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DE69934684D1 - Vorrichtung zur gasbehandlung - Google Patents

Vorrichtung zur gasbehandlung

Info

Publication number
DE69934684D1
DE69934684D1 DE69934684T DE69934684T DE69934684D1 DE 69934684 D1 DE69934684 D1 DE 69934684D1 DE 69934684 T DE69934684 T DE 69934684T DE 69934684 T DE69934684 T DE 69934684T DE 69934684 D1 DE69934684 D1 DE 69934684D1
Authority
DE
Germany
Prior art keywords
gas treatment
treatment
gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69934684T
Other languages
English (en)
Other versions
DE69934684T2 (de
Inventor
Hideaki Amano
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of DE69934684D1 publication Critical patent/DE69934684D1/de
Application granted granted Critical
Publication of DE69934684T2 publication Critical patent/DE69934684T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67063Apparatus for fluid treatment for etching
    • H01L21/67069Apparatus for fluid treatment for etching for drying etching
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45565Shower nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/50Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
    • C23C16/511Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Plasma & Fusion (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)
  • Chemical Vapour Deposition (AREA)
  • ing And Chemical Polishing (AREA)
DE69934684T 1998-04-09 1999-04-09 Vorrichtung zur gasbehandlung Expired - Fee Related DE69934684T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP11420498A JP2001102309A (ja) 1998-04-09 1998-04-09 ガス処理装置
JP11420498 1998-04-09
PCT/JP1999/001902 WO1999053533A1 (fr) 1998-04-09 1999-04-09 Appareil de traitement au gaz

Publications (2)

Publication Number Publication Date
DE69934684D1 true DE69934684D1 (de) 2007-02-15
DE69934684T2 DE69934684T2 (de) 2007-10-18

Family

ID=14631825

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69934684T Expired - Fee Related DE69934684T2 (de) 1998-04-09 1999-04-09 Vorrichtung zur gasbehandlung

Country Status (7)

Country Link
EP (1) EP1079423B1 (de)
JP (1) JP2001102309A (de)
KR (1) KR20010042483A (de)
DE (1) DE69934684T2 (de)
IL (1) IL138903A0 (de)
TW (1) TW412786B (de)
WO (1) WO1999053533A1 (de)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100447297C (zh) * 2003-04-16 2008-12-31 东洋制罐株式会社 微波等离子体处理方法
US8083853B2 (en) 2004-05-12 2011-12-27 Applied Materials, Inc. Plasma uniformity control by gas diffuser hole design
US8074599B2 (en) 2004-05-12 2011-12-13 Applied Materials, Inc. Plasma uniformity control by gas diffuser curvature
US8328939B2 (en) 2004-05-12 2012-12-11 Applied Materials, Inc. Diffuser plate with slit valve compensation
US7429410B2 (en) 2004-09-20 2008-09-30 Applied Materials, Inc. Diffuser gravity support
JP5055114B2 (ja) * 2005-03-30 2012-10-24 パナソニック株式会社 プラズマドーピング方法
KR101253332B1 (ko) * 2006-03-03 2013-04-10 주성엔지니어링(주) 균일한 가스분사를 위한 가스분배판
WO2016190036A1 (ja) * 2015-05-22 2016-12-01 株式会社 日立ハイテクノロジーズ プラズマ処理装置およびそれを用いたプラズマ処理方法
JP2020147795A (ja) * 2019-03-13 2020-09-17 東京エレクトロン株式会社 プラズマ処理装置
US20210047730A1 (en) * 2019-08-13 2021-02-18 Applied Materials, Inc. Chamber configurations for controlled deposition
JP7281433B2 (ja) * 2020-06-24 2023-05-25 株式会社日立ハイテク プラズマ処理装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57121236A (en) * 1981-01-20 1982-07-28 Matsushita Electronics Corp Plasma processing and device thereof
JPH02198138A (ja) * 1989-01-27 1990-08-06 Nec Corp 平行平板型ドライエッチング装置の電極板
US4990229A (en) * 1989-06-13 1991-02-05 Plasma & Materials Technologies, Inc. High density plasma deposition and etching apparatus
EP0413239B1 (de) * 1989-08-14 1996-01-10 Applied Materials, Inc. Gasverteilungssystem und Verfahren zur Benutzung dieses Systems
JPH0390577A (ja) * 1989-09-04 1991-04-16 Hitachi Ltd マイクロ波プラズマ処理装置
JP2630089B2 (ja) * 1990-03-19 1997-07-16 株式会社日立製作所 マイクロ波プラズマ処理装置
US5234526A (en) * 1991-05-24 1993-08-10 Lam Research Corporation Window for microwave plasma processing device
JPH0570956A (ja) * 1991-09-13 1993-03-23 Kobe Steel Ltd 有磁場マイクロ波吸収プラズマ処理装置
JPH06204181A (ja) * 1992-12-29 1994-07-22 Ibiden Co Ltd プラズマエッチング用電極板
US5552017A (en) * 1995-11-27 1996-09-03 Taiwan Semiconductor Manufacturing Company Method for improving the process uniformity in a reactor by asymmetrically adjusting the reactant gas flow

Also Published As

Publication number Publication date
TW412786B (en) 2000-11-21
WO1999053533A1 (fr) 1999-10-21
JP2001102309A (ja) 2001-04-13
KR20010042483A (ko) 2001-05-25
EP1079423A1 (de) 2001-02-28
IL138903A0 (en) 2001-11-25
EP1079423B1 (de) 2007-01-03
DE69934684T2 (de) 2007-10-18
EP1079423A4 (de) 2005-06-08

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee