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FI20041194L - Kaasun pitoisuuden mittalaitteisto ja menetelmä - Google Patents

Kaasun pitoisuuden mittalaitteisto ja menetelmä Download PDF

Info

Publication number
FI20041194L
FI20041194L FI20041194A FI20041194A FI20041194L FI 20041194 L FI20041194 L FI 20041194L FI 20041194 A FI20041194 A FI 20041194A FI 20041194 A FI20041194 A FI 20041194A FI 20041194 L FI20041194 L FI 20041194L
Authority
FI
Finland
Prior art keywords
measuring apparatus
gas concentration
concentration measuring
gas
measuring
Prior art date
Application number
FI20041194A
Other languages
English (en)
Swedish (sv)
Other versions
FI117808B (fi
FI20041194A0 (fi
Inventor
Reino Keraenen
Original Assignee
Vaisala Oyj
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Vaisala Oyj filed Critical Vaisala Oyj
Priority to FI20041194A priority Critical patent/FI117808B/fi
Publication of FI20041194A0 publication Critical patent/FI20041194A0/fi
Priority to US11/661,914 priority patent/US7405827B2/en
Priority to JP2007531779A priority patent/JP4807803B2/ja
Priority to EP05786137.9A priority patent/EP1789772B1/en
Priority to PCT/FI2005/000387 priority patent/WO2006030059A1/en
Publication of FI20041194L publication Critical patent/FI20041194L/fi
Application granted granted Critical
Publication of FI117808B publication Critical patent/FI117808B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N21/09—Cuvette constructions adapted to resist hostile environments or corrosive or abrasive materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G01N21/03—Cuvette constructions
    • G01N2021/0389—Windows
    • G01N2021/0396—Oblique incidence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
FI20041194A 2004-09-14 2004-09-14 Kaasun pitoisuuden mittauslaitteisto ja menetelmä FI117808B (fi)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FI20041194A FI117808B (fi) 2004-09-14 2004-09-14 Kaasun pitoisuuden mittauslaitteisto ja menetelmä
US11/661,914 US7405827B2 (en) 2004-09-14 2005-09-08 Gas content measuring apparatus and method
JP2007531779A JP4807803B2 (ja) 2004-09-14 2005-09-08 ガス含有量測定装置及び方法
EP05786137.9A EP1789772B1 (en) 2004-09-14 2005-09-08 Gas content measuring apparatus and method
PCT/FI2005/000387 WO2006030059A1 (en) 2004-09-14 2005-09-08 Gas content measuring apparatus and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20041194 2004-09-14
FI20041194A FI117808B (fi) 2004-09-14 2004-09-14 Kaasun pitoisuuden mittauslaitteisto ja menetelmä

Publications (3)

Publication Number Publication Date
FI20041194A0 FI20041194A0 (fi) 2004-09-14
FI20041194L true FI20041194L (fi) 2006-03-15
FI117808B FI117808B (fi) 2007-02-28

Family

ID=33041532

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20041194A FI117808B (fi) 2004-09-14 2004-09-14 Kaasun pitoisuuden mittauslaitteisto ja menetelmä

Country Status (5)

Country Link
US (1) US7405827B2 (fi)
EP (1) EP1789772B1 (fi)
JP (1) JP4807803B2 (fi)
FI (1) FI117808B (fi)
WO (1) WO2006030059A1 (fi)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5343356B2 (ja) * 2008-01-07 2013-11-13 セイコーエプソン株式会社 原子発振器
EP2508869B1 (de) 2011-04-05 2015-10-14 Sick Ag Konzentrationsmessgerät, Konzentrationsmessanordnung und Konzentrationsmessverfahren
WO2012161067A1 (ja) 2011-05-20 2012-11-29 株式会社堀場製作所 測定ユニットおよびガス分析装置
US8661896B2 (en) * 2011-07-26 2014-03-04 Mine Safety Appliances Company Protective enclosure for use with a sensor for detecting an analyte
US10437650B2 (en) * 2014-06-19 2019-10-08 Nec Corporation Controlling execution of tasks in a series of operational processing by identifying processing units based on task command, task setting information, state of operational processing
CA3168904A1 (en) 2020-01-27 2021-08-05 Geniphys, Inc. Biologic filler for restoring and regenerating tissue
DE202020101292U1 (de) 2020-03-10 2021-06-16 Sick Ag Gaskonzentrationsmessgerät

