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FI20011362A0 - Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi - Google Patents

Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi

Info

Publication number
FI20011362A0
FI20011362A0 FI20011362A FI20011362A FI20011362A0 FI 20011362 A0 FI20011362 A0 FI 20011362A0 FI 20011362 A FI20011362 A FI 20011362A FI 20011362 A FI20011362 A FI 20011362A FI 20011362 A0 FI20011362 A0 FI 20011362A0
Authority
FI
Finland
Prior art keywords
ray fluorescence
fluorescence analyzer
analyzer
ray
fluorescence
Prior art date
Application number
FI20011362A
Other languages
English (en)
Swedish (sv)
Other versions
FI20011362L (fi
FI20011362A7 (fi
Inventor
Heikki Sipilae
Unto Paakkinen
Original Assignee
Bs Instr Technology Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bs Instr Technology Oy filed Critical Bs Instr Technology Oy
Priority to FI20011362A priority Critical patent/FI20011362A7/fi
Publication of FI20011362A0 publication Critical patent/FI20011362A0/fi
Priority to EP02751208A priority patent/EP1423683A1/en
Priority to PCT/FI2002/000562 priority patent/WO2003001190A1/en
Publication of FI20011362L publication Critical patent/FI20011362L/fi
Publication of FI20011362A7 publication Critical patent/FI20011362A7/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI20011362A 2001-06-26 2001-06-26 Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi FI20011362A7 (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI20011362A FI20011362A7 (fi) 2001-06-26 2001-06-26 Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi
EP02751208A EP1423683A1 (en) 2001-06-26 2002-06-26 X-ray fluorescence analyser, and a method for using an x-ray fluorescence analyser
PCT/FI2002/000562 WO2003001190A1 (en) 2001-06-26 2002-06-26 X-ray fluorescence analyser, and a method for using an x-ray fluorescence analyser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20011362A FI20011362A7 (fi) 2001-06-26 2001-06-26 Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi

Publications (3)

Publication Number Publication Date
FI20011362A0 true FI20011362A0 (fi) 2001-06-26
FI20011362L FI20011362L (fi) 2002-12-27
FI20011362A7 FI20011362A7 (fi) 2002-12-27

Family

ID=8561502

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20011362A FI20011362A7 (fi) 2001-06-26 2001-06-26 Röntgenfluoresenssianalysaattori ja menetelmä röntgenfluoresenssianalysaattorin käyttämiseksi

Country Status (3)

Country Link
EP (1) EP1423683A1 (fi)
FI (1) FI20011362A7 (fi)
WO (1) WO2003001190A1 (fi)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007040651B4 (de) 2007-08-27 2012-02-09 Rational Ag Verfahren zur Einstellung eines Garprogramms über visualisierte Gargutparameter und Gargerät hierfür
AU2017322519B2 (en) 2016-09-09 2019-10-31 Veracio Ltd. Systems and methods for analyzing core using X-ray fluorescence
CN110312928B (zh) * 2017-03-15 2021-03-26 株式会社理学 荧光x射线分析方法以及荧光x射线分析装置
CN111868519A (zh) * 2017-11-15 2020-10-30 机械解析有限公司 用于分析气相色谱洗脱峰的方法和装置
CN117110342A (zh) * 2023-10-18 2023-11-24 矿冶科技集团有限公司 一种物料在线测量装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3703726A (en) * 1970-12-31 1972-11-21 Corning Glass Works Quantitative chemical analysis by x-ray emission spectroscopy
US4362935A (en) * 1979-02-09 1982-12-07 Martin Marietta Corporation Field portable element analysis unit
US4476386A (en) * 1980-06-11 1984-10-09 Commonwealth Scientific And Industrial Research Organization Method and apparatus for material analysis
US5014287A (en) * 1990-04-18 1991-05-07 Thornton Michael G Portable x-ray fluorescence spectrometer for environmental monitoring of inorganic pollutants
US6130931A (en) * 1998-09-17 2000-10-10 Process Control, Inc. X-ray fluorescence elemental analyzer
US6097785A (en) * 1998-10-30 2000-08-01 The United States Of America As Represented By The Secretary Of The Navy Cone penetrometer utilizing an X-ray fluorescence metals sensor
US6421415B1 (en) * 1999-05-21 2002-07-16 Metso Paper Automation Oy On-line system for quantitative analysis of multi-component additives and coatings in sheet material

Also Published As

Publication number Publication date
EP1423683A1 (en) 2004-06-02
FI20011362L (fi) 2002-12-27
FI20011362A7 (fi) 2002-12-27
WO2003001190A1 (en) 2003-01-03

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Legal Events

Date Code Title Description
FC Application refused