistry (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Polarising Elements (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9912016A FR2799014B1 (fr) | 1999-09-27 | 1999-09-27 | Procede et installation de nanolithographie par interferometrie atomique |
| US10/089,176 US6891623B1 (en) | 1999-09-27 | 2000-09-27 | Method and device for atomic interferometry nanolithography |
| AU76675/00A AU7667500A (en) | 1999-09-27 | 2000-09-27 | Method and device for atomic interferometry nanolithography |
| PCT/FR2000/002664 WO2001024219A1 (fr) | 1999-09-27 | 2000-09-27 | Procede et installation de nanolithographie par interferometrie atomique |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR9912016A FR2799014B1 (fr) | 1999-09-27 | 1999-09-27 | Procede et installation de nanolithographie par interferometrie atomique |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| FR2799014A1 FR2799014A1 (fr) | 2001-03-30 |
| FR2799014B1 true FR2799014B1 (fr) | 2001-12-07 |
Family
ID=9550264
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FR9912016A Expired - Fee Related FR2799014B1 (fr) | 1999-09-27 | 1999-09-27 | Procede et installation de nanolithographie par interferometrie atomique |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6891623B1 (fr) |
| AU (1) | AU7667500A (fr) |
| FR (1) | FR2799014B1 (fr) |
| WO (1) | WO2001024219A1 (fr) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7504619B2 (en) * | 2002-05-20 | 2009-03-17 | The University Of Houston System | Energetic neutral particle lithographic apparatus and process |
| US20070240757A1 (en) * | 2004-10-15 | 2007-10-18 | The Trustees Of Boston College | Solar cells using arrays of optical rectennas |
| US7634162B2 (en) * | 2005-08-24 | 2009-12-15 | The Trustees Of Boston College | Apparatus and methods for nanolithography using nanoscale optics |
| US7943847B2 (en) | 2005-08-24 | 2011-05-17 | The Trustees Of Boston College | Apparatus and methods for solar energy conversion using nanoscale cometal structures |
| US7649665B2 (en) * | 2005-08-24 | 2010-01-19 | The Trustees Of Boston College | Apparatus and methods for optical switching using nanoscale optics |
| WO2007086903A2 (fr) * | 2005-08-24 | 2007-08-02 | The Trustees Of Boston College | Appareils et procedes de conversion de l’energie solaire utilisant des structures nanocoaxiales |
| US7589880B2 (en) * | 2005-08-24 | 2009-09-15 | The Trustees Of Boston College | Apparatus and methods for manipulating light using nanoscale cometal structures |
| EA200801227A1 (ru) * | 2005-11-02 | 2008-10-30 | Александр Михайлович Ильянок | Сканирующий наноструйный микроскоп и способ его работы |
| WO2007051274A1 (fr) * | 2005-11-02 | 2007-05-10 | Alexander Mikhailovich Ilyanok | Appareil de nano-lithographie a balayage a jets et procede de fonctionnement |
| JP4825697B2 (ja) * | 2007-01-25 | 2011-11-30 | 株式会社ミツトヨ | デジタル式変位測定器 |
| WO2008094517A1 (fr) * | 2007-01-30 | 2008-08-07 | Solasta, Inc. | Cellule photovoltaïque et son procédé de fabrication |
| CN101663764A (zh) * | 2007-02-12 | 2010-03-03 | 索拉斯特公司 | 具有减少的热载流子冷却的光电池 |
| US20090007956A1 (en) * | 2007-07-03 | 2009-01-08 | Solasta, Inc. | Distributed coax photovoltaic device |
| KR101686435B1 (ko) * | 2010-07-12 | 2016-12-14 | 삼성전자주식회사 | 휴대용 단말기에서 전자파 간섭 발생을 방지하기 위한 장치 및 방법 |
| WO2015015628A1 (fr) * | 2013-08-02 | 2015-02-05 | 株式会社日立製作所 | Dispositif de mesure de champ magnétique |
| WO2017009817A1 (fr) * | 2015-08-11 | 2017-01-19 | Majlesi Hosein | Analyseur de spin intrinsèque d'électrons |
| US9952154B2 (en) * | 2016-06-22 | 2018-04-24 | The Charles Stark Draper Laboratory, Inc. | Separated parallel beam generation for atom interferometry |
| US10157692B2 (en) | 2016-06-22 | 2018-12-18 | The Charles Stark Draper Laboratory, Inc. | Cold atom interferometry |
| JP6650647B2 (ja) * | 2018-07-31 | 2020-02-19 | 日本航空電子工業株式会社 | 冷却原子線生成方法、冷却原子線生成装置、原子干渉計 |
| CN110143199B (zh) * | 2019-05-17 | 2020-09-25 | 南京理工大学 | 商用车车重自适应坡道起步控制方法 |
-
1999
- 1999-09-27 FR FR9912016A patent/FR2799014B1/fr not_active Expired - Fee Related
-
2000
- 2000-09-27 AU AU76675/00A patent/AU7667500A/en not_active Abandoned
- 2000-09-27 WO PCT/FR2000/002664 patent/WO2001024219A1/fr not_active Ceased
- 2000-09-27 US US10/089,176 patent/US6891623B1/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| FR2799014A1 (fr) | 2001-03-30 |
| WO2001024219A1 (fr) | 2001-04-05 |
| AU7667500A (en) | 2001-04-30 |
| US6891623B1 (en) | 2005-05-10 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| ST | Notification of lapse |
Effective date: 20150529 |