EP1080365A1 - Surface plasmon resonance sensor for the simultaneous measurement of a plurality of samples in fluid form - Google Patents
Surface plasmon resonance sensor for the simultaneous measurement of a plurality of samples in fluid formInfo
- Publication number
- EP1080365A1 EP1080365A1 EP99952120A EP99952120A EP1080365A1 EP 1080365 A1 EP1080365 A1 EP 1080365A1 EP 99952120 A EP99952120 A EP 99952120A EP 99952120 A EP99952120 A EP 99952120A EP 1080365 A1 EP1080365 A1 EP 1080365A1
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- European Patent Office
- Prior art keywords
- spr sensor
- sensor according
- optical waveguide
- strip
- thin metal
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/251—Colorimeters; Construction thereof
- G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/552—Attenuated total reflection
- G01N21/553—Attenuated total reflection and using surface plasmons
Definitions
- the invention relates to an SPR sensor for the simultaneous detection of a large number of samples in fluid form, which enables rapid sample recognition in the context of a variety of applications.
- the proposed sensor is used for the parallel or serial detection of samples which have been placed in microtite slats.
- the background of the invention is the necessity to also provide the sensors used for the measurement in a parallel and miniaturized format, so that the measurements of a large number of samples can be carried out in a very short time and with a minimum sample volume and consumption, in order to increase the throughput characterizing substances to increase.
- a very sensitive method for characterizing interfaces is known in the literature as surface plasmon resonance spectroscopy, usually called SPR (surface plasmon resonance).
- SPR surface plasmon resonance
- the method is based on the optical excitation of surface plasmons in thin metal layers. This method is described in detail by Striebel, Ch .; Brecht, A .; Gauglitz, G. in Biosensors & Bioelectronics 9 (1994), 139-146.
- the resonance conditions for the excitation of the surface plasmons strongly depend on the optical properties of the dielectric surrounding the metal layer.
- the determination of refractive index and layer thickness of thin dielectric layers is fundamentally possible with a high degree of accuracy according to the known prior
- SPR spectroscopy is increasingly used e.g. in biochemical analysis, because with mr the direct investigation of the interaction between biomolecules is possible (e.g. antibodies / antigen reactions).
- one reaction partner ligand
- analyte is passed over the surface in solution.
- the interaction is directly detectable as an increase in layer thickness via the change in refractive index.
- Conventional SPR sensors see product description from Biacore AB, Rapsgatan 7, S-75450 Uppsala, Sweden 1996) use a prism that carries a thin metal layer.
- the sample to be measured is brought into contact with the metal or the modified metal surface, and the SPR reflection spectrum of the sample is measured by coupling light and measuring the intensity of the reflected light as a function of the angle of incidence or the wavelength.
- Newer methods and devices use fiber optic elements to build an SPR sensor.
- Commercial optical fibers with diameters between 1 ⁇ m and 2000 ⁇ m are used.
- the fibers are exposed at their ends or other defined areas, that is, the existing sheathing, consisting of waveguide sheath and buffer layer, is removed mechanically, chemically or thermally.
- the fibers are then provided with a metal layer radially or partially radially, and in the case of a fiber-optic sensor based on end reflection, the end face of the fiber is additionally mirrored.
- the radial coating is subject to very high requirements with regard to the layer thickness homogeneity, which can only be achieved technologically with great effort.
- a further disadvantage when using optical fibers is in particular the limited possibility of parallelization, since individual optical fibers must always be arranged manually in an array.
- the invention makes use of the task of planar waveguides, which are each provided with at least one SPR sensor area.
- SPR sensors according to the invention can be arranged in parallel and can simultaneously be brought into contact with a large number of samples (greater than 100).
- planar waveguides used lead the excitation light to the sensor area, which uses the measuring principle of surface plasmon resonance to characterize a solution that has been brought into contact with the sensor. Exactly one sample is brought into contact with each sensor area, so that n-different samples can be characterized with an SPR waveguide array consisting of n waveguides.
- An SPR waveguide array is to be manufactured using technologies from semiconductor production and integrated optics in order to provide a large number of sensors in parallel and to arrange them at a defined distance from one another.
- the invention further enables the SPR waveguide arrays in sample holders, e.g. B. integrate microtiter plates.
- the SPR waveguide arrays should be adaptable to existing formats of microtiter plates (96, 386, 1536, etc.) as well as to different or newly developed formats.
- Planar waveguides are receiving increasing attention in research and development in the field of integrated optics.
- a light-guiding layer is applied to a surface of a carrier material.
- the refractive index of the carrier material or a layer to be provided thereon for this purpose must be smaller than that of the waveguiding layer in order to guarantee an almost loss-free guidance of the light in the waveguide.
- Such flat waveguides are manufactured using known semiconductor technology and integrated optics, such as CVD processes, sputtering, electron beam evaporation, spin coating or various replication techniques.
- Known microtechnical processes also make it possible to produce finely structured waveguides and splitters. Waveguides with thicknesses in the range of a few micrometers to a few 100 ⁇ m and widths up to a few 1000 ⁇ m can be produced using a wide variety of structuring processes.
- the coating of defined waveguide sections with an SPR-capable layer can also be carried out in parallel in a few steps using known technologies.
- An SPR sensor according to the present invention consists of several planar strip-shaped optical waveguides, each of which has at least one two-dimensional measurement area between two end faces.
- These measuring areas are provided with an SPR-capable planar metal layer which is in direct contact with both the wave-guiding material and the sample to be characterized.
- the excitation light reaches the optical waveguide via known coupling mechanisms. There the light spreads along the waveguide and is guided to the sensor area. In the sensor area, the excitation of surface plasmons influences the light guided in the optical waveguide.
- the modified light is either decoupled from the optical waveguide directly after passing through the sensor region via the known coupling principles and passed on for further processing, or it is reflected in itself by a reflective coating on the end face in the optical waveguide and via the same coupling mechanism, through which the light enters the optical fiber reached, decoupled again and thus passed on for further processing.
- planar SPR waveguides based on the final reflection. If the coupled light emerges on the second side of the waveguide, one speaks of a waveguide sensor based on inline transmission.
- FIG. 1 shows a first possible embodiment of an emdimensional SPR sensor that can be expanded into an array
- FIG. 1 a shows a top view of the SPR sensor according to FIG
- FIG. 1b a section from FIG. 1,
- FIG. 2 shows a second embodiment of an SPR sensor which is essentially analogous to FIG. 1
- FIG. 3a shows a perspective view of an SPR sensor according to FIG. 1 or FIG. 2
- FIG. 3b shows an arrangement of several SPR sensors 3a to
- FIG. 4 shows a possibility of inserting a comb-like, sprinkled SPR sensor array consisting of planar SPR sensors according to FIGS. 1 or 2 into a microtitre plate in a sectional view
- FIG. 5 shows a possible arrangement of SPR sensors, whereby the mutual spacing of which is formed by cuvette walls
- FIG. 6a shows a possible arrangement of an SPR sensor, the individual sensor being additionally detected by cuvette walls
- FIG. 6b shows a further embodiment of an SPR sensor array according to FIG. 6a
- FIG. 6c shows a multiple arrangement a training according to Fig. 6a and Fig. 7 a further training possibility according to Fig. 6b.
- FIG. 1 shows a partial section of an SPR sensor in a first exemplary embodiment.
- a plurality of strip-shaped optical waveguides 2, which are arranged at a defined distance from one another, are provided on a planar carrier 1 in such a way that their end faces 21, 22 are flush with the sides 11, 12 of the planar carrier 1, each of the strip-shaped optical waveguides 2, in a section which is to be brought into contact with the fluid samples to be analyzed, which are not shown in FIG. 1, is provided with a thin metal layer 3 which enables the excitation of surface plasmons.
- a 4 "silicon wafer used in semiconductor technology has been assumed, in which the structures of a plurality of planar carriers 1 have first been transferred and structured. Long, narrow rectangular openings have been structured in the wafer 1.
