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DE69829614D1 - Lithographiegerät mit einer positioniervorrichtung mit zwei objekthaltern - Google Patents

Lithographiegerät mit einer positioniervorrichtung mit zwei objekthaltern

Info

Publication number
DE69829614D1
DE69829614D1 DE69829614T DE69829614T DE69829614D1 DE 69829614 D1 DE69829614 D1 DE 69829614D1 DE 69829614 T DE69829614 T DE 69829614T DE 69829614 T DE69829614 T DE 69829614T DE 69829614 D1 DE69829614 D1 DE 69829614D1
Authority
DE
Germany
Prior art keywords
objects
lithography
positioning
positioning device
lithography device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69829614T
Other languages
English (en)
Other versions
DE69829614T2 (de
Inventor
Roelof Loopstra
Maarten Bonnema
Der Schoot Klaas Van
Peter Veldhuis
Patrick Kwan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ASML Netherlands BV
Original Assignee
ASML Netherlands BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ASML Netherlands BV filed Critical ASML Netherlands BV
Application granted granted Critical
Publication of DE69829614D1 publication Critical patent/DE69829614D1/de
Publication of DE69829614T2 publication Critical patent/DE69829614T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • B23Q1/44Movable or adjustable work or tool supports using particular mechanisms
    • B23Q1/56Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/60Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/62Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides
    • B23Q1/621Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides a single sliding pair followed perpendicularly by a single sliding pair
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q1/00Members which are comprised in the general build-up of a form of machine, particularly relatively large fixed members
    • B23Q1/25Movable or adjustable work or tool supports
    • B23Q1/44Movable or adjustable work or tool supports using particular mechanisms
    • B23Q1/56Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/60Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism
    • B23Q1/62Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides
    • B23Q1/621Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides a single sliding pair followed perpendicularly by a single sliding pair
    • B23Q1/623Movable or adjustable work or tool supports using particular mechanisms with sliding pairs only, the sliding pairs being the first two elements of the mechanism two sliding pairs only, the sliding pairs being the first two elements of the mechanism with perpendicular axes, e.g. cross-slides a single sliding pair followed perpendicularly by a single sliding pair followed perpendicularly by a single rotating pair
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q11/00Accessories fitted to machine tools for keeping tools or parts of the machine in good working condition or for cooling work; Safety devices specially combined with or arranged in, or specially adapted for use in connection with, machine tools
    • B23Q11/0032Arrangements for preventing or isolating vibrations in parts of the machine
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G03F7/70741Handling masks outside exposure position, e.g. reticle libraries
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70733Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
    • G03F7/7075Handling workpieces outside exposure position, e.g. SMIF box
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression or isolation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • H01L21/682Mask-wafer alignment

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Atmospheric Sciences (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Library & Information Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Toxicology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Details Of Measuring And Other Instruments (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
DE69829614T 1997-03-10 1998-02-27 Lithographiegerät mit einer positioniervorrichtung mit zwei objekthaltern Expired - Fee Related DE69829614T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP97200706 1997-03-10
EP97200706 1997-03-10
PCT/IB1998/000254 WO1998040791A1 (en) 1997-03-10 1998-02-27 Positioning device having two object holders

Publications (2)

Publication Number Publication Date
DE69829614D1 true DE69829614D1 (de) 2005-05-12
DE69829614T2 DE69829614T2 (de) 2006-03-09

Family

ID=8228087

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69829614T Expired - Fee Related DE69829614T2 (de) 1997-03-10 1998-02-27 Lithographiegerät mit einer positioniervorrichtung mit zwei objekthaltern

Country Status (6)

Country Link
US (2) USRE40043E1 (de)
EP (1) EP0900412B1 (de)
JP (1) JP3626504B2 (de)
DE (1) DE69829614T2 (de)
TW (1) TW452546B (de)
WO (1) WO1998040791A1 (de)

