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EP3816747A4 - MANUFACTURING SYSTEM, MANUFACTURING METHOD, CONTROL DEVICE AND MANUFACTURING PROCESS ANALYSIS METHOD - Google Patents

MANUFACTURING SYSTEM, MANUFACTURING METHOD, CONTROL DEVICE AND MANUFACTURING PROCESS ANALYSIS METHOD Download PDF

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Publication number
EP3816747A4
EP3816747A4 EP19824686.0A EP19824686A EP3816747A4 EP 3816747 A4 EP3816747 A4 EP 3816747A4 EP 19824686 A EP19824686 A EP 19824686A EP 3816747 A4 EP3816747 A4 EP 3816747A4
Authority
EP
European Patent Office
Prior art keywords
manufacturing
control device
process analysis
analysis method
manufacturing process
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP19824686.0A
Other languages
German (de)
French (fr)
Other versions
EP3816747A1 (en
EP3816747B1 (en
Inventor
Kouji Kawano
Akihiro Matsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Chemical Engineering Corp
Original Assignee
Mitsubishi Chemical Engineering Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Chemical Engineering Corp filed Critical Mitsubishi Chemical Engineering Corp
Publication of EP3816747A1 publication Critical patent/EP3816747A1/en
Publication of EP3816747A4 publication Critical patent/EP3816747A4/en
Application granted granted Critical
Publication of EP3816747B1 publication Critical patent/EP3816747B1/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/32—Operator till task planning
    • G05B2219/32368—Quality control
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P80/00—Climate change mitigation technologies for sector-wide applications
    • Y02P80/40—Minimising material used in manufacturing processes
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Factory Administration (AREA)
EP19824686.0A 2018-06-26 2019-03-19 Production system, production method, control device, and production process analysis method Active EP3816747B1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2018121056A JP6481916B1 (en) 2018-06-26 2018-06-26 Production system, production method and control device
PCT/JP2019/011589 WO2020003652A1 (en) 2018-06-26 2019-03-19 Production system, production method, control device, and production process analysis method

Publications (3)

Publication Number Publication Date
EP3816747A1 EP3816747A1 (en) 2021-05-05
EP3816747A4 true EP3816747A4 (en) 2022-03-23
EP3816747B1 EP3816747B1 (en) 2025-08-13

Family

ID=65718218

Family Applications (1)

Application Number Title Priority Date Filing Date
EP19824686.0A Active EP3816747B1 (en) 2018-06-26 2019-03-19 Production system, production method, control device, and production process analysis method

Country Status (4)

Country Link
US (1) US11675343B2 (en)
EP (1) EP3816747B1 (en)
JP (1) JP6481916B1 (en)
WO (1) WO2020003652A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6578456B1 (en) * 2018-02-22 2019-09-18 三菱ケミカルエンジニアリング株式会社 Continuous production system, method and inspection and sorting apparatus
JP6992889B2 (en) * 2018-05-14 2022-01-13 富士通株式会社 Judgment rule acquisition device, judgment rule acquisition method and judgment rule acquisition program
AT521576B1 (en) * 2018-08-21 2022-05-15 Wittmann Tech Gmbh Method for quality control and/or follow-up of an injection molded part produced in a production cycle, and plastics industry installation therefor
JP7419955B2 (en) * 2020-04-27 2024-01-23 横河電機株式会社 Data analysis system, data analysis method, and program
JP2023174448A (en) * 2022-05-27 2023-12-07 ニプロ株式会社 Powder inspection device and powder inspection method

Citations (2)

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Publication number Priority date Publication date Assignee Title
WO2017122340A1 (en) * 2016-01-15 2017-07-20 三菱電機株式会社 Plan generating device, plan generating method, and plan generating program
US20190129402A1 (en) * 2015-03-10 2019-05-02 Mitsubishi Chemical Engineering Corporation Manufacturing process analysis method

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JP3099932B2 (en) * 1993-12-14 2000-10-16 株式会社東芝 Intelligent test line system
JP3738738B2 (en) 2002-03-08 2006-01-25 Ｊｆｅスチール株式会社 Steel product quality control equipment
JP3913715B2 (en) * 2003-06-18 2007-05-09 株式会社東芝 Defect detection method
US7477958B2 (en) * 2005-05-11 2009-01-13 International Business Machines Corporation Method of release and product flow management for a manufacturing facility
JP2007157007A (en) * 2005-12-08 2007-06-21 Ricoh Co Ltd Manufacturing process monitoring control apparatus, monitoring control method, and storage medium
JP2008276428A (en) * 2007-04-27 2008-11-13 Yokogawa Electric Corp Distributed control system
JP5242959B2 (en) * 2007-07-11 2013-07-24 シャープ株式会社 Abnormal factor identification method and system, program for causing a computer to execute the abnormal factor identification method, and computer-readable recording medium recording the program
US9069345B2 (en) 2009-01-23 2015-06-30 Mks Instruments, Inc. Controlling a manufacturing process with a multivariate model
US9134711B2 (en) * 2010-05-04 2015-09-15 Frito-Lay North America, Inc. Advanced batch control
US10290088B2 (en) * 2014-02-14 2019-05-14 Kla-Tencor Corporation Wafer and lot based hierarchical method combining customized metrics with a global classification methodology to monitor process tool condition at extremely high throughput
JP2016167205A (en) 2015-03-10 2016-09-15 三菱化学エンジニアリング株式会社 Manufacturing process monitoring method
JP6561682B2 (en) * 2015-08-24 2019-08-21 株式会社Sumco Silicon wafer process planning system, process planning apparatus, process planning method and program
JP6747810B2 (en) * 2016-01-21 2020-08-26 株式会社神戸製鋼所 Control device and control method for waste incineration plant
JP7116975B2 (en) * 2016-08-31 2022-08-12 フロイント産業株式会社 Deviation processing device and deviation processing method
JP6716423B2 (en) * 2016-10-26 2020-07-01 三菱ケミカルエンジニアリング株式会社 Production process analysis method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20190129402A1 (en) * 2015-03-10 2019-05-02 Mitsubishi Chemical Engineering Corporation Manufacturing process analysis method
WO2017122340A1 (en) * 2016-01-15 2017-07-20 三菱電機株式会社 Plan generating device, plan generating method, and plan generating program
US20190018397A1 (en) * 2016-01-15 2019-01-17 Mitsubishi Electric Corporation Plan generation apparatus, plan generation method, and computer readable medium

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
See also references of WO2020003652A1 *

Also Published As

Publication number Publication date
US20210263507A1 (en) 2021-08-26
JP6481916B1 (en) 2019-03-13
WO2020003652A1 (en) 2020-01-02
US11675343B2 (en) 2023-06-13
EP3816747A1 (en) 2021-05-05
JP2020003940A (en) 2020-01-09
EP3816747B1 (en) 2025-08-13

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