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EP0595104A1 - Arrangement for the compensation of changes in the resonant frequency of a cavity resonator - Google Patents

Arrangement for the compensation of changes in the resonant frequency of a cavity resonator Download PDF

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Publication number
EP0595104A1
EP0595104A1 EP93116486A EP93116486A EP0595104A1 EP 0595104 A1 EP0595104 A1 EP 0595104A1 EP 93116486 A EP93116486 A EP 93116486A EP 93116486 A EP93116486 A EP 93116486A EP 0595104 A1 EP0595104 A1 EP 0595104A1
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EP
European Patent Office
Prior art keywords
wave type
cavity resonator
resonance frequency
changes
controlled variable
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP93116486A
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German (de)
French (fr)
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EP0595104B1 (en
Inventor
Uwe Dipl.-Ing. Rosenberg
Walter Dipl.-Ing. Hägele
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Robert Bosch GmbH
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Robert Bosch GmbH
ANT Nachrichtentechnik GmbH
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Publication of EP0595104A1 publication Critical patent/EP0595104A1/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00—Auxiliary devices
    • H01P1/30—Auxiliary devices for compensation of, or protection against, temperature or moisture effects ; for improving power handling capability

Definitions

  • the present invention relates to an arrangement for compensating influences which change the resonance frequency of a cavity resonator, the cavity resonator having at least one correction element acting on the resonance frequency and a device being provided which adjusts the correction element so that changes in resonance frequency are compensated for.
  • Such an arrangement is e.g. known from DE 34 14 864 C2.
  • a stamp penetrating into the cavity resonator is held by a bimetal perforated disk, which reacts to temperature changes with more or less strong deflections, whereby the stamp changes its immersion depth in the cavity resonator accordingly.
  • a change in geometry caused by temperature influences and the associated change in resonance frequency in the cavity resonator is thus compensated for by the temperature-dependent displacement of the stamp.
  • Resonance frequency changes caused by temperature influences are often compensated for, as can be seen, for example, from DE 40 29 410 A1, in that certain wall areas of the cavity resonator are equipped with materials of different coefficients of thermal expansion.
  • the compensation measures carried out according to the prior art only react to temperature-dependent changes in the resonator geometry.
  • the known means do not react to changes in the cavity geometry resulting from influences other than temperature (e.g. pressure, torsion, etc.).
  • Another disadvantage of the compensation measures of the prior art is that they only react to temperature changes in partial areas of the cavity, where the temperature distribution is generally not constant over the entire cavity.
  • the invention is therefore based on the object of specifying an arrangement of the type mentioned at the outset which responds with as little delay as possible to any change in resonance frequency of the cavity resonator with compensation measures.
  • a control criterion for a frequency-determining correction element is derived directly from a wave type in the cavity resonator, any type of resonance frequency change, regardless of its shape and regardless of the influences which cause it, can be compensated completely and with only a slight delay.
  • influences which change the resonance frequency can For example, changes in the geometry of the cavity or changes in the dielectric properties of a medium in the cavity (for example gas, liquid, solid dielectric), which are caused by temperature influences or mechanical influences.
  • the figure schematically shows an arrangement for compensating for influences which change the resonant frequency of a cavity resonator.
  • a cavity resonator 1 is shown, which e.g. Can be part of a multi-circuit filter.
  • the penetration depth of the tuning element 2 should be adjustable, which is why it is coupled to a servomotor 3.
  • the cavity resonator 1 is dimensioned such that in addition to a useful wave type w1, another wave type w2 is also able to exist therein, which is decoupled from the useful wave type w1. Either the wave type w2 is of a different resonance frequency than the useful wave type w1 or it is degenerate compared to the useful wave type w1 at the same resonance frequency.
  • the wave type w2 excited in the cavity resonator 1 is decoupled separately from the useful wave type w1 and one Detector circuit 4 supplied, which derives a controlled variable x from the wave type w2.
  • the signal amplitude or the signal phase of this wave type w2 can be used as controlled variable x. Because both the amplitude and the phase react with a drift to changes in the geometry of the cavity resonator or the dielectric properties of a medium located therein.
  • a controller 5 derives from the deviation of the controlled variable x from a target value y, which corresponds to an amplitude or phase of the wave type w2 with the cavity resonator unchanged, a manipulated variable z for the servomotor 3, which varies the immersion depth of the tuning element 2 so that the change in resonance frequency is compensated becomes.
  • a correction element must be used, which e.g. changes the composition of the dielectric in the cavity or exerts a variable pressure on the dielectric.

