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FR2783111B1 - Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre - Google Patents

Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre

Info

Publication number
FR2783111B1
FR2783111B1 FR9811384A FR9811384A FR2783111B1 FR 2783111 B1 FR2783111 B1 FR 2783111B1 FR 9811384 A FR9811384 A FR 9811384A FR 9811384 A FR9811384 A FR 9811384A FR 2783111 B1 FR2783111 B1 FR 2783111B1
Authority
FR
France
Prior art keywords
integrated circuit
resynchronize
test cell
modified test
circuit including
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9811384A
Other languages
English (en)
Other versions
FR2783111A1 (fr
Inventor
Noel Forget
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR9811384A priority Critical patent/FR2783111B1/fr
Priority to US09/392,036 priority patent/US6415401B1/en
Publication of FR2783111A1 publication Critical patent/FR2783111A1/fr
Application granted granted Critical
Publication of FR2783111B1 publication Critical patent/FR2783111B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
FR9811384A 1998-09-08 1998-09-08 Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre Expired - Fee Related FR2783111B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR9811384A FR2783111B1 (fr) 1998-09-08 1998-09-08 Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre
US09/392,036 US6415401B1 (en) 1998-09-08 1999-09-08 Integrated circuit having a test cell that resynchronizes the integrated circuit

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR9811384A FR2783111B1 (fr) 1998-09-08 1998-09-08 Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre
US09/392,036 US6415401B1 (en) 1998-09-08 1999-09-08 Integrated circuit having a test cell that resynchronizes the integrated circuit

Publications (2)

Publication Number Publication Date
FR2783111A1 FR2783111A1 (fr) 2000-03-10
FR2783111B1 true FR2783111B1 (fr) 2000-10-13

Family

ID=26234542

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9811384A Expired - Fee Related FR2783111B1 (fr) 1998-09-08 1998-09-08 Circuit integre comportant une cellule de test modifiee pour resynchroniser ledit circuit integre

Country Status (2)

Country Link
US (1) US6415401B1 (fr)
FR (1) FR2783111B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9666302B1 (en) * 2015-12-28 2017-05-30 Taiwan Semiconductor Manufacturing Co., Ltd. System and method for memory scan design-for-test

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125229A (ja) * 1984-07-13 1986-02-04 Sony Corp Ｉｃ装置
JPS6125230A (ja) * 1984-07-13 1986-02-04 Sony Corp Ｉｃ装置
EP0358365B1 (fr) * 1988-09-07 1998-10-21 Texas Instruments Incorporated Tampon/registre de test
US5221865A (en) * 1991-06-21 1993-06-22 Crosspoint Solutions, Inc. Programmable input/output buffer circuit with test capability
US5615217A (en) * 1994-12-01 1997-03-25 International Business Machines Corporation Boundary-scan bypass circuit for integrated circuit electronic component and circuit boards incorporating such circuits and components

Also Published As

Publication number Publication date
FR2783111A1 (fr) 2000-03-10
US6415401B1 (en) 2002-07-02

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20080531