DE602004016159D1 - Testeinrichtung - Google Patents

Testeinrichtung

Info

Publication number: DE602004016159D1
Authority: DE; Germany
Prior art keywords: test facility; facility; test
Prior art date: 2003-06-06
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE602004016159T

Other languages

English (en)

Inventor

Noriaki Chiba

Yasutaka Tsuruki

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Advantest Corp

Original Assignee

Advantest Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2003-06-06

Filing date

2004-06-04

Publication date

2008-10-09

2004-06-04 Application filed by Advantest Corp filed Critical Advantest Corp

2008-10-09 Publication of DE602004016159D1 publication Critical patent/DE602004016159D1/de

2024-06-05 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31928—Formatter
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
General Engineering & Computer Science (AREA)
Manufacturing & Machinery (AREA)
Computer Hardware Design (AREA)
Microelectronics & Electronic Packaging (AREA)
Power Engineering (AREA)
Tests Of Electronic Circuits (AREA)

DE602004016159T 2003-06-06 2004-06-04 Testeinrichtung Expired - Lifetime DE602004016159D1 (de)

Applications Claiming Priority (2)

Application Number	Priority Date	Filing Date	Title
JP2003162603A JP4293840B2 (ja)	2003-06-06	2003-06-06	試験装置
PCT/JP2004/007828 WO2004109309A1 (ja)	2003-06-06	2004-06-04	試験装置

Publications (1)

Publication Number	Publication Date
DE602004016159D1 true DE602004016159D1 (de)	2008-10-09

Family

ID=33508672

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE602004016159T Expired - Lifetime DE602004016159D1 (de)	2003-06-06	2004-06-04	Testeinrichtung

Country Status (7)

Country	Link
EP (1)	EP1640736B1 (de)
JP (1)	JP4293840B2 (de)
KR (1)	KR20060019575A (de)
CN (1)	CN100529784C (de)
DE (1)	DE602004016159D1 (de)
TW (1)	TWI330260B (de)
WO (1)	WO2004109309A1 (de)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2007107988A (ja) *	2005-10-13	2007-04-26	Yokogawa Electric Corp	テスタ
TWI369652B (en)	2008-04-25	2012-08-01	Novatek Microelectronics Corp	Data transformation method and related device for a testing system
CN101577643B (zh) *	2008-05-06	2012-03-21	联咏科技股份有限公司	用于一测试系统的数据转换方法及其相关数据转换装置
JP5202628B2 (ja) *	2008-06-02	2013-06-05	株式会社アドバンテスト	試験装置、伝送回路、試験装置の制御方法および伝送回路の制御方法
WO2010032440A1 (ja)	2008-09-17	2010-03-25	株式会社アドバンテスト	試験装置およびドメイン間同期方法
WO2010095809A2 (ko) *	2009-02-20	2010-08-26	(주)큐엠씨	엘이디 칩 테스트장치
KR100935706B1 (ko) *	2009-06-29	2010-01-08	(주)큐엠씨	엘이디 칩 테스트장치 및 그 전달부재
CN101706538B (zh) *	2009-09-15	2012-01-04	东南大学	显示测试图形多通道时钟发生器
CN103809104B (zh) *	2012-11-09	2017-03-01	瑞昱半导体股份有限公司	扫描时脉产生器以及扫描时脉产生方法
KR101913469B1 (ko) *	2016-10-19	2018-10-30	국방과학연구소	운용 주파수가 다른 2종 전파 고도계 점검 시스템 및 방법

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS6147573A (ja) *	1984-08-13	1986-03-08	Advantest Corp	タイミング発生装置
JPH07209379A (ja) *	1994-01-21	1995-08-11	Advantest Corp	外部クロックに同期した半導体試験装置
US5654657A (en) *	1995-08-01	1997-08-05	Schlumberger Technologies Inc.	Accurate alignment of clocks in mixed-signal tester
JPH1114704A (ja) *	1997-06-24	1999-01-22	Advantest Corp	半導体試験装置
JPH11264857A (ja) *	1998-03-19	1999-09-28	Advantest Corp	半導体試験装置

2003
- 2003-06-06 JP JP2003162603A patent/JP4293840B2/ja not_active Expired - Fee Related
2004
- 2004-06-04 CN CNB2004800155810A patent/CN100529784C/zh not_active Expired - Lifetime
- 2004-06-04 EP EP04745604A patent/EP1640736B1/de not_active Expired - Lifetime
- 2004-06-04 WO PCT/JP2004/007828 patent/WO2004109309A1/ja not_active Ceased
- 2004-06-04 KR KR1020057023474A patent/KR20060019575A/ko not_active Ceased
- 2004-06-04 DE DE602004016159T patent/DE602004016159D1/de not_active Expired - Lifetime
- 2004-06-07 TW TW093116294A patent/TWI330260B/zh not_active IP Right Cessation

Also Published As

Publication number	Publication date
EP1640736B1 (de)	2008-08-27
EP1640736A4 (de)	2006-06-14
JP2004361343A (ja)	2004-12-24
JP4293840B2 (ja)	2009-07-08
TW200508635A (en)	2005-03-01
TWI330260B (en)	2010-09-11
KR20060019575A (ko)	2006-03-03
CN1802570A (zh)	2006-07-12
EP1640736A1 (de)	2006-03-29
WO2004109309A1 (ja)	2004-12-16
CN100529784C (zh)	2009-08-19

Publication	Publication Date	Title
FI20030101A0 (fi)	2003-01-22	Parannettu mittausjärjestely
DK1706767T3 (da)	2019-07-22	Optokobleranordning
DE602004016891D1 (de)	2008-11-13	Testvorrichtung
DE602004016671D1 (de)	2008-10-30	Testvorrichtung
DE502004005536D1 (de)	2007-12-27	Messvorrichtung
DE102004032906B8 (de)	2013-08-01	Kollision-Feststellvorrichtung
ATE520982T1 (de)	2011-09-15	Immuntest
EP1554591A4 (de)	2006-04-12	Nmr-vorrichtung
DE602004016159D1 (de)	2008-10-09	Testeinrichtung
DE602004010287D1 (de)	2008-01-03	Testvorrichtung
DE602004011490D1 (de)	2008-03-13	Testvorrichtung
EE00531U1 (et)	2005-07-15	Sulgev-reguleeriv seade
ATA2792002A (de)	2003-07-15	Temperaturfühler
DE60311818D1 (de)	2007-03-29	Materialprüfverfahren
DE60309128D1 (de)	2006-11-30	LSI-Testanordnung
DE602004004684D1 (de)	2007-03-29	Messvorrichtung
DE502004005315D1 (de)	2007-12-06	Kabelbearbeitungseinrichtung
DE502004004631D1 (de)	2007-09-27	Kabelbearbeitungseinrichtung
DE10394273D2 (de)	2006-03-30	Bauelement-Vorrichtung
DE112004003152A5 (de)	2014-09-04	Messvorrichtung
DE502004005012D1 (de)	2007-10-31	Kabelbearbeitungseinrichtung
DE502005006611D1 (de)	2009-03-26	Einrichtung
FR2852101B1 (fr)	2006-11-24	Pese-personne
DE602004019069D1 (de)	2009-03-05	Kernspintomograph
SE0300991L (sv)	2004-10-03	Anordning

Legal Events

Date	Code	Title	Description
2009-09-17	8364	No opposition during term of opposition