EP1842095A4 - ADAPTIVE SCANNING OPTICAL MICROSCOPE - Google Patents

ADAPTIVE SCANNING OPTICAL MICROSCOPE

Info

Publication number: EP1842095A4
Authority: EP; European Patent Office
Prior art keywords: optical microscope; scanning optical; adaptive scanning; adaptive; microscope
Prior art date: 2005-01-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Withdrawn

Application number

EP05855789A

Other languages

German (de)

French (fr)

Other versions

EP1842095A2 (en

Inventor

Benjamin Michael Potsaid

Yves Bellouard

John T Wen

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Rensselaer Polytechnic Institute

Original Assignee

Rensselaer Polytechnic Institute

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2005-01-27

Filing date

2005-12-29

Publication date

2010-08-04

2005-12-29 Application filed by Rensselaer Polytechnic Institute filed Critical Rensselaer Polytechnic Institute

2007-10-10 Publication of EP1842095A2 publication Critical patent/EP1842095A2/en

2010-08-04 Publication of EP1842095A4 publication Critical patent/EP1842095A4/en

Status Withdrawn legal-status Critical Current

Classifications

- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Optics & Photonics (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Engineering & Computer Science (AREA)
Multimedia (AREA)
Computer Vision & Pattern Recognition (AREA)
Microscoopes, Condenser (AREA)
Lenses (AREA)

EP05855789A 2005-01-27 2005-12-29 ADAPTIVE SCANNING OPTICAL MICROSCOPE Withdrawn EP1842095A4 (en)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
US64757205P	2005-01-27	2005-01-27
PCT/US2005/047287 WO2006081031A2 (en)	2005-01-27	2005-12-29	Adaptive scanning optical microscope

Publications (2)

Publication Number	Publication Date
EP1842095A2 EP1842095A2 (en)	2007-10-10
EP1842095A4 true EP1842095A4 (en)	2010-08-04

Family

ID=36740940

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
EP05855789A Withdrawn EP1842095A4 (en)	2005-01-27	2005-12-29	ADAPTIVE SCANNING OPTICAL MICROSCOPE

Country Status (5)

Country	Link
EP (1)	EP1842095A4 (en)
JP (1)	JP2008529082A (en)
CN (1)	CN100585449C (en)
IL (1)	IL183131A0 (en)
WO (1)	WO2006081031A2 (en)

