DE4232509A1 - Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulation - Google Patents
Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulationInfo
- Publication number
- DE4232509A1 DE4232509A1 DE4232509A DE4232509A DE4232509A1 DE 4232509 A1 DE4232509 A1 DE 4232509A1 DE 4232509 A DE4232509 A DE 4232509A DE 4232509 A DE4232509 A DE 4232509A DE 4232509 A1 DE4232509 A1 DE 4232509A1
- Authority
- DE
- Germany
- Prior art keywords
- ionization
- photon
- containers
- mass spectrometer
- plastic bottles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
- H01J49/147—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers with electrons, e.g. electron impact ionisation, electron attachment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B9/00—Cleaning hollow articles by methods or apparatus specially adapted thereto
- B08B9/08—Cleaning containers, e.g. tanks
- B08B9/46—Inspecting cleaned containers for cleanliness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0078—Testing material properties on manufactured objects
- G01N33/0081—Containers; Packages; Bottles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/162—Direct photo-ionisation, e.g. single photon or multi-photon ionisation
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Plasma & Fusion (AREA)
- Biochemistry (AREA)
- Optics & Photonics (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Mechanical Engineering (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
Description
Die Erfindung bezieht sich auf ein Verfahren zur Bestimmung von Kontaminaten in Behältern.The invention relates to a method for determination of contaminants in containers.
Hierbei ist es bekannt, die zu untersuchenden Behälter beispielsweise in einer Rundläufermaschine aufzunehmen, einen Teilinhalt der Behälterluft anzusaugen und einem Massen spektrometer zur Analyse zuzuleiten. Je nach Analyseergebnis und entsprechender Kontamination wird der Behälter anschließend aussortiert. Als Massenspektrometer werden Geräte verwendet, deren Ionisation durch Elektronenstoß erfolgt. Bei dieser Verfahrensweise beschränkt sich der Nachweis der Fremdstoffe oder von Kontaminaten auf Verbindungen mit Massenzahlen, die nicht mit den Hauptbestandteilen der Luft, Wasser oder beispielsweise bei der Untersuchung von Mehrweg flaschen nicht mit den Aromastoffen von Getränken inter ferieren.Here it is known the container to be examined for example in a rotary machine, to record one Partial content of the container air and a mass to supply spectrometer for analysis. Depending on the analysis result and the container becomes contaminated then sorted out. Devices are used as mass spectrometers used, whose ionization takes place by electron impact. At this procedure limits the evidence of Foreign substances or contaminants on compounds with Mass numbers that are not related to the main components of air, Water or, for example, when examining reusable materials do not bottle with the flavors of beverages inter celebrate.
Die Bestimmung von z. B. Urin über den Indikator NH3 ist hierbei nicht möglich, da die Interferenz mit dem wesentlich häufiger vorkommenden Wassermolekül keinen Nachweis erlaubt.The determination of z. B. Urine is over the NH3 indicator not possible because the interference with the essential more frequently occurring water molecule no detection allowed.
Der Erfindung liegt die Aufgabe zugrunde, insbesondere NH3 massenspektrometisch sicher nachzuweisen. Diese Aufgabe wird bei einem Verfahren der eingangs genannten Art mit einem Massenspektrometer gelöst, dessen Ionisierung durch Photoionisation erfolgt. The invention has for its object, in particular NH3 reliable detection by mass spectrometry. This task will in a method of the type mentioned with a Mass spectrometer solved, its ionization by Photoionization takes place.
Hierbei wird statt der totalen Ionisation über den Elektronen stoß eine Photoionisation eingesetzt, die eine Ionisierung der Luftkomponenten oder die des Wassers bzw. eine Reihe von anderen Fremdstoffen ausschließt und damit eine Vielzahl von möglichen Interferenzen vermeidet.Here, instead of total ionization over the electrons encountered a photo ionization that ionizes the Air components or those of water or a number of excludes other foreign substances and thus a variety of avoids possible interference.
