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FI20165251A7 - Method and arrangement for verification, optimization or calibration a particle detectror - Google Patents

Method and arrangement for verification, optimization or calibration a particle detectror Download PDF

Info

Publication number
FI20165251A7
FI20165251A7 FI20165251A FI20165251A FI20165251A7 FI 20165251 A7 FI20165251 A7 FI 20165251A7 FI 20165251 A FI20165251 A FI 20165251A FI 20165251 A FI20165251 A FI 20165251A FI 20165251 A7 FI20165251 A7 FI 20165251A7
Authority
FI
Finland
Prior art keywords
arrangement
particle
detectror
verification
calibration
Prior art date
Application number
FI20165251A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20165251A (en
Inventor
Heikki Junninen
Juha Kangasluoma
Michel Attoui
Original Assignee
Univ Helsinki
Univ Paris Val De Marne
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Univ Helsinki, Univ Paris Val De Marne filed Critical Univ Helsinki
Priority to FI20165251A priority Critical patent/FI20165251A/en
Priority to PCT/FI2017/050207 priority patent/WO2017162925A1/en
Publication of FI20165251A7 publication Critical patent/FI20165251A7/en
Publication of FI20165251A publication Critical patent/FI20165251A/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
    • B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
    • B82B3/0095—Manufacture or treatments or nanostructures not provided for in groups B82B3/0009 - B82B3/009
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/62—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosols; by investigating electric discharges, e.g. emission of cathode
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D1/00—Evaporating
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01D—SEPARATION
    • B01D5/00—Condensation of vapours; Recovering volatile solvents by condensation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/065—Investigating concentration of particle suspensions using condensation nuclei counters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/0009—Calibration of the apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N2001/2893—Preparing calibration standards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0038—Investigating nanoparticles

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Dispersion Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Electrochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nanotechnology (AREA)
  • Manufacturing & Machinery (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)

Abstract

Järjestely (100) partikkelidetektorin (110) verifioimiseksi, optimoimiseksi tai kalibroimiseksi käsittää partikkelien generointikammion (101) varustettuna elementillä (102) nanopartikkelien generoimiseksi. Järjestely käsittää myös sisääntulon (103) kantokaasun vastaanottamiseksi ja ulostulon (105) mainitun kantokaasun toimittamiseksi yhdessä generoitujen nanopartikkelien kanssa ulkopuolelle partikkelien generointikammiosta (101) ja edelleen partikkelidetektoriin (110). Elementti (102) on edullisesti resistiivisesti kuumennettava metallijohdin, joka kuumennetaan tiettyyn lämpötilaan tai sen yli elementtimateriaalille ominaisen nanopartikkelien emission toteuttamiseksi.An arrangement (100) for verifying, optimizing or calibrating a particle detector (110) comprises a particle generation chamber (101) provided with an element (102) for generating nanoparticles. The arrangement also comprises an inlet (103) for receiving a carrier gas and an outlet (105) for delivering said carrier gas together with the generated nanoparticles to the outside of the particle generation chamber (101) and further to the particle detector (110). The element (102) is preferably a resistively heated metal conductor which is heated to a certain temperature or above to achieve the emission of nanoparticles characteristic of the element material.

FI20165251A 2016-03-24 2016-03-24 Process and arrangement for verification, optimization or calibration of a particle detector FI20165251A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20165251A FI20165251A (en) 2016-03-24 2016-03-24 Process and arrangement for verification, optimization or calibration of a particle detector
PCT/FI2017/050207 WO2017162925A1 (en) 2016-03-24 2017-03-24 Method and arrangement for optimization or calibration a particle detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20165251A FI20165251A (en) 2016-03-24 2016-03-24 Process and arrangement for verification, optimization or calibration of a particle detector

Publications (2)

Publication Number Publication Date
FI20165251A7 true FI20165251A7 (en) 2017-09-25
FI20165251A FI20165251A (en) 2017-09-25

Family

ID=59901240

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20165251A FI20165251A (en) 2016-03-24 2016-03-24 Process and arrangement for verification, optimization or calibration of a particle detector

Country Status (2)

Country Link
FI (1) FI20165251A (en)
WO (1) WO2017162925A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114755290A (en) * 2022-03-31 2022-07-15 瑞莱谱(杭州)医疗科技有限公司 Method and system for automatically tuning an inductively coupled plasma mass spectrometer

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001033377A (en) * 1999-07-01 2001-02-09 L'air Liquide Device and method for counting condensation nucleus for electronic specialty gas
KR100857596B1 (en) * 2005-08-23 2008-09-09 삼성전자주식회사 Nano Particle Generator

Also Published As

Publication number Publication date
FI20165251A (en) 2017-09-25
WO2017162925A1 (en) 2017-09-28

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