EP2486398A4 - MICROTHERMIC CONDUCTIVITY DETECTOR, METHOD FOR MANUFACTURING SAME, AND CHROMATOGRAPHY SYSTEM USING SAME - Google Patents
MICROTHERMIC CONDUCTIVITY DETECTOR, METHOD FOR MANUFACTURING SAME, AND CHROMATOGRAPHY SYSTEM USING SAMEInfo
- Publication number
- EP2486398A4 EP2486398A4 EP10822815.6A EP10822815A EP2486398A4 EP 2486398 A4 EP2486398 A4 EP 2486398A4 EP 10822815 A EP10822815 A EP 10822815A EP 2486398 A4 EP2486398 A4 EP 2486398A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- same
- microthermic
- chromatography system
- conductivity detector
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
- G01N27/14—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature
- G01N27/18—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature caused by changes in the thermal conductivity of a surrounding material to be tested
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
- G01N30/02—Column chromatography
- G01N30/62—Detectors specially adapted therefor
- G01N30/64—Electrical detectors
- G01N30/66—Thermal conductivity detectors
Landscapes
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US25031009P | 2009-10-09 | 2009-10-09 | |
| PCT/US2010/052147 WO2011044547A2 (en) | 2009-10-09 | 2010-10-11 | Micro-thermal conductivity detector, method to fabricate such and chromatography system using such |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2486398A2 EP2486398A2 (en) | 2012-08-15 |
| EP2486398A4 true EP2486398A4 (en) | 2016-10-26 |
Family
ID=43857430
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP10822815.6A Withdrawn EP2486398A4 (en) | 2009-10-09 | 2010-10-11 | MICROTHERMIC CONDUCTIVITY DETECTOR, METHOD FOR MANUFACTURING SAME, AND CHROMATOGRAPHY SYSTEM USING SAME |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP2486398A4 (en) |
| CN (1) | CN102549422A (en) |
| CA (1) | CA2775583A1 (en) |
| WO (1) | WO2011044547A2 (en) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8805614B2 (en) | 2010-08-31 | 2014-08-12 | Schlumberger Technology Corporation | Downhole sample analysis method |
| US8531422B2 (en) | 2011-09-12 | 2013-09-10 | Siemens Aktiengesellschaft | Intrinsically safe touch screen for process equipment |
| FR2995692B1 (en) * | 2012-09-19 | 2014-10-10 | Commissariat Energie Atomique | THERMAL FLOW SENSOR WITH INCREASED RESOLUTION |
| JP5987811B2 (en) * | 2013-06-04 | 2016-09-07 | 株式会社デンソー | Abnormality judgment device for vehicle |
| GB201421102D0 (en) | 2014-11-27 | 2015-01-14 | Cambridge Entpr Ltd | Thermal conductivity sensing device, methods for operation and uses of the same |
| US9261351B1 (en) * | 2015-03-04 | 2016-02-16 | Mitutoyo Corporation | Chromatic range sensor including high sensitivity measurement mode |
| CN105136871A (en) * | 2015-06-19 | 2015-12-09 | 上海集成电路研发中心有限公司 | Micro thermal conductivity detector structure and processing and manufacturing method thereof |
| FR3038982A1 (en) | 2015-07-16 | 2017-01-20 | Commissariat Energie Atomique | ANALYSIS DEVICE FOR ANALYZING A MIXTURE OF AT LEAST TWO GASES |
| FR3040489A1 (en) | 2015-08-28 | 2017-03-03 | Commissariat Energie Atomique | THERMAL FLOW SENSOR IMPLEMENTING AT LEAST ONE OPTICAL RESONATOR, GAS SENSOR AND PIRANI GAUGE COMPRISING AT LEAST ONE SUCH SENSOR. |
| CN108700533B (en) * | 2016-03-07 | 2021-04-20 | 株式会社岛津制作所 | Thermal conductivity detector |
| JP6769720B2 (en) * | 2016-03-24 | 2020-10-14 | ヤマハファインテック株式会社 | Gas sensor |
| JP6359049B2 (en) * | 2016-05-09 | 2018-07-18 | Nissha株式会社 | Gas sensor device and manufacturing method thereof |
| CN108181415B (en) * | 2016-12-08 | 2023-05-12 | 中国科学院上海微系统与信息技术研究所 | Thin film type micro heat conduction detector and preparation method thereof |