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Abstract

An arrangement which responds with compensatory measures with very little delay to every change in the resonant frequency of a cavity resonator consists in that there are means (4) which derive a controlled variable (x) from a wave mode (w2) induced in the cavity resonator (1) in addition to a useful wave mode (w1), and that a controller (5) forms from the controlled variable (x) an actuating signal (z) for a correcting element (2). <IMAGE>

Description

Die vorliegende Erfindung betrifft eine Anordnung zur Kompensation von die Resonanzfrequenz eines Hohlraumresonators ändernden Einflüssen, wobei der Hohlraumresonator mindestens ein auf die Resonanzfrequenz einwirkendes Korrekturglied aufweist und eine Einrichtung vorgesehen ist, welche das Korrekturglied so verstellt, daß Resonanzfrequenzänderungen kompensiert werden.The present invention relates to an arrangement for compensating influences which change the resonance frequency of a cavity resonator, the cavity resonator having at least one correction element acting on the resonance frequency and a device being provided which adjusts the correction element so that changes in resonance frequency are compensated for.

Eine derartige Anordnung ist z.B. aus der DE 34 14 864 C2 bekannt. Hierbei wird ein in den Hohlraumresonator eindringender Stempel von einer Bimetallochscheibe gehalten, welche auf Temperaturänderungen mit mehr oder weniger starken Durchbiegungen reagiert, wodurch der Stempel seine Eintauchtiefe in den Hohlraumresonator entsprechend ändert. Eine durch Temperatureinflüsse hervorgerufene Geometrieänderung und die damit einhergehende Resonanzfrequenzänderung im Hohlraumresonator wird also durch die temperaturabhängige Verschiebung des Stempels kompensiert.Such an arrangement is e.g. known from DE 34 14 864 C2. Here, a stamp penetrating into the cavity resonator is held by a bimetal perforated disk, which reacts to temperature changes with more or less strong deflections, whereby the stamp changes its immersion depth in the cavity resonator accordingly. A change in geometry caused by temperature influences and the associated change in resonance frequency in the cavity resonator is thus compensated for by the temperature-dependent displacement of the stamp.

Durch Temperatureinflüsse bewirkte Resonanzfrequenzänderungen werden häufig auch dadurch kompensiert, wie man z.B. der DE 40 29 410 A1 entnehmen kann, daß gewisse Wandbereiche des Hohlraumresonators mit Materialien verschiedener Wärmeausdehnungskoeffizienten ausgestattet werden.Resonance frequency changes caused by temperature influences are often compensated for, as can be seen, for example, from DE 40 29 410 A1, in that certain wall areas of the cavity resonator are equipped with materials of different coefficients of thermal expansion.

Die gemäß dem Stand der Technik ausgeführten Kompensationsmaßnahmen reagieren nur auf temperaturabhängige Änderungen der Resonatorgeometrie. Auf Änderungen der Hohlraumgeometrie, die von anderen als temperaturbedingten Einflüssen (z.B. Druck, Torsion etc.) herrühren, reagieren die bekannten Mittel nicht. Nachteilig bei den Kompensationsmaßnahmen des Standes der Technik ist auch, daß sie nur auf Temperaturänderungen in partiellen Bereichen des Hohlraumresonators reagieren, wo doch die Temperaturverteilung in der Regel nicht über den gesamten Hohlraumresonator konstant ist.The compensation measures carried out according to the prior art only react to temperature-dependent changes in the resonator geometry. The known means do not react to changes in the cavity geometry resulting from influences other than temperature (e.g. pressure, torsion, etc.). Another disadvantage of the compensation measures of the prior art is that they only react to temperature changes in partial areas of the cavity, where the temperature distribution is generally not constant over the entire cavity.