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5255097Y2 (fi) * 1973-02-09 1977-12-13
JPS5492789A (en) * 1977-12-29 1979-07-23 Fujitsu Ltd Gas analytical method by infrared ray
WO1984000217A1 (fr) * 1982-06-25 1984-01-19 Oskar Oehler Dispositif collecteur de lumiere et son utilisation pour la spectroscopie
JP2875291B2 (ja) * 1989-08-07 1999-03-31 株式会社タツノ・メカトロニクス ガス検出器
JPH03226653A (ja) * 1990-01-31 1991-10-07 Mitsubishi Electric Corp ガス絶縁電気機器
US5201220A (en) 1990-08-28 1993-04-13 Schlumberger Technology Corp. Apparatus and method for detecting the presence of gas in a borehole flow stream
FR2671872B1 (fr) 1991-01-17 1993-04-02 Secomam Sa Spectrophotometre portatif pour l'etude in situ du spectre d'absorption d'une substance.
US5216535A (en) * 1991-06-17 1993-06-01 Fellows William G Optical deflection device
US5448071A (en) * 1993-04-16 1995-09-05 Bruce W. McCaul Gas spectroscopy
JPH0712721A (ja) * 1993-06-23 1995-01-17 Kokusai Denshin Denwa Co Ltd <Kdd> 遠隔測定可能な分光分析装置
US5949537A (en) 1996-04-18 1999-09-07 American Air Liquide Inc. In-line cell for absorption spectroscopy
WO1998022802A1 (de) * 1996-11-15 1998-05-28 Optosens Optische Spektroskopie Und Sensortechnik Gmbh Verfahren und vorrichtung zur kombinierten absorptions- und reflektanzspektroskopie
JP3411779B2 (ja) 1997-03-28 2003-06-03 アンリツ株式会社 ガス濃度測定装置
JP2002506968A (ja) * 1998-03-07 2002-03-05 ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング 光学センサ
JPH11271217A (ja) * 1998-03-20 1999-10-05 Hoechst Reseach & Technology Kk 光学的センサ
JPH11287631A (ja) 1998-03-31 1999-10-19 Lintec Corp 観測装置
US6091504A (en) * 1998-05-21 2000-07-18 Square One Technology, Inc. Method and apparatus for measuring gas concentration using a semiconductor laser
JP3371816B2 (ja) * 1998-07-31 2003-01-27 株式会社島津製作所 粒子濃度測定方法および装置並びに粒子計測装置
DE19840345B4 (de) 1998-09-04 2004-09-30 Dräger Medical AG & Co. KGaA Verfahren und Vorrichtung zum quantitativen Aufspüren eines vorgegebenen Gases
JP2002039942A (ja) * 2000-07-25 2002-02-06 Japan Radio Co Ltd 同位体分析装置
GB0213326D0 (en) 2002-06-11 2002-07-24 Edinburgh Instr Gas sensors
JP2004294214A (ja) * 2003-03-26 2004-10-21 Nippon Soken Inc ガス検出装置
JP4029794B2 (ja) * 2003-07-29 2008-01-09 Ｔｏｔｏ株式会社 エアロゾル粒子濃度測定方法、装置およびそれを備える複合構造物作製装置

Also Published As

Publication number Publication date
EP1789772A4 (en) 2012-05-16
EP1789772A1 (en) 2007-05-30
JP2008513756A (ja) 2008-05-01
JP4807803B2 (ja) 2011-11-02
FI117808B (fi) 2007-02-28
US7405827B2 (en) 2008-07-29
WO2006030059A1 (en) 2006-03-23
US20080002205A1 (en) 2008-01-03
FI20041194A0 (fi) 2004-09-14
EP1789772B1 (en) 2015-11-11

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