DE60000267D1 - Abtastschalter mit unabhängiger Impedanz im Ein-Zustand - Google Patents

Abtastschalter mit unabhängiger Impedanz im Ein-Zustand

Info

Publication number: DE60000267D1
Authority: DE; Germany
Prior art keywords: state; sensing switch; independent impedance; impedance; independent
Prior art date: 2000-02-03
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE60000267T

Other languages

English (en)

Other versions

DE60000267T2 (de

Inventor

Adrian K Ong

Vladimir I Prodanov

Maurice J Tarsia

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Nokia of America Corp

Original Assignee

Lucent Technologies Inc

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2000-02-03

Filing date

2000-08-14

Publication date

2002-08-22

2000-08-14 Application filed by Lucent Technologies Inc filed Critical Lucent Technologies Inc

2002-08-22 Application granted granted Critical

2002-08-22 Publication of DE60000267D1 publication Critical patent/DE60000267D1/de

2003-03-27 Publication of DE60000267T2 publication Critical patent/DE60000267T2/de

2020-08-15 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/06—Modifications for ensuring a fully conducting state
- H03K17/063—Modifications for ensuring a fully conducting state in field-effect transistor switches
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C27/00—Electric analogue stores, e.g. for storing instantaneous values
- G11C27/02—Sample-and-hold arrangements
- G11C27/024—Sample-and-hold arrangements using a capacitive memory element

DE60000267T 2000-02-03 2000-08-14 Abtastschalter mit unabhängiger Impedanz im Ein-Zustand Expired - Lifetime DE60000267T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US09/497,612 US6310565B1 (en)	2000-02-03	2000-02-03	Sampling switch having an independent “on” impedance

Publications (2)

Publication Number	Publication Date
DE60000267D1 true DE60000267D1 (de)	2002-08-22
DE60000267T2 DE60000267T2 (de)	2003-03-27

Family

ID=23977574

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE60000267T Expired - Lifetime DE60000267T2 (de)	2000-02-03	2000-08-14	Abtastschalter mit unabhängiger Impedanz im Ein-Zustand

Country Status (5)

Country	Link
US (1)	US6310565B1 (de)
EP (1)	EP1122741B1 (de)
JP (1)	JP3964140B2 (de)
KR (1)	KR100664456B1 (de)
DE (1)	DE60000267T2 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US6829003B2 (en) *	2000-06-02	2004-12-07	Pentax Corporation	Sampling pulse generator of electronic endoscope
EP1168619A1 (de) *	2000-06-19	2002-01-02	STMicroelectronics S.r.l.	Schaltvorrichtung mit erhöhter Steuerung für einen Abtaster eines Analog/Digital-Wandlers, und dessen Betriebsverfahren
US6525574B1 (en) *	2001-09-06	2003-02-25	Texas Instruments Incorporated	Gate bootstrapped CMOS sample-and-hold circuit
EP1494357B1 (de) *	2003-07-03	2006-09-13	STMicroelectronics S.r.l.	Mit Spannungserhöhung betriebene Abtastschaltung und zugehöriges Ansteuerverfahren
US7148831B2 (en) *	2003-10-27	2006-12-12	Micron Technology, Inc.	Variable quantization ADC for image sensors
FR2871630B1 (fr) *	2004-06-11	2007-02-09	Commissariat Energie Atomique	Procede de commande d'un interrupteur analogique
US7453291B2 (en) *	2004-09-09	2008-11-18	The Regents Of The University Of California	Switch linearized track and hold circuit for switch linearization
TWI334692B (en) *	2007-02-06	2010-12-11	Realtek Semiconductor Corp	Dynamic voltage-generating apparatus and method thereof
US20090039924A1 (en) *	2007-08-09	2009-02-12	Alfio Zanchi	Systems and methods for reducing distortion in semiconductor based sampling systems
US7863943B2 (en) *	2007-09-28	2011-01-04	Maxim Integrated Products, Inc.	Sampling device and circuit having a single voltage supply
US7928794B2 (en)	2008-07-21	2011-04-19	Analog Devices, Inc.	Method and apparatus for a dynamically self-bootstrapped switch
US20100109750A1 (en) *	2008-10-30	2010-05-06	Jens Barrenscheen	Boost Mechanism Using Driver Current Adjustment for Switching Phase Improvement
US8502594B2 (en) *	2008-12-31	2013-08-06	Linear Technology Corporation	Bootstrap transistor circuit
US9378844B2 (en) *	2013-07-31	2016-06-28	Semiconductor Energy Laboratory Co., Ltd.	Semiconductor device including transistor whose gate is electrically connected to capacitor
JP6497089B2 (ja) *	2015-01-29	2019-04-10	株式会社ソシオネクスト	スイッチ回路、ａｄ変換回路および集積回路
US12276992B2 (en) *	2023-04-28	2025-04-15	Texas Instruments Incorporated	Auxiliary supply circuit
CN116811657A (zh) *	2023-05-12	2023-09-29	宁德时代新能源科技股份有限公司	电池控制方法、装置、电池管理系统和存储介质

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US5084634A (en)	1990-10-24	1992-01-28	Burr-Brown Corporation	Dynamic input sampling switch for CDACS
US5170075A (en)	1991-06-11	1992-12-08	Texas Instruments Incorporated	Sample and hold circuitry and methods
US5172019A (en)	1992-01-17	1992-12-15	Burr-Brown Corporation	Bootstrapped FET sampling switch
US5500612A (en)	1994-05-20	1996-03-19	David Sarnoff Research Center, Inc.	Constant impedance sampling switch for an analog to digital converter
US5909131A (en)	1996-07-31	1999-06-01	Analog Devices, Inc.	Low-distortion technique to bandlimit a switched-capacitor sampling circuit
US5936562A (en)	1997-06-06	1999-08-10	Analog Devices, Inc.	High-speed sigma-delta ADCs
US5945872A (en)	1997-11-06	1999-08-31	Analog Devices, Inc.	Two-phase boosted CMOS switch drive technique and circuit
FR2793970B1 (fr) *	1999-05-20	2001-08-31	St Microelectronics Sa	Procede de commande d'un commutateur d'un dispositif de capacite commutee, et dispositif de capacite commutee correspondant

2000
- 2000-02-03 US US09/497,612 patent/US6310565B1/en not_active Expired - Lifetime
- 2000-08-14 DE DE60000267T patent/DE60000267T2/de not_active Expired - Lifetime
- 2000-08-14 EP EP00306916A patent/EP1122741B1/de not_active Expired - Lifetime
2001
- 2001-02-01 JP JP2001025398A patent/JP3964140B2/ja not_active Expired - Fee Related
- 2001-02-03 KR KR1020010005232A patent/KR100664456B1/ko not_active Expired - Fee Related

Also Published As

Publication number	Publication date
KR20010078319A (ko)	2001-08-20
KR100664456B1 (ko)	2007-01-04
EP1122741B1 (de)	2002-07-17
US6310565B1 (en)	2001-10-30
DE60000267T2 (de)	2003-03-27
EP1122741A1 (de)	2001-08-08
JP2001243788A (ja)	2001-09-07
JP3964140B2 (ja)	2007-08-22

Publication	Publication Date	Title
DE60000267D1 (de)	2002-08-22	Abtastschalter mit unabhängiger Impedanz im Ein-Zustand
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Legal Events

Date	Code	Title	Description
2003-08-14	8364	No opposition during term of opposition