Families Citing this family (357)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1998024115A1 (en) 1996-11-28 1998-06-04 Nikon Corporation Aligner and method for exposure
JPH10209039A (ja) 1997-01-27 1998-08-07 Nikon Corp 投影露光方法及び投影露光装置
USRE40043E1 (en) * 1997-03-10 2008-02-05 Asml Netherlands B.V. Positioning device having two object holders
JPH10270535A (ja) * 1997-03-25 1998-10-09 Nikon Corp 移動ステージ装置、及び該ステージ装置を用いた回路デバイス製造方法
IL135139A0 (en) 1997-09-19 2001-05-20 Nikon Corp Stage apparatus, scanning type exposure apparatus, and device produced with the same
TW448487B (en) 1997-11-22 2001-08-01 Nippon Kogaku Kk Exposure apparatus, exposure method and manufacturing method of device
DE69933903T2 (de) * 1998-04-14 2007-05-24 Asml Netherlands B.V. Lithograpischer Projektionsapparat und Verfahren zur Herstellung einer Vorrichtung
US6296990B1 (en) * 1998-05-14 2001-10-02 Asm Lithography, B.V. Gas bearing and lithographic apparatus including such a bearing
EP0957275A3 (de) 1998-05-14 2000-12-06 Asm Lithography B.V. Gaslager und solch ein Lager aufweisende lithographische Einrichtung
TWI242111B (en) 1999-04-19 2005-10-21 Asml Netherlands Bv Gas bearings for use in vacuum chambers and their application in lithographic projection apparatus
TW513617B (en) 1999-04-21 2002-12-11 Asml Corp Lithographic projection apparatus and method of manufacturing a device using a lithographic projection apparatus
EP1052546B1 (de) * 1999-04-21 2004-09-15 ASML Netherlands B.V. Substrathandhabungsvorrichtung zur Verwendung in lithographischen Projektionsapparaten
TW587199B (en) 1999-09-29 2004-05-11 Asml Netherlands Bv Lithographic method and apparatus
JP2001118773A (ja) 1999-10-18 2001-04-27 Nikon Corp ステージ装置及び露光装置
JP2001160530A (ja) 1999-12-01 2001-06-12 Nikon Corp ステージ装置及び露光装置
DE60032568T2 (de) * 1999-12-01 2007-10-04 Asml Netherlands B.V. Positionierungsapparat und damit versehener lithographischer Apparat
KR20020054368A (ko) * 1999-12-16 2002-07-06 시마무라 테루오 노광방법 및 장치
TWI264617B (en) * 1999-12-21 2006-10-21 Asml Netherlands Bv Balanced positioning system for use in lithographic apparatus
US6836093B1 (en) 1999-12-21 2004-12-28 Nikon Corporation Exposure method and apparatus
TW546551B (en) 1999-12-21 2003-08-11 Asml Netherlands Bv Balanced positioning system for use in lithographic apparatus
TW588222B (en) 2000-02-10 2004-05-21 Asml Netherlands Bv Cooling of voice coil motors in lithographic projection apparatus
JP2001308003A (ja) 2000-02-15 2001-11-02 Nikon Corp 露光方法及び装置、並びにデバイス製造方法
US7301605B2 (en) * 2000-03-03 2007-11-27 Nikon Corporation Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices
JP2001267226A (ja) 2000-03-21 2001-09-28 Nikon Corp 駆動装置及び露光装置、並びにデバイス及びその製造方法
US7508487B2 (en) * 2000-06-01 2009-03-24 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby
US6630984B2 (en) 2000-08-03 2003-10-07 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby
US7561270B2 (en) 2000-08-24 2009-07-14 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and device manufactured thereby
TW527526B (en) 2000-08-24 2003-04-11 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
TWI232356B (en) 2000-09-04 2005-05-11 Asml Netherlands Bv Lithographic projection apparatus, device manufacturing method and device manufactured thereby
EP1197803B1 (de) 2000-10-10 2012-02-01 ASML Netherlands B.V. Lithographischer Apparat
EP2081086B1 (de) 2000-11-07 2013-01-02 ASML Netherlands B.V. Lithografische Vorrichtung und Vorrichtungsherstellungsverfahren
US6958808B2 (en) 2000-11-16 2005-10-25 Nikon Corporation System and method for resetting a reaction mass assembly of a stage assembly
US6593997B1 (en) 2000-11-16 2003-07-15 Nikon Corporation Stage assembly including a reaction assembly
US6603531B1 (en) 2000-11-16 2003-08-05 Nikon Corporation Stage assembly including a reaction assembly that is connected by actuators
US6885430B2 (en) 2000-11-16 2005-04-26 Nikon Corporation System and method for resetting a reaction mass assembly of a stage assembly
US6757053B1 (en) 2000-11-16 2004-06-29 Nikon Corporation Stage assembly including a reaction mass assembly
TW591342B (en) 2000-11-30 2004-06-11 Asml Netherlands Bv Lithographic projection apparatus and integrated circuit manufacturing method using a lithographic projection apparatus
JP2002289515A (ja) * 2000-12-28 2002-10-04 Nikon Corp 製品の製造方法、露光装置の製造方法、露光装置、及びデバイス製造方法
US7113258B2 (en) 2001-01-15 2006-09-26 Asml Netherlands B.V. Lithographic apparatus
US6927838B2 (en) 2001-02-27 2005-08-09 Nikon Corporation Multiple stage, stage assembly having independent stage bases
US20020117109A1 (en) * 2001-02-27 2002-08-29 Hazelton Andrew J. Multiple stage, stage assembly having independent reaction force transfer
US6792591B2 (en) 2001-02-28 2004-09-14 Asml Masktools B.V. Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
US6881523B2 (en) 2001-03-14 2005-04-19 Asml Masktools B.V. Optical proximity correction method utilizing ruled ladder bars as sub-resolution assist features
US7735052B2 (en) 2001-04-24 2010-06-08 Asml Masktools Netherlands B.V. Method of identifying an extreme interaction pitch region, methods of designing mask patterns and manufacturing masks, device manufacturing methods and computer programs
JP4342155B2 (ja) 2001-05-23 2009-10-14 エーエスエムエル ネザーランズ ビー.ブイ. 位置決めマークを備えた基板、マスクを設計する方法、コンピュータ・プログラム、位置決めマークを露光するマスク、およびデバイス製造方法
US6879374B2 (en) 2001-06-20 2005-04-12 Asml Netherlands B.V. Device manufacturing method, device manufactured thereby and a mask for use in the method
US6788385B2 (en) * 2001-06-21 2004-09-07 Nikon Corporation Stage device, exposure apparatus and method
TW529172B (en) 2001-07-24 2003-04-21 Asml Netherlands Bv Imaging apparatus
US6674512B2 (en) 2001-08-07 2004-01-06 Nikon Corporation Interferometer system for a semiconductor exposure system
US6785005B2 (en) 2001-09-21 2004-08-31 Nikon Corporation Switching type dual wafer stage
US7026081B2 (en) 2001-09-28 2006-04-11 Asml Masktools B.V. Optical proximity correction method utilizing phase-edges as sub-resolution assist features
TWI268403B (en) 2001-10-19 2006-12-11 Asml Netherlands Bv Lithographic apparatus, device manufacturing method
US6665054B2 (en) 2001-10-22 2003-12-16 Nikon Corporation Two stage method
US6927505B2 (en) 2001-12-19 2005-08-09 Nikon Corporation Following stage planar motor
US20030159956A1 (en) * 2002-02-26 2003-08-28 Woos Michael T. Display backing card
US7170587B2 (en) * 2002-03-18 2007-01-30 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7333178B2 (en) * 2002-03-18 2008-02-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7061577B2 (en) * 2002-03-26 2006-06-13 Nikon Corporation Image adjustor including damping assembly
US6724466B2 (en) 2002-03-26 2004-04-20 Nikon Corporation Stage assembly including a damping assembly
US6757110B2 (en) 2002-05-29 2004-06-29 Asml Holding N.V. Catadioptric lithography system and method with reticle stage orthogonal to wafer stage
EP1367446A1 (de) 2002-05-31 2003-12-03 ASML Netherlands B.V. Lithographischer Apparat
US6906786B2 (en) * 2002-06-07 2005-06-14 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1369745B1 (de) 2002-06-07 2013-02-27 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