- the geometry of a mask used for this purpose in the example is to be designed in such a way that the carcinoma structures that arise after it has been separated can be immersed in 1536-format microtiter plates (32-48 cavities). It can be seen that only a section of this is shown in Fig. 1.
- a silicon wafer with a crystal orientation (110) is selected, which makes it possible to have rectangular free spaces structure vertical edges on at least two edges structured wafers, in the example using the PE-CVD process, coated with S> 2 .
- This SiO 2 layer serves as an optical buffer between the optical fibers 2 provided and the Si substrate.
- the shaping of the optical waveguide 2 in the sense of the present invention is carried out by a customary dry etching process of the silicon oxynitride layer in such a way that parallel strips with widths between 10 ⁇ m to 2000 ⁇ m and distances between 10 ⁇ m and 5000 ⁇ m are formed. It is also possible within the scope of the invention to modify the aforementioned sequence of structure generation in such a way that all the coatings mentioned so far are initially on an unstructured Si wafer be carried out over the entire surface and then the known cam structure is produced in FIG. 1 by means of known selective structuring methods.
- the structures thus obtained are shown in plan view along a plane XX of FIG. 1.
- manufacture the optical waveguide 2 from a polymer that can be cured under the influence of UV light.
- a liquid polymer for example PMMA, polycarbonate, UV-curing adhesives or silicon-containing polymers (Cyclotene or ORMOCERE)
- the optical waveguides are structured by means of known photolithographic methods using an appropriately designed mask.
- the exposed areas are crosslinked and hardened by UV irradiation, the unexposed areas are detached again during development, so that the exposed areas remain as optical waveguides 2.
- the cross section of the optical waveguide 2 is to be made largely square, with manufacturing-related deviations being possible, and in the example according to FIG. 2 it is approximately 190 ⁇ m • 190 ⁇ m, the width b of the fingers f is approximately 550-600 ⁇ m, with the optical waveguide 2 should be arranged centrally on the fingers f.
- the optical refractive index of the material for the carrier 1 is lower than that of the polymer to be applied and that it is not absorbent, in the example according to FIG. 2 the additional previous application of an optical buffer layer 13, as shown in FIG . 1, to be dispensed with.
- the structures for the SPR sensors are advantageously produced on the wafer in such a way that the can structures oppose each other before mirroring.
- a subsequent sawing process for separating the comb structures it is necessary to passivate the optical waveguides 2 with the thin metal layers 3, which enable the excitation of surface plasmon, in order to prevent them from being damaged by splinters or the like. to preserve.
- a thick protective coating is applied.
- these recesses 14 can be produced before or after the application of the metal layer 3 mentioned.
- the application is then carried out at least to the areas of the optical waveguides 2 which are formed by the end face 22 in the area of the metal layer 3.
- the reflective coating 4 can be applied, for example, by a renewed coating process, for example sputtering an aluminum or silver layer.
- the entire surface of the wafer is provided with a protective layer prior to the separation process, which guarantees that the structures 2, 3 previously applied are not contaminated during the mirroring of the ends. After the mirror coating, this protective layer is removed.
- this protective layer is removed.
- the individual SPR sensor areas formed by the metal layers 3 are separated from one another by the comb-shaped recesses 14, so that each of the optical waveguides 2 can only be assigned to one sample, for example by immersing them in a complementarily distributed receptacle of a microtiter plate is.
- FIG. 3a shows a perspective view of an SPR sensor according to FIG. 1 or FIG. 2.
- several such strips are stacked one behind the other and, apart from the areas which are provided with the thin metal layer 3 which enables the excitation of surface plasmons, are grasped by a common holding means and are spaced apart from one another such that their spacing, e.g. corresponds to the recesses of an arbitrarily definable microtitre plate format.
- Arrays which can be adapted as desired, for example 8 • 12, as shown in FIG. 3b, can thus be produced by SPR sensors.
- Such an array is advantageously cast into a polymer after assembly in the area that does not carry the SPR-capable metal layer 3 in order to give the SPR waveguide array additional support, as is indicated schematically in FIG. 3 b by a polymer block encapsulation 6 .
- this SPR waveguide array is brought into contact with a microtitre plate which carries the samples to be characterized.
- the SPR waveguide array is introduced into the microtitre plate 7 until the SPR-capable metal regions 3 are completely wetted by a sample 8, as is shown schematically in FIG. 4.
- FIG. 5 Another possible arrangement of the SPR sensors is indicated in FIG. 5.
- the individual SPR sensors are spaced apart by cuvette walls 71, each one
- Optical fiber 9 shown which can be precisely positioned by means of an xy sliding table over the respective end faces of the optical waveguides 2.
- This optical fiber 9 couples light from a white light radiation source (not shown in more detail) into the respective optical waveguide 2, this light being guided to the excitation area of the surface plasmon and subsequently being reflected on the second, mirrored end face.
- the light is coupled out of the optical waveguide 2 via the end face and transferred into the common arm of a fiber splitter, not shown. From there it reaches, for example, a spectrometer (not shown) where it is spectrally evaluated.
- the spectrometer control and data acquisition is computer controlled via a PC.
- Another way of determining the spectrum is to measure the SPR array in transmission.
- a simple optical fiber 9 is used to couple the light into the optical waveguide 2.
- a second optical fiber is positioned at the output of the optical waveguide 2. This leads the light to a grating spectrometer.
- the mirroring of the end face of the optical waveguide 2 is dispensed with.
- the interaction length decreases, i.e. the effective sensor length by 50%. The signal is less pronounced by this factor.
- two coupling points have to be positioned, which increases the apperative and adjustment effort.
- FIGS. 6a and 6b it is provided that the means separating the detection areas of the individual thin metal layers 3 are formed by cuvette walls 15 connected to the planar carrier 1. Both of the above modes of operation are also possible here.
- An embodiment according to FIG. 6a is designed for an inline operating mode; one by Fig. 6b, by applying a mirror 4, for operation in reflection.
- FIG. 6c indicates how an SPR sensor array can be generated by a multiple arrangement, comparable to the stacking of individual cells of FIG. 6a carrying several SPR sensors, as described for FIG. 3b.
- planar carriers 1 are used, which are provided with essentially planar optical fibers, which each have at least one planar SPR-capable metal layer 3 in a sample detection area, each of which represents a sample detection area that is in contact with a sample is feasible. It is also within the scope of the invention to connect the created SPR-compatible areas with open bottoms of flow cells 16, FIG. 7, spaced apart from one another, which have a common inflow 17 and outflow 18. In such an embodiment in particular, one or more of the flow cells formed can be used as reference channels, for example for the compensation of temperature fluctuations.
- the invention speaks of at least one two-dimensional measurement area, this means that the metal layer 3 provided as the sensor area can also be subdivided into several partial areas 31, 32, 33, as indicated in FIG. 1b.
- the SPR sensor according to the invention can also be used in such a way that a single sample is first immobilized on the sensor areas 3. This immobilization serves to provide a chemically modified measuring surface with which another sample, preferably in solution, can interact.
- the immobilized sample one often speaks of ligands, the sample in solution often being referred to as a receptor or analyte.
- the interaction partners are thus, for example, ligand-receptor pairs.
- An SPR sensor according to the present invention then allows the simultaneous measurement of a large number of different samples (analytes). All of the features shown in the description, the subsequent claims and the drawing can be essential to the invention both individually and in a combination with one another. Reference list
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Abstract
Description
SPR-Sensor zur gleichzeitigen Erfassung einer Vielzahl von in fluider Form vorhegenden ProbenSPR sensor for simultaneous detection of a large number of samples in fluid form
Beschreibungdescription
Die Erfindung betrifft einen SPR-Sensor zur gleichzeitigen Erfassung einer Vielzahl von in fluider Form vorliegenden Proben, der eine schnelle Probenerkennung im Rahmen vielfältiger Anwendungszwecke ermöglicht. Insbesondere findet der vorgeschlagene Sensor zur parallelen oder seriellen Erfassung von Proben, die in Mikrotite latten verbracht sind, Verwendung.The invention relates to an SPR sensor for the simultaneous detection of a large number of samples in fluid form, which enables rapid sample recognition in the context of a variety of applications. In particular, the proposed sensor is used for the parallel or serial detection of samples which have been placed in microtite slats.
