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EP4365641A4 - Procédé et système d'inspection - Google Patents

Procédé et système d'inspection

Info

Publication number
EP4365641A4
EP4365641A4 EP22836961.7A EP22836961A EP4365641A4 EP 4365641 A4 EP4365641 A4 EP 4365641A4 EP 22836961 A EP22836961 A EP 22836961A EP 4365641 A4 EP4365641 A4 EP 4365641A4
Authority
EP
European Patent Office
Prior art keywords
procedures
inspection system
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP22836961.7A
Other languages
German (de)
English (en)
Other versions
EP4365641A1 (fr
Inventor
Li Zhang
Zhiqiang Chen
Qingping Huang
Hui DING
Yong Zhou
Xin Jin
Liming YAO
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tsinghua University
Nuctech Co Ltd
Original Assignee
Tsinghua University
Nuctech Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tsinghua University, Nuctech Co Ltd filed Critical Tsinghua University
Publication of EP4365641A1 publication Critical patent/EP4365641A1/fr
Publication of EP4365641A4 publication Critical patent/EP4365641A4/fr
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/226—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays using tomography

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Software Systems (AREA)
  • Geometry (AREA)
  • Computer Graphics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
EP22836961.7A 2021-07-07 2022-07-06 Procédé et système d'inspection Pending EP4365641A4 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202110769706.4A CN115598715B (zh) 2021-07-07 2021-07-07 检查系统和方法
PCT/CN2022/104143 WO2023280215A1 (fr) 2021-07-07 2022-07-06 Procédé et système d'inspection

Publications (2)

Publication Number Publication Date
EP4365641A1 EP4365641A1 (fr) 2024-05-08
EP4365641A4 true EP4365641A4 (fr) 2025-05-28

Family

ID=84801298

Family Applications (1)

Application Number Title Priority Date Filing Date
EP22836961.7A Pending EP4365641A4 (fr) 2021-07-07 2022-07-06 Procédé et système d'inspection

Country Status (4)

Country Link
US (1) US20250046012A1 (fr)
EP (1) EP4365641A4 (fr)
CN (1) CN115598715B (fr)
WO (1) WO2023280215A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115598718B (zh) * 2021-07-07 2024-05-31 同方威视技术股份有限公司 检查系统和方法
CN115598719B (zh) * 2021-07-07 2024-06-07 同方威视技术股份有限公司 检查系统和方法
JP2023142080A (ja) * 2022-03-24 2023-10-05 アイシンシロキ株式会社 対象物の検出方法及び検出装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5848115A (en) * 1997-05-02 1998-12-08 General Electric Company Computed tomography metrology
US20090067575A1 (en) * 2002-07-24 2009-03-12 Seppi Edward E Radiation scanning units including a movable platform
US20090116617A1 (en) * 2004-04-09 2009-05-07 American Science And Engineering, Inc. Multiple Image Collection and Synthesis for Personnel Screening
US20180128754A1 (en) * 2011-02-24 2018-05-10 Rapiscan Systems, Inc. Optimization of the Source Firing Pattern for X-Ray Scanning Systems
WO2020018515A1 (fr) * 2018-07-20 2020-01-23 Idss Holdings, Inc. Systèmes et procédés de balayage de cargaison palettisée