| FR3053793A1 (en) * | 2017-01-19 | 2018-01-12 | Commissariat Energie Atomique | GAS ANALYSIS DEVICE BY CATHAROMETRIC DETECTION |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5295389A (en) * | 1991-08-21 | 1994-03-22 | Yamatake-Honeywell Co., Ltd. | Thermal conductivity detector |
| DE19639627A1 (en) * | 1995-10-25 | 1997-04-30 | Hewlett Packard Co | Compensation for spatial and temporal temperature fluctuations in a thermal conductivity detector |
| US20070028670A1 (en) * | 2005-05-17 | 2007-02-08 | Honeywell International Inc. | Three-wafer channel structure for a fluid analyzer |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6502983B2 (en) * | 1999-03-30 | 2003-01-07 | The Regents Of The University Of California | Micro-machined thermo-conductivity detector |
| TW494233B (en) * | 2000-02-25 | 2002-07-11 | Chung Shan Inst Of Science | Thermal conductivity detector |
| US20050063865A1 (en) * | 2002-09-27 | 2005-03-24 | Ulrich Bonne | Phased VII micro fluid analyzer having a modular structure |
| US7398681B2 (en) * | 2005-09-22 | 2008-07-15 | The Regents Of The University Of California | Gas sensor based on dynamic thermal conductivity and molecular velocity |
| US7347080B2 (en) * | 2005-12-23 | 2008-03-25 | Serveron Corporation | Thermal conductivity detector |
| CN2911684Y (en) * | 2006-03-21 | 2007-06-13 | 杨翌华 | Mini detector for heat conductivity of ceramic |
| US7600413B2 (en) * | 2006-11-29 | 2009-10-13 | Schlumberger Technology Corporation | Gas chromatography system architecture |
| US20090031785A1 (en) * | 2007-07-31 | 2009-02-05 | Caviton, Inc. | Capacitively coupled dielectric barrier discharge detector |
-
2010
- 2010-10-11 CN CN2010800453603A patent/CN102549422A/en active Pending
- 2010-10-11 EP EP10822815.6A patent/EP2486398A4/en not_active Withdrawn
- 2010-10-11 WO PCT/US2010/052147 patent/WO2011044547A2/en not_active Ceased
- 2010-10-11 CA CA2775583A patent/CA2775583A1/en not_active Abandoned
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5295389A (en) * | 1991-08-21 | 1994-03-22 | Yamatake-Honeywell Co., Ltd. | Thermal conductivity detector |
| DE19639627A1 (en) * | 1995-10-25 | 1997-04-30 | Hewlett Packard Co | Compensation for spatial and temporal temperature fluctuations in a thermal conductivity detector |
| US20070028670A1 (en) * | 2005-05-17 | 2007-02-08 | Honeywell International Inc. | Three-wafer channel structure for a fluid analyzer |
Non-Patent Citations (1)
| Title |
|---|
| KAANTA B C ET AL: "High Sensitivity Micro-Thermal Conductivity Detector for Gas Chromatography", MICRO ELECTRO MECHANICAL SYSTEMS, 2009. MEMS 2009. IEEE 22ND INTERNATIONAL CONFERENCE ON, IEEE, PISCATAWAY, NJ, USA, 25 January 2009 (2009-01-25), pages 264 - 267, XP031444280, ISBN: 978-1-4244-2977-6 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2775583A1 (en) | 2011-04-14 |
| WO2011044547A3 (en) | 2011-09-09 |
| CN102549422A (en) | 2012-07-04 |
| WO2011044547A2 (en) | 2011-04-14 |
| EP2486398A2 (en) | 2012-08-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
| 17P | Request for examination filed |
Effective date: 20120405 |
|
| AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR |
|
| RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: CHEN, HUA Inventor name: ZHANG, XIN Inventor name: BOURLON, BERTRAND Inventor name: ZHDANEEV, OLEG Inventor name: KAANTA, BRADLEY, C. Inventor name: DONZIER, ERIC, PAUL Inventor name: LAMBERTUS, GORDON, R. Inventor name: STEINECKER, WILLIAM, H. |
|
| DAX | Request for extension of the european patent (deleted) | ||
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20160923 |
|
| RIC1 | Information provided on ipc code assigned before grant |
Ipc: G01N 30/66 20060101AFI20160919BHEP Ipc: G01N 25/18 20060101ALI20160919BHEP Ipc: G01N 27/18 20060101ALI20160919BHEP |
|
| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
| 18D | Application deemed to be withdrawn |
Effective date: 20170422 |