TWI266151B (en) * 2002-07-11 2006-11-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1383007A1 (de) * 2002-07-16 2004-01-21 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
US6859259B2 (en) * 2002-08-15 2005-02-22 Asml Netherlands B.V. Lithographic projection apparatus and reflector assembly for use therein
TWI229242B (en) * 2002-08-23 2005-03-11 Asml Netherlands Bv Lithographic projection apparatus and particle barrier for use in said apparatus
US7627354B2 (en) * 2002-08-30 2009-12-01 Qualcomm Incorporated Display format for handheld wireless communication devices
JP4222926B2 (ja) 2002-09-20 2009-02-12 エーエスエムエル ネザーランズ ビー.ブイ. デバイス検査
EP2204697A3 (de) 2002-09-20 2012-04-18 ASML Netherlands B.V. Markerstruktur, lithographische Projektionsvorrichtung, Verfahren zur Substratausrichtung mittels solch einer Struktur und Substrat mit solch einer Markerstruktur
SG126732A1 (en) 2002-09-30 2006-11-29 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US20040105084A1 (en) * 2002-09-30 2004-06-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1429188B1 (de) 2002-11-12 2013-06-19 ASML Netherlands B.V. Lithographischer Projektionsapparat
SG137657A1 (en) 2002-11-12 2007-12-28 Asml Masktools Bv Method and apparatus for performing model-based layout conversion for use with dipole illumination
US9482966B2 (en) 2002-11-12 2016-11-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
SG121822A1 (en) 2002-11-12 2006-05-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US7110081B2 (en) 2002-11-12 2006-09-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
CN100568101C (zh) 2002-11-12 2009-12-09 Asml荷兰有限公司 光刻装置和器件制造方法
US10503084B2 (en) 2002-11-12 2019-12-10 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
SG116510A1 (de) 2002-11-12 2005-11-28
EP2495613B1 (de) 2002-11-12 2013-07-31 ASML Netherlands B.V. Lithografische Vorrichtung
EP1420302A1 (de) 2002-11-18 2004-05-19 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
SG111171A1 (en) 2002-11-27 2005-05-30 Asml Netherlands Bv Lithographic projection apparatus and device manufacturing method
KR101060983B1 (ko) 2002-12-03 2011-08-31 가부시키가이샤 니콘 오염 물질 제거 방법 및 장치, 그리고 노광 방법 및 장치
DE60323927D1 (de) 2002-12-13 2008-11-20 Asml Netherlands Bv Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
DE60322331D1 (de) 2002-12-19 2008-09-04 Asml Netherlands Bv Verfahren zur Herstellung eines Artikels unter Verwendung einer lithographischen Projektionsmaske
EP1434092A1 (de) 2002-12-23 2004-06-30 ASML Netherlands B.V. Lithographischer Apparat, Verfahren zur Herstellung eines Artikels und damit erzeugter Artikel
CN100476585C (zh) 2002-12-23 2009-04-08 Asml荷兰有限公司 具有可扩展薄片的杂质屏蔽
TWI286674B (en) 2002-12-27 2007-09-11 Asml Netherlands Bv Container for a mask, method of transferring lithographic masks therein and method of scanning a mask in a container
SG139530A1 (en) 2003-01-14 2008-02-29 Asml Masktools Bv Method of optical proximity correction design for contact hole mask
CN100555086C (zh) 2003-01-14 2009-10-28 Asml荷兰有限公司 用于光刻装置的水平传感器
TWI304158B (en) 2003-01-15 2008-12-11 Asml Netherlands Bv Detection assembly and lithographic projection apparatus provided with such a detection assembly
US6963821B2 (en) * 2003-02-11 2005-11-08 Nikon Corporation Stage counter mass system
JPWO2004075268A1 (ja) 2003-02-19 2006-06-01 株式会社ニコン 移動方法、露光方法及び露光装置、並びにデバイス製造方法
KR101381538B1 (ko) 2003-02-26 2014-04-04 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
US6943941B2 (en) * 2003-02-27 2005-09-13 Asml Netherlands B.V. Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems
US7206059B2 (en) * 2003-02-27 2007-04-17 Asml Netherlands B.V. Stationary and dynamic radial transverse electric polarizer for high numerical aperture systems
SG115641A1 (en) 2003-03-06 2005-10-28 Asml Netherlands Bv Device and method for manipulation and routing of a metrology beam
TWI264620B (en) 2003-03-07 2006-10-21 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
EP1457826A1 (de) 2003-03-11 2004-09-15 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
TWI234692B (en) 2003-03-11 2005-06-21 Asml Netherlands Bv Lithographic projection assembly, handling apparatus for handling substrates and method of handling a substrate
SG115630A1 (en) 2003-03-11 2005-10-28 Asml Netherlands Bv Temperature conditioned load lock, lithographic apparatus comprising such a load lock and method of manufacturing a substrate with such a load lock
SG115631A1 (en) 2003-03-11 2005-10-28 Asml Netherlands Bv Lithographic projection assembly, load lock and method for transferring objects
SG115629A1 (en) 2003-03-11 2005-10-28 Asml Netherlands Bv Method and apparatus for maintaining a machine part
EP1457825A1 (de) 2003-03-11 2004-09-15 ASML Netherlands B.V. Lithographischer Apparat, Verfahren zur Herstellung eines Artikels und damit erzeugter Artikel
SG125108A1 (en) 2003-03-11 2006-09-29 Asml Netherlands Bv Assembly comprising a sensor for determining at least one of tilt and height of a substrate, a method therefor and a lithographic projection apparatus
EP1457827A1 (de) 2003-03-11 2004-09-15 ASML Netherlands B.V. Lithographischer Apparat, Verfahren zur Herstellung eines Artikels und damit erzeugter Artikel
EP1457833B1 (de) 2003-03-11 2012-05-30 ASML Netherlands B.V. Lithographischer Apparat, Verfahren zur Herstellung eines Artikels und damit erzeugter Artikel
EP1465016A3 (de) 2003-03-31 2008-10-15 ASML MaskTools B.V. Optimierung von Beleuchtungsquelle und Photomaske
SG125948A1 (en) 2003-03-31 2006-10-30 Asml Netherlands Bv Supporting structure for use in a lithographic apparatus
US7397539B2 (en) 2003-03-31 2008-07-08 Asml Netherlands, B.V. Transfer apparatus for transferring an object, lithographic apparatus employing such a transfer apparatus, and method of use thereof
US7126671B2 (en) 2003-04-04 2006-10-24 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4488004B2 (ja) * 2003-04-09 2010-06-23 株式会社ニコン 液浸リソグラフィ流体制御システム
JP4394500B2 (ja) 2003-04-09 2010-01-06 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置、デバイス製造方法、及びコンピュータ・プログラム
EP2667253B1 (de) 2003-04-10 2015-06-10 Nikon Corporation System zur Umgebungskontrolle mittels Vakuum-Rückförderung für eine Immersionslithografievorrichtung
KR101745223B1 (ko) * 2003-04-10 2017-06-08 가부시키가이샤 니콘 액침 리소그래피 장치용 운반 영역을 포함하는 환경 시스템
SG10201603067VA (en) 2003-04-11 2016-05-30 Nikon Corp Apparatus having an immersion fluid system configured to maintain immersion fluid in a gap adjacent an optical assembly
SG189557A1 (en) * 2003-04-11 2013-05-31 Nikon Corp Cleanup method for optics in immersion lithography
JP4071733B2 (ja) 2003-04-17 2008-04-02 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置、デバイス製造方法、およびコンピュータ・プログラム
SG115678A1 (en) 2003-04-22 2005-10-28 Asml Netherlands Bv Substrate carrier and method for making a substrate carrier
EP1475666A1 (de) 2003-05-06 2004-11-10 ASML Netherlands B.V. Substrathalter für einen lithographischen Apparat
EP1475667A1 (de) 2003-05-09 2004-11-10 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
JP4552853B2 (ja) 2003-05-15 2010-09-29 株式会社ニコン 露光装置及びデバイス製造方法
EP1477861A1 (de) 2003-05-16 2004-11-17 ASML Netherlands B.V. Verfahren zur Eichung eines lithographischen Geräts, Ausrichtverfahren, Komputerprogramm, lithographisches Gerät und Verfahren zur Herstellung einer Vorrichtung
TWI503865B (zh) 2003-05-23 2015-10-11 尼康股份有限公司 A method of manufacturing an exposure apparatus and an element
