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DE60038033D1 - Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie - Google Patents

Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie

Info

Publication number
DE60038033D1
DE60038033D1 DE60038033T DE60038033T DE60038033D1 DE 60038033 D1 DE60038033 D1 DE 60038033D1 DE 60038033 T DE60038033 T DE 60038033T DE 60038033 T DE60038033 T DE 60038033T DE 60038033 D1 DE60038033 D1 DE 60038033D1
Authority
DE
Germany
Prior art keywords
analyte
ionization
atmospheric pressure
dopant
photoionisation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60038033T
Other languages
English (en)
Other versions
DE60038033T2 (de
Inventor
Damon B Robb
Andries Pieter Bruins
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nordion Inc
Original Assignee
MDS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by MDS Inc filed Critical MDS Inc
Publication of DE60038033D1 publication Critical patent/DE60038033D1/de
Application granted granted Critical
Publication of DE60038033T2 publication Critical patent/DE60038033T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Extraction Or Liquid Replacement (AREA)
DE60038033T 1999-10-29 2000-10-26 Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie Expired - Lifetime DE60038033T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16270999P 1999-10-29 1999-10-29
US162709P 1999-10-29
PCT/CA2000/001270 WO2001033605A2 (en) 1999-10-29 2000-10-26 Atmospheric pressure photoionization (appi): a new ionization method for liquid chromatography-mass spectrometry

Publications (2)

Publication Number Publication Date
DE60038033D1 true DE60038033D1 (de) 2008-03-27
DE60038033T2 DE60038033T2 (de) 2009-04-23

Family

ID=22586814

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60038033T Expired - Lifetime DE60038033T2 (de) 1999-10-29 2000-10-26 Atmosphärendruckphotoionisation : ein neues ionisationsverfahren für flüssigchromatographie-massenspekrometrie

Country Status (8)

Country Link
US (1) US6534765B1 (de)
EP (1) EP1226602B1 (de)
JP (1) JP4600909B2 (de)
AT (1) ATE386335T1 (de)
AU (1) AU772052B2 (de)
CA (1) CA2386832C (de)
DE (1) DE60038033T2 (de)
WO (1) WO2001033605A2 (de)

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US20040256550A1 (en) * 2003-01-27 2004-12-23 Finch Jeffrey W. Coaxial atmospheric pressure photoionization source for mass spectrometers
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US7332347B2 (en) 2003-04-14 2008-02-19 Liang Li Apparatus and method for concentrating and collecting analytes from a flowing liquid stream
JP4397396B2 (ja) * 2003-04-29 2010-01-13 ヤスミ・キャピタル，リミテッド・ライアビリティ・カンパニー レーザ光イオン化装置への直接液体注入口
DE102004025841B4 (de) * 2004-05-24 2015-07-09 Bruker Daltonik Gmbh Verfahren und Vorrichtung zur massenspektroskopischen Untersuchung von Analyten
JP4782796B2 (ja) * 2004-11-09 2011-09-28 イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー 質量分析計用イオン源
US20060255261A1 (en) * 2005-04-04 2006-11-16 Craig Whitehouse Atmospheric pressure ion source for mass spectrometry
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
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WO2007010261A1 (en) * 2005-07-20 2007-01-25 Smiths Detection-Watford Limited Detection systems
US7576322B2 (en) 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
FR2896585B1 (fr) * 2006-01-20 2008-12-05 Commissariat Energie Atomique Introduction d'additifs pour une interface d'ionisation a pression atmospherique en entree d'un spectrometre
JP4679389B2 (ja) * 2006-02-20 2011-04-27 株式会社日立ハイテクノロジーズ イオン化エネルギーの低い試料を検出する検出器及び分析装置
US7642510B2 (en) * 2006-08-22 2010-01-05 E.I. Du Pont De Nemours And Company Ion source for a mass spectrometer
US7880140B2 (en) * 2007-05-02 2011-02-01 Dh Technologies Development Pte. Ltd Multipole mass filter having improved mass resolution
KR100902946B1 (ko) * 2007-05-15 2009-06-15 (주)에이치시티 소프트 엑스레이 광이온화 하전기
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
EP2232213A4 (de) * 2007-12-13 2015-12-09 Academia Sinica System und verfahren zum durchführen von ladungsüberwachungs-massenspektrometrie
US8044346B2 (en) * 2007-12-21 2011-10-25 Licentia Oy Method and system for desorbing and ionizing chemical compounds from surfaces
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
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US8642952B2 (en) * 2009-11-10 2014-02-04 Waters Technologies Corporation Apparatus and methods for gas chromatography-mass spectrometry
FR2953927B1 (fr) * 2009-12-14 2012-02-03 Commissariat Energie Atomique Dispositif et procede de fabrication d'echantillon a partir d'un liquide
WO2011127126A1 (en) * 2010-04-09 2011-10-13 Waters Technologies Corporation Inspection method and device with heat exchangers
US8723111B2 (en) * 2011-09-29 2014-05-13 Morpho Detection, Llc Apparatus for chemical sampling and method of assembling the same
US9070542B2 (en) 2012-04-06 2015-06-30 Implant Sciences Corporation Selective ionization using high frequency filtering of reactive ions
JP2016511396A (ja) * 2013-01-31 2016-04-14 スミスズ ディテクション モントリオール インコーポレイティド 表面イオン化源
US20140340093A1 (en) * 2013-05-18 2014-11-20 Brechtel Manufacturing, Inc. Liquid ion detector
US20160372313A1 (en) * 2014-03-04 2016-12-22 Micromass Uk Limited Sample Introduction System for Spectrometers
KR102599775B1 (ko) * 2015-05-05 2023-11-07 더 리젠츠 오브 더 유니버시티 오브 미시건 마이크로 유체 광이온화 검출기
EP4357784A3 (de) 2016-09-02 2024-07-31 Board of Regents, The University of Texas System Erfassungssonde und verfahren zur verwendung davon
US11235329B2 (en) 2017-08-10 2022-02-01 Rapiscan Systems, Inc. Systems and methods for substance detection using thermally stable collection devices
IT201700115527A1 (it) 2017-10-13 2019-04-13 Univ Degli Studi Di Urbino Carlo Bo Macchina per analisi chimica comprendente la combinazione della spettrometria di massa a ionizzazione elettronica con la cromatografia liquida
MX2020005448A (es) 2017-11-27 2020-08-27 Univ Texas Sonda de recoleccion minimamente invasiva y metodos para el uso de esta.
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Also Published As

Publication number Publication date
CA2386832C (en) 2009-09-29
CA2386832A1 (en) 2001-05-10
JP2003515105A (ja) 2003-04-22
AU1122101A (en) 2001-05-14
EP1226602A2 (de) 2002-07-31
AU772052B2 (en) 2004-04-08
DE60038033T2 (de) 2009-04-23
US6534765B1 (en) 2003-03-18
WO2001033605A3 (en) 2002-01-03
EP1226602B1 (de) 2008-02-13
WO2001033605A9 (en) 2002-08-29
ATE386335T1 (de) 2008-03-15
WO2001033605A2 (en) 2001-05-10
JP4600909B2 (ja) 2010-12-22

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