EP2099068A4 - Procédé de fabrication d'un substrat de nitrure d'aluminium métallisé - Google Patents
Procédé de fabrication d'un substrat de nitrure d'aluminium métalliséInfo
- Publication number
- EP2099068A4 EP2099068A4 EP07851092A EP07851092A EP2099068A4 EP 2099068 A4 EP2099068 A4 EP 2099068A4 EP 07851092 A EP07851092 A EP 07851092A EP 07851092 A EP07851092 A EP 07851092A EP 2099068 A4 EP2099068 A4 EP 2099068A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- aluminum nitride
- nitride substrate
- metallized aluminum
- producing metallized
- producing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/38—Improvement of the adhesion between the insulating substrate and the metal
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/52—Multiple coating or impregnating multiple coating or impregnating with the same composition or with compositions only differing in the concentration of the constituents, is classified as single coating or impregnation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/89—Coating or impregnation for obtaining at least two superposed coatings having different compositions
- C04B41/90—Coating or impregnation for obtaining at least two superposed coatings having different compositions at least one coating being a metal
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/4867—Applying pastes or inks, e.g. screen printing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/24—Reinforcing the conductive pattern
- H05K3/245—Reinforcing conductive patterns made by printing techniques or by other techniques for applying conductive pastes, inks or powders; Reinforcing other conductive patterns by such techniques
- H05K3/247—Finish coating of conductors by using conductive pastes, inks or powders
- H05K3/248—Finish coating of conductors by using conductive pastes, inks or powders fired compositions for inorganic substrates
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2111/00—Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
- C04B2111/00474—Uses not provided for elsewhere in C04B2111/00
- C04B2111/00844—Uses not provided for elsewhere in C04B2111/00 for electronic applications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/095—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
- H01L2924/097—Glass-ceramics, e.g. devitrified glass
- H01L2924/09701—Low temperature co-fired ceramic [LTCC]
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/09—Use of materials for the conductive, e.g. metallic pattern
- H05K1/092—Dispersed materials, e.g. conductive pastes or inks
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0347—Overplating, e.g. for reinforcing conductors or bumps; Plating over filled vias
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/035—Paste overlayer, i.e. conductive paste or solder paste over conductive layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/12—All metal or with adjacent metals
- Y10T428/12493—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.]
- Y10T428/12535—Composite; i.e., plural, adjacent, spatially distinct metal components [e.g., layers, joint, etc.] with additional, spatially distinct nonmetal component
- Y10T428/12576—Boride, carbide or nitride component
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Structural Engineering (AREA)
- Organic Chemistry (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Laminated Bodies (AREA)
- Ceramic Products (AREA)
- Die Bonding (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Non-Insulated Conductors (AREA)
- Manufacturing Of Electric Cables (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006353863 | 2006-12-28 | ||