Durch die weiter vorangetriebene Automatisierung im Bereich der Wirkstoffsuche ist die Fragestellung der Miniaturisierung und Parallelisierung von immer größerem Interesse. Die Miniaturisierung von Probengefäßen und Syntheseapparaturen und die Parallelisierung der ablaufenden Prozesse bedingt eine Vielzahl an zu untersuchenden Substanzen mit immer weniger Volumen. Daher ist es bei der Realisierung neuartiger Detektions- und Sensorsysteme notwendig, diese so auszubilden, daß gleichzeitig mehrere Messungen parallel ablaufen bzw. eine große Anzahl von Proben innerhalb kürzester Zeit hintereinander gemessen werden können und die dafür benötigten Substanzmengen minimiert werden. Eine wichtige Rolle kommt dabei der Erhöhung des Automatisierungsgrades zu. Hintergrund der Erfindung ist die Notwendigkeit auch die für die Messung verwendeten Sensoren in einem parallelen und miniaturisierten Format vorzusehen, so daß die Messungen einer Vielzahl von Proben in kürzester Zeit und mit minimalem Probenvolumen und -verbrauch, realisiert werden können, um damit den Durchsatz an zu charakterisierenden Substanzen zu erhöhen. Es ist eine sehr empfindliche Methode zur Charakterisierung von Grenzflächen bekannt, die als Oberflächenplasmonen-Resonanz- Spektroskopie, üblicherweise als SPR, (Surface Plasmon Resonance) in der Literatur bezeichnet wird. Sie Methode beruht auf der optischen Anregung von Oberflächenplasmonen in dünnen Metallschichten. Diese Methode ist unter anderen nach dem Stand der Technik ausfuhrlich von Striebel, Ch.; Brecht, A.; Gauglitz, G. in Biosensors & Bioelectronics 9 (1994), 139-146 beschrieben. Die Resonanzbedingungen für die Anregung der Oberflächenplasmonen hängen stark von den optischen Eigenschaften des die Metallschicht umgebenden Dielektrikums ab. Die Bestimmung von Brechzahl und Scl ichtdicke dünner dielektrischer Schichten ist grundsätzUch nach dem bekannten Stand der Technik mit einer hohen Genauigkeit möglich.As automation in the area of drug discovery continues to advance, the issue of miniaturization and parallelization is of increasing interest. The miniaturization of sample vessels and synthesis apparatus and the parallelization of the processes taking place necessitate a large number of substances to be investigated with less and less volume. Therefore, when implementing new types of detection and sensor systems, it is necessary to design them in such a way that several measurements run in parallel at the same time or a large number of samples can be measured in succession within a very short time and the quantities of substances required for this are minimized. Increasing the degree of automation plays an important role in this. The background of the invention is the necessity to also provide the sensors used for the measurement in a parallel and miniaturized format, so that the measurements of a large number of samples can be carried out in a very short time and with a minimum sample volume and consumption, in order to increase the throughput characterizing substances to increase. A very sensitive method for characterizing interfaces is known in the literature as surface plasmon resonance spectroscopy, usually called SPR (surface plasmon resonance). The method is based on the optical excitation of surface plasmons in thin metal layers. This method is described in detail by Striebel, Ch .; Brecht, A .; Gauglitz, G. in Biosensors & Bioelectronics 9 (1994), 139-146. The resonance conditions for the excitation of the surface plasmons strongly depend on the optical properties of the dielectric surrounding the metal layer. The determination of refractive index and layer thickness of thin dielectric layers is fundamentally possible with a high degree of accuracy according to the known prior art.
Die SPR-Spektroskopie findet zunehmend z.B. in der biochemischen Analytik Anwendung, da mit mr die direkte Untersuchung der Wechselwirkung zwischen Biomolekülen möglich ist (z.B. Antiköφer/Antigen-Reaktionen). Dazu wird ein Reaktionspartner (Ligand) auf der Metalloberfläche immobilisiert, der andere Reaktionspartner (Analyt) wird in Lösung über die Oberfläche geleitet. Die Wechselwirkung ist als Schichtdickenzuwachs über die Brechzahländerung direkt nachweisbar. Herkömmliche SPR-Sensoren (vgl. Produktbeschreibung der Fa. Biacore AB, Rapsgatan 7, S-75450 Uppsala, Schweden 1996) verwenden ein Prisma, das eine dünne Metallschicht trägt. Die zu messende Probe wird mit dem Metall bzw. der modifizierten Metalloberfläche in Kontakt gebracht, und das SPR-Reflexionsspektrum der Probe wird durch Einkoppeln von Licht und Messen der Intensität des reflektierten Lichts als Funktion des Einfallswinkels oder der Wellenlänge gemessen.SPR spectroscopy is increasingly used e.g. in biochemical analysis, because with mr the direct investigation of the interaction between biomolecules is possible (e.g. antibodies / antigen reactions). For this purpose, one reaction partner (ligand) is immobilized on the metal surface, the other reaction partner (analyte) is passed over the surface in solution. The interaction is directly detectable as an increase in layer thickness via the change in refractive index. Conventional SPR sensors (see product description from Biacore AB, Rapsgatan 7, S-75450 Uppsala, Sweden 1996) use a prism that carries a thin metal layer. The sample to be measured is brought into contact with the metal or the modified metal surface, and the SPR reflection spectrum of the sample is measured by coupling light and measuring the intensity of the reflected light as a function of the angle of incidence or the wavelength.
Neuere Verfahren und Vorrichtungen (WO 94/16312) nutzen faseroptische Elemente, um einen SPR-Sensor aufzubauen. Dabei werden kommerzielle Lichtleitfasern mit Durchmessern zwischen 1 μm bis 2000 μm verwendet. Die Fasern werden an ihren Enden oder anderen definierten Bereichen freigelegt, das heißt, die vorhandene Ummantelung, bestehend aus Wellenleitermantel und Pufferschicht, wird mechanisch, chemisch oder thermisch entfernt. Anschließend werden die Fasern radial oder partiell radial mit einer Metallschicht versehen und im Fall eines auf Endreflexion basierenden faseroptischen Sensors wird zusätzlich die Stirnseite der Faser verspiegelt. An die radiale Beschichtung werden dabei sehr hohe Anforderungen hinsichtlich der Schichtdickenhomogenität gestellt, die technologisch nur mit einem großem Aufwand realisierbar ist. Ein weiterer Nachteil bei der Verwendung von Lichtleitfasern ist besonders die begrenzte Möglichkeit einer Parallelisierung, da immer einzelne Lichtleitfasern manuell zu einem Array angeordnet werden müssen.Newer methods and devices (WO 94/16312) use fiber optic elements to build an SPR sensor. Commercial optical fibers with diameters between 1 μm and 2000 μm are used. The fibers are exposed at their ends or other defined areas, that is, the existing sheathing, consisting of waveguide sheath and buffer layer, is removed mechanically, chemically or thermally. The fibers are then provided with a metal layer radially or partially radially, and in the case of a fiber-optic sensor based on end reflection, the end face of the fiber is additionally mirrored. The radial coating is subject to very high requirements with regard to the layer thickness homogeneity, which can only be achieved technologically with great effort. A further disadvantage when using optical fibers is in particular the limited possibility of parallelization, since individual optical fibers must always be arranged manually in an array.
Es ist Aufgabe der vorliegenden Erfindung, emen SPR-Sensor zur gleichzeitigen Erfassung einer Vielzahl von in fluider Form vorliegenden Proben anzugeben, der zu einem vorgebbaren Array anordenbar ist, wobei die SPR-Sensoren mittels einer vereinheithchten Technologie und kostengünstiger als solche nach dem bekannten Stand der Technik herstellbar sein sollen.It is an object of the present invention to provide an SPR sensor for the simultaneous detection of a large number of samples in fluid form, which can be arranged in a predeterminable array, the SPR sensors using a unified technology and more cost-effectively than those according to the known state of the art Technology should be producible.