Die Kompensation von Resonanzfrequenzänderungen aufgrund von Temperatureinflüssen kann daher nicht fehlerfrei sein. Außerdem können die bekannten Kompensationsmittel nur mit relativ großen Verzögerungen ihre Wirkung entfalten.The compensation of changes in resonance frequency due to temperature influences cannot therefore be error-free. In addition, the known compensation means can only take effect with relatively large delays.

Der Erfindung liegt daher die Aufgabe zugrunde, eine Anordnung der eingangs genannten Art anzugeben, die mit möglichst geringer Verzögerung auf jede Resonanzfrequenzänderung des Hohlraumresonators mit Kompensationsmaßnahmen reagiert.The invention is therefore based on the object of specifying an arrangement of the type mentioned at the outset which responds with as little delay as possible to any change in resonance frequency of the cavity resonator with compensation measures.

Erfindungsgemäß wird diese Aufgabe durch die Merkmale des Anspruchs 1 gelöst. Zweckmäßige Weiterbildungen der Erfindung gehen aus den Unteransprüchen hervor.According to the invention, this object is achieved by the features of claim 1. Appropriate developments of the invention emerge from the subclaims.

Dadurch, daß nach der Erfindung direkt aus einem Wellentyp im Hohlraumresonator ein Regelkriterium für ein frequenzbestimmendes Korrekturglied abgeleitet wird, kann jede Art von Resonanzfrequenzänderung, egal welcher Gestalt sie ist und unabhängig von den sie hervorrufenden Einflüssen, vollständig und mit nur geringer Verzögerung kompensiert werden. Solche die Resonanzfrequenz ändernden Einflüsse können z.B. Geometrieänderungen des Hohlraumes oder Änderungen der dielektrischen Eigenschaften eines im Hohlraum befindlichen Mediums (z.B. Gas, Flüssigkeit, festes Dielektrikum) sein, welche durch Temperatureinflüsse oder mechanische Einwirkungen hervorgerufen werden.Because, according to the invention, a control criterion for a frequency-determining correction element is derived directly from a wave type in the cavity resonator, any type of resonance frequency change, regardless of its shape and regardless of the influences which cause it, can be compensated completely and with only a slight delay. Such influences which change the resonance frequency can For example, changes in the geometry of the cavity or changes in the dielectric properties of a medium in the cavity (for example gas, liquid, solid dielectric), which are caused by temperature influences or mechanical influences.

Anhand eines in der Zeichnung dargestellten Ausführungsbeispiels wird nachfolgend die Erfindung näher erläutert.Based on an embodiment shown in the drawing, the invention is explained in more detail below.

Die Figur zeigt schematisch eine Anordnung zur Kompensation von die Resonanfrequenz eines Hohlraumresonators ändernden Einflüssen. Dargestellt ist ein Hohlraumresonator 1, der z.B. Teil eines mehrkreisigen Filters sein kann. In den Hohlraumresonator 1 ragt ein die Resonanzfrequenz beeinflussendes Korrekturglied in Gestalt eines Abstimmelementes 2, das z.B. als Stempel ausgebildet ist, aber auch jede beliebige andere geeignete Ausführungsform haben kann. Die Eindringtiefe des Abstimmelementes 2 soll einstellbar sein, weshalb es mit einem Stellmotor 3 gekoppelt ist.The figure schematically shows an arrangement for compensating for influences which change the resonant frequency of a cavity resonator. A cavity resonator 1 is shown, which e.g. Can be part of a multi-circuit filter. A correction element in the form of a tuning element 2, which influences the resonance frequency and projects e.g. is designed as a stamp, but can also have any other suitable embodiment. The penetration depth of the tuning element 2 should be adjustable, which is why it is coupled to a servomotor 3.