US7213963B2 (en) 2003-06-09 2007-05-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1486828B1 (de) 2003-06-09 2013-10-09 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
US7317504B2 (en) 2004-04-08 2008-01-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1486824A1 (de) 2003-06-11 2004-12-15 ASML Netherlands B.V. Bewegliches Trägersystem für einen lithographischen Belichtungsapparat, lithographischer Belichtungssapparat und Verfahren zur Herstellung einer Vorrichtung
US7684008B2 (en) 2003-06-11 2010-03-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20070103529A1 (en) * 2003-06-16 2007-05-10 Kornit Digital Ltd. Process and system for printing images on absorptive surfaces
US20070104899A1 (en) * 2003-06-16 2007-05-10 Kornit Digital Ltd. Process for printing images on dark surfaces
US20070103528A1 (en) * 2003-06-16 2007-05-10 Kornit Digital Ltd. Ink composition
IL162231A (en) * 2004-05-30 2007-05-15 Kornit Digital Ltd Direct digital printing process of jet propulsion inkjet on a wet fabric section
TWI433212B (zh) * 2003-06-19 2014-04-01 尼康股份有限公司 An exposure apparatus, an exposure method, and an element manufacturing method
EP1491967A1 (de) 2003-06-27 2004-12-29 ASML Netherlands B.V. Verfahren und Vorrichtung zur Positionierung eines Substrats auf einem Substrattisch
TWI251129B (en) 2003-06-27 2006-03-11 Asml Netherlands Bv Lithographic apparatus and integrated circuit manufacturing method
DE60321779D1 (de) 2003-06-30 2008-08-07 Asml Netherlands Bv Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
US7355673B2 (en) 2003-06-30 2008-04-08 Asml Masktools B.V. Method, program product and apparatus of simultaneous optimization for NA-Sigma exposure settings and scattering bars OPC using a device layout
JP4520787B2 (ja) 2003-06-30 2010-08-11 エーエスエムエル マスクツールズ ビー.ブイ. 半波長以下リソグラフィ模様付けの改良型散乱バーopc適用方法
TWI284253B (en) 2003-07-01 2007-07-21 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
TWI260154B (en) * 2003-07-03 2006-08-11 Fuji Photo Film Co Ltd Image forming device
KR101296501B1 (ko) * 2003-07-09 2013-08-13 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
EP1500979A1 (de) 2003-07-21 2005-01-26 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung eines Artikels
EP1500987A1 (de) 2003-07-21 2005-01-26 ASML Netherlands B.V. Lithographischer Apparat, Verfahren zur Herstellung eines Artikels und damit hergestellter Artikel
US7384149B2 (en) 2003-07-21 2008-06-10 Asml Netherlands B.V. Lithographic projection apparatus, gas purging method and device manufacturing method and purge gas supply system
TWI245170B (en) 2003-07-22 2005-12-11 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and device manufactured thereby
EP1500980A1 (de) 2003-07-22 2005-01-26 ASML Netherlands B.V. Lithographischer Projektionsapparat, Verfahren zur Herstellung eines Artikels und dabei erzeugter Artikel
KR100697299B1 (ko) 2003-07-23 2007-03-20 에이에스엠엘 네델란즈 비.브이. 리소그래피 장치, 디바이스 제조방법 및 그에 따라 제조된디바이스
KR101641011B1 (ko) 2003-07-28 2016-07-19 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법, 그리고 노광 장치의 제어 방법
JP2005057294A (ja) 2003-08-07 2005-03-03 Asml Netherlands Bv インタフェースユニット、該インタフェースユニットを含むリソグラフィ投影装置、及びデバイス製造方法
CN100468624C (zh) * 2003-08-07 2009-03-11 株式会社尼康 曝光方法及曝光装置、载置台装置、及设备制造方法
JP4146825B2 (ja) 2003-08-27 2008-09-10 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィック装置、デバイス製造方法及びスライド・アセンブリ
TWI245163B (en) 2003-08-29 2005-12-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
KR101371917B1 (ko) 2003-09-03 2014-03-07 가부시키가이샤 니콘 액침 리소그래피용 유체를 제공하기 위한 장치 및 방법
US8064730B2 (en) 2003-09-22 2011-11-22 Asml Netherlands B.V. Device manufacturing method, orientation determination method and lithographic apparatus
US7414759B2 (en) * 2003-11-26 2008-08-19 Samsung Electronics Co., Ltd. Scanner linearity tester
US7253077B2 (en) 2003-12-01 2007-08-07 Asml Netherlands B.V. Substrate, method of preparing a substrate, method of measurement, lithographic apparatus, device manufacturing method and device manufactured thereby, and machine-readable storage medium
US7565219B2 (en) 2003-12-09 2009-07-21 Asml Netherlands B.V. Lithographic apparatus, method of determining a model parameter, device manufacturing method, and device manufactured thereby
US7288779B2 (en) 2003-12-17 2007-10-30 Asml Netherlands B.V. Method for position determination, method for overlay optimization, and lithographic projection apparatus
US20050134865A1 (en) 2003-12-17 2005-06-23 Asml Netherlands B.V. Method for determining a map, device manufacturing method, and lithographic apparatus
US7113255B2 (en) 2003-12-19 2006-09-26 Asml Holding N.V. Grating patch arrangement, lithographic apparatus, method of testing, device manufacturing method, and device manufactured thereby
US7193722B2 (en) * 2003-12-30 2007-03-20 Asml Netherlands B.V. Lithographic apparatus with disturbance correction system and device manufacturing method
US7349101B2 (en) 2003-12-30 2008-03-25 Asml Netherlands B.V. Lithographic apparatus, overlay detector, device manufacturing method, and device manufactured thereby
US7145641B2 (en) 2003-12-31 2006-12-05 Asml Netherlands, B.V. Lithographic apparatus, device manufacturing method, and device manufactured thereby
US7256873B2 (en) 2004-01-28 2007-08-14 Asml Netherlands B.V. Enhanced lithographic resolution through double exposure
US7221433B2 (en) 2004-01-28 2007-05-22 Nikon Corporation Stage assembly including a reaction assembly having a connector assembly
US7589822B2 (en) * 2004-02-02 2009-09-15 Nikon Corporation Stage drive method and stage unit, exposure apparatus, and device manufacturing method
US7607745B2 (en) * 2004-02-12 2009-10-27 Kornit Digital Ltd. Digital printing machine
US7352472B2 (en) 2004-02-18 2008-04-01 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method, and method for determining z-displacement
US7113256B2 (en) 2004-02-18 2006-09-26 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method with feed-forward focus control
US20070030467A1 (en) * 2004-02-19 2007-02-08 Nikon Corporation Exposure apparatus, exposure method, and device fabricating method
JP4572896B2 (ja) * 2004-02-19 2010-11-04 株式会社ニコン 露光装置及びデバイスの製造方法
CN100524616C (zh) * 2004-02-19 2009-08-05 株式会社尼康 曝光装置、曝光方法以及元件制造方法
WO2005081295A1 (ja) * 2004-02-20 2005-09-01 Nikon Corporation 露光方法、露光装置及び露光システム並びにデバイス製造方法
US7625675B2 (en) 2004-02-25 2009-12-01 Oerlikon Trading Ag, Trubbach Method for producing masks for photolithography and the use of such masks
US7184123B2 (en) 2004-03-24 2007-02-27 Asml Netherlands B.V. Lithographic optical system
TWI402893B (zh) * 2004-03-25 2013-07-21 尼康股份有限公司 曝光方法
US7856606B2 (en) 2004-03-31 2010-12-21 Asml Masktools B.V. Apparatus, method and program product for suppressing waviness of features to be printed using photolithographic systems
US7034917B2 (en) * 2004-04-01 2006-04-25 Asml Netherlands B.V. Lithographic apparatus, device manufacturing method and device manufactured thereby
EP1747499A2 (de) * 2004-05-04 2007-01-31 Nikon Corporation Vorrichtung und verfahren zur bereitstellung eines fluids für die immersionslithographie
JP2005327993A (ja) * 2004-05-17 2005-11-24 Canon Inc 位置決め装置、露光装置及びデバイス製造方法