| PCT/JP2007/074740 WO2008081758A1 (fr) | 2006-12-28 | 2007-12-21 | Procédé de fabrication d'un substrat de nitrure d'aluminium métallisé |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| EP2099068A1 EP2099068A1 (fr) | 2009-09-09 |
| EP2099068A4 true EP2099068A4 (fr) | 2011-01-26 |
Family
ID=39588442
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP07851092A Withdrawn EP2099068A4 (fr) | 2006-12-28 | 2007-12-21 | Procédé de fabrication d'un substrat de nitrure d'aluminium métallisé |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20100015468A1 (fr) |
| EP (1) | EP2099068A4 (fr) |
| JP (1) | JPWO2008081758A1 (fr) |
| WO (1) | WO2008081758A1 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8834630B2 (en) | 2007-01-17 | 2014-09-16 | Crystal Is, Inc. | Defect reduction in seeded aluminum nitride crystal growth |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8545629B2 (en) | 2001-12-24 | 2013-10-01 | Crystal Is, Inc. | Method and apparatus for producing large, single-crystals of aluminum nitride |
| US7638346B2 (en) | 2001-12-24 | 2009-12-29 | Crystal Is, Inc. | Nitride semiconductor heterostructures and related methods |
| US7641735B2 (en) | 2005-12-02 | 2010-01-05 | Crystal Is, Inc. | Doped aluminum nitride crystals and methods of making them |
| US9034103B2 (en) | 2006-03-30 | 2015-05-19 | Crystal Is, Inc. | Aluminum nitride bulk crystals having high transparency to ultraviolet light and methods of forming them |
| US9771666B2 (en) | 2007-01-17 | 2017-09-26 | Crystal Is, Inc. | Defect reduction in seeded aluminum nitride crystal growth |
| US8080833B2 (en) | 2007-01-26 | 2011-12-20 | Crystal Is, Inc. | Thick pseudomorphic nitride epitaxial layers |
| US9437430B2 (en) | 2007-01-26 | 2016-09-06 | Crystal Is, Inc. | Thick pseudomorphic nitride epitaxial layers |
| DE102009008926B4 (de) * | 2009-02-13 | 2022-06-15 | Danfoss Silicon Power Gmbh | Verfahren zur Schaffung einer hochtemperatur- und temperaturwechselfesten Verbindung eines Halbleiterbausteins mit einem Verbindungspartner und einer Kontaktlasche unter Verwendung eines temperaturbeaufschlagenden Verfahrens |
| JP5824201B2 (ja) * | 2009-09-11 | 2015-11-25 | Dowaエレクトロニクス株式会社 | 接合材およびそれを用いた接合方法 |
| WO2012003304A1 (fr) | 2010-06-30 | 2012-01-05 | Crystal Is, Inc. | Croissance de grands monocristaux de nitrure d'aluminium avec contrôle de gradient thermique |
| JP5707886B2 (ja) * | 2010-11-15 | 2015-04-30 | 三菱マテリアル株式会社 | パワーモジュール用基板、冷却器付パワーモジュール用基板、パワーモジュールおよびパワーモジュール用基板の製造方法 |
| JP5707885B2 (ja) * | 2010-11-15 | 2015-04-30 | 三菱マテリアル株式会社 | パワーモジュール用基板、冷却器付パワーモジュール用基板、パワーモジュール及びパワーモジュール用基板の製造方法 |
| JP2012111671A (ja) * | 2010-11-26 | 2012-06-14 | Tokuyama Corp | 窒化アルミニウム焼結体加工物の製造方法 |
| US8962359B2 (en) | 2011-07-19 | 2015-02-24 | Crystal Is, Inc. | Photon extraction from nitride ultraviolet light-emitting devices |
| WO2014122137A1 (fr) * | 2013-02-07 | 2014-08-14 | Ceramtec Gmbh | Métallisation multiniveaux sur un substrat en céramique |
| JP6275817B2 (ja) | 2013-03-15 | 2018-02-07 | クリスタル アイエス, インコーポレーテッドCrystal Is, Inc. | 仮像電子及び光学電子装置に対する平面コンタクト |
| JP2018037527A (ja) * | 2016-08-31 | 2018-03-08 | 日本特殊陶業株式会社 | 配線基板及びその製造方法 |
| JP7046643B2 (ja) * | 2018-02-23 | 2022-04-04 | 株式会社ノリタケカンパニーリミテド | 放熱性基板 |
| CN109206139A (zh) * | 2018-09-05 | 2019-01-15 | 东莞市正品五金电子有限公司 | 一种金属化陶瓷基板及其制备方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4728534A (en) * | 1986-08-04 | 1988-03-01 | Motorola, Inc. | Thick film conductor structure |
| EP0766307A1 (fr) * | 1995-03-20 | 1997-04-02 | Kabushiki Kaisha Toshiba | Substrat de circuit au nitrure de silicium |
