EP3464674A4 - HIGH-PRECISION SHADOW MASK DEPOSITION SYSTEM AND METHOD THEREFOR - Google Patents
HIGH-PRECISION SHADOW MASK DEPOSITION SYSTEM AND METHOD THEREFOR Download PDFInfo
- Publication number
- EP3464674A4 EP3464674A4 EP17803308.0A EP17803308A EP3464674A4 EP 3464674 A4 EP3464674 A4 EP 3464674A4 EP 17803308 A EP17803308 A EP 17803308A EP 3464674 A4 EP3464674 A4 EP 3464674A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- shadow mask
- method therefor
- deposition system
- mask deposition
- precision shadow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662340793P | 2016-05-24 | 2016-05-24 | |
| PCT/US2017/033161 WO2017205147A1 (en) | 2016-05-24 | 2017-05-17 | High-precision shadow-mask-deposition system and method therefor |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP3464674A1 EP3464674A1 (en) | 2019-04-10 |
| EP3464674A4 true EP3464674A4 (en) | 2020-01-29 |
Family
ID=65563028
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP17803308.0A Pending EP3464674A4 (en) | 2016-05-24 | 2017-05-17 | HIGH-PRECISION SHADOW MASK DEPOSITION SYSTEM AND METHOD THEREFOR |
Country Status (2)
| Country | Link |
|---|---|
| EP (1) | EP3464674A4 (en) |
| CN (1) | CN109642313B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0741943A (en) * | 1993-07-27 | 1995-02-10 | Nec Corp | Sputtering device |
| JPH07150347A (en) * | 1993-11-26 | 1995-06-13 | Nec Corp | Sputtering device having collimator |
| US20040115338A1 (en) * | 2002-09-05 | 2004-06-17 | Sanyo Electric Co., Ltd. | Manufacturing method of organic electroluminescent display device |
| US20040142108A1 (en) * | 2002-12-03 | 2004-07-22 | Mitsuro Atobe | Mask vapor deposition method, mask vapor deposition system, mask, process for manufacturing mask, apparatus for manufacturing display panel, display panel, and electronic device |
| US20070024831A1 (en) * | 2005-07-27 | 2007-02-01 | International Business Machines Corporation | A method and apparatus for correcting gravitational sag in photomasks used in the production of electronic devices |
| WO2010113102A9 (en) * | 2009-04-03 | 2012-03-29 | Osram Opto Semiconductors Gmbh | An arrangement for holding a substrate in a material deposition apparatus |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012052155A (en) * | 2010-08-31 | 2012-03-15 | Canon Inc | Mask unit for vacuum film deposition and vacuum film deposition apparatus with the same |
| JP5285187B2 (en) * | 2010-12-27 | 2013-09-11 | シャープ株式会社 | Vapor deposition apparatus and vapor deposition method |
| CN203159695U (en) * | 2013-01-22 | 2013-08-28 | 昆山允升吉光电科技有限公司 | Masking component used for evaporation |
| US20160010201A1 (en) * | 2013-01-29 | 2016-01-14 | Sharp Kabushiki Kaisha | Vapor deposition unit and vapor deposition device |
| CN105378139B (en) * | 2013-07-08 | 2017-06-13 | 夏普株式会社 | Evaporation device, evaporation method, and method of manufacturing organic electroluminescence element |
| CN104911548B (en) * | 2015-06-30 | 2017-05-03 | 合肥鑫晟光电科技有限公司 | Vacuum evaporation device and evaporation method |
-
2017
- 2017-05-17 CN CN201780040228.5A patent/CN109642313B/en active Active
- 2017-05-17 EP EP17803308.0A patent/EP3464674A4/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0741943A (en) * | 1993-07-27 | 1995-02-10 | Nec Corp | Sputtering device |
| JPH07150347A (en) * | 1993-11-26 | 1995-06-13 | Nec Corp | Sputtering device having collimator |
| US20040115338A1 (en) * | 2002-09-05 | 2004-06-17 | Sanyo Electric Co., Ltd. | Manufacturing method of organic electroluminescent display device |
| US20040142108A1 (en) * | 2002-12-03 | 2004-07-22 | Mitsuro Atobe | Mask vapor deposition method, mask vapor deposition system, mask, process for manufacturing mask, apparatus for manufacturing display panel, display panel, and electronic device |
| US20070024831A1 (en) * | 2005-07-27 | 2007-02-01 | International Business Machines Corporation | A method and apparatus for correcting gravitational sag in photomasks used in the production of electronic devices |
| WO2010113102A9 (en) * | 2009-04-03 | 2012-03-29 | Osram Opto Semiconductors Gmbh | An arrangement for holding a substrate in a material deposition apparatus |
Non-Patent Citations (1)
| Title |
|---|
| See also references of WO2017205147A1 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109642313A (en) | 2019-04-16 |
| CN109642313B (en) | 2021-03-09 |
| EP3464674A1 (en) | 2019-04-10 |
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Legal Events
| Date | Code | Title | Description |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE INTERNATIONAL PUBLICATION HAS BEEN MADE |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
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| STAA | Information on the status of an ep patent application or granted ep patent |
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| 17P | Request for examination filed |
Effective date: 20181220 |
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| AK | Designated contracting states |
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| AX | Request for extension of the european patent |
Extension state: BA ME |
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| DAV | Request for validation of the european patent (deleted) | ||
| DAX | Request for extension of the european patent (deleted) | ||
| REG | Reference to a national code |
Ref country code: DE Ref legal event code: R079 Free format text: PREVIOUS MAIN CLASS: C23C0014240000 Ipc: C23C0014040000 |
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| A4 | Supplementary search report drawn up and despatched |
Effective date: 20200108 |
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| RIC1 | Information provided on ipc code assigned before grant |
Ipc: G03F 9/00 20060101ALI20191220BHEP Ipc: H01L 51/56 20060101ALI20191220BHEP Ipc: H01L 21/683 20060101ALI20191220BHEP Ipc: C23C 14/50 20060101ALI20191220BHEP Ipc: C23C 14/04 20060101AFI20191220BHEP Ipc: C23C 14/24 20060101ALI20191220BHEP Ipc: H01L 51/00 20060101ALI20191220BHEP Ipc: H01L 21/68 20060101ALI20191220BHEP Ipc: C23C 14/58 20060101ALI20191220BHEP |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: EXAMINATION IS IN PROGRESS |
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| 17Q | First examination report despatched |
Effective date: 20221216 |
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| P01 | Opt-out of the competence of the unified patent court (upc) registered |
Effective date: 20230525 |