US7486381B2 (en) * 2004-05-21 2009-02-03 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US11447648B2 (en) 2004-05-30 2022-09-20 Kornit Digital Ltd. Process and system for printing images on absorptive surfaces
KR101433496B1 (ko) 2004-06-09 2014-08-22 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
EP1780771A1 (de) * 2004-06-25 2007-05-02 Nikon Corporation Ausrichtungsvorrichtung, ausrichtungsverafhren, belichtungsvorrichtung, belichtungsverfahren und bauelementeherstellungsverfahren
US7403264B2 (en) 2004-07-08 2008-07-22 Asml Netherlands B.V. Lithographic projection apparatus and a device manufacturing method using such lithographic projection apparatus
KR101433491B1 (ko) 2004-07-12 2014-08-22 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
EP1788694A4 (de) * 2004-07-15 2014-07-02 Nikon Corp Planarmotorgerät, bühnengerät, belichtungsgerät und bauelementeherstellungsverfahren
US20080013060A1 (en) * 2004-07-23 2008-01-17 Nikon Corporation Support Apparatus, Stage Apparatus, Exposure Apparatus, And Device Manufacturing Method
US8305553B2 (en) * 2004-08-18 2012-11-06 Nikon Corporation Exposure apparatus and device manufacturing method
US7701550B2 (en) 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP3306647A1 (de) * 2004-10-15 2018-04-11 Nikon Corporation Belichtungsvorrichtung und vorrichtungsherstellungsverfahren
US7262831B2 (en) 2004-12-01 2007-08-28 Asml Netherlands B.V. Lithographic projection apparatus and device manufacturing method using such lithographic projection apparatus
US20060119811A1 (en) 2004-12-07 2006-06-08 Asml Netherlands B.V. Radiation exposure apparatus comprising a gas flushing system
US7397533B2 (en) * 2004-12-07 2008-07-08 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7453063B2 (en) * 2004-12-08 2008-11-18 Asml Netherlands B.V. Calibration substrate and method for calibrating a lithographic apparatus
US7355675B2 (en) * 2004-12-29 2008-04-08 Asml Netherlands B.V. Method for measuring information about a substrate, and a substrate for use in a lithographic apparatus
US7193683B2 (en) 2005-01-06 2007-03-20 Nikon Corporation Stage design for reflective optics
JP2006202825A (ja) * 2005-01-18 2006-08-03 Jsr Corp 液浸型露光装置
JP2006202920A (ja) * 2005-01-19 2006-08-03 National Institute Of Information & Communication Technology 加工装置
JP4565271B2 (ja) * 2005-01-31 2010-10-20 株式会社ニコン 露光方法、露光装置、及びデバイス製造方法
US8692973B2 (en) * 2005-01-31 2014-04-08 Nikon Corporation Exposure apparatus and method for producing device
KR20180125636A (ko) * 2005-01-31 2018-11-23 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
US20070258068A1 (en) * 2005-02-17 2007-11-08 Hiroto Horikawa Exposure Apparatus, Exposure Method, and Device Fabricating Method
US7548302B2 (en) 2005-03-29 2009-06-16 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20070085984A1 (en) * 2005-10-18 2007-04-19 Asml Netherlands B.V. Lithographic projection apparatus, device manufacturing method and device manufactured thereby
US7317506B2 (en) 2005-03-29 2008-01-08 Asml Netherlands B.V. Variable illumination source
JP4922638B2 (ja) * 2005-03-29 2012-04-25 エーエスエムエル ネザーランズ ビー.ブイ. リソグラフィ装置、シール、デバイス製造方法、コンピュータプログラム、およびデータ記録媒体
JP4677267B2 (ja) * 2005-04-04 2011-04-27 キヤノン株式会社 平面ステージ装置及び露光装置
USRE43576E1 (en) 2005-04-08 2012-08-14 Asml Netherlands B.V. Dual stage lithographic apparatus and device manufacturing method
US7738075B2 (en) 2005-05-23 2010-06-15 Asml Netherlands B.V. Lithographic attribute enhancement
US7838858B2 (en) 2005-05-31 2010-11-23 Nikon Corporation Evaluation system and method of a search operation that detects a detection subject on an object
US20070074635A1 (en) * 2005-08-25 2007-04-05 Molecular Imprints, Inc. System to couple a body and a docking plate
US7665981B2 (en) * 2005-08-25 2010-02-23 Molecular Imprints, Inc. System to transfer a template transfer body between a motion stage and a docking plate
US20070064384A1 (en) * 2005-08-25 2007-03-22 Molecular Imprints, Inc. Method to transfer a template transfer body between a motion stage and a docking plate
US20070046917A1 (en) 2005-08-31 2007-03-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method that compensates for reticle induced CDU
KR101388345B1 (ko) 2005-09-09 2014-04-22 가부시키가이샤 니콘 노광 장치 및 노광 방법, 그리고 디바이스 제조 방법
US7948675B2 (en) * 2005-10-11 2011-05-24 Nikon Corporation Surface-corrected multilayer-film mirrors with protected reflective surfaces, exposure systems comprising same, and associated methods
US8011915B2 (en) 2005-11-04 2011-09-06 Asml Netherlands B.V. Imprint lithography
KR20080066836A (ko) 2005-11-09 2008-07-16 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
JP5194799B2 (ja) 2005-12-06 2013-05-08 株式会社ニコン 露光方法、露光装置、及びデバイス製造方法
KR100768849B1 (ko) * 2005-12-06 2007-10-22 엘지전자 주식회사 계통 연계형 연료전지 시스템의 전원공급장치 및 방법
KR101539517B1 (ko) 2005-12-08 2015-07-24 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
US7626181B2 (en) 2005-12-09 2009-12-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8953148B2 (en) 2005-12-28 2015-02-10 Nikon Corporation Exposure apparatus and making method thereof
CN102636966B (zh) 2005-12-28 2014-12-03 株式会社尼康 曝光方法及曝光装置、以及元件制造方法
US7649611B2 (en) 2005-12-30 2010-01-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP2857902B1 (de) * 2006-01-19 2016-04-20 Nikon Corporation Immersionsbelichtungsvorrichtung, Immersionsbelichtungsverfahren, und Verfahren zur Herstellung einer Vorrichtung
JP5077770B2 (ja) 2006-03-07 2012-11-21 株式会社ニコン デバイス製造方法、デバイス製造システム及び測定検査装置
US7598024B2 (en) 2006-03-08 2009-10-06 Asml Netherlands B.V. Method and system for enhanced lithographic alignment
EP1843202B1 (de) 2006-04-06 2015-02-18 ASML Netherlands B.V. Verfahren zur Durchführung von Dunkelfeld-Doppeldipollithografie
CN100504614C (zh) * 2006-04-14 2009-06-24 上海微电子装备有限公司 步进扫描光刻机双台交换定位系统
TW200746259A (en) 2006-04-27 2007-12-16 Nikon Corp Measuring and/or inspecting method, measuring and/or inspecting apparatus, exposure method, device manufacturing method, and device manufacturing apparatus
US7583359B2 (en) 2006-05-05 2009-09-01 Asml Netherlands B.V. Reduction of fit error due to non-uniform sample distribution
SG172681A1 (en) 2006-06-09 2011-07-28 Nikon Corp Movable-body apparatus, exposure apparatus, exposure method, and device manufacturing method
US7697115B2 (en) 2006-06-23 2010-04-13 Asml Holding N.V. Resonant scanning mirror
CN2938172Y (zh) * 2006-07-18 2007-08-22 上海微电子装备有限公司 双台轮换曝光精密定位系统
US7675201B2 (en) * 2006-07-25 2010-03-09 Asml Netherlands B.V. Lithographic apparatus with planar motor driven support
EP2071611B1 (de) 2006-08-31 2019-05-01 Nikon Corporation Mobilkörperantriebssystem und mobilkörperantriebsverfahren, strukturerzeugungsvorrichtung und verfahren, belichtungsvorrichtung und verfahren, bauelementeherstellungsverfahren und entscheidungsverfahren
TWI597585B (zh) 2006-08-31 2017-09-01 Nippon Kogaku Kk Exposure method and exposure apparatus, and device manufacturing method
SG10201407395SA (en) 2006-08-31 2014-12-30 Nikon Corp Movable Body Drive Method And Movable Body Drive System, Pattern Formation Method And Apparatus, Exposure Method And Apparatus, And Device Manufacturing Method
KR101770082B1 (ko) 2006-09-01 2017-08-21 가부시키가이샤 니콘 이동체 구동 방법 및 이동체 구동 시스템, 패턴 형성 방법 및 장치, 노광 방법 및 장치, 디바이스 제조 방법, 그리고 캘리브레이션 방법
