FI20001733L - Refraktometri - Google Patents

Refraktometri Download PDF

Info

Publication number: FI20001733L
Authority: FI; Finland
Prior art keywords: refractometer
Prior art date: 2000-08-01

Application number

FI20001733A

Other languages

English (en)

Swedish (sv)

Other versions

FI113566B (fi

FI20001733A0 (fi

Inventor

Harri Salo

Original Assignee

Janesko Oy

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-08-01

Filing date

2000-08-01

Publication date

2002-02-02

2000-08-01 Application filed by Janesko Oy filed Critical Janesko Oy

2000-08-01 Priority to FI20001733A priority Critical patent/FI113566B/fi

2000-08-01 Publication of FI20001733A0 publication Critical patent/FI20001733A0/fi

2001-08-01 Priority to US09/918,528 priority patent/US6760098B2/en

2002-02-02 Publication of FI20001733L publication Critical patent/FI20001733L/fi

2004-05-14 Application granted granted Critical

2004-05-14 Publication of FI113566B publication Critical patent/FI113566B/fi

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N21/431—Dip refractometers, e.g. using optical fibres
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/43—Refractivity; Phase-affecting properties, e.g. optical path length by measuring critical angle
- G01N2021/434—Dipping block in contact with sample, e.g. prism

Landscapes

Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Or Analysing Materials By Optical Means (AREA)

FI20001733A 2000-08-01 2000-08-01 Refraktometri FI113566B (fi)

Priority Applications (2)

Application Number	Priority Date	Filing Date	Title
FI20001733A FI113566B (fi)	2000-08-01	2000-08-01	Refraktometri
US09/918,528 US6760098B2 (en)	2000-08-01	2001-08-01	Refractometer

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
FI20001733		2000-08-01
FI20001733A FI113566B (fi)	2000-08-01	2000-08-01	Refraktometri

Publications (3)

Publication Number	Publication Date
FI20001733A0 FI20001733A0 (fi)	2000-08-01
FI20001733L true FI20001733L (fi)	2002-02-02
FI113566B FI113566B (fi)	2004-05-14

Family

ID=8558836

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
FI20001733A FI113566B (fi)	2000-08-01	2000-08-01	Refraktometri

Country Status (2)

Country	Link
US (1)	US6760098B2 (fi)
FI (1)	FI113566B (fi)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2004150923A (ja) *	2002-10-30	2004-05-27	Atago:Kk	屈折計
GB0401998D0 (en) *	2004-01-30	2004-03-03	Tyco Electronics Raychem Nv	Optical device
JP2008536095A (ja) *	2005-02-11	2008-09-04	スワゲロックカンパニー	流体濃度感知配置
WO2008043876A1 (en) *	2006-10-11	2008-04-17	Janesko Oy	Method for measuring the active koh concentration in a koh etching process
US20090139318A1 (en) *	2007-12-04	2009-06-04	Caterpillar Inc.	Systems and methods for monitoring the quality of a reducing agent
FI124114B (fi)	2009-09-29	2014-03-31	Janesko Oy	Mittausikkunarakenne
US20110168876A1 (en) *	2010-01-14	2011-07-14	Hsiung Hsiao	Optical module and system for liquid sample
US8528399B2 (en)	2010-05-21	2013-09-10	The Mercury Iron and Steel Co.	Methods and apparatuses for measuring properties of a substance in a process stream
FI20135064A7 (fi)	2013-01-23	2014-07-24	Janesko Oy	Menetelmä taitekertoimen mittaamiseksi ja refraktometri
FI126449B (fi)	2014-06-11	2016-12-15	Janesko Oy	Menetelmä ja sovitelma prosessinesteestä otetun erillisnäytteen mittauksen yhteydessä
FI128037B (fi)	2015-06-29	2019-08-15	Janesko Oy	Sovitelma refraktometrin mittaikkunan yhteydessä ja refraktometri
FI126927B (fi)	2016-06-09	2017-08-15	Janesko Oy	Mittalaitteen tiivistysjärjestely ja tiivistysmenetelmä
US10203279B1 (en) *	2017-12-07	2019-02-12	Janesko Oy	Optical measuring device, a refractometer and an arrangement for an optical measurement
IT201800004247A1 (it) *	2018-04-05	2019-10-05		Dispositivo sensore ottico per sostanze fluide
TWI774152B (zh) *	2019-12-20	2022-08-11	美商恩特葛瑞斯股份有限公司	接近界面之流體之準確溫度讀取
JP6900566B1 (ja) *	2020-10-12	2021-07-07	株式会社ソディック	放電加工装置
FI20206374A1 (fi) *	2020-12-28	2022-06-29	Kxs Tech Oy	Refraktometri

