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FI20055326L - Method and measuring device for measuring microwaves - Google Patents

Method and measuring device for measuring microwaves Download PDF

Info

Publication number
FI20055326L
FI20055326L FI20055326A FI20055326A FI20055326L FI 20055326 L FI20055326 L FI 20055326L FI 20055326 A FI20055326 A FI 20055326A FI 20055326 A FI20055326 A FI 20055326A FI 20055326 L FI20055326 L FI 20055326L
Authority
FI
Finland
Prior art keywords
measuring
microwaves
measuring device
measuring microwaves
Prior art date
Application number
FI20055326A
Other languages
Finnish (fi)
Swedish (sv)
Other versions
FI20055326A0 (en
FI119744B (en
Inventor
Taisto Soikkeli
Original Assignee
Elektrobit Microwave Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Elektrobit Microwave Oy filed Critical Elektrobit Microwave Oy
Priority to FI20055326A priority Critical patent/FI119744B/en
Publication of FI20055326A0 publication Critical patent/FI20055326A0/en
Priority to PCT/FI2006/050266 priority patent/WO2006134237A1/en
Publication of FI20055326L publication Critical patent/FI20055326L/en
Application granted granted Critical
Publication of FI119744B publication Critical patent/FI119744B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2623—Measuring-systems or electronic circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2617—Measuring dielectric properties, e.g. constants
    • G01R27/2635—Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • G01R27/2658—Cavities, resonators, free space arrangements, reflexion or interference arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P7/00—Resonators of the waveguide type
    • H01P7/06—Cavity resonators

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
FI20055326A 2005-06-17 2005-06-17 Method and measuring device for microwave measurement FI119744B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20055326A FI119744B (en) 2005-06-17 2005-06-17 Method and measuring device for microwave measurement
PCT/FI2006/050266 WO2006134237A1 (en) 2005-06-17 2006-06-16 Method and measuring device for measuring with microwaves

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20055326 2005-06-17
FI20055326A FI119744B (en) 2005-06-17 2005-06-17 Method and measuring device for microwave measurement

Publications (3)

Publication Number Publication Date
FI20055326A0 FI20055326A0 (en) 2005-06-17
FI20055326L true FI20055326L (en) 2006-12-18
FI119744B FI119744B (en) 2009-02-27

Family

ID=34778462

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20055326A FI119744B (en) 2005-06-17 2005-06-17 Method and measuring device for microwave measurement

Country Status (2)

Country Link
FI (1) FI119744B (en)
WO (1) WO2006134237A1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7982469B2 (en) 2006-06-22 2011-07-19 Senfit Oy Method and measuring device for radio wave measuring

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8991240B2 (en) 2010-01-28 2015-03-31 Oji Holdings Corporation Method and device for measuring basis weight and moisture content amount
US9797703B2 (en) * 2016-03-07 2017-10-24 Duke University Non-invasive thickness measurement using resonant frequency shift
US11060841B2 (en) 2017-06-05 2021-07-13 Duke University Non-invasive thickness measurement using fixed frequency

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1351107A (en) * 1953-10-23 1974-04-24 Emi Ltd Range sensitive devices
BE759483R (en) * 1969-12-08 1971-04-30 Commissariat Energie Atomique METHOD OF MEASURING A DISPLACEMENT AND DEVICE BY MAKING APPLICATIO
US6297648B1 (en) * 1996-08-16 2001-10-02 The Boeing Company Oscillating cavity paint meter
FI119005B (en) * 2004-09-20 2008-06-13 Senfit Oy Procedure for measurement on microwaves, measuring apparatus and oscillator

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7982469B2 (en) 2006-06-22 2011-07-19 Senfit Oy Method and measuring device for radio wave measuring

Also Published As

Publication number Publication date
FI20055326A0 (en) 2005-06-17
WO2006134237A1 (en) 2006-12-21
FI119744B (en) 2009-02-27

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