Der Hohlraumresonator 1 ist so dimensioniert, daß darin neben einem Nutzwellentyp w1 noch ein weiterer Wellentyp w2 existenzfähig ist, der vom Nutzwellentyp w1 entkoppelt ist. Entweder ist der Wellentyp w2 von einer anderen Resonanzfrequenz als der Nutzwellentyp w1 oder er ist bei gleicher Resonanzfrequenz gegenüber dem Nutzwellentyp w1 entartet.The cavity resonator 1 is dimensioned such that in addition to a useful wave type w1, another wave type w2 is also able to exist therein, which is decoupled from the useful wave type w1. Either the wave type w2 is of a different resonance frequency than the useful wave type w1 or it is degenerate compared to the useful wave type w1 at the same resonance frequency.

Der in dem Hohlraumresonator 1 angeregte Wellentyp w2 wird getrennt vom Nutzwellentyp w1 ausgekoppelt und einer Detektorschaltung 4 zugeführt, die aus dem Wellentyp w2 eine Regelgröße x ableitet. Als Regelgröße x kann die Signalamplitude oder die Signalphase dieses Wellentyps w2 verwendet werden. Denn sowohl die Amplitude als auch die Phase reagieren mit einer Drift auf Änderungen der Geometrie des Hohlraumresonators oder der dielektrischen Eigenschaften eines darin befindlichen Mediums. Ein Regler 5 leitet aus der Abweichung der Regelgröße x von einem Sollwert y, der einer Amplitude oder Phase des Wellentyps w2 bei unverändertem Hohlraumresonator entspricht, eine Stellgröße z für den Stellmotor 3 ab, welcher die Eintauchtiefe des Abstimmelements 2 so variiert, daß die Resonanzfrequenzänderung kompensiert wird.The wave type w2 excited in the cavity resonator 1 is decoupled separately from the useful wave type w1 and one Detector circuit 4 supplied, which derives a controlled variable x from the wave type w2. The signal amplitude or the signal phase of this wave type w2 can be used as controlled variable x. Because both the amplitude and the phase react with a drift to changes in the geometry of the cavity resonator or the dielectric properties of a medium located therein. A controller 5 derives from the deviation of the controlled variable x from a target value y, which corresponds to an amplitude or phase of the wave type w2 with the cavity resonator unchanged, a manipulated variable z for the servomotor 3, which varies the immersion depth of the tuning element 2 so that the change in resonance frequency is compensated becomes.

Geht eine Resonanzfrequenzänderung auf eine Veränderung der dielektrischen Eigenschaften im Hohlraumresonator zurück, so ist ein Korrekturglied zu verwenden, welches z.B. die Zusammensetzung des Dielektrikums im Hohlraumresonator ändert oder einen veränderbaren Druck auf das Dielektrikum ausübt.If a change in the resonance frequency is due to a change in the dielectric properties in the cavity, a correction element must be used, which e.g. changes the composition of the dielectric in the cavity or exerts a variable pressure on the dielectric.

Claims (5)