| US5682589A (en) * | 1994-12-21 | 1997-10-28 | International Business Machines Corporation | Aluminum nitride body having graded metallurgy |
| JP2001015635A (ja) * | 1999-06-29 | 2001-01-19 | Kyocera Corp | 光半導体素子収納用パッケージ |
| EP1670295A2 (fr) * | 2004-12-03 | 2006-06-14 | Ngk Spark Plug Co., Ltd. | Substrat céramique et boîtier céramique de stockage d'élément luminescent |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02208274A (ja) * | 1989-02-06 | 1990-08-17 | Nippon Haiburitsudo Technol Kk | セラミックス表面の金属化組成物、表面金属化方法及び表面金属化製品 |
| WO2004074210A1 (fr) * | 1992-07-03 | 2004-09-02 | Masanori Hirano | Corps composite a base de ceramique et de metal et son procede de production |
| JP4161423B2 (ja) | 1997-10-30 | 2008-10-08 | 住友電気工業株式会社 | 窒化アルミニウム焼結体及びそのメタライズ基板 |
| JPH11260964A (ja) * | 1998-03-13 | 1999-09-24 | Toshiba Electronic Engineering Corp | 半導体パッケージ |
| JP2002373960A (ja) * | 2001-06-14 | 2002-12-26 | Tokuyama Corp | 素子接合用基板及びその製造方法 |
| JP4163932B2 (ja) | 2002-10-28 | 2008-10-08 | 京セラ株式会社 | 発光素子収納用パッケージおよび発光装置 |
| JP2005191075A (ja) * | 2003-12-24 | 2005-07-14 | Ngk Spark Plug Co Ltd | 中継基板及びその製造方法、中継基板付き基板 |
| JP4401259B2 (ja) * | 2004-08-20 | 2010-01-20 | 富士通株式会社 | タッチパネル装置 |
| KR101011412B1 (ko) | 2004-11-12 | 2011-01-28 | 가부시끼가이샤 도꾸야마 | 메탈라이즈드 질화알루미늄 기판의 제조 방법 및 그것에의해서 얻어지는 기판 |
-
2007
- 2007-12-21 EP EP07851092A patent/EP2099068A4/fr not_active Withdrawn
- 2007-12-21 WO PCT/JP2007/074740 patent/WO2008081758A1/fr not_active Ceased
- 2007-12-21 US US12/519,571 patent/US20100015468A1/en not_active Abandoned
- 2007-12-21 JP JP2008552103A patent/JPWO2008081758A1/ja not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4728534A (en) * | 1986-08-04 | 1988-03-01 | Motorola, Inc. | Thick film conductor structure |
| US5682589A (en) * | 1994-12-21 | 1997-10-28 | International Business Machines Corporation | Aluminum nitride body having graded metallurgy |
| EP0766307A1 (fr) * | 1995-03-20 | 1997-04-02 | Kabushiki Kaisha Toshiba | Substrat de circuit au nitrure de silicium |
| JP2001015635A (ja) * | 1999-06-29 | 2001-01-19 | Kyocera Corp | 光半導体素子収納用パッケージ |
| EP1670295A2 (fr) * | 2004-12-03 | 2006-06-14 | Ngk Spark Plug Co., Ltd. | Substrat céramique et boîtier céramique de stockage d'élément luminescent |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8834630B2 (en) | 2007-01-17 | 2014-09-16 | Crystal Is, Inc. | Defect reduction in seeded aluminum nitride crystal growth |
Also Published As
| Publication number | Publication date |
|---|---|
| US20100015468A1 (en) | 2010-01-21 |
| WO2008081758A1 (fr) | 2008-07-10 |
| JPWO2008081758A1 (ja) | 2010-04-30 |
| EP2099068A1 (fr) | 2009-09-09 |
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Legal Events
| Date | Code | Title | Description |
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| PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
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| 17P | Request for examination filed |
Effective date: 20090618 |
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| AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR |
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| DAX | Request for extension of the european patent (deleted) | ||
| A4 | Supplementary search report drawn up and despatched |
Effective date: 20101223 |
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| STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
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| 18D | Application deemed to be withdrawn |
Effective date: 20130702 |