Es hat sich dabei als zweckmäßig erwiesen, daß Ein- und/oder Zweiphotonenprozesse zu dieser Ionisation führen können.It has proven to be useful that one and / or Two-photon processes can lead to this ionization.
Ferner wird vorgeschlagen, daß die Ionisation durch Elektronen stoß und Photonenanregung erfolgt.It is also proposed that ionization by electrons collision and photon excitation.
Weitere Merkmale der Erfindung ergehen aus den Unteran sprüchen.Further features of the invention follow from the Unteran sayings.
In der Zeichnung ist ein Ausführungsbeispiel einer Anordnung zur Durchführung des Verfahrens dargestellt. Das Massen spektrometer 1 ist beispielsweise als Quadropolspektrometer ausgebildet und befindet sich in dem Vakuumraum 2, in dem auch das Leit- und Führungsrohr 3 für die Zuleitung der betreffenden Proben eingegliedert ist. In der verlängerten Achse des Führungsrohres 3 befindet sich das Fenster einer Lampe 4, die beispielsweise mit zentrierter Plasmaführung ausgelegt sein kann. Es können aber auch gepulste Lampen oder Laser eingesetzt werden. In the drawing, an embodiment of an arrangement for performing the method is shown. The mass spectrometer 1 is designed, for example, as a quadropole spectrometer and is located in the vacuum space 2 , in which the guide and guide tube 3 for the supply of the samples in question is incorporated. In the elongated axis of the guide tube 3 is the window of a lamp 4 , which can be designed, for example, with a centered plasma guide. However, pulsed lamps or lasers can also be used.
Wie aus der Zeichnung ersichtlich, ist die Beschleunigungs strecke für die Stoßelektronen und die Einstrahlrichtung der Photonen senkrecht zueinander ausgerichtet. Auf diese Weise ist ein intermetierender Betrieb photoneninduzierter und klassischer Massenspektrometrie möglich. Es können ohne weiteres Ein- oder Zweiphotonenprozesse zu der Ionisation eingesetzt werden. Ferner ist es denkbar, die Ionisation durch Elektronenstoß und Photonenanregung, also als photonen induzierte Ionisation durchzuführen.As can be seen from the drawing, the acceleration distance for the impact electrons and the direction of radiation of the Photons aligned perpendicular to each other. In this way is an intermittent operation classic mass spectrometry possible. It can be done without further one or two photon processes for ionization be used. It is also conceivable to carry out the ionization by Electron impact and photon excitation, i.e. as photons to carry out induced ionization.
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4232509A DE4232509A1 (en) | 1992-09-29 | 1992-09-29 | Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE4232509A DE4232509A1 (en) | 1992-09-29 | 1992-09-29 | Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE4232509A1 true DE4232509A1 (en) | 1994-03-31 |
Family
ID=6469050
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE4232509A Withdrawn DE4232509A1 (en) | 1992-09-29 | 1992-09-29 | Measuring contaminants in containers,e.g. plastic bottles - involves using mass spectrometer with ionisation and photon stimulation |
Country Status (1)
| Country | Link |
|---|---|
| DE (1) | DE4232509A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102004025841A1 (en) * | 2004-05-24 | 2005-12-15 | Bergische Universität Wuppertal | Method and apparatus for mass spectroscopic analysis of analytes |
| EP1151466A4 (en) * | 1999-02-09 | 2006-08-30 | Syagen Technology | Photoionization mass spectrometer |
