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DK3211403T3 - Udvendigt inspektionsapparat - Google Patents

Udvendigt inspektionsapparat Download PDF

Info

Publication number
DK3211403T3
DK3211403T3 DK15853487.5T DK15853487T DK3211403T3 DK 3211403 T3 DK3211403 T3 DK 3211403T3 DK 15853487 T DK15853487 T DK 15853487T DK 3211403 T3 DK3211403 T3 DK 3211403T3
Authority
DK
Denmark
Prior art keywords
inspection apparatus
exterior inspection
exterior
inspection
Prior art date
Application number
DK15853487.5T
Other languages
English (en)
Inventor
Yasuhiko Enami
Yo-O Hayashida
Original Assignee
Purex Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Purex Co Ltd filed Critical Purex Co Ltd
Application granted granted Critical
Publication of DK3211403T3 publication Critical patent/DK3211403T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
    • H04N23/12—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with one sensor only
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/80—Camera processing pipelines; Components thereof
    • H04N23/84—Camera processing pipelines; Components thereof for processing colour signals
    • H04N23/88—Camera processing pipelines; Components thereof for processing colour signals for colour balance, e.g. white-balance circuits or colour temperature control
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8835—Adjustable illumination, e.g. software adjustable screen

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Color Television Image Signal Generators (AREA)
DK15853487.5T 2014-10-23 2015-08-10 Udvendigt inspektionsapparat DK3211403T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014216015A JP6353766B2 (ja) 2014-10-23 2014-10-23 外観検査装置
PCT/JP2015/004005 WO2016063439A1 (ja) 2014-10-23 2015-08-10 外観検査装置

Publications (1)

Publication Number Publication Date
DK3211403T3 true DK3211403T3 (da) 2020-12-21

Family

ID=55760503

Family Applications (1)

Application Number Title Priority Date Filing Date
DK15853487.5T DK3211403T3 (da) 2014-10-23 2015-08-10 Udvendigt inspektionsapparat

Country Status (5)

Country Link
US (1) US20170269003A1 (da)
EP (1) EP3211403B8 (da)
JP (1) JP6353766B2 (da)
DK (1) DK3211403T3 (da)
WO (1) WO2016063439A1 (da)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102653207B1 (ko) * 2016-10-07 2024-04-01 삼성전기주식회사 외관 검사 장치 및 그 광학계 자동 캘리브레이션 방법
JP2019128289A (ja) * 2018-01-25 2019-08-01 セイコーエプソン株式会社 電子部品搬送装置および電子部品検査装置
US10753734B2 (en) 2018-06-08 2020-08-25 Dentsply Sirona Inc. Device, method and system for generating dynamic projection patterns in a confocal camera
JP7512733B2 (ja) * 2020-07-21 2024-07-09 株式会社サタケ 穀粒検査器
CN120265943A (zh) * 2023-11-02 2025-07-04 宁德时代新能源科技股份有限公司 视觉检测系统及方法

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2773498B2 (ja) * 1991-11-15 1998-07-09 富士写真光機株式会社 電子内視鏡の映像特性測定装置
JP2595927B2 (ja) * 1992-07-07 1997-04-02 東洋紡績株式会社 シート状物色差検査装置
JP3243039B2 (ja) * 1993-03-05 2002-01-07 株式会社マキ製作所 同軸反射型計測装置の校正方法及び同軸反射型計測装置
JPH10262922A (ja) * 1997-03-25 1998-10-06 Olympus Optical Co Ltd 電子内視鏡装置
WO2000079247A1 (en) * 1999-06-21 2000-12-28 Kabushikikaisha Kajitsuhihakaihinshitsukenkyujo Side multiple-lamp on-line inside quality inspecting device
ES2282135T3 (es) * 1999-09-24 2007-10-16 Kabushikikaisha Kajitsuhihakaihinshitsu Kenkyujo Aparato de inspeccion directa de una parte interna por medio de multiples lamparas situadas en dos lados.
US6874420B2 (en) * 1999-10-22 2005-04-05 Cc1, Inc. System and method for register mark recognition
JP3868896B2 (ja) * 2002-01-23 2007-01-17 本田技研工業株式会社 自律移動体用撮像装置、撮像装置較正方法及び撮像装置較正プログラム
US6861660B2 (en) * 2002-07-29 2005-03-01 Applied Materials, Inc. Process and assembly for non-destructive surface inspection
JP4355479B2 (ja) * 2002-09-03 2009-11-04 株式会社プレックス 欠陥布片検出装置における欠陥レベル情報設定方法
US20060090319A1 (en) * 2004-11-01 2006-05-04 Howe Major K Defect locating system for moving web
JP2005169139A (ja) * 2005-01-18 2005-06-30 Olympus Corp 電子内視鏡装置
UA91387C2 (uk) * 2005-11-16 2010-07-26 Джапан Тобакко Инк. Система ідентифікації суміші
JP5247664B2 (ja) * 2009-11-18 2013-07-24 株式会社日立ハイテクノロジーズ 基板検査装置及びその測定運用システム
JP5881278B2 (ja) * 2010-05-20 2016-03-09 株式会社プレックス 布片検査装置および検査方法
JP5984301B2 (ja) * 2012-10-29 2016-09-06 株式会社プレックス 布類検査装置
JP6108535B2 (ja) * 2013-03-27 2017-04-05 株式会社プレックス 布類検査装置

Also Published As

Publication number Publication date
JP6353766B2 (ja) 2018-07-04
EP3211403B8 (en) 2020-12-16
JP2016085050A (ja) 2016-05-19
EP3211403A1 (en) 2017-08-30
US20170269003A1 (en) 2017-09-21
EP3211403B1 (en) 2020-10-28
EP3211403A4 (en) 2018-05-23
WO2016063439A1 (ja) 2016-04-28

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