Die Aufgabe wird durch die kennzeichnenden Merkmale des ersten Patentanspruchs gelöst. Vorteilhafte Ausgestaltungen sind Gegenstand der nachgeordneten Ansprüche.The object is achieved by the characterizing features of the first claim. Advantageous refinements are the subject of the subordinate claims.
Die Erfindung bedient sich zur Lösung der Aufgabe planarer Wellenleiter, die jeweils mit mindestens einem SPR-Sensorgebiet versehen sind. SPR-Sensoren nach der Erfindung sind parallel anordenbar und können gleichzeitig mit einer großen Anzahl von Proben (größer 100) in Kontakt gebracht werden.The invention makes use of the task of planar waveguides, which are each provided with at least one SPR sensor area. SPR sensors according to the invention can be arranged in parallel and can simultaneously be brought into contact with a large number of samples (greater than 100).
Die dabei verwendeten planaren Wellenleiter führen das Anregungslicht zu dem Sensorgebiet, welches das Meßprinzip der Oberflächenplasmonenresonanz verwendet, um eine mit dem Sensor in Kontakt gebrachte Lösung zu charakterisieren. Dabei wird mit jedem Sensorgebiet genau eine Probe in Kontakt gebracht, so daß mit einem SPR-Wellenleiterarray bestehend aus n-Wellenleitern n-verschiedene Proben charakterisierbar sind.The planar waveguides used lead the excitation light to the sensor area, which uses the measuring principle of surface plasmon resonance to characterize a solution that has been brought into contact with the sensor. Exactly one sample is brought into contact with each sensor area, so that n-different samples can be characterized with an SPR waveguide array consisting of n waveguides.
Ein SPR-Wellenleiterarray soll mittels Technologien der Halbleiterfertigung und integrierten Optik hergestellt werden, um eine große Anzahl von Sensoren parallel bereitzustellen und in einem definierten Abstand zueinander anzuordnen.An SPR waveguide array is to be manufactured using technologies from semiconductor production and integrated optics in order to provide a large number of sensors in parallel and to arrange them at a defined distance from one another.
Die Erfindung ermöglicht weiterhin, die SPR-Wellenleiterarrays in Probenhalter, z. B. Mikrotiterplatten, zu integrieren. Dabei sollen die SPR-Wellenleiterarrays an bereits vorhandene Formate von Mikrotiterplatten (96, 386, 1536, etc.) als auch an davon abweichende oder neu entwickelte Formate anpaßbar sein. Planare Wellenleiter finden immer breitere Beachtung in Forschung und Entwicklung auf dem Gebiet der integrierten Optik. Für die Herstellung wird eine lichtleitende Schicht flächig auf einem Trägermaterial aufgebracht. Der Brechungsindex des Trägermaterials oder einer darauf zu diesem Zweck vorzusehenden Schicht muß kleiner sein, als der der wellenleitenden Schicht, um eine nahezu verlustfreie Führung des Lichtes im Wellenleiter zu garantieren. Die Herstellung solcher flächiger Wellenleiter erfolgt mit bekannten Technologien der Halbleitertechnik und integrierten Optik, wie z.B. CVD-Prozessen, Sputtern, Elektronenstrahlverdampfen, Aufschleudern oder verschiedener Replikationstechniken. Mit bekannten mikrotechnischen Verfahren ist auch eine Herstellung fein strukturierter Wellenleiter und -verzweiger möglich. Dabei sind über verschiedenste Strukturierungsverfahren Wellenleiter mit Dicken im Bereich weniger Mikrometer bis einige 100 μm und Breiten bis einige 1000 μm herstellbar. Die Beschichtung definierter Wellenleiterabschnitte mit einer SPR-fähigen Schicht kann ebenfalls mit bekannten Technologien parallel in wenigen Schritten vorgenommen werden. Ein SPR-Sensor nach vorliegender Erfindung besteht aus mehreren planaren streifenförmigen Lichtwellenleitern, die jeweils zwischen zwei Stirnflächen mindestens ein zweidimensionales Meßgebiet aufweisen. Diese Meßgebiete sind mit einer SPR-fähigen planaren Metallschicht versehen, die sowohl mit dem wellenleitenden Material als auch der zu charakterisierenden Probe in direktem Kontakt steht. Das Anregungslicht gelangt über bekannte Koppelmechanismen in den Lichtwellenleiter. Dort breitet sich das Licht entlang des Wellenleiters aus und wird zum Sensorgebiet geführt. Im Sensorbereich wird durch die Anregung von Oberflächenplasmonen das im Lichtwellenleiter geführte Licht beeinflußt. Im weiteren Verlauf wird das modifizierte Licht entweder direkt nach dem Durchlaufen der Sensorregion aus dem Lichtwellenleiter über die bekannten Koppelprinzipien ausgekoppelt und der weiteren Verarbeitung zugeführt, oder es wird durch eine an der Stirnfläche angebrachten reflektierenden Beschichtung im Lichtwellenleiter in sich reflektiert und über den selben Koppelmechanismus, über den das Licht in den Lichtwellenleiter gelangte, wieder ausgekoppelt und so der weiteren Verarbeitung zugeführt.The invention further enables the SPR waveguide arrays in sample holders, e.g. B. integrate microtiter plates. The SPR waveguide arrays should be adaptable to existing formats of microtiter plates (96, 386, 1536, etc.) as well as to different or newly developed formats. Planar waveguides are receiving increasing attention in research and development in the field of integrated optics. For the production, a light-guiding layer is applied to a surface of a carrier material. The refractive index of the carrier material or a layer to be provided thereon for this purpose must be smaller than that of the waveguiding layer in order to guarantee an almost loss-free guidance of the light in the waveguide. Such flat waveguides are manufactured using known semiconductor technology and integrated optics, such as CVD processes, sputtering, electron beam evaporation, spin coating or various replication techniques. Known microtechnical processes also make it possible to produce finely structured waveguides and splitters. Waveguides with thicknesses in the range of a few micrometers to a few 100 μm and widths up to a few 1000 μm can be produced using a wide variety of structuring processes. The coating of defined waveguide sections with an SPR-capable layer can also be carried out in parallel in a few steps using known technologies. An SPR sensor according to the present invention consists of several planar strip-shaped optical waveguides, each of which has at least one two-dimensional measurement area between two end faces. These measuring areas are provided with an SPR-capable planar metal layer which is in direct contact with both the wave-guiding material and the sample to be characterized. The excitation light reaches the optical waveguide via known coupling mechanisms. There the light spreads along the waveguide and is guided to the sensor area. In the sensor area, the excitation of surface plasmons influences the light guided in the optical waveguide. In the further course, the modified light is either decoupled from the optical waveguide directly after passing through the sensor region via the known coupling principles and passed on for further processing, or it is reflected in itself by a reflective coating on the end face in the optical waveguide and via the same coupling mechanism, through which the light enters the optical fiber reached, decoupled again and thus passed on for further processing.
Im Fall der Ein- und Auskopplung des Lichtes an ein- und derselben Seite des Lichtwellenleiters und Reflexion der Strahlung an dem anderen Ende, handelt es sich um planare SPR-Wellenleiter auf der Basis der Endreflexion. Tritt das eingekoppelte Licht an der zweiten Seite des Wellenleiters aus, spricht man von einem Wellenleitersensor auf Inline-Transmissionsbasis.In the case of the coupling and decoupling of the light on one and the same side of the optical waveguide and reflection of the radiation at the other end, these are planar SPR waveguides based on the final reflection. If the coupled light emerges on the second side of the waveguide, one speaks of a waveguide sensor based on inline transmission.