SG10201407218XA (en) 2006-09-01 2015-01-29 Nippon Kogaku Kk Movable Body Drive Method And Movable Body Drive System, Pattern Formation Method And Apparatus, Exposure Method And Apparatus, And Device Manufacturing Method
US7592760B2 (en) * 2006-09-11 2009-09-22 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US7872730B2 (en) 2006-09-15 2011-01-18 Nikon Corporation Immersion exposure apparatus and immersion exposure method, and device manufacturing method
JP5120377B2 (ja) * 2006-09-29 2013-01-16 株式会社ニコン 露光装置及び露光方法、並びにデバイス製造方法
US20080158531A1 (en) 2006-11-15 2008-07-03 Nikon Corporation Exposure apparatus, exposure method, and method for producing device
US20080212047A1 (en) * 2006-12-28 2008-09-04 Nikon Corporation Exposure apparatus, exposing method, and device fabricating method
US8004651B2 (en) 2007-01-23 2011-08-23 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
CN101012549B (zh) * 2007-01-29 2010-05-19 尤耀明 硅片生产中的载片器
JP2010519722A (ja) * 2007-02-23 2010-06-03 株式会社ニコン 露光方法、露光装置、デバイス製造方法、及び液浸露光用基板
US20080225248A1 (en) * 2007-03-15 2008-09-18 Nikon Corporation Apparatus, systems and methods for removing liquid from workpiece during workpiece processing
US8237911B2 (en) * 2007-03-15 2012-08-07 Nikon Corporation Apparatus and methods for keeping immersion fluid adjacent to an optical assembly during wafer exchange in an immersion lithography machine
US8497980B2 (en) * 2007-03-19 2013-07-30 Nikon Corporation Holding apparatus, exposure apparatus, exposure method, and device manufacturing method
US8134685B2 (en) * 2007-03-23 2012-03-13 Nikon Corporation Liquid recovery system, immersion exposure apparatus, immersion exposing method, and device fabricating method
US20080246941A1 (en) * 2007-04-06 2008-10-09 Katsura Otaki Wavefront aberration measuring device, projection exposure apparatus, method for manufacturing projection optical system, and method for manufacturing device
US8194322B2 (en) * 2007-04-23 2012-06-05 Nikon Corporation Multilayer-film reflective mirror, exposure apparatus, device manufacturing method, and manufacturing method of multilayer-film reflective mirror
US20080266651A1 (en) * 2007-04-24 2008-10-30 Katsuhiko Murakami Optical apparatus, multilayer-film reflective mirror, exposure apparatus, and device
US8300207B2 (en) * 2007-05-17 2012-10-30 Nikon Corporation Exposure apparatus, immersion system, exposing method, and device fabricating method
US20090122282A1 (en) * 2007-05-21 2009-05-14 Nikon Corporation Exposure apparatus, liquid immersion system, exposing method, and device fabricating method
WO2008146819A1 (ja) * 2007-05-28 2008-12-04 Nikon Corporation 露光装置、デバイス製造方法、洗浄装置、及びクリーニング方法並びに露光方法
TW200907597A (en) * 2007-06-04 2009-02-16 Nikon Corp Environmental control apparatus, stage apparatus, exposure apparatus and device manufacturing method
WO2008153023A1 (ja) * 2007-06-11 2008-12-18 Nikon Corporation 計測部材、センサ、計測方法、露光装置、露光方法、及びデバイス製造方法
US9550374B1 (en) 2007-06-27 2017-01-24 Cafepress Inc. System and method for improved digital printing on textiles
CN100470379C (zh) * 2007-07-19 2009-03-18 清华大学 一种光刻机硅片台双台交换系统
US9025126B2 (en) * 2007-07-31 2015-05-05 Nikon Corporation Exposure apparatus adjusting method, exposure apparatus, and device fabricating method
WO2009028494A1 (ja) 2007-08-28 2009-03-05 Nikon Corporation 位置検出装置、位置検出方法、露光装置、およびデバイス製造方法
KR20100072015A (ko) * 2007-09-07 2010-06-29 내셔널 유니버서티 코포레이션 요코하마 내셔널 유니버서티 구동 제어 방법, 구동 제어 장치, 스테이지 제어 방법, 스테이지 제어 장치, 노광 방법, 노광 장치 및 계측 장치
US8711327B2 (en) * 2007-12-14 2014-04-29 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
SG183058A1 (en) * 2007-12-17 2012-08-30 Nikon Corp Exposure apparatus, exposure method and device manufacturing method
US8964166B2 (en) * 2007-12-17 2015-02-24 Nikon Corporation Stage device, exposure apparatus and method of producing device
US20090174873A1 (en) * 2007-12-17 2009-07-09 Nikon Corporation Exposure apparatus, exposure method and device manufacturing method
US8451425B2 (en) * 2007-12-28 2013-05-28 Nikon Corporation Exposure apparatus, exposure method, cleaning apparatus, and device manufacturing method
CN101681809B (zh) * 2007-12-28 2012-04-25 株式会社尼康 曝光装置、曝光方法以及器件制造方法
US8237916B2 (en) * 2007-12-28 2012-08-07 Nikon Corporation Movable body drive system, pattern formation apparatus, exposure apparatus and exposure method, and device manufacturing method
JP5369443B2 (ja) 2008-02-05 2013-12-18 株式会社ニコン ステージ装置、露光装置、露光方法、及びデバイス製造方法
US20090218743A1 (en) * 2008-02-29 2009-09-03 Nikon Corporation Substrate holding apparatus, exposure apparatus, exposing method, device fabricating method, plate member, and wall
NL1036557A1 (nl) 2008-03-11 2009-09-14 Asml Netherlands Bv Method and lithographic apparatus for measuring and acquiring height data relating to a substrate surface.
US20100039628A1 (en) * 2008-03-19 2010-02-18 Nikon Corporation Cleaning tool, cleaning method, and device fabricating method
US8233139B2 (en) * 2008-03-27 2012-07-31 Nikon Corporation Immersion system, exposure apparatus, exposing method, and device fabricating method
KR20100128352A (ko) * 2008-04-11 2010-12-07 가부시키가이샤 니콘 스테이지장치, 노광장치 및 디바이스 제조방법
US8654306B2 (en) * 2008-04-14 2014-02-18 Nikon Corporation Exposure apparatus, cleaning method, and device fabricating method
NL1036647A1 (nl) 2008-04-16 2009-10-19 Asml Netherlands Bv A method of measuring a lithographic projection apparatus.
NL1036891A1 (nl) 2008-05-02 2009-11-03 Asml Netherlands Bv Dichroic mirror, method for manufacturing a dichroic mirror, lithographic apparatus, semiconductor device and method of manufacturing therefor.
US9176393B2 (en) 2008-05-28 2015-11-03 Asml Netherlands B.V. Lithographic apparatus and a method of operating the apparatus
NL2002935A1 (nl) 2008-06-27 2009-12-29 Asml Netherlands Bv Object support positioning device and lithographic apparatus.
TW201003053A (en) * 2008-07-10 2010-01-16 Nikon Corp Deformation measuring apparatus, exposure apparatus, jig for deformation measuring apparatus, position measuring method and device manufacturing method
US20100045949A1 (en) * 2008-08-11 2010-02-25 Nikon Corporation Exposure apparatus, maintaining method and device fabricating method
US20100053588A1 (en) * 2008-08-29 2010-03-04 Nikon Corporation Substrate Stage movement patterns for high throughput While Imaging a Reticle to a pair of Imaging Locations
DE102009045008A1 (de) 2008-10-15 2010-04-29 Carl Zeiss Smt Ag EUV-Lithographievorrichtung und Verfahren zum Bearbeiten einer Maske
US8896806B2 (en) 2008-12-29 2014-11-25 Nikon Corporation Exposure apparatus, exposure method, and device manufacturing method
US20100196832A1 (en) 2009-01-30 2010-08-05 Nikon Corporation Exposure apparatus, exposing method, liquid immersion member and device fabricating method
JP5482784B2 (ja) 2009-03-10 2014-05-07 株式会社ニコン 露光装置、露光方法、及びデバイス製造方法
CN101551598B (zh) 2009-04-03 2010-12-01 清华大学 一种光刻机硅片台双台交换系统
CN101571676B (zh) 2009-04-03 2010-12-01 清华大学 一种光刻机硅片台双台交换系统
NL2004242A (en) 2009-04-13 2010-10-14 Asml Netherlands Bv Detector module, cooling arrangement and lithographic apparatus comprising a detector module.
NL2004322A (en) 2009-04-13 2010-10-14 Asml Netherlands Bv Cooling device, cooling arrangement and lithographic apparatus comprising a cooling arrangement.
US8953143B2 (en) * 2009-04-24 2015-02-10 Nikon Corporation Liquid immersion member