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US7556378B1 (en)	2003-04-10	2009-07-07	Tsontcho Ianchulev	Intraoperative estimation of intraocular lens power
JP4972546B2 (en)	2004-04-20	2012-07-11	ウェーブテック・ビジョン・システムズ・インコーポレイテッド	Integrated surgical microscope and wavefront sensor
DE102006010767B4 (en) *	2006-03-08	2008-04-17	Carl Zeiss Surgical Gmbh	microscopy system
US8333474B2 (en)	2007-10-19	2012-12-18	Wavetec Vision Systems, Inc.	Optical instrument alignment system
US7594729B2 (en)	2007-10-31	2009-09-29	Wf Systems, Llc	Wavefront sensor
WO2010054268A2 (en)	2008-11-06	2010-05-14	Wavetec Vision Systems, Inc.	Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy
US8876290B2 (en)	2009-07-06	2014-11-04	Wavetec Vision Systems, Inc.	Objective quality metric for ocular wavefront measurements
WO2011008609A1 (en)	2009-07-14	2011-01-20	Wavetec Vision Systems, Inc.	Ophthalmic surgery measurement system
ES2653970T3 (en)	2009-07-14	2018-02-09	Wavetec Vision Systems, Inc.	Determination of the effective position of the lens of an intraocular lens using aphakic refractive power
JP5690827B2 (en)	2009-09-18	2015-03-25	カール・ツァイス・エスエムティー・ゲーエムベーハー	Method for measuring shape of optical surface and interference measuring device
JP2011095685A (en) *	2009-11-02	2011-05-12	Sony Corp	Microscope system and control method of microscope system
JP5744450B2 (en) *	2009-11-17	2015-07-08	キヤノン株式会社	Imaging apparatus and control method thereof
DE102012101778A1 (en) *	2012-03-02	2013-09-05	Leica Microsystems Cms Gmbh	Scanning microscopic method and scanning microscope
JP5814855B2 (en) *	2012-04-27	2015-11-17	株式会社日立ハイテクノロジーズ	Charged particle beam adjustment support apparatus and method
US9072462B2 (en)	2012-09-27	2015-07-07	Wavetec Vision Systems, Inc.	Geometric optical power measurement device
TWI490542B (en) *	2013-05-07	2015-07-01	Univ Nat Taiwan	A scanning lens and an interference measuring device using the scanning lens
DE102014005880A1 (en) *	2014-04-17	2015-11-05	Carl Zeiss Ag	Scanning microscope with simplified optics, in particular with variable pupil position
DE102014112199B4 (en) *	2014-08-26	2024-10-10	Carl Zeiss Microscopy Gmbh	Microscopic imaging system
DE102014113908A1 (en) *	2014-09-25	2016-03-31	Carl Zeiss Ag	Laser scanning system
DE102014017001A1 (en) *	2014-11-12	2016-05-12	Carl Zeiss Ag	Microscope with low distortion error
CN104460007B (en) *	2014-12-30	2017-02-01	哈尔滨工业大学	Laser tripled-frequency space intensity shaping method
JP2018529125A (en)	2015-09-02	2018-10-04	インスコピックス，インコーポレイテッド	System and method for color imaging
CN105242397B (en) *	2015-09-30	2017-10-27	深圳大学	A kind of relevant adaptive optics aberration correction system
JP2018533768A (en)	2015-11-05	2018-11-15	インスコピックス，インコーポレイテッド	System and method for optogenetics imaging
US12251272B2 (en)	2015-11-05	2025-03-18	Inscopix, Inc.	Systems and methods for optogenetic imaging using semi-kinematic coupling
CN105910799B (en) *	2016-06-06	2017-06-06	北京理工大学	Infinite and Finite Conjugate Focus-finding Photoelectric Image Analyzer and Its Method
CN106092518B (en) *	2016-06-06	2017-09-05	北京理工大学	Infinite and finite conjugate differential detection focus-finding photoelectric image analyzer and its method
CN106199751B (en) *	2016-07-08	2019-03-01	中国科学院电子学研究所	The automatically controlled beam scanning optical link of Terahertz
CN106680984B (en) *	2016-12-16	2019-06-11	大连光耀辉科技有限公司	A laser dual-channel simultaneous output device and microscope
CN106773024A (en) *	2017-03-30	2017-05-31	中国检验认证集团检验有限公司	A kind of change enlargement ratio optical image technology based on distorting lens
CN107063092B (en) *	2017-06-05	2019-02-05	北京理工大学	A dual light source coaxial calibration system and adjustment method for fast scanning with large field of view
CN112782844B (en) *	2021-01-12	2023-03-31	中国科学院光电技术研究所	Stable closed-loop control method for adaptive optical system
NL2034478B1 (en) *	2023-03-30	2024-10-04	Univ Twente	An aberration compensating unit and method, and a light optical device comprising such a unit.

Citations (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE10038622A1 (en) *	2000-08-03	2002-02-21	Leica Microsystems	Scanning microscope, optical arrangement and method for image acquisition in scanning microscopy
US20020044332A1 (en) *	2000-10-04	2002-04-18	Johann Engelhardt	Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) *	2002-09-16	2004-03-25	Rensselaer Polytechnic Institute	Microscope with extended field of vision
US20040184163A1 (en) *	2003-02-13	2004-09-23	Olympus Corporation	Optical apparatus

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TW538256B (en) *	2000-01-14	2003-06-21	Zeiss Stiftung	Microlithographic reduction projection catadioptric objective
JP2004514943A (en) *	2000-11-28	2004-05-20	カール・ツアイス・エスエムテイ・アーゲー	Catadioptric projection system for 157nm lithography
JP2003057553A (en) *	2001-08-09	2003-02-26	Olympus Optical Co Ltd	Confocal scanning type microscope
AU2003245458A1 (en) *	2002-06-12	2003-12-31	Advanced Research And Technology Institute, Inc.	Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy
US7339148B2 (en) *	2002-12-16	2008-03-04	Olympus America Inc.	Confocal microscope
JP2004198492A (en) *	2002-12-16	2004-07-15	Olympus Corp	Fluorescence microscope
US7057806B2 (en) *	2003-05-09	2006-06-06	3M Innovative Properties Company	Scanning laser microscope with wavefront sensor

2005
- 2005-12-29 EP EP05855789A patent/EP1842095A4/en not_active Withdrawn
- 2005-12-29 WO PCT/US2005/047287 patent/WO2006081031A2/en not_active Ceased
- 2005-12-29 JP JP2007553106A patent/JP2008529082A/en active Pending
- 2005-12-29 CN CN200580045412A patent/CN100585449C/en not_active Expired - Lifetime
2007
- 2007-05-10 IL IL183131A patent/IL183131A0/en unknown

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE10038622A1 (en) *	2000-08-03	2002-02-21	Leica Microsystems	Scanning microscope, optical arrangement and method for image acquisition in scanning microscopy
US20020044332A1 (en) *	2000-10-04	2002-04-18	Johann Engelhardt	Optical arrangement, and method for the deflection of light beams
WO2004025331A2 (en) *	2002-09-16	2004-03-25	Rensselaer Polytechnic Institute	Microscope with extended field of vision
US20040184163A1 (en) *	2003-02-13	2004-09-23	Olympus Corporation	Optical apparatus

Also Published As

Publication number	Publication date
IL183131A0 (en)	2007-09-20
CN101116023A (en)	2008-01-30
WO2006081031A2 (en)	2006-08-03
JP2008529082A (en)	2008-07-31
WO2006081031A3 (en)	2007-03-01
CN100585449C (en)	2010-01-27
EP1842095A2 (en)	2007-10-10

Publication	Publication Date	Title
EP1842095A4 (en)	2010-08-04	ADAPTIVE SCANNING OPTICAL MICROSCOPE
DE602008004052D1 (en)	2011-02-03	Laser Scanning Microscope
DE602005007403D1 (en)	2008-07-24	Scanning confocal microscope
DE602006021005D1 (en)	2011-05-12	OPTICAL MICROSECTROMETER
DE602005021172D1 (en)	2010-06-24	Optical scanning device
EP2042905A4 (en)	2011-05-25	LASER SCAN MICROSCOPE
DE602005022786D1 (en)	2010-09-23	Scanning optical rangefinder
FR2881890B1 (en)	2008-03-07	OPTICAL MODULE
EP2034337A4 (en)	2010-06-23	OPTICAL LENS
DE602006001138D1 (en)	2008-06-26	Optical obturator
EP2264506A4 (en)	2013-11-27	MICROSCOPE LENS LENS
DE602006003114D1 (en)	2008-11-27	light deflector
FR2891370B1 (en)	2010-09-10	OPTICAL ARTICLE
DE602005026497D1 (en)	2011-04-07	scanning Electron Microscope
DE502005007656D1 (en)	2009-08-20	intraocular lens
EP1882461A4 (en)	2009-12-30	intraocular lens
FR2890457B1 (en)	2009-09-25	OPTICAL MODULE
DE502005010766D1 (en)	2011-02-10	Optical instrument
EP1895348A4 (en)	2009-11-25	MICROSCOPE
EP1963448A4 (en)	2011-12-28	COATINGS FOR OPTICAL ELEMENTS
FR2897697B1 (en)	2011-05-20	OPTICAL FRAME.
DE602005000964D1 (en)	2007-06-06	Scanning optical microscope
EP2103983A4 (en)	2010-05-19	ACTUATOR FOR OPTICAL SCANNING
DE602005015262D1 (en)	2009-08-13	FIGURE LENS
DE602005007117D1 (en)	2008-07-10	Optical scanning device

Legal Events

Date	Code	Title	Description
2007-09-07	PUAI	Public reference made under article 153(3) epc to a published international application that has entered the european phase	Free format text: ORIGINAL CODE: 0009012
2007-10-10	17P	Request for examination filed	Effective date: 20070515
2007-10-10	AK	Designated contracting states	Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
2008-02-27	RIN1	Information on inventor provided before grant (corrected)	Inventor name: BELLOUARD, YVES Inventor name: POTSAID, BENJAMIN, MICHAEL Inventor name: WEN, JOHN, T.
2008-04-30	DAX	Request for extension of the european patent (deleted)
2010-08-04	A4	Supplementary search report drawn up and despatched	Effective date: 20100702
2011-08-05	STAA	Information on the status of an ep patent application or granted ep patent	Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN
2011-09-07	18D	Application deemed to be withdrawn	Effective date: 20110201