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DE69915851D1 - Optischer sensor mit gestapelten dielektrischen schichten - Google Patents

Optischer sensor mit gestapelten dielektrischen schichten

Info

Publication number
DE69915851D1
DE69915851D1 DE69915851T DE69915851T DE69915851D1 DE 69915851 D1 DE69915851 D1 DE 69915851D1 DE 69915851 T DE69915851 T DE 69915851T DE 69915851 T DE69915851 T DE 69915851T DE 69915851 D1 DE69915851 D1 DE 69915851D1
Authority
DE
Germany
Prior art keywords
optical sensor
dielectric layers
stacked dielectric
stacked
layers
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69915851T
Other languages
English (en)
Other versions
DE69915851T2 (de
Inventor
A Challener
M Depuydt
A Tolbert
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GlassBridge Enterprises Inc
Original Assignee
Imation Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Imation Corp filed Critical Imation Corp
Publication of DE69915851D1 publication Critical patent/DE69915851D1/de
Application granted granted Critical
Publication of DE69915851T2 publication Critical patent/DE69915851T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE69915851T 1998-10-16 1999-09-09 Optischer sensor mit gestapelten dielektrischen schichten Expired - Fee Related DE69915851T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US174178 1998-10-16
US09/174,178 US6320991B1 (en) 1998-10-16 1998-10-16 Optical sensor having dielectric film stack
PCT/US1999/020689 WO2000023793A1 (en) 1998-10-16 1999-09-09 Optical sensor having dielectric film stack

Publications (2)

Publication Number Publication Date
DE69915851D1 true DE69915851D1 (de) 2004-04-29
DE69915851T2 DE69915851T2 (de) 2005-03-17

Family

ID=22635150

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69915851T Expired - Fee Related DE69915851T2 (de) 1998-10-16 1999-09-09 Optischer sensor mit gestapelten dielektrischen schichten

Country Status (5)

Country Link
US (2) US6320991B1 (de)
EP (1) EP1121583B1 (de)
JP (1) JP2002527771A (de)
DE (1) DE69915851T2 (de)
WO (1) WO2000023793A1 (de)

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Also Published As

Publication number Publication date
EP1121583B1 (de) 2004-03-24
US20020018610A1 (en) 2002-02-14
DE69915851T2 (de) 2005-03-17
WO2000023793A1 (en) 2000-04-27
JP2002527771A (ja) 2002-08-27
US6625336B2 (en) 2003-09-23
EP1121583A1 (de) 2001-08-08
US6320991B1 (en) 2001-11-20

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