| US7196325B2 (en) | 2005-05-25 | 2007-03-27 | Syagen Technology | Glow discharge and photoionizaiton source |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3878392A (en) * | 1973-12-17 | 1975-04-15 | Etec Corp | Specimen analysis with ion and electrom beams |
| US4140905A (en) * | 1977-05-02 | 1979-02-20 | The Governing Council Of The University Of Toronto | Laser-induced mass spectrometry |
| DE2732961A1 (en) * | 1977-07-21 | 1979-02-22 | Leybold Heraeus Gmbh & Co Kg | Sample analysis by bombardment with electromagnetic radiation - with conductive layer in region of sample for uniform potential distribution |
| DE2844002A1 (en) * | 1978-10-09 | 1980-05-14 | Leybold Heraeus Gmbh & Co Kg | METHOD AND DEVICE FOR ANALYZING FLUIDS |
| DE2942386A1 (en) * | 1979-10-19 | 1981-04-30 | Ulrich Dr. 8000 München Boesl | ION SOURCE |
| DE3009069A1 (en) * | 1980-03-10 | 1981-09-17 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Der Verteidigung, 5300 Bonn | INPUT HEAD OF A MEASURING / DETECTING SYSTEM FOR CHEMICAL AGENTS |
| DE3619886A1 (en) * | 1985-06-13 | 1986-12-18 | Mitsubishi Denki K.K., Tokio/Tokyo | DEVICE FOR MASS SPECTROMETRIC ANALYSIS |
| US4734579A (en) * | 1983-10-27 | 1988-03-29 | Atom Sciences, Inc. | Ultrasensitive method for measuring isotope abundance ratios |
| WO1992010745A1 (en) * | 1990-12-06 | 1992-06-25 | Lehmann, Martin | Process for finding a measurement and measuring installation |
-
1992
- 1992-09-29 DE DE4232509A patent/DE4232509A1/en not_active Withdrawn
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3878392A (en) * | 1973-12-17 | 1975-04-15 | Etec Corp | Specimen analysis with ion and electrom beams |
| US4140905A (en) * | 1977-05-02 | 1979-02-20 | The Governing Council Of The University Of Toronto | Laser-induced mass spectrometry |
| DE2732961A1 (en) * | 1977-07-21 | 1979-02-22 | Leybold Heraeus Gmbh & Co Kg | Sample analysis by bombardment with electromagnetic radiation - with conductive layer in region of sample for uniform potential distribution |
| DE2844002A1 (en) * | 1978-10-09 | 1980-05-14 | Leybold Heraeus Gmbh & Co Kg | METHOD AND DEVICE FOR ANALYZING FLUIDS |
| DE2942386A1 (en) * | 1979-10-19 | 1981-04-30 | Ulrich Dr. 8000 München Boesl | ION SOURCE |
| US4433241A (en) * | 1979-10-19 | 1984-02-21 | Ulrich Boesl | Process and apparatus for determining molecule spectra |
| DE3009069A1 (en) * | 1980-03-10 | 1981-09-17 | Bundesrepublik Deutschland, Vertreten Durch Den Bundesminister Der Verteidigung, 5300 Bonn | INPUT HEAD OF A MEASURING / DETECTING SYSTEM FOR CHEMICAL AGENTS |
| US4734579A (en) * | 1983-10-27 | 1988-03-29 | Atom Sciences, Inc. | Ultrasensitive method for measuring isotope abundance ratios |
| DE3619886A1 (en) * | 1985-06-13 | 1986-12-18 | Mitsubishi Denki K.K., Tokio/Tokyo | DEVICE FOR MASS SPECTROMETRIC ANALYSIS |
| WO1992010745A1 (en) * | 1990-12-06 | 1992-06-25 | Lehmann, Martin | Process for finding a measurement and measuring installation |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1151466A4 (en) * | 1999-02-09 | 2006-08-30 | Syagen Technology | Photoionization mass spectrometer |
| DE102004025841A1 (en) * | 2004-05-24 | 2005-12-15 | Bergische Universität Wuppertal | Method and apparatus for mass spectroscopic analysis of analytes |
| DE102004025841B4 (en) * | 2004-05-24 | 2015-07-09 | Bruker Daltonik Gmbh | Method and apparatus for mass spectroscopic analysis of analytes |
| US7196325B2 (en) | 2005-05-25 | 2007-03-27 | Syagen Technology | Glow discharge and photoionizaiton source |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| OM8 | Search report available as to paragraph 43 lit. 1 sentence 1 patent law | ||
| 8139 | Disposal/non-payment of the annual fee |