Anordnung zur Kompensation von die Resonanzfrequenz eines Hohlraumresonators ändernden Einflüssen, wobei der Hohlraumresonator mindestens ein auf die Resonanzfrequenz einwirkendes Korrekturglied aufweist und eine Einrichtung vorgesehen ist, welche das Korrekturglied so verstellt, daß Resonanzfrequenzänderungen kompensiert werden, dadurch gekennzeichnet, daß Mittel (4) vorhanden sind, die aus einem zusätzlich zu einem Nutzwellentyp (w1) in dem Hohlraumresonator (1) angeregten Wellentyp (w2) eine von den die Resonanzfrequenz ändernden Einflüssen abhängige Regelgröße (x) ableiten, und daß ein Regler (5) aus der Regelgröße (x) ein Stellsignal (z) für das Korrekturglied (2) bildet.Arrangement for compensating influences which change the resonance frequency of a cavity resonator, the cavity resonator having at least one correction element acting on the resonance frequency and a device being provided which adjusts the correction element in such a way that changes in resonance frequency are compensated, characterized in that means (4) are provided, derive a control variable (x) from a wave type (w2) excited in addition to a useful wave type (w1) in the cavity resonator (1), and that a controller (5) derives a control signal from the controlled variable (x) (z) forms for the correction element (2). Anordnung nach Anspruch 1, dadurch gekennzeichnet, daß als Regelgröße (x) die Amplitude des ausgekoppelten Wellentyps (w2) dient.Arrangement according to Claim 1, characterized in that the amplitude of the decoupled wave type (w2) serves as the controlled variable (x). Anordnung nach Anspruch 1, dadurch gekennzeichnet, daß als Regelgröße (x) die Phase des ausgekoppelten Wellentyps (w2) dient.Arrangement according to claim 1, characterized in that the phase of the decoupled wave type (w2) serves as the controlled variable (x). Anordnung nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, daß der die Regelgröße (x) liefernde Wellentyp (w2) gegenüber dem Nutzwellentyp (w1) entartet ist.Arrangement according to one of Claims 1 to 3, characterized in that the wave type (w2) which supplies the controlled variable (x) is degenerate compared to the useful wave type (w1). Anordnung nach einem der Ansprüche 1 bis 3, dadurch gekennzeichnet, daß der die Regelgröße (x) liefernde Wellentyp (w2)eine andere Resonanzfrequenz hat als der Nutzwellentyp (w1).Arrangement according to one of claims 1 to 3, characterized in that the wave type (w2) supplying the controlled variable (x) has a different resonance frequency than the useful wave type (w1).
EP19930116486 1992-10-24 1993-10-12 Arrangement for the compensation of changes in the resonant frequency of a cavity resonator Expired - Lifetime EP0595104B1 (en)

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DE4236016 1992-10-24
DE19924236016 DE4236016C1 (en) 1992-10-24 1992-10-24 Arrangement for compensating changes in the resonance frequency of a cavity resonator

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EP0595104A1 true EP0595104A1 (en) 1994-05-04
EP0595104B1 EP0595104B1 (en) 1996-08-28

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1170031A3 (en) * 2000-07-04 2002-06-19 Niigata University A cancer thermotherapy device
US7017412B2 (en) 2002-04-18 2006-03-28 University Of Utah Research Foundation Continuous wave ultrasonic process monitor for polymer processing

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4160183A (en) * 1978-05-26 1979-07-03 Hewlett-Packard Company Oscillator having a quartz resonator cut to compensate for static and dynamic thermal transients
FR2541536A1 (en) * 1983-02-22 1984-08-24 Thomson Csf Generator of millimetre waves with electronic frequency regulation
US4525647A (en) * 1983-12-02 1985-06-25 Motorola, Inc. Dual frequency, dual mode quartz resonator
US5004987A (en) * 1989-05-19 1991-04-02 Piezo Crystal Company Temperature compensated crystal resonator found in a dual-mode oscillator

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3414864A1 (en) * 1984-04-19 1985-10-31 ANT Nachrichtentechnik GmbH, 7150 Backnang Arrangement for temperature compensation of a cavity resonator
DE4029410A1 (en) * 1990-09-17 1992-03-19 Ant Nachrichtentech Cavity resonator with temp. compensation - using bimetallic plate with higher heat expansion coefft. metal lying on outside

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4160183A (en) * 1978-05-26 1979-07-03 Hewlett-Packard Company Oscillator having a quartz resonator cut to compensate for static and dynamic thermal transients
FR2541536A1 (en) * 1983-02-22 1984-08-24 Thomson Csf Generator of millimetre waves with electronic frequency regulation
US4525647A (en) * 1983-12-02 1985-06-25 Motorola, Inc. Dual frequency, dual mode quartz resonator
US5004987A (en) * 1989-05-19 1991-04-02 Piezo Crystal Company Temperature compensated crystal resonator found in a dual-mode oscillator

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1170031A3 (en) * 2000-07-04 2002-06-19 Niigata University A cancer thermotherapy device
US6611719B2 (en) 2000-07-04 2003-08-26 Niigta University Cancer thermotherapy
US7017412B2 (en) 2002-04-18 2006-03-28 University Of Utah Research Foundation Continuous wave ultrasonic process monitor for polymer processing

Also Published As

Publication number Publication date
DE4236016C1 (en) 1993-11-25
EP0595104B1 (en) 1996-08-28

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