US8202671B2 (en) 2009-04-28 2012-06-19 Nikon Corporation Protective apparatus, mask, mask forming apparatus, mask forming method, exposure apparatus, device fabricating method, and foreign matter detecting apparatus
US20110085152A1 (en) * 2009-05-07 2011-04-14 Hideaki Nishino Vibration control apparatus, vibration control method, exposure apparatus, and device manufacturing method
US20100323303A1 (en) * 2009-05-15 2010-12-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, and device fabricating method
IT1399285B1 (it) * 2009-07-03 2013-04-11 Applied Materials Inc Sistema di lavorazione substrato
DE102009033319B4 (de) 2009-07-15 2019-02-21 Carl Zeiss Microscopy Gmbh Partikelstrahl-Mikroskopiesystem und Verfahren zum Betreiben desselben
CN104031476B (zh) 2009-08-10 2017-05-03 柯尼特数码有限公司 用于可拉伸基材的喷墨组合物及方法
US20110199591A1 (en) * 2009-10-14 2011-08-18 Nikon Corporation Exposure apparatus, exposing method, maintenance method and device fabricating method
KR20170113709A (ko) 2009-11-09 2017-10-12 가부시키가이샤 니콘 노광 장치, 노광 방법, 노광 장치의 메인터넌스 방법, 노광 장치의 조정 방법, 및 디바이스 제조 방법
CN101727019B (zh) * 2009-12-15 2011-05-11 清华大学 光刻机硅片台双台交换系统及其交换方法
CN103135365A (zh) 2009-12-28 2013-06-05 株式会社尼康 液浸构件、液浸构件的制造方法、曝光装置、及元件制造方法
CN102714141B (zh) 2010-01-08 2016-03-23 株式会社尼康 液浸构件、曝光装置、曝光方法及元件制造方法
US20110222031A1 (en) * 2010-03-12 2011-09-15 Nikon Corporation Liquid immersion member, exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
NL2006285A (en) * 2010-03-31 2011-10-03 Asml Netherlands Bv Lithographic apparatus, device manufacturing method, and substrate exchanging method.
EP2381310B1 (de) 2010-04-22 2015-05-06 ASML Netherlands BV Flüssigkeitshandhabungsstruktur und lithographischer Apparat
US20120013863A1 (en) 2010-07-14 2012-01-19 Nikon Corporation Liquid immersion member, immersion exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
US20120013864A1 (en) 2010-07-14 2012-01-19 Nikon Corporation Liquid immersion member, immersion exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
US8937703B2 (en) 2010-07-14 2015-01-20 Nikon Corporation Liquid immersion member, immersion exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
US20120012191A1 (en) 2010-07-16 2012-01-19 Nikon Corporation Liquid recovery apparatus, exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
US20120019803A1 (en) 2010-07-23 2012-01-26 Nikon Corporation Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program, and storage medium
US20120019804A1 (en) 2010-07-23 2012-01-26 Nikon Corporation Cleaning method, cleaning apparatus, device fabricating method, program, and storage medium
US20120019802A1 (en) 2010-07-23 2012-01-26 Nikon Corporation Cleaning method, immersion exposure apparatus, device fabricating method, program, and storage medium
US8926080B2 (en) 2010-08-10 2015-01-06 Kornit Digital Ltd. Formaldehyde-free inkjet compositions and processes
EP2469339B1 (de) 2010-12-21 2017-08-30 ASML Netherlands B.V. Lithographischer Apparat und Verfahren zur Herstellung einer Vorrichtung
US20120188521A1 (en) 2010-12-27 2012-07-26 Nikon Corporation Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program and storage medium
US20120162619A1 (en) 2010-12-27 2012-06-28 Nikon Corporation Liquid immersion member, immersion exposure apparatus, exposing method, device fabricating method, program, and storage medium
JPWO2012115002A1 (ja) 2011-02-22 2014-07-07 株式会社ニコン 保持装置、露光装置、及びデバイスの製造方法
US20130016329A1 (en) 2011-07-12 2013-01-17 Nikon Corporation Exposure apparatus, exposure method, measurement method, and device manufacturing method
US9329496B2 (en) 2011-07-21 2016-05-03 Nikon Corporation Exposure apparatus, exposure method, method of manufacturing device, program, and storage medium
US9256137B2 (en) 2011-08-25 2016-02-09 Nikon Corporation Exposure apparatus, liquid holding method, and device manufacturing method
US20130050666A1 (en) 2011-08-26 2013-02-28 Nikon Corporation Exposure apparatus, liquid holding method, and device manufacturing method
WO2013073538A1 (ja) 2011-11-17 2013-05-23 株式会社ニコン エンコーダ装置、移動量計測方法、光学装置、並びに露光方法及び装置
US20130135594A1 (en) 2011-11-25 2013-05-30 Nikon Corporation Liquid immersion member, immersion exposure apparatus, exposure method, device manufacturing method, program, and recording medium
US20130169944A1 (en) 2011-12-28 2013-07-04 Nikon Corporation Exposure apparatus, exposure method, device manufacturing method, program, and recording medium
US9360772B2 (en) 2011-12-29 2016-06-07 Nikon Corporation Carrier method, exposure method, carrier system and exposure apparatus, and device manufacturing method
US9207549B2 (en) 2011-12-29 2015-12-08 Nikon Corporation Exposure apparatus and exposure method, and device manufacturing method with encoder of higher reliability for position measurement
US9753381B2 (en) 2012-03-27 2017-09-05 Asml Netherlands B.V. Substrate table system, lithographic apparatus and substrate table swapping method
US9268231B2 (en) 2012-04-10 2016-02-23 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9323160B2 (en) 2012-04-10 2016-04-26 Nikon Corporation Liquid immersion member, exposure apparatus, exposure method, device fabricating method, program, and recording medium
US9606447B2 (en) 2012-05-21 2017-03-28 Nikon Corporation Reflective mirror, projection optical system, exposure apparatus, and device manufacturing method
US9823580B2 (en) 2012-07-20 2017-11-21 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method for manufacturing device, program, and recording medium
US9494870B2 (en) 2012-10-12 2016-11-15 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9568828B2 (en) 2012-10-12 2017-02-14 Nikon Corporation Exposure apparatus, exposing method, device manufacturing method, program, and recording medium
US9720331B2 (en) 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
JP6119242B2 (ja) 2012-12-27 2017-04-26 株式会社ニコン 露光装置、露光方法、及びデバイス製造方法
US9651873B2 (en) 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9352073B2 (en) 2013-01-22 2016-05-31 Niko Corporation Functional film
US9057955B2 (en) 2013-01-22 2015-06-16 Nikon Corporation Functional film, liquid immersion member, method of manufacturing liquid immersion member, exposure apparatus, and device manufacturing method
WO2014132923A1 (ja) 2013-02-28 2014-09-04 株式会社ニコン 摺動膜、摺動膜が形成された部材、及びその製造方法
JP5344105B1 (ja) 2013-03-08 2013-11-20 ウシオ電機株式会社 光配向用偏光光照射装置及び光配向用偏光光照射方法
WO2014181858A1 (ja) 2013-05-09 2014-11-13 株式会社ニコン 光学素子、投影光学系、露光装置及びデバイス製造方法
KR101854055B1 (ko) 2013-07-05 2018-05-02 가부시키가이샤 니콘 다층막 반사경, 다층막 반사경의 제조 방법, 투영 광학계, 노광 장치, 디바이스의 제조 방법
JP6369472B2 (ja) 2013-10-08 2018-08-08 株式会社ニコン 液浸部材、露光装置及び露光方法、並びにデバイス製造方法
CN106483778B (zh) 2015-08-31 2018-03-30 上海微电子装备(集团)股份有限公司 基于相对位置测量的对准系统、双工件台系统及测量系统
KR102047429B1 (ko) 2015-12-07 2019-11-21 에이에스엠엘 홀딩 엔.브이. 대물렌즈 시스템
BR112019008862A2 (pt) 2016-10-31 2019-09-17 Kornit Digital Ltd processo de impressão por jato de tinta direto de uma imagem em um substrato absorvente, composição de tinta de sublimação de cor, kit de impressão por jato de tinta e máquina de impressão digital
WO2018168923A1 (ja) 2017-03-16 2018-09-20 株式会社ニコン 制御装置及び制御方法、露光装置及び露光方法、デバイス製造方法、データ生成方法、並びに、プログラム
EP3701082A4 (de) 2017-10-22 2021-10-13 Kornit Digital Ltd. Reibungsarme bilder durch tintenstrahldruck
CN111965945A (zh) * 2020-08-12 2020-11-20 Tcl华星光电技术有限公司 曝光平台装置及曝光机