Die Erfindung soll nachstehend anhand schematischer Ausfuhrungsbeispiele näher erläutert werden. Es zeigen:The invention will be explained in more detail below with the aid of schematic exemplary embodiments. Show it:
Fig. 1 eine erste Ausführungsmöglichkeit eines zu einem Array ausbaubaren emdimensionalen SPR-Sensors, Fig. la eine Draufsicht auf den SPR-Sensor nach Fig. 1 in einer1 shows a first possible embodiment of an emdimensional SPR sensor that can be expanded into an array, FIG. 1 a shows a top view of the SPR sensor according to FIG
Ebene X-X, Fig. lb einen Ausschnitt aus Fig. 1,Plane X-X, FIG. 1b a section from FIG. 1,
Fig. 2 eine zweite Ausfulιrungsmögliclτkeit eines SPR-Sensors, die im wesentlichen analog zu Fig. 1 ausgebildet ist, Fig. 3a eine perspektivische Ansicht eines SPR-Sensors nach Fig. 1 oder Fig. 2, Fig. 3b eine Anordnung mehrerer SPR-Sensoren nach Fig. 3a zurFIG. 2 shows a second embodiment of an SPR sensor which is essentially analogous to FIG. 1, FIG. 3a shows a perspective view of an SPR sensor according to FIG. 1 or FIG. 2, FIG. 3b shows an arrangement of several SPR sensors 3a to
Bildung eines Arrays, Fig. 4 eine Einbringui gsmöglicl keit eines kammartig ausgebüdeten SPR-Sensor-Arrays bestehend aus planaren SPR-Sensoren nach den Fig. 1 oder 2 in eine Mikrotiteφlatte in einer Schnittdarstellung, Fig. 5 eine Anordnungsmöglichkeit von SPR-Sensoren, wobei deren gegenseitige Beabstandung durch Küvettenwände gebildet ist, Fig. 6a eine Anordnungsmögüchkeit eines SPR-Sensors, wobei der einzelne Sensor zusätzlich von Küvettenwandungen erfaßt ist, Fig. 6b eine weitere Ausbildungsmöglichkeit eines SPR-Sensor- Arrays nach Fig. 6a, Fig. 6c eine Mehrfachanordnung einer Ausbildung nach Fig.6a und Fig. 7 eine weitere Ausbildungsmöghchkeit nach Fig.6b. In Figur 1 ist in einem ersten Ausfuhrungsbeispiel ein SPR-Sensor in einem Teilausschnitt dargestellt. Dabei sind auf einem planaren Träger 1 mehrere streifenförmige Lichtwellenleiter 2, die zueinander in einem definierten Abstand angeordnet sind, derart vorgesehen, daß sie mit Ihren Stirnflächen 21, 22 mit den Seiten 11, 12 des planaren Trägers 1 bündig abschließen, wobei jeder der streifenförmigen Lichtwellenleiter 2 in einem Abschnitt, der mit den zu analysierenden, in Fig. 1 nicht dargestellten fluiden Proben in Kontakt zu bringen ist, mit einer die Anregung von Oberflächenplasmonen ermöglichenden dünnen Metallschicht 3 versehen ist. Im Beispiel nach Fig. 1 ist dabei von einem in der Halbleitertechnik eingesetzten 4"-Siliziumwafer ausgegangen, in den zunächst die Strukturen mehrerer planarer Träger 1 übertragen und strukturiert worden sind. Dabei sind in den Wafer lange, schmale rechteckige Öffnungen strukturiert, die nach erfolgter Vereinzelung die in Fig. 1 dargestellten kaniniförmigen Ausnehmungen 14 bilden. Eine dafür im Beispiel zum Einsatz gelangende Maske soll in ihrer Geometrie so gestaltet sein, daß die nach ihrer Vereinzelung entstehenden Karnmsrrukturen in Mikrotiterplatten vom 1536er Format (32 • 48 Kavitäten) eingetaucht werden können. Es ist ersichtlich, daß davon in Fig. 1 nur ein Ausschnitt gezeigt ist. Um eine möglichst große Stabilität der einzehien Träger 1 zu gewährleisten, ist ein Silizium- Wafer mit einer Kristall-Orientierung (110) ausgewählt, der es ermöglicht, rechteckige Freiräume mit senkrechten Kanten an wenigstens zwei Kanten zu strukturieren. Anschließend wird der strukturierte Wafer, im Beispiel mittels PE-CVD Verfahren, mit S >2 beschichtet. Diese Siθ2-Schicht dient als optischer Puffer zwischen den vorgesehenen Lichtwellenleitern 2 und dem Si-Substrat. Die Lichtwellenleiter nach Fig. 1 bestehen aus einer Siliziumoxynitrid- Schicht, die bspw eine Dicke von etwa 10 μm aufweisen. Die Formgebung der Lichtwellenleiter 2 im Sinne vorliegender Erfindung erfolgt durch einen üblichen Trockenätzprozeß der Siliziumoxynitrid-Schicht derart, daß parallele Streifen mit Breiten zwischen 10 μm bis 2000 μm und Abständen zwischen 10 μm und 5000 μm entstehen. Auch ist es im Rahmen der Erfindung möglich, vorgenannte Reüienfolge der Strukturerzeugungen derart abzuwandeln, daß auf einem unstrukturierten Si- Wafer zunächst alle bislang genannten Beschichtungen ganzflächig vorgenommen werden und daran anschließend vermittels bekannter selektiver Slrukturierungsverfahren die in Fig. 1 ersichtliche Karnmstruktur erzeugt wird. In Figur la sind die so erhaltenen Strukturen in Draufsicht entlang einer Ebene X-X nach Fig. 1 dargestellt. Ebenso liegt es im Rahmen der Erfindung, die Lichtwellenleiter 2 aus einem unter UV-Lichteinwirkung aushärtbarem Polymer zu fertigen. Dazu wird ein flüssiges Polymer, z.B. PMMA, Polycarbonat, UV-härtende Klebstoffe oder siliziumhaltige Polymere (Cyclotene oder ORMOCERE), auf den Wafer aufgeschleudert oder vergossen. Die Stiυkturierung der Lichtwellenleiter erfolgt mittels bekannter fotolithografischer Verfahren vermittels einer entsprechend ausgeführten Maske. Durch eine UV-Bestrallung werden die belichteten Bereiche vernetzt und verhärtet, die unbelichteten Bereiche werden beim Entwickeln wieder herausgelöst, so daß die belichteten Bereiche als Lichtwellenleiter 2 verbleiben.Formation of an array, FIG. 4 shows a possibility of inserting a comb-like, sprinkled SPR sensor array consisting of planar SPR sensors according to FIGS. 1 or 2 into a microtitre plate in a sectional view, FIG. 5 shows a possible arrangement of SPR sensors, whereby the mutual spacing of which is formed by cuvette walls, FIG. 6a shows a possible arrangement of an SPR sensor, the individual sensor being additionally detected by cuvette walls, FIG. 6b shows a further embodiment of an SPR sensor array according to FIG. 6a, FIG. 6c shows a multiple arrangement a training according to Fig. 6a and Fig. 7 a further training possibility according to Fig. 6b. FIG. 1 shows a partial section of an SPR sensor in a first exemplary embodiment. In this case, a plurality of strip-shaped optical waveguides 2, which are arranged at a defined distance from one another, are provided on a planar carrier 1 in such a way that their end faces 21, 22 are flush with the sides 11, 12 of the planar carrier 1, each of the strip-shaped optical waveguides 2, in a section which is to be brought into contact with the fluid samples to be analyzed, which are not shown in FIG. 1, is provided with a thin metal layer 3 which enables the excitation of surface plasmons. In the example according to FIG. 1, a 4 "silicon wafer used in semiconductor technology has been assumed, in which the structures of a plurality of planar carriers 1 have first been transferred and structured. Long, narrow rectangular openings have been structured in the wafer 1. The canine-shaped recesses 14 shown in Fig. 1. The geometry of a mask used for this purpose in the example is to be designed in such a way that the carcinoma structures that arise after it has been separated can be immersed in 1536-format microtiter plates (32-48 cavities). It can be seen that only a section of this is shown in Fig. 1. In order to ensure the greatest possible stability of the individual carriers 1, a silicon wafer with a crystal orientation (110) is selected, which makes it possible to have rectangular free spaces structure vertical edges on at least two edges structured wafers, in the example using the PE-CVD process, coated with S> 2 . This SiO 2 layer serves as an optical buffer between the optical fibers 2 provided and the Si substrate. 1 consist of a silicon oxynitride layer which, for example, has a thickness of approximately 10 μm. The shaping of the optical waveguide 2 in the sense of the present invention is carried out by a customary dry etching process of the silicon oxynitride layer in such a way that parallel strips with widths between 10 μm to 2000 μm and distances between 10 μm and 5000 μm are formed. It is also possible within the scope of the invention to modify the aforementioned sequence of structure generation in such a way that all the coatings mentioned so far are initially on an unstructured Si wafer be carried out over the entire surface and then the known cam structure is produced in FIG. 1 by means of known selective structuring methods. In Figure la, the structures thus obtained are shown in plan view along a plane XX of FIG. 1. It is also within the scope of the invention to manufacture the optical waveguide 2 from a polymer that can be cured under the influence of UV light. For this purpose, a liquid polymer, for example PMMA, polycarbonate, UV-curing adhesives or silicon-containing polymers (Cyclotene or ORMOCERE), is spun onto or cast onto the wafer. The optical waveguides are structured by means of known photolithographic methods using an appropriately designed mask. The exposed areas are crosslinked and hardened by UV irradiation, the unexposed areas are detached again during development, so that the exposed areas remain as optical waveguides 2.