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4451147A (en) *	1981-08-31	1984-05-29	Karel Dobes	Refractometer
DE4214572C2 (de)	1992-05-03	1994-08-18	Roland Dr Ing Emmrich	Hohler vakuumdichter Formkörper aus keramischem Werkstoff
US5585729A (en) *	1993-05-13	1996-12-17	Gamma Precision Technology, Inc.	Fluid concentration detecting apparatus
DE4418180C2 (de)	1994-06-27	1997-05-15	Emmrich Roland	Sondenanordnung zur Messung der spektralen Absorption in Flüssigkeiten, Gasen oder Feststoffen
US6097479A (en)	1996-10-01	2000-08-01	Texas Instruments Incorporated	Critical angle sensor
FR2766923B1 (fr) *	1997-07-30	1999-10-15	France Etat	Instrument de mesure de l'indice de refraction d'un fluide
FI108259B (fi)	1998-01-30	2001-12-14	Janesko Oy	Refraktometri
US6457478B1 (en) *	1999-11-12	2002-10-01	Michael J. Danese	Method for treating an object using ultra-violet light
BR0109028A (pt) *	2000-03-02	2003-03-05	Dow Global Technologies Inc	Reator tubular, processo para conduzir reações polifásicas lìquido/ lìquido num reator tubular, e processo para compostos aromáticos com nitração no anel num reator tubular
US6500699B1 (en) *	2000-07-11	2002-12-31	Advanced Micro Devices, Inc.	Test fixture for future integration

2000
- 2000-08-01 FI FI20001733A patent/FI113566B/fi not_active IP Right Cessation
2001
- 2001-08-01 US US09/918,528 patent/US6760098B2/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
US6760098B2 (en)	2004-07-06
US20020018200A1 (en)	2002-02-14
FI113566B (fi)	2004-05-14
FI20001733A0 (fi)	2000-08-01

Publication	Publication Date	Title
ATE290000T1 (de)	2005-03-15	Muscarinagonisten
ATE252099T1 (de)	2003-11-15	Biarylcarboxamide
NO20002137D0 (no)	2000-04-26	ReservoarovervÕkning
NO20031949L (no)	2003-07-08	Cyanopyrrolidinderivater
DE10136334B8 (de)	2009-11-26	Hochgeschwindigkeitsvertikalresonatoroberflächenemissionslaser
ATA2932001A (de)	2004-11-15	Schneefräse
DE50108963D1 (de)	2006-04-20	Schlauchklemme
NO20012438D0 (no)	2001-05-16	Strålingseffektutjevner
DE50108226D1 (de)	2006-01-05	Vordralldüsenträger
DE50104056D1 (de)	2004-11-18	Gewichtsmanschette
DE50100710D1 (de)	2003-11-06	Wischblatt
ATE262530T1 (de)	2004-04-15	Indolochinazolinone
ATE298751T1 (de)	2005-07-15	7-oxopyridoryrimidine
FI20001733L (fi)	2002-02-02	Refraktometri
DE50104651D1 (de)	2005-01-05	Fahrzeugfaltverdeck
AR028336A1 (es)	2003-05-07	4-hidroxi-tetrahidropiridonas fenilsubstituidas
DE10192638T1 (de)	2002-10-31	Bohrstangenladevorrichtung
DE50100817D1 (de)	2003-11-27	Kugelgelenk
DE50011511D1 (de)	2005-12-08	Blowby-Heizung
AR028061A1 (es)	2003-04-23	2-enamino-cetonitrilos fenil-substituidos
AR027931A1 (es)	2003-04-16	Antitranspirantes
DE50007634D1 (de)	2004-10-07	Kardioplegieballonkatheter
DE10195909T1 (de)	2003-02-20	Viehfüttervorrichtung
DE10085445T1 (de)	2003-02-27	Drahterodierbearbeitungseinrichtung
DE10195992T1 (de)	2003-02-27	Oberflächenendbearbeitungsbelag

Legal Events

Date	Code	Title	Description
2019-10-22	PC	Transfer of assignment of patent	Owner name: VAISALA OYJ
2020-10-09	MA	Patent expired