Family Cites Families (35)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2407004C (fr) * 2001-02-23 2008-02-19 Mitsubishi Heavy Industries, Ltd. Appareil ct a rayons x
DE10139672A1 (de) * 2001-08-11 2003-03-06 Heimann Systems Gmbh & Co Verfahren und Anlage zur Inspektion eines Objektes, insbesondere eines Gepäckstückes
JP2004033471A (ja) * 2002-07-03 2004-02-05 Toshiba Corp Ｘ線ｃｔスキャナ装置
DE10235849A1 (de) * 2002-08-05 2004-03-04 Siemens Ag Messverfahren und bildgebende medizinische Untersuchungseinrichtung für ein sich periodisch bewegendes Untersuchungsobjekt
GB0903198D0 (en) * 2009-02-25 2009-04-08 Cxr Ltd X-Ray scanners
CN100460852C (zh) * 2005-09-22 2009-02-11 同方威视技术股份有限公司 一种利用射线源对液体物品进行ct安全检查的设备
CN101071111B (zh) * 2006-05-08 2011-05-11 清华大学 一种多视角航空集装箱安全检查系统及方法
CN101271075A (zh) * 2007-03-22 2008-09-24 清华大学 一种ct扫描安全检查方法及其装置
CN101382508A (zh) * 2007-09-05 2009-03-11 同方威视技术股份有限公司 一种检查航空货运集装箱中违禁物品的装置和方法
CN102175699B (zh) * 2007-10-30 2014-10-22 清华大学 检查系统、检查方法、ct装置以及探测装置
CN101960296B (zh) * 2007-12-27 2012-12-12 欧姆龙株式会社 X射线检查装置及x射线检查方法
WO2009133530A1 (fr) * 2008-05-01 2009-11-05 Koninklijke Philips Electronics N.V. Système de positionnement de source et/ou de détecteur
GB2518309B (en) * 2010-01-19 2015-08-19 Rapiscan Systems Inc Multi-view cargo scanner
CN102768219B (zh) * 2012-07-26 2014-07-30 清华大学 组合式射线无损检测方法及系统
CN103674979B (zh) * 2012-09-19 2016-12-21 同方威视技术股份有限公司 一种行李物品ct安检系统及其探测器装置
US9778391B2 (en) * 2013-03-15 2017-10-03 Varex Imaging Corporation Systems and methods for multi-view imaging and tomography
CN103462630B (zh) * 2013-09-13 2015-04-08 深圳先进技术研究院 Ct系统及ct扫描方法
CN104706371B (zh) * 2013-12-13 2017-11-07 通用电气公司 成像方法及成像系统
CN104749197B (zh) * 2013-12-26 2017-08-11 清华大学 Ct系统及其方法
CN104133251B (zh) * 2014-07-04 2017-08-25 清华大学 移动式背散射成像安检设备及方法
CN104483711B (zh) * 2014-12-17 2020-02-21 同方威视技术股份有限公司 基于分布式光源的辐射成像系统
US10215879B2 (en) * 2015-05-07 2019-02-26 Morpho Detection, Llc System for detecting counterfeit goods and method of operating the same
WO2018085824A1 (fr) * 2016-11-07 2018-05-11 Rensselaer Polytechnic Institute Procédés et systèmes de tomodensitométrie stationnaire
CN108268120B (zh) * 2016-12-29 2020-07-28 同方威视技术股份有限公司 基于vr或ar的图像数据处理方法、设备和安检系统
CN107436308B (zh) * 2017-09-15 2024-02-09 中国特种设备检测研究院 一种板状工件ct层析扫描装置
US20220390391A1 (en) * 2019-10-31 2022-12-08 Smiths Detection Inc. Below-ground computed tomography cargo inspection system and method
CN111552002A (zh) * 2020-05-19 2020-08-18 重庆大学 一种三源摆动螺旋安检ct成像装置及方法
CN212622322U (zh) * 2020-07-27 2021-02-26 中国航空综合技术研究所 用于微焦点ct系统的机械扫描装置
CN115097535B (zh) * 2021-07-07 2024-09-20 清华大学 检查系统和方法
CN115598719B (zh) * 2021-07-07 2024-06-07 同方威视技术股份有限公司 检查系统和方法
CN115598718B (zh) * 2021-07-07 2024-05-31 同方威视技术股份有限公司 检查系统和方法
CN115113287B (zh) * 2021-07-07 2024-09-20 清华大学 检查系统和方法
CN115097536B (zh) * 2021-07-07 2024-05-14 同方威视技术股份有限公司 检查系统和方法
CN115598717B (zh) * 2021-07-07 2024-05-14 同方威视技术股份有限公司 检查系统和方法
US12340379B2 (en) * 2023-05-16 2025-06-24 Craig Mateer Baggage imagery reanalysis for multi-modal travel

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5848115A (en) * 1997-05-02 1998-12-08 General Electric Company Computed tomography metrology
US20090067575A1 (en) * 2002-07-24 2009-03-12 Seppi Edward E Radiation scanning units including a movable platform
US20090116617A1 (en) * 2004-04-09 2009-05-07 American Science And Engineering, Inc. Multiple Image Collection and Synthesis for Personnel Screening
US20180128754A1 (en) * 2011-02-24 2018-05-10 Rapiscan Systems, Inc. Optimization of the Source Firing Pattern for X-Ray Scanning Systems
WO2020018515A1 (fr) * 2018-07-20 2020-01-23 Idss Holdings, Inc. Systèmes et procédés de balayage de cargaison palettisée

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2023280215A1 *

Also Published As

Publication number Publication date
CN115598715B (zh) 2024-10-15
EP4365641A1 (fr) 2024-05-08
CN115598715A (zh) 2023-01-13
WO2023280215A1 (fr) 2023-01-12
US20250046012A1 (en) 2025-02-06

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