Der Querschnitt der Lichtwellenleiter 2 soll weitestgehend quadratisch ausgeführt sein, wobei herstellungsbedingt Abweichungen auftreten können, und beträgt im Beispiel nach Fig. 2 etwa 190 μm • 190 μm, die Breite b der Finger f beträgt ca. 550 - 600 μm, wobei die Lichtwellenleiter 2 mittig auf den Fingern f angeordnet sein sollen.The cross section of the optical waveguide 2 is to be made largely square, with manufacturing-related deviations being possible, and in the example according to FIG. 2 it is approximately 190 μm • 190 μm, the width b of the fingers f is approximately 550-600 μm, with the optical waveguide 2 should be arranged centrally on the fingers f.
Mit einer solchen Dimensionierung wird eine weitestgehende Anpassung an Lichtleitfasern, auf die weiter nachstehend eingegangen wird, mit gängigen Durchmessern von 200 μm gewährleistet. Die Länge h der die Finger f beinhaltenden Abschnitte beträgt im Beispiel 5 mm.Such a dimensioning ensures the greatest possible adaptation to optical fibers, which will be discussed further below, with common diameters of 200 μm. The length h of the sections containing the fingers f is 5 mm in the example.
Unter der Voraussetzung, daß die optische Brechzahl des Materials für den Träger 1 kleiner ist, als die des aufzutragenden Polymers, und daß es nicht absorbierend ist, kann im Beispiel nach Fig. 2 auf die zusätzliche vorherige Aufbringung einer optischen Pufferschicht 13, wie in Fig. 1, verzichtet werden.Provided that the optical refractive index of the material for the carrier 1 is lower than that of the polymer to be applied and that it is not absorbent, in the example according to FIG. 2 the additional previous application of an optical buffer layer 13, as shown in FIG . 1, to be dispensed with.
Ebenso können auch andere Polymere Verwendung finden, die bspw. durch Prägen oder andere Replikationstechniken in die gewünschte Streifenform gebracht werden, wobei das verbleibende Material an den Stellen, an denen kein Licht geführt werden soll, in seiner Dicke unter der kritischen Cut-off-Dicke liegen muß. Nach der vorstehend beschriebenen Strukturierung der streifenförmigen Lichtwellenleiter wird in beiden bislang beschriebenen Ausführungsformen der gesamte Wafer durch eine Abdeckung bis auf die Bereiche geschützt, die die SPR-fähige Metallschicht 3 tragen sollen. Danach werden diese freiliegenden Bereiche mit der SPR- fähigen Metallage, z.B. mit einer dünnen Goldschicht mittels Sputtern, beschichtet und im Anschluß daran werden die abgedeckten, übrigen Gebiete von der Schutzschicht befreit.Likewise, other polymers can also be used, which are brought into the desired strip shape, for example by embossing or other replication techniques, the remaining material at the points where no light is to be guided in its thickness below the critical cut-off thickness must lie. After the structuring of the strip-shaped optical waveguides described above, the entire wafer is protected in both embodiments described so far by a cover except for the areas that are intended to carry the SPR-capable metal layer 3. Then these exposed areas are coated with the SPR-capable metal layer, for example with a thin gold layer by means of sputtering, and then the covered, remaining areas are freed from the protective layer.
Vorteilhafterweise werden auf dem Wafer die Strukturen für die SPR-Sensoren so erzeugt, daß sich vor dem Vereinzeln die Kanimstrukturen spiegelbüdlich gegenüberstehen. Für einen folgenden Sägeprozeß zur Vereinzelung der Kammstrukturen ist es notwendig, die Lichtwellenleiter 2 mit den die Anregung von Oberflächenplasmonen ermöghchenden dünnen Metallschichten 3 zu passivieren, um diese vor Beschädigungen durch Splitter o.a. zu bewahren. Dazu wird eine dicke Lackschutzschicht aufgebracht. Danach erfolgt ein Trennprozeß, z.B. durch Sägen, wodurch die gewünschten Kammstrukturen erhalten werden und die Stirnflächen 21, 22, über das Licht in die Lichtwellenleiter ein- bzw. auskoppelbar ist, erzeugt.The structures for the SPR sensors are advantageously produced on the wafer in such a way that the can structures oppose each other before mirroring. For a subsequent sawing process for separating the comb structures, it is necessary to passivate the optical waveguides 2 with the thin metal layers 3, which enable the excitation of surface plasmon, in order to prevent them from being damaged by splinters or the like. to preserve. For this, a thick protective coating is applied. Then there is a separation process, e.g. by sawing, as a result of which the desired comb structures are obtained and the end faces 21, 22, via which light can be coupled into and out of the optical waveguide, are produced.
Je nach verwendeter Technologie zum Einbringen der kammartigen Ausnehmungen in den Trägerkörper 1, können diese Ausnehmungen 14 vor oder nach dem Aufbringen genannter Metallschicht 3 erzeugt werden. In den Beispielen nach den Figuren 1 und 2 erfolgt anschließend die Aufbringung zumindest auf die Bereiche der Lichtwellenleiter 2, die durch die im Bereich der Metallschicht 3 hegenden Stirnfläche 22 gebildet sind. Die Aufbringung der reflektierenden Beschichtung 4 kann zum Beispiel durch einen erneuten Beschichtungsprozeß, z.B. Sputtern einer Aluminium- oder Silberschicht, erfolgen. Dafür wird der Wafer vor dem Trennprozeß ganzflächig mit einer Schutzschicht versehen, die garantiert, daß während der Verspiegelung der Enden die vorher aufgebrachten Strukturen 2, 3 nicht verunreinigt werden. Nach der Verspiegelung wird diese Schutzschicht entfernt. In den Beispielen nach den Figuren 1 und 2 sind die einzelnen durch die Metallschichten 3 gebildeten SPR-Sensorbereiche durch die kammförmigen Ausnehmungen 14 voneinander getrennt, so daß jeder der Lichtwellenleiter 2, z.B. durch Eintauchen in komplementär verteilt angeordnete Aufnahmen einer Mikrotiteφlatte, nur einer Probe zuordenbar ist.Depending on the technology used to introduce the comb-like recesses into the carrier body 1, these recesses 14 can be produced before or after the application of the metal layer 3 mentioned. In the examples according to FIGS. 1 and 2, the application is then carried out at least to the areas of the optical waveguides 2 which are formed by the end face 22 in the area of the metal layer 3. The reflective coating 4 can be applied, for example, by a renewed coating process, for example sputtering an aluminum or silver layer. For this purpose, the entire surface of the wafer is provided with a protective layer prior to the separation process, which guarantees that the structures 2, 3 previously applied are not contaminated during the mirroring of the ends. After the mirror coating, this protective layer is removed. In the examples according to FIGS. 1 and 2, the individual SPR sensor areas formed by the metal layers 3 are separated from one another by the comb-shaped recesses 14, so that each of the optical waveguides 2 can only be assigned to one sample, for example by immersing them in a complementarily distributed receptacle of a microtiter plate is.