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3679874A (en) 1970-07-06 1972-07-25 Bendix Corp Automatic baggage handling system
US4236851A (en) * 1978-01-05 1980-12-02 Kasper Instruments, Inc. Disc handling system and method
JPS6018918A (ja) 1983-07-13 1985-01-31 Canon Inc ステージ装置
GB2155201B (en) * 1984-02-24 1988-07-13 Canon Kk An x-ray exposure apparatus
JP2960423B2 (ja) 1988-11-16 1999-10-06 株式会社日立製作所 試料移動装置及び半導体製造装置
DE69009841T2 (de) 1989-04-17 1994-12-22 Sharp K.K., Osaka Linearantriebsgerät.
JPH03273607A (ja) 1990-03-23 1991-12-04 Canon Inc 移動テーブル装置
NL9100202A (nl) 1991-02-05 1992-09-01 Asm Lithography Bv Lithografische inrichting met een hangende objecttafel.
US5301013A (en) 1991-07-30 1994-04-05 U.S. Philips Corporation Positioning device having two manipulators operating in parallel, and optical lithographic device provided with such a positioning device
US5715064A (en) * 1994-06-17 1998-02-03 International Business Machines Corporation Step and repeat apparatus having enhanced accuracy and increased throughput
JP3800616B2 (ja) 1994-06-27 2006-07-26 株式会社ニコン 目標物移動装置、位置決め装置及び可動ステージ装置
US5826129A (en) * 1994-06-30 1998-10-20 Tokyo Electron Limited Substrate processing system
US5763966A (en) 1995-03-15 1998-06-09 Hinds; Walter E. Single plane motor system generating orthogonal movement
JP3571471B2 (ja) * 1996-09-03 2004-09-29 東京エレクトロン株式会社 処理方法,塗布現像処理システム及び処理システム
EP1197801B1 (de) * 1996-12-24 2005-12-28 ASML Netherlands B.V. Lithographisches Gerät mit zwei Objekthaltern
USRE40043E1 (en) * 1997-03-10 2008-02-05 Asml Netherlands B.V. Positioning device having two object holders

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USRE40043E1 (en) 2008-02-05
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US6262796B1 (en) 2001-07-17
WO1998040791A1 (en) 1998-09-17
JP3626504B2 (ja) 2005-03-09
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EP0900412A1 (de) 1999-03-10
TW452546B (en) 2001-09-01

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