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ES2005965A6 - Surface inspection device - Google Patents

Surface inspection device

Info

Publication number
ES2005965A6
ES2005965A6 ES8703493A ES8703493A ES2005965A6 ES 2005965 A6 ES2005965 A6 ES 2005965A6 ES 8703493 A ES8703493 A ES 8703493A ES 8703493 A ES8703493 A ES 8703493A ES 2005965 A6 ES2005965 A6 ES 2005965A6
Authority
ES
Spain
Prior art keywords
radiation
sensors
sensor
output signal
evaluation unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
ES8703493A
Other languages
Spanish (es)
Inventor
Gunter Hege
Michael Struck
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
Original Assignee
Robert Bosch GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Robert Bosch GmbH filed Critical Robert Bosch GmbH
Publication of ES2005965A6 publication Critical patent/ES2005965A6/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

In a device for inspecting the surface (23) of a three-dimensional part (24), two radiation sources (10, 11) are provided which emit radiation (12, 15) of a given frequency. The common light beam (16) is directed on to the surface to be checked (2) of the part (24) by means of a beam forming system (20) and a first rotary mirror (21) as well as of a concentrating lens (22). The radiation (30) reflected from the surface (29) arrives at an arrangement of sensors (33) after passing through another convex lens (31) and deflection by a second rotary mirror (32). The sensor arrangement (33) comprises a first radiation sensor (34) which sends to an evaluation unit (35) an output signal which depends on the point of impingement of the radiation on the active surface (36) of the first sensor (34). Two further radiation sensors (44, 49) are provided which supply the evaluation unit (35) with an output signal which varies according to the radiation intensity of said sensors (44, 49). Upstream of the latter are arranged colour-permeable filters (42, 47), the pass-band of one filter (42) being modulated on the other radiation frequency (12) of the second radiation source (111). The apparatus described automatically identifies faults characterized by different geometrical and colour markings on the surface (29) of the part (24).
ES8703493A 1986-12-08 1987-12-04 Surface inspection device Expired ES2005965A6 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19863641863 DE3641863A1 (en) 1986-12-08 1986-12-08 SURFACE TEST DEVICE

Publications (1)

Publication Number Publication Date
ES2005965A6 true ES2005965A6 (en) 1989-04-01

Family

ID=6315699

Family Applications (1)

Application Number Title Priority Date Filing Date
ES8703493A Expired ES2005965A6 (en) 1986-12-08 1987-12-04 Surface inspection device

Country Status (3)

Country Link
DE (1) DE3641863A1 (en)
ES (1) ES2005965A6 (en)
WO (1) WO1988004422A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3819900A1 (en) * 1988-06-11 1989-12-14 Daimler Benz Ag METHOD FOR DETERMINING THE CORROSION STABILITY OF DEEP-DRAWABLE IRON SHEETS FOR BODY PARTS OF MOTOR VEHICLES, AND DEVICE FOR CARRYING OUT THIS METHOD
DE4343058A1 (en) * 1993-12-19 1995-06-22 Robert Prof Dr Ing Massen Multiple sensor camera for quality control
DE4434474C2 (en) * 1994-09-27 2000-06-15 Basler Ag Method and device for the complete optical quality control of objects
US5991017A (en) * 1995-06-15 1999-11-23 British Nuclear Fuels Plc Inspecting the surface of an object
DE102009030644B4 (en) * 2009-06-25 2011-02-03 Gottfried Wilhelm Leibniz Universität Hannover Non-contact detection device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3917414A (en) * 1973-10-11 1975-11-04 Geisco Associates Optical inspection system
DE2433682C3 (en) * 1974-07-12 1979-02-15 Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch Device for monitoring a material web or another scanning plane
US4265545A (en) * 1979-07-27 1981-05-05 Intec Corporation Multiple source laser scanning inspection system
US4352017A (en) * 1980-09-22 1982-09-28 Rca Corporation Apparatus for determining the quality of a semiconductor surface
JPS5766345A (en) * 1980-10-09 1982-04-22 Hitachi Ltd Inspection device for defect
US4532723A (en) * 1982-03-25 1985-08-06 General Electric Company Optical inspection system
US4520388A (en) * 1982-11-01 1985-05-28 General Electric Company Optical signal projector
GB2173294B (en) * 1985-04-02 1988-10-12 Glaverbel Method of and apparatus for determining the location of defects present in flat glass

Also Published As

Publication number Publication date
DE3641863A1 (en) 1988-06-09
WO1988004422A1 (en) 1988-06-16

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