In Figur 3a ist eine perspektivische Ansicht eines SPR-Sensors nach Fig. 1 oder Fig. 2 dargestellt. Zur Realisierung eines Arrays von Sensoren werden mehrere derartiger Streifen hintereinander gestapelt angeordnet und abseits der Bereiche, die mit der die Anregung von Oberflächenplasmonen ermöglichenden dünnen Metallschicht 3 versehen sind, von einem gemeinsamen Haltemittel erfaßt und voneinander derart beabstandet sind, daß ihre Beabstandung bspw. dem Abstand der Ausnehmungen eines beliebig vorgebbaren Mikrotiteφlattenformats entspricht. Damit sind beliebig anpaßbare Arrays, bspw. 8 • 12, wie nach Fig. 3b, von SPR-Sensoren herstellbar. Ein solches Array wird vorteilhafterweise nach der Montage in dem Bereich, der nicht die SPR-fähige Metallschicht 3 trägt, in ein Polymer eingegossen, um dem SPR-Wellenleiterarray zusätzlichen Halt zu geben, wie es in Fig. 3b schematisch durch einen Polymerblockverguß 6 angedeutet ist. Dieses SPR-Wellenleiterarray wird für Messungen mit einer Mikrotiteφlatte, die die zu charakterisierenden Proben trägt, in Kontakt gebracht. Dabei wird zur Erzielung einer optimalen Messung das SPR-Wellenleiterarray soweit in die Mikrotiteφlatte 7 eingebracht, bis die SPR-fähigen Metallbereiche 3 von einer Probe 8 vollständig benetzt werden, wie es schematisch in Fig. 4 dargestellt ist.FIG. 3a shows a perspective view of an SPR sensor according to FIG. 1 or FIG. 2. In order to implement an array of sensors, several such strips are stacked one behind the other and, apart from the areas which are provided with the thin metal layer 3 which enables the excitation of surface plasmons, are grasped by a common holding means and are spaced apart from one another such that their spacing, e.g. corresponds to the recesses of an arbitrarily definable microtitre plate format. Arrays which can be adapted as desired, for example 8 • 12, as shown in FIG. 3b, can thus be produced by SPR sensors. Such an array is advantageously cast into a polymer after assembly in the area that does not carry the SPR-capable metal layer 3 in order to give the SPR waveguide array additional support, as is indicated schematically in FIG. 3 b by a polymer block encapsulation 6 . For measurements, this SPR waveguide array is brought into contact with a microtitre plate which carries the samples to be characterized. In order to achieve an optimal measurement, the SPR waveguide array is introduced into the microtitre plate 7 until the SPR-capable metal regions 3 are completely wetted by a sample 8, as is shown schematically in FIG. 4.
Ein weitere Anordnungsmöglichkeit der SPR-Sensoren ist in Figur 5 angedeutet. In diesem Beispiel erfolgt die gegenseitige Beabstandung der einzelnen SPR-Sensoren durch Küvettenwände 71, die jeweils einenAnother possible arrangement of the SPR sensors is indicated in FIG. 5. In this example, the individual SPR sensors are spaced apart by cuvette walls 71, each one
Finger f genannter Kammstruktur umfassen. In diesem Beispiel ist einInclude fingers f of said comb structure. In this example there is a
SPR-Array nach dem Endreflektionsprinzip eingesetzt.SPR array used according to the end reflection principle.
In den Beispielen nach den Figuren 4 und 5 ist weiterhin eine externeIn the examples according to FIGS. 4 and 5 there is also an external one
Lichtleitfaser 9 dargestellt, die vermittels eines xy- Verschiebetisches über die jeweiligen stirnseitigen Endflächen der Lichtwellenleiter 2 präzise positionierbar. Dabei koppelt diese Lichtleitfaser 9 Licht einer nicht näher dargestellten Weißlichtstrahlungsquelle in den jeweiligen Lichtwellenleiter 2 ein, wobei dieses Licht zum Anregungsbereich der Oberflächenplasmonen geführt und anschließend an der zweiten, verspiegelten Stirnfläche reflektiert wird. Nachdem das geführte Licht den Anregungsbereich das zweite Mal nach der Reflexion passiert hat, wird das Licht aus dem Lichtwellenleiter 2 über die Stirnfläche ausgekoppelt und in den gemeinsamen Arm eines nicht dargestellten Faserverzweigers überfuhrt. Von dort gelangt es bspw. in ein nicht dargestelltes Spektrometer, wo es spektral ausgewertet wird. Die Spektrometersteuerung und die Datenerfassung erfolgt computergesteuert über ein PC.Optical fiber 9 shown, which can be precisely positioned by means of an xy sliding table over the respective end faces of the optical waveguides 2. This optical fiber 9 couples light from a white light radiation source (not shown in more detail) into the respective optical waveguide 2, this light being guided to the excitation area of the surface plasmon and subsequently being reflected on the second, mirrored end face. After the guided light has passed the excitation area the second time after the reflection, the light is coupled out of the optical waveguide 2 via the end face and transferred into the common arm of a fiber splitter, not shown. From there it reaches, for example, a spectrometer (not shown) where it is spectrally evaluated. The spectrometer control and data acquisition is computer controlled via a PC.
Eine weitere Möglichkeit der Bestimmung des Spektrums besteht darin, das SPR-Array in Transmission zu vermessen. An Stelle eines Faserverzweigers wird eine einfache Lichtleitfaser 9 zur Einkopplung des Lichtes in den Lichtwellenleiter 2 benutzt. Am Ausgang des Lichtwellenleiters 2 wird eine zweite Lichtleitfaser positioniert. Diese führt das Licht zu einem Gitterspektrometer. Bei einer derartigen Konfiguration wird auf die Verspiegelung der Endfläche des Lichtwellenleiters 2 verzichtet. Allerdings verringert sich die Wechselwirkungslänge, d.h. die effektive Sensorlänge um 50 %. Das Signal ist um diesen Faktor weniger ausgeprägt. Zum anderen müssen zwei Koppelstellen positioniert werden, wodurch sich der apperative und der Justageaufwand erhöhen.Another way of determining the spectrum is to measure the SPR array in transmission. Instead of a fiber splitter, a simple optical fiber 9 is used to couple the light into the optical waveguide 2. A second optical fiber is positioned at the output of the optical waveguide 2. This leads the light to a grating spectrometer. With such a configuration, the mirroring of the end face of the optical waveguide 2 is dispensed with. However, the interaction length decreases, i.e. the effective sensor length by 50%. The signal is less pronounced by this factor. On the other hand, two coupling points have to be positioned, which increases the apperative and adjustment effort.
Je nach eingesetzter Meß- und Rechentechnik ist aber ebenso möglich, jedem der vorgesehenen Lichtwellenleiter 2 eine Lichtleitfaser 9 zuzuordnen, wodurch eine simultane Auswertung aller eingesetzten Proben ermöglicht ist.Depending on the measuring and computing technology used, however, it is also possible to assign an optical fiber 9 to each of the optical waveguides 2 provided, which enables a simultaneous evaluation of all the samples used.
In zwei weiteren Ausführungsformen nach den Figur 6a und 6b ist vorgesehen, daß die die Erfassungsbereiche der einzehien dünnen Metallschichten 3 voneinander trennenden Mittel durch mit den planaren Träger 1 verbundene Küvettenwandungen 15 gebildet sind. Auch dabei sind beide vorgenannte Betriebsweisen möglich. So ist eine Ausführung nach Fig. 6a für eine Inline-Betriebsweise ausgelegt; eine nach Fig. 6b, durch Aufbringung einer Verspiegelung 4, für den Betrieb in Reflexion. In Figur 6c ist angedeutet, wie durch eine Mehrfachanordnung, vergleichbar der zu Fig. 3b beschrieben Stapelung von einzelnen, mehrere SPR-Sensoren tragenden ZeÜen nach Fig. 6a, ein SPR-Sensor-Array erzeugbar ist.In two further embodiments according to FIGS. 6a and 6b, it is provided that the means separating the detection areas of the individual thin metal layers 3 are formed by cuvette walls 15 connected to the planar carrier 1. Both of the above modes of operation are also possible here. An embodiment according to FIG. 6a is designed for an inline operating mode; one by Fig. 6b, by applying a mirror 4, for operation in reflection. FIG. 6c indicates how an SPR sensor array can be generated by a multiple arrangement, comparable to the stacking of individual cells of FIG. 6a carrying several SPR sensors, as described for FIG. 3b.
Die Erfindung ist nicht auf die dargestellten Ausführungsbeispiele beschränkt. Wesentlich ist in jedem Fall, daß planare Träger 1 zum Einsatz gelangen, die mit im wesentlichen planaren Lichtwellenleitern versehen sind, welche in einem Probenerfassungsgebiet jeweils mindestens eine planare SPR-fahige Metallschicht 3 aufweisen, die jeweils ein Probenerfassungsgebiet darstellt, das mit einer Probe in Kontakt bringbar ist. Auch liegt es im Rahmen der Erfindung, die geschaffenen SPR-fähigen Bereiche mit offenen Böden voneinander beabstandeter Durchflußküvetten 16, Fig. 7, in Verbindung zu bringen, die einen gemeinsamen Zufluß 17 und Abfluß 18 aufweisen. Insbesondere bei einer derartigen Ausführungsform können einer oder mehrere der gebildeten Durchflußküvetten als Referenzkanäle, bspw. für die Kompensation von Temperaturschwankungen, verwendet werden. Wenn im Rahmen der Erfindung von mindestens einem zweidimensionalen Meßgebiet die Rede ist, ist darunter zu verstehen, daß die als Sensorgebiet vorgesehenen Metallschicht 3 auch in mehrere Teilgebiete 31, 32, 33 unterteilbar ist, wie es in Fig. lb angedeutet ist. Ebenso ist der erfindungsgemäße SPR-Sensor derart verwendbar, daß zunächst eine einzige Probe auf den Sensorgebieten 3 immobilisiert wird. Diese Immobilisierung dient der Bereitstellung einer chemisch modifizierten Meßoberfläche, mit der eine weitere Probe, bevorzugt in Lösung, wechselwirken kann. Im Falle der immobilisierten Probe spricht man häufig von Liganden, wobei die Probe in Lösung häufig als Rezeptor oder Analyt bezeichnet wird. Die Interaktionspartner sind somit beispielsweise Ligand-Rezeptor Paare. Ein SPR-Sensor nach vorliegender Erfindung erlaubt dann die gleichzeitige Messung einer Vielzahl unterschiedlicher Proben (Analyten). Alle in der Beschreibung, den nachfolgenden Ansprüchen und der Zeichnung dargestellten Merkmale können sowohl einzeln als auch in behebiger Kombination miteinander erfindungswesentlich sein. BezugszeichenlisteThe invention is not restricted to the exemplary embodiments shown. It is essential in any case that planar carriers 1 are used, which are provided with essentially planar optical fibers, which each have at least one planar SPR-capable metal layer 3 in a sample detection area, each of which represents a sample detection area that is in contact with a sample is feasible. It is also within the scope of the invention to connect the created SPR-compatible areas with open bottoms of flow cells 16, FIG. 7, spaced apart from one another, which have a common inflow 17 and outflow 18. In such an embodiment in particular, one or more of the flow cells formed can be used as reference channels, for example for the compensation of temperature fluctuations. If the invention speaks of at least one two-dimensional measurement area, this means that the metal layer 3 provided as the sensor area can also be subdivided into several partial areas 31, 32, 33, as indicated in FIG. 1b. The SPR sensor according to the invention can also be used in such a way that a single sample is first immobilized on the sensor areas 3. This immobilization serves to provide a chemically modified measuring surface with which another sample, preferably in solution, can interact. In the case of the immobilized sample, one often speaks of ligands, the sample in solution often being referred to as a receptor or analyte. The interaction partners are thus, for example, ligand-receptor pairs. An SPR sensor according to the present invention then allows the simultaneous measurement of a large number of different samples (analytes). All of the features shown in the description, the subsequent claims and the drawing can be essential to the invention both individually and in a combination with one another. Reference list
1 - planarer Träger1 - planar carrier
11, 12 - gegenüberliegende Seiten des Trägers 111, 12 - opposite sides of the carrier 1
13 - Beschichtung (Pufferschicht)13 - coating (buffer layer)
14 - Ausnehmungen14 - recesses
15 - Küvettenwandungen15 - cell walls
16 - Durchflußküvetten16 - Flow cells
17 - Zufluß17 - inflow
18 - Abfluß18 - drain
2 - Lichtwellenleiter2 - optical fiber
21, 22 - Strinflächen des Lichtwellenleiters 221, 22 - line surfaces of the optical waveguide 2
3 - SPR-fahige Metallschicht3 - SPR-capable metal layer
31, 32, 33 - Teilgebiete der Metallschicht 331, 32, 33 - partial areas of the metal layer 3
4 - hchtreflektierende Beschichtung4 - highly reflective coating
6 - Verguß b - Breite der Finger f f - Finger h - Länge der Finger f6 - potting b - width of fingers f f - fingers h - length of fingers f
X-X - Ebene X-X - plane
Claims
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19822557 | 1998-05-20 | ||
| DE19822557 | 1998-05-20 | ||
| PCT/EP1999/003596 WO1999060382A1 (en) | 1998-05-20 | 1999-05-19 | Surface plasmon resonance sensor for the simultaneous measurement of a plurality of samples in fluid form |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| EP1080365A1 true EP1080365A1 (en) | 2001-03-07 |
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ID=7868353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| EP99952120A Withdrawn EP1080365A1 (en) | 1998-05-20 | 1999-05-19 | Surface plasmon resonance sensor for the simultaneous measurement of a plurality of samples in fluid form |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6373577B1 (en) |
| EP (1) | EP1080365A1 (en) |
| JP (1) | JP2002518663A (en) |
| AU (1) | AU771043B2 (en) |
| CA (1) | CA2319429A1 (en) |
| DE (1) | DE19923820C2 (en) |
| WO (1) | WO1999060382A1 (en) |
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- 1999-05-19 DE DE19923820A patent/DE19923820C2/en not_active Expired - Fee Related
- 1999-05-19 WO PCT/EP1999/003596 patent/WO1999060382A1/en not_active Ceased
- 1999-05-19 AU AU42664/99A patent/AU771043B2/en not_active Ceased
- 1999-05-19 JP JP2000549943A patent/JP2002518663A/en active Pending
- 1999-05-19 US US09/600,670 patent/US6373577B1/en not_active Expired - Fee Related
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Also Published As
| Publication number | Publication date |
|---|---|
| AU771043B2 (en) | 2004-03-11 |
| DE19923820C2 (en) | 2001-05-10 |
| WO1999060382A1 (en) | 1999-11-25 |
| US6373577B1 (en) | 2002-04-16 |
| AU4266499A (en) | 1999-12-06 |
| JP2002518663A (en) | 2002-06-25 |
| DE19923820A1 (en) | 2000-01-20 |
| CA2319429A1 (en) | 1999-11-25 |
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